CN106556742A - For the apparatus and method of impulsive impedance measurement - Google Patents
For the apparatus and method of impulsive impedance measurement Download PDFInfo
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- CN106556742A CN106556742A CN201510640102.4A CN201510640102A CN106556742A CN 106556742 A CN106556742 A CN 106556742A CN 201510640102 A CN201510640102 A CN 201510640102A CN 106556742 A CN106556742 A CN 106556742A
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Abstract
The present invention relates to the apparatus and method for being used for impulsive impedance measurement.A kind of impulsive impedance measurement apparatus, including：For installing the element under test shielding box of element under test, which has interface Ix+、Ix-、Ux+And Ux-, wherein interface Ix+And Ix-The electric current of element under test, interface U are flow through for measurementx+And Ux-For measuring the voltage at element under test two ends；And impulsive impedance analyzer, including：Signal generator, for generating AC measurment signal；Reference elements, the signal generator and the reference elements are connected in series to the element under test shielding box to form closed-loop path, wherein the element under test and the reference elements are connected to each other by bridge；And sampling analysis unit, its interface U to the element under test shielding boxx+And Ux-And the voltage signal at the reference elements two ends synchronizes sampling, and using dynamic compensation method calculating the impedance of the element under test.
Description
Technical field
Present invention relates in general to impedance measurement, more specifically it relates to be used for the device of impulsive impedance measurement
And method, which can reduce or exclude the impact of Leakage Current, realize very high measurement efficiency and precision.
Background technology
Impedance is one of key property of circuit.At present, there are many kinds of impedance measurement devices, such as patent
In application JP-61-266965, CN99122994.0, US2008191709 and US2012147658
Those disclosed.In these impedance measurement devices, as shown in figure 1, generally by 10 (its of element under test
With unknown impedance Zx) (which has known impedance Z with the reference elements 20 of known impedanceref) series connection company
Connect, the series circuit two ends of the two can be connected respectively to signal source and signal leakage, electric bridge (example therebetween
Such as, connecting line connecting the two etc.) " void is connected to by operational amplifier 30 and/or other circuits
Ground " GND, to reduce the Leakage Current produced because there is voltage between electric bridge and signal ground, it is ensured that
The electric current and the electric current for flowing through reference elements 20 for flowing through element under test 10 is equal to each other.But in actual survey
In amount, it is difficult to the current potential of electric bridge is maintained preferable zero potential always, especially increase in measurement frequency
Or in the case that element under test differs larger with the impedance of reference elements, the current potential on electric bridge may be bigger
Deviate zero potential in degree, so as to cause impedance measurement device unstable properties, measure error it is larger, and
And measurement result is affected larger defect by factors such as environment, temperature.
For the problems referred to above, patent application CN201210081375.6 proposes a kind of impedance measurement device
And method, the impedance of electric bridge is that takes into account, and measures the Leakage Current between electric bridge and signal ground.
However, the device solve only the Leakage Current compensation problem in steady state impedance measurement, and wink is not suitable for it
State impulsive measurement.For transient pulse is measured, on the one hand for high-speed pulse or instantaneous measurement are that have very much
It is necessary, on the other hand for steady state impedance measurement, measurement efficiency can be greatly improved.
Accordingly, it would be desirable to a kind of transient pulse impedance measurement device and method, which can reduce or exclude leakage
The impact of electric current, realizes very high measurement efficiency and precision.
The content of the invention
One aspect of the present invention is to provide the apparatus and method for impulsive impedance measurement, and which can subtract
The impact of little bridge Leakage Current, realizes high measurement efficiency and certainty of measurement.
According to an one exemplary embodiment, a kind of impulsive impedance measurement apparatus may include：For installing unit to be measured
The element under test shielding box of part, which has interface Ix+、Ix-、Ux+And Ux-, wherein interface Ix+And Ix-With
The electric current of element under test, interface U are flow through in measurementx+And Ux-For measuring the voltage at element under test two ends；
And impulsive impedance analyzer, including：Signal generator, for generating pulsed measuring signals；Reference unit
Part, the signal generator and the reference elements are connected in series to the element under test shielding box to be formed
Closed-loop path, wherein the element under test and the reference elements are connected to each other by bridge；And sampling
Analytic unit, its interface U to the element under test shielding boxx+And Ux-And the reference elements two ends
Voltage signal synchronize sampling, and using dynamic compensation method calculating the impedance of the element under test.
