CN106341831B

CN106341831B - A kind of measurement method and device of sensitivity

Info

Publication number: CN106341831B
Application number: CN201510394344.XA
Authority: CN
Inventors: 张瑞艳; 王大鹏; 张敏
Original assignee: China Mobile Communications Group Co Ltd
Current assignee: China Mobile Communications Group Co Ltd
Priority date: 2015-07-07
Filing date: 2015-07-07
Publication date: 2019-08-30
Anticipated expiration: 2035-07-07
Also published as: CN106341831A

Abstract

The invention discloses a kind of measurement method of sensitivity and devices, and the measurement accuracy to solve the problems, such as sensitivity existing in the prior art is poor.This method comprises: inputting the first useful signal and the first AWGN signal to Devices to test, and by adjusting the mode of signal-to-noise ratio, test obtains the first signal-to-noise ratio of the first useful signal and the first AWGN signal；The first signal-to-noise ratio of n group tested according to n times, obtains the demodulation threshold of Devices to test；The second useful signal and the 2nd AWGN signal are inputted to Devices to test, and by adjusting the mode of signal-to-noise ratio, test obtains the second signal-to-noise ratio of the second useful signal and the 2nd AWGN signal；Obtained the second signal-to-noise ratio of m group is tested according to m times, obtains the noise coefficient of Devices to test；According to demodulation threshold and noise coefficient, the sensitivity of Devices to test is determined.

Description

A kind of measurement method and device of sensitivity

Technical field

The present invention relates to wireless communication technology field more particularly to the measurement methods and device of a kind of sensitivity.

Background technique

Sensitivity is the important indicator of wireless product (such as receiver), is meant that no more than certain Packet Error Ratio requirement Minimum input signal strength.Under normal circumstances, in the sensitivity for determining system, need to determine first system demodulation threshold and Noise coefficient.And the demodulation threshold of system is obtained generally by emulation at present, the survey that the noise coefficient of system passes through acoustic meter It measures.Wherein, there is a certain error unavoidably for the simulation result of the demodulation threshold of system and actual result；And the noise of system For coefficient because of the limitation of interface form, many devices are differential interfaces at present, and characteristic impedance is high, it has to interface conversion be added Part, therefore will also result in certain error, moreover in process of production due to the limitation of interface form, acoustic meter cannot be made With.Therefore the sensitivity tested out in this way usually has that accuracy is poor, and sensitivity once occurs Abnormal problem, it is difficult to conclude it is which link is out of joint.

Summary of the invention

The embodiment of the present invention provides the measurement method and device of a kind of sensitivity, to solve spirit existing in the prior art The poor problem of the measurement accuracy of sensitivity.

The embodiment of the present invention uses following technical scheme:

The embodiment of the invention provides a kind of measurement methods of sensitivity, comprising:

The first useful signal and the first white Gaussian noise AWGN signal are inputted to Devices to test, and by adjusting signal-to-noise ratio Mode, test obtain the first signal-to-noise ratio of first useful signal and the first AWGN signal, and first signal-to-noise ratio is Meet the lowest signal-to-noise of the default bit error rate requirement of the Devices to test；Wherein, first useful signal and described first AWGN signal with the same bandwidth of frequency, the power of first useful signal with first and the ratio that is worth greater than the first preset value, it is described First and value be the power of the first AWGN signal, the default demodulation threshold value of the Devices to test and the Devices to test Default noise coefficient value and value；

The first signal-to-noise ratio of n group tested according to n times, obtains the demodulation threshold of the Devices to test；Wherein, the n In each test of secondary test, the power of first useful signal is different, and the power of the first AWGN signal is different, First initial signal-to-noise ratio of first useful signal and the first AWGN signal is all the same；

The second useful signal and the 2nd AWGN signal are inputted to the Devices to test, and by adjusting the mode of signal-to-noise ratio, Test obtains the second signal-to-noise ratio of second useful signal and the 2nd AWGN signal, and second signal-to-noise ratio is meets State the lowest signal-to-noise of the default bit error rate requirement of Devices to test；Wherein, second useful signal and the 2nd AWGN letter Number with the same bandwidth of frequency, the ratio of the power of the power of second useful signal and the 2nd AWGN signal is less than pre-set the Two preset values；

Obtained the second signal-to-noise ratio of m group is tested according to m times, obtains the noise coefficient of the Devices to test；Wherein, the m In each test of secondary test, the power of second useful signal is different, and the power of the 2nd AWGN signal is different, Second initial signal-to-noise ratio of second useful signal and the 2nd AWGN signal is all the same；

According to the demodulation threshold and the noise coefficient, the sensitivity of the Devices to test is determined.

Wherein, the first useful signal and the first AWGN signal are inputted to Devices to test, by adjusting the mode of signal-to-noise ratio, surveyed Examination obtains the first signal-to-noise ratio of first useful signal and the first AWGN signal, specifically includes:

The first useful signal and the first AWGN signal are inputted to Devices to test；

Determine corresponding first error code of the first initial signal-to-noise ratio of first useful signal and the first AWGN signal Rate；

It, will be at the beginning of described first when corresponding first bit error rate of the described first initial signal-to-noise ratio is less than the default bit error rate Beginning signal-to-noise ratio successively successively decreases according to pre-set first step value, and determines that the signal-to-noise ratio after successively decreasing corresponding first misses respectively Code rate, until corresponding first bit error rate of signal-to-noise ratio after successively decreasing is greater than the default bit error rate；

Will be greater than the corresponding signal-to-noise ratio of first bit error rate of the default bit error rate a upper signal-to-noise ratio be determined as it is described First signal-to-noise ratio.

Wherein, the method also includes:

When corresponding first bit error rate of the described first initial signal-to-noise ratio is not less than the default bit error rate, or after successively decreasing When corresponding first bit error rate of signal-to-noise ratio is no more than the default bit error rate, determine that the demodulation threshold of the Devices to test occurs It is abnormal.

Wherein, the first signal-to-noise ratio of n group tested according to n times, obtains the demodulation threshold of the Devices to test, specific to wrap It includes:

Determine the first average value of the first signal-to-noise ratio of n group that n times are tested；

Determine the first difference of the maximum signal to noise ratio and minimum signal-to-noise ratio in the first signal-to-noise ratio of n group that n times are tested；

When first average value be less than pre-set first demodulation threshold mean value threshold value and first difference it is small When pre-set second demodulation threshold difference threshold, first average value is determined as to the demodulation of the Devices to test Thresholding.

Wherein, the method also includes:

When first average value is not small not less than the first demodulation threshold mean value threshold value or first difference When the second demodulation threshold difference threshold, it is abnormal to determine that the demodulation threshold of the Devices to test occurs.

