CN106680221A - Compensation method for wavelength shift based on xenon lamp spectrum - Google Patents
Compensation method for wavelength shift based on xenon lamp spectrum Download PDFInfo
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- CN106680221A CN106680221A CN201611155326.7A CN201611155326A CN106680221A CN 106680221 A CN106680221 A CN 106680221A CN 201611155326 A CN201611155326 A CN 201611155326A CN 106680221 A CN106680221 A CN 106680221A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/12—Circuits of general importance; Signal processing
- G01N2201/127—Calibration; base line adjustment; drift compensation
- G01N2201/12707—Pre-test of apparatus, e.g. dark test, sensor test
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Abstract
The invention provides a compensation method for wavelength shift based on a xenon lamp spectrum. The compensation method comprises the following steps: pumping nitrogen, and collecting lamp spectrum data of the xenon lamp spectrum; selecting a wave peak point from an absorption band closing to nitric oxide in the lamp spectrum data and marking same as a first preset wave peak point, and selecting another wave peak point from an absorption band closing sulfur dioxide and marking same as a second preset wave peak point; saving collected spectrum features in absorption spectrum data, comparing wave peak positions of the preset wave peak points and absorption wave peak points in the absorption spectrum data of nitric oxide and/or sulfur dioxide, and judging whether wavelength is in shift or not; when the wavelength is in shift, horizontally moving the absorption spectrum data according to a wavelength shift direction until wavelengths of the absorption spectrum data and the lamp spectrum data are identical. According to the compensation method provided by the invention, when the wavelength shift of a spectrometer is detected, the wavelength is compensated by horizontally moving and regulating the direction of the wavelength, real-time and dynamic compensation on the wavelength is achieved, the measurement accuracy of an instrument is increased, and the compensation efficiency of the wavelength is increased.
Description
Technical field
The present invention relates to spectral technique field, the compensation side of more particularly to a kind of wave length shift based on xenon lamp spectrum
Method.
Background technology
Spectrogrph is the device for detecting spectral line corresponding wavelength position and intensity with photodetector, is ultraviolet difference absorption spectra
The core component of the spectral absorption technology instrument such as technology.It is existing infrared with continuous improvement of the country to standard limit of smog release
The ultraviolet difference absorption spectroscopy techniques of analytical tool and routine be difficult to meet the low test limit of flue gas analysis, high sensitivity and
High-resolution etc. requires that this is to needing the continuous spectrogrph of operation ultraviolet difference absorption spectrometer device core component one of long-time
Wavelength stability put forward higher requirement.In addition, with prolonged operation and scene with varying strength
Vibration and the change of ambient temperature, this mechanical vibration and variation of ambient temperature all can derivative spectomstry instrument wave length shift, and then
The deviation of apparatus measures data can be caused.Therefore how measurement error caused by wave length shift is eliminated in real time, be further to be lifted
The important step of instrument performance.
However, spectrogrph is without the function of calibration wavelength automatically, and the method for wavelength calibration that spectrogrph manufacturer provides
By showing that lamp or other feature light sources are calibrated to spectrogrph, these methods are relatively complicated, need to split out spectrogrph, but
Quit work once analyser is split out, this is not allowed for continuous monitoring instrument.In addition, split out spectrogrph relating to
Refitting spectrogrph, for continuous monitoring instrument, when it come to the refitting of part, it is possible to cause original system calibration not
It is applied to the system after refitting again, this is a very big workload for system maintenance personnel.
In addition, the compensation method of current wave length shift is required to be passed through SO2Calibrating gas, meanwhile, need specific
Compensate under experiment condition, it is impossible to enough according to current wave length shift situation, compensate in real time.
The content of the invention
The shortcoming of prior art in view of the above, it is an object of the invention to provide a kind of wavelength based on xenon lamp spectrum
The compensation method of drift, drifts about for solving prior art spectrogrph course of work medium wavelength, needs specific environment ability
Carry out wavelength compensation, it is impossible to the problem that real-time monitoring wave length shift is compensated to wavelength.
