CN106412976A - Time delay test method and device for circuit switched fallback of mobile terminal - Google Patents
Time delay test method and device for circuit switched fallback of mobile terminal Download PDFInfo
- Publication number
- CN106412976A CN106412976A CN201610907155.2A CN201610907155A CN106412976A CN 106412976 A CN106412976 A CN 106412976A CN 201610907155 A CN201610907155 A CN 201610907155A CN 106412976 A CN106412976 A CN 106412976A
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- China
- Prior art keywords
- test
- delay
- circuit domain
- domain dropping
- time delay
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Classifications
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04W—WIRELESS COMMUNICATION NETWORKS
- H04W24/00—Supervisory, monitoring or testing arrangements
- H04W24/06—Testing, supervising or monitoring using simulated traffic
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
- H04B17/30—Monitoring; Testing of propagation channels
- H04B17/309—Measuring or estimating channel quality parameters
- H04B17/364—Delay profiles
Abstract
The invention discloses a time delay test method and device for circuit switched fallback of a mobile terminal. The time delay test method comprises the steps of receiving a test instruction pushed by a server, wherein the test instruction comprises a test mode, a test number and preset test times; carrying out a circuit switched fallback test according to the test instruction; and determining time delay information of the circuit switched fallback according to a test result. According to the method and the device, the mobile terminal remotely receives the test instruction pushed by the server, the circuit switched fallback test is carried out according to the test instruction, and the time delay information of the circuit switched fallback is determined according to the test result. According to the method and the device, the time delay information of the circuit switched fallback of the mobile terminal can be tested conveniently and massively without manual dialing and timing, and the test efficiency is improved; and under the condition that the test instruction is remotely received, a tester does not need to go on a business trip to other place for test, the test can be carried out only by placing the mobile terminal at a test place, and the test cost is reduced.
Description
Technical field
The present invention relates to mobile communication technology field, more particularly, to a kind of delay testing side of mobile terminal circuit domain dropping
Method and device.
Background technology
Because current LTE network (Long Term Evolution, Long Term Evolution) i.e. 4G network does not support voice industry
Business, and 4G data service cannot be carried out with voice calling service simultaneously, therefore either TD-LTE (time division duplex Long Term Evolution)
Pattern or FDD-LTE (FDD Long Term Evolution) pattern, when there being phone incoming call, system all can disconnect 4G signal automatically, from
Dynamic fall back to 2G/3G signal and complete voice call, switch back into 4G signal again after end of conversation, and this switching time 2 seconds～
15 seconds about, in the time of signal switching, mobile phone cannot incoming call and exhalation.
The voice call field in 4G epoch has derived three kinds of solutions, respectively CSFB (Circuit Switched
Fallback, circuit domain dropping), SGLTE (Simultaneous GSM and LTE, LTE and GSM synchronously support) and
VoLTE (Voice over LTE, the speech business based on IMS).Wherein, the only built-in a set of radio frequency core of the mobile phone of CSFB scheme
Piece, the greatest drawback of the program is exactly can not to switch to 2G/3G network in time during 4G online, leads to phone in the short time cannot exhale
Enter exhalation, connect phone be also required to wait a period of time be switched to 4G network could continue online.To impact is reduced to minimum, only
The optimization and upgrading of cell phone manufacturer's system update and carrier network can be expected.
Therefore, good and bad for embodying the performance of mobile terminal, when particularly will carry out Data Comparison, mobile terminal be carried out
CSFB call delay and falling delay testing.Current method of testing is mainly, and tester's manual dialup makes test machine caller
Or called, by observing network signal graph target change on test machine, draw time delay in conjunction with manual time-keeping.And each place operation
The network environment of business be likely to different, so, need when test to cover more regions as far as possible, including domestic each province
Even external, then to be accomplished by tester various places of going on business and tested.And test test volume is very big, artificially every time
Timing test also not accurate enough, so this method of testing efficiency is too low at present, cost is too high.
Content of the invention
It is an object of the invention to proposing a kind of time delay measuring method of mobile terminal circuit domain dropping and device, Neng Goubian
The Delay of prompt and substantial amounts of test mobile terminal circuit domain dropping, need not manually dial and timing.
For reaching this purpose, the present invention employs the following technical solutions：
A kind of time delay measuring method of mobile terminal circuit domain dropping, including：
The test instruction that the reception server pushes, described test instruction includes test mode, test number and default test
Number of times；
According to described test instruction execution circuit domain dropping test；
Determine the Delay of circuit domain dropping according to test result.
Wherein, described according to described test instruction execution circuit domain dropping test, including：
According to described test mode, described test number is executed with the circuit domain dropping test of described default testing time.