Wherein, Xiang Suoshu Devices to test inputs the second useful signal and the 2nd AWGN signal, and by adjusting signal-to-noise ratio Mode, test obtain the second signal-to-noise ratio of second useful signal and the 2nd AWGN signal, specifically include:

The second useful signal and the 2nd AWGN signal are inputted to the Devices to test；

Determine corresponding second error code of the second initial signal-to-noise ratio of second useful signal and the 2nd AWGN signal Rate；

It, will be at the beginning of described second when corresponding second bit error rate of the described second initial signal-to-noise ratio is less than the default bit error rate Beginning signal-to-noise ratio successively successively decreases according to pre-set second step value, and determines that the signal-to-noise ratio after successively decreasing corresponding second misses respectively Code rate, until corresponding second bit error rate of signal-to-noise ratio after successively decreasing is greater than the default bit error rate；

Will be greater than the corresponding signal-to-noise ratio of second bit error rate of the default bit error rate a upper signal-to-noise ratio be determined as it is described Second signal-to-noise ratio.

Wherein, the method also includes:

When corresponding second bit error rate of the described second initial signal-to-noise ratio is not less than the default bit error rate, or after successively decreasing When corresponding second bit error rate of signal-to-noise ratio is no more than the default bit error rate, determine that the noise coefficient of the Devices to test occurs It is abnormal.

Wherein, obtained the second signal-to-noise ratio of m group is tested according to m times, obtains the noise coefficient of the Devices to test, it is specific to wrap It includes:

Obtained the second signal-to-noise ratio of m group is tested according to m times, it is corresponding to calculate separately the second signal-to-noise ratio tested obtain every time Noise coefficient；

According to the obtained corresponding noise coefficient of the second signal-to-noise ratio is tested every time, the m group second for determining that m times is tested to obtain is believed It makes an uproar than the second average value of corresponding noise coefficient；

According to the obtained corresponding noise coefficient of the second signal-to-noise ratio is tested every time, the m group second for determining that m times is tested to obtain is believed It makes an uproar than the second difference of maximum noise coefficient and Minimum noises coefficients in corresponding noise coefficient；

When second average value be less than pre-set second demodulation threshold mean value threshold value and second difference it is small When pre-set first demodulation threshold difference threshold, second average value is determined as to the noise of the Devices to test Coefficient.

Wherein, obtained the second signal-to-noise ratio of m group is tested according to m times, calculates separately the second signal-to-noise ratio tested obtain every time Corresponding noise coefficient, specifically includes:

According to formulaIt is corresponding to calculate separately the second signal-to-noise ratio tested obtain every time Noise coefficient；

Wherein, the NF_yThe obtained corresponding noise coefficient of the second signal-to-noise ratio, the S/N are tested for the y times_2-yFor y It is secondary to test the second obtained signal-to-noise ratio, S/N_aveFor the demodulation threshold of the Devices to test, k is the 2nd AWGN in the y times test The power ratio of signal and thermal noise signal.

Wherein, the method also includes:

When second average value is not small not less than the second demodulation threshold mean value threshold value or second difference When the first demodulation threshold difference threshold, it is abnormal to determine that the noise coefficient of the Devices to test occurs.

Wherein, according to the demodulation threshold and the noise coefficient, the sensitivity of the Devices to test is determined, it is specific to wrap It includes:

By the 2nd AWGN signal-off, and the power of second useful signal is updated to pre-set sensitive Degree test initial power；

Determine the corresponding third bit error rate of the sensitivity test initial power；

When the corresponding third bit error rate of the sensitivity test initial power is less than the default bit error rate, by the spirit Sensitivity test initial power successively successively decreases according to pre-set third step value, and determines that the power after successively decreasing is corresponding respectively The third bit error rate, until the corresponding third bit error rate of power after successively decreasing is greater than the default bit error rate；

Will be greater than the corresponding power of the third bit error rate of the default bit error rate a upper power be determined as it is described to be measured First sensitivity of equipment；

According to the demodulation threshold and the noise coefficient, the second sensitivity of the Devices to test is determined；

Door is calculated when the difference of second sensitivity and first sensitivity is less than pre-set sensitivity test When limit value, first sensitivity is determined as to the sensitivity of the Devices to test.

Wherein, the method also includes:

When the difference of second sensitivity and first sensitivity calculates threshold value not less than the sensitivity test When, it is abnormal to determine that the sensitivity of the Devices to test occurs.

The embodiment of the invention provides a kind of measuring devices of sensitivity, comprising:

First signal-to-noise ratio determination unit, for inputting the first useful signal and the first white Gaussian noise AWGN to Devices to test Signal, and by adjusting the mode of signal-to-noise ratio, test obtains the first of first useful signal and the first AWGN signal Signal-to-noise ratio, first signal-to-noise ratio are the lowest signal-to-noise for meeting the default bit error rate requirement of the Devices to test；Wherein, described First useful signal and the first AWGN signal are with the same bandwidth of frequency, the power of first useful signal and first and the ratio that is worth Value is greater than the first preset value, and described first and value are the default demodulation of the power, the Devices to test of the first AWGN signal Threshold value and the default noise coefficient value of the Devices to test and value；

Demodulation threshold determination unit, the n group first for being tested according to the first signal-to-noise ratio determination unit n times are believed It makes an uproar and compares, obtain the demodulation threshold of the Devices to test；Wherein, in each test of the n times test, first useful signal Power it is different, the power of the first AWGN signal is different, first useful signal and the first AWGN signal The first initial signal-to-noise ratio it is all the same；

Second signal-to-noise ratio determination unit, for inputting the second useful signal and the 2nd AWGN signal to the Devices to test, And by adjusting the mode of signal-to-noise ratio, test obtains the second noise of second useful signal and the 2nd AWGN signal Than second signal-to-noise ratio is the lowest signal-to-noise for meeting the default bit error rate requirement of the Devices to test；Wherein, described second Useful signal and the 2nd AWGN signal are the same as the same bandwidth of frequency, the power of second useful signal and the function of the 2nd AWGN signal The ratio of rate is less than pre-set second preset value；

Noise coefficient determination unit is believed for testing obtained m group second according to second signal-to-noise ratio determination unit m times It makes an uproar and compares, obtain the noise coefficient of the Devices to test；Wherein, in each test of the m test, second useful signal Power it is different, the power of the 2nd AWGN signal is different, second useful signal and the 2nd AWGN signal The second initial signal-to-noise ratio it is all the same；

Sensitivity determination unit, demodulation threshold and the noise system for being determined according to the demodulation threshold determination unit The noise coefficient that number determination unit determines, determines the sensitivity of the Devices to test.

Wherein, the first signal-to-noise ratio determination unit, is specifically used for:

Wherein, described device further include:

First anomaly unit, for the first initial signal-to-noise ratio described in the first signal-to-noise ratio determination unit corresponding the One bit error rate is not less than the default bit error rate, or corresponding first bit error rate of signal-to-noise ratio after successively decreasing is pre- no more than described If when the bit error rate, it is abnormal to determine that the demodulation threshold of the Devices to test occurs.

