CN106249059A - Image synchronization display system based on on-chip antenna feed and method - Google Patents
Image synchronization display system based on on-chip antenna feed and method Download PDFInfo
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- CN106249059A CN106249059A CN201610709311.4A CN201610709311A CN106249059A CN 106249059 A CN106249059 A CN 106249059A CN 201610709311 A CN201610709311 A CN 201610709311A CN 106249059 A CN106249059 A CN 106249059A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/10—Radiation diagrams of antennas
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Abstract
The invention discloses a kind of image synchronization display system based on on-chip antenna feed and method, including operation room and darkroom, in described operation room, be provided with control rack；It is provided with microscopy device in described darkroom, is used for showing micro-image and the standing-wave ratio test curve that on-chip antenna feeds；Described microscopy device side is provided with a probe station, described probe station is provided with probe base, probe base side is provided with two horizon bars, and a horizon bar is provided with prevention at radio-frequency port, and described prevention at radio-frequency port is connected with the instrument system basic module controlling rack by radio-frequency cable；The other end of another horizon bar is provided with on-chip antenna, and described on-chip antenna is provided with probe, and described probe is connected with prevention at radio-frequency port.The present invention realizes operator can observe the actual detection position of probe intuitively, the most also can judge whether what probe pricked puts in place by test curve auxiliary operation person, it is to avoid damage probe, reduce testing cost.
Description
Technical field
The present invention relates to on-chip antenna feeding technique field, a kind of image synchronization based on on-chip antenna feed shows
Show system and method.
Background technology
In recent years, along with high frequency technique and the development of antenna technology, the upper frequency limit of antenna is more and more higher, and corresponding size is also
More and more less, and progressively develop towards miniaturization direction, feeding classification is also converted to micro-strip transmission by conventional coaxial, waveguide mode
Linear formula, distributing point is the most small.During sheet mo(u)ld top half antenna measurement, need to use probe feed, owing to distributing point is non-
The least, particularly at millimeter wave frequency band, owing to millimeter wave probe tip is less, use traditional binocular microscope to be difficult to differentiate
Go out between probe and measured piece whether good contact, under probe, press safety travel the most all at several microns～tens micrometer ranges,
Only by naked eyes, probe displacement is differentiated, it is difficult to ensure that the multiple needle point of probe carries out good contact with measured piece simultaneously,
Easily causing operator's maloperation and damage probe, and probe is expensive, the damage to probe can be greatly increased research and development
And the cost produced, reduce exploitation and production efficiency.
At present, the domestic people of having utilizes standard probe platform to build simple on-chip antenna test system, as it is shown in figure 1, in standard
Carry out on probe station calibration can test days line impedence index, utilize reception antenna movement on arcuate frame can carry out antenna direction
Figure test.But carrying out the premise that antenna index accurately measures is well to feed between probe and on-chip antenna.Fig. 1 utilizes binocular
Microscope is observed, and does not has other to can determine whether the foundation of good contact between probe and antenna.By reception antenna half
Move on circular type frame track, utilize test software and vector network analyzer to can get certain polarization of on-chip antenna upper half-space
The directional diagram of tangent plane, now, operator are feeding by microscope when, it is impossible to observe due between probe and antenna
Contact and on vector network analyzer produce test curve change.
In order to realize the performance test of on-chip antenna, there is people that standard probe platform has carried out Curve guide impeller, and binocular is shown
Micro mirror is replaced, and defines test system schema as shown in Figure 2.When reality is tested, in order to ensure good test
Environment, is generally placed on on-chip antenna in microwave dark room environment, and test instrunment equipment is placed on operation room.But probe station,
Microscope and display thereof can not be placed on outside darkroom due to practical situations.Operator is correctly opening Antenna testing system
After, needed the instrument parameter of test, then regulation monotubular ultramicroscope by computer installation, by observing display, make
Microscope is focused on-chip antenna.By regulation probe station XYZ axle, making probe move to above on-chip antenna feed, regulation is visited
Pin platform Z axis makes probe slowly feed close to on-chip antenna, when finding that probe is consistent with feed definition, by slowly regulating Z
The slightest forward slip of probe tip observed by axle probe simultaneously, as shown in Fig. 3-1, Fig. 3-2, Fig. 4-1 Fig. 4-2, as sliding in produced
Dynamic, then stop probe station pressing action, operator before and after can arriving outdoor observation vector network analyzer S parameter curve feed are
No change, as changed and curve multiple scanning test data stabilization, then it is believed that just feed between probe and on-chip antenna
Often, next step on-chip antenna testing performance index can be carried out.
Standard probe platform is utilized to carry out the mode of feed between probe and on-chip antenna, owing to using binocular microscope, behaviour
Make personnel utilizing microscope regulation probe station and during probe, be only capable of the vision with oneself to judge whether are probe and on-chip antenna
Good contact, at microwave frequency band, owing to probe size is relatively large, probe tip is relatively long, and operator is when feeding
It is easier to find the relative displacement after probe and on-chip antenna feed.However as the rising of frequency, probe and antenna feed
Electrical interface is more and more less, and particularly at millimeter wave frequency band, millimeter wave probe tip only has several micron-scale, probe tip with
Displacement stroke forward slip as shown in Fig. 3-1, Fig. 3-2, Fig. 4-1 Fig. 4-2 after on-chip antenna contact, by the tens of microwave frequency band
Micron becomes several micron, is only observed by microscope by operator, has been difficult to judge between probe and on-chip antenna
Whether good contact, it is easy to make probe overvoltage damage, and the probe price of millimeter wave frequency band is relative to microwave frequency band significantly
Improve, so this feeding classification makes antenna measurement become complicated, poor efficiency and testing cost increases.
Although being added the visual field of operator by the probe feed mode after improving, but operator visiting
During pin feed, observe while ultramicroscope display can not Synchronous to the change of instrument and equipment test curve, so
Also mainly judge that probe the most well feeds with the misalignment by display observation probe tip.It is of course also possible to increase
Operator carry out the division of labor and observe, and i.e. one operator judge probe by ultramicroscope display, and whether contact chip goes up to the sky
Line also produces displacement, and whether another operator's optical viewer equipment test curve changes, and this situation increases undoubtedly
Manpower, and there is cooperation problem, once link up and go wrong and the normality of probe feed cannot be confirmed, cause operation
Contradiction between personnel, causes the problems such as testing efficiency is low.
Summary of the invention
It is an object of the invention to as overcoming above-mentioned the deficiencies in the prior art, it is provided that a kind of image based on on-chip antenna feed
Synchronous display system and method, by utilizing the function of remote desktop, on the computer of ultramicroscope display running software
Realize the simultaneous display of the standing-wave ratio curve of instrument system test, make operator pass through microscopy device i.e. observable probe
Feed with tested antenna, again can the real-time change of standing-wave ratio curve of simultaneously optical viewer system test, by physical property and
The dual judgement of electrical property improves the success rate of feed between probe and on-chip antenna.
For achieving the above object, the present invention uses following technical proposals:
Image synchronization display system based on on-chip antenna feed, including operation room and darkroom, sets in described operation room
There is control rack；It is provided with microscopy device in described darkroom, is used for showing micro-image and the standing wave that on-chip antenna feeds
Compare test curve；Described microscopy device side is provided with a probe station, and described probe station is provided with probe base, probe base
Side is provided with two horizon bars, and a horizon bar is provided with prevention at radio-frequency port, and described prevention at radio-frequency port is by radio-frequency cable and control machine
The instrument system basic module of cabinet connects, for the standing-wave ratio curve of display instrument system test on remote desktop；Another
The other end of horizon bar is provided with on-chip antenna, and described on-chip antenna is provided with probe, and described probe is connected with prevention at radio-frequency port.
It is provided with instrument system basic module in described control rack, this basic module includes microwave vector network analysis
Instrument, millimeter wave control machine etc. carry out S parameter test millimeter wave and extend necessary underlying instrument；Described instrument system basic module
Lower section be provided with below main control computer and display, main control computer and display and be provided with turntable controller.
Described probe base is provided with XYZ axle, is used for regulating probe.
Described probe station is provided with a vertical bar, and vertical masthead end installs a horizon bar, at the other end of horizon bar
Being provided with microscope, described microscope is connected with microscopy screen.
Being provided with spiral arm turntable bottom described darkroom, described spiral arm turntable is connected with turntable controller by circuit.
Described spiral arm turntable is provided with receiver module, and one end of described receiver module is connected with reception antenna, the other end with
The instrument system basic module controlling rack connects.
The method of work of a kind of image synchronization display system based on on-chip antenna feed, comprises the following steps:
Step one, connects each device: being connected with microscope by microscopy device, probe is connected with on-chip antenna, penetrates
Frequently port is connected with the instrument system basic module controlling rack and on-chip antenna, receiver module and the instrument system controlling rack
Basic module connects, and spiral arm turntable is connected with turntable controller；
Step 2, according to the image of microscope of display on microscopy device, regulation probe base and microscope focus；
Step 3, according to the position between probe and the on-chip antenna shown on microscopy device, regulates probe position
Put；
Step 4, contacts situation according to the probe of display on microscope with on-chip antenna distributing point, remote desktop shows
The change of standing-wave ratio curve of instrument system test, regulate probe base Z axis；
Step 5: the probe change shown according to standing-wave ratio test curve and microscopy device, confirms on probe and sheet
Feed condition between antenna, if standing-wave ratio test curve is constant, then realizes on-chip antenna feed.
In described step 2, regulation probe base makes on-chip antenna move to show image central area, and regulation microscope is burnt
Clearly indicate at image center away from making tested antenna；
In described step 3, regulation probe base X-axis and Y-axis, make probe move above on-chip antenna feed, regulate probe
Seat Z axis, makes probe slowly close to probe feed point, presses probe under slowly regulation Z axis is the slowest.
In described step 4, standing-wave ratio curve transverse axis frequency, the longitudinal axis is standing wave ratio.
The invention has the beneficial effects as follows:
1. can observe the position relationship between probe and on-chip antenna by operator simultaneously and standing wave is tested
The change of curve, utilizes the two change can quickly realize the feed to on-chip antenna, improves feed efficiency；
2. can determine whether the contact condition between probe and on-chip antenna by the change of test curve, it is ensured that the standard of distributing point
Really property；
3. improved accuracy and the efficiency of probe feed by the present invention, it is to avoid operator cause spy because of error in judgement
The damage of pin, reduces testing cost.
Accompanying drawing explanation
Fig. 1 is existing on-chip antenna test system structure schematic diagram；
Fig. 2 is modified model on-chip antenna test system structure schematic diagram；
Fig. 3-1,3-2 are probe feed pre-structure schematic diagrams；
Fig. 4-1,4-2 are structural representations after probe feed；
Fig. 5 is the image synchronization display system architectures schematic diagram based on on-chip antenna feed that the present invention provides；
Fig. 6 is schematic diagram before the probe that provides of the present invention and on-chip antenna feed；
Fig. 7 is schematic diagram after the probe that provides of the present invention and on-chip antenna feed；
Fig. 8 is the method for work flow chart of the image synchronization display system based on on-chip antenna feed that the present invention provides；
Wherein, 1. microscopy device, 2. microscope, 3. probe, 4. on-chip antenna, 5. probe base, 6. prevention at radio-frequency port,
7. reception antenna, 8. probe station, 9. receiver module, 10. spiral arm turntable.
Detailed description of the invention
The present invention is further described with embodiment below in conjunction with the accompanying drawings.
As it is shown in figure 5, image synchronization display system based on on-chip antenna feed, including operation room and darkroom, described
Control rack it is provided with in operation room；Microscopy device 1 it is provided with in described darkroom, micro-for showing that on-chip antenna feeds
Image and standing-wave ratio test curve；Described microscopy device side is provided with a probe station 8, and described probe station 8 is provided with
Probe base 5, probe base 5 side is provided with two horizon bars, and a horizon bar is provided with prevention at radio-frequency port 6, and described prevention at radio-frequency port 6 passes through
Radio-frequency cable is connected with the instrument system basic module controlling rack, for staying of display instrument system test on remote desktop
Bob curve；The other end of another horizon bar is provided with on-chip antenna 4, and described on-chip antenna is provided with probe 3, described probe 3
It is connected with prevention at radio-frequency port 6.
It is provided with instrument system basic module in described control rack, this basic module includes microwave vector network analysis
Instrument, millimeter wave control machine etc. carry out S parameter test millimeter wave and extend necessary underlying instrument；Described instrument system basic module
Lower section be provided with below main control computer and display, main control computer and display and be provided with turntable controller.
Described probe base 5 is provided with XYZ axle, is used for regulating probe.
Described probe station is provided with a vertical bar, and vertical masthead end installs a horizon bar, at the other end of horizon bar
Being provided with microscope 2, described microscope 2 is connected with microscopy screen 1.
Being provided with spiral arm turntable 10 bottom described darkroom, described spiral arm turntable 10 is connected with turntable controller.
Described spiral arm turntable is provided with receiver module 9, and one end of described receiver module 9 is connected with reception antenna 7, the other end
It is connected with instrument system basic module.
As shown in Figure 6 to 8, the method for work of a kind of image synchronization display system based on on-chip antenna feed, including
Following steps:
Step one, connects each device: being connected with microscope by microscopy device, probe is connected with on-chip antenna, penetrates
Frequently port is connected with the instrument system basic module controlling rack and on-chip antenna, receiver module and the instrument system controlling rack
Basic module connects, and spiral arm turntable is connected with turntable controller；
Step 2, according to the image of microscope of display on microscopy device, regulation probe base and microscope focus；
Step 3, according to the position between probe and the on-chip antenna shown on microscopy device, regulates probe position
Put；
Step 4, contacts situation according to the probe of display on microscope with on-chip antenna distributing point, remote desktop shows
The change of standing-wave ratio curve of instrument system test, regulate probe base Z axis；
Step 5: the probe change shown according to standing-wave ratio test curve and microscopy device, confirms on probe and sheet
Feed condition between antenna, if standing-wave ratio test curve is constant, then realizes on-chip antenna feed.
In described step 2, regulation probe base makes tested antenna move to show image central area, and regulation microscope is burnt
Clearly indicate at image center away from making tested antenna；
In described step 3, regulation probe base X-axis and Y-axis, make probe move above on-chip antenna feed, regulate probe
Seat Z axis, makes probe slowly close to probe feed point, presses probe under slowly regulation Z axis is the slowest.
In described step 4, standing-wave ratio curve transverse axis frequency, the longitudinal axis is standing wave ratio.
The present invention utilizes Remote desk process function, test instrunment equipment apart from tested antenna farther out in the case of, also
The real-time change of instrument test curve can be observed, it is only necessary to operator both can be behaviour on in-plant display
Observe probe and the change of instrument curve while making probe station, saved time and space, improve the effect of probe feed
Rate and accuracy rate, effectively prevent the damage of probe, reduce testing cost.
Although the detailed description of the invention of the present invention is described by the above-mentioned accompanying drawing that combines, but not the present invention is protected model
The restriction enclosed, one of ordinary skill in the art should be understood that on the basis of technical scheme, and those skilled in the art are not
Need to pay various amendments or deformation that creative work can make still within protection scope of the present invention.
Claims (10)
1. image synchronization display system based on on-chip antenna feed, is characterized in that, including operation room and darkroom, described operation
In be provided with control rack；Microscopy device it is provided with, for showing the micro-image that on-chip antenna feeds in described darkroom
With standing-wave ratio test curve；Described microscopy device side is provided with a probe station, and described probe station is provided with probe base,
Probe base side is provided with two horizon bars, and a horizon bar is provided with prevention at radio-frequency port, described prevention at radio-frequency port by radio-frequency cable with
Control the instrument system basic module in rack to connect, bent for the standing-wave ratio of display instrument system test on remote desktop
Line；The other end of another horizon bar is provided with on-chip antenna, and described on-chip antenna is provided with probe, described probe and prevention at radio-frequency port
Connect.
2. the image synchronization display system fed based on on-chip antenna as claimed in claim 1, is characterized in that, described control machine
It is provided with instrument system basic module in cabinet, this basic module includes microwave vector network analyzer, millimeter wave control machine etc.
Carry out S parameter test millimeter wave and extend necessary underlying instrument；The lower section of described instrument system basic module is provided with master control meter
It is provided with turntable controller below calculation machine and display, main control computer and display.
3. the image synchronization display system fed based on on-chip antenna as claimed in claim 1, is characterized in that, described probe
Seat is provided with XYZ axle, is used for regulating probe.
4. the image synchronization display system fed based on on-chip antenna as claimed in claim 1, is characterized in that, described probe station
Being provided with a vertical bar, vertical masthead end installs a horizon bar, and the other end at horizon bar is provided with microscope, described micro-
Mirror is connected with microscopy screen.
5. the image synchronization display system fed based on on-chip antenna as claimed in claim 1, is characterized in that, at the bottom of described darkroom
Portion is provided with spiral arm turntable, and described spiral arm turntable is connected with turntable controller.
6. the image synchronization display system fed based on on-chip antenna as claimed in claim 5, is characterized in that, described rotary transfer arm
Platform is provided with receiver module, and one end of described receiver module is connected with reception antenna, the other end and the instrument system controlling rack
Basic module connects.
7. a method of work for image synchronization display system based on on-chip antenna feed, is characterized in that, comprise the following steps:
Step one, connects each device: being connected with microscope by microscopy device, probe is connected with on-chip antenna, radio-frequency head
Mouth is connected with the instrument system basic module controlled in rack and on-chip antenna, receiver module and the instrument system base controlling rack
This assembly connects, and spiral arm turntable is connected with turntable controller；
Step 2, according to the image of microscope of display on microscopy device, regulation probe base and microscope focus；
Step 3, according to the position between probe and the on-chip antenna shown on microscopy device, regulates probe location；
Step 4, contacts situation according to the probe of display on microscope with on-chip antenna distributing point, the instrument of display on remote desktop
The change of the standing-wave ratio curve of device system test, regulates probe base Z axis；
Step 5: the probe change shown according to standing-wave ratio test curve and microscopy device, confirms probe and on-chip antenna
Between feed condition, if standing-wave ratio test curve is constant, then realize on-chip antenna feed.
8. the image synchronous display method fed based on on-chip antenna as claimed in claim 7, is characterized in that, described step 2
In, regulation probe base makes on-chip antenna move to show image central area, and regulation microscope focus makes tested antenna clearly
Display is at image center.
9. the image synchronous display method fed based on on-chip antenna as claimed in claim 7, is characterized in that, described step 3
In, regulation probe base X-axis and Y-axis, make probe move above on-chip antenna feed, regulate probe base Z axis, make probe slowly connect
Nearly probe feed point, presses probe under slowly regulation Z axis is the slowest.
10. the image synchronous display method fed based on on-chip antenna as claimed in claim 7, is characterized in that, described step
In four, standing-wave ratio curve transverse axis frequency, the longitudinal axis is standing wave ratio.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201610709311.4A CN106249059B (en) | 2016-08-23 | 2016-08-23 | Image synchronization display system and method based on on-chip antenna feed |
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| CN201610709311.4A CN106249059B (en) | 2016-08-23 | 2016-08-23 | Image synchronization display system and method based on on-chip antenna feed |
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| CN106249059A true CN106249059A (en) | 2016-12-21 |
| CN106249059B CN106249059B (en) | 2018-10-19 |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN107015070A (en) * | 2017-05-27 | 2017-08-04 | 上海贤行电子科技有限公司 | It is a kind of to test probe station in chip antenna |
| TWI703332B (en) * | 2019-08-29 | 2020-09-01 | 飛斯特科技實業有限公司 | Method and measuring mechanism for measuring antenna in antenna system by way of back-point pin |
| TWI804309B (en) * | 2022-05-11 | 2023-06-01 | 量崴科技股份有限公司 | Antenna test system |
| CN116953297A (en) * | 2023-07-26 | 2023-10-27 | 中国计量科学研究院 | Antenna back feed measuring device on millimeter wave plate |
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107015070A (en) * | 2017-05-27 | 2017-08-04 | 上海贤行电子科技有限公司 | It is a kind of to test probe station in chip antenna |
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| TWI703332B (en) * | 2019-08-29 | 2020-09-01 | 飛斯特科技實業有限公司 | Method and measuring mechanism for measuring antenna in antenna system by way of back-point pin |
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| CN116953297B (en) * | 2023-07-26 | 2024-02-20 | 中国计量科学研究院 | Antenna back feed measuring device on millimeter wave plate |
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| CN106249059B (en) | 2018-10-19 |
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