CN106371643A - Touch chip failure processing method and apparatus - Google Patents
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Abstract
The invention relates to a touch chip failure processing method and apparatus, and belongs to the technical field of touch control. The method is used in a terminal comprising a touch screen. The touch screen comprises a touch chip. The method comprises the steps of obtaining working parameters of the touch chip every a predetermined cycle; detecting whether the touch chip is out of operation or not according to the working parameters; and when it is detected that the touch chip is out of operation according to the working parameters, resetting the touch chip. According to the method and the apparatus, the problem of relatively long time for resetting the touch chip due to resetting of the touch chip by restarting the terminal can be solved, so that the effect of improving the resetting efficiency of the touch chip can be achieved.
Description
Technical Field
The present disclosure relates to the field of touch technologies, and in particular, to a method and an apparatus for processing a failure of a touch chip.
Background
Most terminals include a touch screen on which a user can operate to interact with the terminal. When the touch screen fails, the terminal needs to reset the touch screen.
Because the capacitive touch screen comprises the touch chip and the touch panel, when a user operates on the touch panel, a coupling capacitor is formed between the finger of the user and the touch panel, because the touch panel is connected with a high-frequency signal, a part of current is absorbed by the finger at the moment, the part of current respectively flows out from the electrodes on the four corners of the touch screen, the current flowing through the four electrodes is proportional to the distances from the finger to the four electrodes, an analog circuit in the touch chip samples a capacitance value generated by the current, the sampled capacitance value is sent to a digital circuit in the touch chip, and the digital circuit determines the operation position of the finger according to the capacitance value. When the touch screen is affected by static electricity, the touch screen is disabled due to the instantaneous high voltage of the static electricity, at the moment, a user needs to restart the terminal, and the touch chip in the touch screen is reset by performing power-off and power-on operations on the terminal.
Disclosure of Invention
In order to solve the problems in the related art, the present disclosure provides a method and an apparatus for processing a failure of a touch chip.
According to a first aspect of the embodiments of the present disclosure, a method for processing a failure of a touch chip is provided, where the method is used in a terminal including a touch screen, where the touch screen includes the touch chip, and the method includes:
acquiring working parameters of the touch chip every other preset period;
detecting whether the touch chip is invalid or not according to the working parameters;
and resetting the touch control chip when the failure of the touch control chip is detected according to the working parameters.
Optionally, when the touch chip includes a digital circuit and an analog circuit, and the working parameter is a capacitance value obtained by the digital circuit from each capacitance value sampled by the analog circuit every predetermined period, the detecting whether the touch chip is failed according to the working parameter includes:
detecting whether the capacitance value belongs to a preset interval or not through the digital circuit;
and when the capacitance value does not belong to the preset interval, determining that the touch chip is invalid through the digital circuit.
Optionally, the resetting the touch chip includes:
resetting the analog circuit through the digital circuit.
Optionally, when the terminal further includes a processing unit connected to the touch screen, and the touch chip includes a digital circuit, and the working parameter is a heartbeat signal sent by the digital circuit to the processing unit every predetermined period, the detecting whether the touch chip fails according to the working parameter includes:
detecting whether the heartbeat signal sent by the digital circuit is received in a preset time period or not by the processing unit, wherein the starting time of the preset time period is the time when the heartbeat signal is received last time by the processing unit, and the duration of the preset time period is greater than that of the preset period;
and when the heartbeat signal is not received within the preset time period, determining that the touch control chip is invalid through the processing unit.
Optionally, the resetting the touch chip includes:
and resetting the digital circuit through the processing unit, or resetting the touch chip through the processing unit.
According to a second aspect of the embodiments of the present disclosure, there is provided a touch chip failure processing apparatus for use in a terminal including a touch screen, where the touch screen includes the touch chip, the apparatus including:
the parameter acquisition module is configured to acquire working parameters of the touch chip every other predetermined period;
the failure detection module is configured to detect whether the touch chip fails according to the working parameters obtained by the parameter acquisition module;
and the chip resetting module is configured to reset the touch chip when the failure detection module detects that the touch chip fails according to the working parameters.
