CN106331545A - Thunder strike-preventive testing mis-protection circuit and TV - Google Patents
Thunder strike-preventive testing mis-protection circuit and TV Download PDFInfo
- Publication number
- CN106331545A CN106331545A CN201610930343.7A CN201610930343A CN106331545A CN 106331545 A CN106331545 A CN 106331545A CN 201610930343 A CN201610930343 A CN 201610930343A CN 106331545 A CN106331545 A CN 106331545A
- Authority
- CN
- China
- Prior art keywords
- audion
- semiconductor
- oxide
- metal
- connects
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N5/00—Details of television systems
- H04N5/63—Generation or supply of power specially adapted for television receivers
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02H—EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
- H02H9/00—Emergency protective circuit arrangements for limiting excess current or voltage without disconnection
- H02H9/04—Emergency protective circuit arrangements for limiting excess current or voltage without disconnection responsive to excess voltage
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N17/00—Diagnosis, testing or measuring for television systems or their details
Abstract
The invention belongs to the technical field of protection circuits and particularly relates to a thunder strike-preventive testing mis-protection circuit and a TV. In an embodiment, a capacitor C23 is parallelly connected over the ground at a reference pin of a programmable parallel-connection voltage stabilizer Q1 to inhibit mis-operation action caused by thunder strike on testing interference signals; the interference signals are quite short in time, so that voltage output by a power source driving module is quite short in time; when the voltage passes the capacitor C23, the energy is absorbed by the capacitor, so that the programmable parallel-connection voltage stabilizer Q1 is prevented from being broken down, no high voltage is input into the power source driving module, the problem of mis-operation caused by thunder strike testing is solved effectively, and the TV is free of the phenomenon of blank screen.
Description
Technical field
The invention belongs to protection circuit technical field, particularly relate to one and prevent lightning test protection circuit and TV by mistake
Machine.
Background technology
LLC resonance oscillation semi-bridge LD6599 scheme is because its work efficiency is high (can reach more than 93%), and element temperature rise is low, outward
Contour road design simple application is flexible, and whole power supply can be accomplished the thinnest, and the advantage such as operating frequency width, so fortune
With widely, including mains lighting supply, TV power supply, modular power source, adapter etc..
If in the case of the design of IC periphery circuit is irrational, arising that some beyond thought problems, such as going out
Now extremely will not protect, or miss the faults such as protection, the mistake that such as power panel application occurs when doing lightning test on a television set
Conservation status, and television set there will be blank screen phenomenon when doing lightning test.
Summary of the invention
The purpose of the embodiment of the present invention is to provide one to prevent lightning test protection circuit and television set by mistake, it is intended to solve
Present television set is when doing lightning test, because protection by mistake, it may appear that the problem of blank screen phenomenon.
The embodiment of the present invention is achieved in that one prevents lightning test by mistake protection circuit, described in prevent lightning test
Protection circuit includes electric power driving module and thunderbolt immunity module by mistake, and described thunderbolt immunity module includes:
Audion D3, electric capacity C23, shunt regulator Q1 able to programme, resistance R16 and audion Q9；
The anode of described audion D3 connects described electric power driving module, and the negative electrode of described audion D3 passes through described electric capacity
C23 ground connection, the benchmark foot of described shunt regulator Q1 able to programme connects the negative electrode of described audion D3, described parallel voltage-stabilizing able to programme
The plus earth of device Q1, the negative electrode of described shunt regulator Q1 able to programme meets the base stage of described audion Q9, described audion Q9
Emitter stage connect the negative electrode of described shunt regulator Q1 able to programme by described resistance R16, the colelctor electrode of described audion Q9 connects
Described electric power driving module.
