CN106446474A - Method for assessing deep charging and discharging risks of satellite - Google Patents
Method for assessing deep charging and discharging risks of satellite Download PDFInfo
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- CN106446474A CN106446474A CN201611039348.7A CN201611039348A CN106446474A CN 106446474 A CN106446474 A CN 106446474A CN 201611039348 A CN201611039348 A CN 201611039348A CN 106446474 A CN106446474 A CN 106446474A
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- satellite
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- deep layer
- appraisal procedure
- layer charge
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F30/00—Computer-aided design [CAD]
- G06F30/30—Circuit design
- G06F30/36—Circuit design at the analogue level
- G06F30/367—Design verification, e.g. using simulation, simulation program with integrated circuit emphasis [SPICE], direct methods or relaxation methods
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- Computer Hardware Design (AREA)
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- Microelectronics & Electronic Packaging (AREA)
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- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
The invention provides a method for assessing deep charging and discharging risks of a satellite. The method comprises the following steps: step one, acquiring a flight track of the satellite; step two, acquiring launch time and designed service life of the satellite; step three, acquiring mechanical frames of the satellite and an instrument and types of dielectric materials; step four, calculating an external environment of the satellite by using a Tiamotech tool, wherein the external environment of the satellite comprises high-energy electrons and high energy protons; and step five, using parameters of a simulating tool material library and selecting or inputting the parameters, and calculating dielectric current in the satellite so as to finish deep charging simulation of the satellite at a targeted position; and step six, visualizing a calculating result by using the Tiamotech tool. A series of problems of contradiction between assessment precision and assessment machine-hour in an operational assessment process of radiation effect hazards of the satellite in a spacecraft researching process are solved. By the method, assessment on satellite deep charging and discharging caused by a space radiation environment is realized.
Description
Technical field
A kind of a kind of the present invention relates to appraisal procedure, in particular it relates to appraisal procedure of satellite deep layer charge and discharge risk.
Background technology
The key elements such as the high energy electron of space radiation environment, high energy proton and heavy ion all can cause radiation effect to endanger to satellite
Evil, wherein high energy electron can cause radiation dose, charge effects to satellite, and in addition high energy proton and heavy ion then also can cause
One class radiation effect, namely it is referred to as single event effects.
Space Particle can be lost due to the resistance being formed by atomic nucleus and electron outside nucleus during passing through material
Fall energy, and the energy losing will be transferred to its material of retardance, the energy being transferred to retardance material in unit is referred to as
For linear energy transfer.Carry out LET transfer and then can lead to device or material radiation dose when lasting, when LET value exceedes necessarily
Value this may result in device and single event effects occur, and when energy transfer finishes, electric charge resides within and produces electrostatic belt
Electricity, namely satellite charging.The satellite operating in terrestrial space can be subjected to the irradiation of ultra rays heavy ion and radiation belt proton, weight
The single particle effect that satellite devices can be caused with proton of ion, wherein radiation belt proton will be by occurring with satellite material
Nuclear reaction and produce heavy ion, in turn result in device occur single particle effect.
If the radiation effect such as single particle effect or deep layer discharge and recharge it is possible to cause satellite in the device in satellite
Disturbance in electronic system, and severe patient leads to device to burn, even whole star lost efficacy.In satellite there is single event in device
Afterwards, gently then cause the upset of Digital Logic position, heavy then cause digital device to burn, cause unit fault, even whole star fault,
The former is referred to as Single event upset effecf, and the latter is referred to as single-particle ablation.Primary space environment in April, 2010
During disturbance, the American communication satellite milky way -15 just due to occurring satellite deep layer discharge and recharge and causing trouble to exit service, is made
Become huge damage to property.
Because the harm Carry-over effect that Space Radiation Effects produce can interfere harm to satellite, proposed by the present invention one
Kind can effectively assess interference damage caused by satellite radiation effect based on Tiamotech radiation emulation tool.Grind in satellite
Stage processed, in-orbit management and fault diagnosis stage afterwards, emulation tool is radiated based on Tiamotech, carry out satellite deep layer charge and discharge
The assessment of electricity is a kind of important means of the harm that reduction is caused due to satellite radiation effect.