In one embodiment, the sampling analysis unit may include：Sampling module, for described to be measured
The interface U of element shielding boxx+And Ux-And the voltage signal U at the reference elements two endsb1And Ub2Enter
Row sampling, wherein Ux-It is the voltage of close described reference elements one end of the element under test, Ub1It is institute
State the voltage of close described element under test one end of reference elements；And computing module, for based on sampling
The magnitude of voltage of acquisition, calculates the impedance of the element under test using dynamic compensation method.
In one embodiment, the computing module may include dynamic compensation module, the dynamic compensation module
May include：When-frequency conversion module, for the time domain voltage for being received is transformed to frequency domain voltage；Frequency domain
Compensating module, for by the frequency domain voltage divided by received frequency domain impedance obtaining frequency domain electric current；
And frequency-when conversion module, for by the frequency domain current transformation be temporal current.
In one embodiment, the computing module can be configured to：The wink of the bridge obtained based on measurement
State voltage (Ux-+Ub1), the transient state for being calculated the bridge using the dynamic compensation module reveals electricity
Stream Ib；Transient voltage (the U at the reference elements two ends obtained based on measurementb1-Ub2), it is calculated
Flow through the transient current I of the reference elementsref；And calculate the transient resistance of the element under test
Zx=(Ux+-Ux-)/(Ib+Iref)。
In one embodiment, the computing module can be configured to：The wink of the bridge obtained based on measurement
State voltage (Ux-+Ub1), the transient state for being calculated the bridge using the dynamic compensation module reveals electricity
Stream Ib；Transient voltage (the U at the reference elements two ends obtained based on measurementb1-Ub2), it is calculated
Flow through the transient current I of the reference elementsref；By the transient state Leakage Current I of the bridgebWith the ginseng
Than the transient current I of elementrefIt is added, to obtain the transient current I of the element under testx；Treat to described
Survey the transient current I of elementxWhen carrying out-frequency conversion, to obtain the current spectrum I of the element under testx(f)；
Transient voltage difference V to the element under test two endsx=Ux+-Ux-When carrying out-frequency conversion, to obtain described treating
Survey the voltage spectrum V at element two endsx(f)；And calculate the complex impedance spectroscopy of the element under test
Zx(f)=Vx(f)/Ix(f)。
In one embodiment, the sampling analysis unit also includes：Trigger control module, for controlling
Sampling module is stated with the interface U to the element under test shielding boxx+And Ux-And the reference elements two
The voltage signal U at endb1And Ub2Synchronize sampling.
In one embodiment, the impulsive impedance analyzer also includes output unit, for exporting described adopting
The impedance of the calculated element under test of sample analytic unit.
According to an one exemplary embodiment of the invention, a kind of pulse measuring method of time domain transient resistance may include：
The transient voltage U at synchronized sampling element under test two endsx+And Ux-And the transient voltage at reference elements two ends
Ub1And Ub2, wherein the element under test, the reference elements and signal generator are connected in series with shape
Into closed-loop path, and transient voltage Ux-It is one end adjacent with the reference elements of the element under test
Voltage, transient voltage Ub1It is the voltage of one end adjacent with the element under test of the reference elements；
The transient current I of the reference elements is flow through in calculatingref=(Ub1-Ub2)/Zref；Using dynamic compensation method, it is based on
Connect the transient voltage V of the bridge of the element under test and the reference elementsbCalculate the wink of the bridge
State Leakage Current Ib, wherein Vb=(Ux-+Ub1)；The transient current of the element under test is flow through in calculating
Ix=Iref+Ib；And calculate transient resistance Z of the element under testx=(Ux+-Ux-)/Ix。
According to an one exemplary embodiment of the invention, a kind of pulse measuring method of impedance spectrum may include：Together
The transient voltage U at step sampling element under test two endsx+And Ux-And the transient voltage U at reference elements two endsb1
And Ub2, wherein the element under test, the reference elements and signal generator are connected in series to be formed
Closed-loop path, and transient voltage Ux-It is one end adjacent with the reference elements of the element under test
Voltage, transient voltage Ub1It is the voltage of one end adjacent with the element under test of the reference elements；
The transient current I of the reference elements is flow through in calculatingref=(Ub1-Ub2)/Zref；Using dynamic compensation method, it is based on
Connect the transient voltage V of the bridge of the element under test and the reference elementsbCalculate the wink of the bridge
State Leakage Current Ib=Vb/Zb, wherein Vb=(Ux-+Ub1)；The transient state of the element under test is flow through in calculating
Electric current Ix=Iref+Ib, and when carrying out to which-frequency conversion to be obtaining current spectrum Ix(f)；To the element under test
The transient voltage difference V at two endsx=(Ux+-Ux-) when carrying out-frequency converted to obtain voltage spectrum Vx(f)；And will
Current spectrum of the voltage spectrum at the element under test two ends divided by the element under test, obtains described to be measured
The complex impedance spectroscopy Z of elementx(f)=Vx(f)/Ix(f)。
In one embodiment, using dynamic compensation method, based on the connection element under test and reference unit
The transient voltage V of the bridge of partbCalculate the transient state Leakage Current I of the bridgebThe step of may include：It is right
The transient voltage VbWhen carrying out-frequency conversion to be obtaining voltage spectrum Vb(f)；Based on the bridge for being received
The impedance spectrum Z on roadbF (), calculates the current spectrum I of the bridgeb(f)；And to the current spectrum Ib(f)
Perform frequency-when conversion to obtain the transient state Leakage Current I of the bridgeb。
Description of the drawings
Fig. 1 illustrates the schematic diagram of the impedance measurement device of prior art.
