CN106296716A - The power regulating method of light source, depth measurement method and device - Google Patents

The power regulating method of light source, depth measurement method and device Download PDF

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Publication number
CN106296716A
CN106296716A CN201610718894.7A CN201610718894A CN106296716A CN 106296716 A CN106296716 A CN 106296716A CN 201610718894 A CN201610718894 A CN 201610718894A CN 106296716 A CN106296716 A CN 106296716A
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Prior art keywords
image
light source
pixel
characteristic
power
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CN201610718894.7A
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黄源浩
刘龙
肖振中
许星
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Shenzhen Orbbec Co Ltd
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Shenzhen Orbbec Co Ltd
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Priority to CN201610718894.7A priority Critical patent/CN106296716A/en
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    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/10Image acquisition modality
    • G06T2207/10048Infrared image

Abstract

The invention discloses the power regulating method of a kind of light source, depth measurement method and device, the power regulating method of this light source includes: gather the object to be measured image under the light sources project of setting power;Extract the characteristic of image;When the characteristic of image is unsatisfactory for preset requirement, adjusts the setting power of light source, and again perform above step, until the characteristic of image meets preset requirement.By the way, the present invention can carry out adaptive adjustment by the image gathered to the power of light source, and without other extra equipment, reduces cost, improves work efficiency.

Description

The power regulating method of light source, depth measurement method and device
Technical field
The present invention relates to image procossing art field, particularly relate to the power regulating method of light source, depth measurement method and Device.
Background technology
The depth finding device utilizing optical projection can obtain target area or the depth map of object to be measured fast and accurately Picture, utilizes depth image can realize the intelligent use such as 3-D scanning, body feeling interaction.
Existing technology typically uses infrared light projection module with fixing power to target area projective structure light pattern, Owing to infrared light has hazardness to human body, so that by infrared light power setting on one more suitably value, a side Even if face to ensure in the recently measured distance all without harmful to human, on the other hand also to ensure that enough luminous intensities are supported The precision that depth map obtains.It is the poorest that fixing infrared light power makes to measure the structured light patterns quality gathered when the most remote, Thus the precision of depth survey can be caused the poorest.
Summary of the invention
The technical problem that present invention mainly solves is to provide the power regulating method of a kind of light source, depth measurement method and dress Put, it is possible to by the image gathered, the power of light source is carried out adaptive adjustment, and without other extra equipment, reduce Cost, improves work efficiency.
For solving above-mentioned technical problem, the technical scheme that the present invention uses is: provide the power of a kind of light source to adjust Method, the method includes: gather the object to be measured image under the light sources project of setting power;Extract the characteristic of image; When the characteristic of image is unsatisfactory for preset requirement, adjusts the setting power of light source, and again perform above step, until figure The characteristic of picture meets preset requirement.
Wherein, extract the characteristic of image, including: obtain the gray value of each pixel of image;Pass through below equation It is calculated the average gray Grad of image and as the characteristic of image:Its In, δ is the average gray Grad of image, and m is the pixel quantity on x direction, and n is the pixel quantity on y direction, fx (xij) it is pixel xijGray scale derivative in the x direction, fy(xij) it is pixel xijGray scale derivative in y-direction.
Wherein, extract the characteristic of image, including: obtain the gray value of each pixel of image;Pass through below equation It is calculated the average gray Grad characteristic as image of image:Wherein, δ is the average gray Grad of image, and m is the pixel quantity on x direction, and n is the pixel quantity on y direction, fxx(xij) For pixel xijGray scale second dervative in the x direction, fyy(xij) it is pixel xijGray scale second dervative in y-direction.
Wherein, adjust the setting power of light source, including: when the average gray Grad of image is more than preset value, reduce The setting power of light source;When the average gray Grad of image is less than preset value, increase the setting power of light source.
Wherein, adjust light source setting power before, also include: will apart from forTime, the best power of light source is arranged Initial value for setting power;Wherein, (a b) is the scope of depth survey of image acquisition device.
Wherein, light source is structure light source, and image is the infrared image of carrying structure light pattern.
For solving above-mentioned technical problem, another technical solution used in the present invention is: provide a kind of depth measurement method, The method includes: use as above method to be adjusted the setting power of light source;Gather object to be measured light source after the adjustment to throw Image under shadow;Image under light sources project is compared with reference picture, to obtain the depth information of object to be measured.
