CN106199186B - phase testing device - Google Patents
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- CN106199186B CN106199186B CN201510223191.2A CN201510223191A CN106199186B CN 106199186 B CN106199186 B CN 106199186B CN 201510223191 A CN201510223191 A CN 201510223191A CN 106199186 B CN106199186 B CN 106199186B
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Abstract
The embodiment of the invention discloses phase testing devices, which comprise a vibration sensor data collector, a stroboscope and a vibration sensor, wherein the input end of the vibration sensor data collector is connected with the output end of the stroboscope, the second input end of the vibration sensor data collector is connected with the output end of the vibration sensor, the stroboscope is used for outputting a key phase signal with the same rotation frequency as that of a tested rotating device to the vibration sensor data collector, and the vibration sensor is used for detecting and outputting a vibration sensor signal of the tested rotating device to the vibration sensor data collector.
Description
Technical Field
The invention relates to the technical field of rotating machinery dynamic balancing instrument systems, in particular to frequency multiplication phase testing devices .
Background
The method comprises the steps of attaching reflection bands to a rotating device to be tested to form an optical distribution electric vibration sensor, wherein pulse signals completely synchronous with the rotating speed are generated due to the color difference of the surface of the rotating shaft when the reflection bands pass through the photoelectric vibration sensor, and the method comprises the steps of attaching key slots to the rotating device to be tested to form eddy current vibration sensors, wherein the key slots are attached to the rotating device to be tested to form eddy current vibration sensors, and the key slots are not required to be provided with a mark for the operation of a probe and a tested object, so that the problem that the phase difference between the vibration signals and the mark of the rotating shaft is obviously solved, and the problem that the technical cost of installing a large-scale reflection band in the field is not solved.
Disclosure of Invention
The invention aims to provide phase testing devices, which are used for solving the problem that in the prior art, when phase measurement is carried out on rotating equipment to be tested in operation, the rotating equipment to be tested needs to be stopped firstly, so that a great amount of financial resources, manpower and material resources are needed in the testing process.
In order to achieve the above purpose, the embodiment of the present invention provides the following technical solutions:
A phase testing device, comprising:
a vibration sensor data collector, a stroboscope and a vibration sensor;
the th input end of the vibration sensor data acquisition unit is connected with the output end of the stroboscope, and the second input end of the vibration sensor data acquisition unit is connected with the output end of the vibration sensor;
the stroboscope is used for outputting a key phase signal with the same rotation frequency as that of the tested rotating equipment to the vibration sensor data acquisition unit and outputting a stroboscopic signal synchronous with the tested rotating equipment to the tested rotating equipment;
and the vibration sensor is used for detecting and outputting a vibration sensor signal of the detected rotating equipment to the vibration sensor data acquisition unit.
Preferably, in the phase testing apparatus, the power supply circuit of the stroboscope includes:
a terminal is used for connecting with a phase line of a power grid;
a th capacitor connected between the th terminal and the second terminal of the switch;
a th resistor connected in parallel with the th capacitor;
a diode having a cathode connected to a second terminal of the capacitor;
a second resistor with a th end connected with the anode of the th diode and a second end connected with a second phase line of the power grid;
a second capacitor connected in parallel with the second resistor;
a second diode having an anode connected to a second terminal of said capacitor;
a third resistor having a terminal connected to the cathode of the second diode and a terminal connected to the second terminal of the second resistor;
a third capacitor connected in parallel with the third resistor.
Preferably, in the phase testing apparatus, the power supply circuit further includes:
and the protector is arranged between the second resistor and a second phase line of the power grid.
Preferably, in the phase testing apparatus, the protector is a fuse or a fuse.
