CN106342305B - A kind of testability index requiring towards multitask is determined method - Google Patents

A kind of testability index requiring towards multitask is determined method

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Publication number
CN106342305B
CN106342305B CN201110011630.5A CN201110011630A CN106342305B CN 106342305 B CN106342305 B CN 106342305B CN 201110011630 A CN201110011630 A CN 201110011630A CN 106342305 B CN106342305 B CN 106342305B
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index
product
testability
value
phased mission
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刘冠军
邱静
苏永定
杨鹏
吕克洪
陈希祥
李天梅
徐玉国
张勇
杨述明
谭晓栋
邓冠前
王超
王刚
赵承旭
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National University of Defense Technology
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Abstract

The invention discloses a kind of testability index towards multitask requirement and determine method, object is to provide a kind of testability index towards multitask requirement and determines method, makes the error of definite product multitask testability index in allowed band. Technical scheme is: first collect related data information, then determine the requirement of product integrated performance index, then determine that each phased mission properties of product of product require and the incidence relation of testability index, and determine corresponding fault detect rate rFDiWith Percent Isolated rFIiDeng testability index, finally determine the product test index that multitask requires. Adopt the present invention to meet under the requirement of product integrated performance index guaranteeing, constantly circulate, revise, obtain the product test index request value that the multitask of minimum testability index error ratio requires, meet the requirement of the integrated performance index of system.

Description

A kind of testability index requiring towards multitask is determined method
Technical field
The present invention relates to the Index of testability engineering field, especially one is wanted towards multitaskThe testability index of asking is determined method.
Background technology
Testability refers to that " product can determine that its state (can work, can not work or performance timely and accuratelyDecline) and effectively isolate a kind of design characteristics of its internal fault ". Testability index is to embody productThe parameter request value of testability demand, the design of guide product testability and measurement product test level, orderBefore can target-seeking testability index have more than 100, and fault detect rate (r whereinFD) and Percent Isolated (rFI)It is most important index.
Determine that testability index is the first step of testability engineering. Testability index deterministic process is generally dividedBe three steps:
The first step, collects related data, mainly comprises: 1) Integrated using ensures and analyzes product testRequirement and constraint; 2) available new technology and used the test present situation of product; 3) task of product,Instructions for use and the security requirement to test; 4) maintainability and the maintenance program requirement etc. to test.
Second step, sets up the correlation model of above-mentioned related data and testability index.
The 3rd step, by correlation model is carried out to comprehensive trade-off analysis, requires really according to product performance indexDetermine testability index request.
At present, testability index determines that method mainly contains analogy method, trade-off analysis method and broad sense stochastic Petri(refer to " system testing design analysis and checking " P71-78, BJ University of Aeronautics & Astronautics goes out net methods etc.Version society, 2003; " system engineering and electronic technology " P4-7,2002 (5))
(1) analogy method refers to the testability skill of understanding by inquiry the product of developing and usedArt situation, finds out and requires development and design product at aspects such as instructions for use, component characteristic and technical meritsAkin product, taking its testability index as benchmark, with reference to the General Requirements value of current testability, andThe difference of considering this product and similar products, the testability of determining this product after slightly revising refers toMark.
(2) trade-off analysis method refers to by the computing formula of expansion availability and reliability, and fault is examinedSurvey rate and Percent Isolated are as its variable, according to fixed product availability and reliability, by powerWeighing apparatus analysis is determined fault detect rate and Fault Isolation requirement.
(3) Stochastic Petri Nets method by test activity regard as reliability in the whole life cycle of product,An organic component of maintainability activity, surveys by the product of setting up based on Stochastic Petri NetsTry process model, built the incidence relation of testability index and product performance index requirement, meeting productUnder product performance requirement, determine rational testability index requirement.
Although said method can be determined the testability index of product, these methods are all to appoint for oneThe situation of business. For complicated product, generally need to carry out multiple distinct task, each stageProduct configuration, functional requirement and the performance requirement value of task is also different, under different mission requirementses, and instituteMay there is larger difference in the testability index proposing. Too high testability index will bring design riskAnd the wasting of resources, and too low testability index cannot meet performance requirement value. How to thering is multitaskThe product of testbility demand determines that rational testability index is a key issue, also not open at presentDocument relates to the testability index of multitask requirement and determines method.
The performance requirement of product is the key factor of determining product test index request, has multitask and wantsThe product performance demands of asking comprises two aspects: the one, and the properties of product required value of each task phase, twoIt is the combination property required value of product. The product reliability requiring as multitask requires to comprise each taskThe reliability requirement in stage, comprises again the overall reliability requirement of product, and overall reliability requirement is generallyWeighted sum or the product of each task phase reliability requirement calculate.
Owing to existing, task phase is proposed to the inconsistent problem of properties of product required value, the task rank that haveSection is very high to performance requirement value, and some task phase are lower to performance requirement value, makes the comprehensive of productPerformance requirement value is higher than actual demand. How by revising task phase demand, to meet product comprehensiveUnder energy required value, by the lower task phase performance requirement value of raising time, reduce higher appointing as far as possibleBusiness work-in-process performance requirement value, reaches unanimity the performance requirement value of each task phase of product, isA key issue.
Current testability index determines that method is mainly to require to propose for the single task of simple products,Be not suitable for the product that complicated multitask requires; Proposing testability at the multitask product for complicated refers toWhen mark requires, propose respectively the testability index requirement of product for each mission requirements, finally selectLarge testability index requires the final test index request as product. This often causes testability to refer toMark requires too high, and product test design difficulty is strengthened, and affects the flow of research of product, has wastedThe resources such as human and material resources. Be badly in need of the product test index that a kind of effective ways solve multitask requirementRequire irrational problem.
Summary of the invention
The technical problem to be solved in the present invention is: provide a kind of testability index towards multitask requirement trueDetermine method, mission performance is synchronizeed and revised with testability index, make definite product multitask testabilityThe error of index, in allowed band, finally provides a rational product test index request.
Technical scheme of the present invention is as follows:
The 1st step, collects related data information. Comprise:
1.1 collect product phased mission performance requirement value P from product design specification or contracti, i representsPhased mission sequence number, i=1,2 ..., N, the phased mission sum that N is product, inputs known product rankSection mission performance required value
1.2 collect each phased mission letter of product from the analysis of product mission requirements and fail-safe analysis resultBreath, comprises task severity Bi, fault rate λi, task environment grade EiWith duration Di,I=1,2 ..., N, represents phased mission sequence number.
The 2nd step, determines the requirement of product integrated performance index
2.1 calculation stages task importance degrees. Task severity is larger, fault rate is higher, task environment etc.Level is larger and the duration is longer, and the importance degree of task is just larger, the importance degree of each phased mission α1(i=1,2 ..., N) and adopt aggregative weighted computing method to calculate, calculating formula is:
α i = 1 4 ( B i Σ j = 1 N B j + λ i Σ j = 1 N λ j + E i Σ j = 1 N E j + D i Σ j = 1 N D j ) - - - ( 1 )
2.2 build product integrated performance index PM
P M = P 1 α 1 · P 2 α 2 . . . . . P N α N - - - ( 2 )
Wherein PiRepresent the performance requirement value of each phased mission, i=1,2 ..., N, represents phased mission orderNumber.
