CN106482672A - A kind of method and system judging lens plane and test pattern plane parallelism - Google Patents
A kind of method and system judging lens plane and test pattern plane parallelism Download PDFInfo
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- CN106482672A CN106482672A CN201610930310.2A CN201610930310A CN106482672A CN 106482672 A CN106482672 A CN 106482672A CN 201610930310 A CN201610930310 A CN 201610930310A CN 106482672 A CN106482672 A CN 106482672A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
- G01B11/27—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes
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Abstract
The invention discloses a kind of method and system judging lens plane and test pattern plane parallelism.The method includes：By test pattern horizontal positioned, test pattern is provided with marked region；Optical center to be measured on test fixture is placed on the plumb line of labelling regional center on test pattern, and the center in alignment mark region；Obtain the picture of the test pattern of lens shooting to be measured, the physical location of labelling regional center on identification picture；Calculate the depth of parallelism of lens plane to be measured and test pattern plane according to formula；Judging whether the depth of parallelism is in the range of predetermined angle, if being judged as YES, judging parallel；If being judged as NO, judge not parallel.Technical scheme is suitable for all products, including the irregular product of profile, highly versatile, is judged parallel according to specific depth of parallelism quantized values, the subjective factorss of exclusion people, and simple and reliable, precision is controlled.
Description
Technical field
The present invention relates to technical field of optical detection, judge that lens plane is parallel with test pattern plane particularly to a kind of
The method and system of degree.
Background technology
A lot of smart electronicses products all have camera function now, and the camera lens in these electronic products with camera function exists
In assembling production process, need to carry out performance detection, particularly the optical characteristics of camera lens are tested, to ensure product function
Normality, keep good Consumer's Experience.The accuracy of the test result of optical characteristics is all with lens plane to be measured and survey
Attempt card plane opposing parallel as premise, therefore, during the optical characteristic test of camera lens to be measured, keep test fixture
On lens plane to be measured and test pattern plane opposing parallel be impact testing result accuracy a key factor.
In prior art, the method for differentiating the depth of parallelism mainly has following two：
One is, the instrument such as use level instrument, and a face finding test fixture is parallel with the plane of test pattern, in configuration
In the case of the product design of camera lens to be measured rule relatively, the corresponding face of camera lens to be measured need only be allowed to be adjacent to parallel with graph card plane
Frock plane, you can ensure that the lens plane to be measured on test fixture is opposing parallel with test pattern plane.But, this method
Suffer from the drawback that：1), with scientific and technological development, the size of electronic product is less and less, some product designs also become be not
Very regular, institute can not adapt to all products in this way, has some limitations；2), assume the test request depth of parallelism -2
Spend to+2 degree, the method can not obtain a specific depth of parallelism quantized values, haves the shortcomings that the depth of parallelism is not energetic.
Two are, by the video pictures of test software real-time play lens shooting, whether mark that artificial judgment is selected exists
In preset range, the method can ensure opposing parallel to a certain extent, but there is also shortcoming：1), this method needs are to be measured
Video capability realized by camera lens, but some camera lenses or can not be not carried out the function of video, and the method has certain limitation
Property；2), there are the subjective factorss of people it is possible to test result can be affected and is forbidden because subjective error causes not parallel；3), same
Sample haves the shortcomings that the depth of parallelism is not energetic.
Content of the invention
In view of prior art there is a problem of the depth of parallelism not energetic it is proposed that the present invention a kind of judge lens plane with
The method and system of test pattern plane parallelism, to solve or to solve the above problems at least in part.
According to an aspect of the invention, it is provided a kind of side judging lens plane and test pattern plane parallelism
Method, methods described includes：
By test pattern horizontal positioned, described test pattern is provided with marked region；
Optical center to be measured on test fixture is placed on the plumb line of labelling regional center on described test pattern, and
It is directed at the center of described marked region；
Obtain the picture of the described test pattern of described lens shooting to be measured, identify labelling regional center on described picture
Physical location；
According to formulaCalculate the flat of described lens plane to be measured and described test pattern plane
Row degree；Wherein d is the physical location of labelling regional center and described center picture on the described picture being represented using pixel count
The distance of theoretical position, N is the corresponding pixel count of unit distance on described picture, and D is described test pattern to described mirror to be measured
The distance of head；
Judging whether the described depth of parallelism is in the range of predetermined angle, if being judged as YES, judging parallel；If being judged as
No, then judge not parallel.
