CN106331693B - Test system and test method - Google Patents
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- CN106331693B CN106331693B CN201510385272.2A CN201510385272A CN106331693B CN 106331693 B CN106331693 B CN 106331693B CN 201510385272 A CN201510385272 A CN 201510385272A CN 106331693 B CN106331693 B CN 106331693B
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Abstract
The invention discloses a kind of test system and test methods, include a display panel and a underlying platform.For display panel to provide multiple display areas, display area shows multiple testing images of corresponding different test event respectively.Underlying platform causes the camera lens of image module to be measured towards display panel to carry multiple image modules to be measured simultaneously, image module to be measured respectively shoot testing image one of them.Module to be tested can effectively be corrected because of manufacturing tolerance and jig tolerance using the present invention, or offset is ultimately imaged caused by the displacement of placement position during because of test, to obtain correct test result, and the mechanism of tester table is avoided to design complexity, and cause equipment cost excessively high.
Description
Technical field
The present invention relates to a kind of test system and test methods.Specifically, it can be provided the present invention relates to one kind multiple aobvious
Show the test system and test method in region.
Background technology
The automatic test machine platform design concept of industry is that the test event that will manually carry out originally is integrated into single at present
Follow-on test is carried out in board, according to operation principles, is broadly divided into two kinds of test methods：A kind of test method is to be measured for fixation
Test equipment by way of mobile test equipment, is moved to the placement location of different modules to be tested, to treat by die trial block
Test module carries out the test of disparity items；Another way is fixed test equipment, by way of movement module to be tested,
Module to be tested is moved under the test equipment of corresponding test event and is tested.
However, which kind of above-mentioned mode no matter is adopted, for module to be tested because of manufacturing tolerance and jig tolerance or because of test
When placement position displacement caused by be ultimately imaged offset, need to be compensated by aligning gear, just can correctly be surveyed
Test result, also must be by manually carrying out picking and placeing for module to be tested before test, and causes the unnecessary consuming of human resources.This
Outside, traditional tester table, which also has, designs excessively complexity, and the situation for causing equipment cost excessively high.
Thus, module to be tested how is effectively corrected because of manufacturing tolerance and jig tolerance or because being put during test
It puts and offset is ultimately imaged caused by the displacement of position, to obtain correct test result, and the mechanism of tester table is avoided to set
Meter is complicated, and causes equipment cost excessively high, then as industry it is anxious to be resolved the problem of.
Invention content
The brief overview about the present invention is given below, in order to provide the basic reason about certain aspects of the invention
Solution.It should be appreciated that this general introduction is not the exhaustive general introduction about the present invention.It is not intended to determine the key of the present invention
Or pith, nor is it intended to limit the scope of the present invention.Its purpose only provides certain concepts in simplified form, with
This is as the preamble in greater detail discussed later.
One embodiment of the invention is related to a test system.According to one embodiment of the invention, test system includes a display
Panel and a underlying platform.For display panel to provide multiple display areas, display area shows corresponding different test item respectively
The multiple testing images of purpose.Underlying platform causes the mirror of image module to be measured to carry multiple image modules to be measured simultaneously
Head towards display panel, image module to be measured respectively shoot testing image one of them.
The underlying platform is a rotating platform, which includes：
Multiple image module rest areas, to carry those image modules to be measured；
Wherein those images module to be measured is arranged separately on four, the upper and lower, left and right side in the plane of the rotating platform
Position.
The rotating platform also includes：
One picks and places area, when those therein one image modules to be measured of image module to be measured are turned to the position for picking and placeing area
When, those image modules to be measured image module to be measured therein is not aligned, and be turned to this and take with any display area
Those image modules to be measured image module to be measured therein for putting area is optionally removed or from the rotating platform by still
Another image module to be measured after tested is not placed alternately.
Further, have also comprising a control unit, and in those image modules to be measured one first image module to be measured,
One second image module to be measured, third image module to be measured；Those display areas are shown comprising one first display area, one second
Show region, one second display area；
The rotating platform is selectively rotated relative to the display panel to one first specific position and one second certain bits
It puts；
When the rotating platform is rotated relative to the display panel to first specific position, first image module to be measured
The testing image of first display area is shot to obtain one first image data, second image module to be measured shoot this
The testing image of two display areas shoots the third and shows to obtain one second image data and third image module to be measured
The testing image in region is to obtain a third image data.
Further, after the control unit controls the rotating platform to rotate to second specific position, this is first to be measured
Image module shoots the testing image of second display area, which shoots the third display area
The testing image.
Those display areas that the display panel is provided include：
One first display area, to show an analysis diagram and certain bitmap, and the positioning figure includes multiple anchor points；
One second display area, to show a color stain test chart；
One third display area, to show a white balance test chart.
Further, it also includes：
One arithmetic element, when one first image module to be measured of those image modules to be measured shoots first display area
After the positioning figure is to obtain one first image data, the arithmetic element is calculating those anchor points in first image data
Coordinate, using the coordinate of those anchor points in first image data with calculate in first image data those positioning
An at least distance and an at least angle between point；And
The arithmetic element is by an at least distance with an at least angle with calculate first image data one one-tenth
Image rotation gyration, an an imaging gradient and imaging displacement amount, and pass through the imaging rotation angle, the imaging gradient and this into
Image displacement gauge calculates a correction parameter, and according to the correction parameter to correct the display location of those anchor points.
The arithmetic element goes out a correction parameter according to the imaging rotation angle, the imaging gradient and the displacement calculation,
And according to the correction parameter selectively to adjust the horizontal displacement of the analysis diagram, vertical displacement, rotation angle or angle of inclination.
Those display areas are included in a test component area, which includes a black card.
