CN106291174A - A kind of life-span preparation method, device, electronic equipment and server - Google Patents
A kind of life-span preparation method, device, electronic equipment and server Download PDFInfo
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- CN106291174A CN106291174A CN201610609626.1A CN201610609626A CN106291174A CN 106291174 A CN106291174 A CN 106291174A CN 201610609626 A CN201610609626 A CN 201610609626A CN 106291174 A CN106291174 A CN 106291174A
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- power supply
- supply unit
- service life
- described power
- life
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Abstract
This application discloses a kind of life-span preparation method, device, electronic equipment and server, method includes: gather at least one power supply unit respective operating temperature and live load in running；Based on described operating temperature and live load, obtain the prediction service life of each described power supply unit respectively.This prediction service life that the application is obtained service life preset relative in prior art more presses close to the life length that power supply unit actual can be properly functioning, therefore, the accuracy utilizing the prediction service life of the power supply unit that the application obtained is higher, and further when carrying out PSU damaging detection, accuracy is higher.
Description
Technical field
The application relates to testing techniques of equipment field, particularly to a kind of life-span preparation method, device, electronic equipment and clothes
Business device.
Background technology
Power supply unit (power supply unit, PSU) is the significant components in the equipment such as server, is responsible for defeated
The 110V/220V voltage entered is changed, other assemblies being available in equipment.The most only after PSU damages, server
After record, PSU is replaced by user.
In prior art, in order to avoid PSU to damage affect the properly functioning of server, need PSU is monitored,
Perception PSU damages in advance, thereby guarantees that equipment reliability of operation.The scheme generally used is: use the longevity by preset one
Life or useful life, the time limit at hand time, prompting user carry out PSU replacing.
But in actual application, can be because various factors causes actual life of PSU and preset service life or makes
With the time limit, deviation occurs, cause in prior art inaccurate to the damage detection of PSU.
Summary of the invention
In view of this, the purpose of the application is to provide a kind of life-span preparation method, device, electronic equipment and server, uses
To solve the preset service life of PSU and actual life in prior art deviation to occur, the damage to PSU is caused to detect not
Technical problem accurately.
This application provides a kind of life-span preparation method, including:
Gather at least one power supply unit respective operating temperature and live load in running；
Based on described operating temperature and live load, obtain the prediction service life of each described power supply unit respectively.
Said method, it is preferred that based on described operating temperature and live load, it is thus achieved that each described power supply unit pre-
Survey service life, including:
To each described power supply unit execution following steps:
UtilizeObtain the prediction service life of described power supply unit；
Wherein, W (t) be the time be operating temperature during t, D (t) is to be the live load during t time, and T is described power supply
The history run time of supply is long, and L1 is the prediction service life of described power supply unit.
Said method, it is preferred that also include:
Judge whether the prediction service life of described power supply unit meets the control condition preset；
If described prediction service life meets described control condition, generating control instruction, described control instruction is used for carrying
Show detection information.
Said method, it is preferred that described prediction service life meets described control condition and includes: described prediction service life
More than the first threshold preset and it is less than the Second Threshold preset with the ratio value of the standard service life of described power supply unit,
Or, described prediction service life is more than described Second Threshold with the ratio value of the standard service life of described power supply unit,
Described Second Threshold is more than described first threshold；
Described generation control instruction, including:
At the ratio value of described prediction service life and the standard service life of described power supply unit more than the preset
One threshold value and less than preset Second Threshold time, generate prompting first detection information control instruction；
Ratio value in described prediction service life with the standard service life of described power supply unit is more than described second
Threshold value, generates the control instruction of prompting the second detection information.
Said method, it is preferred that the standard service life of described power supply unit obtains in the following manner:
UtilizeObtain the standard service life of described power supply unit；
Wherein, W is the standard operating temperature of described power supply unit, and D is the standard live load of described power supply unit,
T is the specified long operational time that described power supply unit runs with standard operating temperature and standard live load, and L2 is described mark
Quasi-service life.
Said method, it is preferred that described based on described operating temperature and live load, obtains each described power supply respectively
After the prediction service life of supply, also include:
Based on each described power supply unit respective prediction service life, by system load distribution to each described power supply
Supply so that the prediction service life of the load and described power supply unit of distributing to each described power supply unit has pre-
If corresponding relation.
Said method, it is preferred that the load residual life corresponding with described prediction service life of described power supply unit
Parameter is directly proportional, and described residual life parameter is 100% difference deducting the life-span factor, and the described life-span factor is power supply unit
The ratio of prediction service life and standard service life.
Said method, it is preferred that the load that described power supply unit is allocated utilizes ln2=l1 × Xn/ L obtains, wherein:
ln2 is load allocated for power supply unit n, and l1 is system load, XnResidual life for power supply unit n is joined
Amount, L is the residual life parameter sum of power supply unit 1～N.
Present invention also provides a kind of server, including:
Temperature sensor, is used for gathering at least one power supply unit respective operating temperature in running；
Load monitor, is used for gathering each described power supply unit respective live load in running；
Processing means, is connected with described temperature sensor and described load monitor, for based on described operating temperature
And live load, obtain the prediction service life of each described power supply unit respectively.