According to another aspect of the present invention, there is provided a kind of judge lens plane and test pattern plane parallelism be
System, described system includes test pattern and test fixture, and described test pattern is provided with marked region, and described system also includes：
Placement unit, for by test pattern horizontal positioned, the optical center to be measured on test fixture being placed in described survey
Attempt on the plumb line of labelling regional center on card, and be directed at the center of described marked region；
Picture acquiring unit, for obtaining the picture of the described test pattern of described lens shooting to be measured；
Center identification unit, for identifying the physical location of labelling regional center on described picture；
Depth of parallelism computing unit, for according to formulaCalculate described lens plane to be measured with
The depth of parallelism of described test pattern plane；Wherein d is the reality of labelling regional center on the described picture being represented using pixel count
The distance of the theoretical position of position and described center picture, N is the corresponding pixel count of unit distance on described picture, and D is described
Test pattern is to the distance of described camera lens to be measured；
Parallel judging unit, for judging whether the described depth of parallelism is in the range of predetermined angle, if being judged as YES, sentences
Allocate row；If being judged as NO, judge not parallel.
In sum, the present invention only need to meet the plumb line that optical center to be measured is located at test pattern marked region center
On, be applicable to the irregular product of profile, and can avoid to a certain extent lens shooting to be measured image distortion to inspection
Survey the impact of result；The picture simultaneously analyzing lens shooting to be measured is parallel with the plane of test pattern to judge lens plane to be measured
The method of degree, can not rely on specific graph card, and flexibility ratio is high；Further according to the physical location of labelling regional center on picture with
The distance of the theoretical position of center picture obtains depth of parallelism quantized values, thus more accurately judging lens plane to be measured and test
Whether graph card plane is parallel.It can be seen that, technical scheme is suitable for all products, including the irregular product of profile, general
Property strong, judged according to specific depth of parallelism quantized values parallel, exclude the subjective factorss of people, simple and reliable, precision is controlled.
Brief description
The method of a kind of judgement lens plane that Fig. 1 provides for one embodiment of the invention and test pattern plane parallelism
Schematic diagram；
The relative position schematic diagram of the test pattern that Fig. 2 provides for one embodiment of the invention and camera lens to be measured；
The relative position schematic diagram of marked region on the Color test pattern that Fig. 3 provides for one embodiment of the invention；
The system of a kind of judgement lens plane that Fig. 4 provides for one embodiment of the invention and test pattern plane parallelism
Schematic diagram；
A kind of judgement lens plane that Fig. 5 provides for another embodiment of the present invention with test pattern plane parallelism is
System schematic diagram.
Specific embodiment
In view of prior art there is a problem of the depth of parallelism not energetic it is proposed that the present invention a kind of judge lens plane with
The method and system of test pattern plane parallelism.The mentality of designing of the present invention is：The center of camera lens to be measured is directed at test chart
On card, the center of marked region is it is assumed that two planes are parallel, and the center of marked region will be located at the immediate vicinity of picture, then,
The distance of the theoretical position of physical location and center picture of analysis picture acceptance of the bid note regional center, obtain lens plane to be measured with
The depth of parallelism quantized values of test pattern plane, and then judge whether two planes are parallel.For making the purpose of the present invention, technical scheme
Clearer with advantage, below in conjunction with accompanying drawing, embodiment of the present invention is described further in detail.
The method of a kind of judgement lens plane that Fig. 1 provides for one embodiment of the invention and test pattern plane parallelism
Schematic diagram.As shown in figure 1, the method includes：
Step S110, by test pattern horizontal positioned, test pattern is provided with marked region.For ensureing entering of subsequent step
OK, test pattern needs horizontal positioned, and this process can be carried out using instruments such as level indicators.Meanwhile, the marked region on test pattern
No particular requirement in size, adapts to graph card；Also no particular requirement on position；The number of even marked region does not also limit
Fixed, the depth of parallelism can be judged in conjunction with the relative position of multiple marked regions in the present invention, specific embodiment can be carried out hereinafter in detail
Describe in detail bright.In addition, the marked region on test pattern can be the pattern that test pattern has in itself, such as SFR test pattern
On black bars, color lump on Color test pattern etc.；Can also be centered on known point a certain on test pattern
The point of interface of four adjacent color lumps on the region of sizing, such as Color test pattern.The setting motility of therefore marked region
Higher it is adaptable to various test patterns.