Further, also comprising a control unit, an arithmetic element, a tester table display unit, the display panel packet
Containing one first display area, those image modules to be measured include one first image module to be measured, wherein：
The display panel shows certain bitmap in first display area；
The control unit controls the underlying platform to rotate to one first specific position, which makes this first treat
Image module is surveyed to be aligned with first display area；
First image module to be measured shoots the positioning figure；
The arithmetic element according to the coordinate of multiple anchor points of the positioning figure to calculate a correction parameter, and according to the correction
Parameter is to compensate an analysis diagram；
The display panel shows the analysis diagram in first display area；
First image module to be measured shoots the analysis diagram；
The tester table display unit shows analysis diagram and a test result captured by first image module to be measured.
Further, also comprising a control unit, an arithmetic element, a tester table display unit, the display panel packet
Containing one first display area, those image modules to be measured include one first image module to be measured, which is a rotation
Platform, and first image module to be measured is placed on the rotating platform, wherein：
First display area of the display panel shows an analysis diagram with positioning function；
The control unit controls the rotating platform to rotate to a specific position, make first image module to be measured with this first
Display area is aligned；
First image module to be measured shoots the analysis diagram with positioning function to obtain an image data；
The arithmetic element should judge the tool according to captured with multiple anchor points in the analysis diagram of positioning function
Whether the analysis diagram for having positioning function needs to correct；
If the arithmetic element judges that the analysis diagram with positioning function needs to correct, one in the image data is calculated
Position point coordinates, using the positioning point coordinates with calculate the image data an imaging rotation angle, an angle of inclination and one
Shifting amount, and pass through the imaging rotation angle, the angle of inclination, the displacement calculation go out a correction parameter, and join according to the correction
Count the display location to correct those anchor points；And
The arithmetic element judges the difference of the display location and a pre-determined display location of the anchor point after those corrections
It is different whether to be less than a threshold value, if the arithmetic element judges that the display location of the anchor point after those corrections is pre-determined with this
The difference of display location is less than the threshold value, then stores the correction parameter and shoot the analysis diagram with positioning function simultaneously,
And show the analysis diagram that there should be positioning function of shooting.
Another embodiment of the present invention is related to a kind of test method.According to one embodiment of the invention, test method includes：It carries
For multiple display areas, a little display areas show multiple testing images of corresponding different test event respectively；And it carries simultaneously
Multiple image modules to be measured cause the camera lens of image module to be measured towards display panel, image mould to be measured in a underlying platform
Block respectively shoot testing image one of them.
Pass through and apply an above-mentioned embodiment, you can effectively correct module to be tested because of manufacturing tolerance and jig tolerance or
Offset is ultimately imaged caused by the displacement of placement position when being because of test, to obtain correct test result, and avoids testing
The mechanism design of board is complicated, and causes equipment cost excessively high.
Description of the drawings
In order to illustrate more clearly about the embodiment of the present invention or technical scheme of the prior art, to embodiment or will show below
There is attached drawing needed in technology description to be briefly described, it should be apparent that, the accompanying drawings in the following description is only this
Some embodiments of invention, for those of ordinary skill in the art, without having to pay creative labor, may be used also
To obtain other attached drawings according to these attached drawings.
Fig. 1 is the schematic diagram of the test system according to depicted in one embodiment of the invention；
Fig. 2 is the schematic diagram in the test component area according to depicted in one embodiment of the invention；
Fig. 3 A are a vertical view of the rotating platform according to depicted in one embodiment of the invention；
Fig. 3 B are another vertical view of the rotating platform according to depicted in one embodiment of the invention；
Fig. 4 is the schematic diagram of the test system according to depicted in one embodiment of the invention；
Fig. 5 is the anchor point schematic diagram according to depicted in one embodiment of the invention；
Fig. 6 is the flow chart of the test method according to depicted in one embodiment of the invention；
Fig. 7 is the flow chart of the bearing calibration according to depicted in one embodiment of the invention；
Fig. 8 is implements the schematic diagram of bearing calibration according to depicted in one embodiment of the invention using anchor point；
Fig. 9 is the flow chart of the test method according to depicted in one embodiment of the invention.
Reference numeral：
200：Test component area
100、400：Test system
10：Display panel
11：First display area
12：Second display area
13：Third display area
14：Black card
50：Arithmetic element
40：Control unit
60：Tester table display unit
30：Test box
20：Underlying platform
A~D：Image module rest area
E：Cabling area
81~85：Anchor point
X1、X2、Y1、Y2：Line
601~608,701~706：Step.
Specific embodiment
Purpose, technical scheme and advantage to make the embodiment of the present invention are clearer, below in conjunction with the embodiment of the present invention
In attached drawing, the technical solution in the embodiment of the present invention is clearly and completely described, it is clear that described embodiment is
Part of the embodiment of the present invention, instead of all the embodiments.Described in the attached drawing of the present invention or a kind of embodiment
Elements and features can be combined with the elements and features shown in one or more other attached drawings or embodiment.It should
Note that it for purposes of clarity, is omitted in attached drawing and explanation unrelated to the invention, known to persons of ordinary skill in the art
Component and the expression and description of processing.Based on the embodiments of the present invention, those of ordinary skill in the art are not paying creation
Property labour under the premise of all other embodiments obtained, shall fall within the protection scope of the present invention.
Referring concurrently to Fig. 1 and Fig. 2.Fig. 1 is the schematic diagram of the test system 100 according to depicted in one embodiment of the invention.
Fig. 2 is the schematic diagram in the test component area 200 according to depicted in one embodiment of the invention.In Fig. 1, test system 100 includes
One display panel 10 and a underlying platform 20.In one embodiment, display panel 10 is included in test component area 200, test
Component region 200 and underlying platform 20 are put in test box 30.
As shown in Fig. 2, display panel 10 is providing multiple display areas.For example, display panel 10 is a liquid crystal
Display panel, and pass through a display surface and show an image frame, and the multiple display area is included in the institute of display panel 10
State display surface.In this embodiment, three different display areas 11~13 are provided altogether on display panel 10.These display areas
11~13 are located at different location on display panel 10 and show the multiple testing images for corresponding to different test event respectively respectively.
In one embodiment, above-mentioned multiple testing images can be respectively analysis diagram/positioning figure, color stain test chart, white balance survey
Attempt or the optic test of other tool equalities is with pattern (such as grayscale gradually layer figure, gamut map, color temperature distribution figure).Citing comes
It says, the display area 11 above display panel 10 can show analysis diagram and positioning figure, positioned at 10 lower left of display panel
Display area 12 can show color stain test chart, can be shown positioned at the display area 13 of 10 lower right of display panel white flat
Weigh test chart.
Underlying platform 20 on underlying platform 20 there are multiple image modules to put to carry multiple image modules to be measured simultaneously
It puts area's (being in this embodiment four) and causes the camera lens direction display of multiple image modules to be measured on underlying platform 20
The display surface of panel 10, wherein the position of the multiple image module to be measured correspond to respectively it is different on display panel 10
Display area, as a result, the multiple image module to be measured can simultaneously respectively shooting testing image one of them.
For example, when underlying platform 20 carries three image modules to be measured, this three image modules to be measured are respectively
First image module to be measured, the second image module to be measured, third image module to be measured.The camera lens of first image module to be measured can be used
To shoot the testing image shown by display area 11, the testing image shown by display area 11 is, for example, an analysis diagram and one
Positioning figure.In another embodiment, the analysis diagram that the testing image shown by display area 11 can have positioning function for one, example
Such as include the analysis diagram of multiple anchor points, this embodiment will be described in detail in following correspondences in the paragraphs of Fig. 9.Pass through shooting
Analysis diagram and certain bitmap can obtain the image space of this first image module shooting result to be measured, to judge the first shadow to be measured
As module whether have manufacturing tolerance, jig tolerance or because test when placement position displacement caused by migration imagery；Together
When, the camera lens of the second image module to be measured can be used to the testing image shown by shooting display area 12, wherein display area 12
Shown testing image is, for example, a white balance test chart, by shooting white balance test chart, can test this second shadow to be measured
As module is for the shooting effect of dynamic colour temperature pure color picture；Meanwhile the camera lens of third image module to be measured can be used to shooting and show
Showing the testing image shown by region 13, the wherein testing image shown by display area 13 is, for example, a color stain test chart,
By shooting color stain test chart, shooting effect of this third image module to be measured for standard pure color picture can be tested.
Therefore, multiple testing images of corresponding different test events are shown respectively by display area 11~13, can be allowed more
A image module to be measured respectively shoot those testing images one of them, with reach the same time respectively be directed to different tests
The effect that project is tested, also solving traditionally needs to prepare multiple test boxs to set different testing images respectively, further
One is shot, and causes the testing time longer and the shortcomings that required space is larger.
In addition, in another embodiment, test component area 200 is also comprising a black card 14.For example, when underlying platform 20
When carrying two image modules to be measured, the camera lens of an image module to be measured can be used to the test shadow shown by shooting display area 12
Picture, the wherein testing image shown by display area 12 are, for example, a white balance test chart, can by shooting white balance test chart
Test shooting effect of this image module to be measured for dynamic colour temperature pure color picture；In the same time, another image module to be measured
Camera lens can be used to shoot black card 14 (such as objects that color is completely black paper card or other black), by shooting black card
14 can test this another image module to be measured for hiding the shooting effect of black picture entirely.
In fact, in current display technology, show that completely black picture usually still has centainly using display panel 10
The light leakage (such as the completely black picture of LCD screen will still have the picture of certain brightness rather than completely black no brightness) of degree, it would be possible to
Lead to test error, and waste the electric energy of display panel 10 for no reason.In this embodiment, it integrates and sets in test component area 200
The black card 14 of entity is put to be hidden the test of black picture entirely, electric energy can be saved and reaches preferable test effect.But it originally takes off
Show file not to be limited comprising black card, in another embodiment, display panel 10 can also be used and show that completely black picture is black to replace
Card.
It is respectively the rotating platform according to depicted in one embodiment of the invention to please refer to Fig. 3 A and Fig. 3 B, Fig. 3 A and Fig. 3 B
Vertical view.In this embodiment, underlying platform can be a rotating platform 20, and rotating platform 20 includes image module rest area A
~D, to carry multiple image modules to be measured respectively.Rotating platform 20 is rotated multiple image modules to be measured by rotation mode
To different positions, with the respective corresponding testing image for shooting different display areas 11~13.Wherein, rotating platform 20 can pass through
Automatic or manual mode rotates.In this embodiment, rotating platform 20 can accommodate simultaneously and carry four image modules to be measured, but
The present invention is not limited thereto.In one embodiment, image module rest area A~D is arranged separately on the plane of rotating platform 20
On four, upper and lower, left and right orientation, thus image module rest area A~D at least three image modules rest areas therein can
Corresponding with display area 11~13 respectively, such as, but not limited in Fig. 2~3A figures, image module rest area D is corresponded to viewing area
Domain 12, image module rest area A are corresponded to display area 11, and image module rest area B is corresponded to display area 13, in this example
In, the image module for being placed on image module placement region D, B and A can be made to take display area 12, display area 11 respectively
And the testing image of display area 13.
In another example, as shown in Figure 3A, it is to be measured to can be used to placement first by the image module rest area D of rotating platform 20
Image module, for the first image module to be measured to shoot the testing image shown by display area 12, image module rest area A can
The second image module to be measured is placed, the second image module to be measured is to shoot the testing image shown by display area 11, when
One image module to be measured has shot the testing image shown by display area 12 and the second image module to be measured has shot viewing area
After testing image shown by domain 11, rotating platform 20 can relative to display panel 10 with rotate (such as：Toward clockwise
90 degree of rotation) to a specific position, as shown in Figure 3B, it is rolled over the first image module to be measured and is able to take display area
Testing image shown by 11 position (such as：The first image module to be measured is made to be located at the underface of display area 11), and it is same
When make the second image module to be measured be rolled over be able to take the testing image shown by display area 13 position (such as：
The second image module to be measured is made to be located at the underface of display area 13), to carry out next round shooting.
In another embodiment, there are four specific positions, such as the spy of rotating platform 20 shown in Fig. 3 A for the tool of rotating platform 20
Positioning is put, the specific position (as shown in Figure 3B) being rotated by 90 ° that rotating platform 20 shown in Fig. 3 A is turned right, will be rotated shown in Fig. 3 A
Platform 20 is toward the specific position of right rotation 180 degree and by rotating platform 20 shown in Fig. 3 A toward the specific position of 270 degree of right rotation
Deng four positions；When rotating platform 20 is rotated to each specific position, image module rest area A~D can be respectively corresponding in turn to
To display area 11~13 and one pick and place area one of them.Thus.When image module to be measured is turned to the position for picking and placeing area
When, this image module to be measured is not aligned with any display area, and causes this easy spinning platform of image module to be measured
It is removed and/or is alternately placed by another image module to be measured not yet after tested.
Therefore, by the rotation of rotating platform 20, multiple image modules to be measured can be allowed to be moved to the corresponding survey not yet shot
The display area position of item, so that image module to be measured is respectively shot for the testing image not yet shot.
In another embodiment, test system 100 also includes a control unit (not being painted), and multiple image modules to be measured
In there is the first image module to be measured, the second image module to be measured, third image module to be measured；Display area includes the first display
Region 11, the second display area 12, third display area 13；As illustrated in fig. 3, when control unit control rotating platform 20 revolves
When going to first specific position, the first image module to be measured shoots an at least testing image for the first display area 11 to obtain
One first image data, the second image module to be measured shoot an at least testing image for the second display area 12 to obtain one second
Image data and third image module 13 to be measured shoot an at least testing image for third display area to obtain a third image
Data；Then, control unit control rotating platform 20 is rotated to one second specific position, as seen in figure 3b.In control unit
Control rotating platform 20 is rotated to the second specific position, and the first image module to be measured shoots at least the one of the second display area 12
Testing image, an at least testing image for the second image module shooting third display area 13 to be measured.In one embodiment, it is controlling
Unit processed control rotating platform 20 is rotated to the second specific position, and third image module to be measured is shooting the first display area
A 11 at least testing image.
So, embodiments of the present invention are not limited to place three image modules to be measured on rotating platform 20, display surface
The quantity for the display area that plate 10 is provided is also not necessarily limited to three；It is understood that, the present invention can place multiple image moulds to be measured
Block is in rotating platform 20, and display panel 10 can provide multiple display areas, and by controlling rotating platform 20 and display panel 10
Relative rotation, multiple image modules to be measured can be made to be moved to the position for being able to take corresponding display area, thus same
Time makes multiple image modules to be measured respectively shoot different test events, and after current test event has been shot, via rotation
The rotation of platform 20, below the display area of each image module to be measured of movement to corresponding next project to be surveyed, with
Shoot the testing image of next test event.
It is noted that in Fig. 3 A~3B, but it is not limited to this to be designed as circular platform for rotating platform 20, in reality
During implementation, rotating platform 20 can be optionally designed as to the platform of elliptical platform, rectangular platform or other shapes.In addition,
In one embodiment, the cabling of each image module to be measured is put together at cabling area E by rotating platform 20, to avoid it is a plurality of walk
Line influences the rotatability of rotating platform 20.In addition, in one embodiment, rotating platform 20 can be by automatically or manually revolving
Turn unspecified angle to a specific position.
Then, also referring to Fig. 4~6.Fig. 4 is the signal of the test system according to depicted in one embodiment of the invention
Figure.Fig. 5 is the anchor point schematic diagram according to depicted in one embodiment of the invention.Fig. 6 is according to depicted in one embodiment of the invention
Test method flow chart.In the present embodiment, test system 400 can be according to the image data of each image module shooting to be measured
To generate test result, and correct the display location of analysis diagram.Wherein, the test component area 200 of test system 400, display surface
Plate 10, underlying platform 20, test box 30 are all similar to the aforementioned embodiment, therefore do not repeat herein.Test system 400 described below
Specific embodiment.
Test system 400 includes a control unit 40, an arithmetic element 50, a tester table display unit 60, and shows
Panel 10 includes one first display area 11 (as shown in Figure 2), and multiple image modules to be measured include one first image module to be measured.
In one embodiment, control unit 40, arithmetic element 50, tester table display unit 60 can be respectively placed in test
Case 30 is interior, the whole and single device to be placed in test box 30 or the whole and single device to be separated with test box 30, and
Control unit 40, arithmetic element 50, tester table display unit 60 can pass through wired or wireless transmission mode and display panel 10
And each image module connection to be measured.Wherein, control unit 40 and arithmetic element 50 respectively or can be integrated into volume circuit, such as micro-
Control unit (microcontroller), microprocessor (microprocessor), digital signal processor (digital
Signal processor), special application integrated circuit (application specific integrated circuit,
ASIC) or a logic circuit is implemented.Tester table display unit 60 can be implemented by a display.
In step 601, the first image module to be measured is placed on underlying platform 20.It in one embodiment, can be by using
Person is manual or automatically places multiple image modules to be measured on underlying platform 20 via test system 400.
In step 602, display panel 10 shows positioning figure in the first display area 11.For example, as shown in figure 5,
The positioning figure of one display area 11 display may include multiple anchor points 81~85, by opposite between each anchor point 81~85
Testing image can be made precise positioning by relationship and respective coordinate position.In another embodiment, the order of step 602 also may be used
With before step 601；Alternatively, in another embodiment, the order of step 602 can also after step 603 with step 604 it
Before.
In step 603, control unit 40 controls underlying platform 20 to rotate to one first specific position, makes the first image to be measured
Module is aligned with the first display area 11.In one embodiment, the first display area 11 display positioning figure and analysis diagram.Another
In embodiment, underlying platform 20 can carry multiple image modules to be measured, these image modules to be measured include at least the first shadow to be measured
As module, the second image module to be measured, third image module to be measured, rotated by underlying platform 20 to the first specific position,
The position of these image modules to be measured can be respectively corresponded to display area 11~13, in favor of respectively shooting display area 11~13
Shown testing image.
In step 604, the first image module shooting positioning figure to be measured.In one embodiment, underlying platform 20 is treated except first
It surveys except image module, further can at least carry the second image module to be measured and third image module to be measured, wherein, first treats
Image module is surveyed to shoot positioning figure and the analysis diagram shown by display area 11, the second image module to be measured is aobvious to shoot
Show the white balance test chart shown by region 12, third image module to be measured is shooting the color stain shown by display area 13
Test chart.In addition, in one embodiment, analysis diagram can be a check figure (SFR), grid figure (MTF), star-plot (Star
Chart) or scan line (TV line) analysis diagram, but not limited to this.
In step 605, arithmetic element 50 is according to multiple anchor points in the positioning figure captured by the first image module to be measured
Coordinate to calculate a correction parameter, and according to the correction parameter to compensate an analysis diagram.
For example, Fig. 7~8 are please referred to.Fig. 7 is the flow chart according to the bearing calibration of one embodiment of the invention.Fig. 8 is
It is according to an embodiment of the invention using anchor point to implement the schematic diagram of bearing calibration.In one embodiment, described in step 605
Analysis diagram compensation method also comprise the steps of：
In step 701, when the first image module to be measured shoots the positioning figure of the first display area 11 to obtain one first
After image data, arithmetic element 50 is calculating the coordinate of multiple anchor points in the first image data.For example, such as Fig. 8
Shown, arithmetic element 50 is calculating the coordinate of the anchor point 81~84 in the first image data.
In a step 702, arithmetic element 50 using the coordinate of the anchor point in the first image data to calculate the first image
An at least distance and an at least angle between anchor point in data, and pass through an at least distance with an at least angle to calculate
Go out an imaging rotation angle, an imaging gradient and the imaging displacement amount of the first image data.
For example, arithmetic element 50 calculate anchor point 81 in the first image data and the distance between anchor point 83,
The distance between the distance between anchor point 82 and anchor point 84, anchor point 81 and anchor point 82, anchor point 83 and anchor point 84
The distance between, the line X1 of anchor point 81 and 83 and the line Y1 of anchor point 81 and 82 formed angle, anchor point 81 and
The angle that 82 line Y1 is formed with the line (not being painted) of anchor point 81 and 84, and pass through these information to calculate first
One imaging rotation angle of image data and an imaging gradient.
In one embodiment, whether arithmetic element 50 is parallel by judging line X1 and line X2, to be used in coordinate y-axis
Slant correction, by judging whether line Y1 and line Y2 are parallel, to be used in the slant correction of coordinate x-axis.In addition, implement one
In example, anchor point 85 is used in balance correction, by the position of anchor point 85 to judge whether that overall image must be translated.
In one embodiment, using the slope for judging two diagonally opposing corner anchor points 81 and 82 lines, to carry out rotation correction.Therefore, pass through
An at least distance and an at least angle between anchor point 81~85, can calculate the first image data imaging rotation angle and into
As gradient.
In step 703, arithmetic element 50 calculates one by being imaged rotation angle, imaging gradient and imaging displacement gauge
Correction parameter, and according to correction parameter to correct the display location of the anchor point in the first image data.In one embodiment, it transports
It is toward 5 pictures of right translation that unit 50, which is calculated, by being imaged rotation angle, imaging gradient and imaging displacement gauge to calculate correction parameter
Element, then by the display location of the anchor point in the first image data toward 5 pixels of right translation.
In step 704, arithmetic element 50 judges the display location and a pre-determined display position of anchor point after correction
Whether the difference put is less than a threshold value；If so, represent allowed by above-mentioned bearing calibration correction after anchor point display
Position can be received, and enter step 705；If it is not, then returning to step 701, arithmetic element 50 is made to be corrected again.
In one embodiment, if threshold value be correction after anchor point display location relative to pre-determined display location
Difference no more than 5 pixels, the display location of anchor point is relative to pre-determined after arithmetic element 50 judges to correct
When display location is 10 pixels to the left, then it represents that the display location of anchor point still needs to correct again, therefore returns to step 701, meter
Calculate the coordinate of current anchor point.
In another embodiment, if threshold value be correction after anchor point display location relative to pre-determined display position
The rotation angle put is no more than 10 degree, and the display location of anchor point is relative to pre-determined after arithmetic element 50 judges to correct
Display location for rotation angle deviate 15 degree when, then it represents that the display location of anchor point still needs to correct again, therefore returns to step
701, calculate the coordinate of current anchor point.
Again in another embodiment, if threshold value be correct after anchor point display location relative to pre-determined display
The difference of position is no more than 5 pixels, and the display location of anchor point is relative to pre- prerequisite after arithmetic element 50 judges to correct
When fixed display location is 3 pixels to the left, then it represents that the display location of anchor point can be received after correction, enter step 705.
In step 705, correction parameter is stored, and according to correction parameter to correct the analysis diagram in the first image data
Display location.For example, if correction parameter is toward right translation 5 pixels, by the display location of analysis diagram toward right translation 5
Pixel.Arithmetic element 50 can calculate a correction ginseng according to imaging rotation angle, imaging gradient and imaging displacement gauge as a result,
Number, and according to correction parameter to adjust the horizontal displacement of analysis diagram or vertical displacement etc..In another embodiment, timing removes
According to correction parameter selectively to adjust the outer of the horizontal displacement of analysis diagram or vertical displacement, can further selectively adjust
The rotation angle of whole analysis diagram or angle of inclination so that correction result is more accurate.
In step 706, the analysis diagram after output calibration.
Then, the step 606 of Fig. 6 is returned to, display panel 10 shows analysis diagram in the first display area 11.
In step 607, the first image module shooting analysis diagram to be measured.In this step, the first image module system to be measured claps
The analysis diagram for having completed correction is taken the photograph, therefore test result can be made more accurate.
In step 608, the analysis diagram and test result of the display shooting of tester table display unit 60.
Then, please with reference to Fig. 2, Fig. 3 A, Fig. 3 B, Fig. 8 and Fig. 9.Fig. 9 is according to depicted in one embodiment of the invention
The flow chart of test method.In this example it is shown that the testing image shown by region 11 can have positioning function for one
Analysis diagram, such as include the analysis diagram of multiple anchor points, the test method step of the present embodiment described below.
In step 901, multiple modules to be measured are placed on rotating platform.In one embodiment, these modules to be measured
In include one first module to be measured.In addition, this step is described in detail above, therefore do not repeat herein.
In step 902, in analysis diagram of the first display area 11 of display panel 10 display with positioning function.One
In embodiment, the analysis diagram with positioning function can be an analysis diagram for including multiple anchor points.
In step 903, control unit 40 controls rotating platform 20 to rotate to specific position, makes mould to be measured in the block first
Module to be measured is aligned with the first display area.For example, in Fig. 3 A~3B, control unit 40 controls rotating platform 20 by original
Position (as shown in Figure 3A) is rotated by 90 ° to the right, with rotation to specific position (as shown in Figure 3B).
In step 904, there is the analysis diagram of positioning function to obtain image data for shooting.For example, it is placed on rotation
Turn that there is the first module to be measured in multiple modules to be measured on platform 20, this first module to be measured, which is rotated into, corresponds to this with fixed
Behind the position of the analysis diagram of bit function, this analysis diagram with positioning function can be shot.
In step 905, arithmetic element 50 is according to the anchor point in the captured analysis diagram with positioning function to sentence
Whether the disconnected analysis diagram with positioning function needs to correct.If desired it corrects, enters step 906, if without correction, enter
Step 911.
In one embodiment, 50 system of arithmetic element calculates the display location of the anchor point in the analysis diagram with positioning function
Whether it is less than threshold value with the difference of pre-determined display location, to judge whether the analysis diagram with positioning function needs school
Just, for example, arithmetic element 50 calculates the display location of the anchor point in the analysis diagram with positioning function and pre-determined shows
The difference for showing position is 5 pixels, this difference is less than threshold value (being, for example, that the two must not differ higher than 10 pixels), then judges this
Analysis diagram with positioning function then enters step 911 without correction；On the contrary, if arithmetic element 50, which calculates, has positioning work(
The display location of anchor point in the analysis diagram of energy and the difference of pre-determined display location are 200 pixels, this difference is small
In threshold value (being, for example, that the two must not differ higher than 10 pixels), then judge that this analysis diagram with positioning function needs to correct,
Then enter step 906.
In step 906, arithmetic element 50 calculates positioning point coordinates.For example, as shown in figure 8, arithmetic element 50 is used
To calculate the coordinate of the anchor point 81~84 in image data.
In step 907, arithmetic element 50 using position point coordinates with calculate the imaging rotation angle of the image data,
Angle of inclination, displacement.Technological means is similar to abovementioned steps 702 used by this step, therefore does not repeat herein.
In step 908, by being imaged rotation angle, angle of inclination, displacement calculation go out correction parameter, and according to correction
Parameter is to correct the display location of anchor point.Technological means is similar to abovementioned steps 703 used by this step, therefore does not go to live in the household of one's in-laws on getting married herein
It states.
In step 909, judge the display location of anchor point and pre-determined display location after correction difference whether
Less than threshold value.If judging, the display location of anchor point is less than threshold value with the difference of pre-determined display location after correction,
Then enter step 910；If judging, the display location of anchor point is not less than door with the difference of pre-determined display location after correction
Bank value, then enter step 906.In addition, technological means is similar to abovementioned steps 702 used by this step, therefore do not repeat herein.
In step 910, this analysis diagram with positioning function is shot after storing correction parameter simultaneously.In this step,
First image module system shooting to be measured has completed the analysis diagram of correction, therefore test result can be made more accurate.
In step 911, the analysis diagram and test result with positioning function of shooting are shown.
By the present invention above-mentioned test system and test method, it can automatically make multiple modules to be measured for difference
Test event be carried out at the same time test, and passing through bearing calibration makes test system effectively correct because of module process tolerance to be tested
Offset is ultimately imaged caused by the displacement of placement position during with jig tolerance or because of test, correct and essence is obtained to reach
The effect of accurate test result.
Finally it should be noted that：The above embodiments are merely illustrative of the technical solutions of the present invention, rather than its limitations；Although
The present invention is described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that：It still may be used
To modify to the technical solution recorded in foregoing embodiments or carry out equivalent replacement to which part technical characteristic；
And these modification or replace, various embodiments of the present invention technical solution that it does not separate the essence of the corresponding technical solution spirit and
Range.
Claims (20)
1. a kind of test system, which is characterized in that include：
One display panel, to provide multiple display areas, those display areas show the more of corresponding different test event respectively
A testing image；One first display area of those display areas, to show certain bitmap, and the positioning figure is comprising multiple fixed
Site；And
One underlying platform to carry multiple image modules to be measured simultaneously, and causes the camera lens direction of those image modules to be measured
The display panel, those image modules to be measured respectively shoot those testing images one of them；
The test system also includes：
One arithmetic element, when one first image module to be measured of those image modules to be measured shoot first display area this is fixed
After bitmap is to obtain one first image data, the arithmetic element is calculating the seat of those anchor points in first image data
Mark, using the coordinate of those anchor points in first image data with calculate those anchor points in first image data it
Between an at least distance and an at least angle；And
The arithmetic element passes through an at least distance and the one one-tenth image rotation of at least angle to calculate first image data
Gyration, an an imaging gradient and imaging displacement amount, and pass through the imaging rotation angle, the imaging gradient and this into image position
It moves gauge and calculates a correction parameter, and according to the correction parameter to correct the display location of those anchor points.
2. as described in claim 1 test system, which is characterized in that the underlying platform be a rotating platform, the rotating platform
Comprising：
Multiple image module rest areas, to carry those image modules to be measured；
Wherein those image modules to be measured are arranged separately on four, the upper and lower, left and right orientation in the plane of the rotating platform.
3. test system as claimed in claim 2, which is characterized in that the rotating platform also includes：
One picks and places area, when those therein one image modules to be measured of image module to be measured are turned to the position for picking and placeing area,
Those image modules to be measured image module to be measured therein is not aligned, and be turned to this and pick and place area with any display area
Those image modules to be measured image module to be measured therein be optionally removed from the rotating platform or not yet passed through
Another image module to be measured of test is alternately placed.
4. test system as claimed in claim 2, which is characterized in that also comprising a control unit, and those image moulds to be measured
There is one second image module to be measured, third image module to be measured in block；Those display areas include one second display area,
One third display area；
The rotating platform is selectively rotated relative to the display panel to one first specific position and one second specific position；
When the rotating platform is rotated relative to the display panel to first specific position, the first image module shooting to be measured
For the testing image of first display area to obtain first image data, it is second aobvious which shoots this
Show the testing image in region and shoot the third display area to obtain one second image data and third image module to be measured
The testing image to obtain a third image data.
5. test system as claimed in claim 4, which is characterized in that the rotating platform is controlled to rotate to this in the control unit
After second specific position, which shoots the testing image of second display area, second shadow to be measured
As the testing image of the module photograph third display area.
6. test system as described in claim 1, which is characterized in that also wrap those display areas that the display panel is provided
Contain：
One second display area, to show a color stain test chart；
One third display area, to show a white balance test chart.
7. as described in claim 1 test system, which is characterized in that first display area to show an analysis diagram and should
Positioning figure, the arithmetic element go out a correction parameter according to the imaging rotation angle, the imaging gradient and the displacement calculation, and
According to the correction parameter selectively to adjust the horizontal displacement of the analysis diagram, vertical displacement, rotation angle or angle of inclination.
8. test system as described in claim 1, which is characterized in that those display areas are included in a test component area, should
Test component area includes a black card.
9. test system as described in claim 1, which is characterized in that also single comprising a control unit, tester table display
Member, wherein：
The control unit controls the underlying platform to rotate to one first specific position, which makes first shadow to be measured
As module is aligned with first display area；
First image module to be measured shoots the positioning figure；
The arithmetic element according to the coordinate of those anchor points of the positioning figure to calculate a correction parameter, and according to the correction parameter
To compensate an analysis diagram；
The display panel shows the analysis diagram in first display area；
First image module to be measured shoots the analysis diagram；
The tester table display unit shows analysis diagram and a test result captured by first image module to be measured.
10. a kind of test system, which is characterized in that include：
One display panel, to provide multiple display areas, those display areas show the more of corresponding different test event respectively
A testing image；And
One underlying platform to carry multiple image modules to be measured simultaneously, and causes the camera lens direction of those image modules to be measured
The display panel, those image modules to be measured respectively shoot those testing images one of them；
For the test system also comprising a control unit, an arithmetic element, a tester table display unit, which includes one
First display area, those image modules to be measured include one first image module to be measured, which is a rotating platform,
And first image module to be measured is placed on the rotating platform, wherein：
First display area of the display panel shows an analysis diagram with positioning function；
The control unit controls the rotating platform to rotate to a specific position, makes first image module to be measured and first display
Regional alignment；
First image module to be measured shoots the analysis diagram with positioning function to obtain an image data；
The arithmetic element should judge this with fixed according to captured with multiple anchor points in the analysis diagram of positioning function
Whether the analysis diagram of bit function, which needs, corrects；
If the arithmetic element judges that the analysis diagram with positioning function needs to correct, the positioning in the image data is calculated
Point coordinates, an imaging rotation angle, an angle of inclination and a displacement using the positioning point coordinates to calculate the image data,
And pass through the imaging rotation angle, the angle of inclination, the displacement calculation go out a correction parameter, and according to the correction parameter with school
The just display location of those anchor points；And
The arithmetic element judges that the difference of the display location and a pre-determined display location of the anchor point after those corrections is
It is no to be less than a threshold value, if the arithmetic element judges display location and pre-determined display of the anchor point after those corrections
The difference of position is less than the threshold value, then stores the correction parameter and shoot the analysis diagram with positioning function simultaneously, and show
Show the analysis diagram that there should be positioning function of shooting.
11. a kind of test method, which is characterized in that include：
Multiple display areas are provided, those display areas show multiple testing images of corresponding different test event respectively；And
Multiple image modules to be measured are placed in a underlying platform, and cause camera lens one display surface of direction of those image modules to be measured
Plate, those image modules to be measured respectively shoot those testing images one of them；
The test method also includes：
By one first display area of those display areas to show certain bitmap, and the positioning figure includes multiple anchor points；
The positioning figure of first display area is shot by one first image module to be measured of those image modules to be measured to take
Obtain one first image data；
Calculate the coordinate of those anchor points in first image data；
Using the coordinate of those anchor points in first image data calculate those anchor points in first image data it
Between an at least distance and an at least angle；
By an at least distance with an at least angle with calculate first image data one imaging rotation angle, one one-tenth
As gradient and an imaging displacement amount；
One correction parameter is calculated by the imaging rotation angle, the imaging gradient and the imaging displacement gauge；
According to the correction parameter to correct the display location of those anchor points.
12. test method as claimed in claim 11, which is characterized in that the underlying platform be a rotating platform, the rotary flat
Platform includes：
Multiple image module rest areas, to carry those image modules to be measured；
Wherein those image modules to be measured are arranged separately on four, the upper and lower, left and right orientation in the plane of the rotating platform.
13. test method as claimed in claim 12, which is characterized in that also include：
When those therein one image modules to be measured of image module to be measured are turned to the position that one picks and places area, those shadows to be measured
Be not aligned with any display area as module image module to be measured therein, and be turned to this pick and place area those are to be measured
Image module image module to be measured therein is optionally removed from the rotating platform or by not yet after tested another
Image module to be measured is alternately placed.
14. test method as claimed in claim 12, which is characterized in that be measured with one second in those image modules to be measured
Image module, third image module to be measured；Those display areas include one second display area, a third display area, should
Test method also includes：
The rotating platform is controlled to rotate to one first specific position；
The testing image of second display area is shot by second image module to be measured to obtain one second image data；
The testing image of the third display area is shot by third image module to be measured to obtain a third image data；
Then, the rotating platform is controlled to rotate to one second specific position.
15. test method as claimed in claim 14, which is characterized in that second specific to this rotating platform is controlled to rotate
After the step of position, also include：
The testing image of second display area is shot by first image module to be measured；
The testing image of the third display area is shot by second image module to be measured.
16. test method as claimed in claim 11, which is characterized in that also include：
By one second display area to show a color stain test chart；
By a third display area to show a white balance test chart.
17. test method as claimed in claim 11, which is characterized in that also include：
By first display area to show an analysis diagram and the positioning figure；
A correction parameter is calculated according to the imaging rotation angle, the imaging gradient and the imaging displacement gauge；
By the correction parameter selectively to adjust the horizontal displacement of the analysis diagram, vertical displacement, rotation angle or inclination angle
Degree.
18. test method as claimed in claim 11, which is characterized in that those display areas are included in a test component area,
The test component area includes a black card.
19. a kind of test method, which is characterized in that include：
Multiple display areas are provided, those display areas show multiple testing images of corresponding different test event respectively；
Multiple image modules to be measured are placed in a underlying platform, and cause camera lens one display surface of direction of those image modules to be measured
Plate, those image modules to be measured respectively shoot those testing images one of them；
Certain bitmap is shown in one first display area of the display panel；
The underlying platform is controlled to rotate to one first specific position, makes one first image module to be measured of those image modules to be measured
It is aligned with first display area；
Shoot the positioning figure；
The coordinate of multiple anchor points according to the positioning figure is to calculate a correction parameter, and according to the correction parameter to compensate a solution
Analysis figure；
The analysis diagram is shown in first display area of the display panel；
Shoot the analysis diagram；And
Show analysis diagram and a test result captured by first image module to be measured.
20. a kind of test method, which is characterized in that include：
Multiple display areas are provided, those display areas show multiple testing images of corresponding different test event respectively；
Multiple image modules to be measured are placed in a underlying platform, and cause camera lens one display surface of direction of those image modules to be measured
Plate, those image modules to be measured respectively shoot those testing images one of them；
An analysis diagram with positioning function is shown in one first display area of the display panel；
The underlying platform is controlled to rotate to a specific position, make one first image module to be measured in those image modules to be measured with
First display area is aligned；
The analysis diagram with positioning function is shot to obtain an image data；
It should judge the solution with positioning function with multiple anchor points in the analysis diagram of positioning function according to captured
Whether analysis figure, which needs, corrects, if judging, the analysis diagram with positioning function needs to correct, and calculates one in the image data
Position point coordinates, using the positioning point coordinates with calculate the image data an imaging rotation angle, an angle of inclination and one
Shifting amount, and pass through the imaging rotation angle, the angle of inclination, the displacement calculation go out a correction parameter, and join according to the correction
Count the display location to correct those anchor points；And
Judge whether the display location of the anchor point after those corrections is less than one with the difference of a pre-determined display location
Bank value, if judging, the display location of the anchor point after those corrections is less than the door with the difference of the pre-determined display location
Value, then store the correction parameter and shoot the analysis diagram with positioning function simultaneously, and shows that should having for shooting positions work(
The analysis diagram and a test result of energy.
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| CN112747901A (en) * | 2019-10-30 | 2021-05-04 | 晋城三赢精密电子有限公司 | Image testing device and system |
| CN113365045B (en) * | 2020-03-04 | 2022-10-11 | 余姚舜宇智能光学技术有限公司 | Camera module detection method, device and system |
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| CN1871860A (en) * | 2003-08-22 | 2006-11-29 | 微米技术有限公司 | Method and apparatus for testing image sensors |
| TWM379758U (en) * | 2009-11-18 | 2010-05-01 | Nat Applied Res Laboratories | Lens imaging quality detecting apparatus |
| TW201214018A (en) * | 2010-09-24 | 2012-04-01 | Hon Hai Prec Ind Co Ltd | Device for testing lens module |
| CN103207514A (en) * | 2012-01-13 | 2013-07-17 | 鸿富锦精密工业（深圳）有限公司 | Lens detecting device and method |
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| TW200826211A (en) * | 2006-12-12 | 2008-06-16 | Visera Technologies Co Ltd | Wafer-level test module and method of image sensor chip |
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|---|---|---|---|---|
| CN1871860A (en) * | 2003-08-22 | 2006-11-29 | 微米技术有限公司 | Method and apparatus for testing image sensors |
| TWM379758U (en) * | 2009-11-18 | 2010-05-01 | Nat Applied Res Laboratories | Lens imaging quality detecting apparatus |
| TW201214018A (en) * | 2010-09-24 | 2012-04-01 | Hon Hai Prec Ind Co Ltd | Device for testing lens module |
| CN103207514A (en) * | 2012-01-13 | 2013-07-17 | 鸿富锦精密工业（深圳）有限公司 | Lens detecting device and method |
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