CN106137233A - Detector detects the method for exposure automatically - Google Patents
Detector detects the method for exposure automatically Download PDFInfo
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- CN106137233A CN106137233A CN201510166453.6A CN201510166453A CN106137233A CN 106137233 A CN106137233 A CN 106137233A CN 201510166453 A CN201510166453 A CN 201510166453A CN 106137233 A CN106137233 A CN 106137233A
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Abstract
The present invention provides a kind of method that detector detects exposure automatically, it at least includes: in the case of without exposure, by described field programmable gate array, the enable signal input part of described gate drivers is set to enabled state, so that all output channels of described gate drivers are opened simultaneously；By described gate drivers, the electric charge in described TFT panel is detected output in real time；By described analog front circuit, the charge integration detecting output in real time is converted to voltage signal；By described analog-digital converter, described voltage signal is converted to digital signal, and described digital signal is input in described field programmable gate array；By the real-time change of digital signal described in described field programmable gate array identification, and judge whether to expose.The present invention saves manual null clear operation, decreases the probability of doctor's maloperation；Can automatically detect exposure, improve production efficiency, saved production cost, also improve the detector sensitivity to X-ray.
Description
Technical field
The present invention relates to detector technology field, particularly relate to a kind of method that detector detects exposure automatically.
Background technology
Digital medical X ray image equipment (also referred to as flat panel detector) by with X-ray production apparatus with the use of, can be into
People and the disease of child, damage and associated health problems provide digital X-ray image, for medical institutions and the diagnosis state of an illness.
Digital X-ray diagnostic imaging system is by flat panel detector, DR (Digital Radiography, digital X-ray image) work
Station software, computer system and related accessories composition, and flat panel detector is its important composition parts.
The scintillator (photoelectric conversion material) that modal flat panel detector uses is: gadolinium oxysulfide (Gd2O2S, GOS),
Cesium iodide (Cesium Iodide, CsI) and amorphous selenium (Amorphous Selenium, A-Se).By scintillator (GOS or
CsI) be coupled together with amorphous silicon photodiodes and TFT (Thin Film Transistor, thin film transistor (TFT)) just constitute non-straight
Connect conversion flat panel detector, A-Se is directly coupled together to constitute directly changes flat panel detector with TFT.
For non-immediate conversion flat panel detector, particularly Amorphous silicon flat-panel detectors, its imaging process needs to experience " X-ray "
To " visible ray ", and " charge image " arrives the imaging transformation process of " digital picture ", is a kind of with non-crystalline silicon photoelectricity two
Pole pipe array is the X ray image detector of core.Under x-ray bombardment, the scintillator of detector or luminescent coating are by X
Ray photons is converted to visible ray, then visible ray is converted to image telecommunications by having the non-crystalline silicon array of photodiode effect
Number, read by analog front circuit integration and A/D (Analog to Digital, analog) conversion, thus obtain digital map
Picture.
Amorphous silicon flat-panel detectors basic structure is mainly by caesium iodide scintillator layer, amorphous silicon photodiodes array (i.e. TFT face
Plate), drive circuit and picture signal reading circuit four part are constituted.Wherein, by amorphous silicon photodiodes in panel detector structure
Array completes the process that visible images is changed to charge image, also achieves the dot matrixed sampling of consecutive image simultaneously.As spy
Surveying the core of device, the performance characteristic of amorphous silicon photodiodes array is the key factor determining detector image-forming quality, each picture
Unit mainly by have heliosensitivity amorphous silicon photodiodes and can not be photosensitive switching diode, row drive wire (Gateline) and
Row sense line (Dataline) is constituted, as shown in Figure 1.The row drive wire being positioned at all pixels of same a line is connected, and is positioned at same string
The row sense line of all pixels is connected, then constitute the bus system of detector matrix.Descending in the unified command of time schedule controller
(namely gate drivers Gate Drivers) is driven to be detected line by line by the electric charge of pixel, then by analog front circuit (such as figure
Charge amplifier circuit Charge Amplifiers in 1) integration changes into voltage signal, and voltage signal is through A/D conversion electricity
Road is converted to corresponding digital signal, the image array of digital signal correspondence TFT panel, and this digital image matrix is passed by numeral
Defeated interface is sent to host computer and shows.