Step S120, the optical center to be measured on test fixture is placed in the plumb line of labelling regional center on test pattern
On, and the center in alignment mark region.Fig. 2 is that the test pattern of one embodiment of the invention is shown with the relative position of camera lens to be measured
It is intended to, the center of camera lens 210 wherein to be measured is placed on the plumb line at marked region 230 center on test pattern 220, test pattern
Distance to camera lens to be measured is D.Because the picture of lens shooting to be measured is that there is certain distortion, lens plane even to be measured
Not parallel with test pattern plane, the relative position of the marked region showing on picture there will not be too big change,
If only the relative position according to marked region in picture judges the depth of parallelism, with regard to the predetermined precision of difficult to reach.Accordingly, it would be desirable to will
Optical center to be measured on test fixture is placed on the plumb line of labelling regional center on test pattern, with alignment mark region
Center.This step can be completed in the range of tolerable error in prior art.It is specially：Ensure that test pattern is level first
, then a plumb line is drawn in the center in marked region, allows optical center to be measured to be located on vertical line.
Step S130, obtains the picture of the test pattern of lens shooting to be measured, the reality of labelling regional center on identification picture
Border position.Optical center to be measured on test fixture is directed at the center of marked region on test pattern, lens shooting therefore to be measured
Picture on marked region center also should be located at picture near center location.Labelling regional center on obtaining picture
Physical location after, you can obtain the theoretical position of labelling regional center on physical location and the picture at marked region center away from
From the distance typically resulting in is pixel count.
Step S140, according to formulaCalculate lens plane to be measured and test pattern plane
The depth of parallelism；Wherein d is the theoretical position of the physical location of labelling regional center and center picture on the picture being represented using pixel count
The distance put, N is the corresponding pixel count of unit distance on picture, and D is the distance of test pattern to camera lens to be measured.Because d is to adopt
The distance values being represented with pixel count, in formula, d/N is divided by the corresponding pixel count of unit distance with pixel count, obtain be away from
From numerical value, its unit is identical with the unit of D distance values, thus passing through formula againTool can be obtained
The angle value of body is as depth of parallelism quantized values.
Step S150, judges whether the depth of parallelism is in the range of predetermined angle, if being judged as YES, judges parallel；If sentencing
It is no for breaking, then judge not parallel.Such as, judge to require the depth of parallelism to spend to+2 degree -2, then will determine that calculated
Whether the depth of parallelism is spent to+2 degree -2, if within this range, evaluation degree meets the requirements, and judges parallel；If not existing
In the range of this, then judge not parallel.It can be seen that, the method for the present invention excludes the subjective factorss of people, and the product shape to camera lens to be measured
Shape does not limit.
In actual decision process, due to test pattern to camera lens to be measured apart from D necessarily, unit distance pair on picture
The pixel count N answering is certain, is according to picture subscript therefore according to the parallel angle that formula theta=arc tan (d/N/D) obtains
The physical location of note regional center to be determined apart from d with the theoretical position of described center picture, so can will judge to require to put down
Row degree scope is converted into the distance range of the theoretical position of the physical location of labelling regional center and center picture on picture.Obtaining
After the physical location of labelling regional center and the actual range of theoretical position of center picture on picture, directly judge this reality
Whether distance is in the distance range requiring.
In order to accurately find marked region on the picture of lens shooting to be measured, need to ensure the marked region on test pattern
There is obvious difference with non-marked area, generally can be made a distinction with the difference of pigment value.In the present invention one
In individual embodiment, on test pattern, the pigment value of marked region and the difference of the pigment value of non-marked area on test pattern are more than
Or it is equal to default pigment limit value.Difference is more obvious, and the accuracy of differentiation is higher, in this step, sets a default pigment limit
Value, on test pattern, the pigment value of marked region and the difference of the pigment value of non-marked area on test pattern are more than or equal to
Think when default pigment limit value that both have obvious difference, beneficial to identification.