Optionally, when the touch chip includes a digital circuit and an analog circuit, and the working parameter is a capacitance value obtained by the digital circuit from each capacitance value sampled by the analog circuit every predetermined period, the failure detection module includes:
a capacitance value detection sub-module configured to detect whether the capacitance value belongs to a predetermined interval through the digital circuit;
a first determining sub-module configured to determine, by the digital circuit, that the touch chip is invalid when the capacitance value detecting sub-module detects that the capacitance value does not belong to the predetermined interval.
Optionally, the chip reset module includes:
a first reset submodule configured to reset the analog circuit by the digital circuit.
Optionally, when the terminal further includes a processing unit connected to the touch screen, the touch chip includes a digital circuit, and the working parameter is a heartbeat signal sent by the digital circuit to the processing unit every other predetermined period, the failure detection module includes:
a heartbeat signal detection submodule configured to detect, by the processing unit, whether the heartbeat signal sent by the digital circuit is received within a predetermined period, where a starting time of the predetermined period is a time when the processing unit last received the heartbeat signal, and a duration of the predetermined period is greater than a duration of the predetermined period;
a second determining sub-module configured to determine, by the processing unit, that the touch chip is invalid when the heartbeat signal detection sub-module detects that the heartbeat signal is not received within the predetermined period of time.
Optionally, the chip reset module includes:
the second reset submodule is configured to reset the digital circuit through the processing unit, or reset the touch chip through the processing unit.
According to a third aspect of the embodiments of the present disclosure, there is provided a touch chip failure processing apparatus, the apparatus including:
a touch screen including a touch chip;
a processor;
a memory for storing processor-executable instructions;
wherein the processor is configured to:
acquiring working parameters of the touch chip every other preset period;
detecting whether the touch chip is invalid or not according to the working parameters;
and resetting the touch control chip when the failure of the touch control chip is detected according to the working parameters.
The technical scheme provided by the embodiment of the disclosure can have the following beneficial effects:
acquiring working parameters of the touch chip at intervals of a preset period; detecting whether the touch chip fails according to the working parameters; when the touch chip is detected to be invalid according to the working parameters, the touch chip is reset, the touch chip can be reset only without restarting the terminal, the problem that the touch chip needs to be reset by restarting the terminal, so that the time consumed for resetting the touch chip is long is solved, and the effect of improving the resetting efficiency of the touch chip is achieved.
It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the disclosure.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the disclosure and together with the description, serve to explain the principles of the disclosure.
Fig. 1 is a flowchart illustrating a method for handling a failure of a touch chip according to an exemplary embodiment.
Fig. 2 is a flowchart illustrating a touch chip failure handling method according to another exemplary embodiment.
Fig. 3 is a flowchart illustrating a touch chip failure handling method according to another exemplary embodiment.
Fig. 4 is a block diagram illustrating a touch chip failure processing apparatus according to an exemplary embodiment.
Fig. 5 is a block diagram illustrating a touch chip failure processing apparatus according to an exemplary embodiment.
FIG. 6 is a block diagram illustrating an apparatus for touch chip failure handling in accordance with an exemplary embodiment.
Detailed Description
Reference will now be made in detail to the exemplary embodiments, examples of which are illustrated in the accompanying drawings. When the following description refers to the accompanying drawings, like numbers in different drawings represent the same or similar elements unless otherwise indicated. The implementations described in the exemplary embodiments below are not intended to represent all implementations consistent with the present disclosure. Rather, they are merely examples of apparatus and methods consistent with certain aspects of the present disclosure, as detailed in the appended claims.
