CN106370115B - Method for testing thickness of aluminum layer of aluminum plastic film - Google Patents
Method for testing thickness of aluminum layer of aluminum plastic film Download PDFInfo
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- CN106370115B CN106370115B CN201610742743.5A CN201610742743A CN106370115B CN 106370115 B CN106370115 B CN 106370115B CN 201610742743 A CN201610742743 A CN 201610742743A CN 106370115 B CN106370115 B CN 106370115B
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- aluminum
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
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Abstract
The invention provides a method for testing the thickness of an aluminum layer of an aluminum-plastic film, which is characterized by comprising the following steps of: firstly, building a slicing machine; secondly, cutting off the part of the aluminum-plastic film, which needs to measure the thickness of the aluminum layer, and clamping the part into two plastic hard sheets to form a sample sheet; thirdly, fixing the sample wafer in a clamping device; fourthly, adjusting the position of the blade, aligning the sharp position of the blade to the aluminum-plastic film part of the sample wafer needing to measure the thickness of the aluminum layer, and pushing the cutter holder to and fro by utilizing the handle to slice the sample wafer; and fifthly, taking down the sample wafer, placing the sample wafer under a microscope to pass through the cut part, and measuring the thickness of the aluminum layer in the aluminum-plastic film. The invention has the beneficial effects that: the method is rapid, simple to operate, accurate in data and free of radiation to a human body, and more reliable data basis is brought to the field of research and development of the aluminum plastic film.
Description
Technical Field
The invention relates to a method for testing the thickness of an aluminum layer of an aluminum-plastic film.
Background
With the rapid development of the electronic industry, the requirements on the battery are higher and higher, and the safety and the service life of the lithium battery become the focus of attention, so that the higher and higher requirements are also provided for a packaging material-aluminum plastic film in the battery.
In order to ensure the safety of the lithium battery, the aluminum foil of the middle layer after the aluminum plastic film is punched and formed is required to be not too thin, the remaining thickness of the aluminum layer is more than 20 microns, and the too thin aluminum layer can influence the barrier property and the corrosion resistance, even the lithium battery is easy to be damaged and even electrolyte is leaked. At present, the thickness of the aluminum layer of the aluminum plastic film can be measured by an X-ray thickness gauge, and the principle is as follows: when X-rays penetrate through a material to be measured, the thickness of the material is measured by utilizing the characteristic that the intensity change of the X-rays is related to the thickness of the material, but an X-ray thickness gauge has stronger radiation.
Disclosure of Invention
The invention aims to provide a method for measuring the thickness of an aluminum layer of an aluminum-plastic film in a non-radiative way.
In order to achieve the purpose, the technical scheme of the invention provides a method for testing the thickness of an aluminum layer of an aluminum-plastic film, which is characterized by comprising the following steps of:
the slicing machine comprises a base and a sliding part which slides on the base in a reciprocating mode, wherein the rear end of a cutter holder is fixed on the sliding part, a handle is arranged on the cutter holder, a blade is fixed at the front end of the cutter holder, a clamping device is arranged below the blade, and the clamping device is fixed on the base;
secondly, cutting off the part of the aluminum-plastic film, which needs to measure the thickness of the aluminum layer, and clamping the part into two plastic hard sheets to form a sample sheet;
thirdly, fixing the sample wafer in a clamping device;
fourthly, adjusting the position of the blade, aligning the sharp position of the blade to the aluminum-plastic film part of the sample wafer needing to measure the thickness of the aluminum layer, and pushing the cutter holder to and fro by utilizing the handle to slice the sample wafer;
and fifthly, taking down the sample wafer, placing the sample wafer under a microscope to pass through the cut part, and measuring the thickness of the aluminum layer in the aluminum-plastic film.
Preferably, in the second step, if the aluminum-plastic film is an attack angle, the aluminum-plastic film is cut along the center of the angle.
Preferably, in the fourth step, if the aluminum-plastic film is a corner punching part, the top corner of the punched pit is cut.
The invention has the beneficial effects that: the method is rapid, simple to operate, accurate in data and free of radiation to a human body, and more reliable data basis is brought to the field of research and development of the aluminum plastic film.
Drawings
Fig. 1 is a schematic view of a microtome.