Content of the invention
For defect of the prior art, it is an object of the invention to provide a kind of assessment side of satellite deep layer charge and discharge risk
Method, it solves the Evaluation accuracy of the business evaluation process of the radiation effect harm in spacecraft development process satellite, assessment machine
When between contradiction a series of problems, such as.The present invention sets up on the basis of real-time, safe efficient；Simultaneously it is also contemplated that spacecraft
The radiation effect class of development process and calculate the time, thus realizing the commenting of satellite deep layer discharge and recharge that space radiation environment is led to
Estimate.
According to an aspect of the present invention, a kind of appraisal procedure of satellite deep layer charge and discharge risk is provided it is characterised in that
Comprise the following steps：
Step one：Obtain satellite flight track；
Step 2：Obtain satellite launch time, projected life；
Step 3：Obtain satellite, the mechanical framework of instrument, type of dielectric material；
Step 4：Using Tiamotech instrument, calculate the external environment that satellite is met with, including high energy electron and high energy matter
Son；
Step 5：Using emulation tool material depot parameter and select or |input paramete, calculate dielectric current in satellite,
The emulation thus the satellite deep layer completing target location charges；
Step 6：Carry out result of calculation visualization using Tiamotech instrument.
Preferably, described satellite flight track is within terrestrial space scope.
Preferably, described satellite launch time precision is not less than 1 year, and projected life precision is not less than 1 year.
Preferably, described satellite, the mechanical framework of instrument include cylinder, soccer star or cube；Satellite, the machine of instrument
Tool framework is the .step formatted file including the output of Pro-E, Inventor or CATIA instrument.
Preferably, described satellite, the mechanical framework of instrument include central load barrel structure, platy structure or truss knot
Structure.
Preferably, described satellite, instrument include the whole star of satellite, subsystem level and unit rank.
Preferably, the material of the mechanical framework of described satellite, instrument includes aluminium alloy, metallic iron and composite.
Preferably, the medium in described satellite capsule includes epoxy resin, polyimides, politef.
Preferably, described satellite includes telecommunication satellite, aeronautical satellite, meteorological satellite and space station.
Compared with prior art, the present invention has following beneficial effect：For research space radiation environment to satellite spoke
Penetrate harm distribution and prevention policies, the demand of method and technology of effect, the satellite radiation effect appraisal procedure using the present invention is entered
Row calculates and analyzes, can be according to track under the stages such as development for the satellite, launch time and life-span etc. to satellite radiation effect
Harm be estimated, consequently facilitating the engineering phases such as satellite engineering design, fault diagnosis, flight management application.
Brief description
The detailed description with reference to the following drawings, non-limiting example made by reading, the further feature of the present invention,
Objects and advantages will become more apparent upon：
Fig. 1 is the flow chart of the method for assessment satellite deep layer discharge and recharge of the present invention.
Specific embodiment
With reference to specific embodiment, the present invention is described in detail.Following examples will be helpful to the technology of this area
Personnel further understand the present invention, but the invention is not limited in any way.It should be pointed out that the ordinary skill to this area
For personnel, without departing from the inventive concept of the premise, some deformation can also be made and improve.These broadly fall into the present invention
Protection domain.
The present invention, by the use of satellite flight data as input, including track, launch time and projected life, and utilizes input
Satellite or instrument structural parameters, calculate external radiation environment and the indoor environment of satellite using flying quality, and combine
The relevant parameter of the medium of needs assessment, the extent of injury of the deep layer discharge and recharge of target location in the satellite capsule finally obtaining.