Wherein, the light of light sources project is the structure light in speckle pattern, and image is speckle image;By the figure under light sources project As comparing with reference picture, to obtain the depth information of object to be measured, including: calculate each pixel of speckle image gathered Relative to the deviation value with reference to each pixel of speckle image;Wherein, reference speckle image is that light source projects in advance to known depth Plane on, and the speckle image that plane acquisition is obtained.
Wherein, before the step that the setting power of light source is adjusted, also include: will apart from forTime, light source Best power is set to the initial value of setting power;Wherein, (a b) is the scope of depth survey of image acquisition device.
For solving above-mentioned technical problem, another technical solution used in the present invention is: provide a kind of depth measurement device, This device includes: light source, for projecting to object to be measured;Photographic head, for gathering the object to be measured light at setting power Image under the projection of source;Processor, for extracting the characteristic of image;Processor is additionally operable to be discontented with in the characteristic of image During foot preset requirement, adjust the setting power of light source, until the characteristic of image meets preset requirement;Processor be additionally operable to by Image under light sources project compares with reference picture, to obtain the depth information of object to be measured.
The invention has the beneficial effects as follows: be different from the situation of prior art, the light source power method of adjustment of the present invention includes: Gather the object to be measured image under the light sources project of setting power;Extract the characteristic of image;Characteristic at image When being unsatisfactory for preset requirement, adjust the setting power of light source, and again perform above step, until the characteristic of image meets Preset requirement.By the way, on the one hand ensure that the quality of the image of collection, on the other hand can make the power of light source One suitably in the range of and human body is not produced impact;Meanwhile, it is capable to self by the image the gathered power to light source Carry out adaptive adjustment, and without other extra equipment, such as, it is not necessary to extra laser range finder, reduce cost, carry High work efficiency.
Accompanying drawing explanation
Fig. 1 is the schematic flow sheet of power regulating method one embodiment of light source of the present invention;
Fig. 2 is the schematic flow sheet of depth measurement method one embodiment of the present invention;
Fig. 3 is the structural representation of a specific embodiment in depth measurement method one embodiment of the present invention;
Fig. 4 is the structural representation of depth measurement device one embodiment of the present invention.
Detailed description of the invention
It is the schematic flow sheet of power regulating method one embodiment of light source of the present invention refering to Fig. 1, Fig. 1, the method bag Include:
S11: gather the object to be measured image under the light sources project of setting power.
Optionally, this light source can be LASER Light Source, such as infrared light supply or ultraviolet source.Owing to this light source is mainly same as Projecting object to be measured or region to be measured, therefore, this light source can be the light source module of array arrangement, such as infrared light supply Module.
Optionally, in a specific embodiment, this light source is the infrared light supply with structured light patterns, the figure of collection As the infrared image for carrying structure light pattern.
Wherein, the initial value of the setting power of light source can be arbitrarily to arrange, for example, it may be light source rated power is Big value and a meansigma methods of minima.
Wherein, object to be measured can be taken pictures by a camera or image by the image gathering object to be measured, such as, When light source is infrared light supply, this camera can be infrared camera.
S12: extract the characteristic of image.
The characteristic of image can be or many in the gray value of image, brightness value, contrast, definition etc. Individual.Such as, if brightness value is too high, in the step of S13, then can reduce the setting power of light source, thus reduce collection The brightness value of image.
Optionally, below as a example by the characteristic average gray Grad as image, this step is described in detail:
In the first embodiment, S12 can specifically include:
S121: obtain the gray value of each pixel of image.
Wherein, obtain the gray value of each pixel, existing technology can be used, be not required here.
S122: be calculated the average gray Grad of image and as the characteristic of image by below equation:
δ = Σ i = 1 m Σ j = 1 n f x ( x i j ) 2 + f y ( x i j ) 2 m × n
Wherein, δ is the average gray Grad of image, and m is the pixel quantity on x direction, and n is the pixel on y direction Point quantity, fx(xij) it is pixel xijGray scale derivative in the x direction, fy(xij) it is pixel xijGray scale in y-direction is led Number.
It should be understood that the image of this acquisition is two dimensional image, build with a pixel in this two dimensional image for initial point Vertical xy coordinate, the direction of x with y is consistent with the vertically and horizontally arranged direction of pixel.
In a second embodiment, S12 can specifically include:
S123: obtain the gray value of each pixel of image.