Under the driving of Gate Drivers, the electric charge in TFT panel is output, and conventional grid drive chip HX8677 has 600
Individual passage, is illustrated in figure 2 the working timing figure of grid drive chip HX8677.CPV is to control clock, in each rising
Along output channel output high level when arriving, i.e. one Gateline exports high level, so the electric charge in TFT panel is
Exporting line by line, this Gateline type of drive carries out a complete scan and takes around 500ms to 1s whole TFT panel.
Before flat panel detector once exposes on carrying out, first have to empty the residual charge of exposure last time, emptied post-exposure,
Starting after end exposure to gather, work schedule is as shown in Figure 3 again.Wherein, the process emptied is through gate drivers by TFT
The process that electric charge in panel exports line by line.In the design of above-mentioned flat panel detector, manually emptying and operate into necessity, doctor is exposing
Need first to click on " emptying " button before light just can be exposed.But doctor may forget empty when operation sometimes, if nothing
Null clear operation directly exposes, and can affect picture quality because leakage current or the ghost of exposure last time, cause mistaken diagnosis.
Flat panel detector signal acquisition process is to be triggered by the X ray sensor being contained within detector, is provided with inside detector
Special X ray sensor circuit.Simultaneously in order to make the sensitivity of X ray sensor increase, punching on structural member is needed to increase
Adding light transmission, design comparison is complicated, also can bring the series of problems of back scattering etc..
Therefore, how to eliminate the drawback of manual null clear operation, prevent doctor from causing picture quality to be affected because of maloperation, thus
Cause mistaken diagnosis, and how to simplify the design of flat panel detector, and improve the flat panel detector sensitivity to X-ray, thus carry
High efficiency, saving production cost etc., be problem demanding prompt solution.
Summary of the invention
The shortcoming of prior art in view of the above, it is an object of the invention to provide a kind of method that detector detects exposure automatically,
The method, based on non-immediate conversion flat panel detector, especially Amorphous silicon flat-panel detectors, is used for solving of the prior art
Detector, when manually null clear operation, easily causes picture quality to be affected because of doctor's maloperation, thus causes mistaken diagnosis
Problem, and in order to increase the sensitivity of X ray sensor, the design for flat panel detector is more complicated, thus causes raw
Produce the problem inefficient, production cost is higher.
For achieving the above object and other relevant purposes, the present invention provides a kind of method that detector detects exposure automatically, wherein,
Described detector at least includes that the TFT panel that gate drivers is connected with described gate drivers is connected with described TFT panel
The analog-digital converter that is connected with described analog front circuit of analog front circuit and with showing that described analog-digital converter is connected
Field programmable gate array, wherein, described detector automatically detects the method for exposure and at least includes:
In the case of without exposure, by described field programmable gate array, the enable signal input part of described gate drivers is set
It is set to enabled state, so that all output channels of described gate drivers are opened simultaneously；
By described gate drivers, the electric charge in described TFT panel is detected output in real time；
By described analog front circuit, the charge integration detecting output in real time is converted to voltage signal；
By described analog-digital converter, described voltage signal is converted to digital signal, and described digital signal is input to described existing
In field programmable gate array；
By the real-time change of digital signal described in described field programmable gate array identification, and judge whether to expose.
Preferably, in the case of without exposure, by described field programmable gate array by the enable signal of described gate drivers
Input is set to enabled state, so that all output channels of described gate drivers are opened simultaneously, specifically comprises the following steps that
Described field programmable gate array provides to the enable signal pins of the grid drive chip at described gate drivers place and enables
Signal；
In the case of without exposure, the enable signal that the enable signal pins of described grid drive chip accesses is by described raster data model
The enable signal input part of device is set to enabled state, so that all output channels of described gate drivers are opened simultaneously；
Wherein, the enable signal pins that the enable signal input part of described gate drivers is suitable to by described grid drive chip connects
The enable signal entered is controlled, all output channels of described gate drivers to be opened or closed simultaneously.
Preferably, when the enable signal input part of described gate drivers is arranged to enabled state, described grid drive chip
Enable signal pins access enable signal be low level signal.
Preferably, by the real-time change of digital signal described in described field programmable gate array identification, and judge whether to expose
Light, specifically comprises the following steps that
Presetting first threshold, wherein, described first threshold is digital signal during exposure generation and believes without numeral during exposure
Minimal difference between number；
The digital signal that described field programmable gate array is currently received and the last digital signal received compare
Relatively, thus identify the real-time change of described digital signal；
When the real-time change of described digital signal is more than described first threshold, described field programmable gate array judges to expose.