Detailed Description
In order to make the invention more comprehensible, preferred embodiments are described in detail below with reference to the accompanying drawings.
The embodiment of the invention adopts the slicer shown in fig. 1, and comprises a base 5 and a sliding part 7 which slides on the base 5 in a reciprocating manner, wherein the rear end of a tool apron 1 is fixed on the sliding part 7, the tool apron 1 is provided with a handle 6, the front end of the tool apron 1 is fixed with a blade 2, a clamping device 4 is arranged below the blade 2, and the clamping device 4 is fixed on the base 5.
The invention utilizes the advantage that the hard plastic is not easy to deform, protects the sample wafer, ensures the end surface of the sliced sample wafer to be smooth and flat, fixes the sample wafer 3 through the clamping device 4, sets the slicing thickness, cuts off the end surface of the sample wafer 3 according to the set slicing thickness when the handle 6 is pulled backwards, and automatically descends a little when the handle is returned forwards to prevent the blade 2 from touching the sample wafer 3, thereby achieving the desired slicing effect of the sample wafer through numerous reciprocating motions.
Example 1
The aluminum-plastic film aluminum layer thickness test has the structural form: PA/AL/CPP, the test procedure is as follows:
the method comprises the following steps: and (3) preparing a sample, cutting off a part to be measured, slightly flattening the surface of the part without wrinkles, and then clamping the part into two plastic hard sheets for fixing to form a sample sheet 3.
Step two: fixing the sample wafer, fixing the plastic hard wafer in the clamping device 4, and rotating the bolt to fix the sample.
Step three: and (4) slicing, adjusting the position of the blade 2, starting slicing by using the sharp position of the blade 2, and cutting the flat end until the end surface is smooth and burr-free.
Step four: and measuring, namely taking down the sample wafer 3, placing under a microscope, magnifying by 500 times, adjusting the focal length to image, and measuring.
Example 2
The thickness of the punched angle aluminum layer after the aluminum plastic film is punched and formed is reserved, and the testing steps are as follows:
the method comprises the following steps: and (4) stamping and forming, namely stamping and forming the sample wafer 3 by a stamping machine.
Step two: and (3) preparing a sample, cutting off a part needing measuring an attack angle, requiring the surface of the part to have no wrinkles, using a marking pen to lightly mark the top end of the attack angle to indicate a mark, cutting the part along the center of the attack angle, slightly flattening the part, and then clamping the part into two plastic hard sheets to fix the part to form a sample sheet 3.
Step three: fixing the sample wafer 3, fixing the plastic hard wafer in the clamping device 4, and rotating the bolt to fix the sample wafer.
Step four: and (4) slicing, adjusting the position of the blade 2, starting slicing by using the sharp position of the blade, and cutting to the mark of the top angle of the punched pit.
Step five: and measuring, namely taking down the clamping device 4, marking the left side and the right side of the marking position of the apex angle by using marking pens at positions of 2mm respectively, placing under a microscope, magnifying by 500 times, adjusting the focal length to image, and measuring the thickness of the middle part of the two marking pens.
The method provided by the invention is not only suitable for testing the thickness of the aluminum layer of the aluminum plastic film, but also suitable for testing the thickness of various composite film metal layers containing metal layers.
Claims (3)
1. A method for testing the thickness of an aluminum layer of an aluminum-plastic film is characterized by comprising the following steps:
the slicing machine comprises a base (5) and a sliding part (7) which slides on the base (5) in a reciprocating mode, wherein the rear end of a cutter holder (1) is fixed on the sliding part (7), a handle (6) is arranged on the cutter holder (1), a blade (2) is fixed at the front end of the cutter holder (1), a clamping device (4) is arranged below the blade (2), and the clamping device (4) is fixed on the base (5);
secondly, cutting off the part of the aluminum-plastic film, which needs to measure the thickness of the aluminum layer, and clamping the part into two plastic hard sheets to form a sample sheet (3);
thirdly, fixing the sample wafer (3) in a clamping device (4);
fourthly, adjusting the position of the blade (2), aligning the sharp position of the blade (2) to the aluminum-plastic film part of the sample wafer (3) needing to measure the thickness of the aluminum layer, and pushing the tool apron (1) to and fro by using a handle (6) so that the blade (2) slices the sample wafer (3);
and fifthly, taking down the sample wafer (3), and placing the sample wafer under a microscope to pass through the cut part to measure the thickness of the aluminum layer in the aluminum plastic film.