In said structure, described electric power driving module includes:
Frequency-adjustable pulse signal generation chip U5, resistance R33, metal-oxide-semiconductor Q5 and metal-oxide-semiconductor Q7；
The overcurrent of described frequency-adjustable pulse signal generation chip U5 is delayed to turn off holding DELAY to meet described audion D3
Anode, the over-voltage over-current protection input DIS of described frequency-adjustable pulse signal generation chip U5 is connect by described resistance R33
The colelctor electrode of described audion Q9, the high-side driver pulse output end HVG of described frequency-adjustable pulse signal generation chip U5 connects
The grid of described metal-oxide-semiconductor Q5, the drain electrode of described metal-oxide-semiconductor Q5 connects power supply, and the source electrode of described metal-oxide-semiconductor Q5 connects the leakage of described metal-oxide-semiconductor Q7
Pole, the grid of described metal-oxide-semiconductor Q7 meets the low side driving pulse outfan LVG of described frequency-adjustable pulse signal generation chip U5,
The source ground of described metal-oxide-semiconductor Q7.
The another object of the embodiment of the present invention is to provide a kind of television set, and described television set includes preventing lightning test by mistake
Protection circuit, described in prevent lightning test by mistake protection circuit from including electric power driving module and thunderbolt immunity module, described thunderbolt
Immunity module includes:
Audion D3, electric capacity C23, shunt regulator Q1 able to programme, resistance R16 and audion Q9；
The anode of described audion D3 connects described electric power driving module, and the negative electrode of described audion D3 passes through described electric capacity
C23 ground connection, the benchmark foot of described shunt regulator Q1 able to programme connects the negative electrode of described audion D3, described parallel voltage-stabilizing able to programme
The plus earth of device Q1, the negative electrode of described shunt regulator Q1 able to programme meets the base stage of described audion Q9, described audion Q9
Emitter stage connect the negative electrode of described shunt regulator Q1 able to programme by described resistance R16, the colelctor electrode of described audion Q9 connects
Described electric power driving module.
In said structure, described electric power driving module includes:
Frequency-adjustable pulse signal generation chip U5, resistance R33, metal-oxide-semiconductor Q5 and metal-oxide-semiconductor Q7；
The overcurrent of described frequency-adjustable pulse signal generation chip U5 is delayed to turn off holding DELAY to meet described audion D3
Anode, the over-voltage over-current protection input DIS of described frequency-adjustable pulse signal generation chip U5 is connect by described resistance R33
The colelctor electrode of described audion Q9, the high-side driver pulse output end HVG of described frequency-adjustable pulse signal generation chip U5 connects
The grid of described metal-oxide-semiconductor Q5, the drain electrode of described metal-oxide-semiconductor Q5 connects power supply, and the source electrode of described metal-oxide-semiconductor Q5 connects the leakage of described metal-oxide-semiconductor Q7
Pole, the grid of described metal-oxide-semiconductor Q7 meets the low side driving pulse outfan LVG of described frequency-adjustable pulse signal generation chip U5,
The source ground of described metal-oxide-semiconductor Q7.
In said structure, described television set also includes whole with the output that the drain electrode of described metal-oxide-semiconductor Q7 and source electrode are connected respectively
Flow module.
In said structure, described television set also includes the overcurrent and overvoltage protective module being connected with described output rectification module.
In embodiments of the present invention, the benchmark foot at shunt regulator Q1 able to programme over the ground and meets an electric capacity C23, presses down
The error protection action that system so causes because of lightning test interference signal, because the time of interference signal is the shortest, so power supply
The voltage driving module to be exported is the shortest, and when voltage is through electric capacity C23, this energy will be by this electricity
Hold to sponging, from without allowing shunt regulator Q1 able to programme puncture, a high voltage also would not be had to be input to power supply and drive
Dynamic model block, so effectively solving the mistake protection phenomenon playing lightning test and cause, television set does not haves the phenomenon of blank screen.
Accompanying drawing explanation
Fig. 1 is the structure chart preventing lightning test protection circuit by mistake that the embodiment of the present invention provides；
Fig. 2 is the circuit structure diagram of the television set that the embodiment of the present invention provides.
Detailed description of the invention
In order to make the purpose of the present invention, technical scheme and advantage clearer, below in conjunction with drawings and Examples, right
The present invention is further elaborated.Should be appreciated that specific embodiment described herein only in order to explain the present invention, and
It is not used in the restriction present invention.
Fig. 1 shows the structure preventing lightning test protection circuit by mistake that the embodiment of the present invention provides, for convenience of description,
Illustrate only the part relevant to the embodiment of the present invention.