Wherein, the demodulation threshold determination unit, is specifically used for:

Wherein, described device further include:

Second anomaly unit is not less than described first for working as the first average value described in the demodulation threshold determination unit When demodulation threshold mean value threshold value or first difference are not less than the second demodulation threshold difference threshold, institute is determined There is exception in the demodulation threshold for stating Devices to test.

Wherein, the second signal-to-noise ratio determination unit, is specifically used for:

Wherein, described device further include:

Third anomaly unit is missed for working as the second initial signal-to-noise ratio corresponding second in the second signal-to-noise ratio determination unit Code rate is not less than the default bit error rate, or corresponding second bit error rate of signal-to-noise ratio after successively decreasing is no more than the default mistake When code rate, it is abnormal to determine that the noise coefficient of the Devices to test occurs.

Wherein, the noise coefficient determination unit, specifically includes:

The first determining module of noise coefficient calculates separately every time for testing obtained the second signal-to-noise ratio of m group according to m times Test the obtained corresponding noise coefficient of the second signal-to-noise ratio；

The second determining module of noise coefficient is tested every time for what is calculated according to first determining module of noise coefficient The corresponding noise coefficient of the second signal-to-noise ratio arrived determines m times and tests the of the obtained corresponding noise coefficient of the second signal-to-noise ratio of m group Two average values；The obtained corresponding noise of the second signal-to-noise ratio is tested every time according to what first determining module of noise coefficient calculated Coefficient determines maximum noise coefficient and minimal noise system that m times is tested in the obtained corresponding noise coefficient of the second signal-to-noise ratio of m group The second several differences；When second average value is less than pre-set second demodulation threshold mean value threshold value and described second When difference is less than pre-set first demodulation threshold difference threshold, second average value is determined as the Devices to test Noise coefficient.

Wherein, first determining module of noise coefficient, is specifically used for:

Wherein, described device further include:

4th anomaly unit is not less than described second for working as the second average value described in the noise coefficient determination unit When demodulation threshold mean value threshold value or second difference are not less than the first demodulation threshold difference threshold, institute is determined There is exception in the noise coefficient for stating Devices to test.

Wherein, the sensitivity determination unit, is specifically used for:

Wherein, described device further include:

5th anomaly unit, for working as the second sensitivity described in the sensitivity determination unit and first sensitivity Difference when calculating threshold value not less than the sensitivity test, it is abnormal to determine that the sensitivity of the Devices to test occurs.

The embodiment of the present invention has the beneficial effect that:

In the embodiment of the present invention, Devices to test is determined by repeatedly sending useful signal and AWGN signal to Devices to test Demodulation threshold and noise coefficient determine the sensitivity of Devices to test and by the demodulation threshold and noise coefficient determined, should The demodulation threshold of the Devices to test determined in the process, noise coefficient and the accuracy of sensitivity are all relatively high, and then reach Improve the effect of measuring accuracy.

Other features and advantages of the present invention will be illustrated in the following description, also, partly becomes from specification It obtains it is clear that understand through the implementation of the invention.The objectives and other advantages of the invention can be by written explanation Specifically noted structure is achieved and obtained in book, claims and attached drawing.

Detailed description of the invention

The drawings described herein are used to provide a further understanding of the present invention, constitutes a part of the invention, this hair Bright illustrative embodiments and their description are used to explain the present invention, and are not constituted improper limitations of the present invention.In the accompanying drawings:

Fig. 1 is a kind of implementation flow chart of the measurement method of sensitivity provided in an embodiment of the present invention；

Fig. 2 is the system architecture diagram provided in an embodiment of the present invention for realizing sensitivity measure；

Fig. 3 is the implementation flow chart of sensitivity measure provided in an embodiment of the present invention；

Fig. 4 is a kind of structural schematic diagram of the measuring device of sensitivity provided in an embodiment of the present invention.

Specific embodiment

Measurement accuracy in order to solve the problems, such as sensitivity existing in the prior art is poor, the embodiment of the invention provides A kind of measurement scheme of sensitivity.In the technical solution, by repeatedly sent to Devices to test useful signal and AWGN signal come It determines the demodulation threshold and noise coefficient of Devices to test, and demodulation threshold and noise coefficient by determining, determines to be measured set Standby sensitivity, the demodulation threshold, noise coefficient and the accuracy of sensitivity for being somebody's turn to do the Devices to test that determined in the process are all opposite It is higher, and then achieved the effect that improve measuring accuracy.

The embodiment of the present invention is illustrated below in conjunction with Figure of description, it should be understood that implementation described herein Example is merely to illustrate and explain the present invention, and is not intended to restrict the invention.And in the absence of conflict, the reality in the present invention The feature for applying example and embodiment can be combined with each other.

The embodiment of the invention provides a kind of measurement methods of sensitivity, as shown in Figure 1, being the implementation process of this method Figure, specifically include the following steps:

Step 11, the first useful signal and the first white Gaussian noise (Additive White are inputted to Devices to test Gaussian Noise, AWGN) signal, and by adjusting the mode of signal-to-noise ratio, test obtains the first useful signal and first First signal-to-noise ratio of AWGN signal, first signal-to-noise ratio are the lowest signal-to-noise for meeting the default bit error rate requirement of Devices to test.

Wherein, the first useful signal and the first AWGN signal need to meet:

1, with the same bandwidth of frequency；

2, the power of the first useful signal and first and value ratio be greater than the first preset value, this first and value be first The default noise coefficient value of the power of AWGN signal, the default demodulation threshold value of Devices to test and Devices to test and value.

In embodiments of the present invention, the first preset value can with but be limited to for 1000.

In order to determine that the lowest signal-to-noise for the default bit error rate requirement for meeting Devices to test, step 11 can be, but not limited to It realizes as follows:

Determine corresponding first bit error rate of the first initial signal-to-noise ratio of the first useful signal and the first AWGN signal；

It is initial by first when corresponding first bit error rate of the first initial signal-to-noise ratio is less than the default bit error rate of Devices to test Signal-to-noise ratio successively successively decreases according to pre-set first step value, and determines corresponding first error code of signal-to-noise ratio after successively decreasing respectively Rate, until corresponding first bit error rate of signal-to-noise ratio after successively decreasing is greater than the default bit error rate；

The upper signal-to-noise ratio that will be greater than the corresponding signal-to-noise ratio of first bit error rate of the default bit error rate is determined as the first noise Than.

The first signal-to-noise ratio determined in this manner as meets the minimum of the default bit error rate requirement of Devices to test Signal-to-noise ratio.

In addition, being not less than the default bit error rate if there is corresponding first bit error rate of the first initial signal-to-noise ratio, or successively decrease The case where corresponding first bit error rate of signal-to-noise ratio afterwards is no more than the default bit error rate, then can determine the solution pitch of Devices to test There is exception in limit, and subsequent step is without continuing to execute.

Step 12, the first signal-to-noise ratio of n group tested according to n times, obtains the demodulation threshold of Devices to test.

Wherein, in each test of n times test, the power of the first useful signal is different, the power of the first AWGN signal Different, the first initial signal-to-noise ratio of the first useful signal and the first AWGN signal is all the same.

