CN106152889A - A kind of large-scale outside micrometer fixed school checking device - Google Patents

A kind of large-scale outside micrometer fixed school checking device Download PDF

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Publication number
CN106152889A
CN106152889A CN201610565881.0A CN201610565881A CN106152889A CN 106152889 A CN106152889 A CN 106152889A CN 201610565881 A CN201610565881 A CN 201610565881A CN 106152889 A CN106152889 A CN 106152889A
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CN
China
Prior art keywords
amesdial
elevating lever
fixed
outside micrometer
sliding shoe
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Granted
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CN201610565881.0A
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Chinese (zh)
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CN106152889B (en
Inventor
屠士祥
李栋杰
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Anhui Puyuan Separation Machinery Manufacturing Co Ltd
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Anhui Puyuan Separation Machinery Manufacturing Co Ltd
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Priority to CN201610565881.0A priority Critical patent/CN106152889B/en
Publication of CN106152889A publication Critical patent/CN106152889A/en
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B3/00Measuring instruments characterised by the use of mechanical techniques
    • G01B3/18Micrometers

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length-Measuring Instruments Using Mechanical Means (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)

Abstract

The invention discloses a kind of large-scale outside micrometer fixed school checking device, including: detection platform, standard gauge block, the first amesdial, the second amesdial, the 3rd amesdial, the 4th amesdial, installing rack and fixed mechanism, standard gauge block is for the calibration reference as the inspection of outside micrometer school;Detection platform is used for supporting, and fixed mechanism, for being locked the chi frame in outside micrometer, prevents it to be moved in checking procedure;First elevating lever, the second elevating lever cooperate for the gage button in outside micrometer, micrometric screw are lifted and be highly adjusted it;First amesdial, the second amesdial cooperate for gage button, micrometric screw in outside micrometer are carried out school inspection, it is ensured that the two is in same level;3rd amesdial, the 4th amesdial cooperate for standard gauge block carries out school inspection, it is ensured that standard gauge block and gage button, micrometric screw are in same perpendicular.Check results of the present invention is reliable.