S124: be calculated the average gray Grad characteristic as image of image by below equation:
δ = Σ i = 1 m Σ j = 1 n f x x ( x i j ) 2 + f y y ( x i j ) 2 m × n
Wherein, δ is the average gray Grad of image, and m is the pixel quantity on x direction, and n is the pixel on y direction Point quantity, fxx(xij) it is pixel xijGray scale second dervative in the x direction, fyy(xij) it is pixel xijIn y-direction Gray scale second dervative.
S13: judge whether the characteristic of image meets preset requirement.
The setting power of light source is not adjusted;If otherwise carrying out S14.
Wherein, it is judged that whether the characteristic of image meets preset requirement, can determine according to the type of characteristic, For example, it may be whether one or more in the definition of image, brightness, contrast, saturation, average gray Grad reach To preset requirement.
S14: adjust the setting power of light source.
After S14 has performed, return to step S11, and repeat above step, until the characteristic of image meets Preset requirement.
Wherein it is possible to according to the kind of characteristic, the adjustment mode of the setting power of light source is pre-seted.
Optionally, if characteristic is the average gray Grad mentioned in above-described embodiment, then S14 can specifically wrap Include:
S141: when the average gray Grad of image is more than preset value, reduce the setting power of light source.
S142: when the average gray Grad of image is less than preset value, increase the setting power of light source.
Wherein, the amplitude being increased or decreased of the setting power of light source can be arbitrarily to arrange, and optionally, increasing adds deduct Little amplitude can be a less value.
Being different from prior art, the light source power method of adjustment of present embodiment includes: gathers object to be measured and is setting merit Image under the light sources project of rate;Extract the characteristic of image;When the characteristic of image is unsatisfactory for preset requirement, adjust The setting power of light source, and again perform above step, until the characteristic of image meets preset requirement.By above-mentioned side On the one hand formula, ensure that the quality of the image of collection, on the other hand can make the power of light source one suitably in the range of And human body is not produced impact;Meanwhile, it is capable to the power of light source is carried out adaptive adjustment self by the image gathered, and Without the equipment that other are extra, such as, it is not necessary to extra laser range finder, reduce cost, improve work efficiency.
Refering to Fig. 2, the schematic flow sheet of depth measurement method one embodiment of the present invention, the method includes:
S21: the setting power of light source is adjusted.
Wherein, the power regulating method of the light source that this step S21 uses is the power regulating method that have employed as above light source The method introduced in one embodiment, repeats no more here.
Optionally, before S21, typically the setting power of light source can be arranged an initial value, in the present embodiment, Can by apart from forTime, the best power of light source is set to the initial value of setting power;Wherein, (a b) is image acquisition The scope of the depth survey of device.Specifically, in distance it is i.e.Time, the power of light source can guarantee that the quality of the image of collection (or certainty of measurement), the function that can make again light source is not very big in order to avoid damaging human body.
S22: gather the image under object to be measured light sources project after the adjustment.
Optionally, in one embodiment, this light source be can the infrared light supply of projection structure light pattern, the image of collection Infrared image for carrying structure light pattern.Wherein, this structured light patterns can be speckle pattern, and therefore, the image of collection is also For speckle image.
S23: compared with reference picture by the image under light sources project, to obtain the depth information of object to be measured.
Wherein, reference picture is the image of the known depth gathered.Specifically, the optical axis of photographing unit can be perpendicular to Placing a flat board in plane, this flat board is known with the distance of photographing unit.Again to this flat projection structured light patterns and by photograph Machine carries out shooting and obtains reference picture.Wherein, the pattern of the image of the pattern of reference picture and collection object to be measured is by same Collect under individual light sources project.
Optionally, in the case of structured light patterns is speckle pattern, reference picture can be with reference to speckle image.Reference Speckle image is that light source projects in advance to the plane of known depth, and the speckle image obtaining plane acquisition.
Wherein, image and the reference picture of collection are compared, can be the coordinate being obtained pixel by gray value, The degree of depth of the image of collection it is calculated again by the side-play amount of pixel.
Optionally, being speckle pattern in structured light patterns, reference picture is that S23 is permissible with reference in the case of speckle image Particularly as follows:
Calculate each pixel of speckle image gathered relative to the deviation value with reference to each pixel of speckle image.