Fig. 1 is a flowchart illustrating a touch chip failure processing method according to an exemplary embodiment, where the touch chip failure processing method is applied to a terminal including a touch screen including a touch chip, and as shown in fig. 1, the touch chip failure processing method includes the following steps.
In step 101, the operating parameters of the touch chip are acquired every predetermined period.
In step 102, whether the touch chip is failed or not is detected according to the working parameters.
In step 103, when the failure of the touch chip is detected according to the working parameters, the touch chip is reset.
In summary, the failure processing method for the touch chip provided by the present disclosure obtains the working parameters of the touch chip every other predetermined period; detecting whether the touch chip fails according to the working parameters; when the touch chip is detected to be invalid according to the working parameters, the touch chip is reset, the touch chip can be reset only without restarting the terminal, the problem that the touch chip needs to be reset by restarting the terminal, so that the time consumed for resetting the touch chip is long is solved, and the effect of improving the resetting efficiency of the touch chip is achieved.
Fig. 2 is a flowchart illustrating a touch chip failure processing method according to another exemplary embodiment, where the touch chip failure processing method is applied to a terminal including a touch screen, the touch screen includes a touch chip, the touch chip includes a digital circuit and an analog circuit, and as shown in fig. 2, the touch chip failure processing method includes the following steps.
In step 201, a working parameter of the touch chip is obtained every predetermined period, where the working parameter is a capacitance value obtained by the digital circuit from each capacitance value sampled by the analog circuit every predetermined period.
For the capacitive touch screen, when a user does not execute operation on the touch panel, the analog circuit samples to obtain a first capacitance value, and the first capacitance value is greater than a capacitance lower limit value; when a user performs an operation on the touch panel, the capacitance value of the touch screen changes due to the coupling capacitance generated between the finger of the user and the touch panel, and the analog circuit samples to obtain a second capacitance value, which is greater than the first capacitance value and smaller than the upper limit value of the capacitance. According to the touch control principle, the analog chip can sample the capacitance value of the touch screen at preset time intervals and determine whether the operation acting on the touch screen exists according to the sampled capacitance value. And the duration of the preset time interval is greater than or equal to the duration of the preset period.
When the analog circuit fails, the analog circuit cannot sample the capacitance value, or the capacitance value sampled by the analog circuit can be mistaken, so that whether the analog circuit fails or not can be determined by detecting the capacitance value sampled by the analog circuit.
In this embodiment, the touch chip includes a timer and a digital circuit, and the digital circuit may obtain a capacitance value sampled by the analog circuit every predetermined period under the control of the timer, and then execute step 202.
In step 202, it is detected by the digital circuit whether the capacitance value belongs to a predetermined interval.
The predetermined interval is an interval formed by capacitance values when the touch screen is in a normal state. The minimum value of the predetermined interval may be a first capacitance value when no operation exists on the touch panel, and the maximum value of the predetermined interval may be a second capacitance value when an operation exists on the touch panel.
In step 203, when the capacitance value does not belong to the predetermined interval, the failure of the touch chip is determined by the digital circuit.
When the capacitance value does not belong to the preset interval, determining that the analog circuit fails, and determining that the touch chip fails; when the capacitance value belongs to the predetermined interval, the analog circuit is determined to be valid, and step 201 is continued.
In step 204, when the touch chip is detected to be out of order according to the working parameters, the analog circuit is reset through the digital circuit.
When the analog circuit is determined to be invalid, the whole touch chip can be reset. Because the touch chip is only required to be reset without restarting the terminal, the time consumed by resetting the touch chip can be reduced, and the resetting efficiency of the touch chip can be improved. Or,
because the working power supply of the digital circuit is a digital power supply, namely, the working power supply of the digital circuit and the working power supply of the analog circuit in the touch chip are different, when the analog circuit is determined to be invalid, the digital circuit can also perform power-off and power-on operations on the analog circuit to complete the reset of the analog circuit. At this time, only the analog circuit in the touch chip is reset, and the whole touch chip does not need to be reset, so that the problem that the time consumed for resetting the whole touch chip is relatively long is solved, and the effect of further improving the reset efficiency of the touch chip is achieved.