2. The method for testing the thickness of the aluminum layer of the aluminum-plastic film as claimed in claim 1, wherein in the second step, if the aluminum-plastic film is an attack angle, the aluminum-plastic film is cut along the center of the attack angle.
3. The method for testing the thickness of the aluminum layer of the aluminum-plastic film as claimed in claim 2, wherein in the fourth step, if the aluminum-plastic film is a corner punching part, the top corner of the punching pit is cut.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610742743.5A CN106370115B (en) | 2016-08-26 | 2016-08-26 | Method for testing thickness of aluminum layer of aluminum plastic film |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610742743.5A CN106370115B (en) | 2016-08-26 | 2016-08-26 | Method for testing thickness of aluminum layer of aluminum plastic film |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN106370115A CN106370115A (en) | 2017-02-01 |
| CN106370115B true CN106370115B (en) | 2020-08-25 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201610742743.5A Active CN106370115B (en) | 2016-08-26 | 2016-08-26 | Method for testing thickness of aluminum layer of aluminum plastic film |
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Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109883366B (en) * | 2019-01-24 | 2020-12-01 | 浙江锋锂新能源科技有限公司 | Method for detecting thickness of aluminum layer of aluminum-plastic film |
| CN112098238B (en) * | 2019-06-18 | 2024-03-05 | 万向一二三股份公司 | Pit punching aluminum plastic film ductility measuring method for power lithium ion battery |
| CN112098237A (en) * | 2019-06-18 | 2020-12-18 | 万向一二三股份公司 | Method for testing hole punching aluminum layer elongation of aluminum plastic film of power lithium ion battery |
| CN111595645A (en) * | 2020-05-26 | 2020-08-28 | 天津市捷威动力工业有限公司 | Preparation method of aluminum layer thickness test sectioning sample after aluminum plastic film stretching |
| CN111649682B (en) * | 2020-06-29 | 2021-11-30 | 天津市捷威动力工业有限公司 | Method for detecting pit angle thickness of lithium ion battery punched aluminum-plastic film |
| CN112098178B (en) * | 2020-10-20 | 2024-03-22 | 天津市捷威动力工业有限公司 | Test method for detecting thickness of aluminum layer at corner of aluminum plastic film after pit punching |
| CN112556588A (en) * | 2020-11-30 | 2021-03-26 | 珠海冠宇电池股份有限公司 | Online thickness measuring device and method for battery seal |
| CN114459314A (en) * | 2022-01-28 | 2022-05-10 | 天津市捷威动力工业有限公司 | Aluminum-plastic film corner aluminum layer thickness testing method and cutting device thereof |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN201380515Y (en) * | 2009-02-28 | 2010-01-13 | 张伟 | Medical film cutter |
| CN201493883U (en) * | 2009-08-21 | 2010-06-02 | 王工一 | Slicer |
| JP2012225848A (en) * | 2011-04-21 | 2012-11-15 | Toyota Motor Corp | Film thickness distribution measurement device and film formation device |
| CN103847029B (en) * | 2012-12-07 | 2016-01-27 | 英莱新能（上海）有限公司 | Thin-film solar cells film plating substrate cutter sweep |
| CN103398662B (en) * | 2013-08-09 | 2016-04-06 | 山东大学 | The measuring method of 10 ~ 100 μm of solid film thickness and device |
| CN104748691B (en) * | 2015-03-05 | 2017-09-05 | 江苏大学 | The measurement apparatus and method of film thickness |
| CN204831209U (en) * | 2015-08-24 | 2015-12-02 | 惠州市纬世新能源有限公司 | Detect lithium ion battery aluminum plastic package film aluminium lamination thickness equipment |
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Address after: 201108 Shanghai city Minhang District Zhuan Hing Road No. 889 Building 1 Applicant after: SHANGHAI ZIJIANG NEW MATERIAL TECHNOLOGY Co.,Ltd. Address before: 201108 Shanghai city Minhang District Zhuan Hing Road No. 889 Building 1 Applicant before: SHANGHAI ZIJIANG NEW MATERIAL TECHNOLOGY Co.,Ltd. |
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