Specifically, below calculating deviation value is done simple introduction:
First the displacement mapping function of each pixel is determined, it is however generally that this function needs to consider to gather image and with reference to figure As the translation of each point and deformation on object to be measured in two width figures.In the present embodiment, due to the pattern in two width figures it is only Owing to subject depth to be measured change causes change in location, there is not bigger deformation, therefore this function can be simplified to Only consider the situation of translation, it may be assumed that X=x+ Δ.Here X and x is respectively a point of object to be measured in collection image and reference Pixel coordinate in image, Δ is deviation value to be asked.
Secondly, corresponding searching algorithm is determined.It is generally adopted by Newton iteration method, but this algorithm relates to substantial amounts of Number and division arithmetic, algorithm write and execution efficiency is the highest.The present embodiment is to use based on iterative least square The searching algorithm of method.Owing to being only considered along the situation of X-direction translation, the most only need to carry out one-dimensional searching algorithm the most permissible , so can the efficiency of boosting algorithm by a relatively large margin.
Finally combine displacement mapping function and disagreement value A just can be solved by interative least square method.
In conjunction with Fig. 3, below with to the infrared speckle pattern of Object Projection to be measured, utilize infrared depth camera to be measured right to gather As a example by the image of elephant, present embodiment is described in detail:
If the design of this depth camera fathoms as a~b, then can be arranged to by the predetermined power of infrared light supply can To realize meeting infrared light not harmful to human when measurement target range is for (a+b)/2 and camera just reaches the measurement of requirement Precision.
During measurement, first to object space (object the most to be measured) with default power projection speckle pattern, then utilize red Outer collected by camera object space speckle image, carries out digitized map by this object space speckle image with reference to speckle image and then As correlation computations, on acquisition object space speckle image, each pixel is relative to reference to the deviation of respective pixel on speckle image Value.Due to the width speckle image referring to obtain in advance in the plane of known depth value with reference to speckle image, it is however generally that Diagram picture either has higher quality, the principal element therefore affecting certainty of measurement to be in contrast or definition The quality of target speckle image.
If current measurement distance is less than (a+b)/2, the target speckle image collected has reasonable quality, tool Body ground, can judge by calculating the average gray Grad of target speckle image, now average gray Grad is general Can show that this speckle image has preferable quality higher than the threshold value preset.Then by infrared light luminous power by certain amplitude Reduce, then gather target speckle image and calculate average gray Grad;Repeat this step average gray until speckle image Grad reaches or close to stopping reduction power during threshold value.After adjusting, this depth camera system can not only be guaranteed high-precision The measurement of degree, can reduce again power consumption.
Here threshold value refers to target speckle image and just reaches when carrying out correlation computations with reference to speckle image to measure The average gray Grad of target speckle image during precision, after determining with reference to speckle image, this threshold value just can be now uniquely determined. Thus, the concrete grammar of predetermined power initial value the most just has, and measurement target is placed in a certain distance (in the present embodiment It is (a+b)/2), then with any power projection speckle, after collecting target speckle pattern, calculate average gray Grad, if Then increase power more than threshold value, otherwise reduce, during until average gray Grad reaches threshold value, record power now, After by this power as predetermined power.
If current measurement distance is more than (a+b)/2, the average gray Grad meeting of the target speckle image collected Less than threshold value, now increasing luminous power, then this step of repeated acquisition is until the average gray Grad of speckle image reaches Or close to stopping increase power during threshold value.After adjusting, even if target this depth camera system in larger distance also can Ensure there is higher certainty of measurement.
Being different from prior art, the depth measurement method in present embodiment includes: adjust the setting power of light source Whole;Gather the image under object to be measured light sources project after the adjustment;Image under light sources project is compared with reference picture Relatively, to obtain the depth information of object to be measured.By the way, it is possible to automatically adjust the luminous power of light source so that measure away from With less power light-emitting to reduce system power dissipation time close to from, and increase the power of light source when measuring distant, thus Ensure in its depth survey precision.Compared with prior art, can be with significantly more efficient under conditions of without other extra means Mode realizes the automatic adjustment of light source power.
Refering to Fig. 4, the structural representation of depth measurement device one embodiment of the present invention, this device includes:
Light source 41, for projecting to object to be measured.
Photographic head 42, for gathering the object to be measured image under the light sources project of setting power.
Processor 43, for extracting the characteristic of image.