In summary, according to the failure processing method for the touch chip provided by the disclosure, whether the capacitance value sampled by the analog circuit belongs to the predetermined interval or not is detected by the digital circuit, when the capacitance value does not belong to the predetermined interval, the failure of the touch chip is determined by the digital circuit, and the analog circuit is reset by the digital circuit, so that only the analog circuit in the touch chip is reset without resetting the whole touch chip, the problem that the time consumed for resetting the whole touch chip is relatively long is solved, and the effect of further improving the reset efficiency of the touch chip is achieved.
Fig. 3 is a flowchart illustrating a touch chip failure processing method according to another exemplary embodiment, where the touch chip failure processing method is applied to a terminal including a touch screen and a processing unit connected to the touch screen, the touch screen includes a touch chip, the touch chip includes a digital circuit, and as shown in fig. 3, the touch chip failure processing method includes the following steps.
In step 301, a working parameter of the touch chip is obtained every predetermined period, where the working parameter is a heartbeat signal sent by the digital circuit to the processing unit every predetermined period.
When the digital circuit fails, since the analog circuit in the touch chip cannot monitor the digital circuit, it is necessary to detect whether the digital circuit fails by using the processing unit in the terminal.
In this embodiment, when the digital circuit is valid, the digital circuit needs to send a heartbeat signal to the processing unit every predetermined period; when the digital circuit fails, the digital circuit cannot send a heartbeat signal to the processing unit, and therefore the processing unit can detect that the digital circuit is valid according to whether the heartbeat signal is received.
In step 302, it is detected by the processing unit whether the heartbeat signal sent by the digital circuit is received within a predetermined time period, wherein the starting time of the predetermined time period is the time when the heartbeat signal is last received by the processing unit, and the duration of the predetermined time period is greater than the duration of a predetermined period.
The processing unit can record the time when the heartbeat signal is received last time, determine a preset time period by taking the time as the starting time, and detect whether the heartbeat signal is received in the preset time period; determining that the digital circuit is valid when the heartbeat signal is received within the predetermined period of time; when the heartbeat signal is not received within the predetermined period of time, it is determined that the digital circuit is disabled.
The duration of the predetermined period may be equal to the duration of the predetermined period. Since there may be a time delay in the transmission of the heartbeat signal, when the processing unit does not receive the heartbeat signal in the predetermined period due to the transmission time delay, the processing unit may determine that the digital circuit is out of order, thereby causing a judgment error, and therefore, the duration of the predetermined period may be set to be greater than the duration of the predetermined period. For example, the predetermined period of time may be three times as long as the predetermined period of time.
In step 303, when it is detected that the heartbeat signal is not received within the predetermined time period, it is determined that the touch chip is invalid by the processing unit.
In step 304, when the failure of the touch chip is detected according to the operating parameters, the digital circuit is reset through the processing unit, or the touch chip is reset through the processing unit.
When the digital circuit is determined to be invalid, the whole touch chip can be reset. Because the touch chip is only required to be reset without restarting the terminal, the time consumed by resetting the touch chip can be reduced, and the resetting efficiency of the touch chip can be improved. Or,
because the working power supply of the digital circuit is a digital power supply, namely, the working power supplies of the digital circuit and the analog circuit in the touch chip are different, when the digital circuit is determined to be invalid, the digital circuit can be reset by executing the operation of powering off and powering on the digital circuit through the processing unit. At this time, only the digital circuit in the touch chip is reset, and the whole touch chip does not need to be reset, so that the problem that the time consumed for resetting the whole touch chip is relatively long is solved, and the effect of further improving the reset efficiency of the touch chip is achieved.