Above-mentioned server, it is preferred that described processing means is additionally operable to: each described power supply unit is utilizedObtain the prediction service life of described power supply unit；
Wherein, W (t) be the time be operating temperature during t, D (t) is to be the live load during t time, and T is described power supply
The history run time of supply is long, and L1 is the prediction service life of described power supply unit.
Above-mentioned server, it is preferred that described processing means is additionally operable to: judge the prediction service life of described power supply unit
Whether meet the control condition preset, if described prediction service life meets described control condition, generate control instruction, described
Control instruction is used for pointing out detection information.
Above-mentioned server, it is preferred that described prediction service life meets described control condition and includes: described prediction runs the longevity
Life more than the first threshold preset and is less than the second threshold preset with the ratio value of the standard service life of described power supply unit
Value, or, described prediction service life is more than described second threshold with the ratio value of the standard service life of described power supply unit
Value, described Second Threshold is more than described first threshold；
Described processing means is additionally operable to: in the standard service life of described prediction service life and described power supply unit
When ratio value is more than the first threshold preset and less than the Second Threshold preset, the control generating prompting the first detection information refers to
Order；
Ratio value in described prediction service life with the standard service life of described power supply unit is more than described second
Threshold value, generates the control instruction of prompting the second detection information.
Above-mentioned server, it is preferred that when described processing means obtains the standard service life of described power supply unit, specifically
For:
UtilizeObtain the standard service life of described power supply unit；
Wherein, W is the standard operating temperature of described power supply unit, and D is the standard live load of described power supply unit,
T is the specified long operational time that described power supply unit runs with standard operating temperature and standard live load, and L2 is described mark
Quasi-service life.
Above-mentioned server, it is preferred that described processing means is additionally operable to:
Based on described operating temperature and live load, obtain the prediction service life of each described power supply unit respectively
Afterwards, based on each described power supply unit respective prediction service life, system load distribution is supplied to each described power supply
Answering device so that the load distributing to each described power supply unit is directly proportional to life-span difference, described life-span difference is that power supply supplies
Answer the difference between the standard service life of device and prediction service life.
Above-mentioned server, it is preferred that when described processing means is the load of described power supply unit distribution, specifically for:
Utilize ln2=l1 × Xn/ L obtains the load of described power supply unit, wherein:
ln2 is load allocated for power supply unit n, and l1 is system load, XnResidual life for power supply unit n is joined
Amount, L is the residual life parameter sum of power supply unit 1～N.
Present invention also provides a kind of life-span acquisition device, including:
Acquisition module, is used for gathering at least one power supply unit respective operating temperature and work in running negative
Carry；
Obtain module, for based on described operating temperature and live load, obtain each described power supply unit respectively
Prediction service life.
Said apparatus, it is preferred that described acquisition module includes:
Life-span obtains submodule, for each described power supply unit performs following steps:
UtilizeObtain the prediction service life of described power supply unit；
Wherein, W (t) be the time be operating temperature during t, D (t) is to be the live load during t time, and T is described power supply
The history run time of supply is long, and L1 is the prediction service life of described power supply unit.
Said apparatus, it is preferred that also include:
Judge module, for judging whether the prediction service life of described power supply unit meets the control condition preset,
If described prediction service life meets described control condition, operating instruction generation module；
Directive generation module, is used for generating control instruction, and described control instruction is used for pointing out detection information.
Said apparatus, it is preferred that described prediction service life meets described control condition and includes: described prediction service life
More than the first threshold preset and it is less than the Second Threshold preset with the ratio value of the standard service life of described power supply unit,
Or, described prediction service life is more than described Second Threshold with the ratio value of the standard service life of described power supply unit,
Described Second Threshold is more than described first threshold；
Described directive generation module includes:
First generates submodule, for the standard service life in described prediction service life and described power supply unit
When ratio value is more than the first threshold preset and less than the Second Threshold preset, the control generating prompting the first detection information refers to
Order；
Second generates submodule, for the standard service life in described prediction service life and described power supply unit
Ratio value is more than described Second Threshold, generates the control instruction of prompting the second detection information.
Said apparatus, it is preferred that also include:
Standard obtains module, is used for utilizingObtain the standard service life of described power supply unit；
Wherein, W is the standard operating temperature of described power supply unit, and D is the standard live load of described power supply unit,
T is the specified long operational time that described power supply unit runs with standard operating temperature and standard live load, and L2 is described mark
Quasi-service life.
Said apparatus, it is preferred that also include:
Load distribution module, for based on each described power supply unit respective prediction service life, by system load
Distribution is to each described power supply unit so that distribute to the load of each described power supply unit and described power supply unit
Prediction service life has default corresponding relation.
Said apparatus, it is preferred that described processing means is that the load of described power supply unit distribution runs with described prediction
Residual life parameter corresponding to life-span is directly proportional, and described residual life parameter is 100% difference deducting the life-span factor, the described longevity
The life factor is the prediction service life ratio with standard service life of power supply unit.
Said apparatus, it is preferred that load distribution module includes:
Load obtains submodule, is used for utilizing ln2=l1 × Xn/ L obtains the load of power supply unit n, wherein:
ln2 is load allocated for power supply unit n, and l1 is system load, XnResidual life for power supply unit n is joined
Amount, L is the residual life parameter sum of power supply unit 1～N.