Specifically, step 12 can be, but not limited to realize as follows:

When the first average value determined be less than pre-set first demodulation threshold mean value threshold value and determine the When one difference is less than pre-set second demodulation threshold difference threshold, the first average value determined is determined as to be measured set Standby demodulation threshold.

In addition, being not less than the first demodulation threshold mean value threshold value if there is the first average value determined, or determine The first difference out is not less than the case where the second demodulation threshold difference threshold, it is determined that the demodulation threshold of Devices to test occurs different Often, subsequent step is without continuing to execute.

Step 13, the second useful signal and the 2nd AWGN signal are inputted to Devices to test, and by adjusting the side of signal-to-noise ratio Formula, test obtain the second signal-to-noise ratio of the second useful signal and the 2nd AWGN signal, which is to meet Devices to test Default bit error rate requirement lowest signal-to-noise.

Wherein, the second useful signal and the 2nd AWGN signal need to meet:

1, with the same bandwidth of frequency；

2, it is default to be less than pre-set second for the ratio of the power of the power of the second useful signal and the 2nd AWGN signal Value.

In order to determine that the lowest signal-to-noise for the default bit error rate requirement for meeting Devices to test, step 13 can be, but not limited to It realizes as follows:

The second useful signal and the 2nd AWGN signal are inputted to Devices to test；

Determine corresponding second bit error rate of the second initial signal-to-noise ratio of the second useful signal and the 2nd AWGN signal；

When corresponding second bit error rate of the second initial signal-to-noise ratio is less than the default bit error rate, by the second initial signal-to-noise ratio according to Pre-set second step value successively successively decreases, and determines corresponding second bit error rate of signal-to-noise ratio after successively decreasing respectively, until passing Corresponding second bit error rate of signal-to-noise ratio after subtracting is greater than the default bit error rate；

The upper signal-to-noise ratio that will be greater than the corresponding signal-to-noise ratio of second bit error rate of the default bit error rate is determined as the second noise Than.

The second signal-to-noise ratio determined in this manner as meets the minimum of the default bit error rate requirement of Devices to test Signal-to-noise ratio.

It should also be noted that, the first initial signal-to-noise ratio and the second initial signal-to-noise ratio in the embodiment of the present invention can be phase Same value.

In addition, being not less than the default bit error rate if there is corresponding second bit error rate of the second initial signal-to-noise ratio, or successively decrease The case where corresponding second bit error rate of signal-to-noise ratio afterwards is no more than the default bit error rate determines that the noise coefficient of Devices to test occurs Abnormal, subsequent step is without continuing to execute.

Step 14, obtained the second signal-to-noise ratio of m group is tested according to m times, obtains the noise coefficient of Devices to test.

Wherein, in each test of m test, the power of the second useful signal is different, the power of the 2nd AWGN signal Different, the second initial signal-to-noise ratio of the second useful signal and the 2nd AWGN signal is all the same.

Specifically, step 14 can be, but not limited to realize as follows:

It is set in advance when the second average value is less than pre-set second demodulation threshold mean value threshold value and the second difference and is less than When the first demodulation threshold difference threshold set, the second average value is determined as to the noise coefficient of Devices to test.

Wherein, it is executing: testing obtained the second signal-to-noise ratio of m group according to m times, calculate separately second for testing obtain every time When the corresponding noise coefficient of signal-to-noise ratio, it can be realized according to following formula (1):

Wherein, NF_yThe obtained corresponding noise coefficient of the second signal-to-noise ratio, S/N are tested for the y times_2-yIt is tested for the y times The second signal-to-noise ratio arrived, S/N_aveFor the demodulation threshold of Devices to test, k is the 2nd AWGN signal and thermal noise in the y times test The power ratio of signal.

In addition, not small not less than the second demodulation threshold mean value threshold value or the second difference if there is the second average value In the first demodulation threshold difference threshold the case where, it is determined that the noise coefficient of Devices to test occurs abnormal, and subsequent step is not necessarily to It continues to execute.

Step 15, according to obtained demodulation threshold and noise coefficient, the sensitivity of Devices to test is determined.

It, can be as follows after the demodulation threshold and noise coefficient of determining Devices to test in the embodiment of the present invention Determine the sensitivity of Devices to test:

First by the 2nd AWGN signal-off, and the power of the second useful signal is updated to pre-set sensitivity and is surveyed Try initial power；

Then, it is determined that the corresponding third bit error rate of sensitivity test initial power, when sensitivity test initial power is corresponding Third bit error rate when being less than the default bit error rate, successively according to pre-set third step value by sensitivity test initial power Successively decrease, and determine the corresponding third bit error rate of power after successively decreasing respectively, until the corresponding third bit error rate of power after successively decreasing Greater than the default bit error rate, the upper power that will be greater than the corresponding power of the third bit error rate of the default bit error rate is determined as to be measured set The first standby sensitivity；

According to the demodulation threshold determined and the noise coefficient determined, the second sensitivity of Devices to test is determined；

It, will when the difference of the second sensitivity and the first sensitivity, which is less than pre-set sensitivity test, calculates threshold value First sensitivity is determined as the sensitivity of Devices to test.

In addition, calculating threshold value not less than sensitivity test if there is the difference of the second sensitivity and the first sensitivity Situation, it is determined that the sensitivity of Devices to test occurs abnormal.

Embodiment in order to better understand the present invention, below in conjunction with the specific specific implementation implemented to the embodiment of the present invention Process is illustrated.

As shown in Fig. 2, being the system architecture diagram provided in an embodiment of the present invention for realizing sensitivity measure, including signal Source, Devices to test and test personal computer (Personal Computer, PC), in which:

Signal source is connected by RF coaxial line with Devices to test, for emitting useful signal and AWGN signal；Test PC It is connected by cable or general purpose interface bus (General-Purpose Interface Bus, GPIB) with signal source, is used for Realize long-range control of the test PC to signal source；Test PC is connected by cable or dedicated communication interface with Devices to test, For realizing test PC device under test state control and Devices to test to test PC transmission of feedback information.

Based on above system framework, sensitivity measuring method is divided into 5 steps and carries out: setting measurement parameter, measurement demodulation Thresholding measures noise coefficient, measurement sensitivity and output five part of result.As shown in figure 3, being the implementation process of sensitivity measure Figure.

Step1: setting measurement parameter

According to the measurement parameter that Devices to test setting is suitable.

Step2: measurement demodulation threshold

By the way that the AWGN signal with frequency with bandwidth is added in useful signal, and by adjusting the form of signal-to-noise ratio, measurement The demodulation signal-to-noise ratio of Devices to test.By way of repeatedly measuring, to multiple result treatment, Devices to test demodulation threshold is determined Correctness, directly output is as a result, enter Step3 in the case of exception if normal.