Description

A kind of large-scale outside micrometer fixed school checking device
Technical field
The present invention relates to outside micrometer school inspection equipment technical field, particularly relate to a kind of large-scale outside micrometer fixed School checking device.
Background technology
Outside micrometer (OUTSIDE MICROMETER) is often simply called micrometer, mainly by the chi frame fixed, gage button, survey Micro-screw rod, fixed sleeving, microdrum, device for measuring force, locking device etc. form, and are that a kind of length more accurate than slide gauge is surveyed Amount.Guarantee the accuracy of outside micrometer measurement result future, and need periodically it to be carried out school inspection.Existing school procuratorial organ formula is all Manually carrying out school inspection, desk checking is difficult to find that the measuring surface depth of parallelism, the poor reliability of assay.
Summary of the invention
The technical problem existed based on above-mentioned background technology, the present invention proposes the inspection of a kind of large-scale outside micrometer fixed school Device.
The present invention proposes a kind of large-scale outside micrometer fixed school checking device, including: detection platform, standard gauge block, First amesdial, the second amesdial, the 3rd amesdial, the 4th amesdial, installing rack and fixed mechanism, wherein:
Detection platform upper surface is provided with the first elevating lever positioned opposite and the second elevating lever, the first elevating lever, second The top of elevating lever is separately installed with the first mounting seat and the second mounting seat;
Detection platform upper surface and be positioned at the side of the first elevating lever and the second elevating lever and be provided with support seat and support seat;
Standard gauge block is for as verification reference standard, being arranged between the first elevating lever, the second elevating lever;
Installing rack is positioned in detection platform;
First amesdial, the second amesdial all include measuring bar, and the first amesdial, the second amesdial are positioned at the first lifting Between bar, the second elevating lever and be respectively and fixedly installed on installing rack, and the first amesdial, the second amesdial are measured bar and are hung down respectively Straight in horizontal plane;
3rd amesdial, the 4th amesdial all include measuring bar, and the 3rd amesdial, the 4th amesdial are positioned at the 1000th point Between table, the second amesdial, the side being respectively and fixedly installed to of line is provided with support seat, supports on seat, and the 3rd amesdial, Measuring bar in 4th amesdial and be respectively parallel to horizontal plane, the measurement end measuring bar in the 3rd amesdial, the 4th amesdial is divided equally Do not point to the first amesdial and the perpendicular at the second amesdial place;
Fixed mechanism is positioned at the first elevating lever and the side of the second elevating lever, and fixed mechanism includes briquetting and fastening bolt, Briquetting is positioned at the top of detection platform, and fastening bolt through briquetting and is threadeded with detection platform.
Preferably, the spacing between detection platform upper surface and horizontal plane by near the first elevating lever, the one of the second elevating lever Successively decrease successively or be incremented by the side lateralling secure mechanism.
Preferably, the spacing between detection platform upper surface and horizontal plane by near the first elevating lever, the one of the second elevating lever Successively decrease successively in the side lateralling secure mechanism.
Preferably, the first elevating lever includes the first sleeve and the first threaded rod, and the first sleeve is vertically arranged and rotatably pacifies Being contained in detection platform, the first threaded rod is vertically arranged and threadeds with the first sleeve.
Preferably, the outer surface of the first sleeve is provided with the hole slot being circular layout around its anchor ring.
Preferably, the second elevating lever includes the second sleeve and the second threaded rod, and the second sleeve is vertically arranged and rotatably pacifies Being contained in detection platform, the second threaded rod is vertically arranged and is connected with the second bush whorl.
Preferably, the outer surface of the second sleeve is provided with the hole slot being circular layout around its anchor ring.
Preferably, the first elevating lever is provided with the first secondary elevating mechanism, the first secondary elevator away from the side of the second elevating lever Structure includes that the first fixed block, the first sliding shoe and the first regulating part, described first fixed block are fixedly mounted in detection platform, the One fixed block is provided with, away from the side of the first elevating lever, the dovetail groove vertically extended;First sliding shoe coordinates with dovetail groove and along swallow The bearing of trend of stern notch slides up and down, and the upper surface of the first sliding shoe is provided with support seat;First regulating part is respectively with One sliding shoe and the first fixed block carry out coordinating for the first sliding shoe is carried out stop.
Preferably, the upper surface of the first sliding shoe is provided with the installing hole extended to its lower surface direction.
Preferably, the second elevating lever is provided with the second secondary elevating mechanism, the second secondary elevator away from the side of the first elevating lever Structure includes that the second fixed block, the second sliding shoe and the second regulating part, described second fixed block are fixedly mounted in detection platform, the Two fixed blocks are provided with, away from the side of the second elevating lever, the dovetail groove vertically extended;The second sliding shoe coordinates with dovetail groove and along swallow The bearing of trend of stern notch slides up and down, and the upper surface of the second sliding shoe is provided with support seat;Second regulating part is respectively with Two sliding shoes and the second fixed block carry out coordinating for the second sliding shoe is carried out stop.
Preferably, the upper surface of the second sliding shoe is provided with the installing hole extended to its lower surface direction.
Preferably, support seat and include that vertical rod, tray and securing member, described vertical rod one end stretch in installing hole and by tightly Firmware is fixed;Described tray is positioned at the top of fixing vertical rod and is secured to.
Preferably, tray upper surface has arc-shaped slot.
Preferably, installing rack includes horizontal plate and is positioned at below horizontal plate for the supporting leg supported.
Preferably, supporting leg includes be triangularly arranged layout the first supporting leg, the second supporting leg and the 3rd supporting leg.
In the present invention, standard gauge block is for the calibration reference as the inspection of outside micrometer school;Detection platform is for detection In the chi frame of micrometer be supported, fixed mechanism, for being locked the chi frame in outside micrometer, prevents it Checking procedure is moved;First elevating lever, the second elevating lever cooperate for the gage button in outside micrometer, survey Micro-screw rod carries out lifting and being highly adjusted it;First amesdial, the second amesdial cooperate for external diameter thousand points In chi, gage button, micrometric screw carry out school inspection, it is ensured that the two is in same level;3rd amesdial, the 4th amesdial are mutual Coordinate for standard gauge block is carried out school inspection, it is ensured that standard gauge block and gage button, micrometric screw are in same perpendicular.
In sum, the large-scale outside micrometer of the one fixed school checking device that the present invention proposes, by four amesdials Cooperate and can be quickly found out the measuring surface depth of parallelism, and the dual school of gage button, micrometric screw and standard gauge block is examined so that survey Amount data are accurate, can effectively reduce error.Additionally, the first elevating lever, the second elevating lever, the first secondary elevating mechanism, the second secondary liter Descending mechanism cooperates and can meet the inspection of the school to different size outside micrometer, effectively expands its range.
Accompanying drawing explanation
Fig. 1 is the structural representation of a kind of large-scale outside micrometer fixed school checking device that the present invention proposes;
Fig. 2 is the partial enlarged drawing of Fig. 1;
Fig. 3 is the knot of the first elevating lever described in a kind of large-scale outside micrometer fixed school checking device that the present invention proposes Structure schematic diagram;
Fig. 4 is the knot of the second elevating lever described in a kind of large-scale outside micrometer fixed school checking device that the present invention proposes Structure schematic diagram.
Detailed description of the invention
Below, by specific embodiment, technical scheme is described in detail.
As Figure 1-4, Fig. 1 is that the structure of a kind of large-scale outside micrometer fixed school checking device that the present invention proposes is shown It is intended to;Fig. 2 is the partial enlarged drawing of Fig. 1;Fig. 3 is in the large-scale outside micrometer of the one fixed school checking device that the present invention proposes The structural representation of described first elevating lever;Fig. 4 is the large-scale outside micrometer of the one fixed school checking device that the present invention proposes Described in the structural representation of the second elevating lever.
Reference Fig. 1-4, the large-scale outside micrometer of the one fixed school checking device that the embodiment of the present invention proposes, including: inspection Survey platform 1, standard gauge block the 4, first amesdial the 5, second amesdial the 6, the 3rd amesdial the 7, the 4th amesdial 8, installing rack 9 and consolidate Determine mechanism 10, wherein:
Detection platform 1 upper surface is provided with the first elevating lever 2 and the second elevating lever 3 positioned opposite, the first elevating lever 2, The top of the second elevating lever 3 is separately installed with the first mounting seat 15 and the second mounting seat 16;Detection platform 1 upper surface and be positioned at The side of one elevating lever 2 and the second elevating lever 3 is provided with support seat and supports seat;Standard gauge block 4 verifies reference standard for conduct, It is arranged between first elevating lever the 2, second elevating lever 3;Installing rack 9 is positioned in detection platform 1;First the 5, the 2000th point of amesdial Table 6 all includes measuring bar, and first amesdial the 5, second amesdial 6 is between first elevating lever the 2, second elevating lever 3 and distinguishes It is fixedly mounted on installing rack 9, and first amesdial the 5, second amesdial 6 is measured bar and is respectively perpendicular to horizontal plane;3000th point Table the 7, the 4th amesdial 8 all includes measuring bar, and the 3rd amesdial the 7, the 4th amesdial 8 is positioned at first amesdial the 5, second amesdial Between 6, the side being respectively and fixedly installed to of line is provided with support seat, supports on seat, and the 3rd amesdial the 7, the 4th amesdial 8 Middle measurement bar is respectively parallel to horizontal plane, and the measurement end measuring bar in the 3rd amesdial 7, the 4th amesdial 8 points to respectively One amesdial 5 and the perpendicular at the second amesdial 6 place;Fixed mechanism 10 is positioned at the first elevating lever 2 and the second elevating lever 3 Side, fixed mechanism 10 includes briquetting 101 and fastening bolt 102, and briquetting 101 is positioned at the top of detection platform 1, fastening bolt 102 through briquetting 101 and threaded with detection platform 1.When outside micrometer being carried out school inspection, first by outside micrometer Chi frame is placed in detection platform 1, and make the gage button of outside micrometer, micrometric screw be individually positioned in the first mounting seat 15, In two mounting seats 16, chi frame is made to be stuck in the lower section of briquetting 101 and utilize fastening bolt to press for 102 times to be locked by chi frame;Then Coordinate gage button, micrometric screw are entered with first elevating lever the 2, second elevating lever 3 respectively by first amesdial the 5, second amesdial 6 Row calibration, is calibrated standard gauge block 4 by the 3rd amesdial the 7, the 4th amesdial 8, and its concrete calibration process is as follows:
Make in first amesdial the 5, second amesdial 6 measure bar top respectively with gage button, the upper surface of micrometric screw Against, and it is the most consistent to observe first amesdial the 5, second amesdial 6 reading, when the two reading is inconsistent, adjusts first liter Fall bar 2 and/or the second elevating lever 3, make the first mounting seat 15 and/or the second mounting seat 16 carry out lifting action, to drive gage button And/or micrometric screw lifting, so that it is guaranteed that gage button and/or micrometric screw are in same level;
Make in the 3rd amesdial the 7, the 4th amesdial 8 measure bar respectively with the side surface of standard gauge block 4 against, utilize the Three amesdial the 7, the 4th amesdials 8 are calibrated, and finally make standard gauge block 4 and gage button, micrometric screw be in same perpendicular;
Finally make gage button, micrometric screw top respectively with the two ends of standard gauge block 4 against, observe its measurement data and mark The tentation data of quasi-gauge block 4 is the most consistent, thus judges whether this outside micrometer certainty of measurement is in acceptability limit.
In the present embodiment, the spacing between detection platform 1 upper surface and horizontal plane is lifted by near the first elevating lever 2, second Successively decrease successively to the side of fixed mechanism 10 in the side of bar 3 so that in verification, the chi frame of outside micrometer is slightly below gage button, micrometer Screw rod, to facilitate verification.
In the present embodiment, the first elevating lever 2 includes the first sleeve 201 and the first threaded rod 202, and the first sleeve 201 is vertical Arranging and may be rotatably mounted in detection platform 1, the first threaded rod 202 is vertically arranged and threadeds with the first sleeve 201;The Two elevating levers 3 include the second sleeve 301 and the second threaded rod 302, and the second sleeve 301 is vertically arranged and may be rotatably mounted at detection On platform 1, the second threaded rod 302 is vertically arranged and threadeds with the second sleeve 301;In work, by rotating the first sleeve 201, the second threaded rod 302 promotes first threaded rod the 202, second threaded rod 302 to stretch, thus realizes lift adjustment action.
In the present embodiment, the outer surface of the first sleeve 201 and the second sleeve 301 is equipped with the hole being circular layout around its anchor ring Groove 13, the insertion being provided for rod member of hole slot 13, the first sleeve 201, second can be driven easily to overlap by moving rod member Cylinder 301 rotates, time saving and energy saving.
In the present embodiment, the first elevating lever 2 is provided with the first secondary elevating mechanism 11 away from the side of the second elevating lever 3, and first Secondary elevating mechanism 11 includes that the first fixed block, the first sliding shoe and the first regulating part, described first fixed block are fixedly mounted on inspection Surveying on platform 1, the first fixed block is provided with, away from the side of the first elevating lever 2, the dovetail groove vertically extended;First sliding shoe and swallow Stern notch cooperation the bearing of trend along dovetail groove slide up and down, and the upper surface of the first sliding shoe is provided with support seat 14;The One regulating part carries out coordinating for the first sliding shoe is carried out stop with the first sliding shoe and the first fixed block respectively.Second lifting Bar 3 is provided with the second secondary elevating mechanism 12 away from the side of the first elevating lever 2, and the second secondary elevating mechanism 12 includes the second fixed block 1201, the second sliding shoe 1202 and the second regulating part 1203, described second fixed block 1201 is fixedly mounted in detection platform 1, Second fixed block 1201 is provided with, away from the side of the second elevating lever 3, the dovetail groove vertically extended;The second sliding shoe 1202 and dovetail Slot fit the bearing of trend along dovetail groove slide up and down, and the upper surface of the second sliding shoe 1202 is provided with support seat 14; Second regulating part 1203 carries out coordinating for the second sliding shoe with the second sliding shoe 1202 and the second fixed block 1201 respectively 1202 carry out stop.The effect of the first secondary elevating mechanism 11 and the second secondary elevating mechanism 12 lifts with the first elevating lever 2 and second The effect of bar 3 is identical, cannot be carried out the school of the large-scale outside micrometer lifted for meeting first elevating lever the 2, second elevating lever 3 Inspection, to expand its scope of application, and fixed block and sliding shoe dovetail in the first secondary elevating mechanism 11 and the second secondary elevating mechanism 12 Slot type is slidably matched, and supporting power is big, and Stability Analysis of Structures is reliable.
In the present embodiment, the upper surface of the first sliding shoe and the second sliding shoe 1202 is provided with respectively to its lower surface direction The installing hole extended, and the support seat 14 being arranged on the first sliding shoe, the second sliding shoe 1202 all includes vertical rod 1401, tray 1402 and securing member 1403, in described vertical rod 1401 one end stretches to installing hole and fixing by securing member 1403;Described tray 1402 tops being positioned at fixing vertical rod 1401 are also secured to, and tray 1402 upper surface has arc-shaped slot;Setting of said structure Put so that lifting reliable and stable, and securing member 1403 can adjust the vertical rod 1401 insertion depth in installing hole, thus realize Fine setting to tray 1402 height.
In the present embodiment, shelve 9 and include horizontal plate and be positioned at below horizontal plate for the supporting leg supported; Supporting leg includes be triangularly arranged layout the first supporting leg, the second supporting leg and the 3rd supporting leg.The setting of this structure both can ensure that structure Stablize, again can school examine during, by respectively the position of three supporting legs being moved, it is achieved to the first amesdial 5 He The position of the second amesdial 6 is finely adjusted, with guarantee measurement bar in the first amesdial 5 and the second amesdial 6 respectively with thousand points Gage button in chi, micrometric screw against.
From the foregoing, it will be observed that the large-scale outside micrometer of the one fixed school checking device that the present invention proposes, by four amesdials Cooperate and can be quickly found out the measuring surface depth of parallelism, and the dual school of gage button, micrometric screw and standard gauge block is examined so that survey Amount data are accurate, can effectively reduce error.Additionally, the first elevating lever, the second elevating lever, the first secondary elevating mechanism, the second secondary liter Descending mechanism cooperates and can meet the inspection of the school to different size outside micrometer, effectively expands its range.
The above, the only present invention preferably detailed description of the invention, but protection scope of the present invention is not limited thereto, Any those familiar with the art in the technical scope that the invention discloses, according to technical scheme and Inventive concept equivalent or change in addition, all should contain within protection scope of the present invention.