As shown in figure 1, the appraisal procedure of satellite deep layer charge and discharge risk of the present invention comprises the following steps：
Step one：Obtain satellite flight track；
Step 2：Obtain satellite launch time, projected life；
Step 3：Obtain satellite, the mechanical framework of instrument, type of dielectric material；
Step 4：Using Tiamotech instrument, calculate the external environment that satellite is met with, including high energy electron and high energy matter
Son；
Step 5：Using emulation tool material depot parameter and select or |input paramete, calculate dielectric current in satellite,
The emulation thus the satellite deep layer completing target location charges；
Step 6：Carry out result of calculation visualization using Tiamotech instrument.
Described satellite flight track within terrestrial space scope, can be stationary orbit, low orbit, middle orbit or its
His track.Satellite launch time precision is not less than 1 year, and projected life precision is not less than 1 year, otherwise will reduce accuracy.
Described satellite, the mechanical framework of instrument include the configurations such as cylinder, soccer star or cube, or various configuration
Combination；Mechanical framework is the .step formatted file of the instrument output such as including Pro-E, Inventor or CATIA.Mechanical framework bag
Include central load barrel structure, platy structure or truss structure.Including the whole star of satellite, subsystem level and unit rank, such as
Can be optical camera or solar cell piece.
Described satellite, the material of the mechanical framework of instrument include aluminium alloy, metallic iron or other metal materials, Yi Jifu
Condensation material.
Medium in described satellite capsule includes epoxy resin, polyimides, politef, and other PMMA etc.
Resin material.
Described electronic device includes silicon, germanium and the material such as GaAs sensitive material or optical fiber, glass.
The appraisal procedure of the present invention is suitable for the harm of radiation effect generation of all kinds of media or electronic device in satellite
Assessment.Additionally, the appraisal procedure of the present invention is suitable for all kinds of satellites, including telecommunication satellite, aeronautical satellite, meteorological satellite and space
All kinds of spacecrafts such as stand；Including spinning stability, three axis stabilized spacecraft.
The present invention relates to the space radiation environment protection of spacecraft and management domain, more particularly, to one kind is for satellite radiation
The method of the satellite deep layer discharge and recharge risk assessment radiating emulation tool based on Tiamotech of effective matrix.
Above the specific embodiment of the present invention is described.It is to be appreciated that the invention is not limited in above-mentioned
Particular implementation, those skilled in the art can make various modifications or modification within the scope of the claims, this not shadow
Ring the flesh and blood of the present invention.
Claims (9)
1. a kind of appraisal procedure of satellite deep layer charge and discharge risk is it is characterised in that comprise the following steps：
Step one：Obtain satellite flight track；
Step 2：Obtain satellite launch time, projected life；
Step 3：Obtain satellite, the mechanical framework of instrument, type of dielectric material；
Step 4：Using Tiamotech instrument, calculate the external environment that satellite is met with, including high energy electron and high energy proton；
Step 5：Using emulation tool material depot parameter and select or |input paramete, calculate dielectric current in satellite, thus
Complete the satellite deep layer charging emulation of target location；
Step 6：Carry out result of calculation visualization using Tiamotech instrument.
2. the appraisal procedure of satellite deep layer charge and discharge risk according to claim 1 is it is characterised in that described satellite
Flight track is within terrestrial space scope.
3. the appraisal procedure of satellite deep layer charge and discharge risk according to claim 1 is it is characterised in that described satellite launch
Time precision is not less than 1 year, and projected life precision is not less than 1 year.
4. the appraisal procedure of satellite deep layer charge and discharge risk according to claim 1 is it is characterised in that described satellite, instrument
The mechanical framework of device includes cylinder, soccer star or cube；Satellite, the mechanical framework of instrument are including Pro-E, Inventor
Or the .step formatted file of CATIA instrument output.
5. the appraisal procedure of satellite deep layer charge and discharge risk according to claim 1 is it is characterised in that described satellite, instrument
The mechanical framework of device includes central load barrel structure, platy structure or truss structure.
6. the appraisal procedure of satellite deep layer charge and discharge risk according to claim 1 is it is characterised in that described satellite, instrument
Device includes the whole star of satellite, subsystem level and unit rank.