Fig. 2 schematically shows the schematic diagram of transient pulse impedance measurement according to an embodiment of the invention.
Fig. 3 illustrates the structured flowchart of transient pulse impedance measurement device according to an embodiment of the invention.
Fig. 4 illustrates the structured flowchart of sampling analysis unit according to an embodiment of the invention.
Fig. 5 illustrates the structured flowchart of dynamic compensation module according to an embodiment of the invention.
The flow chart that Fig. 6 illustrates impulse method time domain transient resistance measurement according to an embodiment of the invention.
The flow chart that Fig. 7 illustrates impulse method impedance spectroscopy measurement according to an embodiment of the invention.
Specific embodiment
Some one exemplary embodiments of the present invention are described below in conjunction with accompanying drawing.It is understood that giving
Go out the principle that these one exemplary embodiments are merely to illustrate the present invention, and these have to be limited the invention to
The precise forms of one exemplary embodiment.
Fig. 2 schematically shows the principle of the transient pulse impedance measurement according to an one exemplary embodiment of the invention
Figure.As shown in Fig. 2 impulsive impedance measurement apparatus 100 include signal source 110, signal source 110 is produced
Flow through the electric current I of element under test 120x, electric current IxIn a part of IrefThe stream of Jing reference elements 130 is to letter
Number leakage 140, and eventually arrive at ground connection GND.Electric current IxIn another part IbJing is connected to unit to be measured
The circuit 150 of the electric bridge between part 120 and reference elements 130 reaches ground connection GND.Assume that and treat
The electric bridge surveyed between element 120 and reference elements 130 has potential Vb, and circuit 150 has impedance
Zb.According to Kirchhoff's law, it was determined that Ix=Ib+Iref。
In stable state or direct current resistance measurer device, can return to zero to force to make V by autobalancebElectricity
Position is close to zero, or because ZbIt is relatively large so as to IbRelative to IrefIt is negligible.But at a high speed
, especially under the conditions of single-pulse measurement, not only no time is to V for impulsive measurement conditionbCarry out autobalance
Zero, and because parasitic capacitance presence and ZbZ is much larger than no longerref, i.e. IbWith respect to IrefCan not be again
It is ignored.Therefore, it is necessary to impulsive impedance measurement apparatus described below and method are used, to solve pulse
Bridge voltage V in resistance measurementbLeakage compensated problem when being not zero.
Fig. 3 illustrates impulsive impedance measurement apparatus according to an embodiment of the invention 200.As shown in figure 3,
Impulsive impedance measurement apparatus 200 include element under test shielding box 210 and impulsive impedance analyzer 220.Treat
Element or circuit, such as element under test 120 shown in Fig. 2 are surveyed, element under test shielding box is may be mounted at
In 210.Element under test shielding box 210 is provided with four interfaces, respectively Ix+、Ix-、Ux+And Ux-,
Wherein Ix+And Ix-Be current interface, the electric current I of element under test 120 is flow through for measurementx, Ux+And Ux-
It is voltage interface, for measuring the voltage at 120 two ends of element under test.By with four-wire method come to unit to be measured
Part 120 carries out impedance measurement, can avoid contact with the impact of resistance and conductor resistance, realize high sensitivity
And high accuracy.