Present invention also provides a kind of electronic equipment, including memorizer and processor, wherein:
Described memorizer, is used for storing application program and described application program runs produced data；
Described processor, is used for running described application program to realize following functions:
Gather at least one power supply unit respective operating temperature and live load in running, based on described work
Make temperature and live load, obtain the prediction service life of each described power supply unit respectively.
Above-mentioned electronic equipment, it is preferred that described processor is additionally operable to: each described power supply unit is utilizedObtain the prediction service life of described power supply unit；
Wherein, W (t) be the time be operating temperature during t, D (t) is to be the live load during t time, and T is described power supply
The history run time of supply is long, and L1 is the prediction service life of described power supply unit.
Above-mentioned electronic equipment, it is preferred that described processor is additionally operable to: judge the prediction service life of described power supply unit
Whether meet the control condition preset, if described prediction service life meets described control condition, generate control instruction, described
Control instruction is used for pointing out detection information.
Above-mentioned electronic equipment, it is preferred that described prediction service life meets described control condition and includes: described prediction runs
Life-span more than the first threshold preset and is less than second preset with the ratio value of the standard service life of described power supply unit
Threshold value, or, described prediction service life is more than described second with the ratio value of the standard service life of described power supply unit
Threshold value, described Second Threshold is more than described first threshold；
Described processor is additionally operable to: at the ratio of described prediction service life with the standard service life of described power supply unit
When example value is more than the first threshold preset and less than the Second Threshold preset, generate the control instruction of prompting the first detection information；
Ratio value in described prediction service life with the standard service life of described power supply unit is more than described second
Threshold value, generates the control instruction of prompting the second detection information.
When described processor obtains the standard service life of described power supply unit, specifically for:
UtilizeObtain the standard service life of described power supply unit；
Wherein, W is the standard operating temperature of described power supply unit, and D is the standard live load of described power supply unit,
T is the specified long operational time that described power supply unit runs with standard operating temperature and standard live load, and L2 is described mark
Quasi-service life.
Above-mentioned electronic equipment, it is preferred that described processor is additionally operable to:
Based on described operating temperature and live load, obtain the prediction service life of each described power supply unit respectively
Afterwards, based on each described power supply unit respective prediction service life, system load distribution is supplied to each described power supply
Answering device so that the load distributing to each described power supply unit is directly proportional to life-span difference, described life-span difference is that power supply supplies
Answer the difference between the standard service life of device and prediction service life.
Above-mentioned electronic equipment, it is preferred that when described processor is the load of described power supply unit distribution, specifically for:
Utilize ln2=l1 × Xn/ L obtains the load of described power supply unit, wherein:
ln2 is load allocated for power supply unit n, and l1 is system load, XnResidual life for power supply unit n is joined
Amount, L is the residual life parameter sum of power supply unit 1～N.
From such scheme, a kind of life-span preparation method, device, electronic equipment and the server that the application provides, lead to
Cross and gather power supply unit actual work temperature in running and live load, and then again based on operating temperature and negative
Carry, the actual life of power supply unit is predicted, obtain the prediction service life of power supply unit, and this prediction
Service life more presses close to the actual of power supply unit at service life preset relative in prior art can be properly functioning
Life length, therefore, the accuracy utilizing the prediction service life of the power supply unit that the application obtained is higher, further
When carrying out PSU damaging detection, accuracy is higher.
Accompanying drawing explanation
For the technical scheme being illustrated more clearly that in the embodiment of the present application, in embodiment being described below required for make
Accompanying drawing be briefly described, it should be apparent that, the accompanying drawing in describing below is only some embodiments of the application, for
From the point of view of those of ordinary skill in the art, on the premise of not paying creative work, it is also possible to obtain it according to these accompanying drawings
His accompanying drawing.
The flowchart of a kind of life-span preparation method embodiment that Fig. 1 provides for the application；
Another flow chart of a kind of life-span preparation method that Fig. 2 provides for the embodiment of the present application；
Another flow chart of a kind of life-span preparation method that Fig. 3 provides for the embodiment of the present application；
The structural representation of a kind of server that Fig. 4 provides for the embodiment of the present application；
Fig. 5 obtains the structural representation of device for a kind of life-span that the embodiment of the present application provides；
Fig. 6 a and Fig. 6 b is respectively the structural representation of acquisition of a kind of life-span device that the embodiment of the present application provides；
Fig. 6 c obtains the part-structure schematic diagram of device for a kind of life-span that the embodiment of the present application provides；
Fig. 6 d, Fig. 6 e and Fig. 6 f are respectively other structural representations of acquisition of a kind of life-span device that the embodiment of the present application provides
Figure；
The structural representation of a kind of electronic equipment that Fig. 7 provides for the embodiment of the present application.
Detailed description of the invention
Below in conjunction with the accompanying drawing in the embodiment of the present application, the technical scheme in the embodiment of the present application is carried out clear, complete
Describe, it is clear that described embodiment is only some embodiments of the present application rather than whole embodiments wholely.Based on
Embodiment in the application, it is every other that those of ordinary skill in the art are obtained under not making creative work premise
Embodiment, broadly falls into the scope of the application protection.
