CN106330591B - OAM test method and equipment for communication system - Google Patents
OAM test method and equipment for communication system Download PDFInfo
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Abstract
The invention provides an OAM test method and equipment of a communication system, wherein the method comprises the following steps: sending a first signal to a tested system and receiving a second signal fed back by the tested system, wherein the second signal is a feedback signal of the first signal; changing a first parameter of the first signal at intervals of a first preset time; acquiring parameters of a second signal at intervals of second preset time, and acquiring at least one parameter which has a mapping relation with the first parameter according to a communication interface protocol from the parameters of the second signal to form a second parameter set; and generating a test result according to the first parameter and the second parameter set. The invention provides a simulation scene and an automatic test means for testing the OAM function and performance of the communication system to verify the time degradation output function, the frequency synchronization and the time synchronization association mechanism of the OAM, and realizes the association verification of different time interface protocols and the automatic test of the source selection function between different time interfaces of the equipment.
Description
Technical Field
The present invention relates to the field of communications technologies, and in particular, to an OAM test method and an OAM test apparatus for a communication system.
Background
OAM refers to operation, maintenance, and management of a communication system. In order to make the communication system operate normally, the OAM maintaining time synchronization and frequency synchronization of the communication system needs to be tested. The existing OAM test equipment can test the functions and performances such as the time and frequency synchronization precision, but the existing test equipment can test the functions and performances under the normal working condition of a synchronous network and a system and can not test the synchronous OAM functions of the synchronous network and the system under the abnormal condition; the existing test equipment cannot analyze the change of the tested equipment caused by the change of the output signal of the test equipment; the existing testing equipment firstly collects data such as interactive messages of a synchronous network and a system, then manually analyzes the data, and judges whether the functions and performances of the synchronous network and the system meet requirements or not, so that the system has the problems of large testing workload, complex testing steps, easiness in operation, error judgment and the like.
Disclosure of Invention
The invention provides an OAM testing method and equipment of a communication system, and aims to solve the problems that the existing OAM testing equipment cannot test synchronous OAM functions of a synchronous network and a system under abnormal conditions, the workload is large, the testing steps are complicated, operation and judgment errors are easy to occur, and the like.
In order to achieve the above object, an embodiment of the present invention provides a method for OAM testing a communication system, where the method includes:
sending a first signal to a tested system and receiving a second signal fed back by the tested system, wherein the second signal is a feedback signal of the first signal;
changing a first parameter of the first signal at intervals of a first preset time;
acquiring parameters of a second signal at intervals of second preset time, and acquiring at least one parameter which has a mapping relation with the first parameter according to a communication interface protocol from the parameters of the second signal to form a second parameter set;
and generating a test result according to the first parameter and the second parameter set.
Further, the first signal includes at least one of a precision time synchronization protocol (PTP) signal, an external timing frequency signal or a line frequency signal, a pulse per second and a current time 1PPS + TOD signal.
Further, the step of generating a detection result according to the first parameter and the second parameter set specifically includes:
judging whether all elements in the second parameter set make corresponding changes according to the mapping relation along with the changes of the first parameters: if so, generating a test result which passes the test; otherwise, generating a test result that the test fails.
Further, after the step of sending the first signal to the system under test and receiving the second signal fed back by the system under test, the method further comprises:
judging whether the communication with the tested system is normal: if yes, executing a step of changing a first parameter of the first signal at intervals of a first preset time; otherwise, prompting the abnormal connection.
Further, the parameters of the PTP signal include: one or more of clock quality class ClockClass, Priority, time traceability, frequency traceability, time Source TimeSource, current coordinated world time and International atomic time offset currentUtcOffset, and Master clock number GrandmasterIdentity; the parameters of the 1PPS + TOD signal comprise one of a pulse-per-second state and a Leap second value Leap Seconds; the parameters of the external timing frequency signal or the line frequency signal comprise at least synchronization status information SSM.
Further, when testing the time degradation output function of the tested system, the first signal is a PTP time signal or a 1PPS + TOD time signal;
a first parameter of a PTP time signal as a first signal is Clockclass, and a second signal is a PTP time signal fed back by the system to be tested and a 1PPS + TOD time signal; a PTP time signal as a second signal, wherein the second parameter set at least comprises a timeSource and a Clockclass; a 1PPS + TOD time signal as a second signal, wherein the second parameter set at least comprises a pulse per second state of the TOD message;
the first parameter of the 1PPS + TOD time signal as the first signal is the pulse per second state, and the second signal is a PTP time signal and a 1PPS + TOD time signal fed back by the system to be tested; a PTP time signal as a second signal, wherein the second parameter set at least comprises a timeSource and a Clockclass; and the second signal is 1PPS + TOD time signal, and the second parameter set at least comprises the pulse per second state of the TOD message.
Further, when the tested system is tested for the source selection function of different time interfaces of the device, the first signal is a PTP time signal and a 1PPS + TOD time signal;
the first parameters of the PTP time signal as the first signal are Priority and ClockClass, and the second signal is a PTP time signal fed back by the tested system and a 1PPS + TOD time signal;
a PTP time signal as a second signal, the second parameter set at least comprising Priority1, ClockClass and grandmaster identity;
the second parameter set of the 1PPS + TOD time signal as the second signal at least comprises the pulse per second state of the TOD message.