Further, according to described test mode, described test number is executed with the circuit domain of described default testing time
Fall test after rise, including：
If described test mode is caller, call described test number, execution circuit domain dropping is tested；
If described test mode is called, when described test number incoming call, execution circuit domain dropping is tested.
Wherein, the Delay of circuit domain dropping is determined according to test result, including：
Determine the Delay of circuit domain dropping according to test result, until testing time reaches described default test time
Number.
Further, after determining the Delay of circuit domain dropping according to test result, also include：
Described Delay is uploaded to described server processed and preserve.
A kind of delay testing device of mobile terminal circuit domain dropping, including：
Command reception module, the test instruction pushing for the reception server, described test instruction includes test mode, survey
Examination number and default testing time；
Fall test module after rise, for according to described test instruction execution circuit domain dropping test；
Time delay acquisition module, for determining the Delay of circuit domain dropping according to test result.
Wherein, described falling test module specifically for：According to described test mode, described to the execution of described test number
The circuit domain dropping test of default testing time.
Further, described falling test module specifically for：
If described test mode is caller, call described test number, execution circuit domain dropping is tested；
If described test mode is called, when described test number incoming call, execution circuit domain dropping is tested.
Wherein, described time delay acquisition module specifically for：
Determine the Delay of circuit domain dropping according to test result, until testing time reaches described default test time
Number.
Further, described delay testing device also includes transmission module, for determining circuit domain according to test result
After the Delay falling after rise, described Delay is uploaded to described server and is processed and preserve.
Beneficial effects of the present invention are：
The test instruction that mobile terminal remote the reception server pushes, surveys according to described test instruction execution circuit domain dropping
Examination, determines the Delay of circuit domain dropping according to test result.The present invention can easily and substantial amounts of test mobile terminal
The Delay of circuit domain dropping, need not manually dial and timing, improve testing efficiency；Receive test instruction long-range
In the case of, tested without tester other places of going on business, as long as mobile terminal is placed in testing location, reduced
Testing cost.
Brief description
Fig. 1 is the flow chart of the time delay measuring method of mobile terminal circuit domain dropping that the embodiment of the present invention one provides；
Fig. 2 is the flow chart of the time delay measuring method of mobile terminal circuit domain dropping that the embodiment of the present invention two provides；
Fig. 3 is the structural representation of the delay testing device of mobile terminal circuit domain dropping that the embodiment of the present invention three provides
Figure.
Specific embodiment
For make present invention solves the technical problem that, the technical scheme that adopts and the technique effect that reaches clearer, below
By combine accompanying drawing the technical scheme of the embodiment of the present invention is described in further detail it is clear that described embodiment only
It is a part of embodiment of the present invention, rather than whole embodiments.
Embodiment one
Fig. 1 is the flow chart of the time delay measuring method of mobile terminal circuit domain dropping that the embodiment of the present invention one provides.As
Shown in Fig. 1, the present embodiment provides a kind of time delay measuring method of mobile terminal circuit domain dropping, for remote testing mobile terminal
The Delay of circuit domain dropping, need not manually dial and timing.Described time delay measuring method passes through a kind of mobile terminal
The delay testing device of circuit domain dropping executing, realized by software and/or hardware, is typically integrated in mobile terminal by this device
Portion.
Described time delay measuring method comprises the steps：
S11, the test instruction that the reception server pushes.
Mobile terminal to be tested, as test machine, needs an auxiliary machine cooperation test.Described test instruction includes surveying
Examination mode, test number and default testing time.Test mode includes caller and called, and test number is the number of auxiliary machine,
Default testing time sets according to testing requirement, and the testing time that different operator, test machine require with testing location is different.
Tester passes through server and pushes test instruction to test machine, and the test that test machine the reception server pushes refers to
Order.
S12, according to described test instruction execution circuit domain dropping test.
According to described test mode, described test number is executed with the circuit domain dropping test of described default testing time.
During the number of test machine caller auxiliary machine, or when the number incoming call of auxiliary machine, triggering falls test after rise.
Circuit domain dropping test includes testing mobile terminal and falling after rise from 4G network (falling after rise to the time of 2G/3G network needs
Time delay), and after end of conversation, time (call delay) of needing from 2G/3G network recovery to 4G network.
S13, determines the Delay of circuit domain dropping according to test result.
Test machine, according to the situation of each test, determines falling time delay and the call delay of circuit domain dropping, Delay
Including but not limited to fall time delay and call delay after rise.
In the present embodiment, the test instruction that the long-range the reception server of test machine pushes, electricity is executed according to described test instruction
The test of road domain dropping, determines the Delay of circuit domain dropping according to test result, can easily and substantial amounts of test is moved
The Delay of terminating circuit domain dropping, need not manually dial and timing, improve testing efficiency；Receive test long-range
In the case of instruction, tested without tester other places of going on business, as long as test machine is placed in testing location, reduced
Testing cost.