For achieving the above object and other related purposes, the present invention provides a kind of benefit of the wave length shift based on xenon lamp spectrum
Compensation method, including：
Step 1, is passed through nitrogen, gathers the light modal data of xenon lamp spectrum, wherein, the light modal data is xenon lamp spectrum
In the spectral signature corresponding to different wave length；
Step 2, in the light modal data, near nitric oxide production absorption bandses a wave crest point is chosen, and is labeled as
First default wave crest point, near sulfur dioxide absorption bandses another wave crest point is chosen, and is labeled as the second default wave crest point；
Step 3, by the spectral signature of collection absorption spectra data is saved in, wherein, select near the first default wave crest point
Select multiple wave crest points and absorb wave crest point for nitric oxide, be sulfur dioxide in second default wave crest point multiple wave crest points selected around
Absorb wave crest point；
Step 4, contrast nitric oxide and/or sulfur dioxide preset wave crest point in respective absorption spectra data and absorb ripple
Peak dot crest location, judges wavelength with the presence or absence of drift according to comparing result；
Step 5, when wavelength is present to drift about, translates absorption spectra data, until absorption spectrum according to wave length shift direction
Till data are identical with the wavelength of light modal data.
As described above, the compensation method of the wave length shift based on xenon lamp spectrum of the present invention, has the advantages that：
In use, there is ripple in real-time monitoring spectrometer wavelength when spectrogrph is detected with spectrogrph in the present invention
During long drift, the wavelength is compensated by the direction of translational adjustment wavelength, reach mending to wavelength for Real-time and Dynamic
Repay, to overcome the measurement error brought because of wave length shift, substantially increase the certainty of measurement of instrument.In addition, the wavelength compensation
When, it is not necessary to specific environment, it is not necessary to be passed through the calibrating gas such as sulfur dioxide, improve the compensation efficiency of wavelength.
Description of the drawings
Fig. 1 is shown as the present invention and provides a kind of compensation method flow chart of the wave length shift based on xenon lamp spectrum；
Fig. 2 is shown as the spectral signature figure based on xenon lamp spectrum of present invention offer；
Fig. 3 is shown as the wave length shift figure in the nitric oxide production calculating section of present invention offer；
Fig. 4 is shown as the wave length shift figure in the calculating section of the sulfur dioxide of present invention offer；
Fig. 5 is shown as inventing the wavelength compensation figure in the nitric oxide production calculating section for providing；
Fig. 6 is shown as the wavelength compensation figure in the calculating section of the sulfur dioxide of present invention offer.
Specific embodiment
Embodiments of the present invention are illustrated below by way of specific instantiation, those skilled in the art can be by this specification
Disclosed content understands easily other advantages and effect of the present invention.The present invention can also pass through concrete realities different in addition
The mode of applying is carried out or applies, the every details in this specification can also based on different viewpoints with application, without departing from
Various modifications and changes are carried out under the spirit of the present invention.It should be noted that, in the case where not conflicting, following examples and enforcement
Feature in example can be mutually combined.
It should be noted that the diagram provided in following examples only illustrates in a schematic way the basic structure of the present invention
Think, only show in schema then with relevant component in the present invention rather than according to component count during actual enforcement, shape and size
Draw, it is actual when the implementing kenel of each component, quantity and ratio can be a kind of random change, and its assembly layout kenel
It is likely more complexity.
Fig. 1 is referred to, the present invention provides a kind of compensation method of the wave length shift based on xenon lamp spectrum, including：
Step 1, is passed through nitrogen, gathers the light modal data of xenon lamp spectrum, wherein, the light modal data is xenon lamp spectrum
In the spectral signature corresponding to different wave length；
With reference to shown in Fig. 2, for the spectral signature figure based on xenon lamp spectrum that the present invention is provided, its corresponding wave-length coverage is
150~450nm, wherein, abscissa is expressed as wavelength, and vertical coordinate is expressed as light intensity, and the spectral signature in the figure is the light of xenon lamp
Modal data.