Further, when the leap second processing function of the system to be tested is tested, the first signal is a PTP time signal or a 1PPS + TOD time signal;
a first parameter of a PTP time signal as a first signal is currentUtcOffset, and a second signal is a PTP time signal fed back by a system to be tested and a 1PPS + TOD time signal; a PTP time signal as the second signal, the second parameter set including at least currentutcofset; a 1PPS + TOD time signal as a second signal, the second parameter set at least comprising Leap Seconds;
the first parameter of the 1PPS + TOD time signal as the first signal is Leap Seconds, the second signal is the 1PPS + TOD time signal fed back by the tested system, and the second signal is the PTP time signal and the 1PPS + TOD time signal fed back by the tested system; a PTP time signal as the second signal, the second parameter set including at least currentutcofset; the second signal is 1PPS + TOD time signal, and the second parameter set includes at least Leap Seconds.
Further, when a frequency synchronization and time synchronization correlation mechanism of a system to be tested is tested, the first signal is a PTP time signal and an external timing frequency signal or a line frequency signal;
the first parameter of the external timing frequency signal or the line frequency signal as the first signal is SSM, the second signal is PTP time signal fed back by the tested system, and the second parameter set at least comprises Grandmaster identity, ClockClass, timeTracable and frequencTracable.
In order to achieve the above object, the present invention also provides an OAM test apparatus of a communication system, the apparatus including:
the signal interaction module is used for sending a first signal to a tested system and receiving a second signal fed back by the tested system, wherein the second signal is a feedback signal of the first signal;
the first parameter processing module is used for changing a first parameter of the first signal at intervals of first preset time;
the acquisition module is used for acquiring parameters of a second signal at intervals of second preset time, acquiring at least one parameter which has a mapping relation with the first parameter according to a communication interface protocol from the parameters of the second signal, and forming a second parameter set;
and the test result generating module is used for generating a test result according to the first parameter and the second parameter set.
Further, the first signal includes at least one of a precision time synchronization protocol (PTP) signal, an external timing frequency signal or a line frequency signal, a pulse per second and a current time 1PPS + TOD signal.
Further, the test result generation module specifically includes:
the judgment submodule is used for judging whether all the elements in the second parameter set correspondingly change along with the change of the first parameter according to the mapping relation: if so, generating a test result which passes the test; otherwise, generating a test result that the test fails.
Further, the apparatus further comprises:
the connection judging module is used for sending a first signal to the tested system and receiving a second signal fed back by the tested system after the signal interaction module sends the first signal to the tested system,
judging whether the communication with the tested system is normal: if yes, executing a step of changing a first parameter of the first signal at intervals of a first preset time; otherwise, prompting the abnormal connection.
Further, the parameters of the PTP signal include: one or more of clock quality class ClockClass, Priority, time traceability, frequency traceability, time Source TimeSource, current coordinated world time and International atomic time offset currentUtcOffset, and Master clock number GrandmasterIdentity; the parameters of the 1PPS + TOD signal at least comprise one of a pulse per second state and a Leap second value Leap Seconds; the parameters of the external timing frequency signal or the line frequency signal comprise at least synchronization status information SSM.
Further, when testing the time degradation output function of the tested system, the first signal is a PTP time signal or a 1PPS + TOD time signal;
a first parameter of a PTP time signal as a first signal is Clockclass, and a second signal is a PTP time signal fed back by the system to be tested and a 1PPS + TOD time signal; a PTP time signal as a second signal, wherein the second parameter set at least comprises a timeSource and a Clockclass; a 1PPS + TOD time signal as a second signal, wherein the second parameter set at least comprises a pulse per second state of the TOD message;
the first parameter of the 1PPS + TOD time signal as the first signal is the pulse per second state, and the second signal is a PTP time signal and a 1PPS + TOD time signal fed back by the system to be tested; a PTP time signal as a second signal, wherein the second parameter set at least comprises a timeSource and a Clockclass; and the second signal is 1PPS + TOD time signal, and the second parameter set at least comprises the pulse per second state of the TOD message.
Further, when the tested system is tested for the source selection function of different time interfaces of the device, the first signal is a PTP time signal and a 1PPS + TOD time signal;
the first parameters of the PTP time signal as the first signal are Priority and ClockClass, and the second signal is a PTP time signal fed back by the tested system and a 1PPS + TOD time signal;
a PTP time signal as a second signal, the second parameter set at least comprising Priority1, ClockClass and grandmaster identity;
the second parameter set of the 1PPS + TOD time signal as the second signal at least comprises the pulse per second state of the TOD message.
Further, when the leap second processing function of the system to be tested is tested, the first signal is a PTP time signal or a 1PPS + TOD time signal;
a first parameter of a PTP time signal as a first signal is currentUtcOffset, and a second signal is a PTP time signal fed back by a system to be tested and a 1PPS + TOD time signal; a PTP time signal as the second signal, the second parameter set including at least currentutcofset; a 1PPS + TOD time signal as a second signal, the second parameter set at least comprising Leap Seconds;
the first parameter of the 1PPS + TOD time signal as the first signal is Leap Seconds, the second signal is the 1PPS + TOD time signal fed back by the tested system, and the second signal is the PTP time signal and the 1PPS + TOD time signal fed back by the tested system; a PTP time signal as the second signal, the second parameter set including at least currentutcofset; the second signal is 1PPS + TOD time signal, and the second parameter set includes at least Leap Seconds.
Further, when a frequency synchronization and time synchronization correlation mechanism of a system to be tested is tested, the first signal is a PTP time signal and an external timing frequency signal or a line frequency signal;
the first parameter of the external timing frequency signal or the line frequency signal as the first signal is SSM, the second signal is PTP time signal fed back by the tested system, and the second parameter set at least comprises Grandmaster identity, ClockClass, timeTracable and frequencTracable.
The scheme of the invention at least comprises the following beneficial effects:
the OAM test method and the OAM test equipment for the communication system provide a simulation scene and an automatic test means for testing the OAM function and the performance of the communication system to verify the time degradation output function, the frequency synchronization and the time synchronization association mechanism of the OAM, and realize the association verification of different time interface protocols and the automatic test of the source selection function between different time interfaces of the equipment; the test of the synchronous OAM function and performance under the abnormal condition of the synchronous network and the system can be realized, and the automatic analysis and judgment of whether the synchronous network and the system OAM function and performance meet the requirements or not can be realized; the invention can simulate various time output faults and support the time synchronization fault management function test; the invention improves the testing efficiency and promotes the construction and application of the synchronous network.
Drawings
Fig. 1 is a flowchart illustrating steps of an OAM test method of a communication system according to an embodiment of the present invention;
fig. 2 is a schematic structural diagram of an OAM test equipment of a communication system according to an embodiment of the present invention;
fig. 3 is a schematic view of a scenario of example 1 of an OAM test apparatus of the communication system according to an embodiment of the present invention;
fig. 4 is a schematic view of a scenario 2 of an example of an OAM test equipment of the communication system according to an embodiment of the present invention;
fig. 5 is a schematic view of a scenario 3 of an example of an OAM test equipment of the communication system according to an embodiment of the present invention;
fig. 6 is a schematic view of a scenario 3 of an example of an OAM test apparatus of the communication system according to the embodiment of the present invention.
Detailed Description
In order to make the technical problems, technical solutions and advantages of the present invention more apparent, the following detailed description is given with reference to the accompanying drawings and specific embodiments.
Referring to fig. 1, the present invention provides a method for OAM testing a communication system, which includes:
further, the first signal comprises at least one of a precision time synchronization protocol (PTP) signal, an external timing frequency signal or a line frequency signal, a pulse per second and a current time 1PPS + TOD signal; as a preferred example, when a frequency synchronization and time synchronization association mechanism of a system under test needs to be verified, only a PTP signal needs to be sent to the system under test; when the source selection function between the device-to-device different time interfaces of the system to be tested needs to be verified, a PTP signal and a 1PPS + TOD signal need to be sent to the system to be tested at the same time.
here, the first preset time is set to change the first parameter after the communication with the system under test is stable.
Further, the parameters of the PTP signal include: one or more of clock quality class ClockClass, Priority, time traceability, frequency traceability, time Source TimeSource, current coordinated world time and International atomic time offset currentUtcOffset, and Master clock number GrandmasterIdentity; the parameters of the 1PPS + TOD signal at least comprise one of a pulse per second state and a Leap second value Leap Seconds; the parameters of the external timing frequency signal or the line frequency signal comprise at least synchronization status information SSM.
103, acquiring parameters of a second signal at intervals of second preset time, and acquiring at least one parameter which has a mapping relation with the first parameter according to a communication interface protocol from the parameters of the second signal to form a second parameter set;
and 104, generating a test result according to the first parameter and the second parameter set.
Further, step 104 specifically includes:
judging whether all elements in the second parameter set make corresponding changes according to the mapping relation along with the changes of the first parameters: if so, generating a test result which passes the test; otherwise, generating a test result that the test fails.
Further, after step 101, the method further comprises:
judging whether the communication with the tested system is normal: if yes, executing a step of changing a first parameter of the first signal at intervals of a first preset time; otherwise, prompting the abnormal connection.
Further, when testing the time degradation output function of the tested system, the first signal is a PTP time signal or a 1PPS + TOD time signal;
a first parameter of a PTP time signal as a first signal is Clockclass, and a second signal is a PTP time signal fed back by the system to be tested and a 1PPS + TOD time signal; a PTP time signal as a second signal, wherein the second parameter set at least comprises a timeSource and a Clockclass; a 1PPS + TOD time signal as a second signal, wherein the second parameter set at least comprises a pulse per second state of the TOD message;
the first parameter of the 1PPS + TOD time signal as the first signal is the pulse per second state, and the second signal is a PTP time signal and a 1PPS + TOD time signal fed back by the system to be tested; a PTP time signal as a second signal, wherein the second parameter set at least comprises a timeSource and a Clockclass; and the second signal is 1PPS + TOD time signal, and the second parameter set at least comprises the pulse per second state of the TOD message.
Further, when the tested system is tested for the source selection function of different time interfaces of the device, the first signal is a PTP time signal and a 1PPS + TOD time signal;
the first parameters of the PTP time signal as the first signal are Priority and ClockClass, and the second signal is a PTP time signal fed back by the tested system and a 1PPS + TOD time signal;
a PTP time signal as a second signal, the second parameter set at least comprising Priority1, ClockClass and grandmaster identity;
the second parameter set of the 1PPS + TOD time signal as the second signal at least comprises the pulse per second state of the TOD message.