In summary, according to the failure processing method for the touch chip provided by the disclosure, the processing unit detects whether the heartbeat signal sent by the digital circuit is received within the preset time period, when the processing unit detects that the heartbeat signal is not received within the preset time period, the processing unit determines that the touch chip is failed, and the processing unit resets the digital circuit, so that only the digital circuit in the touch chip is reset without resetting the whole touch chip, the problem that the time consumed for resetting the whole touch chip is relatively long is solved, and the effect of further improving the resetting efficiency of the touch chip is achieved.
Fig. 4 is a block diagram illustrating a touch chip failure processing apparatus according to an exemplary embodiment, where the touch chip failure processing apparatus is applied to a terminal including a touch screen including a touch chip, and as shown in fig. 4, the touch chip failure processing apparatus includes: a parameter acquisition module 410, a failure detection module 420, and a chip reset module 430.
The parameter obtaining module 410 is configured to obtain the working parameters of the touch chip every predetermined period;
the failure detection module 420 is configured to detect whether the touch chip fails according to the working parameters obtained by the parameter obtaining module 410;
the chip reset module 430 is configured to reset the touch chip when the failure detection module 420 detects that the touch chip fails according to the working parameters.
In summary, the failure processing apparatus for a touch chip provided by the present disclosure obtains the working parameters of the touch chip every other predetermined period; detecting whether the touch chip fails according to the working parameters; when the touch chip is detected to be invalid according to the working parameters, the touch chip is reset, the touch chip can be reset only without restarting the terminal, the problem that the touch chip needs to be reset by restarting the terminal, so that the time consumed for resetting the touch chip is long is solved, and the effect of improving the resetting efficiency of the touch chip is achieved.
Fig. 5 is a block diagram illustrating a touch chip failure processing apparatus according to an exemplary embodiment, where the touch chip failure processing apparatus is applied to a terminal including a touch screen including a touch chip, and as shown in fig. 5, the touch chip failure processing apparatus includes: a parameter acquisition module 510, a failure detection module 520, and a chip reset module 530.
The parameter obtaining module 510 is configured to obtain the working parameters of the touch chip every predetermined period;
the failure detection module 520 is configured to detect whether the touch chip fails according to the working parameters obtained by the parameter obtaining module 510;
the chip reset module 530 is configured to reset the touch chip when the failure detection module 520 detects that the touch chip fails according to the working parameters.
Optionally, when the touch chip includes a digital circuit and an analog circuit, and the working parameter is a capacitance value obtained by the digital circuit from each capacitance value sampled by the analog circuit every predetermined period, the failure detection module 520 includes: a capacitance value detection submodule 521 and a first determination submodule 522;
the capacitance detection submodule 521 is configured to detect whether the capacitance belongs to a predetermined interval through a digital circuit;
the first determining submodule 522 is configured to determine that the touch chip is disabled by the digital circuit when the capacitance value detecting submodule 521 detects that the capacitance value does not belong to the predetermined interval.
Optionally, the chip reset module 530 includes: a first reset submodule 531;
the first reset submodule 531 is configured to reset the analog circuit through a digital circuit.
Optionally, when the terminal further includes a processing unit connected to the touch screen, the touch chip includes a digital circuit, and the working parameter is a heartbeat signal sent to the processing unit by the digital circuit every predetermined period, the failure detection module 520 includes: a heartbeat signal detection submodule 523 and a second determination submodule 524;
the heartbeat signal detection submodule 523 is configured to detect, by the processing unit, whether the heartbeat signal sent by the digital circuit is received within a predetermined time period, where a starting time of the predetermined time period is a time when the processing unit receives the heartbeat signal last time, and a duration of the predetermined time period is greater than a duration of a predetermined period;
the second determining submodule 524 is configured to determine that the touch chip is disabled by the processing unit when the heartbeat signal detecting submodule 523 detects that the heartbeat signal is not received within the predetermined period of time.
Optionally, the chip reset module 530 includes: a second reset sub-module 532;
the second reset sub-module 532 is configured to reset the digital circuit through the processing unit, or reset the touch chip through the processing unit.
In summary, the failure processing apparatus for a touch chip provided by the present disclosure obtains the working parameters of the touch chip every other predetermined period; detecting whether the touch chip fails according to the working parameters; when the touch chip is detected to be invalid according to the working parameters, the touch chip is reset, the touch chip can be reset only without restarting the terminal, the problem that the touch chip needs to be reset by restarting the terminal, so that the time consumed for resetting the touch chip is long is solved, and the effect of improving the resetting efficiency of the touch chip is achieved.
In addition, the analog circuit is reset through the digital circuit, or the digital circuit is reset through the processing unit, so that only the analog circuit or the digital circuit in the touch chip can be reset without resetting the whole touch chip, the problem that the time consumed for resetting the whole touch chip is relatively long is solved, and the effect of further improving the resetting efficiency of the touch chip is achieved.
With regard to the apparatus in the above-described embodiment, the specific manner in which each module performs the operation has been described in detail in the embodiment related to the method, and will not be elaborated here.
An exemplary embodiment of the present disclosure provides a touch chip failure processing apparatus, which can implement the touch chip failure processing method provided by the present disclosure, and the touch chip failure processing apparatus includes: a touch screen including a touch chip; a processor, a memory for storing processor-executable instructions;
wherein the processor is configured to:
acquiring working parameters of the touch chip every other preset period;
detecting whether the touch chip fails according to the working parameters;
and resetting the touch chip when the failure of the touch chip is detected according to the working parameters.
FIG. 6 is a block diagram illustrating an apparatus 600 for touch chip failure handling according to an example embodiment. For example, the apparatus 600 may be a mobile phone, a computer, a digital broadcast terminal, a messaging device, a game console, a tablet device, a medical device, an exercise device, a personal digital assistant, and the like.
Referring to fig. 6, apparatus 600 may include one or more of the following components: processing component 602, memory 604, power component 606, multimedia component 608, audio component 610, input/output (I/O) interface 612, sensor component 614, and communication component 616.
The processing component 602 generally controls overall operation of the device 600, such as operations associated with display, telephone calls, data communications, camera operations, and recording operations. The processing components 602 may include one or more processors 618 to execute instructions to perform all or a portion of the steps of the methods described above. Further, the processing component 602 can include one or more modules that facilitate interaction between the processing component 602 and other components. For example, the processing component 602 can include a multimedia module to facilitate interaction between the multimedia component 608 and the processing component 602.
The memory 604 is configured to store various types of data to support operations at the apparatus 600. Examples of such data include instructions for any application or method operating on device 600, contact data, phonebook data, messages, pictures, videos, and so forth. The memory 604 may be implemented by any type or combination of volatile or non-volatile memory devices such as Static Random Access Memory (SRAM), electrically erasable programmable read-only memory (EEPROM), erasable programmable read-only memory (EPROM), programmable read-only memory (PROM), read-only memory (ROM), magnetic memory, flash memory, magnetic or optical disks.
Power supply component 606 provides power to the various components of device 600. The power components 606 may include a power management system, one or more power supplies, and other components associated with generating, managing, and distributing power for the apparatus 600.
The multimedia component 608 includes a screen that provides an output interface between the device 600 and a user. In some embodiments, the screen may include a Liquid Crystal Display (LCD) and a Touch Panel (TP). If the screen includes a touch panel, the screen may be implemented as a touch screen to receive an input signal from a user. The touch panel includes one or more touch sensors to sense touch, slide, and gestures on the touch panel. The touch sensor may not only sense the boundary of a touch or slide action, but also detect the duration and pressure associated with the touch or slide operation. In some embodiments, the multimedia component 608 includes a front facing camera and/or a rear facing camera. The front camera and/or the rear camera may receive external multimedia data when the device 600 is in an operating mode, such as a shooting mode or a video mode. Each front camera and rear camera may be a fixed optical lens system or have a focal length and optical zoom capability.
The audio component 610 is configured to output and/or input audio signals. For example, audio component 610 includes a Microphone (MIC) configured to receive external audio signals when apparatus 600 is in an operational mode, such as a call mode, a recording mode, and a voice recognition mode. The received audio signal may further be stored in the memory 604 or transmitted via the communication component 616. In some embodiments, audio component 610 further includes a speaker for outputting audio signals.
The I/O interface 612 provides an interface between the processing component 602 and peripheral interface modules, which may be keyboards, click wheels, buttons, etc. These buttons may include, but are not limited to: a home button, a volume button, a start button, and a lock button.
The sensor component 614 includes one or more sensors for providing status assessment of various aspects of the apparatus 600. For example, the sensor component 614 may detect an open/closed state of the device 600, the relative positioning of components, such as a display and keypad of the device 600, the sensor component 614 may also detect a change in position of the device 600 or a component of the device 600, the presence or absence of user contact with the device 600, orientation or acceleration/deceleration of the device 600, and a change in temperature of the device 600. The sensor assembly 614 may include a proximity sensor configured to detect the presence of a nearby object without any physical contact. The sensor assembly 614 may also include a light sensor, such as a CMOS or CCD image sensor, for use in imaging applications. In some embodiments, the sensor assembly 614 may also include an acceleration sensor, a gyroscope sensor, a magnetic sensor, a pressure sensor, or a temperature sensor.
The communication component 616 is configured to facilitate communications between the apparatus 600 and other devices in a wired or wireless manner. The apparatus 600 may access a wireless network based on a communication standard, such as WiFi, 2G or 3G, or a combination thereof. In an exemplary embodiment, the communication component 616 receives broadcast signals or broadcast related information from an external broadcast management system via a broadcast channel. In an exemplary embodiment, the communication component 616 further includes a Near Field Communication (NFC) module to facilitate short-range communications. For example, the NFC module may be implemented based on Radio Frequency Identification (RFID) technology, infrared data association (IrDA) technology, Ultra Wideband (UWB) technology, Bluetooth (BT) technology, and other technologies.
In an exemplary embodiment, the apparatus 600 may be implemented by one or more Application Specific Integrated Circuits (ASICs), Digital Signal Processors (DSPs), Digital Signal Processing Devices (DSPDs), Programmable Logic Devices (PLDs), Field Programmable Gate Arrays (FPGAs), controllers, micro-controllers, microprocessors or other electronic components for performing the above-described methods.
In an exemplary embodiment, a non-transitory computer readable storage medium comprising instructions, such as the memory 604 comprising instructions, executable by the processor 618 of the apparatus 600 to perform the above-described method is also provided. For example, the non-transitory computer readable storage medium may be a ROM, a Random Access Memory (RAM), a CD-ROM, a magnetic tape, a floppy disk, an optical data storage device, and the like.
Other embodiments of the disclosure will be apparent to those skilled in the art from consideration of the specification and practice of the disclosure herein. This application is intended to cover any variations, uses, or adaptations of the disclosure following, in general, the principles of the disclosure and including such departures from the present disclosure as come within known or customary practice within the art to which the disclosure pertains. It is intended that the specification and examples be considered as exemplary only, with a true scope and spirit of the disclosure being indicated by the following claims.
It will be understood that the present disclosure is not limited to the precise arrangements described above and shown in the drawings and that various modifications and changes may be made without departing from the scope thereof. The scope of the present disclosure is limited only by the appended claims.
Claims (11)
1. A failure processing method of a touch chip is used in a terminal comprising a touch screen, wherein the touch screen comprises the touch chip, and the method comprises the following steps:
acquiring working parameters of the touch chip every other preset period;
detecting whether the touch chip is invalid or not according to the working parameters;
and resetting the touch control chip when the failure of the touch control chip is detected according to the working parameters.
