CN106097700A - The method of testing of a kind of IR remote controller and system - Google Patents
The method of testing of a kind of IR remote controller and system Download PDFInfo
- Publication number
- CN106097700A CN106097700A CN201610592238.7A CN201610592238A CN106097700A CN 106097700 A CN106097700 A CN 106097700A CN 201610592238 A CN201610592238 A CN 201610592238A CN 106097700 A CN106097700 A CN 106097700A
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- remote controller
- test
- mcu
- testing
- code value
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- 238000010998 test method Methods 0.000 title claims abstract description 11
- 238000012360 testing method Methods 0.000 claims abstract description 100
- 238000000034 method Methods 0.000 claims description 12
- 238000001514 detection method Methods 0.000 claims description 6
- 230000002159 abnormal effect Effects 0.000 claims description 3
- 238000004519 manufacturing process Methods 0.000 abstract description 4
- 238000010586 diagram Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 2
- RVCKCEDKBVEEHL-UHFFFAOYSA-N 2,3,4,5,6-pentachlorobenzyl alcohol Chemical compound OCC1=C(Cl)C(Cl)=C(Cl)C(Cl)=C1Cl RVCKCEDKBVEEHL-UHFFFAOYSA-N 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G08—SIGNALLING
- G08C—TRANSMISSION SYSTEMS FOR MEASURED VALUES, CONTROL OR SIMILAR SIGNALS
- G08C25/00—Arrangements for preventing or correcting errors; Monitoring arrangements
-
- G—PHYSICS
- G08—SIGNALLING
- G08C—TRANSMISSION SYSTEMS FOR MEASURED VALUES, CONTROL OR SIMILAR SIGNALS
- G08C23/00—Non-electrical signal transmission systems, e.g. optical systems
- G08C23/04—Non-electrical signal transmission systems, e.g. optical systems using light waves, e.g. infrared
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Selective Calling Equipment (AREA)
Abstract
The present invention provides method of testing and the system of a kind of IR remote controller, and described method of testing comprises the following steps: step S1, the test program of burning IR remote controller on MCU;Step S2, after waiting until that MCU powers on, is directly entered test pattern, described MCU output test code value according to test program;Step S3, is received by Decoder and judges to test code value, until after test code value is sent, entering normal module by MCU.The present invention is after IR remote controller is electrified, and MCU first automatically into the test program of burning in advance, and then will can launch test code value at once automatically, until after being completed, described MCU controls IR remote controller and enters normal mode;Therefore, test workman has only to power on, and observes test data the most in test mode, without the mode of operation of switching IR remote controller after being completed, so can be greatly improved production test efficiency, and reduce cost.
Description
Technical field
The present invention relates to a kind of method of testing, particularly relate to the method for testing of a kind of IR remote controller, and relate to have employed
The system of the method for testing of this IR remote controller.
Background technology
When existing IR remote controller needs test electric current and hardware effort the most normal, it is all to need remote controller PCBA
It is electrified, the most again with the button on Conductive gauge pressing IR remote controller, whether carries out testing the hardware of this IR remote controller
Normal and operating current is the most normal, such method of testing, need more manual operation, cost of labor is high, work effect
Rate is low.
Summary of the invention
The technical problem to be solved is to need to provide one can reduce cost of labor, and improves work efficiency
The method of testing of IR remote controller, and relate to the system that have employed the method for testing of this IR remote controller.
To this, the present invention provides the method for testing of a kind of IR remote controller, comprises the following steps:
Step S1, the test program of burning IR remote controller on MCU;
Step S2, after waiting until that MCU powers on, is directly entered test pattern according to test program, and described MCU exports test patterns
Value;
Step S3, is received by Decoder and judges to test code value, until after test code value is sent, just being entered by MCU
Norm block.
Further improvement of the present invention is, in described step S2, after entering test pattern, the I/O port of described MCU passes through
Infrared transmitting tube output infrared test signal.
Further improvement of the present invention is, in described step S2, IR remote controller is connected with ammeter, described
While MCU exports test code value automatically, detected the current value of described IR remote controller by ammeter.
Further improvement of the present invention is, described IR remote controller is arranged on testing current tool, and described electric current is surveyed
Examination tool is connected with described ammeter, when described IR remote controller is placed on described testing current tool, is automatically obtained
The detection of described current value.
Further improvement of the present invention is, in described step S3, after test code value is sent, described MCU controls
IR remote controller exits test pattern, and automatically into normal mode.
Further improvement of the present invention is, in described step S2, described MCU powers on and powers on first for this MCU.
Further improvement of the present invention is, in described step S3, described Decoder is provided with alarm device, when determining
When test code value occurs abnormal, send alarm.
The present invention also provides for the test system of a kind of IR remote controller, have employed the test of IR remote controller as above
Method, and include direct current supply module, described direct current supply module is connected with described MCU.
Further improvement of the present invention is, also includes that testing current tool, described direct current supply module are arranged at described
On testing current tool, when described IR remote controller is positioned on described testing current tool, connect direct current supply module real
Existing MCU powers on, and is automatically obtained the detection of current value.