Preferably, in the phase testing apparatus, the strobe circuit of the stroboscope includes:
a neon lamp with an end connected with the positive electrode of a power circuit of the stroboscope and a second end connected with the negative electrode of the power module;
a pulse transformer having a synonym terminal of a secondary coil connected to the th neon lamp for ionizing the inert gas in the th neon lamp, wherein the synonym terminal of the secondary coil of the pulse transformer is connected to the second terminal of the th neon lamp;
a fourth resistor connected with the terminal of the neon lamp at the terminal in series;
a fourth capacitor with a th end connected to the th end of the fourth resistor and a second end connected to the same name end of the primary winding of the pulse transformer;
a fifth resistor, wherein the th end is connected with the th end of the fourth capacitor, and the second end is connected with the synonym end of the primary coil of the pulse transformer;
the cathode of the thyristor is connected with the th end of the fourth capacitor, and the anode of the thyristor is connected with the second end of the fifth resistor;
a second neon lamp with the th end connected with the control end of the thyristor;
a fifth capacitor having a terminal connected to the second terminal of the second neon lamp and a second terminal connected to the anode of the thyristor;
, an eighth resistor connected to the second terminal of the fifth capacitor;
an adjustable resistor with an th end connected with the eighth resistor and a control end connected with the second end of the second neon lamp;
and the end is connected with the second end of the adjustable resistor, and the end is connected with the end of the fourth resistor.
Preferably, in the phase testing apparatus, the key phase signal generating circuit of the stroboscope includes:
the common terminal is connected with the control terminal of the thyristor, the common terminal is used as a key phase signal output terminal of the stroboscope, and the sixth capacitor and the ninth resistor are connected in parallel;
and a sixth resistor connected between the terminal and the control terminal of the thyristor, and the terminal and the anode of the thyristor.
Preferably, in the phase testing apparatus, the vibration sensor is a piezoelectric acceleration vibration sensor, a speed vibration sensor, or an eddy current displacement vibration sensor, which is provided on a bearing seat of the rotating device to be tested.
Preferably, in the phase testing apparatus, the strobe is a key phase signal capable of outputting a pulse voltage of 5V.
According to the scheme, when the phase of the rotating equipment to be detected in operation is detected by adopting the technical scheme disclosed by the application, the vibration sensor is arranged at the proper position of the rotating equipment to be detected, the flash frequency output by the stroboscope is adjusted to be the same as the rotation frequency of the rotating equipment to be detected, so that a user can observe the surface condition of the surface of the rotating equipment to be detected, the mark position of the surface of the rotating equipment to be detected can be observed, meanwhile, the stroboscope is also used for outputting a key phase signal to the vibration sensor data collector, after the vibration sensor data collector acquires the vibration sensor signal output by the vibration sensor and the key phase signal output by the stroboscope, the displayed angle signal is the phase difference of the vibration high point of the rotating equipment relative to the mark position observed by the user through the stroboscope, namely phase, therefore, the frequency doubling angle position of the rotating equipment to be detected can be observed without stopping the operation of the rotating equipment to be detected, and the phase difference of the vibration high point of the rotating equipment to be detected relative to the frequency doubling position can be detected through the vibration sensor data collector, and the whole process is low in cost and labor-saving.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only embodiments of the present invention, and other drawings can be obtained by those skilled in the art without creative efforts.
FIG. 1 is a block diagram of an phase testing device according to an embodiment of the present invention;
fig. 2 is a circuit structure diagram of stroboscopic devices disclosed in the embodiment of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only partial embodiments of of the present invention, rather than all embodiments.
The stroboscope is an optical measuring instrument which controls a light source to emit light and rapidly flashes at a specific frequency. The stroboscope can emit short-time and frequent flashes, and when the flash frequency is close to or synchronous with the rotation or movement speed of the object to be detected, the surface quality or the operation condition of the high-speed moving object can be easily observed by using the persistence of vision or video synchronization of eyes.
The embodiment of the invention discloses phase testing devices, which are used for realizing the phase measurement of a rotating device to be tested of a machine set under the condition of no shutdown, and refer to fig. 1, wherein the phase testing devices comprise:
the system comprises a vibration sensor data acquisition unit 1, a stroboscope 2 and a vibration sensor 3;
an th input end of the vibration sensor data acquisition unit 1 is connected with an output end of the stroboscope 2, and a second input end of the vibration sensor data acquisition unit is connected with an output end of the vibration sensor 3;
the stroboscope 2 is configured to output a stroboscopic signal to the vibration sensor data collector 1, where the stroboscopic signal has the same rotation frequency as that of a rotating device (e.g., a rotor) to be tested, and output a stroboscopic signal synchronized with the rotating device to be tested to the rotating device to be tested;
and the vibration sensor 3 is used for detecting and outputting a vibration sensor signal of the detected rotating equipment to the vibration sensor data collector 1.
When measuring the phase of the rotating device under test, by arranging the vibration sensor 3 at a suitable position of the rotating device under test (a position capable of detecting the vibration signal of the rotating device under test), adjusting the flash frequency output by the stroboscope 2 to be the same as the rotation frequency of the rotating device under test, the user can observe the surface condition of the surface of the rotating device under test, and can observe the mark position (such as a key slot, a rusted bolt, etc.) of the surface of the rotating device under test, meanwhile, the stroboscope is also used for outputting key phase signals to the vibration sensor data collector 1, after the vibration sensor data acquisition unit 1 acquires the vibration sensor signal output by the vibration sensor 3 and the key phase signal output by the stroboscope, the displayed angle signal is the phase difference between the actual vibration sensor high point and the marker position observed by the user through the stroboscope. If the measured rotating equipment is rigid measured rotating equipment and the output of the vibration sensor 3 is an acceleration signal, the measured phase is the phase of the unbalanced mass, and if the measured rotating equipment is flexible measured rotating equipment, the phase of the unbalanced mass of the measured rotating equipment can be obtained after the measured rotating equipment rotates in the rotating direction of the measured rotating equipment through a lag angle.
It can be seen that, when adopting the technical scheme disclosed in the above-mentioned embodiment of this application to detect the phase place of the rotational device under test in the operation, need not to stop the rotational device under test operation can pass through the stroboscope can look over the mark position of the rotational device under test, and can pass through vibration sensor data collection station records the vibration high point of the rotational device under test relatively with the phase place of mark position, therefore whole process save time, laborsaving and the cost is lower.
It is understood that the vibration sensor in the above embodiments of the present application may be any vibration sensor in the prior art capable of detecting the vibration signal of the rotating device under test, for example, it may be a piezoelectric acceleration vibration sensor or a velocity vibration sensor or an eddy current displacement vibration sensor, and when the vibration sensor is a piezoelectric acceleration vibration sensor or a velocity vibration sensor, the vibration sensor may be disposed on the bearing seat of the rotating device under test.
It is understood that the stroboscope in the above embodiments of the present application may be any stroboscope capable of implementing a key-phase adjustable signal in the prior art, and of course, in order to make the operating power supply of the stroboscope more stable, the present application also discloses power supply circuits of the stroboscope, and referring to fig. 2, the power supply circuit may include:
the switch S1, electric capacity C1, resistance R1, diode VD1, second diode VD2, second electric capacity C2, second resistance R2, third electric capacity C3 and third resistance R3, the concrete structure is:
the normally closed end of the switch S1 is connected with a phase line of a power grid, the capacitor C1 is connected in parallel with a R1 of the 0 th resistor, the th capacitor C1 and a th common end of a R1 of the th resistor are connected with a normally open end of the switch S1, the other common end is connected with a cathode of the diode VD1 of the th and an anode of the diode VD2, the second capacitor C2 is connected in parallel with the second resistor R2, the second capacitor C2 and a th common end of the second resistor R2 are connected with an anode of the diode VD1, the other common end is connected with a second phase line of the power grid, the third capacitor C3 is connected in parallel with a third resistor R3, the third capacitor C3 and a th common end of the third resistor R3 are connected with a cathode of the diode VD2, and the second common end is connected with the second capacitor C2 and the second common end of the second resistor R2 after parallel connection.