Preferably, described detector automatically detects the method for exposure and also includes:
When exposure occurs, by described field programmable gate array, the enable signal input part of described gate drivers is set to
Closed mode, so that all output channels of described gate drivers simultaneously close off.
Preferably, when exposure occurs, by described field programmable gate array, described gate drivers is set to off closed state,
So that all output channels of described gate drivers simultaneously close off, specifically comprise the following steps that
Described field programmable gate array provides to the enable signal pins of the grid drive chip at described gate drivers place and enables
Signal；
When exposure occurs, what the enable signal pins of described grid drive chip accessed enables signal by described gate drivers
Enable signal input part and be set to off closed state, so that all output channels of described gate drivers simultaneously close off；
Wherein, the enable signal pins that the enable signal input part of described gate drivers is suitable to by described grid drive chip connects
The enable signal entered is controlled, all output channels of described gate drivers to be opened or closed simultaneously.
Preferably, when the enable signal input part of described gate drivers is set to off closed state, described grid drive chip
Enable signal pins access enable signal be high level signal.
Preferably, when exposure occurs, X-ray is sensed using described TFT panel as X ray sensor.
Preferably, described detector automatically detects the method for exposure and also includes: after end exposure, by described gate drivers
Read the electric charge in described TFT panel line by line.
As it has been described above, the method that the detector of the present invention detects exposure automatically, have the advantages that and utilize gate drivers
The function simultaneously opened of all output channels, save manual null clear operation, decrease the probability of doctor's maloperation；Exposure occurs
Time whole TFT panel as X ray sensor, X ray sensor circuit and structural member punch operation can be saved, improve
Production efficiency, has saved production cost, and owing to whole TFT panel is as X ray sensor, has also improved detector
Sensitivity to X-ray.
Accompanying drawing explanation
Fig. 1 is shown as the structural representation of present invention Amorphous silicon flat-panel detectors of the prior art.
Fig. 2 is shown as the working timing figure of present invention grid drive chip HX8677 of the prior art.
Fig. 3 is shown as the working timing figure of present invention detector of the prior art.
Fig. 4 is shown as the idiographic flow schematic diagram that the detector of the embodiment of the present invention detects the method for exposure automatically.
Fig. 5 is shown as the detector of the embodiment of the present invention and automatically detects in the method for exposure the workflow of detector when exposure occurs
Cheng Tu.
Fig. 6 is shown as the detector of the embodiment of the present invention and automatically detects the enable signal input part of gate drivers in the method for exposure
It is arranged to the working timing figure of grid drive chip HX8677 during enabled state.
Element numbers explanation
1 gate drivers (Gate Drivers)
2 TFT panel
3 analog front circuits (AFE, Analog Front End)
4 analog-digital converters (ADC, Analog to Digital Converter)
5 field programmable gate arrays (FPGA, Field Programmable Gate Array)
Detailed description of the invention
Below by way of specific instantiation, embodiments of the present invention being described, those skilled in the art can be by disclosed by this specification
Content understand other advantages and effect of the present invention easily.The present invention can also be added by the most different detailed description of the invention
To implement or application, the every details in this specification can also be based on different viewpoints and application, in the essence without departing from the present invention
Various modification or change is carried out under god.
Referring to Fig. 4～Fig. 6, embodiments of the invention relate to a kind of method that detector detects exposure automatically, wherein, detector
At least include the AFE (analog front end) that the TFT panel 2 that gate drivers 1 is connected is connected with TFT panel 2 with gate drivers 1
Analog-digital converter 4 that circuit 3 is connected with analog front circuit 3 and the field-programmable gate array being connected with analog-digital converter 4
Row 5.It should be noted that the diagram provided in the present embodiment illustrates the basic conception of the present invention the most in a schematic way, then scheme
Component count, shape and size when only showing the assembly relevant with the present invention rather than implement according to reality in formula are drawn, in fact
When border is implemented, the kenel of each assembly, quantity and ratio can be a kind of random change, and its assembly layout kenel is likely to the most multiple
Miscellaneous.
In the present embodiment, will enable the function that all output channels of gate drivers 1 open simultaneously and be referred to as XON merit
Energy.Gate drivers 1 has one and enables input, and the enable signal input part of gate drivers 1 is arranged to enabled state
Time, the XON function of gate drivers 1 is opened；Accordingly, the enable signal input part of gate drivers 1 is arranged to
During closed mode, the XON function of gate drivers 1 is closed.Wherein, the enable signal input part of gate drivers 1 needs
To enable signal by input one to be configured.
