CN106546895A - A kind of diode surge capability test circuit and its control method - Google Patents
A kind of diode surge capability test circuit and its control method Download PDFInfo
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- CN106546895A CN106546895A CN201610893731.2A CN201610893731A CN106546895A CN 106546895 A CN106546895 A CN 106546895A CN 201610893731 A CN201610893731 A CN 201610893731A CN 106546895 A CN106546895 A CN 106546895A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2632—Circuits therefor for testing diodes
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Abstract
The invention provides a kind of diode surge capability test circuit and its control method, the test circuit includes charhing unit, RC resonant elements, rectification unit and measured diode；RC resonant elements include capacitance group and the inductive bank connected, and charhing unit includes power supply and the charge switch connected；RC resonant elements, rectification unit and measured diode are in parallel respectively；Charhing unit is in parallel with capacitance group；Methods described includes：Closure charge switch, power supply charge to capacitance group：Charge switch is disconnected after the voltage of capacitance group reaches its preset value；Control RC resonant elements export surge current to measured diode；Control rectification unit carries out surge test to surge current rectification；Back-pressure test switch is closed after the completion of surge test carries out voltage-withstand test.Compared with prior art, the present invention is provided a kind of diode surge capability test circuit and its control method, can persistently export surge forward current to measured diode, to test the repetition surge capability of measured diode.
Description
Technical Field
The invention relates to the technical field of power electronic device testing, in particular to a diode surge performance testing circuit and a control method thereof.
Background
With the rapid development of power electronic devices, the structure of the controllable device reverse diode is widely applied to the fields of power systems, locomotive traction, industrial frequency conversion and the like. The performance and reliability of the diode have important influence on the working capacity and stability of the system, so that the accurate and reasonable test technology has important significance on the design and use of the diode and the system.
At present, the performance test of the diode mainly comprises the tests of dynamic and static parameters, surge current and the like. The standard surge current test is listed as a type test item by the relevant national standard, the test method is mature and common, but the application working condition of the diode is changed to a certain extent along with the increasing expansion of the application range of the power electronic device. For example, in a power system, a diode needs to bear not only a single pulse surge current, but also a surge current with a certain number of continuous pulses when the system is short-circuited, and fig. 1 is a waveform diagram of the continuous pulse surge current, and as shown in the figure, the peak value of each surge current of the continuous pulse surge current is gradually and slightly attenuated. However, the standard surge current test is only suitable for detecting the single-pulse surge current, and meanwhile, in the prior art, most of diode test equipment is standard surge test equipment, so that the reliability of the power electronic device passing through the continuous pulse surge current cannot be effectively tested.
Disclosure of Invention
In order to overcome the defects of the prior art, the invention provides a diode surge performance testing circuit and a control method thereof.
In a first aspect, a technical solution of a diode surge performance test circuit in the present invention is:
the test circuit comprises a charging unit, an RC resonance unit, a rectifying unit and a tested diode; the RC resonance unit comprises a capacitor group and an inductor group which are connected in series, and the charging unit comprises a power supply and a charging switch which are connected in series;
the RC resonance unit, the rectifying unit and the tested diode are respectively connected in parallel;
the charging unit is connected in parallel with the capacitor bank.
Further, a preferred technical solution provided by the present invention is: the rectifying unit is a controllable rectifying unit.
Further, a preferred technical solution provided by the present invention is: the RC resonance unit further comprises a surge test switch; the surge test switch is connected between the capacitor bank and the inductor bank;
the rectifying unit is a controllable rectifying unit or an uncontrollable rectifying unit.
Further, a preferred technical solution provided by the present invention is: the charging unit further comprises a back-voltage test switch;
one of the back-voltage test switches is connected between the positive pole of the power supply and the cathode of the diode under test, and the other back-voltage test switch is connected between the negative pole of the power supply and the anode of the diode under test.
In a second aspect, a technical solution of a control method for a diode surge performance test circuit in the present invention is:
the test circuit comprises a charging unit, and an RC resonance unit, a rectifying unit and a tested diode which are respectively connected in parallel; the charging unit comprises a power supply and a charging switch which are connected in series, and the power supply is connected with the diode to be tested in parallel in a reverse direction through a back voltage test switch;
the RC resonance unit comprises a capacitor bank, a surge test switch and an inductor bank which are sequentially connected in series, and the rectifying unit is a controllable rectifying unit or an uncontrollable rectifying unit; or the RC resonance unit comprises a capacitor group and an inductor group which are connected in series, and the rectifying unit is a controllable rectifying unit;
the control method comprises the following steps:
closing the charging switch, and charging the capacitor bank by the power supply: when the voltage of the capacitor bank reaches a preset value, the charging switch is switched off, and the RC resonance unit outputs surge current to the tested diode;
controlling the rectifying unit to rectify the surge current so that the diode to be tested continuously passes through the forward surge current to perform surge test on the diode to be tested; and when the surge test is finished, the back-pressure test switch is closed, and the power supply outputs reverse high voltage to the tested diode so as to carry out voltage withstand test on the tested diode.