Step 2, in the light modal data, near nitric oxide production absorption bandses a wave crest point is chosen, and is labeled as
First default wave crest point, near sulfur dioxide absorption bandses another wave crest point is chosen, and is labeled as the second default wave crest point；
Specifically, wherein, the nitric oxide production absorption bandses are 200~230nm, and the sulfur dioxide absorption bandses are
280~310nm, it is preferable that the corresponding wavelength of the first wave peak dot is 229nm, the corresponding wavelength of the secondary peak point is
315nm.Wherein, the first default wave crest point is the wave crest point of the peak swing of homologous thread, and the second default wave crest point is bent for correspondence
The wave crest point of the peak swing of line, the sulfur dioxide of selection and each self-corresponding measuring section of nitric oxide apart from wavelength at a distance of compared with
Far, will not influence each other so as to choose two default measurement wave crest points, to improve certainty of measurement, the same default crest chosen
Point corresponds to respectively sulfur dioxide and absorbs very weak with nitric oxide production, does not interfere with the change of crest location.
With reference to Fig. 3, Fig. 4, provide respectively in the nitric oxide production wave length shift figure calculated in section, the calculating section of sulfur dioxide
Wave length shift figure, wherein, the light intensity amplitude of the wavelength in Fig. 3 and Fig. 4 is not deleted, but is drifted about in horizontal upper ripple length,
That is the position of Wave crest and wave trough can not correspond to, and original corresponding wave crest point displacement be caused to other wavelength points, to spectrogrph
Measurement bring error.
Step 3, by the spectral signature of collection absorption spectra data is saved in, wherein, select near the first default wave crest point
Select multiple wave crest points and absorb wave crest point for nitric oxide, be sulfur dioxide in second default wave crest point multiple wave crest points selected around
Absorb wave crest point；
Specifically, in absorption spectra data, it is defined by the position corresponding to the first default wave crest point, in each choosing in its left and right
Multiple wave crest points absorb wave crest point as nitric oxide；
In absorption spectra data, it is defined by the position corresponding to the second default wave crest point, in its left and right multiple ripples is respectively selected
Peak dot absorbs wave crest point as sulfur dioxide.
Wherein, the plurality of crest is counted out as 5~10, multiple several when wavelength arranges multiple wave crest points simultaneously
Simultaneously correspondence compares wave crest point, can prevent the accidental thing between wave crest point, improves the accuracy rate of monitoring.
Step 4, contrast nitric oxide and/or sulfur dioxide preset wave crest point in respective absorption spectra data and absorb ripple
Peak dot crest location, judges wavelength with the presence or absence of drift according to comparing result；
Specifically, whether absorption spectrum medium wavelength can determine whether by the combination or any one mode of following two modes
There occurs drift.
The first：
Contrast the nitric oxide production first default wave crest point and absorb wave crest point in absorption spectra data medium wave peak with nitric oxide
Position；When the first default wave crest point is identical with the crest location corresponding to nitric oxide absorption wave crest point, then wavelength does not drift about；
When the first default wave crest point is different with the crest location corresponding to nitric oxide absorption wave crest point, then wave length shift.
Second：
Second default wave crest point and the sulfur dioxide of contrast sulfur dioxide absorbs wave crest point in absorption spectra data medium wave peak
Position；When the second default wave crest point is identical with the crest location corresponding to sulfur dioxide absorption wave crest point, then wavelength does not drift about；
When the second default wave crest point is different with the crest location corresponding to sulfur dioxide absorption wave crest point, then wave length shift.
In the present embodiment, by being compared for default wave crest point and the crest location for absorbing wave crest point, because light
Spectrometer drifts about greatly in short wavelength, drifts about on the contrary during long wavelength little, meanwhile, the corresponding wavelength location of wave crest point of selection is for two
Sulfur oxide absorbs very weak with nitric oxide production, compares light modal data is corresponding with absorption spectra data respectively, according to pre-
If wave crest point is compared with wave crest point position is absorbed, wherein, with default wave crest point as starting point, carry out to its both sides direction respectively
Peak to peak is contrasted, and is not original corresponding wavelength if be shifted over relative to the crest of spectrum in original light modal data
During point, then it represents that now the wavelength there occurs drift, if constant relative to the crest location of original spectrum, then it represents that the ripple
Long no drift.
Simultaneously, it is not necessary to split out spectrogrph, when spectrogrph works, by measuring whether several wave crest point positions occur
Change, judges whether wavelength drifts about, and improves monitoring efficiency.