As a example by grid drive chip HX8677, it is possible to the enable signal of the chip realizing the XON function of gate drivers 1 draws
Foot is "/XAO ", the datasheet of this chip is described in detail/and the effect of XAO pin.Refer to Fig. 6, its display
The work schedule of grid drive chip HX8677 when signal input part is arranged to enabled state is enabled at gate drivers 1
Figure.Now enabling signal is low level signal, and as seen from Figure 6 ,/XAO pin is in low level state, gate drivers 1
600 output channels OUT1～OUT600 open simultaneously, the electric charge in TFT panel 2 is detected output in real time, it is achieved that
Null clear operation to TFT panel 2.It is to say, during the enable input input low level of gate drivers 1, raster data model
The enable signal input part of device 1 is arranged to enabled state, and the XON function of gate drivers 1 is opened；Accordingly, defeated
When entering high level, the enable signal input part of gate drivers 1 is set to off closed state, the XON merit of gate drivers 1
Can be closed.
As shown in Figure 4, the detector of the present embodiment automatically detects the method for exposure and at least includes:
In the case of without exposure, opened the XON function of gate drivers 1 by field programmable gate array 5, so that grid
All output channels of driver 1 are opened simultaneously.
By gate drivers 1, the electric charge in TFT panel 2 is detected output real-time.
By analog front circuit 3, the charge integration detecting output in real time is converted to voltage signal.
By analog-digital converter 4, voltage signal is converted to digital signal, and digital signal is input to field programmable gate array
In 5.
Identified the real-time change of digital signal by field programmable gate array 5, and judge whether to expose.
In the present embodiment, said process had both achieved the automatic detection function to exposure, and achieve again TFT panel 2 is clear
Empty function.
In the present embodiment, in the case of without exposure, by field programmable gate array 5 by the XON of gate drivers 1
Function is opened, so that all output channels of gate drivers 1 are opened simultaneously, specifically comprises the following steps that
Field programmable gate array 5 provides to the enable signal pins of the grid drive chip at gate drivers 1 place and enables signal；
In the case of without exposure, what the enable signal pins of grid drive chip accessed enables signal by the XON of gate drivers 1
Function is opened so that all output channels of gate drivers 1 are opened simultaneously；Wherein, the enable signal input of gate drivers 1
The enable signal that end is suitable to by the enable signal pins of grid drive chip accesses is controlled, with by the institute of gate drivers 1
There is output channel to open or close simultaneously.
In the present embodiment, owing to when an exposure takes place, the charge number in TFT panel 2 can sharply increase, the electricity of detection output
Lotus number increases therewith, is input to the digital signal in field programmable gate array 5 and also can increase, therefore, it is possible to can be compiled by scene
Journey gate array 5 identifies the real-time change of digital signal, and judges whether to expose, and specifically comprises the following steps that
First, presetting first threshold, wherein, first threshold is to expose digital signal when occurring and without numeral during exposure
Minimal difference between signal.
Secondly, the digital signal that field programmable gate array 5 is currently received and the last digital signal received are carried out
Compare, thus identify the real-time change of digital signal.The real-time change of digital signal is actual reflects twice detected output electricity
The change of the brightness value of the TFT panel 2 of lotus.
Finally, when the real-time change of digital signal is more than first threshold, field programmable gate array 5 judges to expose.
Please continue to refer to Fig. 4, detector automatically detects the method for exposure and also includes: when exposure occurs, pass through field-programmable
The enable signal input part of gate drivers 1 is set to off closed state by gate array 5, so that all outputs of gate drivers 1
Passage simultaneously closes off.
In the present embodiment, when exposure occurs, by field programmable gate array 5 by defeated for the enable signal of gate drivers 1
Entering end and be set to off closed state, i.e./XAO pin is in high level state, so that all output channels of gate drivers 1 are same
Time close, specifically comprise the following steps that
Field programmable gate array 5 provides to the enable signal pins of the grid drive chip at gate drivers 1 place and enables signal；
When exposure occurs, what the enable signal pins of grid drive chip accessed enables signal by defeated for the enable signal of gate drivers 1
Enter end and be set to off closed state, so that all output channels of gate drivers 1 simultaneously close off, i.e. close gate drivers 1
XON function.Wherein, the enable signal pins that the enable signal input part of gate drivers 1 is suitable to by grid drive chip connects
The enable signal entered is controlled, all output channels of gate drivers 1 to be opened or closed simultaneously.
In the present embodiment, when the enable signal input part of gate drivers 1 is set to off closed state, grid drive chip
/ XAO pin access enable signal be high level signal.
The workflow of detector refers to Fig. 5, and when exposure occurs, field programmable gate array 5 sends control XON function
The instruction closed, i.e. provides the enable signal of high level to the enable signal pins of grid drive chip, thus by gate drivers
All output channels of 1 simultaneously close off.
It is noted that the most whole process is without using X ray sensor circuit.When exposure occurs, with
Whole TFT panel 2 senses X-ray as X ray sensor, considerably increases the sensitivity to X-ray, and without
To structural member punch operation, production efficiency can be improved, save production cost.
Please continue to refer to Fig. 4 and Fig. 5, described detector automatically detects the method for exposure and also includes: after end exposure, at CPV
The output channel making gate drivers 1 under the control of clock is opened line by line, is read line by line by the electric charge in TFT panel 2, it is achieved
Single exposure flow operations.
It addition, when the real-time change of digital signal is less than first threshold, field programmable gate array 5 judges to expose,
Please continue to refer to Fig. 4, continue through gate drivers 1 and the electric charge in TFT panel 2 is detected in real time output and continues follow-up
Flow process.Until field programmable gate array 5 judges to expose, can be compiled by scene immediately after i.e. automatically detecting X-ray
The enable signal input part of gate drivers 1 is set to off closed state by journey gate array 5, i.e. closes XON function, makes grid
All output channels of driver 1 simultaneously close off, and read TFT line by line according still further to normal mode of operation after waiting end exposure
Charge image in panel 2, completes signals collecting.It should be noted that due to 600 row output channels of gate drivers 1
Opening, digital signal is the shortest more than the time of first threshold, usually about 10ns simultaneously, so to the damage of electric charge after exposure
Vector is negligible.When after all charge images read line by line in TFT panel 2, again by field-programmable gate array
Row 5 open the XON function of gate drivers 1, make all output channels of gate drivers 1 open simultaneously, are ready for
Exposure process next time.
In sum, the detector of the present invention detects the method for exposure automatically, has the advantages that and utilizes gate drivers
The function simultaneously opened of all output channels, save manual null clear operation, decrease the probability of doctor's maloperation；Exposure occurs
Time whole TFT panel as X ray sensor, X ray sensor circuit and structural member punch operation can be saved, improve
Production efficiency, has saved production cost, and owing to whole TFT panel is as X ray sensor, has also improved detector
Sensitivity to X-ray.So, the present invention effectively overcomes various shortcoming of the prior art and has high industrial utilization.
The principle of above-described embodiment only illustrative present invention and effect thereof, not for limiting the present invention.Any it is familiar with this skill
Above-described embodiment all can be modified under the spirit and the scope of the present invention or change by the personage of art.Therefore, such as
All that in art, tool usually intellectual is completed under without departing from disclosed spirit and technological thought etc.
Effect is modified or changes, and must be contained by the claim of the present invention.
Claims (9)
1. the method that detector detects exposure automatically, wherein, described detector at least includes that gate drivers drives with described grid
The analog front circuit that the TFT panel that dynamic device connects is connected with described TFT panel is connected with described analog front circuit
Analog-digital converter and the field programmable gate array that is connected with described analog-digital converter, it is characterised in that described detection
Device automatically detects the method for exposure and at least includes:
In the case of without exposure, by described field programmable gate array, the enable signal of described gate drivers is inputted
End is set to enabled state, so that all output channels of described gate drivers are opened simultaneously；
By described gate drivers, the electric charge in described TFT panel is detected output in real time；
By described analog front circuit, the charge integration detecting output in real time is converted to voltage signal；
By described analog-digital converter, described voltage signal is converted to digital signal, and described digital signal is input to institute
State in field programmable gate array；
By the real-time change of digital signal described in described field programmable gate array identification, and judge whether to expose.
Detector the most according to claim 1 detects the method for exposure automatically, it is characterised in that in the case of without exposure, logical
Cross described field programmable gate array and the enable signal input part of described gate drivers is set to enabled state, so that described
All output channels of gate drivers are opened simultaneously, specifically comprise the following steps that
Described field programmable gate array provides to the enable signal pins of the grid drive chip at described gate drivers place
Enable signal；
In the case of without exposure, the enable signal that the enable signal pins of described grid drive chip accesses is by described grid
The enable signal input part of driver is set to enabled state, so that all output channels of described gate drivers are beaten simultaneously
Open；
Wherein, the enable signal that the enable signal input part of described gate drivers is suitable to by described grid drive chip draws
The enable signal that foot accesses is controlled, all output channels of described gate drivers to be opened or closed simultaneously.
Detector the most according to claim 2 detects the method for exposure automatically, it is characterised in that making of described gate drivers
When energy signal input part is arranged to enabled state, the enable signal that the enable signal pins of described grid drive chip accesses is
Low level signal.
Detector the most according to claim 1 detects the method for exposure automatically, it is characterised in that by described field programmable gate
The real-time change of digital signal described in array identification, and judge whether to expose, specifically comprise the following steps that
Presetting first threshold, wherein, described first threshold is to expose digital signal when occurring and without number during exposure
Minimal difference between word signal；
The digital signal that described field programmable gate array is currently received and the last digital signal received are carried out
Compare, thus identify the real-time change of described digital signal；
When the real-time change of described digital signal is more than described first threshold, described field programmable gate array judges to occur
Exposure.
5. the method automatically detecting exposure according to the detector described in any one of claim 1-4, it is characterised in that described detector is certainly
The method of dynamic detection exposure also includes:
When exposure occurs, by described field programmable gate array, the enable signal input part of described gate drivers is set
It is set to closed mode, so that all output channels of described gate drivers simultaneously close off.
Detector the most according to claim 5 detects the method for exposure automatically, it is characterised in that when exposure occurs, by institute
State field programmable gate array and the enable signal input part of described gate drivers is set to off closed state, so that described grid
All output channels of driver simultaneously close off, and specifically comprise the following steps that
Described field programmable gate array provides to the enable signal pins of the grid drive chip at described gate drivers place
Enable signal；
When exposure occurs, the enable signal that the enable signal pins of described grid drive chip accesses is by described raster data model
The enable signal input part of device is set to off closed state, so that all output channels of described gate drivers simultaneously close off；
Wherein, the enable signal that the enable signal input part of described gate drivers is suitable to by described grid drive chip draws
The enable signal that foot accesses is controlled, all output channels of described gate drivers to be opened or closed simultaneously.
Detector the most according to claim 6 detects the method for exposure automatically, it is characterised in that making of described gate drivers
When energy signal input part is set to off closed state, the enable signal that the enable signal pins of described grid drive chip accesses is
High level signal.
Detector the most according to claim 6 detects the method for exposure automatically, it is characterised in that when exposure occurs, with described
TFT panel senses X-ray as X ray sensor.
Detector the most according to claim 1 detects the method for exposure automatically, it is characterised in that described detector detects exposure automatically
The method of light also includes: after end exposure, reads the electric charge in described TFT panel line by line by described gate drivers.
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| CN111166359A (en) * | 2018-11-13 | 2020-05-19 | 深圳迈瑞生物医疗电子股份有限公司 | Flat panel detector, automatic exposure detection method thereof and ray imaging system |
| CN111198396A (en) * | 2019-12-23 | 2020-05-26 | 德润特医疗科技（武汉）有限公司 | AED rapid detection method |
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| CN108429893B (en) * | 2017-02-15 | 2021-01-01 | 奕瑞影像科技（太仓）有限公司 | Image sensor for full-field exposure detection and full-field exposure detection method thereof |
| CN109199420A (en) * | 2018-10-10 | 2019-01-15 | 北京纳米维景科技有限公司 | Triggering method, trigger device and the corresponding image detector of image detector |
| CN111166359A (en) * | 2018-11-13 | 2020-05-19 | 深圳迈瑞生物医疗电子股份有限公司 | Flat panel detector, automatic exposure detection method thereof and ray imaging system |
| CN111166359B (en) * | 2018-11-13 | 2024-02-09 | 深圳迈瑞生物医疗电子股份有限公司 | Flat panel detector, automatic exposure detection method thereof and radiographic imaging system |
| CN111198396A (en) * | 2019-12-23 | 2020-05-26 | 德润特医疗科技（武汉）有限公司 | AED rapid detection method |
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