CN106227664A

CN106227664A - A kind of method and device testing application program

Info

Publication number: CN106227664A
Application number: CN201610587520.6A
Authority: CN
Inventors: 董文平
Original assignee: Huawei Technologies Co Ltd
Current assignee: Huawei Technologies Co Ltd
Priority date: 2016-07-22
Filing date: 2016-07-22
Publication date: 2016-12-14
Anticipated expiration: 2036-07-22
Also published as: CN106227664B

Abstract

The invention discloses a kind of method and device testing application program, described method includes: first terminal receives application scenarios and selects instruction, and wherein, described first terminal is provided with application program to be tested；Described first terminal selects instruction according to described application scenarios, determines the application scenarios to described Application testing to be tested；Described first terminal, from the corresponding relation of default application scenarios and sensor parameters, searches the sensor parameters corresponding to application scenarios determined；Described application program to be tested, based on the sensor parameters found, is tested by described first terminal, and using test result as the described application program to be tested test result under the application scenarios determined；Use the method and device of the present invention, the testing efficiency of application program can be improved.

Description

A kind of method and device testing application program

Technical field

The present invention relates to automatization testing technique field, particularly relate to a kind of method and device testing application program.

Background technology

Along with popularizing of intelligent terminal, intelligent terminal APP (Application, application program) is also developed rapidly.Logical Often, major part APP is required for, first from the sensor acquisition data of intelligent terminal, the most again the data gathered being analyzed place Reason, it is achieved corresponding function；Such as, note step APP is the application program of a kind of recordable user's walking number, and this application program needs head From the 3-axis acceleration sensor of intelligent terminal, first gather user's acceleration at X-axis, Y-axis and Z axis, the most again based on user At out-of-alignment acceleration, determine user's whether walking, the walking number of last counting user, be illustrated in the display of intelligent terminal In interface.

Owing to the operation of above-mentioned APP not only needs to rely on sensor acquisition data, but also different scenes need to be applicable to, The most above-mentioned note step APP need to be applicable to note step (such as taking a walk) and the note step of high-speed mobile scene of user's low speed mobile context (such as running).The most in the prior art, after developer develops a APP, APP is carried out by general employing following manner Test: first APP to be tested is installed to intelligent terminal, in order to APP can collect the data of sensor acquisition；Then, Manually arranging a scene, check that can this APP realize corresponding function under this scene, such as, tester selects to carry installation The intelligent terminal of meter step APP takes a walk, and checks whether this APP can realize remembering step function；Subsequently, manually convert scene, look into Seeing that can this APP realize corresponding function, such as, tester carries the intelligent terminal of installation meter step APP again and runs, and checks Whether this APP can realize remembering step function；So circulation, till all testing into all application scenarios of this APP.

Therefore, in the prior art, when a APP newly developed is tested, just need to this be manually set The different application scene of APP, then tests this APP under different application scene, such as, manually arranges APP to be tested Low-speed applications scene, and APP is tested, the high-speed applications scene of APP to be tested is the most manually set, and right APP carries out test etc., so that the inefficiency of test application program.

Summary of the invention

The embodiment of the present invention provides a kind of method and device testing application program, to improve the test effect of application program Rate.

First aspect, it is provided that a kind of method testing application program, including:

First terminal receives application scenarios and selects instruction, and wherein, described first terminal is provided with application program to be tested；

Described first terminal selects instruction according to described application scenarios, determines and answers described Application testing to be tested Use scene；

Described first terminal, from the corresponding relation of default application scenarios and sensor parameters, searches the applied field determined Sensor parameters corresponding to scape；Wherein, in described corresponding relation, the sensor parameters corresponding to arbitrary application scenarios be The second terminal under corresponding application scenarios is gathered, described second terminal is provided with multiple sensor；

Described application program to be tested, based on the sensor parameters found, is tested by described first terminal, and will Test result is as the described application program to be tested test result under the application scenarios determined.

Therefore, in the present invention, available preformed application scenarios and the corresponding relation of sensor parameters, right Multiple APP to be tested test under different application scene, often test a APP, i.e. people compared to of the prior art Work arranges different application scenarios, to obtain the sensor parameters of different application scene, improves testing efficiency.

In conjunction with first aspect, in the implementation that the first is possible, the sensor parameters that described first terminal finds The raw sensor parameter directly generated for sensor；Described first terminal, based on the sensor parameters found, is treated described Test application program is tested, and using test result as the survey under the application scenarios determined of the described application program to be tested Test result, including:

The raw sensor Parameters Transformation found is the available sensor parameters of application program by described first terminal；

The available sensor parameters of application program after conversion is depended on by described first terminal by the transmission channel preset Secondary cycle through to the first default memory area, so that described application program to be tested can be from the first default memory area Read available sensor parameters, and run according to the available sensor parameters read, generating run result；

Described first terminal obtains the operation result of described application program to be tested, and determines institute according to described operation result State the application program to be tested test result under current test application scenarios.

Due in actual applications, relative to the available sensor parameters of acquisition applications program, gather raw sensor Parameter is easier to, and in the present invention, gathers raw sensor parameter, can treat test program and test, then, use Said method, it is possible to decrease gather the difficulty of sensor parameters, thus reduce the difficulty of test application program.

In conjunction with first aspect, in the implementation that the second is possible, the sensor parameters that described first terminal finds For the available sensor parameters of application program, described raw sensory according to the available sensor parameters of described application program Device parameter is generated；Described application program to be tested, based on the sensor parameters found, is surveyed by described first terminal Examination, and using test result as the described application program to be tested test result under the application scenarios determined, including:

Available for the application program found sensor parameters is depended on by described first terminal by the transmission channel preset Secondary cycle through to the first default memory area, so that described application program to be tested can be from the first default memory area Read available sensor parameters, and run according to the available sensor parameters read, generating run result；

Due in the present invention, the sensor parameters gathered in advance is directly the available sensor parameters of application program, So, first terminal can directly utilize the sensor parameter and test application program to be tested, and without sensing The conversion of device parameter, thus improve testing efficiency.

In conjunction with the implementation that the first possible implementation of first aspect or the second of first aspect are possible, In the implementation that the third is possible, raw sensor parameter or application program that described first terminal finds are available Sensor parameters includes many groups, and the sensor parameters of different group is the most in the same time, is collected in the second terminal；Often Group sensor parameters includes the sensor parameters of different sensors；The number of described Preset Transfer passage is multiple, and a transmission Passage is corresponding to transmitting the sensor parameters of a sensor.

Due in actual applications, the sensor parameters of different sensors has different transmission channels, and in the present invention, All create a transmission channel for each sensor, with the real process that sensor transmits sensor parameters closer to, thus improve The accuracy of test.

In conjunction with the implementation that the first possible implementation of first aspect or the second of first aspect are possible, In the 4th kind of possible implementation, raw sensor parameter or application program that described first terminal finds are available Sensor parameters includes many groups, and the sensor parameters of different group is the most in the same time, is collected in the second terminal；Often Group sensor parameters includes the sensor parameters of different sensors；The number of described Preset Transfer passage is one, and this transmission Passage is for transmitting the sensor parameters of all the sensors.

Therefore, in the present invention, utilize a transmission channel to can transmit the sensor parameters of all the sensors, relatively In all creating a transmission channel for each sensor, save the cost creating transmission channel.

In conjunction with the implementation that the first possible implementation of first aspect or the second of first aspect are possible, In the 5th kind of possible implementation, described method also includes:

Described first terminal, when receiving stopping test instruction, stops sending the available sensor parameters of application program To the first memory area preset.

Due in the present invention, when first terminal receives the stopping test instruction of user, can stop sending sensor Parameter, thus stop the test of application program；Visible, user can control the stopping that testing whether of application program to be tested, thus Improve the practicality of this method of testing.

In conjunction with first aspect, in the 6th kind of possible implementation, described method also includes:

Described first terminal is when receiving the instruction increasing application scenarios and sensor parameters, from the second default storage The application scenarios and sensor parameters that need to increase is read in region, and described second memory area is previously stored with the applied field that need to increase Scape and sensor parameters；

Described first terminal, by the application scenarios read and sensor parameters, adds to described application scenarios and sensor ginseng In the corresponding relation of number.

Therefore, in the present invention, user can increase application scenarios corresponding with sensor parameters according to self-demand Application scenarios in relation and sensor parameters, thus improve the practicality of this method of testing.

In conjunction with first aspect, in the 7th kind of possible implementation, described method also includes:

Described first terminal, when receiving external sensor parameter test instruction, reads from the 3rd default memory area External sensor parameter；

Described application program to be tested, based on the sensor parameters read, is tested by described first terminal.

Therefore, in the present invention, user can be according to self-demand, and the sensor parameters outside utilization is answered to be tested Test by program, thus improve the practicality of this method of testing.

In conjunction with the implementation that the first possible implementation of first aspect or the second of first aspect are possible, In the 8th kind of possible implementation, described transmission channel is created by transmission path establishing equipment.

Therefore, in the present invention, user utilizes the transmission path establishing equipment within first terminal can create biography Defeated passage, relative to utilizing external equipment to create transmission channel, reduces the establishment difficulty of transmission channel.

Second aspect, it is provided that a kind of device testing application program, including:

Receive unit, be used for receiving application scenarios and select instruction；

Determine unit, select instruction for the described application scenarios received according to described reception unit, determine to be tested The application scenarios of Application testing；

Search unit, for from the corresponding relation of default application scenarios and sensor parameters, search and described determine list The sensor parameters corresponding to application scenarios that unit determines；Wherein, in described corresponding relation, corresponding to arbitrary application scenarios Sensor parameters, by gathered in the second terminal under corresponding application scenarios, is provided with multiple in described second terminal Sensor；

First test cell, for the sensor parameters found based on described lookup unit, to described application to be tested Program is tested, and using test result as the described application program to be tested test result under the application scenarios determined.

In conjunction with second aspect, in the implementation that the first is possible, described first test cell is at described lookup unit When the sensor parameters found is the raw sensor parameter that sensor directly generates, specifically for:

It is the available sensor parameters of application program by the raw sensor Parameters Transformation found；

By default transmission channel will conversion after the available sensor parameters of application program cycle through successively to The first memory area preset, so that described application program to be tested can read available from the first default memory area Sensor parameters, and run according to the available sensor parameters read, generating run result；

Obtain the operation result of described application program to be tested, and determine described application to be tested according to described operation result Program test result under current test application scenarios.

Due in actual applications, relative to the available sensor parameters of acquisition applications program, gather raw sensor Parameter is easier to, and in the present invention, gathers raw sensor parameter, can treat test program and test, then, use Said apparatus, it is possible to decrease gather the difficulty of sensor parameters, thus reduce the difficulty of test application program.

In conjunction with second aspect, in the implementation that the second is possible, described first test cell is at described lookup unit When the sensor parameters found is application program available sensor parameters, specifically for:

By default transmission channel available for the application program found sensor parameters cycled through successively to The first memory area preset, so that described application program to be tested can read available from the first default memory area Sensor parameters, and run according to the available sensor parameters read, generating run result；

In conjunction with the implementation that the first possible implementation of second aspect or the second of second aspect are possible, In the implementation that the third is possible, raw sensor parameter or application program that described lookup unit finds are available Sensor parameters includes many groups, and the sensor parameters of different group is the most in the same time, is collected in the second terminal；Often Group sensor parameters includes the sensor parameters of different sensors；The number of described Preset Transfer passage is multiple, and a transmission Passage is corresponding to transmitting the sensor parameters of a sensor.

In conjunction with the implementation that the first possible implementation of second aspect or the second of second aspect are possible, In the 4th kind of possible implementation, raw sensor parameter or application program that described lookup unit finds are available Sensor parameters includes many groups, and the sensor parameters of different group is the most in the same time, is collected in the second terminal；Often Group sensor parameters includes the sensor parameters of different sensors；The number of described Preset Transfer passage is one, and this transmission Passage is for transmitting the sensor parameters of all the sensors.

In conjunction with the implementation that the first possible implementation of second aspect or the second of second aspect are possible, In the 5th kind of possible implementation, described device also includes:

Stop transmitting element, for when receiving stopping test instruction, stopping sending the available sensing of application program Device parameter is to the first memory area preset.

Due in the present invention, when first terminal receives the stopping test instruction of user, can stop sending sensor Parameter, thus stop the test of application program；Visible, user can control the stopping that testing whether of application program to be tested, thus Improve the practicality of this test device.