Step 5, when wavelength is present to drift about, translates absorption spectra data, until absorption spectrum according to wave length shift direction
Till data are identical with the wavelength of light modal data.
Respectively correspond to it is above-mentioned the first：
When the first default wave crest point absorbs the crest location corresponding to wave crest point more than nitric oxide, contrast modulation spectrum number
According to absorption spectrum is translated to long wave length direction, till absorption spectra data is identical with the wavelength of light modal data；When
When one default wave crest point absorbs the crest location corresponding to wave crest point less than nitric oxide, contrast modulation spectroscopic data is by absorption spectrum
To the translation of shortwave length direction, till absorption spectra data is identical with the wavelength of light modal data.
In the present embodiment, Fig. 5 is referred to, to invent the wavelength compensation figure in the nitric oxide production calculating section for providing,
When there is wave length shift, wavelength is compensated using aforesaid way, with reference to the original Fig. 3 of contrast, it can be determined that wavelength 200~
Position of each wave crest point after nitric oxide is absorbed in 230nm, through compensation, without drift phenomenon.
Above-mentioned second is corresponded to respectively：
When the second default wave crest point absorbs the crest location corresponding to wave crest point more than sulfur dioxide, contrast modulation spectrum number
According to absorption spectrum is translated to long wave length direction, till absorption spectra data is identical with the wavelength of light modal data；When
Less than when inhaling sulfur dioxide and absorbing the crest location corresponding to wave crest point, contrast modulation spectroscopic data is by absorbing light for two default wave crest points
Compose to the translation of shortwave length direction, till absorption spectra data is identical with the wavelength of light modal data.
Fig. 6 is referred to, wave length shift is occurring in the wavelength compensation figure in the calculating section of the sulfur dioxide provided for the present invention
When, wavelength is compensated using aforesaid way, with reference to the original Fig. 4 of contrast, it can be determined that in 280~320nm of wavelength each
Position of the wave crest point after sulfur dioxide absorption, through compensation, without drift phenomenon.
In sum, spectrogrph of the invention in use, real-time monitoring spectrometer wavelength, when detecting spectrogrph
During generation wave length shift, the wavelength is compensated by the direction of translational adjustment wavelength, reach Real-time and Dynamic to wavelength
Compensate, to overcome the measurement error brought because of wave length shift, substantially increase the certainty of measurement of instrument.In addition, the ripple
During long compensation, it is not necessary to specific environment, it is not necessary to be passed through the calibrating gas such as sulfur dioxide, improve the compensation efficiency of wavelength.
So, the present invention effectively overcomes various shortcoming of the prior art and has high industrial utilization.
The principle and its effect of above-described embodiment only illustrative present invention, it is of the invention not for limiting.It is any ripe
Know the personage of this technology all can carry out modifications and changes under the spirit and the scope without prejudice to the present invention to above-described embodiment.Cause
This, such as those of ordinary skill in the art is complete with institute under technological thought without departing from disclosed spirit
Into all equivalent modifications or change, should by the present invention claim be covered.
Claims (9)
1. a kind of compensation method of the wave length shift based on xenon lamp spectrum, it is characterised in that include：
Step 1, is passed through nitrogen, gathers the light modal data of xenon lamp spectrum, wherein, the light modal data is xenon lamp spectrum not
Spectral signature corresponding to co-wavelength；
Step 2, in the light modal data, near nitric oxide production absorption bandses a wave crest point is chosen, and is labeled as first
Default wave crest point, near sulfur dioxide absorption bandses another wave crest point is chosen, and is labeled as the second default wave crest point；
Step 3, by the spectral signature of collection absorption spectra data is saved in, wherein, it is selected around many in the first default wave crest point
Individual wave crest point is that nitric oxide absorbs wave crest point, is sulfur dioxide absorption in second default wave crest point multiple wave crest points selected around
Wave crest point；
Step 4, contrast nitric oxide and/or sulfur dioxide preset wave crest point in respective absorption spectra data and absorb wave crest point
Crest location, judges wavelength with the presence or absence of drift according to comparing result；
Step 5, when wavelength is present to drift about, translates absorption spectra data, until absorption spectra data according to wave length shift direction
Till identical with the wavelength of light modal data.