Impulsive impedance analyzer 220 includes signal generator 222, reference elements 224, sampling analysis list
Unit 226 and output unit 228, they can also be in a shielding box.As shown in figure 3, pulse resistance
Analysis resistant instrument 220 is connected to the interface I of element under test shielding box 210 by shielding linex+、Ix-、Ux+With
Ux-, wherein screen layer can be grounded, so as to avoid electromagnetic interference well, it is ensured that certainty of measurement.Signal is sent out
Raw device 222 and reference elements 224 are connected in series and are connected to the I of element under test shielding box 210x+With
Ix-Interface, to form closed-loop path.Sampling analysis unit 226 is connected to element under test shielding box 210
Ux+And Ux-Interface is measuring the voltage at 120 two ends of element under test, wherein interface Ux-It is to be measured for measuring
The voltage of 224 one end of close reference elements of element 120.Sampling analysis unit 226 is also connected to reference
The two ends of element 224 are measuring the voltage U at 224 two ends of reference elementsb1And Ub2, wherein voltage Ub1
It is the voltage of 120 one end of close element under test of reference elements 224.As can be seen that same to reference unit
Part 224 carries out four-wire method measurement, to avoid contact with the impact of resistance and conductor resistance, realizes high sensitivity
And high accuracy.Signal generator 222 can be pulse signal generator, its can generate pulse signal with
The impulse transients measurement process of the present invention for being described below in detail.Can be used for impulse transients measurement process
The example of pulse signal may include but be not limited to square wave, triangular wave etc..Certainly, signal generator 222
Can also generate other signals, such as AC signal, direct current signal etc., for other measurement process,
Such as steady state measurement process.Sampling analysis unit 226 can carry out high-speed sampling to above-mentioned voltage signal,
And the impulse transients measurement process of the present invention that execution is described below in detail, is calculated element under test
120 impedance results, and impedance results are supplied to into output unit 228.Sampling analysis unit 226
Concrete structure will be described in detail hereinafter.Output unit 228 can be such as printer, show
Device etc., the impedance of the element under test 120 that its output measurement is obtained.
Fig. 4 illustrates the structured flowchart of sampling analysis unit according to an embodiment of the invention.As shown in figure 4,
Sampling analysis unit 300 includes sampling module 310, trigger control module 320 and computing module 330.
As it was previously stated, sampling module 310 can be to voltage signal Ux+、Ux-、Ub1And Ub2Sampled, touched
Send out control module 320 and can control sampling of the sampling module 310 to each voltage, for example, can control
Sampling module 310 is synchronously to voltage signal Ux+、Ux-、Ub1And Ub2Sampled.The electricity sampled
Pressure signal can be provided to computing module 330 to be calculated, so as to obtain the resistance of element under test 120
Anti-, the calculating process will be discussed in more detail below.Especially, computing module 330 can include dynamic
Compensating module 332, which calculates the Leakage Current for flowing through bridge using dynamic compensation method, such that it is able to convection current
The actual current for crossing element under test 120 carries out dynamic compensation.The concrete structure of dynamic compensation module 332
It is described below.Computing module 330 is by the output of calculated resistance value to such as output unit
228, to be supplied to user.
Fig. 5 is the block diagram of dynamic compensation module according to an embodiment of the invention.As shown in figure 5, dynamic
When compensating module 400 includes-frequency conversion module 410, frequency domain compensation module 420 and frequency-when conversion module
430.When-frequency conversion module 410 can receive time domain voltage signal such as VbT (), carries out time domain to frequency to which
The conversion in domain, such as realize the conversion by Fast Fourier Transform (FFT) (FFT), so as to obtain frequency domain
Voltage signal Vb(f).Frequency domain compensation module receive from when-frequency conversion module 410 frequency domain voltage signal
Vb(f), and the corresponding frequency domain impedance signal Z of inputb(f), such that it is able to be calculated frequency domain electric current letter
Number Ib(f), and by calculated frequency domain current signal IbF () is supplied to frequency-when conversion module 430.In frequency
In-when conversion module 430, to frequency domain current signal IbF () carries out the conversion of frequency domain to time domain, so as to obtain
And output time-domain current signal Ib(t)。
The base of impulsive impedance measurement apparatus according to an exemplary embodiment of the invention is described above
This structure, and the basic structure will become by its method of operating is illustrated below with reference to flow chart
Obtain clearer.To those skilled in the art, retouch by said structure block diagram and with reference to following
The method flow stated belongs to the conventional work of this area building the circuit diagram of the impulsive impedance measurement apparatus
Make, and extra creative work need not be paid.
The flow chart that Fig. 6 illustrates impulse method time domain transient resistance measurement event according to an embodiment of the invention.
As shown in fig. 6, in step S610, by transient state electricity of the sampling module 320 to 120 two ends of element under test
Pressure is sampled, and obtains magnitude of voltage Ux+And Ux-.In step S620, sampling module 320 can touched
Send out under the control of control module 310, synchronously the transient voltage at 224 two ends of reference elements sampled,
Obtain magnitude of voltage Ub1And Ub2.Then, the sampled magnitude of voltage for obtaining can be sent to computing module 330
To be calculated.For example, in step S630, the transient state Leakage Current of bridge is calculated with dynamic compensation method
Ib.Specifically, the transient voltage of bridge can be calculated as Vb=(Ux-+Ub1), which is time-domain value, so
V can be also designated asb(t).Time domain transient voltage VbT () is provided to dynamic compensation module 400, when-frequency become
Time-frequency domain conversion is carried out in mold changing block 410, frequency domain value V is obtainedb(f).Next, in frequency domain compensation
In module 420, using calculated VbThe frequency domain resistance value Z of the bridge of (f) and inputbF (), can be with
Dynamic compensation is carried out, the frequency domain current value I of bridge is obtainedb(f)=Vb(f)/Zb(f).It should be understood that the frequency of bridge
Domain impedance ZbF () is to measure the given value for determining in advance, its measuring method will be described in detail hereinafter.
Finally, the frequency domain current value I of bridgebF () experiences frequency-time-domain-transformation in frequency-when conversion module 430,
Obtain and export temporal current value I of bridgebT (), is also denoted as Ib。
In step S640, the actual current of element under test 120 is flow through in calculating.As it was previously stated, according to base
That hoff's law, flows through the electric current I of element under test 120x=Ib+Iref, wherein IbThe step of having been described above
In be calculated, IrefMay be calculated Iref=(Ub1-Ub2)/Zref, ZrefIt is the resistance value of reference elements 224,
Which is given value.Thus, can obtain flowing through actual current value I of element under test 120x。
Finally, in step S650, by the transient voltage drop V on element under test 120x=(Ux+-Ux-) remove
To flow through its transient current Ix, you can it is calculated transient resistance Z of element under test 120x=Vx/Ix。
According to calculating process above, transient resistance Z of element under test 120xIt is represented by following
Formula (1).
Wherein magnitude of voltage Ux+、Ux-、Ub1And Ub2It is measured value, ZrefAnd ZbIt is given value.But should
It is noted that the bridge Leakage Current part (U in formula (1)x-+Ub1)/ZbIn, do not embody
Dynamic compensation process described above, therefore formula (1) can not reflect the principle of the present invention comprehensively.
The resistance value Z of bridge circuitbCan be demarcated by measuring in advance.For example, can be by with known
Impedance ZcalibCalibrating element be arranged on element under test shielding box 210 in, then perform above-mentioned measurement process.
According to above-mentioned formula (1), you can be back-calculated to obtain the resistance value Z of bridge circuitb, which is represented by following public affairs
Formula (2).
By the resistance value Z for measuring bridge circuit at different frequenciesb, you can obtain its frequency domain characteristic Zb(f)。
Although describing each step according to certain order above, however, it is understood that these steps can not
Necessarily carry out in the described sequence.As long as the method for the present invention can be realized in principle, for each
The execution sequence of step does not have special restriction.
The flow chart that Fig. 7 illustrates impulse method impedance spectroscopy measurement process according to an embodiment of the invention.Such as
Shown in Fig. 7, in step S710, by transient voltage of the sampling module 320 to 120 two ends of element under test
Sampled, obtained magnitude of voltage Ux+And Ux-.In step S720, sampling module 320 can be in triggering
Under the control of control module 310, synchronously the transient voltage at 224 two ends of reference elements is sampled,
Obtain magnitude of voltage Ub1And Ub2.Then, the sampled magnitude of voltage for obtaining can be sent to computing module 330
To be calculated.For example, in step S730, can using with the same step described in Fig. 6,
The Leakage Current I of bridge is calculated using dynamic compensation methodb, and then obtain flowing through in step S740 and treat
Survey actual current value I of element 120x.Finally in step S750, the voltage to 120 two ends of element under test
Difference Vx=(Ux+-Ux-) time-frequency domain conversion is carried out, obtain Vx(f), and to flowing through element under test 120
Electric current IxTime-frequency domain conversion is carried out, I is obtainedx(f).Also, by the voltage at 120 two ends of element under test
Frequency spectrum is divided by the current spectrum for flowing through element under test 120, you can be calculated the multiple resistance of element under test 120
Anti- frequency spectrum Zx(f)=Vx(f)/Ix(f)。
Impulsive impedance measurement apparatus according to an exemplary embodiment of the invention and side is described above
Method.The present invention is reduced the impact of Leakage Current, can be realized very by being measured using impulse transients
High measurement efficiency and precision.The present invention can be applied to carry out the various electronic equipments of impedance measurement
In.
Finally, above-mentioned one exemplary embodiment is merely to illustrate the principle of the present invention, and should not be construed as to this
The restriction of invention.It will be appreciated by persons skilled in the art that defining without departing from claims
In the case of the scope of the present invention, modification on various forms and details, replacement, combination etc. can be carried out
Deng.The scope of the present invention only has claims and its equivalent is limited.
Claims (10)
1. a kind of impulsive impedance measurement apparatus, including：
For installing the element under test shielding box of element under test, which has interface Ix+、Ix-、Ux+And Ux-,
Wherein interface Ix+And Ix-The electric current of element under test, interface U are flow through for measurementx+And Ux-Treat for measurement
Survey the voltage at element two ends；And
Impulsive impedance analyzer, including：
Signal generator, for generating pulsed measuring signals；
Reference elements, the signal generator and the reference elements are connected in series to the unit to be measured
Part shielding box is to form closed-loop path, wherein the element under test and the reference elements pass through bridge
It is connected to each other；And
Sampling analysis unit, its interface U to the element under test shielding boxx+And Ux-And it is described
The voltage signal at reference elements two ends synchronizes sampling, and using dynamic compensation method to calculate
State the impedance of element under test.
2. impulsive impedance measurement apparatus as claimed in claim 1, wherein the sampling analysis unit includes：
Sampling module, for the interface U to the element under test shielding boxx+And Ux-And the reference unit
The voltage signal U at part two endsb1And Ub2Sampled, wherein Ux-It is the close described of the element under test
The voltage of reference elements one end, Ub1It is the voltage of close described element under test one end of the reference elements；
And
Computing module, for the magnitude of voltage obtained based on sampling, calculates described treating using dynamic compensation method
Survey the impedance of element.
3. impulsive impedance measurement apparatus as claimed in claim 2, wherein the computing module includes dynamic
Compensating module, the dynamic compensation module include：
When-frequency conversion module, for the time domain voltage for being received is transformed to frequency domain voltage；
Frequency domain compensation module, for by the frequency domain voltage divided by received frequency domain impedance with obtain frequency
Domain electric current；And
Frequently-when conversion module, for by the frequency domain current transformation be temporal current.
4. impulsive impedance measurement apparatus as claimed in claim 3, wherein the computing module is configured to：
Transient voltage (the U of the bridge obtained based on measurementx-+Ub1), using the dynamic compensation mould
Block is calculated the transient state Leakage Current I of the bridgeb；
Transient voltage (the U at the reference elements two ends obtained based on measurementb1-Ub2), it is calculated stream
Cross the transient current I of the reference elementsref；And
Calculate transient resistance Z of the element under testx=(Ux+-Ux-)/(Ib+Iref)。
5. impulsive impedance measurement apparatus as claimed in claim 3, wherein the computing module is configured to：
Transient voltage (the U of the bridge obtained based on measurementx-+Ub1), using the dynamic compensation mould
Block is calculated the transient state Leakage Current I of the bridgeb；
Transient voltage (the U at the reference elements two ends obtained based on measurementb1-Ub2), it is calculated stream
Cross the transient current I of the reference elementsref；
By the transient state Leakage Current I of the bridgebWith the transient current I of the reference elementsrefIt is added, with
Obtain the transient current I of the element under testx；
Transient current I to the element under testxWhen carrying out-frequency conversion, to obtain the element under test
Current spectrum Ix(f)；
Transient voltage U to the element under test two endsx+And Ux-When carrying out-frequency conversion, it is described to obtain
The voltage spectrum U at element under test two endsx+(f) and Ux-(f)；And
Calculate the complex impedance spectroscopy Z of the element under testx(f)=(Ux+(f)-Ux-(f))/Ix(f)。
6. impulsive impedance measurement apparatus as claimed in claim 2, wherein the sampling analysis unit is also wrapped
Include：
Trigger control module, for controlling the sampling module with the interface to the element under test shielding box
Ux+And Ux-And the voltage signal U at the reference elements two endsb1And Ub2Synchronize sampling.
7. impulsive impedance measurement apparatus as claimed in claim 1, wherein the impulsive impedance analyzer is also
Including output unit, for exporting the impedance of the calculated element under test of the sampling analysis unit.
8. a kind of pulse measuring method of time domain transient resistance, including：
The transient voltage U at synchronized sampling element under test two endsx+And Ux-And the transient state at reference elements two ends
Voltage Ub1And Ub2, wherein the series connection of the element under test, the reference elements and signal generator connects
Connect to form closed-loop path, and transient voltage Ux-It is the adjacent with the reference elements of the element under test
One end voltage, transient voltage Ub1It is one end adjacent with the element under test of the reference elements
Voltage；
The transient current I of the reference elements is flow through in calculatingref=(Ub1-Ub2)/Zref；
Using dynamic compensation method, the transient state based on the bridge for connecting the element under test and the reference elements
Voltage VbCalculate the transient state Leakage Current I of the bridgeb=Vb/Zb, wherein Vb=(Ux-+Ub1)；
The transient current I of the element under test is flow through in calculatingx=Iref+Ib；And
Calculate transient resistance Z of the element under testx=(Ux+-Ux-)/Ix。
9. a kind of pulse measuring method of impedance spectrum, including：
The transient voltage U at synchronized sampling element under test two endsx+And Ux-And the transient state at reference elements two ends
Voltage Ub1And Ub2, wherein the series connection of the element under test, the reference elements and signal generator connects
Connect to form closed-loop path, and transient voltage Ux-It is the adjacent with the reference elements of the element under test
One end voltage, transient voltage Ub1It is one end adjacent with the element under test of the reference elements
Voltage；
The transient current I of the reference elements is flow through in calculatingref=(Ub1-Ub2)/Zref；
Using dynamic compensation method, the transient state based on the bridge for connecting the element under test and the reference elements
Voltage VbCalculate the transient state Leakage Current I of the bridgeb=Vb/Zb, wherein Vb=(Ux-+Ub1)；
The transient current I of the element under test is flow through in calculatingx=Iref+Ib, and when carrying out to which-frequency conversion with
To current spectrum Ix(f)；
Transient voltage difference V to the element under test two endsx=Ux+-Ux-When carrying out-frequency conversion to be obtaining electricity
Voltage-frequency composes Vx(f)；And
By the voltage spectrum at the element under test two ends divided by the current spectrum of the element under test, institute is obtained
State the complex impedance spectroscopy Z of element under testx(f)=Vx(f)/Ix(f)。
10. method as claimed in claim 8 or 9, wherein using dynamic compensation method, based on connection institute
State the transient voltage V of the bridge of element under test and the reference elementsbThe transient state for calculating the bridge is revealed
Electric current IbIncluding：
To the transient voltage VbWhen carrying out-frequency conversion to be obtaining voltage spectrum Vb(f)；
Impedance spectrum Z based on the bridge for being receivedbF (), calculates the current spectrum I of the bridgeb(f)；
And
To the current spectrum Ib(f) perform frequency-when conversion to obtain the transient state Leakage Current I of the bridgeb。
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| CN109782064A (en) * | 2019-01-03 | 2019-05-21 | 国网宁夏电力有限公司电力科学研究院 | A kind of wind power plant output impedance frequency characteristic test analysis method |
| WO2020135354A1 (en) * | 2018-12-29 | 2020-07-02 | 中兴通讯股份有限公司 | Method and device for measuring impedance of transmission channel |
| CN116859126A (en) * | 2023-08-31 | 2023-10-10 | 国网山东省电力公司泰安供电公司 | AC impedance spectrum measurement system and method based on double-channel half-bridge method |
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| CN116859126A (en) * | 2023-08-31 | 2023-10-10 | 国网山东省电力公司泰安供电公司 | AC impedance spectrum measurement system and method based on double-channel half-bridge method |
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