CN106301222B - A kind of method based on EL graphical analysis cell piece part dark current - Google Patents
A kind of method based on EL graphical analysis cell piece part dark current Download PDFInfo
- Publication number
- CN106301222B CN106301222B CN201610891171.7A CN201610891171A CN106301222B CN 106301222 B CN106301222 B CN 106301222B CN 201610891171 A CN201610891171 A CN 201610891171A CN 106301222 B CN106301222 B CN 106301222B
- Authority
- CN
- China
- Prior art keywords
- current
- cell piece
- local
- electroluminescent
- dark current
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000000034 method Methods 0.000 title claims abstract description 13
- 238000004458 analytical method Methods 0.000 title claims abstract description 12
- 238000012545 processing Methods 0.000 claims description 6
- 238000012360 testing method Methods 0.000 claims description 6
- 230000007547 defect Effects 0.000 description 6
- 230000005611 electricity Effects 0.000 description 4
- 238000005516 engineering process Methods 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 238000000205 computational method Methods 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000010422 painting Methods 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
- H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
- Photovoltaic Devices (AREA)
Abstract
The invention discloses a kind of method based on EL graphical analysis solar cell piece part dark current, comprise the following steps：(1) different electric currents is passed through to cell piece, the EL pictures under different electric currents are shot with portable EL testers；(2) gray value of EL pictures is obtained using PS image procossings；(3) electric current and the relational expression of the electroluminescent intensity under phase induced current are drawn；(4) measure local electroluminescent intensity and combination electric current and the relational expression of the electroluminescent intensity under phase induced current draw local current；(5) formula is utilizedCalculate local dark current.
Description
Technical field
The present invention relates to a kind of method based on EL graphical analysis cell piece part dark current, belongs to photovoltaic module technology neck
Domain.
Background technology
Traditional energy is being faced with the crisis petered out, and human needs develops the new energy to replace traditional energy.
Development solar energy is one of main path for solving environmental problem and energy deficiency, how effectively to improve solar cell
The efficiency of component is most important.Due to battery defect cause itself, solar cell is set phenomena such as hot spot failure occur.It is serious
Hot spot phenomenon can burn battery locally so that component is by permanent damage, reduces the service life of component.
However, in the production process of crystal silicon battery, due to answering masterpiece in the pollution of environment or water quality, process
With and the reason such as operation error, the defects of result in different types of solar cell.The defects of more serious, can cause too
Locally there is larger reverse leakage current in positive energy battery, and point-like is leaked electricity under serious situation, can cause solar cell " burn-through ", and
Influence of the specific research defect to the Current Voltage of cell piece is not furtherd investigate, therefore it provides a kind of utilize EL image studies
The local dark current of cell piece, it is extremely important to photovoltaic module failure mechanism to further analyzing defect cell piece.
The content of the invention
The technical problems to be solved by the invention are the defects of overcoming the prior art, there is provided one kind is based on EL graphical analyses electricity
The method of pond piece part dark current, realization utilize EL image quick discrimination cell piece part electrical properties, and that improves photovoltaic module can
By property, increase the cell piece service life, reduce corresponding cost.
In order to solve the above technical problems, the technical solution adopted by the present invention is as follows：
A kind of method based on EL graphical analysis cell piece part dark current, comprises the following steps：
1) a piece of solar cell piece is selected；
2) portable EL testers are utilized, applies different electric current I in selected solar cell on piece, obtains different electricity
The electroluminescent image under I is flowed, and calculates the electroluminescent intensity level ψ under phase induced current I；
3) according to the electroluminescent intensity ψ under obtained different electric current I and phase induced current, the curve of I and ψ is fitted, is obtained
Coefficient a and c in once linear relationship formula ψ=aI+c, and then obtain the relational expression of I and ψ；
4) solar cell piece is divided into 9 regions, measures the local electroluminescent intensity level corresponding to each region
ψi, i is location index, i=1,2,3,4,5,6,7,8,9；
5) relational expression and the local electroluminescent intensity ψ of step 4) obtained using step 3)i, ψ is calculatediIt is corresponding
Ii, IiFor the local current of i positions；
6) formula is utilizedAnd the local current I obtained in step 5)iObtain I0i；
I0iFor local dark current, V is the voltage of input,For thermal voltage, q is quantities of charge, and V carries for DC constant voltage power supply
The voltage of confession, T are test temperature.
The electroluminescent intensity level of foregoing step 2) is the gray value of the electroluminescent image obtained by PS processing.
The local electroluminescent intensity level of foregoing step 4) is the electroluminescent of the affiliated area obtained by PS processing
The gray value of image.
Foregoing test temperature is 300K.
The beneficial effect that the present invention is reached：
(1) dark current of cell piece part can be quickly analyzed using EL images, cell piece is sorted according to EL images, is saved
Time, reliable results.