Processor 43 is additionally operable to when the characteristic of image is unsatisfactory for preset requirement, adjusts the setting power of light source, directly Characteristic to image meets preset requirement.
Processor 43 is additionally operable to compare the image under light sources project with reference picture, to obtain the deep of object to be measured Degree information.
It should be understood that light source 41 and processor 43 connect, so that the power of light source 41 can be adjusted by processor 43 Joint.Photographic head 42 and processor 43 connect, so that the image that photographic head 42 gathers can be sent to processor 43 to image Process, i.e. extract the characteristic of image.
It addition, optional, this device can also include memorizer, and this memorizer is for default algorithm, threshold value, reference Images etc. store.
Optionally, this depth measurement device can be depth survey camera, and this camera includes photographic head and light source, processor It is arranged at the inside of camera.
In a specific embodiment, this light source 41 can be infrared projection module, and this infrared projection module sends With the infrared structure light of speckle pattern, so, this depth camera is infrared depth camera, and its photographic head 42 is used for gathering to be measured The infrared speckle pattern of object.
Specifically, after photographic head 42 collects the infrared speckle image of object to be measured, processor 43 first obtains infrared The gray value of each pixel of speckle image, then the average gray Grad of infrared speckle image is obtained by following two mode:
1, the average gray Grad of image it is calculated by below equation:
δ = Σ i = 1 m Σ j = 1 n f x ( x i j ) 2 + f y ( x i j ) 2 m × n
Wherein, δ is the average gray Grad of image, and m is the pixel quantity on x direction, and n is the pixel on y direction Point quantity, fx(xij) it is pixel xijGray scale derivative in the x direction, fy(xij) it is pixel xijGray scale in y-direction is led Number.
2, the average gray Grad of image it is calculated by below equation:
δ = Σ i = 1 m Σ j = 1 n f x x ( x i j ) 2 + f y y ( x i j ) 2 m × n
Wherein, δ is the average gray Grad of image, and m is the pixel quantity on x direction, and n is the pixel on y direction Point quantity, fxx(xij) it is pixel xijGray scale second dervative in the x direction, fyy(xij) it is pixel xijIn y-direction Gray scale second dervative.
After the average gray Grad of the infrared speckle pattern obtaining collection again, processor 43 is additionally operable to:
When the average gray Grad of image is more than preset value, reduce the setting power of light source 41;And at image When average gray Grad is less than preset value, increase the setting power of light source 41.
Wherein, preset value i.e. average gray Grad threshold value, threshold value here refer to gather target speckle image with The average gray Grad of the speckle image gathered during certainty of measurement is just reached when carrying out correlation computations with reference to speckle image, when After determining with reference to speckle image, this threshold value just can be now uniquely determined.
After the power of light source 41 adjusted being over, it is possible to carry out the depth finding of object to be measured.
Specifically, each pixel of speckle image that processor 43 can be obtained by calculating is every relative to reference to speckle image The deviation value of individual pixel, obtains the depth value of the speckle image gathered.
Specifically, below calculating deviation value is done simple introduction:
First the displacement mapping function of each pixel is determined, it is however generally that this function needs to consider to gather image and with reference to figure As the translation of each point and deformation on object to be measured in two width figures.In the present embodiment, due to the pattern in two width figures it is only Owing to subject depth to be measured change causes change in location, there is not bigger deformation, therefore this function can be simplified to Only consider the situation of translation, it may be assumed that X=x+ Δ.Here X and x is respectively a point of object to be measured in collection image and reference Pixel coordinate in image, Δ is deviation value to be asked.
Secondly, corresponding searching algorithm is determined.It is generally adopted by Newton iteration method, but this algorithm relates to substantial amounts of Number and division arithmetic, algorithm write and execution efficiency is the highest.The present embodiment is to use based on iterative least square The searching algorithm of method.Owing to being only considered along the situation of X-direction translation, the most only need to carry out one-dimensional searching algorithm the most permissible , so can the efficiency of boosting algorithm by a relatively large margin.
Finally combine displacement mapping function and disagreement value A just can be solved by interative least square method.
It should be understood that the device of present embodiment is based on above-mentioned light source power method of adjustment and depth measurement method One device, specifically, can be a depth survey camera, and its concrete enforcement principle is similar with step, repeats no more here.