According to the known phased mission performance requirement value of the 1.1st stepCalculating with the 2.2nd step of taskImportance degree αi, substitution formula (2) obtains the combination property required value of product
P M * = ( P 1 * ) α 1 · ( P 2 * ) α 2 . . . . . ( P N * ) α N - - - ( 3 )
The 3rd step, determines the incidence relation of each phased mission properties of product required value and testability index,And the testability index of definite each phased mission: fault detect rate rFDiWith Percent Isolated rFIi
3.1 set up the phased mission Stochastic Petri Nets model (bibliography that comprises testability index" system engineering and electronic technology " P4-7,2002 (5));
3.2 pairs of Stochastic Petri Nets models solve, and obtain the performance requirement value with phased mission i PiFor ordinate, with fault detect rate rFDiOr Percent Isolated rFIiFor the relation curve of abscissa, wherein PiWith rFDiAnd rFIiProportional (bibliography " system engineering and electronic technology " P4-7,2002 (5));
The 3.3 fault detect rate F at performance requirement value and each phased missionFDiOr Percent Isolated rFIi'sOn relation curve, if known stage performance required value, with phased mission performance requirement value PiSit for verticalHorizontal line of mark picture, the abscissa corresponding with the intersection point of relation curve is corresponding fault detect rate rFDiWith Percent Isolated rFIi; If known fault verification and measurement ratio rFDiWith Percent Isolated rFIi, taking this value asAbscissa draws a vertical line, and the ordinate corresponding with the intersection point of relation curve is phased mission performance and wantsEvaluation.
The 4th step, determines the product test index of multitask requirement, and method is:
Adopt mission performance synchronize the method for correction with testability index and determine the product survey that multitask requiresExamination property index, step is as follows:
4.1 by the fault detect rate r of productFDiWith Percent Isolated rFIiForm a direct index set to be repaired,Fault detect rate value { the r of each phased mission that input is obtained by the 3rd stepFD1,rFD2,…,rFDNAnd faultVerification and measurement ratio value { rFI1,rFI2,…,rFIN}。
4.2 extract arbitrary testability index r from direct index set to be repairedx, for rxAt phased missionThe required value of i is expressed as rxi(i=1,2 ..., N), select rxMaximum in multistage task: rootAccording to phased mission sequence number, by rxiForm a sequence Sx, then according to ascending order to SxHeavyNew arrangement obtains sequence Sx′,Sx' N value be rxMaximum. Hypothetical sequence SxI positionPut after index rearrangement, be positioned at sequence Sx' k position, define a function gxBy SxAnd Sx′In each index be mapped one by one, i.e. gx(i)=k represents sequence SxIn i positioning index again arrangeCorresponding S after orderx' in the index of k position, its inverse functionRepresent the rear sequence S of rearrangementx′In the corresponding sequence S of index of k positionxIn i positioning index, rxMaximum beThe product bug verification and measurement ratio required value for example with three mission requirementses is sequence Sx={rx1,rx2,rx3, it is largeLittle Guan is rx2<rx3<rx1, ascending rearrangement is sequence S afterwardsx′={rx2,rx3,rx1}=?Its inverse function isBe that maximum is
4.3 determine the testability index sequence S of product in multitask requirementxMiddle maximumWith sequence SxMean value error ratio betax
β x = r xg x - 1 ( N ) Σ i = 1 N r xi × 100 % - - - ( 4 )
The importance degree difference of 4.4 multitasks is larger, the error ratio beta between the testability index allowingxAlsoLarger, therefore, the error ratio that adopts the variance of the importance degree of multitask to allow as testability indexThat is:
β x * = 1 N Σ i = 1 N ( α i - 1 N ) 2 - - - ( 5 )
WhenTime, represent testability index rxError in allowed band, testability index rxValue is relatively consistent, need not revise, and forwards the 4.8th step to, otherwise, forward the 4.5th step to.
4.5 reduce full test indexValue, establish ΔxRepresent testability index rxCorrection step-length,Its span is Δx∈ [0.1,0.5], revised indexFor:
r xg x - 1 ( N ) ′ = r xg x - 1 ( N ) - Δ x - - - ( 6 )
4.6 increase minimum testability indexValue, revised indexFor:
r xg x - 1 ( 1 ) ′ = r xg x - 1 ( 1 ) + Δ x - - - ( 7 )
4.7 determine phased mission testability index required value by step 3.3, again obtain theWithThe performance indications of individual phased missionWithThen willWithSubstitution formula (8)Recalculate product integrated performance index PM
P M = ( P g x - 1 ( 1 ) ) α g x - 1 ( 1 ) · ( P g x - 1 ( 2 ) ) α g x - 1 ( 2 ) . . . . . ( P g x - 1 ( N ) ) α g x - 1 ( N ) - - - ( 8 )
If 4.7.1And?Forward 4.8 to.