In one embodiment of the invention, identify the reality of labelling regional center on picture in step S130 shown in Fig. 1
Border position includes：
Choose the several points on labelling region contour on picture；The several points matching that will be chosen using method of least square
Cheng Yuan, central coordinate of circle that this is justified is as the physical location of labelling regional center on picture.On the marked region profile chosen
The number of point does not limit it is ensured that finding a week of marked region.It should be noted that choose picture on marked region wheel
Inevitably there are some noises during several points on exterior feature, removed using existing algorithm and adopt again after these noises
Use least square fitting Cheng Yuan, the present invention is not construed as limiting to the algorithm removing noise.Specifically, choose marked region on picture
Several points on profile include：
Centered on the theoretical position of center picture, preset length calibrates an area-of-interest for radius, emerging feeling
Any one found in interesting region on marked region is put as current point；With current point as starting point, along area-of-interest radius
Outwards search for, search out reverse search after the point in several non-marked area, by search first pigment value mutation
Point is as first point on marked region profile；Current point is sequentially advanced clockwise or counterclockwise one in advance
If determining next current point after the distance of step-length, repeat the above steps find the next point on marked region profile, directly
To around area-of-interest one week.For judging whether around area-of-interest one week, can be by the labelling searching recently
The distance of first point on the point on region contour and marked region profile is judged.
Wherein, preset length sets according to the size of marked region, to ensure that area-of-interest comprises marked region.
In a specific example, the marked region on test pattern is black bars, and the length of side is 400 pixel values, reason
It is (1200,1200) by center, then the center of the area-of-interest of demarcation is (1200,1200), and preset length is set to
300 pixel values, choose the several points on labelling region contour on picture in this area-of-interest.
In order to further ensure that the accuracy of the center of marked region on picture, the number of marked region does not also limit
Fixed, multiple marked regions can be set, the relative position in conjunction with multiple marked regions judges the depth of parallelism further.For example, in SFR
In graph card, the top in test pattern, bottom, left part, right part, middle part set 5 marked regions, according to this 5 mark zones
The pattern characteristics in domain, that is, relative position relation identify middle part marked region as centre mark region, then known again
The step of the physical location of centre mark regional center on other picture, to ensure the accuracy of identified marked region；Knowing
After not going out the physical location of centre mark regional center on picture, also can be according to the relative position of 5 marked regions in picture
Relation, determines that the physical location of centre mark regional center finding is strictly the center in centre mark region, that is, be in top,
Bottom, left part, on the intersection point of the line of centres of the marked region of right part, rather than other point, further ensure that side shown in Fig. 1
The accuracy of the judgement depth of parallelism of method.
The relative position schematic diagram of marked region on the Color test pattern that Fig. 3 provides for one embodiment of the invention.As
Shown in Fig. 3, with test pattern, the midpoint of the line at color lump 330 center of the color lump 320 of upper left quarter and right lower quadrant is for setting mark
Note region 310, by the center of alignment lenses marked region 310 to be measured, the reality at marked region 310 center on identifying picture
Behind position, marked region 310 center of identification also according to the relative position relation of this color lump 320 and 330 in picture, can be determined
Physical location is strictly the center of marked region, that is, be in the midpoint of the line at this color lump 320 and 330 centers.
The system of a kind of judgement lens plane that Fig. 4 provides for one embodiment of the invention and test pattern plane parallelism
Schematic diagram.As shown in figure 4, the system 400 of this judgement lens plane and test pattern plane parallelism include test pattern 410 and
Test fixture 420, test pattern is provided with marked region, the system of this judgement lens plane and test pattern plane parallelism
400 also include：
Placement unit 430, for by test pattern horizontal positioned, the optical center to be measured on test fixture being placed in test
On the plumb line of labelling regional center on graph card, and the center in alignment mark region.
Picture acquiring unit 440, for obtaining the picture of the test pattern of lens shooting to be measured.
Center identification unit 450, for identifying the physical location of labelling regional center on picture.
Depth of parallelism computing unit 460, for according to formula theta=arc tan (d/N/D) calculate lens plane to be measured with
The depth of parallelism of test pattern plane；Wherein d is the theoretical position of the physical location of labelling regional center and center picture on picture
Distance, N be picture on the corresponding pixel count of unit distance, D is the distance of test pattern to camera lens to be measured.
Parallel judging unit 470, for judging whether the depth of parallelism is in the range of predetermined angle, if being judged as YES, sentences
Allocate row；If being judged as NO, judge not parallel.
In one embodiment of the invention, on the pigment value of marked region and test pattern non-marked area pigment value
Difference be more than or equal to default pigment limit value.
A kind of judgement lens plane that Fig. 5 provides for another embodiment of the present invention with test pattern plane parallelism is
System schematic diagram.As shown in figure 5, judging that lens plane is included with the system 500 of test pattern plane parallelism：Test pattern 510,
Test fixture 520, placement unit 530, picture acquiring unit 540, center identification unit 550, depth of parallelism computing unit 560, flat
Row judging unit 570；Center identification unit 550 includes：Profile point chooses module 551, fitting module 552 and center demarcating module
553.Wherein test pattern 510, test fixture 520, placement unit 530, picture acquiring unit 540, center identification unit 550,
Depth of parallelism computing unit 560, parallel judging unit 570 and the test pattern 410 shown in Fig. 4, test fixture 420, placement unit
430th, picture acquiring unit 440, center identification unit 450, depth of parallelism computing unit 460, parallel judging unit 470 have identical
Function, identical part will not be described here.
Profile point chooses module 551, for choosing the several points on labelling region contour on picture.
Fitting module 552, for fitting to circle using method of least square by the several points that profile point chooses module selection.
Center demarcating module 553, for the central coordinate of circle of circle that fits to fitting module as marked region on picture
The physical location at center.
In one embodiment of the invention, profile point choose module 551 specifically for：Theoretical position with center picture
Centered on, preset length calibrates an area-of-interest for radius, finds arbitrary on marked region in area-of-interest
Individual point is as current point；With current point as starting point, outwards search for along area-of-interest radius, search out several non-marked area
Reverse search after point on domain, using the point of search first pigment value mutation as first on marked region profile
Point；Next working as is determined after distance current point being sequentially advanced clockwise or counterclockwise a default step-length
Front, repeat the above steps find the next point on marked region profile, until around area-of-interest one week till.
In one embodiment of the invention, preset length sets according to the size of marked region, to ensure region of interest
Domain comprises marked region.
In sum, the present invention only need to meet the plumb line that optical center to be measured is located at test pattern marked region center
On, be applicable to the irregular product of profile, and can avoid to a certain extent lens shooting to be measured image distortion to inspection
Survey the impact of result；The picture simultaneously analyzing lens shooting to be measured is parallel with the plane of test pattern to judge lens plane to be measured
The method of degree, can not rely on specific graph card, and flexibility ratio is high；Calculate lens plane to be measured and test pattern further according to formula
The depth of parallelism of plane, can obtain depth of parallelism quantized values, more accurately judge whether are lens plane to be measured and test pattern plane
Parallel.It can be seen that, technical scheme is suitable for all products, and including the irregular product of profile, highly versatile, according to concrete
Depth of parallelism quantized values judge parallel, the subjective factorss of exclusion people, simple and reliable, precision is controlled.
It should be noted that the method and system judging lens plane and test pattern plane parallelism of the present invention
For the trimming process of the test fixture of camera lens to be measured, by the method for the present invention judge not parallel after, can be obtained according to the present invention
To the numerical value of the depth of parallelism manually adjust frock, until output distance results meet the requirement of the test depth of parallelism, because product is deposited
In certain error, the system call interception of frock can be carried out by verifying the product of some different sizes, if test can be met
The depth of parallelism requires, then frock correction completes.Or, in test process, test fixture can be automatically and real-time according to result of determination
Regulation, with meet test the depth of parallelism require, carry out the test of camera lens to be measured.
The above, the only specific embodiment of the present invention, under the above-mentioned teaching of the present invention, those skilled in the art
Other improvement or deformation can be carried out on the basis of above-described embodiment.It will be understood by those skilled in the art that above-mentioned tool
The purpose of the present invention is simply preferably explained in body description, and protection scope of the present invention should be defined by scope of the claims.
Claims (10)
1. a kind of method of judgement lens plane and test pattern plane parallelism is it is characterised in that methods described includes：
By test pattern horizontal positioned, described test pattern is provided with marked region；
Optical center to be measured on test fixture is placed on the plumb line of labelling regional center on described test pattern, and is aligned
The center of described marked region；
Obtain the picture of the described test pattern of described lens shooting to be measured, identify the reality of labelling regional center on described picture
Position；
According to formulaCalculate described lens plane to be measured parallel with described test pattern plane
Degree；Wherein d is the reason of the physical location of labelling regional center and described center picture on the described picture being represented using pixel count
By the distance of position, N is the corresponding pixel count of unit distance on described picture, and D is described test pattern to described camera lens to be measured
Distance；
Judging whether the described depth of parallelism is in the range of predetermined angle, if being judged as YES, judging parallel；If being judged as NO,
Judge not parallel.
2. the method for claim 1 is it is characterised in that by the pigment value of described marked region and described test pattern
The difference of the pigment value of non-marked area is more than or equal to default pigment limit value.
3. method as claimed in claim 2 it is characterised in that on the described picture of described identification labelling regional center actual bit
Put including：
Choose the several points on labelling region contour on described picture；
The described several points chosen are fitted to by circle using method of least square, using the central coordinate of circle of described circle as described picture
The physical location of upper labelling regional center.
4. method as claimed in claim 3 is it is characterised in that some on labelling region contour on the described picture of described selection
Individual point includes：
Centered on the theoretical position of described center picture, preset length calibrates an area-of-interest for radius, described
Any one found in area-of-interest on described marked region is put as current point；
With described current point as starting point, outwards search for along described area-of-interest radius, search out several non-marked area
On point after reverse search, using the point of search first pigment value mutation as first on described marked region profile
Point；
Determine down after the distance described current point being sequentially advanced clockwise or counterclockwise a default step-length
One current point, repeat the above steps find the next point on described marked region profile, until around described region of interest
Till domain one week.
5. method as claimed in claim 4 is it is characterised in that described preset length sets according to the size of described marked region
Calmly, comprise described marked region to ensure described area-of-interest.
6. a kind of system judging lens plane and test pattern plane parallelism is it is characterised in that include test pattern and survey
Trial work fills, and described test pattern is provided with marked region, and described system also includes：
Placement unit, for by test pattern horizontal positioned, the optical center to be measured on test fixture being placed in described test chart
On the plumb line of labelling regional center on card, and it is directed at the center of described marked region；
Picture acquiring unit, for obtaining the picture of the described test pattern of described lens shooting to be measured；
Center identification unit, for identifying the physical location of labelling regional center on described picture；
Depth of parallelism computing unit, for according to formulaCalculate described lens plane to be measured with described
The depth of parallelism of test pattern plane；Wherein d is the physical location of labelling regional center on the described picture being represented using pixel count
With the distance of the theoretical position of described center picture, N is the corresponding pixel count of unit distance on described picture, and D is described test
Graph card is to the distance of described camera lens to be measured；
Parallel judging unit, for judging whether the described depth of parallelism is in the range of predetermined angle, if being judged as YES, judges flat
OK；If being judged as NO, judge not parallel.
7. system as claimed in claim 6 is it is characterised in that the pigment value of described marked region is non-with described test pattern
The difference of the pigment value of marked region is more than or equal to default pigment limit value.
8. system as claimed in claim 7 is it is characterised in that described center identification unit includes：
Profile point chooses module, for choosing the several points on labelling region contour on described picture；
Fitting module, for being fitted to the described several points that described profile point chooses module selection using method of least square
Circle；
Center demarcating module, for the central coordinate of circle of circle that fits to described fitting module as marked region on described picture
The physical location at center.
9. system as claimed in claim 8 it is characterised in that described profile point choose module specifically for,
Centered on the theoretical position of described center picture, preset length calibrates an area-of-interest for radius, described
Any one found in area-of-interest on described marked region is put as current point；
With described current point as starting point, outwards search for along described area-of-interest radius, search out several non-marked area
On point after reverse search, using the point of search first pigment value mutation as first on described marked region profile
Point；
Determine down after the distance described current point being sequentially advanced clockwise or counterclockwise a default step-length
One current point, repeat the above steps find the next point on described marked region profile, until around described region of interest
Till domain one week.
10. system as claimed in claim 9 is it is characterised in that described preset length sets according to the size of described marked region
Calmly, comprise described marked region to ensure described area-of-interest.
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