2. the compensation method of the wave length shift based on xenon lamp spectrum according to claim 1, it is characterised in that the step
Nitric oxide production absorption bandses described in 2 are 200~230nm, and the sulfur dioxide absorption bandses are 280~310nm.
3. the compensation method of the wave length shift based on xenon lamp spectrum according to claim 2, it is characterised in that described first
The corresponding wavelength of wave crest point is 229nm, and the corresponding wavelength of the secondary peak point is 315nm.
4. the compensation method of the wave length shift based on xenon lamp spectrum according to claim 1, it is characterised in that the step
3 include：
In absorption spectra data, it is defined by the position corresponding to the first default wave crest point, in its left and right multiple wave crest points is respectively selected
Wave crest point is absorbed as nitric oxide；
In absorption spectra data, it is defined by the position corresponding to the second default wave crest point, in its left and right multiple wave crest points is respectively selected
Wave crest point is absorbed as sulfur dioxide.
5. the compensation method of the wave length shift based on xenon lamp spectrum according to claim 1, it is characterised in that the plurality of
Crest is counted out as 5~10.
6. the compensation method of the wave length shift based on xenon lamp spectrum according to claim 1, it is characterised in that the step
4 include：
Contrast the nitric oxide production first default wave crest point and absorb wave crest point in absorption spectra data medium wave peak position with nitric oxide；
When the first default wave crest point is identical with the crest location corresponding to nitric oxide absorption wave crest point, then wavelength does not drift about；When
When one default wave crest point is different with the crest location corresponding to nitric oxide absorption wave crest point, then wave length shift.
7. the compensation method of the wave length shift based on xenon lamp spectrum according to claim 1, it is characterised in that the step
4 also include：
Second default wave crest point and the sulfur dioxide of contrast sulfur dioxide absorbs wave crest point in absorption spectra data medium wave peak position；
When the second default wave crest point is identical with the crest location corresponding to sulfur dioxide absorption wave crest point, then wavelength does not drift about；When
When two default wave crest points are different with the crest location corresponding to sulfur dioxide absorption wave crest point, then wave length shift.
8. the compensation method of the wave length shift based on xenon lamp spectrum according to claim 1, it is characterised in that the step
5 include：
When the first default wave crest point absorbs the crest location corresponding to wave crest point more than nitric oxide, contrast modulation spectroscopic data will
Absorption spectrum to long wave length direction is translated, till absorption spectra data is identical with the wavelength of light modal data；When first pre-
If wave crest point absorbs the crest location corresponding to wave crest point less than nitric oxide, contrast modulation spectroscopic data is by absorption spectrum to short
Wavelength direction is translated, till absorption spectra data is identical with the wavelength of light modal data.
9. the compensation method of the wave length shift based on xenon lamp spectrum according to claim 1, it is characterised in that the step
5 also include：
When the second default wave crest point absorbs the crest location corresponding to wave crest point more than sulfur dioxide, contrast modulation spectroscopic data will
Absorption spectrum to long wave length direction is translated, till absorption spectra data is identical with the wavelength of light modal data；When second pre-
If wave crest point less than inhale sulfur dioxide absorb wave crest point corresponding to crest location, contrast modulation spectroscopic data by absorption spectrum to
Shortwave length direction is translated, till absorption spectra data is identical with the wavelength of light modal data.
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| CN104198416A (en) * | 2014-09-15 | 2014-12-10 | 南京国电环保科技有限公司 | Real-time compensation method of measurement errors caused by spectrograph wavelength drift |
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| CN101706423A (en) * | 2009-09-30 | 2010-05-12 | 聚光科技(杭州)股份有限公司 | Laser gas absorption spectrum analyzing method |
| CN102519892A (en) * | 2011-12-08 | 2012-06-27 | 杭州微兰科技有限公司 | Spectral line drift participated regression algorithm method for correcting spectral line drift in differential optical absorption spectral measurement |
| CN102879864A (en) * | 2012-11-01 | 2013-01-16 | 武汉邮电科学研究院 | Wavelength shift detection and calibration method for LCOS (Liquid Crystal On Silicon) wavelength selection switch |
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