If 4.7.2And?Forward 4.2 to.
If 4.7.3AndForward step 4.6 to.
If 4.7.4And?Forward toStep 4.2.
If 4.8 direct index set to be repaired exist uncorrected index, forward 4.2 to;
4.9 finish.
Adopt the present invention can reach following technique effect:
(1) the present invention in the 2nd step the task severity by collecting, fault rate, task environment etc.The quantization factors such as level and duration, adopt aggregative weighted computing method to obtain phased mission importance degree, and adoptUse based on phased mission performance requirement value and product integrated performance index computational methods all phased missionsPerformance requirement value is carried out COMPREHENSIVE CALCULATING, makes properties of product overall target can reflect each stage of productPerformance requirement value.
(2) the present invention is in the 4th step, by reducing the highest testability index required value, reduce correspondingThe performance requirement value of phased mission, improve the phased mission performance requirement of minimum testability index required valueValue and then improve minimum testability index requirement, is guaranteeing to meet under the requirement of product integrated performance index,Constantly circulate, revise, can obtain the product that the multitask of minimum testability index error ratio requiresTestability index required value, meets the requirement of the integrated performance index of system.
Brief description of the drawings
Fig. 1 is general flow chart of the present invention.
Fig. 2 is the relation curve of the present invention's the 3rd step performance requirement value and fault detect rate, Percent Isolated
Fig. 3 is the flow chart of the present invention's the 4th step.
Specific embodiments
Fig. 1 is general flow chart of the present invention, and step is as follows:
1 collects related data information. Comprise: phased mission performance requirement value, product mission profile number,Severity, fault rate, task environment grade and duration four factors of phased mission, and these fourFactor is with respect to the weight factor of task significance.
2 utilize formula (1) and the requirement of (2) counting yield integrated performance index.
3 utilize Stochastic Petri Nets method to determine each phased mission properties of product required value and testabilityThe incidence relation of index, and the testability index of definite each phased mission of product.
4 methods of utilizing circulation to revise testability index requirement and phased mission performance requirement value are determined manyThe product test index that business requires, then Output rusults. Concrete steps are in conjunction with Fig. 3 introduction.
Fig. 2 is the relation curve of the present invention's the 3rd step performance requirement value and fault detect rate or Percent Isolated
Abscissa in 1 Fig. 2 (a) is fault detect rate, and ordinate is performance requirement value, and curve is propertyEnergy required value and fault detect rate are at the relation curve of phased mission i. Dot (intersection point) on curveCorresponding ordinate is performance requirement value (Pi=0.99), corresponding abscissa is fault detect rate requirement (rFDi=0.925)。
Abscissa in 2 Fig. 2 (b) is Percent Isolated, and ordinate is performance requirement value, and curve is propertyEnergy required value and Percent Isolated are at the relation curve of phased mission i. Dot (intersection point) on curveCorresponding ordinate is performance requirement value (Pi=0.99), corresponding abscissa is Percent Isolated requirement (rFIi=0.95)。
Fig. 3 is the flow chart of the 4th step in Fig. 1, and step is as follows:
4.1 input product direct index set to be repaired { rFD,rFI, and direct index r to be repairedFDAnd rFIAt eachThe testability index value of phased mission is { rFD1,rFD2,…,FFDNAnd { rFI1,rFI2,…,rFIN};
4.2 choose testability index r to be revisedxCorresponding sequence SxMaximum
4.3 calculate testability index r by formula (4)xError ratio betax
The 4.4 error ratios that allowed by formula (5) counting yieldAnd error in judgement ratio betaxWhether littleInIf so, transfer to 4.8 steps, otherwise, forward the 4.5th step to.