Shown in Fig. 1, for the flowchart of a kind of life-span preparation method embodiment that the application provides, wherein, shown side
Method is be applicable to the equipment with power supply unit PSU, such as various electrical equipments such as servers.In the present embodiment, the life-span is obtained
The method obtained may comprise steps of:
Step 101: gather at least one power supply unit respective operating temperature and live load in running.
Wherein, in the electrical equipments such as at least one power supply unit here refers to, server contained all can
Properly functioning power supply unit, can only comprise a power supply unit in electrical equipment, it is also possible to comprise multiple power supply and supply
Answer device, in the present embodiment in electrical equipment all can be properly functioning the power supply unit respective work in running
Make temperature and live load is acquired.
Step 102: based on operating temperature and live load, obtain the prediction service life of each power supply unit respectively.
Wherein, the prediction service life of power supply unit refers to the maximum operation time that power supply unit can be properly functioning
Long.
From such scheme, a kind of life-span preparation method that the embodiment of the present application provides, by gathering power supply unit
Actual work temperature in running and live load, and then again based on operating temperature and load, to power supply unit
Actual life is predicted, and obtains the prediction service life of power supply unit, and this prediction service life is relative to existing
Have and more press close to the life length that power supply unit actual can be properly functioning service life preset in technology, therefore, profit
The accuracy of the prediction service life of the power supply unit obtained with the present embodiment is higher, is further damaging PSU
During bad detection, accuracy is higher.
In implementing, the present embodiment can utilize the operating temperature to each power supply unit and live load to carry out
Hereinafter operate, obtain the prediction service life of each power supply unit:
UtilizeObtain the prediction service life of power supply unit.
Wherein, W (t) is time operating temperature actual when being t, and D (t) is time live load actual when being t, and t is
Time timing to the operation of power supply unit, T is that the history run time of power supply unit is long, i.e. the maximum of t, and L1 is electricity
The prediction service life of source supply.
Fig. 2 show another flow chart of a kind of life-span preparation method that the embodiment of the present application provides, step 102 it
After, it is also possible to comprise the following steps:
Step 103: judge whether the prediction service life of power supply unit meets the control condition preset, if prediction fortune
The row life-span meets control condition, then perform step 104.
Step 104: generate control instruction, this control instruction may be used for pointing out detection information.
Such as, control instruction can show the instruction of detection information after being operation.
Here control condition can be that prediction service life reaches capacity, and reaches capacity in the life-span of power supply unit
Time, perform to generate the operation of control instruction, reach to point out the purpose of detection information.
In a particular application, it was predicted that service life meets control condition and can be: prediction service life and power supply unit
Standard service life ratio value more than preset first threshold and less than preset Second Threshold, or, it was predicted that run the longevity
Life is more than Second Threshold with the ratio value of the standard service life of power supply unit, and wherein, Second Threshold is more than first threshold.
Here, the standard service life of power supply unit refers to, based on power supply unit with the load amount specified, temperature
Service life obtained by amount and specified long operational time, and predict the standard service life of service life and power supply unit
Ratio value can be understood as the life-span factor of power supply unit, this life-span factor can characterize the operation longevity of power supply unit
The standard service life of the most close regulation of life, or had the risk etc. of damage, on this basis, the present embodiment is being given birth to
When becoming control instruction, can be accomplished by:
When the life-span factor is more than first threshold and is less than Second Threshold, show that the service life of power supply unit is close to mark
Quasi-service life, now, generates the control instruction of prompting the first detection information.Here the first detection information can be: " please note
The service life of meaning PSU " or the information such as " please note whether have PSU spare unit be available for change ", such as yellow light warning information.
And when the life-span factor is more than Second Threshold, show that the operation of power supply unit may exist the wind of damage
Danger, now, generates the control instruction of prompting the second detection information.Here the second detection information can be: " please notes replacing
PSU " etc. information, such as red light warning information.
Here first threshold and Second Threshold can be configured according to demand, if first threshold is 80%, and the second threshold
Value is 100% etc..
The present embodiment utilize the prediction obtained by the actual work temperature according to power supply unit and live load run
Power supply unit the need of being replaced or other process detect, and then is improved the Exact Travelling of detection by the life-span.
Wherein, the standard service life of power supply unit can obtain in the following manner:
UtilizeObtain the standard service life of described power supply unit；
Wherein, W is the standard operating temperature of described power supply unit, and D is the standard live load of described power supply unit,
T is the specified long operational time that described power supply unit runs with standard operating temperature and standard live load, and L2 is described mark
Quasi-service life.
Such as, the lifetime specification of certain PSU is: 75% load, 55 DEG C and 43800 hours, say, that PSU is with load 70% also
Can run at 55 DEG C 43800 hours, based on this, the present embodiment utilize
Obtaining the standard service life of this PSU, the life-span factor of this PSU is: L1/L2.
The load that most preferably undertakes of power supply unit can be carried out point by the present embodiment based on the prediction service life obtained
Arranging is put.Fig. 3 show another flow chart of a kind of life-span preparation method that the embodiment of the present application provides, in shown step 102
Afterwards, it is also possible to comprise the following steps:
Step 105: based on each power supply unit respective prediction service life, by system load distribution to each power supply
Supply so that the prediction service life of the load and power supply unit of distributing to power supply unit has default corresponding pass
System.
Here corresponding relation can be: the residual life that the load of power supply unit distribution is corresponding with prediction service life
Parameter is directly proportional, and residual life parameter is 100% difference deducting the life-span factor, and the life-span factor is the pre-of power supply unit
Survey the ratio of service life and standard service life.
Concrete, electrical equipment has 1～N number of (N is the positive integer more than or equal to 1) power supply unit, by system
When load l1 distributes to these power supply units, for power supply unit n, it is possible to use ln2=l1 × Xn/ L obtains power supply supply
The load of device n, l thereinn2 are the load that power supply unit n is allocated, XnFor the residual life parameter of power supply unit n,
Xn=100%-Ln1/Ln2, Ln1 is the prediction service life of power supply unit n, Ln2 is the standard operation longevity of power supply unit n
Life, L is the residual life parameter sum of power supply unit 1～N, L=X1+X2+···+XN。
As a example by two power supply units, the allocated load of power supply unit 1 is system load × power supply unit 1
Residual life parameter/(the residual life parameter of the residual life parameter+power supply unit 2 of power supply unit 1), power supply unit
The 1 allocated residual life parameter that load is system load × power supply unit 2/(residual life parameter of power supply unit 1
The residual life parameter of+power supply unit 2), wherein the residual life parameter of power supply unit 1 is 100%-power supply unit 1
The life-span factor, the life-span factor that residual life parameter is 100%-power supply unit 2 of power supply unit 2.
As a example by three power supply units, the allocated load of power supply unit 1 is system load × power supply unit 1
Residual life parameter/(residual life parameter+power supply unit 3 of the residual life parameter+power supply unit 2 of power supply unit 1
Residual life parameter), the allocated residual life parameter that load is system load × power supply unit 2 of power supply unit 2/
(the residual life ginseng of the residual life parameter+power supply unit 3 of the residual life parameter+power supply unit 2 of power supply unit 1
Amount), the allocated residual life parameter/(power supply unit 1 that load is system load × power supply unit 3 of power supply unit 3
The residual life parameter of residual life parameter+power supply unit 3 of residual life parameter+power supply unit 2), wherein power supply
The life-span factor that residual life parameter is 100%-power supply unit 1 of supply 1, the residual life parameter of power supply unit 2
For the life-span factor of 100%-power supply unit 2, the residual life parameter of power supply unit 3 is 100%-power supply unit 3
The life-span factor.
Fig. 4 show the structural representation of a kind of server that the embodiment of the present application provides, wherein, except containing in server
Have outside at least one power supply unit 401, also have a structure that
Temperature sensor 402, is used for gathering at least one power supply unit 401 respective work temperature in running
Degree.
Wherein, the work temperature of the power supply unit 401 that the operating temperature that temperature sensor 402 is gathered is on server
Degree.
Load monitor 403, is used for gathering the respective work in running of each described power supply unit 401 and bears
Carry.
Wherein, the work of the power supply unit 401 that the live load that load monitor 403 is gathered is on server is born
Carry.
Processing means 404, is connected with described temperature sensor 402 and described load monitor 403, for based on described
Operating temperature and live load, obtain the prediction service life of each described power supply unit 401 respectively.
Here processing means 404 can realize, such as FPGA by being able to carry out the apparatus assembly of above-mentioned functions
Devices such as (Field-Programmable Gate Array, i.e. field programmable gate arrays).
In one implementation, processing means 404 is additionally operable to: utilize each described power supply unit 401Obtain the prediction service life of described power supply unit 401；
Wherein, W (t) be the time be operating temperature during t, D (t) is to be the live load during t time, and T is described power supply
The history run time of supply 401 is long, and L1 is the prediction service life of described power supply unit 401.
In another implementation, described processing means 404 is additionally operable to: judge that the prediction of described power supply unit 401 runs
Whether the life-span meets the control condition preset, if described prediction service life meets described control condition, generates control instruction,
Described control instruction is used for pointing out detection information.
Concrete, described prediction service life meets described control condition and includes: described prediction service life and described electricity
The ratio value of the standard service life of source supply 401 is more than the first threshold preset and is less than the Second Threshold preset, or,
Described prediction service life is more than described Second Threshold, institute with the ratio value of the standard service life of described power supply unit 401
State Second Threshold more than described first threshold；
Accordingly, described processing means 404 is additionally operable to: at described prediction service life and described power supply unit 401
When the ratio value of standard service life is more than the first threshold preset and less than the Second Threshold preset, generate prompting the first detection
The control instruction of information；And at the ratio value of described prediction service life Yu the standard service life of described power supply unit 401
More than described Second Threshold, generate the control instruction of prompting the second detection information.
In another implementation, when described processing means 404 obtains the standard service life of described power supply unit 401,
Specifically for:
UtilizeObtain the standard service life of described power supply unit 401；
Wherein, W is the standard operating temperature of described power supply unit 401, and D is the standard work of described power supply unit 401
Loading, T is the specified long operational time that described power supply unit 401 runs with standard operating temperature and standard live load,
L2 is described standard service life.
In another implementation, described processing means 404 is additionally operable to:
Based on described operating temperature and live load, the prediction obtaining each described power supply unit 401 respectively runs
After life-span, based on each described power supply unit 401 respective prediction service life, by system load distribution to each described
Power supply unit 401 so that the load distributing to each described power supply unit 401 is directly proportional to life-span difference, the described life-span
Difference is the difference between the standard service life of power supply unit 401 and prediction service life.
In other realize, when described processing means 404 is the load of described power supply unit 401 distribution, specifically for:
Utilize ln2=l1 × Xn/ L obtains the load of described power supply unit 401, wherein:
ln2 is load allocated for power supply unit n, and l1 is system load, XnResidual life for power supply unit n is joined
Amount, L is the residual life parameter sum of power supply unit 1～N.
Fig. 5 show the structural representation of acquisition of a kind of life-span device that the embodiment of the present application provides, and wherein, device is permissible
Including following structure, to realize the prediction of the service life to power supply unit:
Acquisition module 501, is used for gathering at least one power supply unit respective operating temperature and work in running
Load.
Obtain module 502, for based on described operating temperature and live load, obtain each described power supply unit respectively
Prediction service life.
In one implementation, as shown in FIG. 6 a, described acquisition module 502 can obtain submodule 521 in fact by the life-span
Existing:
And the life-span obtains submodule, specifically for each described power supply unit being performed following operation:
UtilizeObtain the prediction service life of described power supply unit；
Wherein, W (t) be the time be operating temperature during t, D (t) is to be the live load during t time, and T is described power supply
The history run time of supply is long, and L1 is the prediction service life of described power supply unit.
As shown in Figure 6b, described device can also include following structure:
Judge module 503, for judging whether the prediction service life of described power supply unit meets the control strip preset
Part, if described prediction service life meets described control condition, operating instruction generation module 504；
Directive generation module 504, is used for generating control instruction, and described control instruction is used for pointing out detection information.
Described prediction service life meets described control condition and includes: described prediction service life and described power supply unit
Standard service life ratio value more than preset first threshold and less than preset Second Threshold, or, described prediction fortune
The row life-span is more than described Second Threshold with the ratio value of the standard service life of described power supply unit, and described Second Threshold is more than
Described first threshold；
As shown in the figure 6c, described directive generation module 504 can be realized by following structure:
First generates submodule 541, for running the longevity in the standard of described prediction service life with described power supply unit
When the ratio value of life is more than the first threshold preset and less than the Second Threshold preset, generate the control of prompting the first detection information
Instruction；
Second generates submodule 542, for running the longevity in the standard of described prediction service life with described power supply unit
The ratio value of life, more than described Second Threshold, generates the control instruction of prompting the second detection information.
As illustrated in fig. 6d, described device can also include following structure:
Standard obtains module 505, is used for utilizingObtain the standard service life of described power supply unit；
Wherein, W is the standard operating temperature of described power supply unit, and D is the standard live load of described power supply unit,
T is the specified long operational time that described power supply unit runs with standard operating temperature and standard live load, and L2 is described mark
Quasi-service life.
As illustrated in figure 6e, described device can also include:
Load distribution module 506, for based on each described power supply unit respective prediction service life, bears system
Carry distribution to each described power supply unit so that distribute to the load of each described power supply unit and the pre-of power supply unit
Survey service life and there is default corresponding relation.
Here corresponding relation can be: the residual life that the load of power supply unit distribution is corresponding with prediction service life
Parameter is directly proportional, and described residual life parameter is 100% difference deducting the life-span factor, and the described life-span factor is power supply unit
The ratio of prediction service life and standard service life.
As shown in Fig. 6 f, the described load distribution module 506 in described device can be realized by following structure:
Load obtains submodule 561, is used for utilizing ln2=l1 × Xn/ L obtains the load of power supply unit n, wherein:
ln2 is load allocated for power supply unit n, and l1 is system load, XnResidual life for power supply unit n is joined
Amount, L is the residual life parameter sum of power supply unit 1～N.
Fig. 7 show the structural representation of a kind of electronic equipment that the embodiment of the present application provides, wherein, described electronic equipment
Can be the electrical equipments such as server, electronic equipment be connected with at least one power supply unit, and these power supply units are clothes
Apparatus assembly on the business electrical equipment such as device, in the present embodiment, described electronic equipment can include following structure:
Memorizer 701, is used for storing application program and described application program runs produced data；
Processor 702, is used for running described application program to realize following functions:
Gather at least one power supply unit respective operating temperature and live load in running, based on described work
Make temperature and live load, obtain the prediction service life of each described power supply unit respectively.
In one implementation, described processor 702 is additionally operable to: utilize each described power supply unitObtain the prediction service life of described power supply unit；
Wherein, W (t) be the time be operating temperature during t, D (t) is to be the live load during t time, and T is described power supply
The history run time of supply is long, and L1 is the prediction service life of described power supply unit.
In another implementation, described processor 702 is additionally operable to: the prediction service life judging described power supply unit is
The no satisfied control condition preset, if described prediction service life meets described control condition, generates control instruction, described control
Instruction processed is used for pointing out detection information.
In another implementation, described prediction service life meets described control condition and includes: described prediction service life
More than the first threshold preset and it is less than the Second Threshold preset with the ratio value of the standard service life of described power supply unit,
Or, described prediction service life is more than described Second Threshold with the ratio value of the standard service life of described power supply unit,
Described Second Threshold is more than described first threshold；
Accordingly, described processor 702 is additionally operable to: in the standard fortune of described prediction service life with described power supply unit
When the ratio value in row life-span is more than the first threshold preset and less than the Second Threshold preset, generate prompting the first detection information
Control instruction；
Ratio value in described prediction service life with the standard service life of described power supply unit is more than described second
Threshold value, generates the control instruction of prompting the second detection information.
And in another implementation, when described processor 702 obtains the standard service life of described power supply unit, specifically
For:
UtilizeObtain the standard service life of described power supply unit；
Wherein, W is the standard operating temperature of described power supply unit, and D is the standard live load of described power supply unit,
T is the specified long operational time that described power supply unit runs with standard operating temperature and standard live load, and L2 is described mark
Quasi-service life.
In other realize, described processor 702 is additionally operable to:
Based on described operating temperature and live load, obtain the prediction service life of each described power supply unit respectively
Afterwards, based on each described power supply unit respective prediction service life, system load distribution is supplied to each described power supply
Answering device so that the load distributing to each described power supply unit is directly proportional to life-span difference, described life-span difference is that power supply supplies
Answer the difference between the standard service life of device and prediction service life.
Concrete, when described processor 702 is the load of described power supply unit distribution, specifically for:
Utilize ln2=l1 × Xn/ L obtains the load of described power supply unit, wherein:
ln2 is load allocated for power supply unit n, and l1 is system load, XnResidual life for power supply unit n is joined
Amount, L is the residual life parameter sum of power supply unit 1～N.
In implementing, processor 702 can be BMC (baseboard management controller, substrate
Management Controller) realize, say, that in the present embodiment, each power supply unit being connected with electronic equipment is by relevant parameter
Or state such as operating temperature and live load etc. are delivered to electronic equipment, BMC the implementation in the present embodiment is utilized to obtain
The prediction service life of each power supply unit, and judge that life-span of power supply unit is whether close to the limit and need to change electricity
Source supply, and then report to the police to user or user, causes the server cannot be properly functioning in the damage avoiding power supply unit
On the premise of making user operation loss, it is possible to increase the accuracy of prediction, it is further ensured that server reliability of operation,
The operation avoiding user is lost.
Further, in the present embodiment, BMC prediction service life based on each power supply unit obtained, can obtain
To the residual parameters of power supply unit, and then carrying out the distribution of system load, the output thus controlling each power supply unit is born
Carry, increase the reliability of server.
It addition, in the present embodiment, it is not necessary to increase extra nextport hardware component NextPort or parts to realize such scheme, but
BMC writes corresponding algorithm or code realizes, extra cost will not be increased.
It should be noted that each embodiment in this specification all uses the mode gone forward one by one to describe, each embodiment weight
Point explanation is all the difference with other embodiments, and between each embodiment, identical similar part sees mutually.
Finally, in addition it is also necessary to explanation, in this article, the relational terms of such as first and second or the like be used merely to by
One entity or operation separate with another entity or operating space, and not necessarily require or imply these entities or operation
Between exist any this reality relation or order.And, term " includes ", " comprising " or its any other variant meaning
Containing comprising of nonexcludability, so that include that the process of a series of key element, method, article or equipment not only include that
A little key elements, but also include other key elements being not expressly set out, or also include for this process, method, article or
The key element that equipment is intrinsic.In the case of there is no more restriction, statement " including ... " key element limited, do not arrange
Except there is also other identical element in including the process of described key element, method, article or equipment.
Above a kind of life-span preparation method, device, electronic equipment and server provided herein are carried out in detail
Introduce, the described above to the disclosed embodiments, make professional and technical personnel in the field be capable of or use the application.To this
The multiple amendment of a little embodiments will be apparent from for those skilled in the art, as defined herein typically
Principle can realize in the case of without departing from spirit herein or scope in other embodiments.Therefore, the application will not
Can be intended to be limited to the embodiments shown herein, and be to fit to consistent with principles disclosed herein and features of novelty
The widest scope.
Claims (18)
1. a life-span preparation method, including:
Gather at least one power supply unit respective operating temperature and live load in running；
Based on described operating temperature and live load, obtain the prediction service life of each described power supply unit respectively.
Method the most according to claim 1, it is characterised in that based on described operating temperature and live load, it is thus achieved that each
The prediction service life of described power supply unit, including:
To each described power supply unit execution following steps:
UtilizeObtain the prediction service life of described power supply unit；
Wherein, W (t) be the time be operating temperature during t, D (t) is to be the live load during t time, and T is described power supply supply
The history run time of device is long, and L1 is the prediction service life of described power supply unit.
Method the most according to claim 1 and 2, it is characterised in that also include:
Judge whether the prediction service life of described power supply unit meets the control condition preset；
If described prediction service life meets described control condition, generating control instruction, described control instruction is used for pointing out inspection
Measurement information.
Method the most according to claim 3, it is characterised in that described prediction service life meets described control condition bag
Include: the ratio value of the standard service life of described prediction service life and described power supply unit more than the first threshold preset and
Less than the Second Threshold preset, or, the ratio of the standard service life of described prediction service life and described power supply unit
Value is more than described first threshold more than described Second Threshold, described Second Threshold；
Described generation control instruction, including:
Ratio value in described prediction service life with the standard service life of described power supply unit is more than the first threshold preset
When being worth and be less than the Second Threshold preset, generate prompting first and detect the control instruction of information；
Ratio value in described prediction service life with the standard service life of described power supply unit is more than described Second Threshold,
Generate the control instruction of prompting the second detection information.
Method the most according to claim 4, it is characterised in that the standard service life of described power supply unit is by following
Mode obtains:
UtilizeObtain the standard service life of described power supply unit；
Wherein, W is the standard operating temperature of described power supply unit, and D is the standard live load of described power supply unit, and T is
The specified long operational time that described power supply unit runs with standard operating temperature and standard live load, L2 is described standard fortune
The row life-span.
Method the most according to claim 1 and 2, it is characterised in that described based on described operating temperature and live load,
After obtaining the prediction service life of each described power supply unit respectively, also include:
Based on each described power supply unit respective prediction service life, by system load distribution to each described power supply supply
Device so that the prediction service life of the load and described power supply unit of distributing to each described power supply unit has default
Corresponding relation.
Method the most according to claim 6, it is characterised in that the load of described power supply unit runs the longevity with described prediction
The residual life parameter of life correspondence is directly proportional, and described residual life parameter is 100% difference deducting the life-span factor, the described life-span
The factor is the prediction service life ratio with standard service life of power supply unit.
Method the most according to claim 7, it is characterised in that the load that described power supply unit is allocated utilizes ln2=l1
×Xn/ L obtains, wherein:
ln2 is load allocated for power supply unit n, and l1 is system load, XnFor the residual life parameter of power supply unit n, L
Residual life parameter sum for power supply unit 1～N.
9. a server, including:
Temperature sensor, is used for gathering at least one power supply unit respective operating temperature in running；
Load monitor, is used for gathering each described power supply unit respective live load in running；
Processing means, is connected with described temperature sensor and described load monitor, for based on described operating temperature and work
Load, obtain the prediction service life of each described power supply unit respectively.
Server the most according to claim 9, it is characterised in that described processing means specifically for: to each described electricity
Source supply utilizesObtain the prediction service life of described power supply unit；
Wherein, W (t) be the time be operating temperature during t, D (t) is to be the live load during t time, and T is described power supply supply
The history run time of device is long, and L1 is the prediction service life of described power supply unit.
11. according to the server described in claim 9 or 10, it is characterised in that described processing means is additionally operable to: judge described electricity
Whether the prediction service life of source supply meets the control condition preset, if described prediction service life meets described control
Condition, generates control instruction, and described control instruction is used for pointing out detection information.
12. servers according to claim 11, it is characterised in that described prediction service life meets described control condition
Including: described prediction service life is more than, with the ratio value of the standard service life of described power supply unit, the first threshold preset
And less than the Second Threshold preset, or, the ratio of described prediction service life and the standard service life of described power supply unit
Example value is more than described Second Threshold, and described Second Threshold is more than described first threshold；
Described processing means specifically for: at the ratio of described prediction service life with the standard service life of described power supply unit
When example value is more than the first threshold preset and less than the Second Threshold preset, generate the control instruction of prompting the first detection information；
Ratio value in described prediction service life with the standard service life of described power supply unit is more than described Second Threshold,
Generate the control instruction of prompting the second detection information.
13. servers according to claim 12, it is characterised in that described processing means obtains described power supply unit
During standard service life, specifically for:
UtilizeObtain the standard service life of described power supply unit；
Wherein, W is the standard operating temperature of described power supply unit, and D is the standard live load of described power supply unit, and T is
The specified long operational time that described power supply unit runs with standard operating temperature and standard live load, L2 is described standard fortune
The row life-span.
14. according to the server described in claim 9 or 10, it is characterised in that described processing means is additionally operable to:
Based on described operating temperature and live load, obtain respectively each described power supply unit prediction service life it
After, based on each described power supply unit respective prediction service life, by system load distribution to each described power supply supply
Device so that the prediction service life of the load and described power supply unit of distributing to each described power supply unit has default
Corresponding relation.
15. servers according to claim 14, it is characterised in that described processing means is the distribution of described power supply unit
Load the life-span difference corresponding with described prediction service life be directly proportional, described life-span difference be power supply unit standard transport
Difference between row life-span and prediction service life.
16. servers according to claim 15, it is characterised in that described processing means is the distribution of described power supply unit
Load time, specifically for:
Utilize ln2=l1 × Xn/ L obtains the load of described power supply unit, wherein:
ln2 is load allocated for power supply unit n, and l1 is system load, XnFor the residual life parameter of power supply unit n, L
Residual life parameter sum for power supply unit 1～N.
17. 1 kinds of life-spans obtain device, including:
Acquisition module, is used for gathering at least one power supply unit respective operating temperature and live load in running；
Obtain module, for based on described operating temperature and live load, obtain the prediction of each described power supply unit respectively
Service life.
18. 1 kinds of electronic equipments, including memorizer and processor, wherein:
Described memorizer, is used for storing application program and described application program runs produced data；
Described processor, is used for running described application program to realize following functions:
Gather at least one power supply unit respective operating temperature and live load in running, based on described work temperature
Degree and live load, obtain the prediction service life of each described power supply unit respectively.
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