One prevents lightning test by mistake protection circuit, described in prevent lightning test protection circuit by mistake from including electric power driving module
1 and thunderbolt immunity module 2, described thunderbolt immunity module 2 includes:
Audion D3, electric capacity C23, shunt regulator Q1 able to programme, resistance R16 and audion Q9；
The anode of described audion D3 connects described electric power driving module 1, and the negative electrode of described audion D3 passes through described electric capacity
C23 ground connection, the benchmark foot of described shunt regulator Q1 able to programme connects the negative electrode of described audion D3, described parallel voltage-stabilizing able to programme
The plus earth of device Q1, the negative electrode of described shunt regulator Q1 able to programme meets the base stage of described audion Q9, described audion Q9
Emitter stage connect the negative electrode of described shunt regulator Q1 able to programme by described resistance R16, the colelctor electrode of described audion Q9 connects
Described electric power driving module 1.
As one embodiment of the invention, described electric power driving module 1 includes:
Frequency-adjustable pulse signal generation chip U5, resistance R33, metal-oxide-semiconductor Q5 and metal-oxide-semiconductor Q7；
The overcurrent of described frequency-adjustable pulse signal generation chip U5 is delayed to turn off holding DELAY to meet described audion D3
Anode, the over-voltage over-current protection input DIS of described frequency-adjustable pulse signal generation chip U5 is connect by described resistance R33
The colelctor electrode of described audion Q9, the high-side driver pulse output end HVG of described frequency-adjustable pulse signal generation chip U5 connects
The grid of described metal-oxide-semiconductor Q5, the drain electrode of described metal-oxide-semiconductor Q5 connects power supply, and the source electrode of described metal-oxide-semiconductor Q5 connects the leakage of described metal-oxide-semiconductor Q7
Pole, the grid of described metal-oxide-semiconductor Q7 meets the low side driving pulse outfan LVG of described frequency-adjustable pulse signal generation chip U5,
The source ground of described metal-oxide-semiconductor Q7.
Fig. 2 shows the structure of the television set that the embodiment of the present invention provides, and for convenience of description, illustrate only and the present invention
The part that embodiment is relevant.
A kind of television set, described television set includes preventing lightning test protection circuit by mistake, described in prevent lightning test from protecting by mistake
Protection circuit includes electric power driving module 1 and thunderbolt immunity module 2, and described thunderbolt immunity module 2 includes:
Audion D3, electric capacity C23, shunt regulator Q1 able to programme, resistance R16 and audion Q9；
The anode of described audion D3 connects described electric power driving module 1, and the negative electrode of described audion D3 passes through described electric capacity
C23 ground connection, the benchmark foot of described shunt regulator Q1 able to programme connects the negative electrode of described audion D3, described parallel voltage-stabilizing able to programme
The plus earth of device Q1, the negative electrode of described shunt regulator Q1 able to programme meets the base stage of described audion Q9, described audion Q9
Emitter stage connect the negative electrode of described shunt regulator Q1 able to programme by described resistance R16, the colelctor electrode of described audion Q9 connects
Described electric power driving module 1.
As one embodiment of the invention, described electric power driving module 1 includes:
Frequency-adjustable pulse signal generation chip U5, resistance R33, metal-oxide-semiconductor Q5 and metal-oxide-semiconductor Q7；
The overcurrent of described frequency-adjustable pulse signal generation chip U5 is delayed to turn off holding DELAY to meet described audion D3
Anode, the over-voltage over-current protection input DIS of described frequency-adjustable pulse signal generation chip U5 is connect by described resistance R33
The colelctor electrode of described audion Q9, the high-side driver pulse output end HVG of described frequency-adjustable pulse signal generation chip U5 connects
The grid of described metal-oxide-semiconductor Q5, the drain electrode of described metal-oxide-semiconductor Q5 connects power supply, and the source electrode of described metal-oxide-semiconductor Q5 connects the leakage of described metal-oxide-semiconductor Q7
Pole, the grid of described metal-oxide-semiconductor Q7 meets the low side driving pulse outfan LVG of described frequency-adjustable pulse signal generation chip U5,
The source ground of described metal-oxide-semiconductor Q7.