It can be understood that, in order to protect the above circuit from damage caused by excessive current in the circuit, referring to fig. 2, in the above embodiment of the present application, an protector F1 may be further provided in the power circuit, where the protector F1 is provided between the grid second connection and the second common terminal of the second capacitor C2 and the second resistor R2, that is, the grid second connection is connected to the second common terminal of the second capacitor C2 and the second resistor R2 through the protector, and the protector F1 may specifically be any circuit or device such as a fuse or a fuse capable of breaking the circuit connection when the circuit is over-current.
According to the specific principle, 220VC mains supply is subjected to current limiting and filtering through -th resistor R1 and -th capacitor C1, and then is alternately charged to the second capacitor C2 and the third capacitor C3 through -th diode VD1 and second diode VD2 and is subjected to 2-time boosting, so that the peak voltage of about 620V can be obtained, and preparation is made for neon lamp flashing in the stroboscope.
In addition, in order to make the stroboscopic effect better stable, this application also discloses kinds of specific structures of the stroboscopic circuit in stroboscope, refer to fig. 2, include:
neon lamp DS1, second neon lamp DS2, thyristor Q1, pulse transformer T1, fourth capacitor C4, fourth resistor C4, fifth capacitor C5, fifth resistor R5, seventh resistor R7, eighth resistor R8 and adjustable resistor RP, wherein the specific connection relationship is as follows:
a second terminal of the neon lamp DS is connected to an anode of a power circuit (i.e., a cathode of the second diode VD in the upper 0 power circuit embodiment), a second terminal is connected to a cathode of the power circuit (i.e., a second common terminal of the second capacitor C and the second resistor R in the upper 1 power circuit embodiment), an output terminal (a dotted terminal of a secondary winding) of the pulse transformer T is connected to the 2 nd neon lamp DS for ionizing the inert gas in the 3 rd neon lamp, a 4 th input terminal (a dotted terminal of a primary coil) of the pulse transformer T is connected to a second terminal of the fourth capacitor C, a second input terminal (a dotted terminal of a primary coil) of the pulse transformer T is connected to a second terminal of the fifth resistor R, a 5 th terminal of the fifth resistor R is connected to a 6 th terminal of the fourth capacitor C, a common node of the fifth resistor R and the fourth capacitor C is connected to a second terminal of the fourth resistor R, a 7 th terminal of the fourth resistor R is connected to a positive terminal of the power circuit, a positive terminal of the fourth resistor R is connected to a control node of the fourth thyristor, a control resistor R, a node RP of the fourth thyristor R is connected to a control node of the fourth thyristor, a control resistor R, a control node of the fourth thyristor, a junction of the fourth diode R, a junction of the thyristor, a fourth diode R is connected to a junction of the power circuit, a junction of the fourth diode R, a junction of the neon lamp, a junction of the thyristor, and a junction of the thyristor, a.
In the stroboscopic circuit, the fourth resistor R, the fifth resistor R, the fourth capacitor C, the pulse transformer T and the thyristor Q form a stroboscopic trigger unit, the seventh resistor R, the adjustable resistor RP, the eighth resistor R and the second neon lamp DS form a stroboscopic trigger control unit, a voltage division circuit formed by the seventh resistor R, the adjustable resistor RP and the eighth resistor R charges the fifth capacitor C, when the charging voltage of the fifth capacitor C reaches the starting voltage of the second neon lamp DS, the thyristor Q is conducted, as the fourth resistor R charges the fourth capacitor C (the fifth resistor R limits the current to ensure that the voltage of the fourth capacitor C does not exceed the rated voltage of the pulse transformer T), when the thyristor Q is conducted, the fourth capacitor C discharges through a primary coil of the pulse transformer T, a near-kilovolt voltage is induced on the secondary coil, inert gas in the fourth neon lamp DS is ionized instantly, the inert gas in the third neon lamp DS is conducted, and the second capacitor C and the third neon lamp DS generate a strong electric arc light through the third capacitor C, and the neon lamp DC can be adjusted to the neon lamp intensity value after the third neon lamp DC and the neon lamp C are rotated to the neon lamp intensity value can be reduced to the neon lamp intensity value of the third neon lamp.
The charging time constant and the stroboscopic frequency under different working conditions can be obtained by selecting a proper seventh resistor R7, an adjustable resistor RP and a proper fifth capacitor C5 and adjusting the value of the adjustable resistor RP by a person skilled in the art.
It can be understood that, in order to enable the strobe apparatus to output a stable key phase signal, the present application also discloses key phase signal generating circuits of the strobe apparatus, which are connected to the strobe circuit disclosed in the above embodiment, see fig. 2, and include:
the structure of the circuit comprises a sixth resistor R6, a sixth capacitor C6 and a ninth resistor R9;
a end of the sixth resistor R6 is connected with the anode of the thyristor Q1, another end is connected with the control end of the thyristor Q1, the sixth capacitor C6 is connected with a ninth resistor R9 in parallel, a common end of and the resistor R6 are connected with a common node of the control ends of the thyristor Q1, and another common end of of the sixth capacitor C6 and the ninth resistor R9 is used as a key phase signal output end and connected with the vibration sensor data collector 1.
The principle is that when the fifth capacitor C5 is boosted to the ignition voltage of the second neon lamp DS2, the thyristor Q1 is triggered, the trigger waveform is pulse signals, the thyristor trigger voltage UG is 1-5V, and according to the key phase input voltage level of the connected vibration data collector 1, voltage division and filtering are carried out through the sixth capacitor C6 and the ninth resistor R9, and the voltage division and filtering are used as pulse signals for triggering the vibration data collector 1.
In summary, according to the technical solution disclosed in the present application, the obvious mark (such as a key slot) of the exposed portion of the tested rotating device is used, and the rotation speed of the flasher and the rotation speed of the tested rotating device are synchronized by adjusting the frequency, so that the measurement of the frequency multiplication amplitude and the phase of the rotating device is realized.
The embodiments in the present description are described in a progressive manner, each embodiment focuses on differences from other embodiments, and the same and similar parts among the embodiments are referred to each other.
Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the invention.
Claims (8)
1, phase testing device, comprising:
a vibration sensor data collector, a stroboscope and a vibration sensor;
the th input end of the vibration sensor data acquisition unit is connected with the output end of the stroboscope, the second input end of the vibration sensor data acquisition unit is connected with the output end of the vibration sensor, and the vibration sensor data acquisition unit is used for obtaining a phase difference according to a key phase signal and a vibration sensor signal and displaying the phase difference in the form of an angle signal;
the stroboscope is used for outputting the key phase signal with the same rotating frequency as the rotating frequency of the tested rotating equipment to the vibration sensor data collector and outputting a stroboscopic signal which is actively adjusted to be synchronous with the tested rotating equipment to the tested rotating equipment, and comprises a power circuit, a stroboscopic circuit and a key phase signal generating circuit;
and the vibration sensor is used for detecting and outputting the vibration sensor signal of the detected rotating equipment to the vibration sensor data acquisition unit.
2. The phase testing apparatus of claim 1, wherein the power supply circuit of the stroboscope comprises:
a terminal is used for connecting with a phase line of a power grid;
a th capacitor connected between the th terminal and the second terminal of the switch;
a th resistor connected in parallel with the th capacitor;
a diode having a cathode connected to a second terminal of the capacitor;
a second resistor with a th end connected with the anode of the th diode and a second end connected with a second phase line of the power grid;
a second capacitor connected in parallel with the second resistor;
a second diode having an anode connected to a second terminal of said capacitor;
a third resistor having a terminal connected to the cathode of the second diode and a terminal connected to the second terminal of the second resistor;
a third capacitor connected in parallel with the third resistor.
3. The phase test apparatus of claim 2, wherein the power supply circuit further comprises:
and the protector is arranged between the second resistor and a second phase line of the power grid.
4. A phase testing apparatus according to claim 3, wherein the protector is a fuse or a fuse.
5. The phase testing apparatus of claim 1, wherein the strobe circuit of the stroboscope comprises:
a neon lamp with an end connected with the positive electrode of a power circuit of the stroboscope and a second end connected with the negative electrode of the power module;
a pulse transformer having a synonym terminal of a secondary coil connected to the th neon lamp for ionizing the inert gas in the th neon lamp, wherein the synonym terminal of the secondary coil of the pulse transformer is connected to the second terminal of the th neon lamp;
a fourth resistor connected with the terminal of the neon lamp at the terminal in series;
a fourth capacitor with a th end connected to the th end of the fourth resistor and a second end connected to the same name end of the primary winding of the pulse transformer;
a fifth resistor, wherein the th end is connected with the th end of the fourth capacitor, and the second end is connected with the synonym end of the primary coil of the pulse transformer;
the cathode of the thyristor is connected with the th end of the fourth capacitor, and the anode of the thyristor is connected with the second end of the fifth resistor;
a second neon lamp with the th end connected with the control end of the thyristor;
a fifth capacitor having a terminal connected to the second terminal of the second neon lamp and a second terminal connected to the anode of the thyristor;
, an eighth resistor connected to the second terminal of the fifth capacitor;
an adjustable resistor with an th end connected with the eighth resistor and a control end connected with the second end of the second neon lamp;
and the end is connected with the second end of the adjustable resistor, and the end is connected with the end of the fourth resistor.
6. The phase test apparatus of claim 5, wherein the key phase signal generating circuit of the stroboscope comprises:
the common terminal is connected with the control terminal of the thyristor, the common terminal is used as a key phase signal output terminal of the stroboscope, and the sixth capacitor and the ninth resistor are connected in parallel;
and a sixth resistor connected between the terminal and the control terminal of the thyristor, and the terminal and the anode of the thyristor.
7. The phase testing device according to claim 1, wherein the vibration sensor is a piezoelectric acceleration vibration sensor or a velocity vibration sensor or an eddy current displacement vibration sensor provided on a bearing housing of the rotating device under test.
8. The phase test apparatus of claim 1, wherein the stroboscope is a stroboscope capable of outputting a key phase signal of a pulse voltage of 5V.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN201510223191.2A CN106199186B (en) | 2015-05-05 | 2015-05-05 | phase testing device |
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| CN201510223191.2A CN106199186B (en) | 2015-05-05 | 2015-05-05 | phase testing device |
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| CN106199186A CN106199186A (en) | 2016-12-07 |
| CN106199186B true CN106199186B (en) | 2020-01-31 |
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| CN107607782B (en) * | 2017-08-09 | 2019-11-08 | 中国长江电力股份有限公司 | A method of for water turbine units PMU device key phase pulse signal square wave shaping |
| CN113865687B (en) * | 2021-08-31 | 2024-02-20 | 青岛海尔空调器有限总公司 | Pipeline vibration testing device |
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| US4654600A (en) * | 1985-08-30 | 1987-03-31 | Tektronix, Inc. | Phase detector |
| CN2309029Y (en) * | 1997-06-19 | 1999-02-24 | 曹保国 | Relay stroboscopic lamp |
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| CN101451898A (en) * | 2009-01-13 | 2009-06-10 | 华北电力大学 | Steam-electric generating set rotor thermal bending unbalance fault real time diagnostic method |
| CN101750198A (en) * | 2008-11-28 | 2010-06-23 | 上海宝钢工业检测公司 | Method for measuring corresponding phase positions of vibration signals of different measuring points of rotary machine |
| CN203981344U (en) * | 2014-08-19 | 2014-12-03 | 哈尔滨汇通电力工程有限公司 | Universal strobe type vibration phase adapter |
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| US4654600A (en) * | 1985-08-30 | 1987-03-31 | Tektronix, Inc. | Phase detector |
| CN2309029Y (en) * | 1997-06-19 | 1999-02-24 | 曹保国 | Relay stroboscopic lamp |
| CN2630800Y (en) * | 2003-06-18 | 2004-08-04 | 哈尔滨飞机工业(集团)有限责任公司 | Helicopter dynamic balance simulation tester |
| CN101750198A (en) * | 2008-11-28 | 2010-06-23 | 上海宝钢工业检测公司 | Method for measuring corresponding phase positions of vibration signals of different measuring points of rotary machine |
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