7. the appraisal procedure of satellite deep layer charge and discharge risk according to claim 1 is it is characterised in that described satellite, instrument
The material of the mechanical framework of device includes aluminium alloy, metallic iron and composite.
8. the appraisal procedure of satellite deep layer charge and discharge risk according to claim 1 is it is characterised in that in described satellite capsule
Medium include epoxy resin, polyimides, politef.
9. the appraisal procedure of satellite deep layer charge and discharge risk according to claim 1 is it is characterised in that described satellite includes
Telecommunication satellite, aeronautical satellite, meteorological satellite and space station.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201611039348.7A CN106446474A (en) | 2016-11-21 | 2016-11-21 | Method for assessing deep charging and discharging risks of satellite |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201611039348.7A CN106446474A (en) | 2016-11-21 | 2016-11-21 | Method for assessing deep charging and discharging risks of satellite |
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| CN106446474A true CN106446474A (en) | 2017-02-22 |
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| CN201611039348.7A Pending CN106446474A (en) | 2016-11-21 | 2016-11-21 | Method for assessing deep charging and discharging risks of satellite |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107679274A (en) * | 2017-08-30 | 2018-02-09 | 西安空间无线电技术研究所 | A kind of spacecraft discharge and recharge comprehensive analysis method |
| CN108791954A (en) * | 2018-05-30 | 2018-11-13 | 兰州空间技术物理研究所 | A kind of fault early warning method based on the in-orbit interior charged effect dynamic base table of spacecraft |
| CN110472331A (en) * | 2019-08-14 | 2019-11-19 | 上海卫星工程研究所 | Reduce the layout optimization method of sensitive single machine dose of radiation in satellite capsule |
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| CN103886149A (en) * | 2014-03-18 | 2014-06-25 | 北京卫星环境工程研究所 | Method for determining electrification risk of exposed medium assembly of satellite |
| CN104836529A (en) * | 2015-05-20 | 2015-08-12 | 北京空间飞行器总体设计部 | Fault diagnosis method for output current of on-orbit satellite solar cell array |
| CN105375603A (en) * | 2015-08-05 | 2016-03-02 | 上海卫星工程研究所 | Satellite thermal vacuum test ground power supply system |
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2016
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| WO2010089480A1 (en) * | 2009-02-06 | 2010-08-12 | Universite Du Sud Toulon Var | Optimised calculation method for a ray concentration device, in particular solar rays, and resulting ray concentrator |
| CN103886149A (en) * | 2014-03-18 | 2014-06-25 | 北京卫星环境工程研究所 | Method for determining electrification risk of exposed medium assembly of satellite |
| CN104836529A (en) * | 2015-05-20 | 2015-08-12 | 北京空间飞行器总体设计部 | Fault diagnosis method for output current of on-orbit satellite solar cell array |
| CN105375603A (en) * | 2015-08-05 | 2016-03-02 | 上海卫星工程研究所 | Satellite thermal vacuum test ground power supply system |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107679274A (en) * | 2017-08-30 | 2018-02-09 | 西安空间无线电技术研究所 | A kind of spacecraft discharge and recharge comprehensive analysis method |
| CN107679274B (en) * | 2017-08-30 | 2021-06-11 | 西安空间无线电技术研究所 | Spacecraft charging and discharging comprehensive analysis method |
| CN108791954A (en) * | 2018-05-30 | 2018-11-13 | 兰州空间技术物理研究所 | A kind of fault early warning method based on the in-orbit interior charged effect dynamic base table of spacecraft |
| CN110472331A (en) * | 2019-08-14 | 2019-11-19 | 上海卫星工程研究所 | Reduce the layout optimization method of sensitive single machine dose of radiation in satellite capsule |
| CN110472331B (en) * | 2019-08-14 | 2022-11-29 | 上海卫星工程研究所 | Layout optimization method for reducing radiation dose of sensitive single machines in satellite cabin |
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Application publication date: 20170222 |
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