CN106200617A - Test antiskid brake controls the method that device low temperature calculates model data - Google Patents
Test antiskid brake controls the method that device low temperature calculates model data Download PDFInfo
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- CN106200617A CN106200617A CN201610585005.4A CN201610585005A CN106200617A CN 106200617 A CN106200617 A CN 106200617A CN 201610585005 A CN201610585005 A CN 201610585005A CN 106200617 A CN106200617 A CN 106200617A
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0208—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the configuration of the monitoring system
- G05B23/0213—Modular or universal configuration of the monitoring system, e.g. monitoring system having modules that may be combined to build monitoring program; monitoring system that can be applied to legacy systems; adaptable monitoring system; using different communication protocols
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B2219/00—Program-control systems
- G05B2219/20—Pc systems
- G05B2219/24—Pc safety
- G05B2219/24065—Real time diagnostics
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Abstract
A kind of method testing antiskid brake control device low temperature calculating model data, under conditions of relation between variations in temperature and test period does not also have achievement in research, low-temperature model offer adequate data is revised in order to give, the low-temperature test point of the present invention is respectively as follows :-15 DEG C,-25 DEG C,-35 DEG C,-40 DEG C,-45 DEG C,-50 DEG C,-55 DEG C and-60 DEG C totally 8 points, contain HB5830.9 low-temperature test standard and specify that the maximum temperature of low temperature range is-55 DEG C for-25 DEG C and minimum temperature, the test data of low temperature overall process can be obtained, and meet GJB150 and specify the requirement that tolerance is ± 2 DEG C of low-temperature test.The present invention uses 8 low-temperature test point correction antiskid brakes to control the computation model of device, meets antiskid brake and controls the actually used situation of device, improve precision, reduce error, it is achieved that antiskid brake controls the Modifying model in device low temperature range.
Description
Technical field
The present invention relates to the low temperature fault diagnosis field of civilian airplane in transportation category electronic product, specifically a kind of at low temperature bar
Surveying the method that antiskid brake controls the response of device low temperature under part, low temperature response data is used for revising low-temperature model.
Background technology
Both at home and abroad the low-temperature test of electronic product is proved, during persistently reducing temperature, occur that cryogenic property is not
Qualified, but temperature raises and can recover normal performance.If continuing to reduce temperature to there will be the low temperature injury of electronic product, occur low
Even if the performance of electronic product at room temperature can not be recovered after temperature damage.
It is the electronic product in airplane brake system that antiskid brake controls device, aircraft provide working power, receiver
The wheel rotation speed change signal of telecommunication of wheel speed sensor impression, carries out the brake during landing antiskid brake according to this signal of telecommunication
Stress control.This antiskid brake controls device can complete normal land antiskid brake control, and take-off line brake controls, between wheel
Protection controls, and ground protection controls, and the wheel spline brake after undercarriage stowage etc. controls function.
The low temperature failure cause of electronic product has:
1, being organized under cryogenic conditions of a part of quasiconductor changes, and causes cisco unity malfunction；
2, solder joint ftractures under cryogenic；
3, pin fracture under cryogenic；
4, low temperature condensation punctures or short circuit.
The most conventional electronic product low temperature environment test standard has:
1, HB5830.9 " airborne equipment environmental condition and test method low temperature "；
2, GJB150A.4 " military equipment laboratory environment test method low-temperature test "；
3, MIL-STD-810F " environmental project considers and laboratory test 502.4 low temperature ".
Use software modeling to calculate for low temperature fault both at home and abroad, and study the correction technique of electronic product low-temperature model.
Use computer technology to set up antiskid brake and control the low-temperature model of device, need to use test data that this calculates mould
Type is modified, and makes the calculating error of low-temperature model in prescribed limit.
Foreign current situation:
The external low-temperature model using following technology correction electronic product:
1, Part I content is that the method using complete machine thermal response carries out thermal measurement, gives tested electronics under normal temperature condition
Product is energized, and after the temperature of electronic product no longer changes, connects with housing with the temperature sensor collection temperature of pcb board, pcb board
The temperature of synapsis and the temperature of housing outer surface, as the foundation of corrected Calculation model；
2, the second part is PBC plate heat distribution test: taken out by the PBC plate of electronic product, is applied to PBC with monochromatic glue
Measured surface, arranges test point on heater members, is energized under normal temperature condition tested electronic product, treats the heat self produced
After amount balance, carry out heat distribution test with temperature tracer device, finally give the temperature data of each components and parts on PBC plate, as repairing
The foundation of positive computation model；
3, MIL-HDBK-217F, MIL-STD-810F standard is used to carry out low temperature accident analysis.
External above-mentioned technology is used to there is following deficiency:
1, under product energising and normal temperature condition, the temperature of actual measurement housing, actual measurement pcb board, pcb board and housing contact position
Temperature, the temperature adjustmemt low temperature computation model of actual measurement housing outer surface, and the operating temperature that electronic product is under cryogenic is not
It is consistent completely, because have ignored the ambient temperature cooling effect to electronic product, and electronic product operating temperature rise effect, therefore
Revised error is big；
2, what MIL-HDBK-217F " reliability of electronic equipment estimates handbook " added up is the basic failure rate of electronic product,
Do not differentiate between high temperature, low temperature, vibration fault rate；
3, MIL-STD-810F not explanation tests the temperature of electronic product, in prediction on such basis under room temperature and power on condition
The low temperature impact on the electronic product life-span, does not therefore have depending on of abundance with the low-temperature model of room temperature measured data correction electronic product
According to.
Present status in China:
The temperature of domestic employing following technical testing electronic product, and according to test data correction low temperature computation model:
1, the fault rate of the anticipated electronic product of GJB299C " electronic product reliability estimates handbook " is used, but electric in standard
The fault rate statistics of sub-product is basic failure rate, does not differentiates between high temperature, low temperature, vibration fault rate；
2, low temperature checking is carried out according to GJB150A.4 " low-temperature test ", HB5830.9 " low temperature "；
3, the geo-thermal response test of electronic product: at normal temperatures electronic product is energized, applies the maximum of electronic product respectively
Power consumption and conventional power consumption, after waiting thermal balance, gather at each PBC plate and cabinet contact point and the temperature number of housing outer surface
According to；
4, PBC plate heat distribution test: be applied to PBC plate measured surface with single dumb light paint, arranges test on heater members
Point, applies maximum power dissipation and common function under normal temperature condition respectively, carries out heat with temperature sensor after temperature no longer changes
Distribution tests, finally gives the temperature data of each components and parts on PBC plate；
5, in the patent of invention of ZL201110310883.2, it is proposed that one determines airplane antiskid braking control box low temperature
The method of the working stress limit.The method uses 25 DEG C/min～the rate of temperature fall of 60 DEG C/min, and cooling step-length is 1 DEG C～5 DEG C,
Retention time 5min in every step-length, in every step-length, the performance test time is the technical scheme of 5min, in the mistake of stepping cooling
Journey is tested antiskid braking control box performance underproof temperature data occurs, occur that the underproof data of temperature are exactly temperature first
The degree working stress limit, reaches to determine the purpose of the working stress limit.The temperature of this invention is the ambient temperature within proof box,
Not testing the temperature-responsive of antiskid braking control box and components and parts thereof, this invention does not solve low-power consumption components and parts temperature-responsive
Problem, its technical scheme and the present invention are unrelated.
6, in the patent of invention of ZL201310699408.8, it is proposed that a kind of antiskid braking control box low temperature SST
Method.The method uses 5 DEG C/min～the rate of temperature fall of 25 DEG C/min, and cooling step-length is 5 DEG C～10 DEG C, keeps in every step-length
Time is 60min, and in every step-length, the performance test time is the technical scheme of 10min, and during stepping is lowered the temperature, test is anti-
There is underproof temperature data, the temperature data of test antiskid braking control box loss of function in sliding brake-control box performance, prevents
The temperature data of sliding brake-control box loss of function is exactly the temperature damage limiting range of stress, reaches to determine the mesh of the bursting stress limit
's.For example, the temperature hold-time of this invention is that proof box interior environment temperature arrives-55 DEG C and whole components and parts reach
It is 60min to the time differences of-55 ± 2 DEG C.50 thermocouples pasted by the components and parts that caloric value is maximum, this antiskid brake control
The maximum current of box processed is 0mA～20mA, and voltage is 28V, and peak power is 0.56 watt, lowers the temperature at 5 DEG C/min～25 DEG C/min
In can be implemented in 60min temperature hold-time under rate conditions, the temperature of all components and parts is controlled in the range of ± 2 DEG C,
And using 60min as the temperature stabilization times in follow-up low temperature SST.First, although this invention is in the big unit of caloric value
Paste 50 thermocouples on device, but do not carry out the overall process test of low temperature response；Secondly, the components and parts that test caloric value is big
The problem not solving low-power consumption components and parts temperature-responsive；3rd, the technical scheme of this invention solves antiskid braking control box
Low temperature damage Limits properties, is stepping low temperature and the relation of antiskid braking control box progressively loss of function, this technology and unit's device
Part temperature response problem in time is unrelated, and technical scheme and the present invention of this invention are unrelated.The technical scheme is that survey
Examination antiskid brake controls the low temperature of device and responds and be used for revising low temperature computation model.
There is following deficiency in the above-mentioned technology of domestic employing:
1, under normal temperature condition, test the temperature of electronic product, have ignored the low ambient temperature temperature drop effect to electronic product,
Erroneous judgement occurs；
2, GJB150 does not allow to test the temperature of electronic product at room temperature and power on condition, and low temperature is to electronics in prediction on such basis
The impact of product, temperature reduces the aging effects to electronic product and quantitatively illustrates currently without any standard, therefore with often
The low-temperature model of temperature measured data correction electronic product does not has the foundation of abundance.
3, invention 201110310883.2 test has obtained the low-temperature working limiting range of stress of antiskid braking control box, invention
201310169901.9 tests have obtained antiskid brake and have controlled the low temperature damage limit of device, and the invention of this binomial does not all carry out low temperature
The test of response.
Summary of the invention
For making up the deficiency not carrying out temperature-responsive test in prior art, for revising the low temperature response of low temperature computation model
Data provide foundation, and the present invention proposes a kind of method testing antiskid brake control device low temperature calculating model data.
The detailed process of the present invention is:
Step 1, determines that antiskid brake controls the temperature range of device low-temperature test
The first step, determines that antiskid brake controls the maximum temperature of device low-temperature test temperature range
Second step, determines that antiskid brake controls the minimum temperature of device low-temperature test
Determined by low-temperature test temperature range be-15 DEG C～-60 DEG C.In the range of temperature test, determine that low temperature is surveyed
The step-length of examination is 5 DEG C～10 DEG C.
Step 2, selects test equipment and temperature sensor: described test equipment includes low-temperature test chamber and temperature and humidity inspection
Instrument；Described sensor is thermocouple.
Select requiring to include of test equipment and sensor:
I low-temperature test chamber requires: temperature range: 30 DEG C～-80 DEG C, rate of temperature fall: 5 DEG C/min～15 DEG C/min is optional,
Low-temperature test chamber volume is 0.5m3～1m3, observation window to be had on test chamber door, side φ to be had 70mm～the wire of φ 100mm
Hole.
II temperature sensor requires: select T-shaped thermocouple, temperature-measuring range: 30 DEG C～-80 DEG C, I class precision, and this is anti-skidding stops
Panel and data board is had on truck control device.A T-shaped thermocouple is the most all pasted in 12 low-power consumption modules and components and parts.
III hygrothermograph requires: select U.S.'s Keithley hygrothermograph, for by each T-shaped thermocouple assay
Voltage signal is processed as temperature-responsive data, and can show the temperature-time curve of each components and parts.
Step 3, setup test equipment and antiskid brake control device
Specifically:
A set of antiskid brake control device is placed in low-temperature test chamber by I, and each T-shaped thermocouple is attached to 12 low merits respectively
On 5 outer surfaces of consumption components and parts and housing；In addition to the installation bottom surface that antiskid brake controls device case, remaining 5 outer surface
1 T-shaped thermocouple of each patch, for testing the temperature of housing.
Described low-power consumption components and parts are the components and parts that power consumption is less than 0.05 watt；12 low-power consumption components and parts are respectively: signal
Processor, memorizer, eight, four tunnel D/A converter, audion, ceramic condenser, Programmable Logic Device, microcontrollers monitor core
Sheet, 16 fixed point DSPs, memorizer, solid-state relay, Programmable Logic Device and bus transceiver.
Each T-shaped thermocouple is drawn from the wire guide of cryostat by II, is connected with hygrothermograph respectively；Stop anti-skidding
The cable of truck control device is drawn from the wire guide of cryostat, is connected with power supply sum counter respectively.
III closes low temperature chamber door, starts cooling；Control device to antiskid brake simultaneously and 20mA electric current is provided, pass through enumerator
Make antiskid brake control during unit simulation land brake/get off the brakes work.
Step 4, test:
In order to obtain continuous print low temperature response data and temperature time curve, component surface is not implemented temperature and control.
When under testing condition of different temperatures, antiskid brake controls the temperature of device, test temperature is from-15 DEG C～-60
DEG C, measure antiskid brake under each temperature spot successively and control the temperature of device.When testing temperature and being-15 DEG C～-35 DEG C, with-
Test for step-length for 10 DEG C；When testing temperature more than-35 DEG C～-60 DEG C, test with-5 DEG C for step-length；
Specifically:
I makes antiskid brake control device in running order；
The width that II antiskid brake control device is uncapped is 10mm, for being drawn by holding wire.The temperature of cryostat is dropped
To test temperature, hygrothermograph detect and record the numerical value of each test point each point temperature-responsive；Described temperature-responsive
Numerical value refers to the temperature-time curve of each test point each point, and reach this to test the speed and no longer change when being temperature.Now temperature and humidity inspection
The numerical value controlling Computer display each point temperature-responsive of instrument.Respectively obtain antiskid brake under-15 DEG C～-60 DEG C of each points to control
The temperature of device.
So far, complete this antiskid brake control device low temperature calculating model and need the test job of data.
In the present invention, selected test point comprises minimum temperature and the maximum temperature of low temperature range in use, at cryogenic temperature
In the range of each temperature test point on test antiskid brake control device temperature data, temperature sensor layout is in low-power consumption
On components and parts；Component surface temperature control is not carried out during low temperature response test.
The temperature data that present invention test obtains is supplied to antiskid brake and controls the low temperature computation model of device, for model
Revise.
The mistake produced in order to avoid all using room temperature to test data correction low temperature computation model in existing domestic and international technology
Difference, in order to provide the low temperature response data revising low temperature computation model, the present invention proposes antiskid brake and controls device low temperature number
According to method of testing.Room temperature is different with cryo physic concepts, and failure mechanism is different.Therefore prior art uses room temperature test data
Revise low-temperature model and hardly result in correct result.
Use the technology of the present invention correction antiskid brake to control the low temperature computation model of device, achieve following implementation result:
1, under conditions of the relation between variations in temperature and test period does not also have achievement in research, low temperature is revised in order to give
Model provide adequate data, the low-temperature test point of the present invention is :-15 DEG C ,-25 DEG C ,-35 DEG C ,-40 DEG C ,-45 DEG C ,-50
DEG C ,-55 DEG C ,-60 DEG C of totally 8 points, contain HB5830.9 low-temperature test standard specify the maximum temperature of low temperature range for-
25 DEG C are-55 DEG C with minimum temperature, it is possible to obtain the test data of low temperature overall process.Last point is the reason of-60 DEG C
It is that GJB150 specifies that the tolerance of low-temperature test is ± 2 DEG C, process of the test has the situation less than-55 DEG C, so determining last
One test point is-60 DEG C；The test of existing domestic and international technology room temperature cannot obtain the present invention omnidistance survey in using low temperature range
The effect of examination.
2, when using existing room temperature point data correction, its precision is ± 10%, ambient temperature range during calculating
It is exactly :-55 ± 5.5 DEG C that following two kinds of contrary result of calculations occur:
In computation model, ambient temperature can normally work for electronic product when-49.5 DEG C；
When in computation model, ambient temperature reaches 60.5 DEG C, the performance of electronic product can occur owing to calculating error erroneous judgement electricity
Sub-product breaks down.
When using the technology of the present invention, when the minimum temperature drop of components and parts reaches-55 DEG C in the course of the work, calculated temperature
Degree scope is :-55 DEG C ± 5%=-55 DEG C ± 2.75 DEG C, compared to the prior art, computational accuracy improves 50%.
The present invention and the Integrated comparative of prior art implementation result:
1, overall plan compares: the low temperature computation model of prior art electronic product uses the correction of a room temperature test point
Method, precision is low, and error is big.The present invention uses 8 low-temperature test point correction antiskid brakes to control the computation model of device, meets
Antiskid brake controls the actually used situation of device；
2, test point quantity compares；Prior art only tests the data of one point of room temperature, and the present invention is from-25 DEG C～-60
DEG C totally 8 low warm spots, it is achieved that antiskid brake controls the Modifying model in device low temperature range.
Accompanying drawing explanation
Fig. 1 is the schematic diagram that antiskid brake controls 5 surfaces of device case.
Fig. 2 is the flow chart of the present invention.In figure:
1 is front panel；2. the first side panel；3 is top panel；4 is rear board；5 is the second side panel.
Detailed description of the invention
The present embodiment is the method for testing that a kind of civil transport antiskid brake controls the response of device low temperature.
The test purpose of the present embodiment: the performance that actual measurement antiskid brake under Different hypothermia point controls device is the most qualified；
And record antiskid brake control device, housing, the low temperature data of components and parts under Different hypothermia test point.
The detailed process of the present embodiment is:
Step 1, determines that antiskid brake controls the temperature range of device low-temperature test
The first step, determines that antiskid brake controls the maximum temperature of device low-temperature test temperature range
The low temperature range during device uses is controlled, with reference to the maximum temperature of HB5830.9 low-temperature test according to determining antiskid brake
For-25 DEG C, the tolerance of temperature is ± 2 DEG C, determines that maximum temperature is-15 DEG C, low temperature tolerance is included.
Second step, determines that antiskid brake controls the minimum temperature of device low-temperature test
The low temperature range during device uses is controlled, with reference to the minimum temperature of HB5830.9 low-temperature test according to determining antiskid brake
For-55 DEG C, the tolerance of temperature is ± 2 DEG C, determines the most low for-60 DEG C, low temperature tolerance is included.
Determined by low-temperature test temperature range be-15 DEG C～-60 DEG C.In the range of temperature test, determine that low temperature is surveyed
The step-length of examination is 5 DEG C～10 DEG C.
Step 2, selects test equipment and temperature sensor
Described test equipment includes low-temperature test chamber and hygrothermograph；Described sensor is thermocouple.According to following
Require to select test equipment and sensor.
1, low-temperature test chamber requires: temperature range: 30 DEG C～-80 DEG C, rate of temperature fall: 5 DEG C/min～15 DEG C/min appoints
Choosing, low-temperature test chamber volume 0.5m3～1m3Optionally, observation window to be had on test chamber door, side φ to be had 70mm's～φ 100mm
Wire guide, it is simple to temperature sensor signal line, cable are controlled to guide to device the temperature and humidity inspection of laboratory from antiskid brake
On instrument and power supply, enumerator.
2, temperature sensor requires: select T-shaped thermocouple, temperature-measuring range: 30 DEG C～-80 DEG C, I class precision, and this is anti-skidding stops
Have two pieces of circuit boards on truck control device, one piece be panel, another block be data board.At 12 low-power consumption modules and components and parts
The most all pasting a T-shaped thermocouple, low-power consumption components and parts are the components and parts that power consumption is less than 0.05 watt.These 12 components and parts are respectively
It is: signal processor, memorizer, eight, four tunnel D/A converter, audion, ceramic condenser, Programmable Logic Device, microcontroller
Device monitoring chip, 16 fixed point DSPs, memorizer, solid-state relay, Programmable Logic Device and bus transceiver；Sliding
Braking control device is horizontally mounted aboard, in addition to the installation bottom surface that antiskid brake controls device case, outside remaining 5 panel
1 T-shaped thermocouple is respectively pasted on surface, controls the temperature of device case for testing antiskid brake, needs the T-shaped thermocouple quantity to be altogether
17.
3, hygrothermograph requires: select U.S.'s Keithley hygrothermograph, for by the electricity of T-shaped thermocouple assay
Pressure signal processing is temperature-responsive data, and the most now shows the temperature-time curve of each components and parts.
Step 3, starts test equipment and antiskid brake controls device
1, by 1 set antiskid brake control device be placed in low-temperature test chamber, 17 T-shaped thermocouples are attached to respectively 12 low
On 5 outer surfaces of power consumption components and parts and housing, low-power consumption components and parts are the components and parts that power consumption is less than 0.05 watt.These 12 low merits
Consume components and parts respectively: signal processor, memorizer, eight, four tunnel D/A converter, audion, ceramic condenser, FPGA
Circuit, microcontrollers monitor chip, 16 fixed point DSPs, memorizer, solid-state relay, Programmable Logic Device, total
Line transceiver；In addition to the installation bottom surface that antiskid brake controls device case, remaining 5 outer surface respectively pastes 1 T-shaped thermocouple, uses
In the temperature of test housing, pasting T-shaped thermocouple quantity altogether is 17.
2,17 T-shaped thermocouples are drawn from the wire guide of cryostat, be connected with hygrothermograph；By antiskid brake
The cable controlling device is drawn from the wire guide of cryostat, is connected with power supply, enumerator.
3, close low temperature chamber door, start cooling；Control device to antiskid brake simultaneously and 20mA electric current is provided, pass through enumerator
Make antiskid brake control during unit simulation land brake/get off the brakes work.
Step 4, test process
In order to obtain continuous print low temperature response data and temperature time curve, component surface is not controlled temperature.
The first step, under the conditions of testing-15 DEG C, antiskid brake controls the temperature of device
1, antiskid brake is made to control device in running order；
2, the width that antiskid brake control device is uncapped is 10mm, for being drawn by holding wire.The temperature of cryostat is dropped
To-15 DEG C, hygrothermograph detect and record the numerical value of 17 test point each point temperature-responsives；Described temperature-responsive
Numerical value refers to the temperature-time curve of 17 test point each points, and reaches no longer to change when-15 DEG C.Now hygrothermograph
Controlling the numerical value of Computer display each point temperature-responsive, prompting carries out the work of next test point.
After tested, antiskid brake control device performance is qualified；The temperature of 12 low-power consumption components and parts is shown in Table 1.
Table 1 controls the test data under device duty in ambient temperature-15 DEG C and antiskid brake
When ambient temperature is-15 DEG C, the temperature test data of antiskid brake control 5 panels of device case are shown in Table 2, and these are 5 years old
Accompanying drawing 1 is shown in the definition on individual surface.
The temperature of surface of shell when table 2 ambient temperature is-15 DEG C
| Test event | Front panel 1 | First side panel 2 | Top panel 3 | Rear board 4 | Second side panel 5 |
| Test temperature | 3℃ | 3℃ | 3℃ | 3℃ | 4℃ |
Second step, under the conditions of testing-25 DEG C, antiskid brake controls the temperature of device
1, antiskid brake is made to control device in running order；
2, the width that antiskid brake control device is uncapped is 10mm, for being drawn by holding wire.By under the temperature of cryostat
Drop to-25 DEG C, hygrothermograph automatically detect and record the numerical value of 17 test point each point temperature-responsives；Described temperature
Degree response numerical value refers to the temperature-time curve of 17 test point each points, reaches no longer to change when-25 DEG C.Now temperature and humidity inspection
The numerical value controlling Computer display each point temperature-responsive of instrument, prompting carries out the work of next test point.
After tested, antiskid brake control device performance is qualified；The temperature of 12 low-power consumption components and parts is shown in Table 3
Table 3 controls the test data under device duty in ambient temperature-25 DEG C and antiskid brake
When ambient temperature is-25 DEG C, the temperature test data on antiskid brake control 5 surfaces of device case are shown in Table 4.
The temperature of surface of shell when table 4 ambient temperature is-25 DEG C
| Test event | Front panel 1 | First side panel 2 | Top panel 3 | Rear board 4 | Second side panel 5 |
| Test temperature | -7 DEG C | -7 DEG C | -7 DEG C | -7 DEG C | -6 DEG C |
3rd step, under the conditions of testing-35 DEG C, antiskid brake controls the temperature of device
1, antiskid brake is made to control device in running order；
2, the width that antiskid brake control device is uncapped is 10mm, for being drawn by holding wire.By under the temperature of cryostat
Drop to-35 DEG C, hygrothermograph automatically detect and record the numerical value of 17 test point each point temperature-responsives；Described temperature
Degree response numerical value refers to the temperature-time curve of 17 test point each points, reaches no longer to change when-35 DEG C.Now temperature and humidity inspection
The numerical value controlling Computer display each point temperature-responsive of instrument, prompting carries out the work of next test point.
After tested, antiskid brake control device performance is qualified；The temperature of 12 low-power consumption components and parts is shown in Table 5.
Table 5 controls the test data under device duty in ambient temperature-35 DEG C and antiskid brake
When ambient temperature is-35 DEG C, the temperature test data on antiskid brake control 5 surfaces of device case are shown in Table 6.
The temperature of surface of shell when table 6 ambient temperature is-35 DEG C
| Test event | Front panel 1 | First side panel 2 | Top panel 3 | Rear board 4 | Second side panel 5 |
| Test temperature | -17 DEG C | -17 DEG C | -17 DEG C | -17 DEG C | -16 DEG C |
4th step, under the conditions of testing-40 DEG C, antiskid brake controls the temperature of device
1, antiskid brake is made to control device in running order；
2, the width that antiskid brake control device is uncapped is 10mm, for being drawn by holding wire.By under the temperature of cryostat
Drop to-40 DEG C, hygrothermograph automatically detect and record the numerical value of 17 test point each point temperature-responsives；Described temperature
Degree response numerical value refers to the temperature-time curve of 17 test point each points, reaches no longer to change when-15 DEG C.Now temperature and humidity inspection
The numerical value controlling Computer display each point temperature-responsive of instrument, prompting carries out the work of next test point.
After tested, antiskid brake control device performance is qualified；The temperature of 12 low-power consumption components and parts is shown in Table 7.
Table 7 controls the test data under device duty in ambient temperature-40 DEG C and antiskid brake
When ambient temperature is-40 DEG C, the temperature test data on antiskid brake control 5 surfaces of device case are shown in Table 8.
The temperature of surface of shell when table 8 ambient temperature is-40 DEG C
| Test event | Front panel 1 | First side panel 2 | Top panel 3 | Rear board 4 | Second side panel 5 |
| Test temperature | -21 DEG C | -22 DEG C | -21 DEG C | -21 DEG C | -20 DEG C |
5th step, under the conditions of testing-45 DEG C, antiskid brake controls the temperature of device
1, antiskid brake is made to control device in running order；
2, the width that antiskid brake control device is uncapped is 10mm, for being drawn by holding wire.By under the temperature of cryostat
Drop to-45 DEG C, hygrothermograph automatically detect and record the numerical value of 17 test point each point temperature-responsives；Described temperature
Degree response numerical value refers to the temperature-time curve of 17 test point each points, reaches no longer to change when-45 DEG C.Now temperature and humidity inspection
The numerical value controlling Computer display each point temperature-responsive of instrument, prompting carries out the work of next test point.
After tested, antiskid brake control device performance is qualified；The temperature of 12 low-power consumption components and parts is shown in Table 9.
Table 9 controls the test data under device duty in ambient temperature-45 DEG C and antiskid brake
When ambient temperature is-45 DEG C, the temperature test data on antiskid brake control 5 surfaces of device case are shown in Table 10.
The temperature of surface of shell when table 10 ambient temperature is-45 DEG C
| Test event | Front panel 1 | First side panel 2 | Top panel 3 | Rear board 4 | Second side panel 5 |
| Test temperature | -26 DEG C | -27 DEG C | -27 DEG C | -26 DEG C | -25 DEG C |
6th step, under the conditions of testing-50 DEG C, antiskid brake controls the temperature of device
1, antiskid brake is made to control device in running order；
2, the width that antiskid brake control device is uncapped is 10mm, for being drawn by holding wire.By under the temperature of cryostat
Drop to-50 DEG C, hygrothermograph automatically detect and record the numerical value of 17 test point each point temperature-responsives；Described temperature
Degree response numerical value refers to the temperature-time curve of 17 test point each points, reaches no longer to change when-50 DEG C.Now temperature and humidity inspection
The numerical value controlling Computer display each point temperature-responsive of instrument, prompting carries out the work of next test point.
After tested, antiskid brake control device performance is qualified；The temperature of 12 low-power consumption components and parts is shown in Table 11.
Table 11 controls the test data under device duty in ambient temperature-50 DEG C and antiskid brake
When ambient temperature is-50 DEG C, the temperature test data on antiskid brake control 5 surfaces of device case are shown in Table 12.
The temperature of surface of shell when table 12 ambient temperature is-50 DEG C
| Test event | Front panel 1 | First side panel 2 | Top panel 3 | Rear board 4 | Second side panel 5 |
| Test temperature | -31 DEG C | -32 DEG C | -32 DEG C | -31 DEG C | -30 DEG C |
7th step, under the conditions of testing-55 DEG C, antiskid brake controls the temperature of device
1, antiskid brake is made to control device in running order
2, the width that antiskid brake control device is uncapped is 10mm, for being drawn by holding wire.By under the temperature of cryostat
Drop to-55 DEG C, hygrothermograph automatically detect and record the numerical value of 17 test point each point temperature-responsives；Described temperature
Degree response numerical value refers to the temperature-time curve of 17 test point each points, reaches no longer to change when-55 DEG C.Now temperature and humidity inspection
The numerical value controlling Computer display each point temperature-responsive of instrument, prompting carries out the work of next test point.
After tested, antiskid brake control device performance is qualified；The temperature of 12 low-power consumption components and parts is shown in Table 13.
Table 13 controls the test data under device duty in ambient temperature-55 DEG C and antiskid brake
When ambient temperature is-55 DEG C, the temperature test data on antiskid brake control 5 surfaces of device case are shown in Table 14.
The temperature of surface of shell when table 14 ambient temperature is-55 DEG C
| Test event | Front panel 1 | First side panel 2 | Top panel 3 | Rear board 4 | Second side panel 5 |
| Test temperature | -36 DEG C | -37 DEG C | -37 DEG C | -36 DEG C | -35 DEG C |
8th step, under the conditions of testing-60 DEG C, antiskid brake controls the temperature of device
1, antiskid brake is made to control device in running order；
2, the width that antiskid brake control device is uncapped is 10mm, for being drawn by holding wire.By under the temperature of cryostat
Drop to-60 DEG C, hygrothermograph automatically detect and record the numerical value of 17 test point each point temperature-responsives；Described temperature
Degree response numerical value refers to the temperature-time curve of 17 test point each points, reaches no longer to change when-60 DEG C.Now temperature and humidity inspection
The numerical value controlling Computer display each point temperature-responsive of instrument.
After tested, antiskid brake control device performance is qualified；The temperature of 12 low-power consumption components and parts is shown in Table 15.
Table 15 controls the test data under device duty in ambient temperature-60 DEG C and antiskid brake
When ambient temperature is-60 DEG C, the temperature test data on antiskid brake control 5 surfaces of device case are shown in Table 16.
The temperature of surface of shell when table 16 ambient temperature is-50 DEG C
| Test event | Front panel 1 | First side panel 2 | Top panel 3 | Rear board 4 | Second side panel 5 |
| Test temperature | -41 DEG C | -42 DEG C | -42 DEG C | -41 DEG C | -40 DEG C |
So far, present invention test achieves low temperature response data and the temperature-time curve of table 1～table 16, these data,
Curve is tested for revising low temperature computation model adjustment scheme.
So far, complete this antiskid brake control device low temperature calculating model and need the test job of data.
Claims (3)
1. test the method that antiskid brake controls device low temperature calculating model data for one kind, it is characterised in that detailed process is:
Step 1, determine antiskid brake control device low-temperature test temperature range:
The first step, determines that antiskid brake controls the maximum temperature of device low-temperature test temperature range；
Second step, determines that antiskid brake controls the minimum temperature of device low-temperature test；
Determined by low-temperature test temperature range be-15 DEG C～-60 DEG C；In the range of temperature test, determine low-temperature test
Step-length is 5 DEG C～10 DEG C；
Step 2, selects test equipment and temperature sensor: described test equipment includes low-temperature test chamber and hygrothermograph；
Described sensor is thermocouple；
Step 3, test equipment and the preparation of antiskid brake control device:
Specifically:
A set of antiskid brake control device is placed in low-temperature test chamber by I, and each T-shaped thermocouple is attached to 12 low-power consumption units respectively
On 5 outer surfaces of device and housing；In addition to the installation bottom surface that antiskid brake controls device case, remaining 5 outer surface respectively pastes 1
Individual T-shaped thermocouple；
Each T-shaped thermocouple is drawn from the wire guide of cryostat by II, is connected with hygrothermograph respectively；By antiskid brake control
The cable of device processed is drawn from the wire guide of cryostat, is connected with power supply sum counter respectively；
III closes low temperature chamber door, starts cooling；Control device to antiskid brake simultaneously and 20mA electric current is provided, make to prevent by enumerator
During sliding braking control device simulation land brake/get off the brakes work；
Step 4, test:
In order to obtain continuous print low temperature response data and temperature time curve, component surface is not implemented temperature and control；
When under testing condition of different temperatures, antiskid brake controls the temperature of device, test temperature, from-15 DEG C～-60 DEG C, depends on
Under each temperature spot of secondary measurement, antiskid brake controls the temperature of device；When testing temperature and being-15 DEG C～-35 DEG C, with-10 DEG C
Test for step-length；When testing temperature more than-35 DEG C～-60 DEG C, test with-5 DEG C for step-length；
Specifically:
I makes antiskid brake control device in running order；
Antiskid brake is controlled device holding wire by II draws；Drop to the temperature of cryostat test temperature, by hygrothermograph
Detect and record the numerical value of each test point each point temperature-responsive；Described temperature-responsive numerical value refers to the Temperature-time of each test point
Curve, and reach-15 DEG C～-60 DEG C test in the range of each point time no longer change；The now control of hygrothermograph calculates
The numerical value of machine display each point temperature-responsive；Respectively obtain antiskid brake under-15 DEG C～-60 DEG C of each points and control the temperature of device；
So far, complete this antiskid brake control device low temperature calculating model and need the test job of data.
2. test antiskid brake controls the method that device low temperature calculates model data as claimed in claim 1, it is characterised in that choosing
Select requiring to include of test equipment and sensor:
I low-temperature test chamber requires: temperature range: 30 DEG C～-80 DEG C, rate of temperature fall: 5 DEG C/min～15 DEG C/min is optional, low temperature
Volume of the chamber is 0.5m3～1m3, observation window to be had on test chamber door, side φ to be had 70mm～the wire guide of φ 100mm；
II temperature sensor requires: select T-shaped thermocouple, temperature-measuring range: 30 DEG C～-80 DEG C, I class precision, this antiskid brake control
Panel and data board is had on device processed；A T-shaped thermocouple is the most all pasted in 12 low-power consumption modules and components and parts；Low merit
Consumption components and parts are the components and parts that power consumption is less than 0.05 watt；
III hygrothermograph requires: select U.S.'s Keithley hygrothermograph, for being believed by the voltage of T-shaped thermocouple assay
Number it is processed as temperature-responsive data, and the temperature-time curve of each components and parts can be shown.
3. test antiskid brake controls the method that device low temperature calculates model data as claimed in claim 1, it is characterised in that institute
State 12 low-power consumption components and parts respectively: signal processor, memorizer, eight, four tunnel D/A converter, audion, ceramic condenser,
Programmable Logic Device, microcontrollers monitor chip, 16 fixed point DSPs, memorizer, solid-state relay, able to programme patrol
Collect circuit and bus transceiver.
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN107389322A (en) * | 2017-06-26 | 2017-11-24 | 西安航空制动科技有限公司 | A kind of low-temperature test method of airplane brake system |
| CN109388901A (en) * | 2018-10-26 | 2019-02-26 | 中车青岛四方车辆研究所有限公司 | Rail vehicle low-temperature sensitive component fatigue test modeling method |
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| CN106200617B (en) | 2018-08-07 |
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