Compared with prior art, the beneficial effects of the present invention is: after IR remote controller is electrified, MCU can the most automatically
Enter the test program of burning in advance, and then will automatically launch test code value at once, until after being completed, described MCU is controlled
IR remote controller processed enters normal mode;Therefore, test workman has only to power on, and observes test data the most in test mode
, without the mode of operation of switching IR remote controller after being completed, so can be greatly improved production test efficiency, fall
Low to test labor claim, reduce the frequency of manual operation, therefore cost is effectively reduced.
Accompanying drawing explanation
Fig. 1 is the workflow schematic diagram of an embodiment of the present invention;
Fig. 2 is the system structure schematic diagram of an embodiment of the present invention;
Fig. 3 is the circuit theory schematic diagram of an embodiment of the present invention.
Detailed description of the invention
Below in conjunction with the accompanying drawings, the preferably embodiment of the present invention is described in further detail.
Embodiment 1:
As depicted in figs. 1 and 2, this example provides the method for testing of a kind of IR remote controller, comprises the following steps:
Step S1, the test program of burning IR remote controller on MCU;
Step S2, after waiting until that MCU powers on, is directly entered test pattern according to test program, and described MCU exports test patterns
Value;
Step S3, is received by Decoder and judges to test code value, until after test code value is sent, just being entered by MCU
Norm block.
Step S1 described in this example is used for by default test program and then makes MCU can automatically send test code value, institute
Stating test code value is each key code value in the circuit diagram shown in Fig. 3, and then can be used in detecting described IR remote controller
Hardware is the most normal;In described step S2, after entering test pattern, the I/O port of described MCU exports infrared by infrared transmitting tube
Test signal, such as is controlled exporting infrared test signal to infrared transmitting tube by 15 pins of described MCU.In Fig. 2,
AD009-03 is a kind of learning-oriented remote-controlled chip.
Preferably, in step S2 described in this example, IR remote controller is connected with ammeter, automatically exports survey at described MCU
While examination code value, detected the current value of described IR remote controller by ammeter;Being more highly preferred to, described IR remote controller sets
Being placed on testing current tool, described testing current tool is connected with described ammeter, when described IR remote controller is placed on
Time on described testing current tool, it is automatically obtained the detection of described current value.Described testing current tool is that current value detects institute
The frock used, can be automatically obtained the inspection of current value when described IR remote controller is positioned on described testing current tool
Survey.
In step S3 described in this example, after test code value is sent, described MCU controls IR remote controller and exits test mould
Formula, and automatically into normal mode, so it can be avoided that workman is after being completed, in addition it is also necessary to Non-follow control mode of operation switches
Problem, further achieve the raising of work efficiency;Described mode of operation includes test pattern and normal mode, described just
Norm formula refers to user can directly control the normal mode of operation of infrared equipment by IR remote controller.
In step S2 described in this example, described MCU powers on and powers on first for this MCU, say, that when plant produced, red
Outer remote controller powers on first so that MCU powers on, and then is directly entered test pattern, after test terminates, automatically switches to normal
Pattern.Such setting, can either facilitate production test, it is possible to reduce technical threshold and the number of operations of workman's test as far as possible,
Change battery simultaneously during also being able to prevent user from using and also can enter the drawback of test pattern, be very suitable for infrared remote control
The test of device and use.
In step S3 described in this example, described Decoder is provided with alarm device, when determining test code value and occurring abnormal,
Send alarm;If unusual circumstance in test process, send alarm, test workman so can be given fine
Suggesting effect so that test workman can operate the test of several IR remote controller simultaneously, improves work efficiency.
This example is after IR remote controller is electrified, and MCU meeting is first automatically into the test program of burning in advance, and then horse back is the most just
Can automatically launch test code value, until after being completed, described MCU controls IR remote controller and enters normal mode;Therefore, test
Workman has only to power on, and observes test data the most in test mode, without switching infrared remote control after being completed
The mode of operation of device, so can be greatly improved production test efficiency, reduces test labor claim, reduces manual operation
Frequency, therefore cost is effectively reduced.
Embodiment 2:
This example also provides for the test system of a kind of IR remote controller, have employed the test of IR remote controller as described in Example 1
Method, and include direct current supply module, described direct current supply module is connected with described MCU.
This example further preferably includes that testing current tool, described direct current supply module are arranged on described testing current tool,
When described IR remote controller is positioned on described testing current tool, connection direct current supply module realizes MCU and powers on, and automatically
Realize the detection of current value.Therefore, this example has only to be positioned over by described IR remote controller on described testing current tool, with regard to energy
The enough hardware automatically detecting described IR remote controller and operating current are the most normal.
Above content is to combine concrete preferred implementation further description made for the present invention, it is impossible to assert
Being embodied as of the present invention is confined to these explanations.For general technical staff of the technical field of the invention,
On the premise of present inventive concept, it is also possible to make some simple deduction or replace, all should be considered as belonging to the present invention's
Protection domain.
Claims (9)
1. the method for testing of an IR remote controller, it is characterised in that comprise the following steps:
Step S1, the test program of burning IR remote controller on MCU;
Step S2, after waiting until that MCU powers on, is directly entered test pattern according to test program, and described MCU exports test patterns
Value;
Step S3, is received by Decoder and judges to test code value, until after test code value is sent, just being entered by MCU
Norm block.
The method of testing of IR remote controller the most according to claim 1, it is characterised in that in described step S2, enters and surveys
After die trial formula, the I/O port of described MCU exports infrared test signal by infrared transmitting tube.
The method of testing of IR remote controller the most according to claim 1, it is characterised in that in described step S2, infrared distant
Control device is connected with ammeter, while described MCU exports test code value automatically, detects described infrared remote control by ammeter
The current value of device.
The method of testing of IR remote controller the most according to claim 3, it is characterised in that described IR remote controller is arranged at
On testing current tool, described testing current tool is connected with described ammeter, when described IR remote controller is placed on described
Time on testing current tool, it is automatically obtained the detection of described current value.
5. according to the method for testing of the IR remote controller described in Claims 1-4 any one, it is characterised in that described step
In S3, after test code value is sent, described MCU controls IR remote controller and exits test pattern, and automatically into normal mode
Formula.
6. according to the method for testing of the IR remote controller described in Claims 1-4 any one, it is characterised in that described step
In S2, described MCU powers on and powers on first for this MCU.
7. according to the method for testing of the IR remote controller described in Claims 1-4 any one, it is characterised in that described step
In S3, described Decoder is provided with alarm device, when determining test code value and occurring abnormal, sends alarm.
8. the test system of an IR remote controller, it is characterised in that have employed as described in claim 1 to 7 any one
The method of testing of IR remote controller, and include direct current supply module, described direct current supply module is connected with described MCU.
The test system of IR remote controller the most according to claim 8, it is characterised in that also include testing current tool,
Described direct current supply module is arranged on described testing current tool, controls when described IR remote controller is positioned over described testing current
Time on tool, connection direct current supply module realizes MCU and powers on, and is automatically obtained the detection of current value.
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CN201610592238.7A CN106097700A (en) | 2016-07-22 | 2016-07-22 | The method of testing of a kind of IR remote controller and system |
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CN201610592238.7A CN106097700A (en) | 2016-07-22 | 2016-07-22 | The method of testing of a kind of IR remote controller and system |
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Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107886705A (en) * | 2017-12-28 | 2018-04-06 | 上海传英信息技术有限公司 | A kind of infrared remote control method of testing and system |
CN109769389A (en) * | 2019-01-23 | 2019-05-17 | 浙江灵杰智控科技有限公司 | One kind being based on the surface-pasted controller production technology of tin cream |
CN110308321A (en) * | 2019-07-05 | 2019-10-08 | 珠海格力智能装备有限公司 | Dynamic current detection method and device |
CN112986799A (en) * | 2021-02-10 | 2021-06-18 | 深圳市云鼠科技开发有限公司 | FCT test fixture and method |
US20220201514A1 (en) * | 2020-12-23 | 2022-06-23 | Dish Network L.L.C. | Automated remote control tester |
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JPS58115998A (en) * | 1981-12-28 | 1983-07-09 | Sony Corp | Remote control system |
CN201590157U (en) * | 2010-01-22 | 2010-09-22 | 深圳创维数字技术股份有限公司 | Automatic testing arrangement for remote control device |
CN102645433A (en) * | 2011-02-21 | 2012-08-22 | 珠海格力电器股份有限公司 | Method and system for detecting remote controller |
CN203838877U (en) * | 2014-03-26 | 2014-09-17 | 深圳市创荣发电子有限公司 | Infrared remote controller test device and system |
CN104464259A (en) * | 2014-12-03 | 2015-03-25 | 深圳市星火原光电科技有限公司 | Automatic test instrument with air conditioner remote controller and test method |
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2016
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JPS58115998A (en) * | 1981-12-28 | 1983-07-09 | Sony Corp | Remote control system |
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CN102645433A (en) * | 2011-02-21 | 2012-08-22 | 珠海格力电器股份有限公司 | Method and system for detecting remote controller |
CN203838877U (en) * | 2014-03-26 | 2014-09-17 | 深圳市创荣发电子有限公司 | Infrared remote controller test device and system |
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Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107886705A (en) * | 2017-12-28 | 2018-04-06 | 上海传英信息技术有限公司 | A kind of infrared remote control method of testing and system |
CN109769389A (en) * | 2019-01-23 | 2019-05-17 | 浙江灵杰智控科技有限公司 | One kind being based on the surface-pasted controller production technology of tin cream |
CN110308321A (en) * | 2019-07-05 | 2019-10-08 | 珠海格力智能装备有限公司 | Dynamic current detection method and device |
US20220201514A1 (en) * | 2020-12-23 | 2022-06-23 | Dish Network L.L.C. | Automated remote control tester |
US12035158B2 (en) * | 2020-12-23 | 2024-07-09 | Dish Network L.L.C. | Automated remote control tester |
CN112986799A (en) * | 2021-02-10 | 2021-06-18 | 深圳市云鼠科技开发有限公司 | FCT test fixture and method |
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Application publication date: 20161109 |