(2) performance of cell piece can be differentiated by the performance of EL graphical analysis cell piece part dark current, reduces component
The risk of failure, so as to improve the reliability of component.
Brief description of the drawings
Fig. 1 is the method for the present invention flow chart；
Fig. 2 is the graph of a relation of cell piece luminous intensity and electric current；
Fig. 3 is that solar cell piece is divided into 9 regional area schematic diagrames.
Embodiment
The invention will be further described below in conjunction with the accompanying drawings.Following embodiments are only used for clearly illustrating the present invention
Technical solution, and be not intended to limit the protection scope of the present invention and limit the scope of the invention.
The method based on EL graphical analysis cell piece part dark current of the present invention, as shown in Figure 1, specific as follows：
1) a piece of solar cell piece is selected.
2) portable EL testers are utilized, applies different electric current I in selected solar cell on piece, obtains different electricity
The electroluminescent image under I is flowed, and calculates the electroluminescent intensity ψ under phase induced current I.Electroluminescent intensity is approximately to pass through PS
The gray value that processing electroluminescent image obtains, comprises the following steps：2-1) the definite size that analyze image；2-2) establish same
The grayscale format painting canvas of sample size；The position of gray scale 2-3) is analyzed with magic rod or the choosing of quick selection tool circle；2-4) calculate
Gray value.PS processing after gray value be approximately considered be EL images electroluminescent intensity level.
3) according to the electroluminescent intensity ψ under obtained different electric current I and phase induced current, the curve of fitting I and ψ, such as Fig. 2
It is shown, the coefficient a and c in once linear relationship formula ψ=aI+c are obtained, and then obtain the approximate relation of I and ψ.
4) solar cell piece is divided into 9 parts (such as Fig. 3), measures the local electroluminescent corresponding to each part
Intensity ψi, i is location index (i=1,2,3,4,5,6,7,8,9).In the computational methods and step 2) of local electroluminescent intensity
Electroluminescent strength calculation method is identical.
5) relational expression and the local electroluminescent intensity ψ of step 4) obtained using step 3)i, ψ is calculatediIt is corresponding
Ii, IiFor the local current of i positions.
6) formula is utilizedAnd the local current I obtained in step 5)iObtain I0i。
IiFor local current, I0iFor local dark current, V is the voltage that DC constant voltage power supply provides,For thermal voltage, q is
Quantities of charge, T are test temperature, and it is 300K to make test temperature.As T=300k,Degrees Fahrenheit=32+ is Celsius
Degree × 1.8.
The above is only the preferred embodiment of the present invention, it is noted that for the ordinary skill people of the art
For member, without departing from the technical principles of the invention, some improvement and deformation can also be made, these are improved and deformation
Also it should be regarded as protection scope of the present invention.
Claims (4)
- A kind of 1. method based on EL graphical analysis cell piece part dark current, it is characterised in that comprise the following steps：1) a piece of solar cell piece is selected；2) portable EL testers are utilized, applies different electric current I in selected solar cell on piece, obtains different electric current I Under electroluminescent image, and calculate the electroluminescent intensity level ψ under phase induced current I；3) according to the electroluminescent intensity ψ under obtained different electric current I and phase induced current, the curve of I and ψ is fitted, is obtained once Coefficient a and c in linear relation ψ=aI+c, and then obtain the relational expression of I and ψ；4) solar cell piece is divided into 9 regions, measures the local electroluminescent intensity level ψ corresponding to each regioni, i is Location index, i=1,2,3,4,5,6,7,8,9；5) relational expression and the local electroluminescent intensity ψ of step 4) obtained using step 3)i, ψ is calculatediCorresponding Ii, Ii For the local current of i positions；6) formula is utilizedAnd the local current I obtained in step 5)iObtain I0i；I0iFor local dark current, V is the voltage of input,For thermal voltage, q is quantities of charge, and V provides for DC constant voltage power supply Voltage, T is test temperature.
- A kind of 2. method based on EL graphical analysis cell piece part dark current according to claim 1, it is characterised in that The electroluminescent intensity level of the step 2) is the gray value of the electroluminescent image obtained by PS processing.
- A kind of 3. method based on EL graphical analysis cell piece part dark current according to claim 1, it is characterised in that The local electroluminescent intensity level of the step 4) is the gray scale of the electroluminescent image of the affiliated area obtained by PS processing Value.