2. The method of claim 1, wherein when the touch chip comprises a digital circuit and an analog circuit, and the operation parameter is a capacitance value obtained by the digital circuit from capacitance values sampled by the analog circuit every predetermined period, the detecting whether the touch chip is failed according to the operation parameter comprises:
detecting whether the capacitance value belongs to a preset interval or not through the digital circuit;
and when the capacitance value does not belong to the preset interval, determining that the touch chip is invalid through the digital circuit.
3. The method of claim 2, wherein the resetting the touch chip comprises:
resetting the analog circuit through the digital circuit.
4. The method according to any one of claims 1 to 3, wherein when the terminal further includes a processing unit connected to the touch screen, the touch chip includes a digital circuit, and the operating parameter is a heartbeat signal sent by the digital circuit to the processing unit every predetermined period, the detecting whether the touch chip is disabled according to the operating parameter includes:
detecting whether the heartbeat signal sent by the digital circuit is received in a preset time period or not by the processing unit, wherein the starting time of the preset time period is the time when the heartbeat signal is received last time by the processing unit, and the duration of the preset time period is greater than that of the preset period;
and when the heartbeat signal is not received within the preset time period, determining that the touch control chip is invalid through the processing unit.
5. The method of claim 4, wherein resetting the touch chip comprises:
and resetting the digital circuit through the processing unit, or resetting the touch chip through the processing unit.
6. A touch chip failure processing device, which is used in a terminal including a touch screen, wherein the touch screen includes the touch chip, the device comprising:
the parameter acquisition module is configured to acquire working parameters of the touch chip every other predetermined period;
the failure detection module is configured to detect whether the touch chip fails according to the working parameters obtained by the parameter acquisition module;
and the chip resetting module is configured to reset the touch chip when the failure detection module detects that the touch chip fails according to the working parameters.
7. The apparatus of claim 6, wherein when the touch chip comprises a digital circuit and an analog circuit, and the operating parameter is a capacitance value obtained by the digital circuit from capacitance values sampled by the analog circuit every predetermined period, the failure detection module comprises:
a capacitance value detection sub-module configured to detect whether the capacitance value belongs to a predetermined interval through the digital circuit;
a first determining sub-module configured to determine, by the digital circuit, that the touch chip is invalid when the capacitance value detecting sub-module detects that the capacitance value does not belong to the predetermined interval.
8. The apparatus of claim 7, wherein the chip reset module comprises:
a first reset submodule configured to reset the analog circuit by the digital circuit.
9. The apparatus according to any one of claims 6 to 8, wherein when the terminal further includes a processing unit connected to the touch screen, the touch chip includes a digital circuit, and the operating parameter is a heartbeat signal sent by the digital circuit to the processing unit every predetermined period, the failure detection module includes:
a heartbeat signal detection submodule configured to detect, by the processing unit, whether the heartbeat signal sent by the digital circuit is received within a predetermined period, where a starting time of the predetermined period is a time when the processing unit last received the heartbeat signal, and a duration of the predetermined period is greater than a duration of the predetermined period;
a second determining sub-module configured to determine, by the processing unit, that the touch chip is invalid when the heartbeat signal detection sub-module detects that the heartbeat signal is not received within the predetermined period of time.
10. The apparatus of claim 9, wherein the chip reset module comprises:
the second reset submodule is configured to reset the digital circuit through the processing unit, or reset the touch chip through the processing unit.
11. A touch chip failure processing device, the device comprising:
a touch screen including a touch chip;
a processor;
a memory for storing processor-executable instructions;
wherein the processor is configured to:
acquiring working parameters of the touch chip every other preset period;
detecting whether the touch chip is invalid or not according to the working parameters;
and resetting the touch control chip when the failure of the touch control chip is detected according to the working parameters.
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| CN201510434060.9A CN106371643B (en) | 2015-07-22 | 2015-07-22 | Touch chip crash handling method and device |
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