Claims (10)

1. a large-scale outside micrometer fixed school checking device, it is characterised in that including: detection platform (1), standard gauge block (4), the first amesdial (5), the second amesdial (6), the 3rd amesdial (7), the 4th amesdial (8), installing rack (9) and fixing machine Structure (10), wherein:
Detection platform (1) upper surface is provided with the first elevating lever (2) positioned opposite and the second elevating lever (3), the first elevating lever (2), the top of the second elevating lever (3) is separately installed with the first mounting seat (15) and the second mounting seat (16);
Detection platform (1) upper surface and be positioned at the side of the first elevating lever (2) and the second elevating lever (3) and be provided with support seat and support Seat;
Standard gauge block (4) is for as verification reference standard, being arranged between the first elevating lever (2), the second elevating lever (3);
Installing rack (9) is positioned in detection platform (1);
First amesdial (5), the second amesdial (6) all include measuring bar, and the first amesdial (5), the second amesdial (6) are positioned at the Between one elevating lever (2), the second elevating lever (3) and be respectively and fixedly installed on installing rack (9), and the first amesdial (5), second Amesdial (6) is measured bar and is respectively perpendicular to horizontal plane;
3rd amesdial (7), the 4th amesdial (8) all include measuring bar, and the 3rd amesdial (7), the 4th amesdial (8) are positioned at the Between one amesdial (5), the second amesdial (6), the side being respectively and fixedly installed to of line is provided with support seat, supports on seat, and 3rd amesdial (7), the 4th amesdial (8) are measured bar and is respectively parallel to horizontal plane, the 3rd amesdial (7), the 4th amesdial (8) the measurement end measuring bar in points to the first amesdial (5) and the perpendicular at the second amesdial (6) place respectively;
Fixed mechanism (10) is positioned at the first elevating lever (2) and the side of the second elevating lever (3), and fixed mechanism (10) includes briquetting And fastening bolt (102) (101), briquetting (101) is positioned at the top of detection platform (1), and fastening bolt (102) passes briquetting (101) and with detection platform (1) threaded.
The fixed school of large-scale outside micrometer the most according to claim 1 checking device, it is characterised in that detection platform (1) Spacing between upper surface and horizontal plane by near the first elevating lever (2), the second elevating lever (3) side to fixed mechanism (10) Successively decrease successively or be incremented by side;Preferably, the detection platform (1) spacing between upper surface and horizontal plane is by near the first elevating lever (2), successively decrease successively to the side of fixed mechanism (10) in the side of the second elevating lever (3).
The fixed school of large-scale outside micrometer the most according to claim 1 checking device, it is characterised in that the first elevating lever (2) including the first sleeve (201) and the first threaded rod (202), the first sleeve (201) is vertically arranged and may be rotatably mounted at detection On platform (1), the first threaded rod (202) is vertically arranged and threadeds with the first sleeve (201);Preferably, the first sleeve (201) outer surface is provided with the hole slot (13) being circular layout around its anchor ring.
The fixed school of large-scale outside micrometer the most according to claim 1 checking device, it is characterised in that the second elevating lever (3) including the second sleeve (301) and the second threaded rod (302), the second sleeve (301) is vertically arranged and may be rotatably mounted at detection On platform 1, the second threaded rod (302) is vertically arranged and threadeds with the second sleeve (301);Preferably, the second sleeve (301) Outer surface be provided with the hole slot (13) being circular layout around its anchor ring.
The fixed school of large-scale outside micrometer the most according to claim 1 checking device, it is characterised in that the first elevating lever (2) side away from the second elevating lever (3) is provided with the first secondary elevating mechanism (11), and the first secondary elevating mechanism (11) includes that first is solid Determining block, the first sliding shoe and the first regulating part, described first fixed block is fixedly mounted in detection platform (1), the first fixed block Side away from the first elevating lever (2) is provided with the dovetail groove of vertically extension;First sliding shoe coordinates with dovetail groove and along dovetail groove Bearing of trend slide up and down, the upper surface of the first sliding shoe be provided with support seat (14);First regulating part is respectively with One sliding shoe and the first fixed block carry out coordinating for the first sliding shoe is carried out stop.
The fixed school of large-scale outside micrometer the most according to claim 5 checking device, it is characterised in that the first sliding shoe Upper surface is provided with the installing hole extended to its lower surface direction.
The fixed school of large-scale outside micrometer the most according to claim 1 checking device, it is characterised in that the second elevating lever (3) side away from the first elevating lever (2) is provided with the second secondary elevating mechanism (12), and the second secondary elevating mechanism (12) includes that second is solid Determining block (1201), the second sliding shoe (1202) and the second regulating part (1203), described second fixed block (1201) is fixedly mounted on In detection platform (1), the second fixed block (1201) is provided with, away from the side of the second elevating lever (3), the dovetail groove vertically extended;The Two sliding shoes (1202) coordinate with dovetail groove and slide up and down along the bearing of trend of dovetail groove, the second sliding shoe (1202) Upper surface is provided with support seat (14);Second regulating part (1203) respectively with the second sliding shoe (1202) and the second fixed block (1201) carry out coordinating for the second sliding shoe (1202) is carried out stop.
The fixed school of large-scale outside micrometer the most according to claim 7 checking device, it is characterised in that the second sliding shoe (1202) upper surface is provided with the installing hole extended to its lower surface direction.
9. according to the large-scale outside micrometer fixed school checking device described in claim 6 or 8, it is characterised in that support seat (14) including vertical rod (1401), tray (1402) and securing member (1403), described vertical rod (1401) one end stretches in installing hole And fixed by securing member (1403);Described tray (1402) is positioned at the top of fixing vertical rod (1401) and is secured to;Preferably Ground, tray (1402) upper surface has arc-shaped slot.
The fixed school of large-scale outside micrometer the most according to claim 1 checking device, it is characterised in that installing rack (9) wraps Include horizontal plate and be positioned at below horizontal plate for the supporting leg supported;Preferably, supporting leg includes row triangular in shape Row arrange the first supporting leg, the second supporting leg and the 3rd supporting leg.
CN201610565881.0A 2016-07-18 2016-07-18 A kind of fixed school checking device of large size outside micrometer Active CN106152889B (en)

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Cited By (2)

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CN114459309A (en) * 2021-12-31 2022-05-10 太原重工股份有限公司 Large-size outer spigot high-precision detection device
CN114812334A (en) * 2022-05-24 2022-07-29 浙江正鼎汽车零部件有限公司 Verifying attachment of swing arm support on vehicle chassis

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CN114459309A (en) * 2021-12-31 2022-05-10 太原重工股份有限公司 Large-size outer spigot high-precision detection device
CN114459309B (en) * 2021-12-31 2024-04-30 太原重工股份有限公司 High-precision detection device for large-size male end
CN114812334A (en) * 2022-05-24 2022-07-29 浙江正鼎汽车零部件有限公司 Verifying attachment of swing arm support on vehicle chassis
CN114812334B (en) * 2022-05-24 2023-07-25 浙江正鼎汽车零部件有限公司 Inspection device for swing arm support on automobile chassis

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