- A kind of 4. method based on EL graphical analysis cell piece part dark current according to claim 1, it is characterised in that The test temperature is 300K.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610891171.7A CN106301222B (en) | 2016-10-12 | 2016-10-12 | A kind of method based on EL graphical analysis cell piece part dark current |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610891171.7A CN106301222B (en) | 2016-10-12 | 2016-10-12 | A kind of method based on EL graphical analysis cell piece part dark current |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN106301222A CN106301222A (en) | 2017-01-04 |
| CN106301222B true CN106301222B (en) | 2018-05-01 |
Family
ID=57718661
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610891171.7A Expired - Fee Related CN106301222B (en) | 2016-10-12 | 2016-10-12 | A kind of method based on EL graphical analysis cell piece part dark current |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN106301222B (en) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6860904B2 (en) * | 2017-03-29 | 2021-04-21 | 国立大学法人 奈良先端科学技術大学院大学 | Photovoltaic module evaluation method, evaluation device and evaluation program |
| CN108680486B (en) * | 2018-05-02 | 2020-09-29 | 河海大学常州校区 | Long-term weather resistance testing method for photovoltaic module |
| CN109004061B (en) * | 2018-06-28 | 2023-07-18 | 华南理工大学 | Electric injection annealing test device and method for crystalline silicon photovoltaic solar cell |
| DE102018119171A1 (en) * | 2018-08-07 | 2020-02-13 | Wavelabs Solar Metrology Systems Gmbh | Optoelectronic solar cell test system for an inline solar cell production plant and method for optimizing the inline production of solar cells using such an optoelectronic solar cell test system |
| CN109768117A (en) * | 2018-12-27 | 2019-05-17 | 江苏日托光伏科技股份有限公司 | A kind of MWT component black-film repair method |
| CN110648939B (en) * | 2019-11-06 | 2022-03-22 | 天合光能股份有限公司 | Method for detecting non-uniformity of passivation of solar cell |
| CN112037191B (en) * | 2020-08-28 | 2023-08-25 | 晶科能源股份有限公司 | Method and device for determining local leakage current density threshold value and computer equipment |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101696942B (en) * | 2009-10-16 | 2011-03-30 | 厦门大学 | Multi-junction solar cell and AC electroluminescence testing method and device of each sub cell |
| DE102009054515A1 (en) * | 2009-12-10 | 2011-06-16 | Op-Tection - Optics For Detection Gmbh | Method for testing quality of multi-crystalline silicon solar cell for converting electromagnetic radiation into electric current, involves executing different electroluminescence measurements, and testing quality of cell using image |
| US8301409B2 (en) * | 2009-12-23 | 2012-10-30 | General Electric Company | Photon imaging system for detecting defects in photovoltaic devices, and method thereof |
| CN104320077A (en) * | 2014-09-29 | 2015-01-28 | 广东产品质量监督检验研究院 | Rapid detection method for photovoltaic components |
-
2016
- 2016-10-12 CN CN201610891171.7A patent/CN106301222B/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| CN106301222A (en) | 2017-01-04 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN106301222B (en) | A kind of method based on EL graphical analysis cell piece part dark current | |
| CN103838291B (en) | A kind of maximum power point tracing method of solar cell | |
| CN108880469A (en) | A kind of method of solar battery parameter extraction | |
| CN110455827A (en) | A kind of smart new energy solar panel qualification detection system and method | |
| CN107185854A (en) | The algorithm of photovoltaic cell acetes chinensis and color classification based on RGB channel | |
| CN203827291U (en) | Solar cell photoelectric property test system | |
| CN113989241A (en) | Photovoltaic module EL defect detection method based on image processing and deep learning fusion | |
| CN106208964A (en) | Analog solar assembly acceleration PID performance test methods under actual application environment | |
| CN109613841A (en) | A kind of solar photovoltaic assembly parameter identification method under malfunction | |
| Shah et al. | Diagnostics of thin-film silicon solar cells and solar panels/modules with variable intensity measurements (VIM) | |
| Sharma et al. | Investigation of solar cell degradation using electrochemical impedance spectroscopy | |
| CN107478335B (en) | A kind of method of microdefect solar module hot spot temperature computation | |
| CN102832154B (en) | Method used for detecting and repairing leakage defect of film solar battery | |
| CN203337560U (en) | Detection and sorting device for sub-fissures of crystalline silicon wafer of solar cell | |
| CN203310896U (en) | Solar energy cell sheet reverse leakage current detection device | |
| CN106653642A (en) | Test system and test method for testing forward and reverse conversion capability of photovoltaic bypass diode | |
| Martinez Moreno et al. | On-site tests for the detection of potential induced degradation in modules | |
| CN108469439A (en) | Based on electroluminescent solar battery sheet defect detecting device and method | |
| CN202533567U (en) | Solar cell leakage detection system | |
| CN106411261B (en) | A kind of method based on EL graphical analysis solar cell piece local voltages | |
| CN108280287B (en) | Method for extracting solar cell parameters | |
| CN206649100U (en) | A kind of MWT photovoltaic modulies conductive core plate internal short-circuit verifying attachment | |
| US8731852B2 (en) | Method for analysing photovoltaic layer systems using thermography | |
| CN203896307U (en) | Photovoltaic component power testing and defect detecting integrated machine | |
| CN108181015A (en) | Half photovoltaic module hot spot temperature testing method |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20180501 Termination date: 20201012 |