Embodiment two
Fig. 2 is the flow chart of the time delay measuring method of mobile terminal circuit domain dropping that the embodiment of the present invention two provides.As
Shown in Fig. 2, the present embodiment improves on the basis of embodiment one, is completed and upload the data to server and be analyzed
And preservation.
Described in the present embodiment, time delay measuring method comprises the steps：
S21, the test instruction that the reception server pushes.
Described test instruction includes test mode, test number and default testing time.
Tester passes through server and pushes test instruction to test machine.
S22, according to described test mode, tests to described test number execution circuit domain dropping.If described test mode
For caller, execution step S221；If described test mode is called, execution step S222.
Test instruction in analyzing step S21, obtains test mode in instruction, test number and default testing time.
According still further to the requirement of test mode, test number execution circuit domain dropping is tested.
S221, calls described test number, and execution circuit domain dropping is tested, and continues executing with S23.
If described test mode is caller, test machine calls the test number of auxiliary machine, and during phone exhalation, timing obtains surveys
Test-run a machine falls after rise from 4G network to the falling time delay of 2G/3G network, and after hanging up the telephone, it is extensive from 2G/3G network that timing obtains test machine
Arrive the call delay of 4G network again.
S222, when described test number incoming call, execution circuit domain dropping is tested, and continues executing with S23.
If described test mode is called, when the test number incoming call of auxiliary machine, timing obtains test machine and returns from 4G network
Drop down onto the falling time delay of 2G/3G network, after hanging up the telephone, timing obtains test machine exhaling from 2G/3G network recovery to 4G network
It is time delay.
S23, determines the Delay of circuit domain dropping according to test result.
Delay includes but is not limited to fall time delay and call delay after rise.
S24, judges whether testing time reaches described default testing time, is then execution step S25；Otherwise return execution
Step S22.
The test instruction of step S21 includes default testing time, and often the test of execution primary circuit domain dropping, will obtain one
Group Delay, repeats test according to test instruction, until testing time reaches default testing time.
S25, described Delay is uploaded to described server and is processed and preserve.
After completing a test instruction, the Delay of acquisition is uploaded onto the server and is preserved, server or test
Personnel can remotely be processed to these Delays, including statistical computation, draws a diagram.
In the present embodiment, the test instruction that the long-range the reception server of test machine pushes, electricity is executed according to described test instruction
The test of road domain dropping, determines the Delay of circuit domain dropping according to test result, can easily and substantial amounts of test is moved
The Delay of terminating circuit domain dropping, need not manually dial and timing, improve testing efficiency and accuracy；Long-range
In the case of receiving test instruction, tested without tester other places of going on business, as long as test machine is placed in testing location
, test result upload server, tester can remotely check and carry out data analysiss, reduce and test into by test machine
This.
Embodiment three
Fig. 3 is the structural representation of the delay testing device of mobile terminal circuit domain dropping that the embodiment of the present invention three provides
Figure.As shown in figure 3, a kind of delay testing device of mobile terminal circuit domain dropping, for execute described in above-described embodiment when
Delay test method, solves same technical problem, reaches identical technique effect.
Described delay testing device includes：Command reception module 41, falling test module 42 and time delay acquisition module 43.
Command reception module 41, for the reception server push test instruction, described test instruction include test mode,
Test number and default testing time.
Fall test module 42 after rise, for according to described test instruction execution circuit domain dropping test.
Time delay acquisition module 43, for determining the Delay of circuit domain dropping according to test result.
Wherein, described falling test module 42 specifically for：According to described test mode, institute is executed to described test number
State the circuit domain dropping test of default testing time.
Further, fall after rise test module 42 specifically for：If described test mode is caller, call described Test No.
Code, execution circuit domain dropping is tested；If described test mode is called, when described test number incoming call, execution circuit domain is returned
Fall test.
Wherein, time delay acquisition module 43 specifically for：Determine the Delay of circuit domain dropping according to test result, until
Testing time reaches described default testing time.
As one kind improvement of the present embodiment, described delay testing device also includes transmission module 44, for according to survey
After test result determines the Delay of circuit domain dropping, described Delay is uploaded to described server and is processed and protect
Deposit.
The present embodiment can easily and substantial amounts of test mobile terminal circuit domain dropping Delay, without artificial hand
Dynamic dialing and timing, improve testing efficiency；Long-range receive test instruction in the case of, go on business other places without tester
Tested, as long as mobile terminal is placed in testing location, reduced testing cost.
