CN106298624A - A kind of wafer support mechanism being conveniently replaceable - Google Patents

A kind of wafer support mechanism being conveniently replaceable Download PDF

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Publication number
CN106298624A
CN106298624A CN201510367887.2A CN201510367887A CN106298624A CN 106298624 A CN106298624 A CN 106298624A CN 201510367887 A CN201510367887 A CN 201510367887A CN 106298624 A CN106298624 A CN 106298624A
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CN
China
Prior art keywords
ceramics pole
hot plate
ceramic jacket
height
land portions
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN201510367887.2A
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Chinese (zh)
Other versions
CN106298624B (en
Inventor
柴智
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Piotech Inc
Original Assignee
Piotech Shenyang Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Piotech Shenyang Co Ltd filed Critical Piotech Shenyang Co Ltd
Priority to CN201510367887.2A priority Critical patent/CN106298624B/en
Publication of CN106298624A publication Critical patent/CN106298624A/en
Application granted granted Critical
Publication of CN106298624B publication Critical patent/CN106298624B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/687Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
    • H01L21/68714Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
    • H01L21/68785Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by the mechanical construction of the susceptor, stage or support
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67098Apparatus for thermal treatment
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2221/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
    • H01L2221/67Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
    • H01L2221/683Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Abstract

A kind of wafer support mechanism being conveniently replaceable, solves the most easily changeable problem of existing wafer support mechanism.This mechanism includes hot plate, ceramic jacket, ceramics pole and clamp specially.Described hot plate is machined with circular counter bore, ceramic jacket is put into counterbore, then ceramics pole is put into ceramic jacket.Described ceramic jacket inner port edge is shaped with chamfering, and ceramics pole land portions can be made to expose, and the land portions of ceramics pole is shaped with wedge-shaped slot.When clamp specially loosens, clamp opening portion can be enclosed within the land portions of ceramics pole by the land portions of ceramics pole, upwards pulled up and can be extracted in ceramic jacket by ceramics pole.Described ceramics pole top has spherical surface hill, for support wafer, the height of ceramics pole spherical surface hill and hot plate upper surface is measured with height gauge, ceramics pole is extracted with clamp specially, change corresponding ceramics pole and reach desired height, with same method, the whole support mechanisms in hot plate are adjusted to sustained height, make the gap between wafer with hot plate keep consistent.Can be widely applied to semiconductive thin film deposition arts.

Description

A kind of wafer support mechanism being conveniently replaceable
Technical field
The present invention relates to the wafer support mechanism of a kind of semiconductor coated film equipment, this mechanism is mainly used in In semiconductor coated film equipment reaction intracavity room temperature or elevated temperature processes, belong to answering of semiconductive thin film deposition Use technical field.
Background technology
Certain gap is needed, the size pair in gap between wafer and hot plate in semiconductor coated film equipment Process results has a significant impact, and current wafer support mechanism is unadjustable, needs by changing different high Degree wafer support mechanism, makes gap keep consistent, adjusts height in this way, take out ceramics pole ratio More difficult, especially after hot plate had carried out high-temperature technology, " stuck " phenomenon and nothing easily occur Method is taken out.
Summary of the invention
The present invention, to solve for the purpose of the problems referred to above, devises the wafer support mechanism being conveniently replaceable, solves The most easily changeable problem of existing wafer support mechanism.This mechanism utilize change differing heights there is special knot The ceramics pole regulation height of structure, makes the gap between wafer with hot plate keep consistent, it is simple to the wafer of replacing Support mechanism,
For achieving the above object, the present invention uses following technical proposals: a kind of wafer support being conveniently replaceable Mechanism, this mechanism includes hot plate (1), ceramic jacket (2), ceramics pole (3) and clamp specially (4). Described hot plate (1) is machined with circular counter bore, and ceramic jacket (2) is put into counterbore, then by ceramics pole (3) Put into ceramic jacket (2).Described ceramic jacket (2) inner port edge is shaped with chamfering (5), can make ceramics pole (3) Land portions is exposed, and the land portions of ceramics pole (3) is shaped with wedge-shaped slot, and clamp specially (4) loosens shape During state, clamp opening (6) part can pass through the land portions of ceramics pole (3), is enclosed within ceramics pole (3) Land portions on, when firmly clutching clamp specially (4), the opening part of clamp specially (4) less than pottery The diameter of porcelain knob land portions, upwards pulls up, and can be extracted in ceramic jacket (2) by ceramics pole (3).
Described ceramics pole (3) top has spherical surface hill, for support wafer, measures pottery with height gauge The height of porcelain knob (3) spherical surface hill and hot plate (1) upper surface, the height measured according to reality higher than or Less than requiring height, entangle the wedge-shaped slot of ceramics pole with clamp specially (4), extract ceramics pole (3), Change corresponding ceramics pole (3) and reach desired height, with complete by hot plate (1) of same method Support mechanism of portion is adjusted to sustained height.
Beneficial effects of the present invention and feature are:
Due to the fact that and have employed the design of new structure, solve existing wafer support mechanism the most easily changeable Problem.Desired height is reached, with complete by hot plate of same method by changing corresponding ceramics pole Support mechanism of portion is adjusted to sustained height, makes the gap between wafer with hot plate keep consistent.There is design new Clever, rational in infrastructure, simple to operate, easy accessibility and safe and reliable feature.Can be widely applied to partly lead Body thin film deposition arts.,
Accompanying drawing explanation
Fig. 1 is the structural representation of the present invention.
In figure, piece mark represents respectively:
1, hot plate;2, ceramic jacket;3, ceramics pole;4, clamp specially;5, chamfering;6, clamp leaves Mouthful.
Detailed description of the invention
Embodiment
Referring to the drawings 1, a kind of wafer support mechanism being conveniently replaceable, this mechanism includes hot plate 1, pottery Set 2, ceramics pole 3 and clamp specially 4.Described hot plate 1 is machined with circular counter bore, is put by ceramic jacket 2 Enter counterbore, then ceramics pole 3 is put into ceramic jacket 2.Described ceramic jacket 2 inner port edge is shaped with chamfering 5, Ceramics pole 3 land portions can be made to expose, and the land portions of ceramics pole 3 is shaped with wedge-shaped slot, and clamp 4 loosens During state, clamp opening 6 part can be enclosed within the sphere of ceramics pole 3 by the land portions of ceramics pole 3 In part, when firmly clutching clamp specially 4, the opening part of clamp is less than the diameter of ceramics pole land portions, Upwards pull up, ceramics pole 3 can be extracted in ceramic jacket 2.
Described ceramics pole 3 top has spherical surface hill, for support wafer, measures ceramics pole with height gauge 3 spherical surface hills and the height of hot plate 1 upper surface, be higher or lower than according to the height of reality measurement and require height Degree, entangles the wedge-shaped slot of ceramics pole, extracts ceramics pole 3, change corresponding ceramics pole with clamp specially 4 3 reach desired height, with same method, the whole support mechanisms in hot plate 1 are adjusted to sustained height ?.