Further, when the leap second processing function of the system to be tested is tested, the first signal is a PTP time signal or a 1PPS + TOD time signal;
a first parameter of a PTP time signal as a first signal is currentUtcOffset, and a second signal is a PTP time signal fed back by a system to be tested and a 1PPS + TOD time signal; a PTP time signal as the second signal, the second parameter set including at least currentutcofset; a 1PPS + TOD time signal as a second signal, the second parameter set at least comprising Leap Seconds;
the first parameter of the 1PPS + TOD time signal as the first signal is Leap Seconds, the second signal is the 1PPS + TOD time signal fed back by the tested system, and the second signal is the PTP time signal and the 1PPS + TOD time signal fed back by the tested system; a PTP time signal as the second signal, the second parameter set including at least currentutcofset; the second signal is 1PPS + TOD time signal, and the second parameter set includes at least Leap Seconds.
Further, when a frequency synchronization and time synchronization correlation mechanism of a system to be tested is tested, the first signal is a PTP time signal and an external timing frequency signal or a line frequency signal;
the first parameter of the external timing frequency signal or the line frequency signal as the first signal is SSM, the second signal is PTP time signal fed back by the tested system, and the second parameter set at least comprises Grandmaster identity, ClockClass, timeTracable and frequencTracable.
The OAM testing method and the OAM testing equipment of the communication system provide a simulation scene and an automatic testing means for testing the OAM function and the performance of the communication system, verify the time degradation output function, the frequency synchronization and the time synchronization association mechanism of the OAM, and realize the association verification of different time interface protocols and the automatic testing of the source selection function between different time interfaces of the equipment; the test of the synchronous OAM function and performance under the abnormal condition of the synchronous network and the system can be realized, and the automatic analysis and judgment of whether the synchronous network and the system OAM function and performance meet the requirements or not can be realized; the invention can simulate various time output faults and support the time synchronization fault management function test; the invention improves the testing efficiency and promotes the construction and application of the synchronous network.
Referring to fig. 2, in order to achieve the above object, the present invention further provides an OAM test apparatus of a communication system, the apparatus including:
the signal interaction module 201 is configured to send a first signal to a system under test and receive a second signal fed back by the system under test, where the second signal is a feedback signal of the first signal;
a first parameter processing module 202, configured to change a first parameter of the first signal at intervals of a first preset time;
the acquisition module 203 is configured to acquire parameters of a second signal at intervals of a second preset time, and acquire at least one parameter that has a mapping relationship with the first parameter according to a communication interface protocol from the parameters of the second signal to form a second parameter set;
the test result generating module 204 is configured to generate a test result according to the first parameter and the second parameter set.
Further, the first signal includes at least one of a precision time synchronization protocol (PTP) signal, an external timing frequency signal or a line frequency signal, a pulse per second and a current time 1PPS + TOD signal.
Further, the test result generation module specifically includes:
the judgment submodule is used for judging whether all the elements in the second parameter set correspondingly change along with the change of the first parameter according to the mapping relation: if so, generating a test result which passes the test; otherwise, generating a test result that the test fails.
Further, the apparatus further comprises:
the connection judging module is used for sending a first signal to the tested system and receiving a second signal fed back by the tested system after the signal interaction module sends the first signal to the tested system,
judging whether the communication with the tested system is normal: if yes, executing a step of changing a first parameter of the first signal at intervals of a first preset time; otherwise, prompting the abnormal connection.
Further, the parameters of the PTP signal include: one or more of clock quality class ClockClass, Priority, time traceability, frequency traceability, time Source TimeSource, current coordinated world time and International atomic time offset currentUtcOffset, and Master clock number GrandmasterIdentity; the parameters of the 1PPS + TOD signal at least comprise one of a pulse per second state and a Leap second value Leap Seconds; the parameters of the external timing frequency signal or the line frequency signal comprise at least synchronization status information SSM.
Further, when testing the time degradation output function of the tested system, the first signal is a PTP time signal or a 1PPS + TOD time signal;
a first parameter of a PTP time signal as a first signal is Clockclass, and a second signal is a PTP time signal fed back by the system to be tested and a 1PPS + TOD time signal; a PTP time signal as a second signal, wherein the second parameter set at least comprises a timeSource and a Clockclass; a 1PPS + TOD time signal as a second signal, wherein the second parameter set at least comprises a pulse per second state of the TOD message;
the first parameter of the 1PPS + TOD time signal as the first signal is the pulse per second state, and the second signal is a PTP time signal and a 1PPS + TOD time signal fed back by the system to be tested; a PTP time signal as a second signal, wherein the second parameter set at least comprises a timeSource and a Clockclass; and the second signal is 1PPS + TOD time signal, and the second parameter set at least comprises the pulse per second state of the TOD message.
Further, when the tested system is tested for the source selection function of different time interfaces of the device, the first signal is a PTP time signal and a 1PPS + TOD time signal;
the first parameters of the PTP time signal as the first signal are Priority and ClockClass, and the second signal is a PTP time signal fed back by the tested system and a 1PPS + TOD time signal;
a PTP time signal as a second signal, the second parameter set at least comprising Priority1, ClockClass and grandmaster identity;
the second parameter set of the 1PPS + TOD time signal as the second signal at least comprises the pulse per second state of the TOD message.