4.5 reduce full test index by formula (6)Value be
4.6 increase minimum testability index by formula (7)Value be
4.7 obtain according to step 3.3 the phased mission performance requirement value of revising after testability index againWithAnd substitution formula (8) recalculates product integrated performance index PM, after then judgement is revisedFull test index and minimum testability index, revise after integrated performance index and target capabilities indexMagnitude relationship:
● whenAnd Forward 4.8 to;
● whenAnd Forward 4.2 to;
● whenAndForward step 4.6 to;
● whenAnd Forward step 4.2 to;
4.8 have judged whether testability index correction, if so, forward 4.2 to, otherwise, forward to 4.9;
The revised full test index request value of 4.9 output, as final result, finishes.

Claims (1)

1. the testability index requiring towards multitask is determined a method, it is characterized in that comprising the following steps:
The 1st step, collects related data information, comprises the following steps:
1.1 collect product phased mission performance requirement value from product design specification or contract, and input is producedProduct phased mission performance requirement valueThe performance requirement value P of each taskiRepresent, i=1,2 ..., N,Represent phased mission sequence number, the phased mission sum that N is product,For known phased mission performance is wantedEvaluation;
1.2 collect each phased mission letter of product from the analysis of product mission requirements and fail-safe analysis resultBreath, comprises task severity Bi, fault rate λi, task environment grade EiWith duration Di,I=1,2 ..., N, represents phased mission sequence number;
The 2nd step, determine the requirement of product integrated performance index:
2.1 adopt aggregative weighted computing method to calculate the importance degree α of each phased missioni, calculating formula is:
α i = 1 4 ( B i Σ j = 1 N B j + λ i Σ j = 1 N λ j E i Σ j = 1 N E j + D i Σ j = 1 N D j ) - - - ( 1 )
2.2 build product integrated performance index PM
P M = P 1 α 1 · P 1 α 1 ..... P N α N - - - ( 2 )
According to known phased mission performance requirement valueWith task importance degree αi, substitution formula (2) obtains productCombination property required value
P M * = ( P 1 * ) α 1 · ( P 2 * ) α 2 ..... ( P N * ) α N - - - ( 3 )
The 3rd step, determines the incidence relation of each phased mission properties of product required value and testability index,And definite corresponding fault detect rate rFDiWith Percent Isolated rFIi, step is as follows:
3.1 set up the phased mission Stochastic Petri Nets model that comprises testability index;
3.2 pairs of Stochastic Petri Nets models solve, and obtain the performance requirement value with phased mission i PiFor ordinate, with fault detect rate rFDiOr Percent Isolated rFIiFor the relation curve of abscissa, wherein PiWith rFDiAnd rFIiProportional;
3.3 at performance requirement value and fault detect rate rFDiOr Percent Isolated rFIiRelation curve on, ifKnown stage performance required value, with phased mission performance requirement value PiFor ordinate is drawn a horizontal line,The abscissa corresponding with the intersection point of relation curve is corresponding fault detect rate rFDiOr Percent Isolated rFIi; If known fault verification and measurement ratio rFDiOr Percent Isolated rFIi, draw one taking this value as abscissa and hang downStraight line, the ordinate corresponding with the intersection point of relation curve is phased mission performance requirement value;
The 4th step, determines the product test index of multitask requirement
Adopt mission performance synchronize the method for correction with testability index and determine the product survey that multitask requiresExamination property index, step is as follows:
4.1 by the fault detect rate r of productFDiWith Percent Isolated rFIiForm a direct index set to be repaired,Fault detect rate value { the r of each phased mission that input is obtained by the 3rd stepFD1,rFD2,…,rFDNAnd faultIsolation rate value { rFI1,rFI2,…,rFIN};
4.2 extract arbitrary testability index r from direct index set to be repairedx, for rxAt phased missionThe required value of i is expressed as rxi, select rxMaximum in multistage task: according to phased mission sequence number,By rxiForm a sequence Sx, then according to ascending order to SxRearrange and obtain sequence S 'x, S′xN value be rxMaximum; Hypothetical sequence SxThe rearrangement of i positioning index after,Be positioned at sequence S 'xK position, define a function gxBy SxAnd S 'xIn each index one a pair ofShould get up, i.e. gx(i)=k represents sequence SxIn corresponding S ' after the rearrangement of i positioning indexxIn kThe index of individual position, its inverse functionRepresent the rear sequence S ' of rearrangementxIn k positionThe corresponding sequence S of indexxIn i positioning index, rxMaximum be
4.3 determine the testability index sequence S of product in multitask requirementxMiddle maximumWith sequence SxMean value error ratio betax
β x = r xg x - 1 ( N ) Σ i = 1 N r x i × 100 % - - - ( 4 )
The 4.4 error ratios that adopt the variance of the importance degree of multitask to allow as testability index?
β x * = 1 N Σ i = 1 N ( α i - 1 N ) 2 - - - ( 5 )
WhenTime, represent testability index rxError in allowed band, testability index rxValue is relatively consistent, need not revise, and forwards the 4.8th step to, otherwise, forward the 4.5th step to;
4.5 reduce full test indexValue, revised indexFor:
r xg x - 1 ( N ) ′ = r xg x - 1 ( N ) - Δ x - - - ( 6 )
ΔxFor testability index rxCorrection step-length, span is Δx∈[0.1,0.5];
4.6 increase minimum testability indexValue, revised indexFor:
r xg x - 1 ( 1 ) ′ = r xg x - 1 ( 1 ) + Δ x - - - ( 7 )
4.7 determine phased mission testability index required value by step 3.3, again obtain theWithThe performance indications of individual phased missionWithThen willWithSubstitution formula (8)Recalculate product integrated performance index PM
P M = ( P g x - 1 ( 1 ) ) α g x - 1 ( 1 ) · ( P g x - 1 ( 2 ) ) α g x - 1 ( 2 ) ..... ( P g x - 1 ( N ) ) α g x - 1 ( N ) - - - ( 8 )
If 4.7.1And?Forward 4.8 to;
If 4.7.2And?Forward 4.2 to;
If 4.7.3AndForward step 4.6 to;
If 4.7.4And?Forward toStep 4.2;
If 4.8 direct index set to be repaired exist uncorrected index, forward 4.2 to;
4.9 finish.
CN201110011630.5A 2011-06-24 2011-06-24 A kind of testability index requiring towards multitask is determined method Active CN106342305B (en)

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110175359A (en) * 2019-04-23 2019-08-27 中国电子产品可靠性与环境试验研究所((工业和信息化部电子第五研究所)(中国赛宝实验室)) Complication system Safety Modeling Methods and device based on operation flow
CN111444089A (en) * 2020-03-18 2020-07-24 中国人民解放军海军航空大学 Method, device and equipment for analyzing testability based on CGSPN
CN113094940A (en) * 2021-03-04 2021-07-09 中国电子产品可靠性与环境试验研究所((工业和信息化部电子第五研究所)(中国赛宝实验室)) Built-in test index determining method and built-in test method for aviation product

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110175359A (en) * 2019-04-23 2019-08-27 中国电子产品可靠性与环境试验研究所((工业和信息化部电子第五研究所)(中国赛宝实验室)) Complication system Safety Modeling Methods and device based on operation flow
CN110175359B (en) * 2019-04-23 2023-05-12 中国电子产品可靠性与环境试验研究所((工业和信息化部电子第五研究所)(中国赛宝实验室)) Method and device for modeling security of complex system based on business process
CN111444089A (en) * 2020-03-18 2020-07-24 中国人民解放军海军航空大学 Method, device and equipment for analyzing testability based on CGSPN
CN113094940A (en) * 2021-03-04 2021-07-09 中国电子产品可靠性与环境试验研究所((工业和信息化部电子第五研究所)(中国赛宝实验室)) Built-in test index determining method and built-in test method for aviation product
CN113094940B (en) * 2021-03-04 2022-02-11 中国电子产品可靠性与环境试验研究所((工业和信息化部电子第五研究所)(中国赛宝实验室)) Built-in test index determining method and built-in test method for aviation product

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