Claims (2)

1. one kind is conveniently replaceable wafer support mechanism, it is characterised in that: this mechanism include hot plate (1), Ceramic jacket (2), ceramics pole (3) and clamp specially (4), described hot plate (1) is machined with circular counter bore, Ceramic jacket (2) is put into counterbore, then ceramics pole (3) is put into ceramic jacket (2);Described ceramic jacket (2) Inner port edge is shaped with chamfering (5), ceramics pole (3) land portions can be made to expose, the ball of ceramics pole (3) Face part is shaped with wedge-shaped slot, and during clamp specially (4) relaxation state, clamp opening (6) part can be passed through The land portions of ceramics pole (3), is enclosed within the land portions of ceramics pole (3), firmly clutches exclusive clamps During pincers (4), the opening part of clamp specially (4), less than the diameter of ceramics pole land portions, upwards pulls up, Ceramics pole (3) can be extracted in ceramic jacket (2).
The wafer support mechanism being conveniently replaceable the most as claimed in claim 1, it is characterised in that: described Ceramics pole (3) top has spherical surface hill, for support wafer, measures ceramics pole (3) with height gauge Spherical surface hill and the height of hot plate (1) upper surface, be higher or lower than according to the height of reality measurement and require Highly, entangle the wedge-shaped slot of ceramics pole with clamp specially (4), extract ceramics pole (3), change corresponding Ceramics pole (3) reach desired height, with same method by the whole support machines in hot plate (1) Structure is adjusted to sustained height.
CN201510367887.2A 2015-06-29 2015-06-29 Wafer bearing mechanism convenient to replace and used for semiconductor film coating equipment Active CN106298624B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201510367887.2A CN106298624B (en) 2015-06-29 2015-06-29 Wafer bearing mechanism convenient to replace and used for semiconductor film coating equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201510367887.2A CN106298624B (en) 2015-06-29 2015-06-29 Wafer bearing mechanism convenient to replace and used for semiconductor film coating equipment

Publications (2)

Publication Number Publication Date
CN106298624A true CN106298624A (en) 2017-01-04
CN106298624B CN106298624B (en) 2020-10-30

Family

ID=57650501

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201510367887.2A Active CN106298624B (en) 2015-06-29 2015-06-29 Wafer bearing mechanism convenient to replace and used for semiconductor film coating equipment

Country Status (1)

Country Link
CN (1) CN106298624B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113818003A (en) * 2020-06-19 2021-12-21 拓荆科技股份有限公司 Film preparation method and equipment

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10151725A (en) * 1996-11-25 1998-06-09 Matsushita Electric Ind Co Ltd Sheet and method for step replacement of screen printing machine
JP2003188068A (en) * 2001-12-17 2003-07-04 Hirata Corp Heat treatment apparatus for substrate
JP2013232512A (en) * 2012-04-27 2013-11-14 Sharp Corp Substrate processing apparatus
CN204760366U (en) * 2015-06-29 2015-11-11 沈阳拓荆科技有限公司 Removable wafer bearing structure

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10151725A (en) * 1996-11-25 1998-06-09 Matsushita Electric Ind Co Ltd Sheet and method for step replacement of screen printing machine
JP2003188068A (en) * 2001-12-17 2003-07-04 Hirata Corp Heat treatment apparatus for substrate
JP2013232512A (en) * 2012-04-27 2013-11-14 Sharp Corp Substrate processing apparatus
CN204760366U (en) * 2015-06-29 2015-11-11 沈阳拓荆科技有限公司 Removable wafer bearing structure

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113818003A (en) * 2020-06-19 2021-12-21 拓荆科技股份有限公司 Film preparation method and equipment

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CN106298624B (en) 2020-10-30

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Address after: No.900 Shuijia, Hunnan District, Shenyang City, Liaoning Province

Patentee after: Tuojing Technology Co.,Ltd.

Address before: 110179 3rd floor, No.1-1 Xinyuan street, Hunnan New District, Shenyang City, Liaoning Province

Patentee before: PIOTECH Co.,Ltd.

CP03 Change of name, title or address