Further, when the leap second processing function of the system to be tested is tested, the first signal is a PTP time signal or a 1PPS + TOD time signal;
a first parameter of a PTP time signal as a first signal is currentUtcOffset, and a second signal is a PTP time signal fed back by a system to be tested and a 1PPS + TOD time signal; a PTP time signal as the second signal, the second parameter set including at least currentutcofset; a 1PPS + TOD time signal as a second signal, the second parameter set at least comprising Leap Seconds;
the first parameter of the 1PPS + TOD time signal as the first signal is Leap Seconds, the second signal is the 1PPS + TOD time signal fed back by the tested system, and the second signal is the PTP time signal and the 1PPS + TOD time signal fed back by the tested system; a PTP time signal as the second signal, the second parameter set including at least currentutcofset; the second signal is 1PPS + TOD time signal, and the second parameter set includes at least Leap Seconds.
Further, when a frequency synchronization and time synchronization correlation mechanism of a system to be tested is tested, the first signal is a PTP time signal and an external timing frequency signal or a line frequency signal;
the first parameter of the external timing frequency signal or the line frequency signal as the first signal is SSM, the second signal is PTP time signal fed back by the tested system, and the second parameter set at least comprises Grandmaster identity, ClockClass, timeTracable and frequencTracable.
Finally, the above-mentioned solutions of the embodiments of the present invention are further described by using several specific examples.
Example 1: and testing the time degradation output function of the tested system.
The test system stores parameter mapping relations of different time interface protocols, can support two time interfaces of PTP and 1PPS + TOD in output and input, automatically changes one parameter of a first signal output by the test system, and tests whether a second signal of the signal output by the tested system changes. If the output and the input are different time interfaces, whether the parameters of the other time interface are changed correspondingly according to the mapping relation can be tested, and whether the test is passed or not can be automatically given.
Referring to fig. 3, the test system outputs a first signal to the system under test, collects a second signal output by the system under test, automatically changes a parameter ClockClass or a second pulse state of the first signal of the test system, and analyzes whether the second signal changes along with the first signal. The method comprises the following specific steps:
the method comprises the following steps: the test system sends a first signal, namely a PTP time signal or a 1PPS + TOD time signal to the tested system; and receives a second signal from the system under test, i.e., a PTP time signal or a 1PPS + TOD time signal.
Step two: the test system changes the clock class of the first signal PTP message or the pulse per second state code of the TOD message in turn at intervals of first preset time. For example, ClockClass is set to 6, 7, 8, 52, 187, 255 in this order; the pulse-per-second states are set to 0x00, 0x01, 0x05, 0x03, 0x04, and 0x02 in this order. It should be noted that, when the test system sends the PTP time signal to the system under test, the ClockClass of the PTP message is changed; when the test system sends 1PPS + TOD time signal to the tested system, the second pulse state code of the TOD message is changed.
Step three: the test system collects PTP messages from the tested system in a delayed mode and analyzes whether parameters such as timeSource and Clockclass in the messages change along with the first signals. According to the sequence of the second step, the timeSource output by the tested system should be 0x20, 0xA0, 0xA0, 0xA0 and 0xA0 in sequence, and the ClockClass should be 6, 7, 8, 52, 187 and 255 in sequence. If the second signal changes correctly along with the first signal, prompting that the PTP system has effective degradation output function; otherwise, prompting that the PTP system has invalid degraded output function.
Step four: the testing system collects 1PPS + TOD time signals from the tested system in a delayed mode and analyzes whether parameters such as pulse per second state in the message change along with the first signals or not. The pulse per second state should be 0x00, 0x01, 0x05, 0x03, 0x04 and 0x02 in sequence. If the second signal changes correctly along with the first signal, prompting that the 1PPS + TOD system degradation output function is effective; otherwise, prompting that the 1PPS + TOD system degraded output function is invalid.
Example 2: and testing the source selection function of the tested system to different time interfaces of the equipment.
The test system supports automatic testing of the source selection function of different time interfaces of the equipment. The testing system stores parameter mapping relations of different time interface protocols, simultaneously outputs signals of two time interfaces, automatically changes parameters of one output time interface, and triggers the change of a time source selection source of equipment, automatically analyzes whether the selected source of the tested system changes or not through the parameters by testing the parameters in the output signals (PTP, 1PPS + TOD) of the tested system, and automatically gives a result whether the test passes or not.
Referring to fig. 4, the test system sends a first signal, PTP and 1PPS + TOD time signal, to the system under test; and simultaneously acquiring a second signal fed back by the tested system, namely PTP and 1PPS + TOD time signals. Parameters Priority1, ClockClass and Priority2 of PTP output signals are automatically changed, the pulse per second state of 1PPS + TOD signals is automatically changed, and whether source selection switching occurs in the tested system is analyzed. The method comprises the following specific steps:
the method comprises the following steps: the test system sends a PTP time signal and a 1PPS + TOD time signal to the tested system at the same time, and the test system acquires the PTP time signal and the 1PPS + TOD time signal from the tested system at the same time.
Step two: the test system sets output PTP message parameters Priority1, ClockClass and Priority2 parameters, such as 128, 6 and 10;
the test system sets the pulse per second state of the output TOD message, such as 0x00, and sets the corresponding Priority1, Priority2 and other parameters as 128 and 20 in the tested system.
Step three: the test system collects PTP messages from the tested system in a delayed mode, and whether the parameters of Priority1, ClockClass, Priority2, grandmaster identity and the like in the messages are consistent with the first signals or not is analyzed.
The configuration values of the parameters such as Priority1, ClockClass, Priority2, and grandmaster identity should be the same as those of the output PTP message. (as PTP is the same as quality grade of 1PPS + TOD, and the priority is higher, PTP should be tracked by the tested system), if the conditions are met, prompting that different interface source selection functions of time synchronization are effective; otherwise, prompting that the time synchronization different interface source selection function is invalid.
Step four: the test system collects 1PPS + TOD time signals from the tested system in a delayed mode and analyzes the pulse per second state in the messages. The pulse per second state should have a mapping relation with the ClockClass of the output PTP message.
If the conditions are met, prompting that the time synchronization different interface source selection functions are effective; otherwise, prompting that the time synchronization different interface source selection function is invalid.
Step five: the test system changes the quality level ClockClass in the PTP message again after a preset time, for example, the quality level is reduced to 7.
Step six: repeating the third step and the fourth step, wherein the tested system should reverse and track the 1PPS + TOD signal output by the test system, the PTP and 1PPS + TOD output by the tested system are tested by the test system, Priority1, ClockClass, Priority2, grandmasterIdentity, pulse per second state, clock source type, clock source working state and the like should be the same as the 1PPS + TOD time signal output by the test system, or the equivalent mapping value thereof.
Step seven: the test system turns off the 1PPS + TOD time signal after a predetermined time.
Step eight: and repeating the third step and the fourth step. At this time, the system to be tested should reverse and track the PTP signal output by the test system, wherein configuration values of parameters such as Priority1, clock class, Priority2, grandmaster identity, Priority1, clock class, Priority2, grandmaster identity and the like corresponding to the second pulse state, clock source type and clock source working state should be the same as the PTP time signal output by the test system, or the equivalent mapping value thereof.
Example 3: and testing the leap second processing function of the tested system.
Referring to fig. 5, the test system sends a first signal, PTP and 1PPS + TOD time signal, to the system under test; and simultaneously acquiring a second signal fed back by the tested system, namely PTP and 1PPS + TOD time signals. The parameter currentUtcOffset of the PTP signal in the first signal or the Leap Seconds in the 1PPS + TOD signal is automatically changed and it is automatically analyzed whether the Leap Seconds of the second signal follow the change of the output signal (parameter currentUtcOffset of the PTP output signal or the Leap Seconds in the 1PPS + TOD output signal). The test system supports the conversion corresponding relation of the parameters currentUtcOffset and Leap Seconds, and the value of currentUtcOffset is equal to the value of Leap Seconds + 19. The specific test steps are as follows:
the method comprises the following steps: the test system sends a PTP time signal and a 1PPS + TOD time signal to the tested system at the same time, and the test system acquires the PTP time signal and the 1PPS + TOD time signal from the tested system at the same time.
Step two: the test system adjusts currentUtcOffset of the output PTP message or Leap Seconds of the TOD message in sequence at intervals of first preset time. Wherein, it is assumed that currentutcofset is sequentially set as: -100, -35, 0, 35, 100, Leap Seconds are in the order: -100, -35, 0, 35, 100. It should be noted that, when the test system sends the PTP time signal to the system under test, currentUtcOffset of the PTP message is adjusted; and when the 1PPS + TOD time signal is sent, adjusting the leapSecnds of the TOD message.
Step three: the test system collects PTP time signals from the tested system in a delayed mode and analyzes whether parameters such as currentUtcOffset in the PTP message change along with the first signals. The value of currentUtcOffset is the same as that in the first signal message, and if yes, the PTP leap second processing function is prompted to be effective; otherwise, the PTP leap second processing function is prompted to be invalid.
Step four: the test system collects 1PPS + TOD time signals from the tested system in a delayed mode and analyzes whether parameters such as Leap Seconds in the message change along with the first signals or not. The value of LeapSeconds in the message should have a corresponding relationship with the value of currentUtcOffset in the first signal message, and the value of currentUtcOffset is equal to the value of LeapSeconds + 19. If the first signal changes, prompting that the 1PPS + TOD leap second processing function is effective; otherwise, the 1PPS + TOD leap second processing function is prompted to be invalid.
Step five: the test system automatically keeps the ClockClass value of the output PTP message to be 255 or the pulse per second state of the TOD message to be 0x02 within a preset time, so that the tested system loses the time reference source.
Step six: and repeating the third step and the fourth step, wherein the values of currentUtcOffset and Leap Seconds in the input message of the test system should be kept unchanged.
Step seven: and changing the tested system and continuing the test.
Example 4: and testing the frequency synchronization and time synchronization correlation mechanism of the tested system.
Referring to fig. 6, the test system is able to automatically verify the frequency synchronization and time synchronization association mechanism. Namely, the test system automatically changes the frequency synchronization quality grade of the first signal and analyzes whether the second signal parameter fed back by the tested equipment is changed correspondingly. The specific test method is as follows:
the test system can automatically change the quality grade of the output external timing signal or the synchronous Ethernet signal, simultaneously detect the Grandmasteridentity, ClockClass, timeTracable and frequeTracable fields in the input PTP signal message, and analyze whether the second signal changes along with the first signal. The method comprises the following specific steps:
the method comprises the following steps: the test system sends a PTP time signal and an external timing frequency signal or a line frequency signal to the tested system at the same time, and the test system acquires the PTP time signal and the external timing frequency signal or the line frequency signal from the tested system at the same time.
Step two: the test system sets the ClockClass parameter of the PTP message to be 6, sequentially adjusts SSM (synchronous state information) of the external timing frequency signal or the line frequency signal or the synchronous Ethernet signal at intervals of a first preset time, and simulates frequency signals of various grades, namely SSM codes are 0010, 0100, 1000, 1011 and 1111 in sequence.
Step three: the test system obtains PTP time signals from the tested system in a delayed mode, and whether parameters such as Grandmaster identity, ClockClass, timeTracable and frequencTracable in the message change along with the first signals or not is analyzed. If the second signal changes along with the first signal, prompting that a frequency synchronization and time synchronization association mechanism is effective; otherwise, the association mechanism of frequency synchronization and time synchronization is invalid.
Step four: changing the tested system and continuing the test
Example 5, the test system can simulate various time output faults and support time synchronization fault management function tests. Specifically, the test system can automatically open/close the PTP output interface at a fixed time in a certain order, separately open/close an Announce (notification carrying time status) message, a Sync (synchronization) message, a Delay _ Resp (Delay response) message, a 1PPS signal in 1PPS + ToD, and a ToD signal in 1PPS + ToD sent in the PTP interface, and automatically adjust the sending frequency of the Announce message, the ClockClass parameter, the stepremoved (synchronization hop count) parameter, the quality level of the 1PPS + ToD time signal, the PTP time signal, and the like.
It should be noted that the OAM test equipment of the communication system provided in the embodiment of the present invention is an equipment that applies the foregoing method, that is, all embodiments of the foregoing method are applicable to this equipment, and can achieve the same or similar beneficial effects.
While the foregoing is directed to the preferred embodiment of the present invention, it will be understood by those skilled in the art that various changes and modifications may be made without departing from the spirit and scope of the invention as defined in the appended claims.
Claims (14)
1. An OAM test method for a communication system, comprising:
sending a first signal to a tested system and receiving a second signal fed back by the tested system, wherein the second signal is a feedback signal of the first signal, and the first signal comprises at least one of a precision time synchronization protocol (PTP) signal, an external timing frequency signal or a line frequency signal, a pulse per second and a current time 1PPS + TOD signal;
changing a first parameter of the first signal at intervals of a first preset time;
acquiring parameters of the second signal at intervals of second preset time, and acquiring at least one parameter which has a mapping relation with the first parameter according to a communication interface protocol from the parameters of the second signal to form a second parameter set;
generating a test result according to the first parameter and the second parameter set, wherein the test result comprises: judging whether all elements in the second parameter set correspondingly change along with the change of the first parameter according to the mapping relation: if so, generating a test result which passes the test; otherwise, generating a test result that the test fails.
2. The testing method of claim 1, wherein after the step of sending a first signal to a system under test and receiving a second signal fed back by the system under test, the method further comprises:
judging whether the communication with the tested system is normal or not: if yes, executing a step of changing a first parameter of the first signal at intervals of a first preset time; otherwise, prompting the abnormal connection.
3. The test method of claim 1, wherein the parameters of the PTP signal comprise: one or more of clock quality class ClockClass, Priority, time traceability, frequency traceability, time Source TimeSource, current coordinated world time and International atomic time offset currentUtcOffset, and Master clock number GrandmasterIdentity; the parameter of the 1PPS + TOD signal comprises one of a pulse per second state and a Leap second value Leap Seconds;
the parameters of the external timing frequency signal or the line frequency signal at least comprise synchronization status information SSM.
4. The test method according to claim 3, wherein, when testing the time-degradation output function of the system under test, the first signal is a PTP time signal or a 1PPS + TOD time signal;
the first parameter of the PTP time signal as the first signal is Clockclass, and the second signal is a PTP time signal fed back by the system to be tested and a 1PPS + TOD time signal; the second parameter set of the PTP time signal as the second signal at least comprises a timeSource and a Clockclass; the second parameter set at least comprises a pulse per second state of the TOD message, wherein the second signal is 1PPS + TOD time signal;
the first parameter of the 1PPS + TOD time signal as the first signal is a pulse per second state, and the second signal is a PTP time signal and a 1PPS + TOD time signal fed back by the system to be tested; the second parameter set of the PTP time signal as the second signal at least comprises a timeSource and a Clockclass; and the second parameter set at least comprises the pulse per second state of the TOD message, wherein the time signal is 1PPS + TOD and is used as a second signal.
5. The test method according to claim 3, wherein when testing the source selection function of the tested system to the device at different time interfaces, the first signal is a PTP time signal and a 1PPS + TOD time signal;
the first parameters of the PTP time signal as the first signal are Priority and ClockClass, and the second signal is a PTP time signal fed back by the tested system and a 1PPS + TOD time signal;
the second parameter set of the PTP time signal as the second signal at least comprises Priority1, ClockClass and grandmaster identity;
the second parameter set of the 1PPS + TOD time signal as the second signal at least includes the pulse per second state of the TOD message.
6. The method according to claim 3, wherein the first signal is a PTP time signal or a 1PPS + TOD time signal when testing the leap second handling function of the system under test;
the first parameter of the PTP time signal as the first signal is currentUtcOffset, and the second signal is a PTP time signal fed back by the system to be tested and a 1PPS + TOD time signal; the PTP time signal as the second signal, the second parameter set at least comprises currentUtcOffset; the 1PPS + TOD time signal is taken as a second signal, and the second parameter set at least comprises Leap Seconds;
the first parameter of the 1PPS + TOD time signal as the first signal is Leap Seconds, the second signal is a 1PPS + TOD time signal fed back by the tested system, and the second signal is a PTP time signal and a 1PPS + TOD time signal fed back by the tested system; the PTP time signal as the second signal, the second parameter set at least comprises currentUtcOffset; the second parameter set includes at least Leap Seconds as the 1PPS + TOD time signal as the second signal.
7. The test method according to claim 3, wherein when testing the correlation mechanism of frequency synchronization and time synchronization of the system under test, the first signal is a PTP time signal and an external timing frequency signal or a line frequency signal;
the first parameter of the external timing frequency signal or the line frequency signal as the first signal is SSM, the second signal is PTP time signal fed back by the tested system, and the second parameter set at least comprises grandmaster identity, ClockClass, timeTracable and frequenclearable.
8. An OAM test apparatus of a communication system, comprising:
the system comprises a signal interaction module, a signal receiving module and a signal processing module, wherein the signal interaction module is used for sending a first signal to a tested system and receiving a second signal fed back by the tested system, the second signal is a feedback signal of the first signal, and the first signal comprises at least one of a precise time synchronization protocol (PTP) signal, an external timing frequency signal or a line frequency signal, a pulse per second and a current time 1PPS + TOD signal;
the first parameter processing module is used for changing a first parameter of the first signal at intervals of first preset time;
the acquisition module is used for acquiring parameters of the second signal at intervals of second preset time, acquiring at least one parameter which has a mapping relation with the first parameter according to a communication interface protocol from the parameters of the second signal, and forming a second parameter set;
the test result generating module is used for generating a test result according to the first parameter and the second parameter set; the test result generation module specifically comprises:
a determining submodule, configured to determine whether all elements in the second parameter set correspondingly change according to the mapping relationship with the change of the first parameter: if so, generating a test result which passes the test; otherwise, generating a test result that the test fails.
9. The test apparatus of claim 8, wherein the apparatus further comprises:
the connection judging module is used for sending a first signal to a tested system and receiving a second signal fed back by the tested system after the signal interaction module sends the first signal to the tested system,
judging whether the communication with the tested system is normal or not: if yes, executing a step of changing a first parameter of the first signal at intervals of a first preset time; otherwise, prompting the abnormal connection.
10. The test device of claim 8, wherein the parameters of the PTP signal include: one or more of clock quality class ClockClass, Priority, time traceability, frequency traceability, time Source TimeSource, current coordinated world time and International atomic time offset currentUtcOffset, and Master clock number GrandmasterIdentity; the parameter of the 1PPS + TOD signal comprises one of a pulse per second state and a Leap second value Leap Seconds;
the parameters of the external timing frequency signal or the line frequency signal at least comprise synchronization status information SSM.
11. The test apparatus according to claim 10, wherein the first signal is a PTP time signal or a 1PPS + TOD time signal when testing a time degradation output function of the system under test;
the first parameter of the PTP time signal as the first signal is Clockclass, and the second signal is a PTP time signal fed back by the system to be tested and a 1PPS + TOD time signal; the second parameter set of the PTP time signal as the second signal at least comprises a timeSource and a Clockclass; the second parameter set at least comprises a pulse per second state of the TOD message, wherein the second signal is 1PPS + TOD time signal;
the first parameter of the 1PPS + TOD time signal as the first signal is a pulse per second state, and the second signal is a PTP time signal and a 1PPS + TOD time signal fed back by the system to be tested; the second parameter set of the PTP time signal as the second signal at least comprises a timeSource and a Clockclass; and the second parameter set at least comprises the pulse per second state of the TOD message, wherein the time signal is 1PPS + TOD and is used as a second signal.
12. The test equipment according to claim 10, wherein when testing the source selection function of the tested system to the equipment at different time interfaces, the first signal is a PTP time signal and a 1PPS + TOD time signal;
the first parameters of the PTP time signal as the first signal are Priority and ClockClass, and the second signal is a PTP time signal fed back by the tested system and a 1PPS + TOD time signal;
the second parameter set of the PTP time signal as the second signal at least comprises Priority1, ClockClass and grandmaster identity;
the second parameter set of the 1PPS + TOD time signal as the second signal at least includes the pulse per second state of the TOD message.
13. The test device of claim 10, wherein the first signal is a PTP time signal or a 1PPS + TOD time signal when testing the system-under-test leap second handling function;
the first parameter of the PTP time signal as the first signal is currentUtcOffset, and the second signal is a PTP time signal fed back by the system to be tested and a 1PPS + TOD time signal; the PTP time signal as the second signal, the second parameter set at least comprises currentUtcOffset; the 1PPS + TOD time signal is taken as a second signal, and the second parameter set at least comprises Leap Seconds;
the first parameter of the 1PPS + TOD time signal as the first signal is Leap Seconds, the second signal is a 1PPS + TOD time signal fed back by the tested system, and the second signal is a PTP time signal and a 1PPS + TOD time signal fed back by the tested system; the PTP time signal as the second signal, the second parameter set at least comprises currentUtcOffset; the second parameter set includes at least Leap Seconds as the 1PPS + TOD time signal as the second signal.
14. The test equipment according to claim 10, wherein when testing the frequency synchronization and time synchronization association mechanism of the system under test, the first signal is a PTP time signal and an external timing frequency signal or a line frequency signal;
the first parameter of the external timing frequency signal or the line frequency signal as the first signal is SSM, the second signal is PTP time signal fed back by the tested system, and the second parameter set at least comprises grandmaster identity, ClockClass, timeTracable and frequenclearable.
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