Further, a preferred technical solution provided by the present invention is: when RC resonance unit is including the electric capacity group, surge test switch and the inductance group of establishing ties in proper order, just when the rectifier cell is controllable rectifier cell or uncontrollable rectifier cell, carry out the surge test to the diode under test and include:
closing the surge test switch, and outputting surge current to the tested diode by the RC resonance unit;
controlling the rectifying unit to rectify the surge current so that the diode to be tested continuously passes through the forward surge current;
and detecting the forward surge current, and switching off the surge test switch when the pulse number reaches a preset value.
Further, a preferred technical solution provided by the present invention is: when the RC resonant unit includes a capacitor bank and an inductor bank connected in series, and the rectifying unit is a controllable rectifying unit, the surge test on the diode to be tested includes:
after the RC resonance unit outputs surge current to the diode to be tested, the rectification unit is controlled to rectify the surge current, so that the diode to be tested continuously passes through the forward surge current;
and detecting the forward surge current, and controlling the rectifying unit to output a reverse surge current to the diode to be detected after the pulse number reaches a preset value, so that the diode is reversely cut off.
Compared with the closest prior art, the invention has the beneficial effects that:
1. according to the diode surge performance test circuit provided by the invention, the RC resonance unit discharges to the tested diode to realize the output of surge current to the tested diode, after the rectifying unit rectifies the surge current, the RC resonance unit can be controlled to continuously output forward surge current to the tested diode, and meanwhile, the peak value and the frequency of the surge current can be adjusted by setting the capacitance value of the capacitor bank, the inductance value of the inductor bank and the voltage value;
2. according to the control method of the diode surge performance test circuit, the surge test and the back pressure test can be performed on the tested diode by switching the charging switch and the back pressure test switch, the back pressure test can be performed quickly after the surge test is finished, and the utilization rate of the test circuit is improved.
Drawings
FIG. 1: a continuous pulse surge current waveform schematic diagram;
FIG. 2: the invention discloses a schematic diagram of a diode surge performance test circuit;
wherein, 1: a power source; 2: a charging switch; 3: a capacitor bank; 4: an inductor group; 5: a surge test switch; 6: a rectifying unit; 7: a diode under test; 8: and a back pressure test switch.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The following describes a diode surge performance test circuit provided in an embodiment of the present invention with reference to the accompanying drawings.
Fig. 2 is a schematic diagram of a diode surge performance testing circuit in an embodiment of the present invention, and as shown in the drawing, the diode surge performance testing circuit in the embodiment includes a charging unit, an RC resonant unit, a rectifying unit 6, and a diode 7 to be tested. Wherein,
the RC resonant unit comprises a capacitor group 3 and an inductor group 4 which are connected in series, and the charging unit comprises a power supply 1 and a charging switch 2 which are connected in series.
The RC resonance unit, the rectifying unit 6 and the tested diode 7 are respectively connected in parallel, and the charging unit is connected in parallel with the capacitor bank 3.
In this embodiment, the RC resonant unit discharges to the diode 7 to be tested to output the surge current to the diode 7, and the rectifying unit 6 rectifies the surge current to control the RC resonant unit to continuously output the forward surge current to the diode 7 to be tested, as shown in fig. 1, the forward surge current includes a plurality of continuous pulse currents. Meanwhile, the peak value and the frequency of the surge current can be adjusted by setting the capacitance value of the capacitor bank, the inductance value of the inductor bank and the voltage value.
Further, the diode surge performance test circuit in the present embodiment further includes the following structure.
In this embodiment, the rectifying unit may be a controllable rectifying unit or an uncontrollable rectifying unit. The RC resonant unit should also comprise a surge test switch 5 arranged between the capacitor bank 3 and the inductor bank 4 when using a non-controllable rectifying unit, and may comprise only the capacitor bank 3 and the inductor bank 4 in series when using a controllable rectifying unit.
In this embodiment, the surge test switch 5 is closed to control the RC resonant unit to output the surge current to the diode 7 to be tested, and when the pulse number of the forward surge current passing through the diode 7 to be tested reaches the preset value, the surge test switch 5 is opened to control the RC resonant unit not to output the surge current to the diode 7 to be tested any more, so as to end the surge test.
In this embodiment, the rectifying unit 6 is a controllable rectifying unit, and the RC resonant unit only includes the capacitor group 3 and the inductor group 4 connected in series, and when the pulse number of the forward surge current passing through the diode 7 reaches a preset value, the controllable rectifying unit may be controlled to output a reverse surge current to the diode 7, so that the diode 7 is cut off in a reverse direction, and the surge test is ended.
Further, the charging unit in this embodiment may further include the following structure.
The charging unit in this embodiment further comprises a back-voltage test switch 8. Wherein,
one of the reverse voltage test switches 8 is connected between the positive pole of the power source 1 and the cathode of the diode under test 7, and the other reverse voltage test switch 8 is connected between the negative pole of the power source 1 and the anode of the diode under test 7.
In the embodiment, after the surge test is completed, the reverse voltage test switch 8 is closed, and the power supply 1 is controlled to output reverse high voltage to the tested diode 7, so that the tested diode 7 is subjected to voltage withstanding test, the utilization rate of equipment is improved, and the use cost of the equipment is indirectly reduced.
The invention also provides a control method of the diode surge performance test circuit, and provides a specific embodiment.
The test circuit in this embodiment includes a charging unit, and an RC resonant unit, a rectifying unit 6 and a diode 7 to be tested, which are respectively connected in parallel. The charging unit comprises a power supply 1 and a charging switch 2 which are connected in series, wherein the power supply 1 is connected with a diode 7 to be tested in an inverse parallel mode through a back voltage test switch 8. The RC resonance unit comprises two topological structures, specifically:
(1) the RC resonance unit comprises a capacitor group 3, a surge test switch 5 and an inductor group 4 which are sequentially connected in series, and meanwhile, the rectifying unit 6 can be a controllable rectifying unit or an uncontrollable rectifying unit.
(2) The RC resonance unit comprises a capacitor group 3 and an inductor group 4 which are connected in series, and meanwhile, the rectifying unit is a controllable rectifying unit.
The control method of the diode surge performance test circuit in the embodiment can be implemented according to the following steps.
1. The charging switch 2 is closed, and the power supply 1 charges the capacitor bank 3: the charging switch 2 is switched off when the voltage of the capacitor bank 3 reaches its preset value.
2. The RC resonant unit outputs a surge current to the diode 7 under test.
3. The control rectification unit 6 rectifies the surge current, so that the diode 7 to be tested continuously passes through the forward surge current to carry out surge test on the forward surge current; and when the surge test is finished, the back-pressure test switch 8 is closed, and the power supply 1 outputs a reverse high voltage to the tested diode so as to carry out a voltage withstanding test on the tested diode.
In the embodiment, the surge test and the back pressure test can be performed on the tested diode 7 by switching the charging switch 2 and the back pressure test switch 8, the back pressure test can be performed quickly after the surge test is finished, and the utilization rate of the test circuit is improved.
Further, the surge test of the diode under test in this embodiment may be performed according to the following steps.
In this embodiment, the RC resonant unit includes a capacitor group 3, a surge test switch 5 and an inductor group 5 connected in series in sequence, and when the rectifying unit 6 is a controllable rectifying unit or an uncontrollable rectifying unit. The surge test of the tested diode is specifically as follows:
1. and closing the surge test switch 5, and outputting the surge current to the tested diode 7 by the RC resonance unit.
2. The control rectification unit 6 rectifies the surge current, so that the diode 7 to be tested continuously passes through the forward surge current.
3. And detecting the forward surge current, and switching off the surge test switch when the pulse number reaches a preset value.
In this embodiment, the surge test switch 5 is closed to control the RC resonant unit to output the surge current to the diode 7 to be tested, and when the pulse number of the forward surge current passing through the diode 7 to be tested reaches the preset value, the surge test switch 5 is opened to control the RC resonant unit not to output the surge current to the diode 7 to be tested any more, so as to end the surge test.
Further, the surge test of the diode under test in this embodiment can also be performed according to the following steps.
In this embodiment, the RC resonant unit includes a capacitor group 3 and an inductor group 4 connected in series, and meanwhile, the rectifying unit is a controllable rectifying unit. The surge test of the tested diode is specifically as follows:
1. the RC resonance unit outputs surge current to the diode 7 to be tested, and the rectifying unit 6 is controlled to rectify the surge current, so that the diode 7 to be tested continuously passes through the forward surge current.
2. And detecting the forward surge current, and controlling the rectifying unit 6 to output the reverse surge current to the diode to be detected after the pulse number reaches a preset value, so that the diode is reversely cut off.
In this embodiment, the rectifying unit 6 is a controllable rectifying unit, and the RC resonant unit only includes the capacitor group 3 and the inductor group 4 connected in series, and when the pulse number of the forward surge current passing through the diode 7 reaches a preset value, the controllable rectifying unit may be controlled to output a reverse surge current to the diode 7, so that the diode 7 is cut off in a reverse direction, and the surge test is ended.
It will be apparent to those skilled in the art that various changes and modifications may be made in the present invention without departing from the spirit and scope of the invention. Thus, if such modifications and variations of the present invention fall within the scope of the claims of the present invention and their equivalents, the present invention is also intended to include such modifications and variations.
Claims (7)
1. The diode surge performance test circuit is characterized by comprising a charging unit, an RC resonance unit, a rectifying unit and a tested diode; the RC resonance unit comprises a capacitor group and an inductor group which are connected in series, and the charging unit comprises a power supply and a charging switch which are connected in series;
the RC resonance unit, the rectifying unit and the tested diode are respectively connected in parallel;
the charging unit is connected in parallel with the capacitor bank.
2. The diode surge performance test circuit of claim 1,
the rectifying unit is a controllable rectifying unit.
3. The diode surge performance test circuit of claim 1, wherein said RC resonant unit further comprises a surge test switch; the surge test switch is connected between the capacitor bank and the inductor bank;
the rectifying unit is a controllable rectifying unit or an uncontrollable rectifying unit.
4. The diode surge performance test circuit of claim 1, wherein said charging unit further comprises a back-voltage test switch;
one of the back-voltage test switches is connected between the positive pole of the power supply and the cathode of the diode under test, and the other back-voltage test switch is connected between the negative pole of the power supply and the anode of the diode under test.
5. A control method of a diode surge performance test circuit is characterized in that the test circuit comprises a charging unit, an RC resonance unit, a rectifying unit and a tested diode which are respectively connected in parallel; the charging unit comprises a power supply and a charging switch which are connected in series, and the power supply is connected with the diode to be tested in parallel in a reverse direction through a back voltage test switch;
the RC resonance unit comprises a capacitor bank, a surge test switch and an inductor bank which are sequentially connected in series, and the rectifying unit is a controllable rectifying unit or an uncontrollable rectifying unit; or the RC resonance unit comprises a capacitor group and an inductor group which are connected in series, and the rectifying unit is a controllable rectifying unit;
the control method comprises the following steps:
closing the charging switch, and charging the capacitor bank by the power supply: when the voltage of the capacitor bank reaches a preset value, the charging switch is switched off, and the RC resonance unit outputs surge current to the tested diode;
controlling the rectifying unit to rectify the surge current so that the diode to be tested continuously passes through the forward surge current to perform surge test on the diode to be tested; and when the surge test is finished, the back-pressure test switch is closed, and the power supply outputs reverse high voltage to the tested diode so as to carry out voltage withstand test on the tested diode.
6. The method as claimed in claim 5, wherein when the RC resonant unit includes a capacitor bank, a surge test switch and an inductor bank connected in series in sequence, and the rectifying unit is a controllable rectifying unit or an uncontrollable rectifying unit, the surge test of the diode under test includes:
closing the surge test switch, and outputting surge current to the tested diode by the RC resonance unit;
controlling the rectifying unit to rectify the surge current so that the diode to be tested continuously passes through the forward surge current;
and detecting the forward surge current, and switching off the surge test switch when the pulse number reaches a preset value.
7. The method as claimed in claim 5, wherein when the RC resonant unit comprises a capacitor bank and an inductor bank connected in series, and the rectifying unit is a controllable rectifying unit, the surge test of the diode under test comprises:
after the RC resonance unit outputs surge current to the diode to be tested, the rectification unit is controlled to rectify the surge current, so that the diode to be tested continuously passes through the forward surge current;
and detecting the forward surge current, and controlling the rectifying unit to output a reverse surge current to the diode to be detected after the pulse number reaches a preset value, so that the diode is reversely cut off.
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| CN201610893731.2A CN106546895B (en) | 2016-10-13 | 2016-10-13 | Diode surge performance test circuit and control method thereof |
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| CN111693839A (en) * | 2020-06-17 | 2020-09-22 | 西安交通大学 | Method for distinguishing degradation reason of SiC MOSFET under repeated surge current of body diode |
| CN115389900A (en) * | 2022-09-16 | 2022-11-25 | 合肥工业大学 | Surge current test circuit based on SiC MOSFET and charging and discharging method |
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| CN106546895B (en) | 2021-08-20 |
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Effective date of registration: 20170714 Address after: 102209 Beijing City, Changping District science and Technology Park in the future smart grid research institute hospital Applicant after: GLOBAL ENERGY INTERCONNECTION RESEARCH INSTITUTE Applicant after: State Grid Corporation of China Applicant after: State Grid Zhejiang Electric Power Company Applicant after: Jiangsu is with the electric Science and Technology Ltd. of core Address before: 102209 Beijing City, Changping District science and Technology Park in the future smart grid research institute hospital Applicant before: GLOBAL ENERGY INTERCONNECTION RESEARCH INSTITUTE Applicant before: State Grid Corporation of China Applicant before: Jiangsu is with the electric Science and Technology Ltd. of core |
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