As one embodiment of the invention, described television set also includes being connected with drain electrode and the source electrode of described metal-oxide-semiconductor Q7 respectively
Output rectification module 3.
As one embodiment of the invention, described television set also includes the overcurrent-overvoltage being connected with described output rectification module 3
Protection module 4.
Operation principle: when carrying out lightning test, because the pulse voltage of lightning test is at least more than 2KV, so often
Beating and be once struck by lightning, frequency-adjustable pulse signal generation chip U5 peripheral circuit will receive some noises interference signal, such as
The current detecting foot of the 6th foot and the input detection voltage foot of the 7th foot, once this functional pin has received than oneself institute not
During the high voltage that can bear, inside frequency-adjustable pulse signal generation chip U5, end will be delayed to turn off by overcurrent
DELAY sends a protection voltage, although the output time of this voltage can be the shortest, but equally can be formed the most above-mentioned said
Protection process.But owing to this noise interference signal will make it protect, hence it is evident that do not meet design and require, so solving this
One method is exactly over the ground and to meet an electric capacity C23 at the benchmark foot of shunt regulator Q1 able to programme, suppresses so because interference
Signal and the error protection action that causes, because the time of interference signal is the shortest, so frequency-adjustable pulse signal generation chip U5
Overcurrent be delayed to turn off holding the voltage that exported of DELAY the shortest, when voltage is through electric capacity C23,
This energy will be sponged by this electric capacity, shunt regulator Q1 able to programme will not be allowed to puncture, also would not have a high electricity
Pressure is input to the over-voltage over-current protection input DIS of frequency-adjustable pulse signal generation chip U5.Beat so effectively solving
Lightning test and cause mistake protection phenomenon.
In embodiments of the present invention, the benchmark foot at shunt regulator Q1 able to programme over the ground and meets an electric capacity C23, presses down
The error protection action that system so causes because of lightning test interference signal, because the time of interference signal is the shortest, so power supply
The voltage driving module to be exported is the shortest, and when voltage is through electric capacity C23, this energy will be by this electricity
Hold to sponging, from without allowing shunt regulator Q1 able to programme puncture, a high voltage also would not be had to be input to power supply and drive
Dynamic model block, so effectively solving the mistake protection phenomenon playing lightning test and cause, television set does not haves the phenomenon of blank screen.
The foregoing is only presently preferred embodiments of the present invention, not in order to limit the present invention, all essences in the present invention
Any amendment, equivalent and the improvement etc. made within god and principle, should be included within the scope of the present invention.
Claims (6)
1. one kind prevents lightning test by mistake protection circuit, it is characterised in that described in prevent lightning test protection circuit by mistake from including electricity
Source drives module and thunderbolt immunity module, and described thunderbolt immunity module includes:
Audion D3, electric capacity C23, shunt regulator Q1 able to programme, resistance R16 and audion Q9；
The anode of described audion D3 connects described electric power driving module, and the negative electrode of described audion D3 is connect by described electric capacity C23
Ground, the benchmark foot of described shunt regulator Q1 able to programme meets the negative electrode of described audion D3, described shunt regulator Q1 able to programme
Plus earth, the negative electrode of described shunt regulator Q1 able to programme connects the base stage of described audion Q9, described audion Q9 send out
Emitter-base bandgap grading connects the negative electrode of described shunt regulator Q1 able to programme by described resistance R16, and the colelctor electrode of described audion Q9 connects described
Electric power driving module.
Prevent lightning test protection circuit by mistake the most as claimed in claim 1, it is characterised in that described electric power driving module bag
Include:
Frequency-adjustable pulse signal generation chip U5, resistance R33, metal-oxide-semiconductor Q5 and metal-oxide-semiconductor Q7；
The overcurrent of described frequency-adjustable pulse signal generation chip U5 is delayed to turn off the sun holding DELAY to meet described audion D3
Pole, the over-voltage over-current protection input DIS of described frequency-adjustable pulse signal generation chip U5 connects described by described resistance R33
The colelctor electrode of audion Q9, the high-side driver pulse output end HVG of described frequency-adjustable pulse signal generation chip U5 connects described
The grid of metal-oxide-semiconductor Q5, the drain electrode of described metal-oxide-semiconductor Q5 connects power supply, and the source electrode of described metal-oxide-semiconductor Q5 meets the drain electrode of described metal-oxide-semiconductor Q7, institute
The grid stating metal-oxide-semiconductor Q7 meets the low side driving pulse outfan LVG of described frequency-adjustable pulse signal generation chip U5, described
The source ground of metal-oxide-semiconductor Q7.