The depth measurement device of present embodiment, it is possible to by the process to the image that self gathers, the power to light source It is adjusted so that with less power light-emitting to reduce system power dissipation when measuring close together, and when measuring distant Increase the power of light source, thus ensure in its depth survey precision.Compared with prior art, at the bar without other extra means The automatic adjustment of light source power can be realized in a more efficient way under part.
The foregoing is only embodiments of the present invention, not thereby limit the scope of the claims of the present invention, every utilization is originally Equivalent structure or equivalence flow process that description of the invention and accompanying drawing content are made convert, or are directly or indirectly used in what other were correlated with Technical field, is the most in like manner included in the scope of patent protection of the present invention.

Claims (10)

1. the power regulating method of a light source, it is characterised in that including:
Gather the object to be measured image under the light sources project of setting power;
Extract the characteristic of described image;
When the characteristic of described image is unsatisfactory for preset requirement, adjust the setting power of described light source, and again perform with Upper step, until the characteristic of described image meets preset requirement.
Method the most according to claim 1, it is characterised in that
The characteristic of the described image of described extraction, including:
Obtain the gray value of each pixel of described image;
It is calculated the average gray Grad of described image and as the characteristic of described image by below equation:
δ = Σ i = 1 m Σ j = 1 n f x ( x i j ) 2 + f y ( x i j ) 2 m × n ;
Wherein, δ is the average gray Grad of described image, and m is the pixel quantity on x direction, and n is the pixel on y direction Point quantity, fx(xij) it is pixel xijGray scale derivative in the x direction, fy(xij) it is pixel xijGray scale in y-direction is led Number.
Method the most according to claim 1, it is characterised in that
The characteristic of the described image of described extraction, including:
Obtain the gray value of each pixel of described image;
The average gray Grad characteristic as described image of described image it is calculated by below equation:
δ = Σ i = 1 m Σ j = 1 n f x x ( x i j ) 2 + f y y ( x i j ) 2 m × n ;
Wherein, δ is the average gray Grad of described image, and m is the pixel quantity on x direction, and n is the pixel on y direction Point quantity, fxx(xij) it is pixel xijGray scale second dervative in the x direction, fyy(xij) it is pixel xijIn y-direction Gray scale second dervative.
The most according to the method in claim 2 or 3, it is characterised in that
The setting power of the described light source of described adjustment, including:
When the average gray Grad of described image is more than preset value, reduce the setting power of described light source;
When the average gray Grad of described image is less than preset value, increase the setting power of described light source.
Method the most according to claim 4, it is characterised in that
Before the setting power of described adjustment light source, also include:
Will apart from forTime, the best power of described light source is set to the initial value of described setting power;
Wherein, (a b) is the scope of depth survey of image acquisition device.
Method the most according to claim 1, it is characterised in that described light source is structure light source, and described image is for carrying knot The infrared image of structure light pattern.
7. a depth measurement method, it is characterised in that including:
Use the method as described in any one of claim 1-6 that the setting power of light source is adjusted;
Gather the image under object to be measured light sources project after the adjustment;
Image under described light sources project is compared with reference picture, to obtain the depth information of described object to be measured.
Method the most according to claim 7, it is characterised in that
The light of described light sources project is the structure light in speckle pattern, and described image is speckle image;
Described image under described light sources project is compared with reference picture, believe obtaining the degree of depth of described object to be measured Breath, including:
Calculate each pixel of speckle image gathered relative to the deviation value with reference to each pixel of speckle image;
Wherein, described is that described light source projects in advance to the plane of known depth with reference to speckle image, and adopts described plane The speckle image that collection obtains.
Method the most according to claim 7, it is characterised in that
Before the described step that the setting power of light source is adjusted, also include:
Will apart from forTime, the best power of described light source is set to the initial value of described setting power;
Wherein, (a b) is the scope of depth survey of image acquisition device.
10. a depth measurement device, it is characterised in that including:
Light source, for projecting to object to be measured;
Photographic head, for gathering the object to be measured image under the described light sources project of setting power;
Processor, for extracting the characteristic of described image;
Described processor is additionally operable to, when the characteristic of described image is unsatisfactory for preset requirement, adjust the setting merit of described light source Rate, until the characteristic of described image meets preset requirement;
Described processor is additionally operable to compare the image under described light sources project with reference picture, described to be measured right to obtain The depth information of elephant.
CN201610718894.7A 2016-08-24 2016-08-24 The power regulating method of light source, depth measurement method and device Pending CN106296716A (en)

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