Step3: measurement noise coefficient

By the way that the AWGN signal with frequency with bandwidth is added in useful signal, and by adjusting the form of signal-to-noise ratio, measurement The demodulation signal-to-noise ratio of Devices to test.By way of repeatedly measuring, to multiple result treatment, Devices to test noise coefficient is determined Correctness, directly output is as a result, enter Step4 in the case of exception if normal.

Step4: measurement sensitivity

Conventionally measure the sensitivity of Devices to test.

Step5: output result

The sensitivity and step4 test of system are calculated by the obtained demodulation threshold of step2 and step3 and noise coefficient Obtained signal-to-noise ratio is made comparisons, and determines the correctness of Devices to test sensitivity, and directly output is as a result, normal in the case of exception If export the demodulation threshold of Devices to test, noise coefficient and sensitivity.

The illustratively implementation process of automatic measurement for a specific example below.

The default demodulation threshold value that Devices to test is arranged is A, and presetting noise coefficient value is B, the default error code of Devices to test Rate is C.

Step1: setting measurement parameter.

The parameter for needing to be arranged is referring to following table 1.

Table 1:

Step2: measurement demodulation threshold

Demodulation threshold refers to that a system meets minimum signal-to-noise ratio required when certain bit error rate.Therefore the present invention is implemented Example meeting setting signal source when testing demodulation threshold exports useful signal and AWGN signal simultaneously, and requires:

1. available signal power, which need to meet, is greater than 1000 times or more with AWGN signal power, A and B's and value ratio；

2. the two is the same as the same bandwidth of frequency.

Step2 needs to carry out n times measurement, and every time when measurement, the power of useful signal is different, and the power of AWGN signal is not yet Together, the initial signal-to-noise ratio S/N of useful signal and AWGN signal_thIt is fixed and invariable.

By taking first time measures as an example: the available signal power in system setting signal source is S_1-1, from S/N_thStart according to set Stepping adjust automatically signal-to-noise ratio meets the lowest signal-to-noise S/N that default bit error rate C is required until obtaining_1-1.If not meeting The signal-to-noise ratio of condition is stated, then process is jumped out, and export result: demodulation threshold can not be measured normally.

After being measured for the first time, system is measured automatically into second, the useful signal function in automatic setting signal source Rate is S_1-2, the second measurement process is identical as first time measurement process, and same obtain meets the minimum of default bit error rate C requirement Signal-to-noise ratio S/N_1-2, until completing n times measurement, obtain n group signal-to-noise ratio S/N_1-i, wherein S/N_1-iFor obtained in i-th measurement Meet the lowest signal-to-noise that default bit error rate C is required, the value range of i is 1 to n.

After being measured, test result is calculated:

N group signal-to-noise ratio S/N_1-iAverage value S/N_aveAre as follows:

N group signal-to-noise ratio S/N_1-iThe difference S/N of middle maximum signal to noise ratio and minimum signal-to-noise ratio_delAre as follows:

S/N_del=max (S/N_1-1,...,S/N_1-n)-min(S/N_1-1,...,S/N_1-n)；

If S/N_ave< Th1 and S/N_delThe demodulation threshold of Devices to test is then denoted as S/N by < Th2_ave, and carry out step3； Otherwise export conclusion: demodulation threshold is abnormal, and exports S/N_aveAnd S/N_delOccurrence.

Step3: measurement noise coefficient

Noise coefficient be Devices to test it is intrinsic, represent the output signal-to-noise ratio of the Devices to test to input signal-to-noise ratio The deterioration degree of (input noise is thermal noise).

Therefore meeting setting signal source in test noise coefficient of the embodiment of the present invention exports useful signal and AWGN letter simultaneously Number, it is desirable that:

1. available signal power need to meet with the ratio of AWGN signal power less than the second preset value；

2. the two has with the same bandwidth of frequency.

Step3 needs to carry out m measurement, and every time when measurement, the power of useful signal is different, and the power of AWGN signal is not yet Together, the initial signal-to-noise ratio S/N of useful signal and AWGN signal_thIt is fixed and invariable.

By taking first time measures as an example: the available signal power in system setting signal source is S_2-1, from S/N_thStart according to set Stepping adjust automatically signal-to-noise ratio meets the lowest signal-to-noise S/N that default bit error rate C is required until obtaining_2-1.If not meeting The signal-to-noise ratio of condition is stated, then process is jumped out, and provide result: noise coefficient can not be measured normally.

After being measured for the first time, system is measured automatically into second, the useful signal function in automatic setting signal source Rate is S_2-2, second of measurement process is identical as first time measurement process, and same obtain meets default bit error rate C requirement most Low signal-to-noise ratio S/N_2-2, until completing m measurement, obtain m group signal-to-noise ratio S/N_2-y, wherein S/N_2-yTo be obtained in the y times measurement The desired lowest signal-to-noise of the default bit error rate C of satisfaction, the value range of y is 1 to m.

After the completion of test, measurement result is calculated:

Firstly, utilizing formulaCalculate lowest signal-to-noise S/ obtained in measurement every time N_2-yCorresponding noise coefficient.Wherein, K is the power ratio of the AWGN signal and thermal noise signal in the y times test.

Then, m group NF_yAverage value NF_aveAre as follows:

M group NF_yIn maximum value and minimum value difference NF_delAre as follows:

NF_del=max (NF₁,...,NF_m)-min(NF₁,...,NF_m)；

If NF_ave< Th3 and NF_delThe noise coefficient of Devices to test is then denoted as NF by < Th4_ave, and carry out step4；It is no Then export conclusion: noise coefficient is abnormal, and exports NF_aveAnd NF_delOccurrence.

Step4: measurement sensitivity

By AWGN signal-off, the power that useful signal is arranged is S_start, pass through set stepping adjust automatically useful signal Power, determine the minimum power for meeting default bit error rate C, be denoted as S_Measurement.Subsequently into step5.

Step5: result output

First with formula S_{It calculates}=-174+10*logBW+NF_ave+S/N_ave, the sensitivity of Devices to test is calculated, by S_{It calculates} And S_MeasurementIt compares, works as S_{It calculates}And S_MeasurementDifference be less than Th5 when, export result S_Measurement；Otherwise the sensitivity for exporting Devices to test is different Often, and S is exported_{It calculates}And S_MeasurementOccurrence.

Further, if Devices to test has exception, moreover it is possible to it is determined which link is out of joint.

Based on the same inventive concept, a kind of measuring device of sensitivity is additionally provided in the embodiment of the present invention, due to above-mentioned The principle that device solves the problems, such as is similar to the measurement method of sensitivity, therefore the implementation of above-mentioned apparatus may refer to the reality of method It applies, overlaps will not be repeated.

As shown in figure 4, the structural schematic diagram of the measuring device for sensitivity provided in an embodiment of the present invention, comprising:

First signal-to-noise ratio determination unit 41, for inputting the first useful signal and the first white Gaussian noise to Devices to test AWGN signal, and by adjusting the mode of signal-to-noise ratio, test obtain first useful signal and the first AWGN signal First signal-to-noise ratio, first signal-to-noise ratio are the lowest signal-to-noise for meeting the default bit error rate requirement of the Devices to test；Wherein, First useful signal and the first AWGN signal with the same bandwidth of frequency, the power of first useful signal with first and be worth Ratio be greater than the first preset value, described first and value be the power of the first AWGN signal, the Devices to test it is default Demodulation threshold value and the default noise coefficient value of the Devices to test and value；

Demodulation threshold determination unit 42, for testing obtained n group the according to first signal-to-noise ratio determination unit 41n times One signal-to-noise ratio obtains the demodulation threshold of the Devices to test；Wherein, in each test of the n times test, described first is useful The power of signal is different, and the power of the first AWGN signal is different, first useful signal and the first AWGN The initial signal-to-noise ratio of the first of signal is all the same；

Second signal-to-noise ratio determination unit 43, for inputting the second useful signal and the 2nd AWGN letter to the Devices to test Number, and by adjusting the mode of signal-to-noise ratio, test obtains the second letter of second useful signal and the 2nd AWGN signal It makes an uproar and compares, second signal-to-noise ratio is the lowest signal-to-noise for meeting the default bit error rate requirement of the Devices to test；Wherein, described Two useful signals and the 2nd AWGN signal with the same bandwidth of frequency, the power of second useful signal and the 2nd AWGN signal The ratio of power is less than pre-set second preset value；

Noise coefficient determination unit 44, for testing obtained m group the according to second signal-to-noise ratio determination unit 43m times Two signal-to-noise ratio obtain the noise coefficient of the Devices to test；Wherein, in each test of the m test, described second is useful The power of signal is different, and the power of the 2nd AWGN signal is different, second useful signal and the 2nd AWGN The initial signal-to-noise ratio of the second of signal is all the same；

Sensitivity determination unit 45, demodulation threshold for being determined according to the demodulation threshold determination unit 42 and described makes an uproar The noise coefficient that sound factor determination unit 44 determines, determines the sensitivity of the Devices to test.

Wherein, the first signal-to-noise ratio determination unit 41, is specifically used for:

Wherein, described device further include:

First anomaly unit 46, it is corresponding for working as the first initial signal-to-noise ratio described in the first signal-to-noise ratio determination unit 41 First bit error rate be not less than the default bit error rate, or corresponding first bit error rate of signal-to-noise ratio after successively decreasing is no more than institute When stating the default bit error rate, it is abnormal to determine that the demodulation threshold of the Devices to test occurs.

Wherein, the demodulation threshold determination unit 42, is specifically used for:

Wherein, described device further include:

Second anomaly unit 47, for working as the first average value described in the demodulation threshold determination unit 42 not less than described When first demodulation threshold mean value threshold value or first difference are not less than the second demodulation threshold difference threshold, really The demodulation threshold of the fixed Devices to test occurs abnormal.

Wherein, the second signal-to-noise ratio determination unit 43, is specifically used for:

Wherein, described device further include:

Third anomaly unit 48, for second initial signal-to-noise ratio corresponding the in the second signal-to-noise ratio determination unit 43 Two bit error rates are not less than the default bit error rate, or corresponding second bit error rate of signal-to-noise ratio after successively decreasing is pre- no more than described If when the bit error rate, it is abnormal to determine that the noise coefficient of the Devices to test occurs.

Wherein, the noise coefficient determination unit 44, specifically includes:

The first determining module of noise coefficient 441 calculates separately every for testing obtained the second signal-to-noise ratio of m group according to m times It is secondary to test the obtained corresponding noise coefficient of the second signal-to-noise ratio；

The second determining module of noise coefficient 442, it is each for being calculated according to first determining module of noise coefficient 441 The obtained corresponding noise coefficient of the second signal-to-noise ratio is tested, determines m times and tests the obtained corresponding noise system of the second signal-to-noise ratio of m group The second several average value；The second obtained signal-to-noise ratio is tested every time according to what first determining module of noise coefficient 441 calculated Corresponding noise coefficient, determine maximum noise coefficient that m times is tested in the obtained corresponding noise coefficient of the second signal-to-noise ratio of m group with Second difference of Minimum noises coefficients；When second average value be less than pre-set second demodulation threshold mean value threshold value, And second difference be less than pre-set first demodulation threshold difference threshold when, second average value is determined as institute State the noise coefficient of Devices to test.

Wherein, first determining module of noise coefficient 441, is specifically used for:

Wherein, described device further include:

4th anomaly unit 49, for working as the second average value described in the noise coefficient determination unit 44 not less than described When second demodulation threshold mean value threshold value or second difference are not less than the first demodulation threshold difference threshold, really The noise coefficient of the fixed Devices to test occurs abnormal.

Wherein, the sensitivity determination unit 45, is specifically used for:

Wherein, described device further include:

5th anomaly unit 410, for working as the second sensitivity and described first described in the sensitivity determination unit 45 When the difference of sensitivity calculates threshold value not less than the sensitivity test, it is different to determine that the sensitivity of the Devices to test occurs Often.

For convenience of description, above each section is divided by function describes respectively for each module (or unit).Certainly, exist Implement to realize the function of each module (or unit) in same or multiple softwares or hardware when the present invention.

It should be understood by those skilled in the art that, the embodiment of the present invention can provide as method, system or computer program Product.Therefore, complete hardware embodiment, complete software embodiment or reality combining software and hardware aspects can be used in the present invention Apply the form of example.Moreover, it wherein includes the computer of computer usable program code that the present invention, which can be used in one or more, The computer program implemented in usable storage medium (including but not limited to magnetic disk storage, CD-ROM, optical memory etc.) produces The form of product.

The present invention be referring to according to the method for the embodiment of the present invention, the process of equipment (system) and computer program product Figure and/or block diagram describe.It should be understood that every one stream in flowchart and/or the block diagram can be realized by computer program instructions The combination of process and/or box in journey and/or box and flowchart and/or the block diagram.It can provide these computer programs Instruct the processor of general purpose computer, special purpose computer, Embedded Processor or other programmable data processing devices to produce A raw machine, so that being generated by the instruction that computer or the processor of other programmable data processing devices execute for real The device for the function of being specified in present one or more flows of the flowchart and/or one or more blocks of the block diagram.

These computer program instructions, which may also be stored in, is able to guide computer or other programmable data processing devices with spy Determine in the computer-readable memory that mode works, so that it includes referring to that instruction stored in the computer readable memory, which generates, Enable the manufacture of device, the command device realize in one box of one or more flows of the flowchart and/or block diagram or The function of being specified in multiple boxes.

These computer program instructions also can be loaded onto a computer or other programmable data processing device, so that counting Series of operation steps are executed on calculation machine or other programmable devices to generate computer implemented processing, thus in computer or The instruction executed on other programmable devices is provided for realizing in one or more flows of the flowchart and/or block diagram one The step of function of being specified in a box or multiple boxes.

Although preferred embodiments of the present invention have been described, it is created once a person skilled in the art knows basic Property concept, then additional changes and modifications may be made to these embodiments.So it includes excellent that the following claims are intended to be interpreted as It selects embodiment and falls into all change and modification of the scope of the invention.

Obviously, various changes and modifications can be made to the invention without departing from essence of the invention by those skilled in the art Mind and range.In this way, if these modifications and changes of the present invention belongs to the range of the claims in the present invention and its equivalent technologies Within, then the present invention is also intended to include these modifications and variations.

Claims

1. a kind of measurement method of sensitivity characterized by comprising

The first useful signal and the first white Gaussian noise AWGN signal are inputted to Devices to test, and by adjusting the side of signal-to-noise ratio Formula, test obtain the first signal-to-noise ratio of first useful signal and the first AWGN signal, and first signal-to-noise ratio is full The lowest signal-to-noise of the default bit error rate requirement of the foot Devices to test；Wherein, first useful signal and described first AWGN signal with the same bandwidth of frequency, the power of first useful signal with first and the ratio that is worth greater than the first preset value, it is described First and value be the power of the first AWGN signal, the default demodulation threshold value of the Devices to test and the Devices to test Default noise coefficient value and value；

The first signal-to-noise ratio of n group tested according to n times, obtains the demodulation threshold of the Devices to test；Wherein, the n times are surveyed In each test of examination, the power of first useful signal is different, and the power of the first AWGN signal is different, described First initial signal-to-noise ratio of the first useful signal and the first AWGN signal is all the same；

The second useful signal and the 2nd AWGN signal are inputted to the Devices to test, and by adjusting the mode of signal-to-noise ratio, test Obtain the second signal-to-noise ratio of second useful signal and the 2nd AWGN signal, second signal-to-noise ratio be meet it is described to The lowest signal-to-noise of the default bit error rate requirement of measurement equipment；Wherein, second useful signal and the 2nd AWGN signal are same Frequently same bandwidth, it is pre- that the ratio of the power of the power and the 2nd AWGN signal of second useful signal is less than pre-set second If value；

Obtained the second signal-to-noise ratio of m group is tested according to m times, obtains the noise coefficient of the Devices to test；Wherein, the m survey In each test of examination, the power of second useful signal is different, and the power of the 2nd AWGN signal is different, described Second initial signal-to-noise ratio of the second useful signal and the 2nd AWGN signal is all the same；

According to the demodulation threshold and the noise coefficient, the sensitivity of the Devices to test is determined；

Wherein, it according to the demodulation threshold and the noise coefficient, determines the sensitivity of the Devices to test, specifically includes:

By the 2nd AWGN signal-off, and the power of second useful signal is updated to pre-set sensitivity and is surveyed Try initial power；

When the corresponding third bit error rate of the sensitivity test initial power is less than the default bit error rate, by the sensitivity Test initial power successively successively decreases according to pre-set third step value, and determines the corresponding third of power after successively decreasing respectively The bit error rate, until the corresponding third bit error rate of power after successively decreasing is greater than the default bit error rate；

The upper power that will be greater than the corresponding power of the third bit error rate of the default bit error rate is determined as the Devices to test The first sensitivity；

Threshold value is calculated when the difference of second sensitivity and first sensitivity is less than pre-set sensitivity test When, first sensitivity is determined as to the sensitivity of the Devices to test.

2. the method as described in claim 1, which is characterized in that input the first useful signal and the first AWGN letter to Devices to test Number, by adjusting the mode of signal-to-noise ratio, test obtains the first noise of first useful signal and the first AWGN signal Than specifically including:

Determine corresponding first bit error rate of the first initial signal-to-noise ratio of first useful signal and the first AWGN signal；

When corresponding first bit error rate of the described first initial signal-to-noise ratio is less than the default bit error rate, described first will initially believe It makes an uproar than successively successively decreasing according to pre-set first step value, and determines corresponding first error code of signal-to-noise ratio after successively decreasing respectively Rate, until corresponding first bit error rate of signal-to-noise ratio after successively decreasing is greater than the default bit error rate；

The upper signal-to-noise ratio that will be greater than the corresponding signal-to-noise ratio of first bit error rate of the default bit error rate is determined as described first Signal-to-noise ratio.

3. method according to claim 2, which is characterized in that the method also includes:

Noise when corresponding first bit error rate of the described first initial signal-to-noise ratio is not less than the default bit error rate, or after successively decreasing When than corresponding first bit error rate no more than the default bit error rate, it is different to determine that the demodulation threshold of the Devices to test occurs Often.

4. method a method according to any one of claims 1-3, which is characterized in that the first signal-to-noise ratio of n group tested according to n times, The demodulation threshold of the Devices to test is obtained, is specifically included:

When first average value is less than pre-set first demodulation threshold mean value threshold value and first difference is less than in advance When the second demodulation threshold difference threshold being first arranged, first average value is determined as to the solution pitch of the Devices to test Limit.

5. method as claimed in claim 4, which is characterized in that the method also includes:

When first average value is not less than institute not less than the first demodulation threshold mean value threshold value or first difference When stating the second demodulation threshold difference threshold, it is abnormal to determine that the demodulation threshold of the Devices to test occurs.

6. the method as described in claim 1, which is characterized in that Xiang Suoshu Devices to test inputs the second useful signal and second AWGN signal, and by adjusting the mode of signal-to-noise ratio, test obtain second useful signal and the 2nd AWGN signal Second signal-to-noise ratio, specifically includes:

Determine corresponding second bit error rate of the second initial signal-to-noise ratio of second useful signal and the 2nd AWGN signal；

When corresponding second bit error rate of the described second initial signal-to-noise ratio is less than the default bit error rate, described second will initially believe It makes an uproar than successively successively decreasing according to pre-set second step value, and determines corresponding second error code of signal-to-noise ratio after successively decreasing respectively Rate, until corresponding second bit error rate of signal-to-noise ratio after successively decreasing is greater than the default bit error rate；

The upper signal-to-noise ratio that will be greater than the corresponding signal-to-noise ratio of second bit error rate of the default bit error rate is determined as described second Signal-to-noise ratio.

7. method as claimed in claim 6, which is characterized in that the method also includes:

Noise when corresponding second bit error rate of the described second initial signal-to-noise ratio is not less than the default bit error rate, or after successively decreasing When than corresponding second bit error rate no more than the default bit error rate, it is different to determine that the noise coefficient of the Devices to test occurs Often.

8. claim 1,6 and 7 it is any as described in method, which is characterized in that test obtained the second noise of m group according to m times Than obtaining the noise coefficient of the Devices to test, specifically including:

Obtained the second signal-to-noise ratio of m group is tested according to m times, calculates separately the corresponding noise of the second signal-to-noise ratio tested obtain every time Coefficient；

According to the obtained corresponding noise coefficient of the second signal-to-noise ratio is tested every time, determines m times and test obtained the second signal-to-noise ratio of m group Second average value of corresponding noise coefficient；

According to the obtained corresponding noise coefficient of the second signal-to-noise ratio is tested every time, determines m times and test obtained the second signal-to-noise ratio of m group Second difference of maximum noise coefficient and Minimum noises coefficients in corresponding noise coefficient；

When second average value is less than pre-set second demodulation threshold mean value threshold value and second difference is less than in advance When the first demodulation threshold difference threshold being first arranged, second average value is determined as to the noise system of the Devices to test Number.

9. method according to claim 8, which is characterized in that test obtained the second signal-to-noise ratio of m group according to m times, count respectively The obtained corresponding noise coefficient of the second signal-to-noise ratio is tested in calculation every time, is specifically included:

According to formulaCalculate separately the corresponding noise of the second signal-to-noise ratio tested obtain every time Coefficient；

Wherein, the NF_yThe obtained corresponding noise coefficient of the second signal-to-noise ratio, the S/N are tested for the y times_2-yIt is tested for the y times The second obtained signal-to-noise ratio, S/N_aveFor the demodulation threshold of the Devices to test, k be the 2nd AWGN signal in the y time test with The power ratio of thermal noise signal.

10. method as claimed in claim 8 or 9, which is characterized in that the method also includes:

When second average value is not less than institute not less than the second demodulation threshold mean value threshold value or second difference When stating the first demodulation threshold difference threshold, it is abnormal to determine that the noise coefficient of the Devices to test occurs.

11. the method as described in claim 1, which is characterized in that the method also includes:

When the difference of second sensitivity and first sensitivity calculates threshold value not less than the sensitivity test, really The sensitivity of the fixed Devices to test occurs abnormal.

12. a kind of measuring device of sensitivity characterized by comprising

First signal-to-noise ratio determination unit, for inputting the first useful signal and the first white Gaussian noise AWGN letter to Devices to test Number, and by adjusting the mode of signal-to-noise ratio, test obtains the first letter of first useful signal and the first AWGN signal It makes an uproar and compares, first signal-to-noise ratio is the lowest signal-to-noise for meeting the default bit error rate requirement of the Devices to test；Wherein, described One useful signal and the first AWGN signal are with the same bandwidth of frequency, the power of first useful signal and first and the ratio that is worth Greater than the first preset value, described first and value be the power of the first AWGN signal, the Devices to test default solution pitch The default noise coefficient value of limit value and the Devices to test and value；

Demodulation threshold determination unit, the first noise of n group for being tested according to the first signal-to-noise ratio determination unit n times Than obtaining the demodulation threshold of the Devices to test；Wherein, in each test of the n times test, first useful signal Power is different, and the power of the first AWGN signal is different, first useful signal and the first AWGN signal First initial signal-to-noise ratio is all the same；

Second signal-to-noise ratio determination unit for inputting the second useful signal and the 2nd AWGN signal to the Devices to test, and is led to The mode of adjustment signal-to-noise ratio is crossed, test obtains the second signal-to-noise ratio of second useful signal and the 2nd AWGN signal, institute Stating the second signal-to-noise ratio is the lowest signal-to-noise for meeting the default bit error rate requirement of the Devices to test；Wherein, described second is useful Signal and the same same bandwidth of frequency of the 2nd AWGN signal, the power of the power and the 2nd AWGN signal of second useful signal Ratio is less than pre-set second preset value；

Noise coefficient determination unit, for testing obtained the second noise of m group according to second signal-to-noise ratio determination unit m times Than obtaining the noise coefficient of the Devices to test；Wherein, in each test of the m test, second useful signal Power is different, and the power of the 2nd AWGN signal is different, second useful signal and the 2nd AWGN signal Second initial signal-to-noise ratio is all the same；

Sensitivity determination unit, the demodulation threshold and the noise coefficient for being determined according to the demodulation threshold determination unit are true The noise coefficient that order member determines, determines the sensitivity of the Devices to test；

Wherein, the sensitivity determination unit, is specifically used for:

13. device as claimed in claim 12, which is characterized in that the first signal-to-noise ratio determination unit is specifically used for:

14. device as claimed in claim 13, which is characterized in that described device further include:

First anomaly unit is missed for working as the first initial signal-to-noise ratio corresponding first described in the first signal-to-noise ratio determination unit Code rate is not less than the default bit error rate, or corresponding first bit error rate of signal-to-noise ratio after successively decreasing is no more than the default mistake When code rate, it is abnormal to determine that the demodulation threshold of the Devices to test occurs.

15. the device as described in claim 12-14 is any, which is characterized in that the demodulation threshold determination unit is specific to use In:

16. device as claimed in claim 15, which is characterized in that described device further include:

Second anomaly unit, for working as the first average value described in the demodulation threshold determination unit not less than first demodulation When thresholding mean value threshold value or first difference are not less than the second demodulation threshold difference threshold, determine it is described to The demodulation threshold of measurement equipment occurs abnormal.

17. device as claimed in claim 12, which is characterized in that the second signal-to-noise ratio determination unit is specifically used for:

18. device as claimed in claim 17, which is characterized in that described device further include:

Third anomaly unit, for corresponding second bit error rate of the second initial signal-to-noise ratio in the second signal-to-noise ratio determination unit Corresponding second bit error rate of signal-to-noise ratio not less than the default bit error rate, or after successively decreasing is no more than the default bit error rate When, it is abnormal to determine that the noise coefficient of the Devices to test occurs.

19. claim 12,17 and 18 it is any as described in device, which is characterized in that the noise coefficient determination unit, specifically Include:

The first determining module of noise coefficient calculates separately each test for testing obtained the second signal-to-noise ratio of m group according to m times The obtained corresponding noise coefficient of the second signal-to-noise ratio；

The second determining module of noise coefficient, what each test for being calculated according to first determining module of noise coefficient obtained The corresponding noise coefficient of second signal-to-noise ratio determines that the second of the corresponding noise coefficient of the second signal-to-noise ratio of m group that m test obtains is flat Mean value；The obtained corresponding noise system of the second signal-to-noise ratio is tested every time according to what first determining module of noise coefficient calculated Number determines the m maximum noise coefficient and Minimum noises coefficients tested in the obtained corresponding noise coefficient of the second signal-to-noise ratio of m group The second difference；When second average value is less than pre-set second demodulation threshold mean value threshold value and described second poor When value is less than pre-set first demodulation threshold difference threshold, second average value is determined as the Devices to test Noise coefficient.

20. device as claimed in claim 19, which is characterized in that first determining module of noise coefficient is specifically used for:

21. the device as described in claim 19 or 20, which is characterized in that described device further include:

4th anomaly unit, for working as the second average value described in the noise coefficient determination unit not less than second demodulation When thresholding mean value threshold value or second difference are not less than the first demodulation threshold difference threshold, determine it is described to The noise coefficient of measurement equipment occurs abnormal.

22. device as claimed in claim 12, which is characterized in that described device further include:

5th anomaly unit, for working as the difference of the second sensitivity and first sensitivity described in the sensitivity determination unit When value calculates threshold value not less than the sensitivity test, it is abnormal to determine that the sensitivity of the Devices to test occurs.