Describe the know-why of the present invention above in association with specific embodiment.These descriptions are intended merely to explain the present invention's
Principle, and limiting the scope of the invention can not be construed to by any way.Based on explanation herein, the technology of this area
Personnel do not need to pay other specific embodiments that performing creative labour can associate the present invention, and these modes fall within
Within protection scope of the present invention.
Claims (10)
1. a kind of time delay measuring method of mobile terminal circuit domain dropping is it is characterised in that include：
The test instruction that the reception server pushes, described test instruction includes test mode, test number and default testing time；
According to described test instruction execution circuit domain dropping test；
Determine the Delay of circuit domain dropping according to test result.
2. time delay measuring method according to claim 1 it is characterised in that described according to described test instruction execution circuit
Domain dropping is tested, including：
According to described test mode, described test number execution circuit domain dropping is tested.
3. time delay measuring method according to claim 2 is it is characterised in that according to described test mode, to described test
Number execution circuit domain dropping is tested, including：
If described test mode is caller, call described test number, execution circuit domain dropping is tested；
If described test mode is called, when described test number incoming call, execution circuit domain dropping is tested.
4. time delay measuring method according to claim 3 is it is characterised in that determine circuit domain dropping according to test result
Delay, including：
Determine the Delay of circuit domain dropping according to test result, until testing time reaches described default testing time.
5. time delay measuring method according to claim 1 is it is characterised in that determine circuit domain dropping according to test result
After Delay, also include：
Described Delay is uploaded to described server processed and preserve.
6. a kind of delay testing device of mobile terminal circuit domain dropping is it is characterised in that include：
Command reception module, the test instruction pushing for the reception server, described test instruction includes test mode, Test No.
Code and default testing time；
Fall test module after rise, for according to described test instruction execution circuit domain dropping test；
Time delay acquisition module, for determining the Delay of circuit domain dropping according to test result.
7. delay testing device according to claim 6 it is characterised in that described falling test module specifically for：
According to described test mode, described test number is executed with the circuit domain dropping test of described default testing time.
8. delay testing device according to claim 7 it is characterised in that described falling test module specifically for：
If described test mode is caller, call described test number, execution circuit domain dropping is tested；
If described test mode is called, when described test number incoming call, execution circuit domain dropping is tested.
9. delay testing device according to claim 7 it is characterised in that described time delay acquisition module specifically for：
Determine the Delay of circuit domain dropping according to test result, until testing time reaches described default testing time.
10. delay testing device according to claim 6 is it is characterised in that also include：
Upper transmission module, for after determining the Delay of circuit domain dropping according to test result, by described Delay
Pass to described server to be processed and preserve.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610907155.2A CN106412976A (en) | 2016-10-18 | 2016-10-18 | Time delay test method and device for circuit switched fallback of mobile terminal |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610907155.2A CN106412976A (en) | 2016-10-18 | 2016-10-18 | Time delay test method and device for circuit switched fallback of mobile terminal |
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| CN106412976A true CN106412976A (en) | 2017-02-15 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201610907155.2A Pending CN106412976A (en) | 2016-10-18 | 2016-10-18 | Time delay test method and device for circuit switched fallback of mobile terminal |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107182078A (en) * | 2017-05-12 | 2017-09-19 | 捷开通讯(深圳)有限公司 | Method, terminal and the storage device of analysing terminal circuit domain dropping test report |
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| CN101500255B (en) * | 2008-02-03 | 2010-10-20 | 中国移动通信集团公司 | Mobile terminal test method and system |
| US20130235740A1 (en) * | 2012-03-07 | 2013-09-12 | Pantech Co., Ltd. | Method and mobile terminal for managing circuit switched fallback procedure and network registration |
| CN104302012A (en) * | 2014-09-05 | 2015-01-21 | 中国联合网络通信集团有限公司 | Circuit domain dropping voice calling building method and device |
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2016
- 2016-10-18 CN CN201610907155.2A patent/CN106412976A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1567752A (en) * | 2003-06-20 | 2005-01-19 | 华为技术有限公司 | A monitoring method |
| CN101500255B (en) * | 2008-02-03 | 2010-10-20 | 中国移动通信集团公司 | Mobile terminal test method and system |
| US20130235740A1 (en) * | 2012-03-07 | 2013-09-12 | Pantech Co., Ltd. | Method and mobile terminal for managing circuit switched fallback procedure and network registration |
| CN104302012A (en) * | 2014-09-05 | 2015-01-21 | 中国联合网络通信集团有限公司 | Circuit domain dropping voice calling building method and device |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN107182078A (en) * | 2017-05-12 | 2017-09-19 | 捷开通讯(深圳)有限公司 | Method, terminal and the storage device of analysing terminal circuit domain dropping test report |
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Application publication date: 20170215 |
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