In conjunction with second aspect, in the 6th kind of possible implementation, described device also includes:

First reads unit, for when receiving the instruction increasing application scenarios and sensor parameters, from default the Two memory areas read the application scenarios that need to increase and sensor parameters, and described second memory area is previously stored with and need to increase Application scenarios and sensor parameters；

Adding device, for the application scenarios that will read and sensor parameters, adds to described application scenarios and sensor In the corresponding relation of parameter.

Therefore, in the present invention, user can increase application scenarios corresponding with sensor parameters according to self-demand Application scenarios in relation and sensor parameters, thus improve the practicality of this test device.In conjunction with second aspect, the 7th Planting in possible implementation, described device also includes:

Second reads unit, for when receiving external sensor parameter test instruction, from the 3rd default memory block External sensor parameter is read in territory；

Second test cell, for based on the sensor parameters read, tests described application program to be tested.

Therefore, in the present invention, user can be according to self-demand, and the sensor parameters outside utilization is answered to be tested Test by program, thus improve the practicality of this test device.The first possible realization side in conjunction with second aspect The implementation that the second of formula or second aspect is possible, in the 8th kind of possible implementation, described transmission channel is Transmission path establishing equipment is created；

The third aspect, it is provided that a kind of equipment testing application program, described equipment at least includes memorizer and processor；

Described memorizer, is used for the program that stores and instruction；

Described processor, for program and instruction by calling storage in described memorizer, performs the survey of first aspect The method of examination application program.

Therefore, use the equipment of the test application program of the present invention, available preformed application scenarios and biography Multiple APP to be tested are tested, compared in prior art under different application scene by the corresponding relation of sensor parameter A APP of often test, different application scenarios is the most manually set, to obtain the sensor parameters of different application scene, improve Testing efficiency.

In embodiments of the present invention, in advance under different application scene, the second terminal gathers sensor parameters, is formed Application scenarios and the corresponding relation of sensor parameters；And in embodiments of the present invention, when developing a APP and being to be tested, described First APP to be tested need to be installed to first terminal by tester, and then tester can input application in first terminal Scene selects instruction, and first terminal can select instruction according to the application scenarios of tester's input, determines that APP to be tested needs to survey The application scenarios of examination；Then, from the corresponding relation of default application scenarios and sensor parameters, the application scenarios determined is searched Corresponding sensor parameters；Finally, APP to be tested is tested by first terminal based on the sensor parameters searched, and Using test result as the APP to be tested test result under the application scenarios determined.Therefore, in the embodiment of the present invention In, available preformed application scenarios and the corresponding relation of sensor parameters, to multiple APP to be tested in different application field Test under scape, often test a APP compared to of the prior art, different application scenarios is the most manually set, to obtain Take the sensor parameters of different application scene, improve testing efficiency.

Accompanying drawing explanation

In order to be illustrated more clearly that the embodiment of the present invention or technical scheme of the prior art, below will be to embodiment or existing In having technology to describe, the required accompanying drawing used is briefly described, it should be apparent that, the accompanying drawing in describing below is this Some bright embodiments, for those of ordinary skill in the art, it is also possible to obtain other accompanying drawing according to these accompanying drawings.

One flow chart of the test application program method that Fig. 1 provides for the embodiment of the present invention；

Fig. 2 reads a schematic diagram of sensor parameters for the APP that the embodiment of the present invention provides；

Another flow chart of the test application program method that Fig. 3 provides for the embodiment of the present invention；

Fig. 4 reads another schematic diagram of sensor parameters for the APP that the embodiment of the present invention provides；

Fig. 5 reads the another schematic diagram of sensor parameters for the APP that the embodiment of the present invention provides；

The another flow chart of the test application program method that Fig. 6 provides for the embodiment of the present invention；

One structural representation of the test application programmer that Fig. 7 provides for the embodiment of the present invention；

One structural representation of the test application devices that Fig. 8 provides for the embodiment of the present invention.

Detailed description of the invention

Below in conjunction with the accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is carried out clear, complete Describe, it is clear that described embodiment is only a part of embodiment of the present invention wholely, be not whole embodiments.

Embodiment one

The present invention provides a kind of method testing application program, and the method application scenarios is: developer develops a APP (Application, application program), all can be properly functioning under various application scenarios in order to ensure this APP, such as low speed Mobile solution scene and high-speed mobile application scenarios etc., need to test under different application scene this APP.

In embodiments of the present invention, before APP to be tested is tested, in advance APP to be tested need to be arranged on first In terminal；Described first terminal can for test used by computer, i.e. measuring and calculation machine, the operating system of described measuring and calculation machine Generally XP or Windows.Due in actual applications, APP to be tested be generally used for smart mobile phone, portable computer or In the equipment such as wearable smart machine, and the operating system of the said equipment is generally Android operation system or IOS, because of This, in embodiments of the present invention, in order to install APP to be tested in measuring and calculation machine, need first to install in measuring and calculation machine The virtual opetrating system of APP to be tested, then installs APP to be tested in virtual opetrating system again.

In embodiments of the present invention, described first terminal is alternatively smart mobile phone, portable computer or wearable intelligence The equipment such as equipment；Due to the said equipment typically from belt sensor, and the said equipment typically periodically gathers and is given birth to from belt sensor The sensor parameters become, and the sensor parameters that will gather, after treatment, be stored in a predeterminable area, and the said equipment institute The all APP installed all will read sensor parameters from above-mentioned predeterminable area；Visible, set to above-mentioned APP to be tested is installed After Bei, APP to be tested also by reading sensor parameters from the predeterminable area of the said equipment, therefore, in embodiments of the present invention, needs Close the function gathering the sensor parameters generated from belt sensor in the said equipment in advance, or, control APP to be tested and forbid Read the sensor parameters generated in the said equipment from belt sensor.

And the method for the test application program that the present invention provides, as it is shown in figure 1, at least comprise the following steps:

Step S11: first terminal receives application scenarios and selects instruction；

In embodiments of the present invention, described first terminal can specifically provide the man-machine friendship machine interface for test, described In human-computer interaction interface, the icon of different application scene can be provided with；Tester can select by clicking on application scenarios icon APP to be tested is tested by different application scenarios；

Or, in embodiments of the present invention, described human-computer interaction interface can provide an input frame, is tested by above-mentioned input frame Personnel can input different application scenarios and select to instruct, and the application scenarios selection instruction of such as tester's input can be " select application scenarios * ".