3. a television set, it is characterised in that described television set includes preventing lightning test protection circuit by mistake, it is characterised in that
Described prevent lightning test by mistake protection circuit from including electric power driving module and thunderbolt immunity module, described thunderbolt immunity module
Including:
Audion D3, electric capacity C23, shunt regulator Q1 able to programme, resistance R16 and audion Q9；
The anode of described audion D3 connects described electric power driving module, and the negative electrode of described audion D3 is connect by described electric capacity C23
Ground, the benchmark foot of described shunt regulator Q1 able to programme meets the negative electrode of described audion D3, described shunt regulator Q1 able to programme
Plus earth, the negative electrode of described shunt regulator Q1 able to programme connects the base stage of described audion Q9, described audion Q9 send out
Emitter-base bandgap grading connects the negative electrode of described shunt regulator Q1 able to programme by described resistance R16, and the colelctor electrode of described audion Q9 connects described
Electric power driving module.
4. television set as claimed in claim 3, it is characterised in that described electric power driving module includes:
Frequency-adjustable pulse signal generation chip U5, resistance R33, metal-oxide-semiconductor Q5 and metal-oxide-semiconductor Q7；
The overcurrent of described frequency-adjustable pulse signal generation chip U5 is delayed to turn off the sun holding DELAY to meet described audion D3
Pole, the over-voltage over-current protection input DIS of described frequency-adjustable pulse signal generation chip U5 connects described by described resistance R33
The colelctor electrode of audion Q9, the high-side driver pulse output end HVG of described frequency-adjustable pulse signal generation chip U5 connects described
The grid of metal-oxide-semiconductor Q5, the drain electrode of described metal-oxide-semiconductor Q5 connects power supply, and the source electrode of described metal-oxide-semiconductor Q5 meets the drain electrode of described metal-oxide-semiconductor Q7, institute
The grid stating metal-oxide-semiconductor Q7 meets the low side driving pulse outfan LVG of described frequency-adjustable pulse signal generation chip U5, described
The source ground of metal-oxide-semiconductor Q7.
5. television set as claimed in claim 3, it is characterised in that described television set also includes respectively with described metal-oxide-semiconductor Q7's
The output rectification module that drain electrode and source electrode connect.
6. television set as claimed in claim 4, it is characterised in that described television set also includes with described output rectification module even
The overcurrent and overvoltage protective module connect.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610930343.7A CN106331545B (en) | 2016-10-31 | 2016-10-31 | Lightning stroke prevention test error protection circuit and television |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610930343.7A CN106331545B (en) | 2016-10-31 | 2016-10-31 | Lightning stroke prevention test error protection circuit and television |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN106331545A true CN106331545A (en) | 2017-01-11 |
| CN106331545B CN106331545B (en) | 2023-02-14 |
Family
ID=57818241
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610930343.7A Active CN106331545B (en) | 2016-10-31 | 2016-10-31 | Lightning stroke prevention test error protection circuit and television |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN106331545B (en) |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2511032Y (en) * | 2001-10-15 | 2002-09-11 | 海信集团有限公司 | Domestic-appliance lightning-stroke-proof apparatus of mainly preventing from inductive lightning |
| CN102025137A (en) * | 2009-09-21 | 2011-04-20 | 群康科技(深圳)有限公司 | Electrostatic discharge protection circuit and electronic device with same |
| CN202551203U (en) * | 2012-04-27 | 2012-11-21 | 深圳创维－Rgb电子有限公司 | Singlechip microcomputer power supply management circuit and television constant-current driving plate |
| CN202678955U (en) * | 2012-07-12 | 2013-01-16 | 深圳市普德新星电源技术有限公司 | Device preventing power supply from being restarted during a lightning stroke |
| CN103683244A (en) * | 2013-12-03 | 2014-03-26 | 天津航空机电有限公司 | Power loop driving circuit and current-limiting method of solid-state power controller |
| CN205141989U (en) * | 2015-11-27 | 2016-04-06 | 明纬(广州)电子有限公司 | Switching power supply circuit of interference is hit in lightning protection |
| CN206212156U (en) * | 2016-10-31 | 2017-05-31 | 合肥惠科金扬科技有限公司 | One kind prevents lightning test from missing protection circuit and television set |
-
2016
- 2016-10-31 CN CN201610930343.7A patent/CN106331545B/en active Active
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2511032Y (en) * | 2001-10-15 | 2002-09-11 | 海信集团有限公司 | Domestic-appliance lightning-stroke-proof apparatus of mainly preventing from inductive lightning |
| CN102025137A (en) * | 2009-09-21 | 2011-04-20 | 群康科技(深圳)有限公司 | Electrostatic discharge protection circuit and electronic device with same |
| CN202551203U (en) * | 2012-04-27 | 2012-11-21 | 深圳创维－Rgb电子有限公司 | Singlechip microcomputer power supply management circuit and television constant-current driving plate |
| CN202678955U (en) * | 2012-07-12 | 2013-01-16 | 深圳市普德新星电源技术有限公司 | Device preventing power supply from being restarted during a lightning stroke |
| CN103683244A (en) * | 2013-12-03 | 2014-03-26 | 天津航空机电有限公司 | Power loop driving circuit and current-limiting method of solid-state power controller |
| CN205141989U (en) * | 2015-11-27 | 2016-04-06 | 明纬(广州)电子有限公司 | Switching power supply circuit of interference is hit in lightning protection |
| CN206212156U (en) * | 2016-10-31 | 2017-05-31 | 合肥惠科金扬科技有限公司 | One kind prevents lightning test from missing protection circuit and television set |
Also Published As
| Publication number | Publication date |
|---|---|
| CN106331545B (en) | 2023-02-14 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN103248033B (en) | Transient and DC synchronous triggering type power supply clamping ESD protection circuit | |
| CN102693978B (en) | Electrostatic discharge protection circuit | |
| CN105577153A (en) | Semiconductor device | |
| CN106026621A (en) | IGBT drive circuit for preventing short circuit protection blind area and detection method | |
| CN204906177U (en) | IGBT turn -offs overvoltage active clamping circuit | |
| CN104242249A (en) | Protective circuit of switching power supply | |
| US9172298B2 (en) | Fully-controlled bridge rectifying device with surge suppression function | |
| CN205829455U (en) | The IGBT drive circuit of short-circuit protection blind area avoided by a kind of band | |
| CN103619095A (en) | LED driving circuit | |
| CN202503261U (en) | Protective device of input voltage fluctuation | |
| CN107425811B (en) | The monitoring device and photovoltaic generating system of photovoltaic module | |
| CN103545792A (en) | ACS710 based frequency converter overcurrent protection circuit and method | |
| CN107453739A (en) | Drive Protecting Circuit, integrated circuit, IPM modules and the air conditioner of power switch pipe | |
| CN202772560U (en) | IGBT current foldback circuit and inductive load control circuit | |
| CN107204613B (en) | A kind of over-pressure safety device and method | |
| CN203590551U (en) | Led drive circuit | |
| CN206212156U (en) | One kind prevents lightning test from missing protection circuit and television set | |
| CN206412759U (en) | A kind of electronic equipment and its electrostatic discharge protection circuit | |
| CN203193500U (en) | Switching power supply and charging loop thereof | |
| CN202930915U (en) | Short circuit protection device of frequency converter switch power supply | |
| CN106331545A (en) | Thunder strike-preventive testing mis-protection circuit and TV | |
| CN201781268U (en) | Over-voltage protection device of inverter | |
| CN104377674B (en) | Electrostatic discharge protection circuit and integrated circuit | |
| CN202872328U (en) | Power supply input voltage overvoltage protection circuit used for single-phase inverter type welder | |
| CN103326344A (en) | Overvoltage limiting circuit |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |