CN106291132A - Embedding on-chip antenna gain test method and system are gone based on single port calibration probe - Google Patents

Embedding on-chip antenna gain test method and system are gone based on single port calibration probe Download PDF

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Publication number
CN106291132A
CN106291132A CN201610767631.5A CN201610767631A CN106291132A CN 106291132 A CN106291132 A CN 106291132A CN 201610767631 A CN201610767631 A CN 201610767631A CN 106291132 A CN106291132 A CN 106291132A
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China
Prior art keywords
antenna
probe
chip antenna
single port
embedding
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CN201610767631.5A
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Chinese (zh)
Inventor
赵锐
王亚海
杜刘革
常庆功
胡大海
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CETC 41 Institute
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CETC 41 Institute
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Priority to CN201610767631.5A priority Critical patent/CN106291132A/en
Publication of CN106291132A publication Critical patent/CN106291132A/en
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/10—Radiation diagrams of antennas

Abstract

The invention discloses and go embedding on-chip antenna gain test method based on single port calibration probe, including, step 1: transmitting terminal connection standard antenna, receiving terminal connects reception antenna；Step 2: gather the radiation signal that standard antenna receives, and store；Step 3: standard antenna of dismantling, and the port (vector network analyzer end) between vector network analyzer and standard antenna do single port calibration, afterwards this port linking probe and probe port do single port calibration；Step 4: tested on-chip antenna is fed, the signal that on breadload, aerial radiation goes out, and store；Step 5: utilize the signal of described step 2 and the standard antenna of step 4 storage and on-chip antenna collection to obtain the gain data of on-chip antenna.Can effectively solve, owing to probe is used for multiple times the problem causing probe Insertion Loss to change, accurately to measure the actual Insertion Loss value of probe, and then improve the gain test precision of tested on-chip antenna.

Description

Embedding on-chip antenna gain test method and system are gone based on single port calibration probe
Technical field
The present invention relates to the technical field of performance test of antenna, particularly relate to go on embedding sheet based on single port calibration probe Aerial gain test method and system.
Background technology
The development of integrated circuit (ICs) is the swiftest and the most violent in recent years.The size of transistor constantly reduces, the operating frequency limit Constantly increasing, circuit integration degree is constantly strengthened, and manufacturing process constantly improves, and power consumption constantly reduces, these It is all the power promoting integrated circuit development.RF IC is the same with digital integrated electronic circuit, have also been obtained huge Development, multi-standard, the wireless transceiver system of multiband has been developed, on the other hand, the integrated electricity of monolithic microwave of millimere-wave band (MMIC) has been widely used in radar and communications system on road.Millimeter wave frequency band has the widest bandwidth, it is generally recognized that millimeter Ripple thinks the electromagnetic wave of 26.5GHz-300GHz, and bandwidth is up to 273.5GHz, exceedes ten times of whole bandwidth from direct current to microwave. Even if propagate in an atmosphere, it is considered in the case of Atmospheric Absorption, four primary window can only using (35GHz, 94GHz, 140GHz, 220GHz) total bandwidth can also reach 135GHz.Millimetre-wave circuit many employings GaAs before or InP-base technique, Owing to these materials of GaAs and InP have higher electron mobility and resistivity, therefore circuit can obtain good RF performance, But a disadvantage is that the relatively costly of these techniques.The point-to-point connection of Gigabit-rate, vast capacity WLAN (WLAN) the broadband communications application at a high speed such as short-range high speed personal area metworking (WPAN) demand commercially is just Constantly expanding, at this time design realizes the millimeter-wave monolithic microwave collection with high integration, low-power consumption, high-performance and low cost Become circuit (MMIC) to be only and comply with trend.Silicon (Si) base CMOS technology has low cost, low in energy consumption and can relatively hold The advantages such as easy and baseband I C module manufacturing process is compatible.On the circuit manufactured, although CMOS technology is compared with GaAs technique Advantage is not had in terms of high frequency performance and noiseproof feature, but, along with the day by day maturation of deep-submicron with nanometer technology, if Count and realize Millimeter-wave CMOS circuit and have become as possibility.And on-chip antenna the most just becomes interconnection in sheet, the one of communication between sheet Inevitable choice.
Any antenna can use characteristic parameter to assess the performance of antenna.The characterisitic parameter of antenna includes that antenna hinders Anti-, directional characteristic, gain, polarization and the pattern characteristics of antenna.These characterisitic parameters of antenna determine the quality of antenna And the application scenario of antenna and the scope of application, so, in order to check the performance quality of on-chip antenna in research and development and production process, Also must test the performance parameter of on-chip antenna, one of them important indicator is exactly gain.
Gain characterizes the ability of day bundle of lines defeated people power concentrated radiation quantitatively, shows that antenna is towards specific direction sending and receiving The quality of electromagnetic information, is one of antenna most important telecommunication index, is also to analyze isolation, intersection between antenna, antenna array Other indispensable instruments of electromagnetic performance parameter such as polarization ratio.Improve antenna gain and can determine that direction expands electric wave a certain Coverage, increasing action distance and strengthening power.Therefore, antenna gain, the particularly design of standard gain antenna, test and Demarcate in dual-use practice, have stronger current demand and higher engineering significance.
The various test of antenna gain substantially can be divided into absolute method and relative method two class.Absolute method is surveyed antenna gain and is needed Consider the measuring distance between the test Insertion Loss of feeder line, antenna to be measured and inspection antenna and affect numerous error sources of measuring accuracy.
Friis transmission formula is antenna gain test and the theoretical basis demarcated.It elaborates that shown in Fig. 1,2 are in spoke Penetrating far field, arbitrarily polarize, any maximum points to, and makees the port B launching inspection antenna and makees to receive antenna to be measured (AUT) port Energy transitive relation between C.
But, the far field test of antenna gain is typically difficult to accurately repeat, and is also not frequently used energy meter and extracts port B's Output PTInput power P with port CR.And be easy to get, the output P of signal source port AoutAnd receiver Defeated people's power P of port Din.In antenna gain far field test now, signal source and receiver often unite two into one as vector net Network analyser.Then, it is simple to the gain design of engineer applied and the Friis transmission formula of demarcation can be revised as
P i n = q · ( λ 4 π · r ) MG R G T η R η T P o u t - - - ( 1 )
In formula: q is the polarization mismatch coefficient between dual-mode antenna, when dual-mode antenna is pure linear polarization, q=cos2δ, δ are for receiving Send out the angle in (polarization) direction between antenna current；λ is operation wavelength；R is dual-mode antenna spacing；GTGRIt is respectively reception antenna And transmitter antenna gain (dBi).They are the three-dimensional functions of respective local coordinate direction in space；ηTFor connectivity port A, launch between B The slotting people loss of feeder lineηRFor connectivity port C, between D, receive the slotting people of feeder line LossM is dual-mode antenna port B, the modifying factor that C induces one because of signaling reflex. If signal source is mated with reception feeder line, i.e. with transmitting feeder line, receiver
M = ( 1 - | Γ R | 2 ) · ( 1 - | Γ T | 2 ) - - - ( 2 )
Then formula (1) just takes the form of usual Friis transmission formula.
Assume: Fig. 1 checks at B antenna A to be measured at antenna T Yu C0It is right that the maximum of (or standard gain antenna S) points to Accurate, polarization coupling, spacing are fixed；During gain test, the output of signal source power is constant.
Relative method-relative method
Linear polarized antenna gain generally uses " relative method " i.e. relative method to test: inspection antenna T will launch feeder line note at B The constant frequency of people and the signal of power are launched.Respectively antenna A0 to be measured adjacent at C and standard are increased with same reception feeder line Benefit antenna S receives.If the reception power of the receiver port D that 2 tests obtain is respectively PAin and PSin.Then by formula (1) Can obtain, it is considered to test feeder line is inserted people's loss and transmits the expression that mismatch is different from the antenna A0 gain G to be measured of textbook
G = 10 lg ρ s ( ρ A + 1 ) 2 ( ρ s + 1 ) 2 ρ A + ( G s + P S i n - P A i n ) - - - ( 3 )
In formula: ρsρABeing respectively the standing-wave ratio of S, A0 input end, Gs is the gain of S.
Relative method gain test system schematic is as shown in Figure 2.
Absolute method-biphase same antenna method
The absolute method test of two identical antenna A0 gain G to be measured, uses any of which antenna to make to launch, and another antenna connects Receive.After correction, the gain G of A0 can be obtained by formula (1)
G = 10 lg [ 4 π · r λ ( ρ A + 1 ) 2 4 ρ A ] + 1 2 ( P i n - P o u t + L T + L R ) - - - ( 4 )
Biphase same antenna method gain test system schematic is as shown in Figure 3.
Both the above typical antenna gain test method is all based on conventional antenna interface feed basis, and direct method test needs Measure transmitting antenna and the power of reception antenna interface end, calculate two same antennas in conjunction with Friis transmission formula Gain；Relative method needs to demarcate standard antenna, more relatively tests with antenna to be measured replacement standard antenna, but phase For on-chip antenna, these two kinds of methods can not carry out Validity Test due to the difference of on-chip antenna feeding classification.
Summary of the invention
The purpose of the present invention is contemplated to solve the problems referred to above, it is provided that remove embedding on-chip antenna based on single port calibration probe Gain test method and system, can effectively solve owing to probe is used for multiple times the problem causing probe Insertion Loss to change, accurately measure The actual Insertion Loss value of probe, and then improve the gain test precision of tested on-chip antenna.
To achieve these goals, the present invention adopts the following technical scheme that
Embedding on-chip antenna gain test method is gone based on single port calibration probe, including,
Step 1: transmitting terminal connects the standard antenna of known gain, receiving terminal connects reception antenna；
Step 2: gather the radiation signal that standard antenna receives, and store；
Step 3: standard antenna of dismantling, and the vector network analyzer end between vector network analyzer and standard antenna Mouth do single port calibration, afterwards this port linking probe and probe port do single port calibration；
Step 4: tested on-chip antenna is fed, the signal that on breadload, aerial radiation goes out, and store；
Step 5: utilize the signal of described step 2 and the standard antenna of step 4 storage and on-chip antenna collection to obtain on sheet The gain data of antenna.
Described step 1 controls turntable after completing and moves by setup program.
In described step 4, use probe that tested on-chip antenna is fed.
In described step 4, utilize the signal that on reception antenna breadload, aerial radiation goes out.
In described step 5, utilizing standard antenna and the signal of twice collection of on-chip antenna, the Insertion Loss getting rid of probe obtains The gain data of on-chip antenna.
Testing under frequency sweep mode, test frequency number is many, and one-shot measurement can obtain the gain data of full frequency band.
Use the described system going embedding on-chip antenna gain test method based on single port calibration probe, including master control meter Calculation machine, described main control computer is connected with vector network analyzer and turntable controller, described vector network analyzer and millimeter Ripple controls machine and connects, and described millimeter wave controls machine and is connected with millimeter wave series T/R test module, and described millimeter wave series T/R is surveyed Die trial block is connected with probe, and the microwave and millimeter wave signal of generation is fed to on-chip antenna by described probe；Also include receiver module, Aerial radiation microwave and millimeter wave signal out on described receiver module receiving sheet, and deliver in vector network analyzer.
Described receiver module includes that reception antenna, described reception antenna are fixed on turntable.
Described turntable includes azimuth plane rotation platform and pitching face rotation platform, described azimuth plane rotation platform and pitching face Rotation platform is all connected with turntable controller, and described turntable controller is connected with described main control computer.
Described pitching face rotation platform rotates around on-chip antenna, keeps reception antenna and on-chip antenna during rotation Reception and transmission range constant.
Beneficial effects of the present invention:
The present invention utilizes Antenna testing system respectively in the case of being not connected with probe and linking probe two kinds, respectively at vector Network Analyzer port and probe port do single port calibration, accurately obtain probe Insertion Loss data, efficiently solve utilization relatively Method carries out the uncertain problem of probe Insertion Loss during gain calibration to on-chip antenna, substantially increases sheet based on probe feed heaven The measuring accuracy of line gain.
Accompanying drawing explanation
Fig. 1 is antenna gain test philosophy；
Fig. 2 is relative method gain test system schematic；
Fig. 3 is two antennas identical method gain test system schematic；
Fig. 4 be the present invention based on probe feed gain test system schematic.
Fig. 5 is the test particular flow sheet of the present embodiment.
Detailed description of the invention
The invention will be further described with embodiment below in conjunction with the accompanying drawings.
As it is shown on figure 3, go the system of embedding on-chip antenna gain test method based on single port calibration probe, including master control Computer, described main control computer is connected with vector network analyzer and turntable controller, described vector network analyzer and milli Metric wave controls machine and connects, and described millimeter wave controls machine and is connected with millimeter wave series T/R test module, described millimeter wave series T/R Test module is connected with probe, and the microwave and millimeter wave signal of generation is fed to on-chip antenna by described probe；Also include receiving mould Block, aerial radiation microwave and millimeter wave signal out on described receiver module receiving sheet, and deliver in vector network analyzer.
Described receiver module includes that reception antenna, described reception antenna are fixed on turntable.Described turntable includes azimuth plane Rotation platform and pitching face rotation platform, described azimuth plane rotation platform and pitching face rotation platform are all with turntable controller even Connecing, described turntable controller is connected with described main control computer.Described pitching face rotation platform rotates around on-chip antenna, rotates During keep the reception and transmission range of reception antenna and on-chip antenna constant.
Under the control of main control computer, vector network analyzer produce microwave and millimeter wave signal by emission port, After cable, waveguide assemblies, probe, it is fed to on-chip antenna；Receiver module is placed on far-end, and is fixed on turntable, receives mould Block utilizes aerial radiation microwave and millimeter wave signal out on the reception antenna receiving sheet being fixed thereon, by microwave cable and rotation Turning joint etc. and deliver in vector network analyzer, it is achieved the reception of signal, turret systems passes through pitching face rotation platform around sheet Upper antenna rotate, during rotation keep reception and transmission range constant, by test on-chip antenna certain angle in the range of amplitude, Phase information, can complete the index test such as directional diagram, gain.
As it is shown in figure 5, utilize this system to carry out based on single port calibration probe go embedding on-chip antenna gain test method Detailed process include:
(1) correct connecting test instrument and equipment and cable, it is ensured that each connection equipment is working properly；
(2) at transmitting terminal connection standard antenna, receiving terminal connects reception antenna；
(3) by test software design patterns instrument parameter, make turntable follow procedure set rule and move；
(4) gather, by data acquisition software, the radiation signal that standard antenna receives, and store；
(5) dismantle standard antenna, and the port (vector network analyzer between vector network analyzer and standard antenna End) do single port calibration, afterwards this port linking probe and probe port do single port calibration；
(6) use probe that tested on-chip antenna is fed, utilize the letter that on reception antenna breadload, aerial radiation goes out Number, and store；
(7) utilizing standard antenna and the signal of twice collection of on-chip antenna, the Insertion Loss getting rid of probe i.e. can get on sheet The gain data of antenna.
The a kind of of present invention proposition goes embedding on-chip antenna gain test method based on single port calibration probe, utilizes and is visiting Pin output port and vector network analyzer port carry out single port calibration respectively, accurately obtain probe Insertion Loss data, and utilizing should Insertion Loss data substitute into system radio frequency link, can accurately obtain on-chip antenna gain parameter.
(1) measuring accuracy is high: calibrate, accurately by doing single port at vector network analyzer port and probe port respectively Obtain probe Insertion Loss data, and then obtain result of calculation accurately when calculating on-chip antenna gain；
(2) calibration is convenient: can calibrate under frequency sweep mode, and test frequency number is many, and primary calibration measurement is the most available The gain data of full frequency band；
The present invention utilizes the mode carrying out single port calibration at vector network analyzer port and probe output port respectively, Accurately measure the method obtaining probe Insertion Loss data；Utilize Antenna testing system based on probe station structure that on-chip antenna is carried out The transmitting of radiation signal and acquisition.
Although the detailed description of the invention of the present invention is described by the above-mentioned accompanying drawing that combines, but not the present invention is protected model The restriction enclosed, one of ordinary skill in the art should be understood that on the basis of technical scheme, and those skilled in the art are not Need to pay various amendments or deformation that creative work can make still within protection scope of the present invention.

Claims (10)

1. go embedding on-chip antenna gain test method based on single port calibration probe, it is characterized in that, including,
Step 1: transmitting terminal connects the standard antenna of known gain, receiving terminal connects reception antenna；
Step 2: gather the radiation signal that standard antenna receives, and store；
Step 3: standard antenna of dismantling, and the vector network analyzer port between vector network analyzer and standard antenna does Single port calibrate, afterwards this port linking probe and probe port do single port calibration；
Step 4: tested on-chip antenna is fed, the signal that on breadload, aerial radiation goes out, and store；
Step 5: utilize the signal of described step 2 and the standard antenna of step 4 storage and on-chip antenna collection to obtain on-chip antenna Gain data.
2. go embedding on-chip antenna gain test method based on single port calibration probe as claimed in claim 1, it is characterized in that, institute State control turntable after step 1 completes to move by setup program.
3. go embedding on-chip antenna gain test method based on single port calibration probe as claimed in claim 1, it is characterized in that, institute State in step 4, use probe that tested on-chip antenna is fed.
4. go embedding on-chip antenna gain test method based on single port calibration probe as claimed in claim 1, it is characterized in that, institute State in step 4, utilize the signal that on reception antenna breadload, aerial radiation goes out.
5. go embedding on-chip antenna gain test method based on single port calibration probe as claimed in claim 1, it is characterized in that, institute Stating in step 5, utilize standard antenna and the signal of twice collection of on-chip antenna, the Insertion Loss getting rid of probe obtains on-chip antenna Gain data.
6. go embedding on-chip antenna gain test method based on single port calibration probe as claimed in claim 1, it is characterized in that, Testing under frequency sweep mode, test frequency number is many, and one-shot measurement can obtain the gain data of full frequency band.
7. use the system going embedding on-chip antenna gain test method described in claim 1 based on single port calibration probe, its Feature is, including main control computer, described main control computer is connected with vector network analyzer and turntable controller, described vector Network Analyzer controls machine with millimeter wave and is connected, and described millimeter wave controls machine and is connected with millimeter wave series T/R test module, described Millimeter wave series T/R test module is connected with probe, and the microwave and millimeter wave signal of generation is fed to on-chip antenna by described probe； Also include receiver module, aerial radiation microwave and millimeter wave signal out on described receiver module receiving sheet, and deliver to vector net In network analyser.
8. system as claimed in claim 7, is characterized in that, described receiver module includes reception antenna, and described reception antenna is solid It is scheduled on turntable.
9. system as claimed in claim 8, is characterized in that, described turntable includes azimuth plane rotation platform and pitching face rotary flat Platform, described azimuth plane rotation platform and pitching face rotation platform be all connected with turntable controller, and described turntable controller is with described Main control computer connects.
10. system as claimed in claim 9, is characterized in that, described pitching face rotation platform rotates around on-chip antenna, rotates During keep the reception and transmission range of reception antenna and on-chip antenna constant.
CN201610767631.5A 2016-08-30 2016-08-30 Embedding on-chip antenna gain test method and system are gone based on single port calibration probe Pending CN106291132A (en)

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CN107944530A (en) * 2017-11-16 2018-04-20 国网安徽省电力公司电力科学研究院 A kind of calibration method of electric label-sensitivity test
CN108414844A (en) * 2018-03-15 2018-08-17 上海民航华东空管工程技术有限公司 A kind of test method of target antenna radiation pattern
CN109478937A (en) * 2017-01-22 2019-03-15 华为技术有限公司 Channel calibration method and device
CN110308334A (en) * 2019-05-31 2019-10-08 西安空间无线电技术研究所 A kind of rotary joint standing wave when Insertion Loss test method
CN113111524A (en) * 2021-04-21 2021-07-13 北京航空航天大学 Antenna isolation degree prediction method based on receiving and transmitting antenna far field test data, storage medium and device
CN114252708A (en) * 2022-03-01 2022-03-29 陕西拾贝通讯技术有限公司 Automatic calibration method for antenna gain with controllable precision
CN114280382A (en) * 2021-12-27 2022-04-05 中国电子科技集团公司第三十八研究所 Test system and test method for automatically correcting spherical near-field antenna

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CN113111524B (en) * 2021-04-21 2021-09-21 北京航空航天大学 Antenna isolation degree prediction method based on far field test, storage medium and device
CN114280382A (en) * 2021-12-27 2022-04-05 中国电子科技集团公司第三十八研究所 Test system and test method for automatically correcting spherical near-field antenna
CN114280382B (en) * 2021-12-27 2023-06-27 中国电子科技集团公司第三十八研究所 Automatic spherical near field antenna correction test system and test method thereof
CN114252708A (en) * 2022-03-01 2022-03-29 陕西拾贝通讯技术有限公司 Automatic calibration method for antenna gain with controllable precision
CN114252708B (en) * 2022-03-01 2022-05-17 陕西拾贝通讯技术有限公司 Automatic calibration method for antenna gain with controllable precision

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Application publication date: 20170104