In embodiments of the present invention, the application scenarios that described first terminal is received selects instruction can be specially tester Trigger the operation of application scenarios icon, or the instruction that tester inputs at above-mentioned input frame.

Step S12: first terminal selects instruction according to described application scenarios, determines described Application testing to be tested Application scenarios；

In embodiments of the present invention, the instruction that such as first terminal is received is the trigger action of " application scenarios A icon ", So, first terminal can determine that the application scenarios testing APP to be tested that tester is selected is A；For another example, first terminal The instruction received is " select application scenarios A ", then first terminal also can determine that tester selected to be tested The application scenarios of APP test is A；.

Step S13: first terminal is from the corresponding relation of default application scenarios and sensor parameters, and what lookup determined should With the sensor parameters corresponding to scene；

Step S14: described application program to be tested, based on the sensor parameters found, is surveyed by described first terminal Examination, and using test result as the described application program to be tested test result under the application scenarios determined.

In embodiments of the present invention, tester to APP to be tested testing under the application scenarios currently determined Cheng Hou, tester can select Another Application scene to test APP to be tested again in first terminal, and first terminal will Repeat above-mentioned steps S11-S14, till the testing into of all application scenarios to APP to be tested.

Therefore, in embodiments of the present invention, in advance under different application scene, the second terminal gathers sensor Parameter, forms the corresponding relation of application scenarios and sensor parameters；And in embodiments of the present invention, when developing, a APP is to be measured During examination, first APP to be tested need to be installed to first terminal by described tester, and then tester can be in first terminal Input application scenarios selects instruction, and first terminal can select instruction according to the application scenarios of tester's input, determines to be measured The application scenarios that examination APP need to test；Then, from the corresponding relation of default application scenarios and sensor parameters, lookup determines Sensor parameters corresponding to application scenarios；Finally, APP to be tested is carried out by first terminal based on the sensor parameters searched Test, and using test result as the APP to be tested test result under the application scenarios determined.Therefore, in the present invention In embodiment, available preformed application scenarios and the corresponding relation of sensor parameters, to multiple APP to be tested in difference Test under application scenarios, often test a APP compared to of the prior art, different applied field is the most manually set Scape, to obtain the sensor parameters of different application scene, improves testing efficiency.

Embodiment two

A kind of method that present invention also offers application scenarios obtained in embodiment one and sensor parameters corresponding relation, Specific as follows:

The most manually arrange the second terminal to be under an application scenarios, then gather the biography of all the sensors in the second terminal Sensor parameter, forms the sensor parameters corresponding to this application scenarios；Such as, the second terminal is manually set and is in running applied field Under scape, the most manually carry the second terminal and run, gather the sensor ginseng of all the sensors in the second terminal the most at this moment Number；

Concrete, owing in actual applications, the second terminal being provided with various sensor, and each sensor all can Generate sensor parameters in real time；In embodiments of the present invention, the operating system of the second terminal provides at driver, hardware connects Mouthful unit and sensor-service unit, in Android operation system, described driver can be specially Kernel and drive, described firmly Part interface unit can be specially HAL layer, and described sensor-service unit can be specially the sensor garment of Android Framework framework Business unit.

In embodiments of the present invention, as in figure 2 it is shown, so that the second terminal to be provided with tri-sensors of A, B, C, describe in detail APP in second terminal is installed, the process of acquisition sensor parameters:

First driver can periodically read the raw sensor that sensors A, sensor B and sensor C generate Parameter；And the A memory area of the raw sensor parameter read-in hardware interface unit that sensors A generated, by sensor B institute The B memory area of the raw sensor parameter read-in hardware interface unit generated, the raw sensor generated by sensor C is joined The C memory area of number write hardware interface unit；

Simultaneously because the raw sensor parameter that sensor directly generates, APP can not directly apply, therefore, and hardware interface The raw sensor Parameters Transformation that each sensor is generated is also the available sensor parameters of APP by unit, finally, will turn Sensor parameters after changing sends to memory area corresponding to sensor-service unit, stores；Therefore, hardware interface The raw sensor parameter of the sensors A that A memory area is also stored by unit, changes, and by the sensor ginseng after conversion Number writes the A ' memory area to sensor-service unit, the raw sensor ginseng of the sensor B stored by B memory area Number, changes, and by the B ' memory area in the sensor parameters write after conversion to sensor-service unit, is stored by C The raw sensor parameter of the sensor C of region storage, changes, and writes the sensor parameters after conversion to sensor C ' memory area in service unit.

Finally, the APP in the second terminal is by the demand according to self, from the A ' memory area of sensor-service unit, B ' Memory area or C ' memory area read sensor parameters.

Optionally, in embodiments of the present invention, can be when different when, each memory area in acquisition hardware interface unit Raw sensor parameter, form sensor parameters corresponding to current scene；Such as, in embodiments of the present invention, can time Carving 1, the memory area A at hardware interface unit gathers the raw sensor parameter of sensors A respectively, gathers at memory area B The raw sensor parameter of sensor B, gathers the raw sensor parameter of sensor C, then form one group of biography at memory area C Sensor parameter；Then, then in the moment 2, the raw sensor parameter of sensors A is gathered at the memory area A of hardware interface unit, Gather the raw sensor parameter of sensor B at memory area B, gather the raw sensor ginseng of sensor C at predeterminable area C Number, forms another group sensor parameters；The like, till the sensor parameters gathered reaches preset requirement.Finally, The many groups sensor parameters that will be gathered, as the sensor parameters corresponding to current scene；

Optionally, in embodiments of the present invention, also each storage in sensor-service unit can be gathered when different when Sensor parameters after the conversion of region storage, forms the sensor parameters corresponding to current scene；Still continue to use above-mentioned act, at this In bright embodiment, can be in the moment 1, the biography after the conversion of memory area A ' the collection sensors A of sensor-service unit respectively Sensor parameter, the sensor parameters after memory area B ' gathers the conversion of sensor B, gather sensor C at memory area C ' Conversion after sensor parameters, then form one group of sensor parameters；Then, then in the moment 2, at sensor-service unit Memory area A ' gathers the sensor parameter after the conversion of sensors A, the sensor after memory area B ' gathers sensor B conversion Parameter, the sensor parameters after predeterminable area C ' gathers sensor C conversion, form another group sensor parameters；The like, Till the sensor parameters gathered reaches preset requirement.Finally, the many groups sensor parameters that will be gathered, as currently Sensor parameters corresponding to scene.

In embodiments of the present invention, after the sensor parameters collection corresponding to current scene completes；Also can manually arrange Other application scenarios, repeats said process, can obtain the sensor parameters corresponding to all scenes；Ultimately form application Scene and the corresponding relation of sensor parameters, store to first terminal, or in the storage device outside first terminal.Pass through Above-mentioned discussion understands, and in embodiments of the present invention, the sensor parameters corresponding to each application scenarios includes many groups, and often organizes biography Sensor parameter includes the sensor parameters of different sensors.

Therefore, in embodiments of the present invention, the corresponding relation of application scenarios and sensor parameters can be obtained.

Embodiment three

By the discussion of embodiment two, in the described application scenarios corresponding relation with sensor parameters, described biography Sensor parameter can be the raw sensor parameter that sensor directly generates, it is possible to for the APP available sensor ginseng after conversion Number；Therefore, in embodiments of the present invention, the sensor parameters found at first terminal be sensor directly generate original During sensor parameters, as it is shown on figure 3, step S14 in above-described embodiment one: first terminal is based on the sensor ginseng found Number, tests described application program to be tested, and should determine as described application program to be tested using test result With the test result under scene can particularly as follows:

Step S31: the raw sensor Parameters Transformation found is the available sensor of application program by first terminal Parameter；

Step S32: the available sensor of application program after conversion is joined by first terminal by the transmission channel preset Number cycles through successively to the first default memory area；

Owing in actual applications, sensor is continuously generated sensor parameters, and APP is also that constantly circulation is read Newly-generated sensor parameters, and according to the sensor parameters of up-to-date reading, run.And in above-mentioned application scenarios and biography In the corresponding relation of sensor parameter, the sensor parameters gathered in the second terminal in advance is limited, therefore in the present invention In embodiment, generate the process of sensor parameters in real time to simulate the sensor, be provided with one or more transmission channel, Gathered sensor parameters is cycled through by this transmission channel；

Optionally, in embodiments of the present invention, the number of the transmission channel preset can be multiple, and a passage is corresponding to passing Send the sensor parameters of a sensor；In embodiments of the present invention, described first terminal is installed the operating system of APP to be tested At least can provide hardware interface unit and sensor-service unit, in Android operation system, described hardware interface unit can have Body is HAL layer, and described HAL layer is the interface layer between operating system nucleus and hardware circuit, and described sensor-service unit can It is specially the sensor-service region in Android framework Framework.

In embodiments of the present invention, the transmission path establishing equipment in first terminal can be specifically utilized to create transmission channel, Described transmission path establishing equipment can be specially Uinput virtual unit.

In embodiments of the present invention, by with the sensor parameters corresponding to current test application scenarios, including two groups of sensings Device parameter, respectively following as a example by, describe the present invention in detail and send the process of sensor parameters:

First group: the sensor parameters A1 of sensors A, the sensor ginseng of the sensor parameters B1 of sensor B, sensor C Number C1；

Second group: the sensor parameters A2 of sensors A, the sensor ginseng of the sensor parameters B2 of sensor B, sensor C Number C2.

In embodiments of the present invention, owing to each group of sensor parameters includes three sensors, therefore, as shown in Figure 4, wound The transmission channel built can be specially three, respectively transmission channel A, transmission channel B and transmission channel C, and transmission channel A pair Should be in the sensor parameters of transmission sensors A, transmission channel B is corresponding to transmitting the sensor parameters of sensor B, transmission channel C Corresponding to transmitting the sensor parameters of sensor C；

In embodiments of the present invention, can be first by the sensor parameters A1 of sensors A, the sensing of sensor B of first group Device parameter B1, and the sensor parameters C1 of sensor C, respectively by corresponding transmission channel A, transmission channel B, and transmission Channel C is sent to memory area A corresponding to hardware interface unit, memory area B and memory area C, then, hardware interface list Unit, will storage again by memory area A ' corresponding for the sensor parameters A1 write of memory area A storage to sensor-service unit Memory area C, to memory area B ' corresponding to sensor-service unit, is stored by the sensor parameters B1 write of region B storage Sensor parameters C1 write is to memory area C ' corresponding to sensor-service unit；

And after first group of sensor parameters transmission completes, it is spaced preset duration, according still further to said method by second group of biography Sensor parameter is sent to the default memory area of sensor-service unit；Transmit first group of sensor parameters the most again, so follow Ring, until receiving stopping test instruction, then stops sending sensor parameters.

And APP to be tested specifically can read the up-to-date sensing of sensors A by the memory area A ' from sensor-service unit Device parameter, reads the newest sensor parameter of sensor B from memory area B ', reads the up-to-date of sensor C from memory area C ' Sensor parameters.

It should be noted that in the embodiment of the present invention, application scenarios can specifically store with the corresponding relation of sensor parameters At hardware interface unit, hardware interface unit can specifically perform the S11-S14 in embodiment one；And for analog sensor parameter True gatherer process, when the sensor parameters corresponding to hard connection interface unit obtains current test application scenarios, the most directly Connect and write to sensor-service unit, but by corresponding transmission channel, sensor parameters is resent to self.

Optionally, in embodiments of the present invention, as it is shown in figure 5, the transmission channel created also can be specially one, and should Transmission channel is for transmitting the sensor parameters of all the sensors；In embodiments of the present invention, still continue to use the example above, illustrate to send out Send the detailed process of sensor parameters:

Currently test the sensor parameters corresponding to application scenarios, including two sensors parameter, the following is respectively:

In embodiments of the present invention, can be first by the sensor parameters A1 of the sensors A in first group, sensor B Sensor parameters B1 and the sensor parameters C1 of sensor C, pass sequentially through transmission channel and be sent to hardware interface unit；And Each sensor parameters that hardware interface unit will be received, is sent to sensor-service unit, and sensor-service unit will Each sensor parameters stores to corresponding memory area, and such as, sensor-service unit can be by the sensor parameters of sensors A A1 stores to memory area A ', stores the sensor parameters B1 of sensor B to memory area B ', by the sensor of sensor C Parameter C1 stores to memory area C '；Then after first group of sensor parameters transmission completes, then it is spaced preset duration, according to upper The method of stating transmits second group of sensor parameters, transmits first group of sensor parameters the most again, so circulates, until receiving stopping Test instruction, then stop sending sensor parameters.And the memory area corresponding from sensor-service unit of APP to be tested reads Sensor parameters,；

In embodiments of the present invention, in the human-computer interaction interface being used for test that first terminal provides, it is also provided with stopping Test icon；When tester to stop test, test icon can be triggered；And it is corresponding, when the stopping of first terminal is surveyed Attempt tag splice when receiving trigger action, then stop sending that application program is available and sensor parameters is to the first memory block preset Territory；Or, in embodiments of the present invention, when tester to stop test, also can be at the input frame of above-mentioned human-computer interaction interface Middle input stops test instruction；And when first terminal receives the stopping test instruction of input frame input, i.e. stopping transmission should With the available sensor parameters of program to the first memory area preset.

Step S33: application program to be tested reads available sensor parameters from the first default memory area, and depends on Run according to the available sensor parameters read, generating run result；

Step S34: first terminal obtains the operation result of described application program to be tested, and true according to described operation result The fixed described application program to be tested test result under current test application scenarios.

Therefore, in embodiments of the present invention, when the sensor parameters gathered in advance is raw sensor parameter, can APP to be tested is tested.

Embodiment four

By the discussion of embodiment two, in the described application scenarios corresponding relation with sensor parameters, described biography Sensor parameter can be the raw sensor parameter that sensor directly generates, it is possible to for the APP available sensor ginseng after conversion Number；Therefore, in embodiments of the present invention, the sensor parameters found at first terminal is the available sensing of application program During device parameter, as shown in Figure 6, step S14 in above-described embodiment one: first terminal is based on the sensor parameters found, right Described application program to be tested is tested, and using test result as described application program to be tested at the application scenarios determined Under test result can particularly as follows:

Step S61: the available sensor of application program found is joined by first terminal by the transmission channel preset Number cycles through successively to the first default memory area；

In embodiments of the present invention, the number of the transmission channel preset can be multiple, and a passage is corresponding to transmitting a biography The sensor parameters of sensor；The transmission channel preset also can be specially one, and this transmission channel is used for transmitting all the sensors Sensor parameters；And about the method for transmission channel transmission sensor parameter, can be referring specifically to the record of embodiment four, at this Repeat no more.

Step S62: application program to be tested can read available sensor parameters from the first default memory area, and Run according to the available sensor parameters read, generating run result；

Step S63: first terminal obtains the operation result of described application program to be tested, and true according to described operation result The fixed described application program to be tested test result under current test application scenarios.

Therefore, in embodiments of the present invention, when the sensor parameters gathered in advance is the available biography of application program During sensor parameter, APP to be tested can be tested.

Embodiment five

In embodiments of the present invention, in the human-computer interaction interface being used for test that described first terminal provides, may also include Increase icon；The application scenarios of storage and answering in the corresponding relation of sensor parameters in tester need to increase first terminal During with scene and sensor parameters, the application scenarios that need to increase and sensor parameters can be stored to default second by tester Memory area, described first memory area can be the memory area within first terminal, it is possible to for the storage of External memory equipment Region；Then tester clicks on increase icon, and described first terminal can receive increase application scenarios and sensor parameters Instruction, described first terminal i.e. reads the application scenarios that need to increase and sensor parameters from the second memory area, and will read Application scenarios and sensor parameters, add to the corresponding relation of described application scenarios and sensor parameters.

In embodiments of the present invention, described tester also can input from the input frame that above-mentioned human-computer interaction interface provides Increase the instruction of application scenarios and sensor parameters；And first terminal is when receiving above-mentioned instruction, perform from the second memory block Territory, reads the application scenarios and sensor parameters that need to increase, and by the application scenarios read and sensor parameters, adds to institute State in the corresponding relation of application scenarios and sensor parameters.

Therefore, in embodiments of the present invention, tester can increase application scenarios and sensor parameters according to demand Corresponding relation in application scenarios and sensor parameters.

Embodiment six

In embodiments of the present invention, in the human-computer interaction interface that described first terminal provides, may also include external sensor Parameter testing button；And if the sensor parameters that tester does not stores in wanting to utilize first terminal, APP to be tested is carried out Test, first the sensor parameter can be stored to the 3rd default memory area, described 3rd storage by described tester Region can be the memory area within first terminal, it is possible to for the memory area of External memory equipment；Then tester triggers Described external sensor parameter testing button, corresponding first terminal will receive the instruction of external sensor parameter test, so After will from the 3rd memory area read sensor parameters, be then based on read sensor parameters, to described application to be tested Program is tested, and test result is presented in human-computer interaction interface.

In embodiments of the present invention, in the input frame that described tester also can provide in human-computer interaction interface outside input The instruction of portion's sensor parameters test, and described first terminal is when receiving above-mentioned instruction, will perform " from the 3rd memory area Read sensor parameters, based on the sensor parameters read, described application program to be tested is tested, and test is tied Fruit is presented in human-computer interaction interface " this instruction.

Therefore, in embodiments of the present invention, the sensor parameters that available first terminal does not stores, to be tested APP tests.

Embodiment seven

Corresponding with above-mentioned a kind of embodiment of the method testing application program, the present invention also provides for a kind of test application journey The device of sequence, as it is shown in fig. 7, at least include:

Receive unit 601, be used for receiving application scenarios and select instruction；

Determine unit 602, select instruction for the described application scenarios received according to described reception unit, determine to be measured The application scenarios of examination Application testing；

Search unit 603, for from the corresponding relation of default application scenarios and sensor parameters, search and described determine The sensor parameters corresponding to application scenarios that unit determines；Wherein, in described corresponding relation, corresponding to arbitrary application scenarios Sensor parameters by what the second terminal under corresponding application scenarios was gathered, described second terminal is provided with many Individual sensor；

First test cell 604, for the sensor parameters that finds based on described lookup unit, to described to be tested should Test by program, and using test result as described application program to be tested under the application scenarios determined test knot Really.

Optionally, the sensor parameters that the first test cell 604 finds at lookup unit 603 is that sensor directly generates Raw sensor parameter time, specifically for: be the available biography of application program by the raw sensor Parameters Transformation found Sensor parameter；By default transmission channel will conversion after the available sensor parameters of application program cycle through successively to The first memory area preset, so that described application program to be tested can read available from the first default memory area Sensor parameters, and run according to the available sensor parameters read, generating run result；Obtain described to be tested The operation result of application program, and determine that described application program to be tested is currently testing application scenarios according to described operation result Under test result.

Optionally, the first test cell 604 is that application program may utilize at the sensor parameters that lookup unit 603 finds Sensor parameters time, specifically for: by default transmission channel, the available sensor of application program that finds is joined Number cycles through successively to the first default memory area, so that described application program to be tested can be from the first default storage Available sensor parameters is read in region, and runs according to the available sensor parameters read, and generating run is tied Really；Obtain the operation result of described application program to be tested, and determine described application program to be tested according to described operation result Test result under current test application scenarios.

Optionally, raw sensor parameter or the available sensor parameters of application program that unit 603 finds is searched Including many groups, and the sensor parameters of different group is the most in the same time, is collected in the second terminal；Often group sensor ginseng Number includes the sensor parameters of different sensors；The number of described Preset Transfer passage is multiple, and a transmission channel corresponds to Transmit the sensor parameters of a sensor.

Optionally, raw sensor parameter or the available sensor parameters of application program that unit 603 finds is searched Including many groups, and the sensor parameters of different group is the most in the same time, is collected in the second terminal；Often group sensor ginseng Number includes the sensor parameters of different sensors；The number of described Preset Transfer passage is one, and this transmission channel is used for passing Send the sensor parameters of all the sensors.

Optionally, described device also includes: stop transmitting element, for when receiving stopping test instruction, stopping sending out Send the described sensor parameters the first memory area to presetting.

Optionally, described device also includes: first reads unit, for receiving increase application scenarios and sensor ginseng During the instruction counted, read the application scenarios and sensor parameters that need to increase, described second storage from the second default memory area Region is previously stored with the application scenarios and sensor parameters that need to increase；Adding device, for the application scenarios that will read and biography Sensor parameter, adds to the corresponding relation of described application scenarios and sensor parameters.

Optionally, described device also includes: second reads unit, for receiving external sensor parameter test instruction Time, reading external sensor parameter from the 3rd default memory area, described 3rd memory area is previously stored with described first The sensor parameters not stored in terminal；Second test cell, for based on the sensor parameters read, to described to be tested Application program is tested.

Embodiment eight

Based on above-mentioned same idea, as described in Figure 8, the present invention also provides for a kind of equipment testing application program, described in set Include memorizer 71 and processor 72 less；

Memorizer 71, is used for the program that stores and instruction；

Processor 72, for program and instruction by calling storage in memorizer, performs:

Receive application scenarios and select instruction；

Select instruction according to described application scenarios, determine the application scenarios to described Application testing to be tested；

From the default application scenarios corresponding relation with sensor parameters, search the biography corresponding to application scenarios determined Sensor parameter；Wherein, in described corresponding relation, the sensor parameters corresponding to arbitrary application scenarios is in corresponding application The second terminal under scene is gathered, described second terminal is provided with multiple sensor；

Based on the sensor parameters found, described application program to be tested is tested, and using test result as The described application program to be tested test result under the application scenarios determined.

Wherein, bus architecture can include bus and the bridge of any number of interconnection, specifically represented by processor Or the various electrical chains of memorizer that multiple processor and memorizer represent are connected together.Bus architecture can also be by such as peripheral Other electrical chains various of equipment, manostat and management circuit or the like are connected together, and these are all well known in the art , therefore, the most no longer it is described further.EBI provides interface.Processor be responsible for bus architecture and Common process, memorizer can store the data that processor is used when performing operation.

Those skilled in the art are it should be appreciated that embodiments of the invention can be provided as method, system or computer program Product.Therefore, the reality in terms of the present invention can use complete hardware embodiment, complete software implementation or combine software and hardware Execute the form of example.And, the present invention can use at one or more computers wherein including computer usable program code The upper computer program product implemented of usable storage medium (including but not limited to disk memory, CD-ROM, optical memory etc.) The form of product.

The present invention is with reference to method, equipment (system) and the flow process of computer program according to embodiments of the present invention Figure and/or block diagram describe.It should be understood that can the most first-class by computer program instructions flowchart and/or block diagram Flow process in journey and/or square frame and flow chart and/or block diagram and/or the combination of square frame.These computer programs can be provided Instruction arrives the processor of general purpose computer, special-purpose computer, Embedded Processor or other programmable data processing device to produce A raw machine so that the instruction performed by the processor of computer or other programmable data processing device is produced for real The device of the function specified in one flow process of flow chart or multiple flow process and/or one square frame of block diagram or multiple square frame now.

These computer program instructions may be alternatively stored in and computer or other programmable data processing device can be guided with spy Determine in the computer-readable memory that mode works so that the instruction being stored in this computer-readable memory produces and includes referring to Make the manufacture of device, this command device realize at one flow process of flow chart or multiple flow process and/or one square frame of block diagram or The function specified in multiple square frames.

These computer program instructions also can be loaded in computer or other programmable data processing device so that at meter Perform sequence of operations step on calculation machine or other programmable devices to produce computer implemented process, thus at computer or The instruction performed on other programmable devices provides for realizing at one flow process of flow chart or multiple flow process and/or block diagram one The step of the function specified in individual square frame or multiple square frame.

Although preferred embodiments of the present invention have been described, but those skilled in the art once know basic creation Property concept, then can make other change and amendment to these embodiments.So, claims are intended to be construed to include excellent Select embodiment and fall into all changes and the amendment of the scope of the invention.

Obviously, those skilled in the art can carry out various change and modification without deviating from this to the embodiment of the present invention The spirit and scope of bright embodiment.So, if these amendments of the embodiment of the present invention and modification belong to the claims in the present invention And within the scope of equivalent technologies, then the present invention is also intended to comprise these change and modification.

Claims

1. the method testing application program, it is characterised in that including:

Described first terminal selects instruction according to described application scenarios, determines the applied field to described Application testing to be tested Scape；

Described first terminal, from the corresponding relation of default application scenarios and sensor parameters, searches the application scenarios institute determined Corresponding sensor parameters；Wherein, in described corresponding relation, the sensor parameters corresponding to arbitrary application scenarios is relatively The second terminal under the application scenarios answered is gathered, described second terminal is provided with multiple sensor；

Method the most according to claim 1, it is characterised in that the sensor parameters that described first terminal finds is sensing The raw sensor parameter that device directly generates；

Described application program to be tested, based on the sensor parameters found, is tested by described first terminal, and will test Result as the described application program to be tested test result under the application scenarios determined, including:

The available sensor parameters of application program after conversion is followed successively by described first terminal by the transmission channel preset The first memory area preset is delivered in environment-development, so that described application program to be tested can read from the first default memory area Available sensor parameters, and run according to the available sensor parameters read, generating run result；

Described first terminal obtain described application program to be tested operation result, and according to described operation result determine described in treat Test application program test result under current test application scenarios.

Method the most according to claim 1, it is characterised in that the sensor parameters that described first terminal finds is application The available sensor parameters of program, described raw sensor parameter according to the available sensor parameters of described application program Generated；

Available for the application program found sensor parameters is followed successively by described first terminal by the transmission channel preset The first memory area preset is delivered in environment-development, so that described application program to be tested can read from the first default memory area Available sensor parameters, and run according to the available sensor parameters read, generating run result；

The most according to the method in claim 2 or 3, it is characterised in that the raw sensor ginseng that described first terminal finds Number or the available sensor parameters of application program include many groups, and the sensor parameters of different group is the most in the same time, the Two terminals are collected；Often group sensor parameters includes the sensor parameters of different sensors；Described Preset Transfer passage Number be multiple, and a transmission channel corresponding to transmit a sensor sensor parameters.

The most according to the method in claim 2 or 3, it is characterised in that the raw sensor ginseng that described first terminal finds Number or the available sensor parameters of application program include many groups, and the sensor parameters of different group is the most in the same time, the Two terminals are collected；Often group sensor parameters includes the sensor parameters of different sensors；Described Preset Transfer passage Number be one, and this transmission channel is for transmitting the sensor parameters of all the sensors.

The most according to the method in claim 2 or 3, it is characterised in that described method also includes:

Described first terminal, when receiving stopping test instruction, stops sending the available sensor parameters of application program in advance If the first memory area.

Method the most according to claim 1, it is characterised in that described method also includes:

Described first terminal is when receiving the instruction increasing application scenarios and sensor parameters, from the second default memory area Application scenarios that reading need to increase and sensor parameters, described second memory area be previously stored with the application scenarios that need to increase with Sensor parameters；

Described first terminal, by the application scenarios read and sensor parameters, adds to described application scenarios and sensor parameters In corresponding relation.

Described first terminal, when receiving external sensor parameter test instruction, reads outside from the 3rd default memory area Sensor parameters, the sensor parameters that described 3rd memory area does not stores in being previously stored with described first terminal；

9. the device testing application program, it is characterised in that including:

Determine unit, select instruction for the described application scenarios received according to described reception unit, determine application to be tested The application scenarios of program test；

Search unit, for from the corresponding relation of default application scenarios and sensor parameters, search and described determine that unit is true The fixed sensor parameters corresponding to application scenarios；Wherein, the sensing in described corresponding relation, corresponding to arbitrary application scenarios Device parameter, by gathered in the second terminal under corresponding application scenarios, is provided with multiple sensing in described second terminal Device；

First test cell, for the sensor parameters found based on described lookup unit, to described application program to be tested Test, and using test result as the described application program to be tested test result under the application scenarios determined.

Device the most according to claim 9, it is characterised in that described first test cell is searched at described lookup unit To sensor parameters be the raw sensor parameter that sensor directly generates time, specifically for:

By default transmission channel, the available sensor parameters of application program after conversion is cycled through successively to presetting The first memory area so that described application program to be tested can read available sensing from default first memory area Device parameter, and run according to the available sensor parameters read, generating run result；

Obtain the operation result of described application program to be tested, and determine described application program to be tested according to described operation result Test result under current test application scenarios.

11. devices according to claim 9, it is characterised in that described first test cell is searched at described lookup unit To sensor parameters be application program available sensor parameters time, specifically for:

By default transmission channel, available for the application program found sensor parameters is cycled through successively to presetting The first memory area so that described application program to be tested can read available sensing from default first memory area Device parameter, and run according to the available sensor parameters read, generating run result；

12. according to the device described in claim 10 or 11, it is characterised in that the raw sensor that described lookup unit finds Parameter or the available sensor parameters of application program include many groups, and the sensor parameters of different group is the most in the same time, Second terminal is collected；Often group sensor parameters includes the sensor parameters of different sensors；Described Preset Transfer leads to The number in road is multiple, and a transmission channel is corresponding to transmitting the sensor parameters of a sensor.

13. according to the device described in claim 10 or 11, it is characterised in that the raw sensor that described lookup unit finds Parameter or the available sensor parameters of application program include many groups, and the sensor parameters of different group is the most in the same time, Second terminal is collected；Often group sensor parameters includes the sensor parameters of different sensors；Described Preset Transfer leads to The number in road is one, and this transmission channel is for transmitting the sensor parameters of all the sensors.

14. according to the device described in claim 10 or 11, it is characterised in that described device also includes:

Stop transmitting element, for when receiving stopping test instruction, stopping sending the available sensing of described application program Device parameter is to the first memory area preset.

15. devices according to claim 9, it is characterised in that described device also includes:

First reads unit, for when receiving the instruction increasing application scenarios and sensor parameters, depositing from default second The application scenarios and sensor parameters that need to increase is read in storage area territory, and described second memory area is previously stored with the application that need to increase Scene and sensor parameters；

Adding device, for the application scenarios that will read and sensor parameters, adds to described application scenarios and sensor parameters Corresponding relation in.

16. devices according to claim 9, it is characterised in that described device also includes:

Second reads unit, for when receiving external sensor parameter test instruction, reading from the 3rd default memory area Take external sensor parameter, the sensor parameters that described 3rd memory area does not stores in being previously stored with described first terminal；