CN106248350A - The material homogeneity detection method of a kind of optical glass and device - Google Patents

The material homogeneity detection method of a kind of optical glass and device Download PDF

Info

Publication number
CN106248350A
CN106248350A CN201510962393.9A CN201510962393A CN106248350A CN 106248350 A CN106248350 A CN 106248350A CN 201510962393 A CN201510962393 A CN 201510962393A CN 106248350 A CN106248350 A CN 106248350A
Authority
CN
China
Prior art keywords
microscopy
sub
aperture
camera lens
material homogeneity
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN201510962393.9A
Other languages
Chinese (zh)
Other versions
CN106248350B (en
Inventor
苗亮
张文龙
刘钰
马冬梅
金春水
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Changchun Institute of Optics Fine Mechanics and Physics of CAS
Original Assignee
Changchun Institute of Optics Fine Mechanics and Physics of CAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Changchun Institute of Optics Fine Mechanics and Physics of CAS filed Critical Changchun Institute of Optics Fine Mechanics and Physics of CAS
Priority to CN201510962393.9A priority Critical patent/CN106248350B/en
Publication of CN106248350A publication Critical patent/CN106248350A/en
Application granted granted Critical
Publication of CN106248350B publication Critical patent/CN106248350B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02Testing optical properties
    • G01M11/0242Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0271Testing optical properties by measuring geometrical properties or aberrations by using interferometric methods

Abstract

The present invention proposes the material homogeneity detection method of a kind of optical glass, at least three sub-aperture region will be divided into by microscopy, respectively each sub-aperture region is calculated material homogeneity, recycling sub-aperture stitching algorithm is calculated by the material homogeneity of microscopy, additionally, monitored and correction by the plane mirror monitoring interferometer and side by the lateral attitude of microscopy, therefore the heeling condition of the uniformity test result of different sub-aperture is completely the same, and " inclination " amount introduced in sub-aperture interferes testing result by the out of focus in uniformity and astigmatism can be retained truly, thus avoid, by the unified uniformity of microscopy, discontinuous splicing vestige is occurred.The method that the present invention proposes is during utilizing small-bore phase-shifting interferometer to realize the detection of large-aperture optical glass material uniformity, it is possible not only to realize whole wave aberration absolute sense of material homogeneity, and the detection error that discontinuous splicing vestige causes can be eliminated.

Description

The material homogeneity detection method of a kind of optical glass and device
Technical field
The present invention relates to optical interferometry technical field, the material particularly to a kind of optical glass is uniform Property detection method and device.
Background technology
High-precision optical imaging lens is generally made up of multiple optical lenses, in order to reach preferably to become picture element Amount, it is desirable to the transmission wavefront of optical lens reaches diffraction limit, and the material homogeneity of optical glass is light Learn one of main source of camera lens transmission wavefront error.Additionally, use zero compensation mirror method detection aspheric surface During mirror surface-shaped, in order to obtain High-precision aspheric surface testing as a result, it is desirable to correct each of zero-bit compensating glass Plant error source, the most just include the impact on compensating glass non-spherical wavefront of the compensating glass glass material uniformity. In above-mentioned application, the absolute sense technology of optical glass material uniformity is to develop high-precision optical to become As camera lens and the indispensable important step of zero compensation mirror.
In prior art, generally utilize transmission beam method based on phase-shifting interferometer detection optical glass material uniform Property, the method can eliminate interferometer by the most different configuration of detection, optical standard has, by microscopy The systematic error that two face, surface shapes introduce during detection, thus realize optical glass material uniformity Absolute sense.For the detection of large-aperture optical glass material uniformity, directly utilize aperture interferometer Solving the problems referred to above cost the highest, prior art even cannot manufacture and meet bore and measuring accuracy requirement Interferometer and optical standard tool, therefore generally use based on small-bore interferometer zygote aperture splicing technology Solve the test problems of large-aperture optical glass material uniformity.But, above-mentioned solution cannot be high-precision Out of focus in degree test material homogeneity and astigmatism, and during owing to being moved by microscopy, lateral attitude is easily sent out Changing, causes splicing to leave discontinuous splicing vestige in final uniformity testing result, Thus cause uniformity test error to increase.
Summary of the invention
In view of this, embodiments provide a kind of optical glass material homogeneity detection method and Device.
It is an object of the present invention to provide the material homogeneity detection method of a kind of optical glass, described side Method includes:
It is polished optical glass to be detected obtaining parallel flat as by microscopy;
By described three the sub-aperture area, wherein, two adjacent sub-aperture region of being at least divided into by microscopy Territory has overlapping region;
Obtain the material homogeneity in each sub-aperture region;
Utilize sub-aperture stitching algorithm the material homogeneity in whole sub-aperture regions is carried out splicing calculate with Obtain the material homogeneity of described large-aperture optical glass.
Alternatively, described being polished by optical glass to be detected obtains parallel flat as concrete by microscopy Including: it is polished the upper and lower surface of optical glass to be detected obtaining parallel flat as by microscopy.
Alternatively, the material homogeneity in described acquisition each sub-aperture region specifically includes:
Adjust described any one sub-aperture region made by the position of microscopy in the plurality of sub-aperture region The interference fringe formed with transmission plane camera lens is zero striped;
Regulation plane of reflection lens location makes described plane of reflection camera lens be formed with described transmission plane camera lens Interference fringe be zero striped, wherein, described transmission plane camera lens is formed the with described by microscopy front surface One interference cavity, described is formed the second interference cavity by upper and lower two surfaces of microscopy, described by microscopy rear surface with Described plane of reflection camera lens forms the 3rd interference cavity;
Described first interference cavity, described second interference cavity and institute is calculated according to wavelength phase shift principle of interference State the testing result of the 3rd interference cavity;
Obtain described transmission plane camera lens and the 4th interference cavity of described transmission plane camera lens formation, according to ripple Long phase shift principle of interference calculates the testing result of described 4th interference cavity;
According to described first interference cavity, described second interference cavity, described 3rd interference cavity and the described 4th The testing result of interference cavity calculates the material homogeneity in described sub-aperture region.
Alternatively, at least it is divided into three sub-aperture area by microscopy specifically includes described:
It is divided into three sub-aperture area, the respectively first sub-aperture region, the second son by microscopy by described Aperture area and third sub-aperture region;
Alternatively, what described acquisition described transmission plane camera lens and described transmission plane camera lens were formed is the 4th dry Relate to chamber, calculate the testing result of described 4th interference cavity according to wavelength phase shift principle of interference before, institute Method of stating also includes:
Taken out described between described transmission plane camera lens and described transmission plane camera lens by microscopy.
Alternatively, described adjustment described by the position of microscopy make in the plurality of sub-aperture region arbitrary After the interference fringe that individual sub-aperture area and transmission plane camera lens are formed is zero striped, described method is also wrapped Include:
Obtain by the tilt quantity of microscopy;
Described utilize sub-aperture stitching algorithm the material homogeneity in whole sub-aperture regions is carried out splicing meter Calculate and specifically include with the material homogeneity obtaining described large-aperture optical glass:
Described utilize sub-aperture stitching algorithm the material homogeneity in whole sub-aperture regions is carried out splicing meter Calculate and described by the tilt quantity of microscopy with obtain described large-aperture optical glass material homogeneity.
It is a further object to provide the material homogeneity detection device of a kind of optical glass, described Device include for carry out the interferometer of wavelength phase-shifting interference measuring, transmission plane camera lens, be positioned at described Penetrate below plane camera lens by microscopy, for adjusting described transmission plane lens location so that with described quilt Interference fringe is zero striped five dimensions that microscopy is formed adjust platforms, are positioned at and described are put down by the reflection below microscopy Face camera lens, for adjust described plane of reflection lens location so that with the described interference bar formed by microscopy Stricture of vagina is that the three-dimensional of zero striped adjusts platform;
Described is that optical glass to be detected is polished obtaining parallel flat by microscopy;
Described at least it is divided into three sub-aperture area, two the most adjacent sub-aperture region by microscopy surface Territory;
Described interferometer carries out material homogeneity to each sub-aperture region divided respectively and is examined Survey result and the affiliated testing result of utilization carries out splicing and calculates to obtain described by the material homogeneity of microscopy..
Alternatively, described device also includes:
Plane mirror, described by the lateral attitude of microscopy for correcting;
Monitor interferometer, described by the lateral attitude of microscopy for monitoring;
The Monitoring Data that described interferometer is additionally operable to according to described plane mirror and described supervision interferometer is true Determine the described tilt quantity by microscopy and utilize sub-aperture stitching algorithm by the material in whole sub-aperture regions Uniformity carries out splicing and calculates and described described uniform by the material of microscopy to obtain by the tilt quantity of microscopy Property.
The present invention proposes the material homogeneity detection method of a kind of optical glass, will be divided at least by microscopy Three sub-aperture area, calculate material homogeneity respectively to each sub-aperture region, and recycling sub-aperture is spelled Connect algorithm to be calculated by the material homogeneity of microscopy, it addition, by the lateral attitude of microscopy by monitoring interference The plane mirror of instrument and side monitors and correction, therefore the inclining of the uniformity test result of different sub-aperture Ramp-like state is completely the same, and is introduced in sub-aperture interferes testing result by the out of focus in uniformity and astigmatism " inclination " amount can be retained truly, thus avoid and occur not in the unified uniformity of microscopy Continuous print splicing vestige.The method that the present invention proposes is utilizing small-bore phase-shifting interferometer to realize heavy caliber light During learning the detection of glass material uniformity, the whole wave aberrations being possible not only to realize material homogeneity are exhausted To detection, and the detection error that discontinuous splicing vestige causes can be eliminated.
Accompanying drawing explanation
Fig. 1 is the flow chart of a kind of embodiment of the material homogeneity detection method of the optical glass of the present invention;
Fig. 2 is the flow process of the another kind of embodiment of the material homogeneity detection method of the optical glass of the present invention Figure;
Fig. 3 be the material homogeneity detection method of the optical glass of the present invention be divided into many height by microscopy The schematic diagram of aperture area;
Fig. 4 is a kind of structural representation of the material homogeneity detection device of the optical glass of the present invention.
Detailed description of the invention
In order to make those skilled in the art be more fully understood that the present invention program, real below in conjunction with the present invention Execute the accompanying drawing in example, the technical scheme in the embodiment of the present invention be clearly and completely described, it is clear that Described embodiment is only the embodiment of a present invention part rather than whole embodiments.Based on Embodiment in the present invention, those of ordinary skill in the art are obtained under not making creative work premise The every other embodiment obtained, all should belong to the scope of protection of the invention.
Term " first " in description and claims of this specification and above-mentioned accompanying drawing, " second ", " Three " " the 4th " etc. is for distinguishing similar object, without being used for describing specific order or successively time Sequence.Should be appreciated that the data of so use can be exchanged in the appropriate case, in order to enforcement described herein Example can be implemented with the order in addition to the content except here illustrating or describe.Additionally, term " includes " " have " and their any deformation, it is intended that cover non-exclusive comprising, such as, comprise The process of series of steps or unit, method, system, product or equipment are not necessarily limited to clearly to list Those steps or unit, but can include the most clearly listing or for these processes, method, Product or intrinsic other step of equipment or unit.
Shown in Fig. 1, the one of the material homogeneity detection method of a kind of optical glass that the present invention provides Planting embodiment, described method includes:
S101, it is polished optical glass to be detected obtaining parallel flat as by microscopy.
S102, by described three the sub-aperture area, wherein, two adjacent sons of being at least divided into by microscopy Aperture area has overlapping region.
S103, obtain the material homogeneity in each sub-aperture region.
S104, sub-aperture stitching algorithm is utilized to be spliced by the material homogeneity in whole sub-aperture regions Calculate to obtain the material homogeneity of described large-aperture optical glass.
The present invention proposes the material homogeneity detection method of a kind of optical glass, will be divided at least by microscopy Three sub-aperture area, calculate material homogeneity respectively to each sub-aperture region, and recycling sub-aperture is spelled Connect algorithm to be calculated by the material homogeneity of microscopy, it addition, by the lateral attitude of microscopy by monitoring interference The plane mirror of instrument and side monitors and correction, therefore the inclining of the uniformity test result of different sub-aperture Ramp-like state is completely the same, and is introduced in sub-aperture interferes testing result by the out of focus in uniformity and astigmatism " inclination " amount can be retained truly, thus avoid and occur not in the unified uniformity of microscopy Continuous print splicing vestige.The method that the present invention proposes is utilizing small-bore phase-shifting interferometer to realize heavy caliber light During learning the detection of glass material uniformity, the whole wave aberrations being possible not only to realize material homogeneity are exhausted To detection, and the detection error that discontinuous splicing vestige causes can be eliminated.
Shown in Fig. 2 and Fig. 3, the material homogeneity detection side of a kind of optical glass that the present invention provides The another kind of embodiment of method, described method includes:
S201, it is polished the upper and lower surface of optical glass to be detected obtaining parallel flat as by microscopy.
S202, by described three the sub-aperture area, wherein, two adjacent sons of being at least divided into by microscopy Aperture area has overlapping region.
S203, adjust described any one sub-aperture made by the position of microscopy in the plurality of sub-aperture region The interference fringe that region, footpath is formed with transmission plane camera lens is zero striped.
S204, regulation plane of reflection lens location make described plane of reflection camera lens and described transmission plane mirror The interference fringe that capitiform becomes is zero striped, and wherein, described transmission plane camera lens is with described by microscopy front surface Form the first interference cavity, described formed the second interference cavity by upper and lower two surfaces of microscopy, described by after microscopy Surface forms the 3rd interference cavity with described plane of reflection camera lens.
S205, calculate described first interference cavity C1, described second dry according to wavelength phase shift principle of interference Relate to chamber C2 and the testing result of described 3rd interference cavity C3.
Utilize wavelength phase shift interfere 1 can utilize one-shot measurement obtain three interference cavity testing result:
C1=-S1-S2+k1,
C2=nS2-nS3+nT+k2,
C3=-S3-S4+k3
Wherein, S1, S2, S3And S4It is respectively transmission plane camera lens, by microscopy front surface, by after microscopy Surface and the face shape error of plane of reflection camera lens, n is by microscopy Refractive Index of Material, and T is by microscopy thickness, k1, k2And k3It is three constant terms.
S206, obtain the 4th interference cavity that described transmission plane camera lens and described transmission plane camera lens are formed, The testing result of described 4th interference cavity is calculated according to wavelength phase shift principle of interference.
Will be located between transmission plane camera lens and described transmission plane camera lens before obtaining the 4th interference cavity Taken out the detection carrying out the 4th interference cavity again by microscopy, the calculation for the 4th interference cavity can be:
CEC=-S1-S4+k4
Wherein, k4For constant term.
S207, according to described first interference cavity, described second interference cavity, described 3rd interference cavity and institute The testing result stating the 4th interference cavity calculates the material homogeneity in described sub-aperture region.
Can be used by the calculation of the material homogeneity H1 of on microscopy aperture area:
H1=nT=C2-n(CEC-C3-C1)
Carry out calculating by the parameter utilizing calculating process above to obtain and can obtain a sub-aperture area Material homogeneity.
It is pointed out that the step that the material homogeneity for each sub-aperture region detects is similar, Repeat according to step S203 to S207, do not repeat.
Alternatively, when the material homogeneity carrying out another sub-aperture region detects, again will Put back in interference cavity by microscopy, in fetching process repeatedly, by microscopy supporting mechanism need to guarantee low stress and High position repdocutbility, readjusts by microscopy lateral attitude, makes by microscopy and the formation of transmission plane camera lens Interference fringe is zero striped, utilizes and monitors that interferometer measurement is by the plane mirror of microscopy support means side The inclination T of interference fringe1And T2, utilize five dimensions to adjust platform and adjust by microscopy position, make by second son of microscopy The interference fringe that aperture is formed with transmission plane camera lens is zero striped, observes the plane monitoring interferometer measurement The inclination T ' of mirror interference striped1With T '2, utilize five dimensions to adjust platform fine setting and tilted to make plane reflection by microscopy The interference fringe of mirror tilts for T1And T2, repeat the operating process of step S203 to S207, it is possible to obtain Material homogeneity H by second sub-aperture of microscopy2
S208, sub-aperture stitching algorithm is utilized to be spliced by the material homogeneity in whole sub-aperture regions Calculate to obtain the material homogeneity of described large-aperture optical glass.
For sub-aperture stitching algorithm, those of ordinary skill in the art it is to be appreciated that concrete splicing not Repeat, it should be pointed out that also increase during splicing to by the tilt quantity of microscopy, profit With sub-aperture stitching algorithm, the material homogeneity in whole sub-aperture regions is carried out splicing to calculate and described By the tilt quantity of microscopy to obtain the material homogeneity of described large-aperture optical glass, it is to avoid complete by microscopy Bore uniformity occurs discontinuous splicing vestige.
For the acquisition by microscopy tilt quantity, the invention provides a kind of implementation, specifically include:
For the ease of understanding the technical scheme of the application, provide below a kind of use scene and explained.
1, using large-aperture optical glass two surface finish be parallel flat as by microscopy, two surface requirements reach To higher surface figure accuracy.
2, build material homogeneity measurement apparatus based on small-bore phase-shifting interferometer via wavelength tuning, move including wavelength Relevant interferometer main frame, transmission plane camera lens, adjusted platform, plane of reflection camera lens, three-dimensionals by microscopy, five dimensions Adjust platform, monitor interferometer and plane mirror, heavy caliber is divided into multiple sub-aperture region by microscopy, Each sub-aperture region all can utilize phase-shifting interferometer via wavelength tuning to measure, and adjacent two sub-aperture area tool There is sufficiently large overlapping region, to ensure follow-up splicing precision.
3, transmission plane camera lens is installed on interferometer main frame, will be arranged in detection device by microscopy, profit Adjusting platform adjustment by five dimensions is made its first sub-aperture area and transmission plane camera lens be formed by microscopy position Interference fringe is zero striped, is arranged on by plane of reflection camera lens in detection device, utilizes three-dimensional to adjust platform and adjusts The interference fringe that whole inclination makes itself and transmission plane camera lens be formed is zero striped, finally adjusts interferometer and focuses on Position makes plane of reflection camera lens become the object plane of interferometer imaging mirror.Transmission plane camera lens, by microscopy and anti- Penetrate the position relationship between plane camera lens three and need to meet the testing requirement of phase-shifting interferometer via wavelength tuning, to prevent Test process occurs the interference of frequency multiplication interference signal.
4, in the case of comprising by the having one's bosom filled with of microscopy, transmission plane camera lens is interfered with being formed by microscopy front surface Chamber C1, formed interference cavity C by microscopy front and rear surfaces2, formed dry by microscopy rear surface with plane of reflection camera lens Relate to chamber C3.Utilize phase-shifting interferometer via wavelength tuning that one-shot measurement can be utilized to obtain the detection of following three interference cavity Result:
C1=-S1-S2+k1,
C2=nS2-nS3+nT+k2,
C3=-S3-S4+k3
Wherein, S1, S2, S3And S4It is respectively transmission plane camera lens, by microscopy front surface, by after microscopy Surface and the face shape error of plane of reflection camera lens, n is by microscopy Refractive Index of Material, and T is by microscopy thickness, k1, k2And k3It is three constant terms.
5, taking out by microscopy 3, transmission plane camera lens forms cavity C with plane of reflection camera lensEC, utilize wavelength The testing result that phase-shifting interferometer 1 obtains cavity is as follows:
CEC=-S1-S4+k4
Wherein, k4For constant term.Therefore, by the material homogeneity H of 3 first sub-aperture of microscopy1Can be by The above-mentioned test result having one's bosom filled with cavity is derived:
H1=nT=C2-n(CEC-C3-C1)
6, again will be put back in interference cavity by microscopy 3, in fetching process repeatedly, by microscopy supporting mechanism Low stress and high position repdocutbility need to be guaranteed.Readjust by microscopy lateral attitude so that it is with transmission plane The interferogram that camera lens is formed is zero striped, utilizes and monitors that interferometer 7 is measured by microscopy support means side The inclination T of plane mirror 8 interference fringe1And T2
Utilize five dimensions to adjust platform 4 and adjust by microscopy position so that it is second sub-aperture and transmission plane camera lens The interference fringe formed is zero striped, observes plane mirror 8 interference fringe monitoring that interferometer 7 is measured Inclination T '1With T '2, utilize five dimensions to adjust platform 4 and finely tune to be tilted to make the interference bar of plane mirror 8 by microscopy Stricture of vagina tilts for T1And T2.Then, step 4 and the operating process of 5 are repeated, it is possible to obtain by microscopy second The material homogeneity H of sub-aperture2.Repeat the measurement in each sub-aperture region, it is possible to obtain by microscopy The material homogeneity H in 3 all sub-aperture regions1,H2,H3..., Hn
7, utilize classical sub-aperture stitching algorithm by the material homogeneity by the whole sub-aperture region of microscopy 3 Data H1,H2,H3..., HnBe stitched together acquisition heavy caliber by the material homogeneity of microscopy Zone Full H。
A kind of method described above, corresponding, the material that present invention also offers a kind of optical glass is equal Even property detection device, is applied to the material homogeneity detection method of above-mentioned optical glass, is described below.
Shown in Fig. 3 and Fig. 4, the present invention provides the material homogeneity detection device of a kind of optical glass A kind of embodiment, described device include for carry out the interferometer 1 of wavelength phase-shifting interference measuring, transmission put down Face camera lens 2, be positioned at below described transmission plane camera lens by microscopy 3, for adjusting described transmission plane mirror Head position is so that adjust platform 4 with five dimensions that the described interference fringe formed by microscopy is zero striped, be positioned at institute State the plane of reflection camera lens 5 below by microscopy, for adjusting described plane of reflection lens location so that with institute Stating the interference fringe formed by microscopy is that the three-dimensional of zero striped adjusts platform 6;
Described it is polished obtaining parallel flat for optical glass to be detected by microscopy 3;
Described at least it is divided into three sub-aperture area, two the most adjacent sub-aperture by microscopy 3 surface Region;
Described interferometer 1 carries out material homogeneity detection respectively and obtains each sub-aperture region divided Testing result belonging to testing result utilization carries out splicing and calculates to obtain described uniform by the material of microscopy Property.
The present invention propose a kind of optical glass material homogeneity detection device, will by microscopy 3 be divided into Few three sub-aperture area, calculate material homogeneity to each sub-aperture region respectively, recycle sub-aperture Stitching algorithm is calculated by the material homogeneity of microscopy 3, it addition, by the lateral attitude of microscopy 3 by supervising Monitoring depending on the plane mirror 7 of interferometer 8 and side and correct, therefore the uniformity of different sub-aperture is surveyed The heeling condition of test result is completely the same, and is interfered detection by the out of focus in uniformity and astigmatism in sub-aperture " inclination " amount introduced in result can be retained truly, thus avoids by the unified uniformity of microscopy 3 Middle appearance discontinuous splicing vestige.The method that the present invention proposes is utilizing small-bore phase-shifting interferometer to realize During the detection of large-aperture optical glass material uniformity, it is possible not only to realize the whole of material homogeneity Wave aberration absolute sense, and the detection error that discontinuous splicing vestige causes can be eliminated.
Alternatively, described device also includes:
Plane mirror 7, described by the lateral attitude of microscopy for correcting;
Monitor interferometer 8, described by the lateral attitude of microscopy for monitoring;
Described interferometer 1 is additionally operable to according to described plane mirror 7 and the monitoring of described supervision interferometer 8 Data determine the described tilt quantity by microscopy 3 and utilize sub-aperture stitching algorithm by whole sub-aperture districts The material homogeneity in territory carries out splicing and calculates and described described by microscopy to obtain by the tilt quantity of microscopy 3 Material homogeneity.
Those skilled in the art is it can be understood that arrive, and for convenience and simplicity of description, above-mentioned retouches The specific works process of the system stated, device and unit, is referred to the correspondence in preceding method embodiment Process, does not repeats them here.
In several embodiments provided herein, it should be understood that disclosed system, device and Method, can realize by another way.Such as, device embodiment described above is only shown Meaning property, such as, the division of described unit, be only a kind of logic function and divide, actual can when realizing There to be other dividing mode, the most multiple unit or assembly can in conjunction with or be desirably integrated into another System, or some features can ignore, or do not perform.Another point, shown or discussed each other Coupling direct-coupling or communication connection can be the INDIRECT COUPLING by some interfaces, device or unit Or communication connection, can be electrical, machinery or other form.
One of ordinary skill in the art will appreciate that all or part of step realizing in above-described embodiment method The program that can be by completes to instruct relevant hardware, and described program can be stored in a kind of computer In readable storage medium storing program for executing, storage medium mentioned above can be read only memory, disk or CD etc..
Material homogeneity detection method and device to a kind of optical glass provided by the present invention are carried out above It is discussed in detail, for one of ordinary skill in the art, according to the thought of the embodiment of the present invention, at tool All will change on body embodiment and range of application, in sum, this specification content should not be managed Solve as limitation of the present invention.

Claims (8)

1. the material homogeneity detection method of an optical glass, it is characterised in that described method includes:
It is polished optical glass to be detected obtaining parallel flat as by microscopy;
By described three the sub-aperture area, wherein, two adjacent sub-aperture region of being at least divided into by microscopy Territory has overlapping region;
Obtain the material homogeneity in each sub-aperture region;
Utilize sub-aperture stitching algorithm the material homogeneity in whole sub-aperture regions is carried out splicing calculate with Obtain the material homogeneity of described large-aperture optical glass.
Method the most according to claim 1, it is characterised in that described optical glass to be detected is entered Row polishing obtains parallel flat and specifically includes as by microscopy:
It is polished the upper and lower surface of optical glass to be detected obtaining parallel flat as by microscopy.
Method the most according to claim 1 and 2, it is characterised in that each sub-aperture of described acquisition The material homogeneity in region specifically includes:
Adjust described any one sub-aperture region made by the position of microscopy in the plurality of sub-aperture region The interference fringe formed with transmission plane camera lens is zero striped;
Regulation plane of reflection lens location makes described plane of reflection camera lens be formed with described transmission plane camera lens Interference fringe be zero striped, wherein, described transmission plane camera lens is formed the with described by microscopy front surface One interference cavity, described is formed the second interference cavity by upper and lower two surfaces of microscopy, described by microscopy rear surface with Described plane of reflection camera lens forms the 3rd interference cavity;
Described first interference cavity, described second interference cavity and institute is calculated according to wavelength phase shift principle of interference State the testing result of the 3rd interference cavity;
Obtain described transmission plane camera lens and the 4th interference cavity of described transmission plane camera lens formation, according to ripple Long phase shift principle of interference calculates the testing result of described 4th interference cavity;
According to described first interference cavity, described second interference cavity, described 3rd interference cavity and the described 4th The testing result of interference cavity calculates the material homogeneity in described sub-aperture region.
Method the most according to claim 3, it is characterised in that be at least divided into described by microscopy Three sub-aperture area specifically include:
It is divided into three sub-aperture area, the respectively first sub-aperture region, the second son by microscopy by described Aperture area and third sub-aperture region.
Method the most according to claim 3, it is characterised in that described acquisition described transmission plane mirror The 4th interference cavity that head and described transmission plane camera lens are formed, calculates according to wavelength phase shift principle of interference Before the testing result of described 4th interference cavity, described method also includes:
Taken out described between described transmission plane camera lens and described transmission plane camera lens by microscopy.
Method the most according to claim 3, it is characterised in that described adjustment is described by the position of microscopy Put so that doing that any one the sub-aperture region in the plurality of sub-aperture region and transmission plane camera lens are formed Relating to after striped is zero striped, described method also includes:
Obtain by the tilt quantity of microscopy;
Described utilize sub-aperture stitching algorithm the material homogeneity in whole sub-aperture regions is carried out splicing meter Calculate and specifically include with the material homogeneity obtaining described large-aperture optical glass:
Described utilize sub-aperture stitching algorithm the material homogeneity in whole sub-aperture regions is carried out splicing meter Calculate and described by the tilt quantity of microscopy with obtain described large-aperture optical glass material homogeneity.
7. the material homogeneity detection device of an optical glass, it is characterised in that described device includes using In carrying out the interferometer of wavelength phase-shifting interference measuring, transmission plane camera lens, being positioned at described transmission plane camera lens Lower section by microscopy, for adjusting described transmission plane lens location so that being formed by microscopy with described Interference fringe be zero striped five dimension adjust platforms, be positioned at described by the plane of reflection camera lens below microscopy, use In adjusting described plane of reflection lens location so that being zero striped with the described interference fringe formed by microscopy Three-dimensional adjust platform;
Described is that optical glass to be detected is polished obtaining parallel flat by microscopy;
Described at least it is divided into three sub-aperture area, two the most adjacent sub-aperture region by microscopy surface Territory;
Described interferometer carries out material homogeneity to each sub-aperture region divided respectively and is examined Survey result and the affiliated testing result of utilization carries out splicing and calculates to obtain described by the material homogeneity of microscopy.
Device the most according to claim 7, it is characterised in that described device also includes:
Plane mirror, described by the lateral attitude of microscopy for correcting;
Monitor interferometer, described by the lateral attitude of microscopy for monitoring;
The Monitoring Data that described interferometer is additionally operable to according to described plane mirror and described supervision interferometer is true Determine the described tilt quantity by microscopy and utilize sub-aperture stitching algorithm by the material in whole sub-aperture regions Uniformity carries out splicing and calculates and described described uniform by the material of microscopy to obtain by the tilt quantity of microscopy Property.
CN201510962393.9A 2015-12-21 2015-12-21 A kind of material homogeneity detection method and device of optical glass Active CN106248350B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201510962393.9A CN106248350B (en) 2015-12-21 2015-12-21 A kind of material homogeneity detection method and device of optical glass

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201510962393.9A CN106248350B (en) 2015-12-21 2015-12-21 A kind of material homogeneity detection method and device of optical glass

Publications (2)

Publication Number Publication Date
CN106248350A true CN106248350A (en) 2016-12-21
CN106248350B CN106248350B (en) 2019-01-29

Family

ID=57626488

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201510962393.9A Active CN106248350B (en) 2015-12-21 2015-12-21 A kind of material homogeneity detection method and device of optical glass

Country Status (1)

Country Link
CN (1) CN106248350B (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109406108A (en) * 2018-10-19 2019-03-01 中国兵器工业标准化研究所 The temperature impact evaluation of infrared optical material uniformity test and control method
CN110337583A (en) * 2017-05-02 2019-10-15 林平 A kind of sample bearing device for infrared spectrometry

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1324006A1 (en) * 2001-12-18 2003-07-02 QED Technologies, Inc. Simultaneous self-calibrated sub-aperture stitching for surface figure measurement ( interferometer )
CN1731148A (en) * 2004-11-02 2006-02-08 中国科学院长春光学精密机械与物理研究所 A kind of high-precision measuring method of optical glass refractive index
CN1746648A (en) * 2005-10-31 2006-03-15 中国科学院光电技术研究所 A kind of deep aspherical mirror detection system with big bore
CN102889978A (en) * 2012-09-14 2013-01-23 中国科学院光电技术研究所 Device and method for detecting large-aperture window
CN104089963A (en) * 2014-07-02 2014-10-08 中国科学院长春光学精密机械与物理研究所 Detection method of subsurface defect of optical glass

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1324006A1 (en) * 2001-12-18 2003-07-02 QED Technologies, Inc. Simultaneous self-calibrated sub-aperture stitching for surface figure measurement ( interferometer )
CN1731148A (en) * 2004-11-02 2006-02-08 中国科学院长春光学精密机械与物理研究所 A kind of high-precision measuring method of optical glass refractive index
CN1746648A (en) * 2005-10-31 2006-03-15 中国科学院光电技术研究所 A kind of deep aspherical mirror detection system with big bore
CN102889978A (en) * 2012-09-14 2013-01-23 中国科学院光电技术研究所 Device and method for detecting large-aperture window
CN104089963A (en) * 2014-07-02 2014-10-08 中国科学院长春光学精密机械与物理研究所 Detection method of subsurface defect of optical glass

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
傅英: "光学材料折射率均匀性的子孔径拼接技术研究", 《中国优秀硕士学位论文全文数据库 工程科技Ⅱ辑》 *

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110337583A (en) * 2017-05-02 2019-10-15 林平 A kind of sample bearing device for infrared spectrometry
CN109406108A (en) * 2018-10-19 2019-03-01 中国兵器工业标准化研究所 The temperature impact evaluation of infrared optical material uniformity test and control method
WO2020078213A1 (en) * 2018-10-19 2020-04-23 中国兵器工业标准化研究所 Temperature impact assessment and control method for infrared optical material uniformity test
US10809191B1 (en) 2018-10-19 2020-10-20 China North Standardization Center Method for evaluating and controlling temperature influence on a homogeneity test for infrared optical materials

Also Published As

Publication number Publication date
CN106248350B (en) 2019-01-29

Similar Documents

Publication Publication Date Title
CN101709955B (en) Device for detecting surface shape of optical aspheric surface by sub-aperture stitching interferometer
KR100972571B1 (en) Aspheric lens surface-misalignment measuring method and apparatus
CN107421436B (en) Aspherical interferometer measuration system and method based on the spatial light modulator plane of reference
CN102620683B (en) Sub-aperture stitching detects the compensation method of aspheric surface alignment error
US9234739B2 (en) In situ calibration of interferometers
US10288522B2 (en) Characterizing the surface of a contact lens with an immersed reference prism
CN107782254B (en) A kind of mixed compensating mode sub-aperture stitching surface testing method
CN104949763B (en) A kind of lens wave-front optical aberration measurement method based on inverse Hartmann's principle
US7405833B2 (en) Method for calibration and removal of wavefront errors
CN107505684A (en) A kind of Method of Adjustment of microscope group
CN103217125A (en) Sub-aperture stitching-based high-accuracy planar optical element face type detection method
CN102297758A (en) Refractive index distribution measuring method and refractive index distribution measuring apparatus
CN102200432A (en) Aspheric object measuring method and apparatus
CN104713494B (en) The dual wavelength tuning interference testing device and method of Fourier transformation phase shift calibration
CN102243068B (en) Method for correcting system error during splicing sub-aperture
CN106767498B (en) It is a kind of for spherical lens face shape absolute calibration by microscopy Method of Adjustment and device
CN106248350A (en) The material homogeneity detection method of a kind of optical glass and device
US8576408B2 (en) Surface figure test method for large convex optical surfaces
KR101599204B1 (en) Alignment Method for high resolution optical system to minimize the performance of each optical field
CN105387805A (en) Splicing error detection method based on far-field light spot energy curve
Williby et al. Interferometric testing of soft contact lenses
Briguglio et al. Optical calibration of the E-ELT adaptive mirror M4: testing protocol and assessment of the measurement accuracy
CN115358132B (en) Interferometer thermal stability optimization method based on optical-mechanical thermal integration analysis
Zhang et al. Multidimensional stitching method with wavelength tuned interferometry and unconstrained support tooling for large-thin parallel plate
Palunas et al. The Magellan Telescopes: a performance update

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant