CN106199480A - CT saturation detection method based on B-spline wavelet transformation - Google Patents
CT saturation detection method based on B-spline wavelet transformation Download PDFInfo
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- CN106199480A CN106199480A CN201610558418.3A CN201610558418A CN106199480A CN 106199480 A CN106199480 A CN 106199480A CN 201610558418 A CN201610558418 A CN 201610558418A CN 106199480 A CN106199480 A CN 106199480A
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- yardstick
- wavelet transform
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- transform modulus
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- G01R35/02—Testing or calibrating of apparatus covered by the other groups of this subclass of auxiliary devices, e.g. of instrument transformers according to prescribed transformation ratio, phase angle, or wattage rating
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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Abstract
The present invention relates to CT saturation detection method, be specially CT saturation detection method based on B-spline wavelet transformation.Solve defect and problem that existing CT saturation detection method exists.Present invention uses and have seriality concurrently, the Cubic B-spline Wavelet of symmetry feature carries out saturation detection to Current Transformer Secondary electric current, in combination with two yardsticks i.e. yardstick two and yardstick three, signal is carried out conversion process, saturation point position can be determined with accurate difference；This algorithm amount of calculation is little simultaneously, it is possible to achieve immediately detect, and quickly judges that electromagnetic current transducer is the most saturated, and saturated be district in or external area error causes, determine whether latch-up protection, prevent protection misoperation.
Description
Technical field
The present invention relates to CT saturation detection method, be specially current transformer based on B-spline wavelet transformation
Saturation detection method.
Background technology
Current differential protection is one of protection of transmission line of electricity, and it is based on " flowing into the summation etc. of node current in circuit
In zero " principle.Fig. 1 show the structural representation of transmission line of electricity current differential protection.At the two ends by protection transmission line of electricity
Connecting electromagnetic current transducer, electronic current mutual inductor respectively, electric current I1, I2 of two ends current transformer separately flow into difference
Motor type relay, if there is troubles inside the sample space, then I1 with I2 symbol is consistent, and out-of-balance current increases and exceedes setting valve IS, and it is poor to make
Motor type relay action also exports corresponding actuating signal, it is achieved current differential protection；If being now properly functioning or external area error,
Then I1 with I2 symbol is contrary, and it is poor to be equivalent to, and out-of-balance current makes balanced relay action not sufficient to exceed setting valve IS, the most just
Do not export corresponding actuating signal.
And occur when external area error and cause electromagnetic current transducer saturated, now electric current can not be by the correct change of disease, often
Differential protection generation misoperation can be made.
To this end, transmission line of electricity current differential protection, often can increase by a processor, processor gathers electromagnetic current transducer
Secondary current and by being analyzed to judge that electromagnetic current transducer is the most saturated to it, and saturated be district in or
External area error causes, if troubles inside the sample space causes saturated processor to export high level, if external area error causes saturated
Processor output low level；The action output signal of the output signal of processor and balanced relay collectively as one with door
Input, the output with door, as the control signal of transmission line of electricity current differential protection, prevents electromagnetic current transducer from satisfying with this
With the differential protection misoperation caused.
Above-mentioned processor has harmonic synthesis information law, sampled point difference for analyzing the most saturated method of current transformer
Calculating method, wavelet transformation analysis method etc..Harmonic synthesis information law and sampled point Difference Calculation method need a large amount of calculating, do not have reality
Shi Xing, the rapidity for relay protection has extreme influence, after fault occurs, it is impossible to fix a breakdown in time, can be to equipment, line
Road does a lot of damage；When utilizing wavelet transformation analysis method, its selected small echo major part is dB small echo, and this small echo belongs to
Asymmetric small echo, it there may be the situation of skew, therefore there is decision errors, and is using wavelet transformation the location of singular point
Time waveform is not carried out multi-scale transform, its reliability is not enough；When wavelet analysis method combines counting method, need statistical fluctuation
Number of times, occasionality is relatively big, and easy occurrence count error causes judging inaccurate.
Summary of the invention
The present invention solves defect and the problem that above-mentioned existing CT saturation detection method exists, it is provided that a kind of based on
The CT saturation detection method of B-spline wavelet transformation.The method can effectively, Cutoff current transformer secondary in time
The saturation point of electric current, and judge that fault belongs in district or outside district, thus open or Blocking Differential Protection, prevent differential guarantor
Protect the situation of misoperation.
The present invention adopts the following technical scheme that realization: CT saturation based on B-spline wavelet transformation detects
Method, is realized by following steps:
1) gather the secondary current of current transformer, obtain Current Transformer Secondary current curve；
2) utilize Cubic B-spline Wavelet that Current Transformer Secondary current curve carries out multiscale analysis, and choose many chis
Spend yardstick two and yardstick three curve of gained after analyzing；
3) yardstick two and yardstick three curve are carried out modulus maximum conversion, obtain yardstick two wavelet transform modulus and yardstick three mould pole
It is worth greatly curve；
4) detection yardstick two wavelet transform modulus and yardstick three wavelet transform modulus, it is thus achieved that yardstick two wavelet transform modulus and yardstick
Three wavelet transform modulus produce the moment of sign mutation first；If yardstick two wavelet transform modulus and yardstick three modulus maximum
The moment producing sign mutation in curve first differs, and in the record moment producing sign mutation first formerly, is designated as t1, essence
Really to millisecond, and record the Sudden Changing Rate peak value Q1 in t1 moment；If yardstick two wavelet transform modulus and yardstick three modulus maximum are bent
The moment producing sign mutation in line first is identical, is the moment t1 producing sign mutation first with this moment, and with this moment
The Sudden Changing Rate peak value of yardstick two wavelet transform modulus is as the Sudden Changing Rate peak value Q1 in t1 moment；Wherein, so-called sign mutation is prominent
Variable peak value reaches 0.4～more than 0.6；
5) if from moment t1 in 5ms, in yardstick two wavelet transform modulus or yardstick three wavelet transform modulus, sudden change is detected
The relatively macromutation of amount peak value >=2Q1, then assert that current transformer is in the saturation that troubles inside the sample space causes；If from t1+15ms
In the 35ms that moment rises, detect in yardstick two wavelet transform modulus or yardstick three wavelet transform modulus Sudden Changing Rate peak value >=
The relatively big prominent amount of 2Q1, then assert that current transformer is in the saturation that external area error causes.
Present invention uses have concurrently seriality, symmetry feature Cubic B-spline Wavelet to Current Transformer Secondary
Electric current carries out saturation detection, in combination with two yardsticks, signal is carried out conversion process, can with accurate difference determine saturated
Point position；This algorithm amount of calculation is little simultaneously, it is possible to achieve immediately detect, and quickly judges that electromagnetic current transducer is the most saturated,
And saturated be district in or external area error causes, determine whether latch-up protection, prevent protection misoperation.
The present invention is as follows through emulation experiment checking:
In electric analog software PSCAD, built power system simulation model, simulate respectively troubles inside the sample space, external area error with
And the situation of chopper reclosing, the data obtained is analyzed processing by the method for the invention.
Emulation experiment one: as shown in accompanying drawing 2-6, break down outside simulation region.Fig. 2 is the current transformer collected
Secondary current curve, Fig. 3,4 is that the yardstick two after cubic B-Spline interpolation process multiple dimensioned to external area error electric current and yardstick three are bent
Line waveform, Fig. 5,6 be respectively yardstick two and yardstick three wavelet transform modulus；It can be seen that yardstick two modulus maximum is bent
Line is identical with the moment producing sign mutation in yardstick three wavelet transform modulus first, and fault moment produces sign mutation first
Moment t1=0.1s, in corresponding diagram, sampled point is at 200.Start moment in fault, the yardstick two of Cubic B-spline Wavelet
Catastrophe point with yardstick three curve i.e. detects electric current, the most not yet enters saturation.Contrast yardstick two and yardstick three times
Wavelet transformation analysis, it can be seen that two times location to saturation point of yardstick are more accurate, yardstick three then to saturated sensitiveer,
But at the sampled point 200 when fault starts, the fluctuation of yardstick two is the least, and its modulus maximum is the most negligible.Accompanying drawing 5,6
For yardstick two and the wavelet modulus maxima under yardstick three, it can be seen that modulus maximum can be more accurately located saturated
Point.Using the Sudden Changing Rate peak value of scale during t1 two wavelet transform modulus as the Sudden Changing Rate peak value Q1 in t1 moment, from t1+15ms
In the 35ms that moment rises, detect in yardstick two wavelet transform modulus or yardstick three wavelet transform modulus Sudden Changing Rate peak value >=
The relatively big prominent amount (at corresponding sampled point 300, the about t1+25ms moment) of 2Q1, analyzes and assert that current transformer is in external area error and makes
The saturation become, consistent with simulated failure.
Emulation experiment two: as illustrated in figures 7-11, (effect is equal to outside district to utilize chopper reclosing simulation excitation surge current
Fault)；Fig. 7 is the Current Transformer Secondary current curve collected, and Fig. 8,9 is cubic B-Spline interpolation to external area error electricity
Flowing the yardstick two after multiple dimensioned process and yardstick three curve waveform, Figure 10,11 respectively yardstick two and yardstick three modulus maximums are bent
Line；Breaker opening times is T1=0.095s, and closing time is T2=0.115s.One cycle sampled point is 80, therefore T1 institute is right
The sampled point answered is 180, and sampled point corresponding for T2 is at 260.It can be seen that disconnect at chopper and close a floodgate from accompanying drawing 8,9
Afterwards, the wavelet transformation under yardstick two is the most unchanged, and yardstick three then all has fluctuation near sampled point at this at two.In sampling
Point is when being 380, and waveform occurs saturated, simultaneously yardstick two and the wavelet transformation under yardstick three all have under fluctuation, and yardstick three little
Wave conversion is sensitiveer, and the wavelet transformation under yardstick two is the most accurate.It can be seen that produce letter first from accompanying drawing 10,11
The moment t1=0.095s of number sudden change produces on yardstick three wavelet transform modulus, and the Sudden Changing Rate peak value Q1 inscribed when writing down this,
In the 35ms from the t1+15ms moment, detect prominent in yardstick two wavelet transform modulus or yardstick three wavelet transform modulus
The relatively big prominent amount (at sampled point 380, the about t1+30ms moment) of variable peak value >=2Q1, analyzes and assert that current transformer is in district
The saturation that outer fault causes, consistent with simulated failure.
Emulation experiment three: as shown in figs. 12-16, breaks down in simulation region.Figure 12 is the current transformer collected
Secondary current curve, Figure 13,14 is the yardstick two after cubic B-Spline interpolation process multiple dimensioned to external area error electric current and yardstick three
Curve waveform, Figure 15,16 be respectively yardstick two and yardstick three wavelet transform modulus；Fault in protection zone betides t=0.1s
Time, at the sampled point 200 in corresponding diagram, when fault occurs, waveform occurs saturated the most immediately, and yardstick two is being adopted with yardstick three
All having bigger fluctuation at sampling point 210, the burr of its modulus maximum corresponding to mesoscale two is little, to catastrophe point position first
Location very accurate, yardstick three then has large range of fluctuation, and precision is short of.It can be seen that occur 2～3ms(in event in fault
Barrier occur after in 5ms) after i.e. occur in that relatively macromutation amount, analyze and assert that current transformer is in the saturated shape that troubles inside the sample space causes
State, consistent with simulated failure.
Through B-spline small echo utilized above, external area error, chopper reclosing and troubles inside the sample space after current waveform are divided
Analysis and detection, it can be seen that after carrying out B-spline wavelet transformation, catastrophe point does not has displacement substantially, and other types small echo is the most all
There is displacement in various degree.Under excitation surge current and other harmonic waves disturb, often there will be the location under pseudo-extreme point, and large scale
Less accurate, therefore should use and multiple dimensioned waveform is analyzed.Two times contrast locatings to saturation interval of this wavelet scale are relatively accurate,
And three times detections for saturation point of yardstick are the most sensitive, both with the use of, saturation point position can be accurately positioned, thus be
The present invention provides condition.
Accompanying drawing explanation
Fig. 1 is the current differential protection schematic diagram that saturated misoperation prevented by transmission line of electricity band；
Fig. 2 is the Current Transformer Secondary current curve that emulation experiment one collects；
Fig. 3 is emulation experiment one Cubic B-spline Wavelet multiscale analysis gained yardstick two curve；
Fig. 4 is emulation experiment one Cubic B-spline Wavelet multiscale analysis gained yardstick three curve；
Fig. 5 is emulation experiment one yardstick two wavelet transform modulus；
Fig. 6 is emulation experiment one yardstick three wavelet transform modulus；
Fig. 7 is the Current Transformer Secondary current curve that emulation experiment two collects；
Fig. 8 is emulation experiment two Cubic B-spline Wavelet multiscale analysis gained yardstick two curve；
Fig. 9 is emulation experiment two Cubic B-spline Wavelet multiscale analysis gained yardstick three curve；
Figure 10 is emulation experiment two yardstick two wavelet transform modulus；
Figure 11 is emulation experiment two yardstick three wavelet transform modulus；
Figure 12 is the Current Transformer Secondary current curve that emulation experiment three collects；
Figure 13 is emulation experiment three Cubic B-spline Wavelet multiscale analysis gained yardstick two curve；
Figure 14 is emulation experiment three Cubic B-spline Wavelet multiscale analysis gained yardstick three curve；
Figure 15 is emulation experiment three yardstick two wavelet transform modulus；
Figure 16 is emulation experiment three yardstick three wavelet transform modulus.
Detailed description of the invention
CT saturation detection method based on B-spline wavelet transformation, is realized by following steps:
1) gather the secondary current of current transformer, obtain Current Transformer Secondary current curve；
2) utilize Cubic B-spline Wavelet that Current Transformer Secondary current curve carries out multiscale analysis, and choose many chis
Spend yardstick two and yardstick three curve of gained after analyzing；
3) yardstick two and yardstick three curve are carried out modulus maximum conversion, obtain yardstick two wavelet transform modulus and yardstick three mould pole
It is worth greatly curve；
4) detection yardstick two wavelet transform modulus and yardstick three wavelet transform modulus, it is thus achieved that yardstick two wavelet transform modulus and yardstick
Three wavelet transform modulus produce the moment of sign mutation first；If yardstick two wavelet transform modulus and yardstick three modulus maximum
The moment producing sign mutation in curve first differs, and in the record moment producing sign mutation first formerly, is designated as t1, essence
Really to millisecond, and record the Sudden Changing Rate peak value Q1 in t1 moment；If yardstick two wavelet transform modulus and yardstick three modulus maximum are bent
The moment producing sign mutation in line first is identical, is the moment t1 producing sign mutation first with this moment, and with this moment
The Sudden Changing Rate peak value of yardstick two wavelet transform modulus is as the Sudden Changing Rate peak value Q1 in t1 moment；Wherein, so-called sign mutation is prominent
Variable peak value reaches 0.4～more than 0.6；
5) if from moment t1 in 5ms, in yardstick two wavelet transform modulus or yardstick three wavelet transform modulus, sudden change is detected
The relatively macromutation of amount peak value >=2Q1, then assert that current transformer is in the saturation that troubles inside the sample space causes；If from t1+15ms
In the 35ms that moment rises, detect in yardstick two wavelet transform modulus or yardstick three wavelet transform modulus Sudden Changing Rate peak value >=
The relatively big prominent amount of 2Q1, then assert that current transformer is in the saturation that external area error causes.
Claims (1)
1. a CT saturation detection method based on B-spline wavelet transformation, it is characterised in that be real by following steps
Existing:
1) gather the secondary current of current transformer, obtain Current Transformer Secondary current curve；
2) utilize Cubic B-spline Wavelet that Current Transformer Secondary current curve carries out multiscale analysis, and choose many chis
Spend yardstick two and yardstick three curve of gained after analyzing；
3) yardstick two and yardstick three curve are carried out modulus maximum conversion, obtain yardstick two wavelet transform modulus and yardstick three mould pole
It is worth greatly curve；
4) detection yardstick two wavelet transform modulus and yardstick three wavelet transform modulus, it is thus achieved that yardstick two wavelet transform modulus and yardstick
Three wavelet transform modulus produce the moment of sign mutation first；If yardstick two wavelet transform modulus and yardstick three modulus maximum
The moment producing sign mutation in curve first differs, and in the record moment producing sign mutation first formerly, is designated as t1, essence
Really to millisecond, and record the Sudden Changing Rate peak value Q1 in t1 moment；If yardstick two wavelet transform modulus and yardstick three modulus maximum are bent
The moment producing sign mutation in line first is identical, is the moment t1 producing sign mutation first with this moment, and with this moment
The Sudden Changing Rate peak value of yardstick two wavelet transform modulus is as the Sudden Changing Rate peak value Q1 in t1 moment；Wherein, so-called sign mutation is prominent
Variable peak value reaches 0.4～more than 0.6；
5) if from moment t1 in 5ms, in yardstick two wavelet transform modulus or yardstick three wavelet transform modulus, sudden change is detected
The relatively macromutation of amount peak value >=2Q1, then assert that current transformer is in the saturation that troubles inside the sample space causes；If from t1+15ms
In the 35ms that moment rises, detect in yardstick two wavelet transform modulus or yardstick three wavelet transform modulus Sudden Changing Rate peak value >=
The relatively big prominent amount of 2Q1, then assert that current transformer is in the saturation that external area error causes.
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107255760A (en) * | 2017-06-21 | 2017-10-17 | 重庆新世杰电气股份有限公司 | A kind of method and system for judging CT saturation |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20030057939A1 (en) * | 2000-07-12 | 2003-03-27 | Yong-Cheol Kang | Method for detecting current transformer saturation |
| CN102005740A (en) * | 2010-10-29 | 2011-04-06 | 昆明理工大学 | Extra-high voltage direct current line boundary element method adopting polar wave wavelet energy ratio |
| CN102156246A (en) * | 2011-03-24 | 2011-08-17 | 昆明理工大学 | Wavelet energy entropy detecting method for recognizing faults of ultra-high voltage direct-current transmission line |
| CN103513212A (en) * | 2013-09-12 | 2014-01-15 | 卢庆港 | BH curve characteristic CT state recognition and unsaturation degree computing method based on reconstruction |
| CN103529321A (en) * | 2013-10-10 | 2014-01-22 | 长园深瑞继保自动化有限公司 | Current transformer saturation detecting method |
-
2016
- 2016-07-16 CN CN201610558418.3A patent/CN106199480B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20030057939A1 (en) * | 2000-07-12 | 2003-03-27 | Yong-Cheol Kang | Method for detecting current transformer saturation |
| CN102005740A (en) * | 2010-10-29 | 2011-04-06 | 昆明理工大学 | Extra-high voltage direct current line boundary element method adopting polar wave wavelet energy ratio |
| CN102156246A (en) * | 2011-03-24 | 2011-08-17 | 昆明理工大学 | Wavelet energy entropy detecting method for recognizing faults of ultra-high voltage direct-current transmission line |
| CN103513212A (en) * | 2013-09-12 | 2014-01-15 | 卢庆港 | BH curve characteristic CT state recognition and unsaturation degree computing method based on reconstruction |
| CN103529321A (en) * | 2013-10-10 | 2014-01-22 | 长园深瑞继保自动化有限公司 | Current transformer saturation detecting method |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107255760A (en) * | 2017-06-21 | 2017-10-17 | 重庆新世杰电气股份有限公司 | A kind of method and system for judging CT saturation |
| CN107255760B (en) * | 2017-06-21 | 2019-11-22 | 重庆新世杰电气股份有限公司 | A kind of method and system judging CT saturation |
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