CN106097700A - The method of testing of a kind of IR remote controller and system - Google Patents

The method of testing of a kind of IR remote controller and system Download PDF

Info

Publication number
CN106097700A
CN106097700A CN201610592238.7A CN201610592238A CN106097700A CN 106097700 A CN106097700 A CN 106097700A CN 201610592238 A CN201610592238 A CN 201610592238A CN 106097700 A CN106097700 A CN 106097700A
Authority
CN
China
Prior art keywords
remote controller
test
mcu
testing
code value
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201610592238.7A
Other languages
Chinese (zh)
Inventor
李文斌
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shenzhen C&D Electronics Co Ltd
Original Assignee
Shenzhen C&D Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shenzhen C&D Electronics Co Ltd filed Critical Shenzhen C&D Electronics Co Ltd
Priority to CN201610592238.7A priority Critical patent/CN106097700A/en
Publication of CN106097700A publication Critical patent/CN106097700A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G08SIGNALLING
    • G08CTRANSMISSION SYSTEMS FOR MEASURED VALUES, CONTROL OR SIMILAR SIGNALS
    • G08C25/00Arrangements for preventing or correcting errors; Monitoring arrangements
    • GPHYSICS
    • G08SIGNALLING
    • G08CTRANSMISSION SYSTEMS FOR MEASURED VALUES, CONTROL OR SIMILAR SIGNALS
    • G08C23/00Non-electrical signal transmission systems, e.g. optical systems
    • G08C23/04Non-electrical signal transmission systems, e.g. optical systems using light waves, e.g. infrared

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Selective Calling Equipment (AREA)

Abstract

The present invention provides method of testing and the system of a kind of IR remote controller, and described method of testing comprises the following steps: step S1, the test program of burning IR remote controller on MCU;Step S2, after waiting until that MCU powers on, is directly entered test pattern, described MCU output test code value according to test program;Step S3, is received by Decoder and judges to test code value, until after test code value is sent, entering normal module by MCU.The present invention is after IR remote controller is electrified, and MCU first automatically into the test program of burning in advance, and then will can launch test code value at once automatically, until after being completed, described MCU controls IR remote controller and enters normal mode;Therefore, test workman has only to power on, and observes test data the most in test mode, without the mode of operation of switching IR remote controller after being completed, so can be greatly improved production test efficiency, and reduce cost.

Description

The method of testing of a kind of IR remote controller and system
Technical field
The present invention relates to a kind of method of testing, particularly relate to the method for testing of a kind of IR remote controller, and relate to have employed The system of the method for testing of this IR remote controller.
Background technology
When existing IR remote controller needs test electric current and hardware effort the most normal, it is all to need remote controller PCBA It is electrified, the most again with the button on Conductive gauge pressing IR remote controller, whether carries out testing the hardware of this IR remote controller Normal and operating current is the most normal, such method of testing, need more manual operation, cost of labor is high, work effect Rate is low.
Summary of the invention
The technical problem to be solved is to need to provide one can reduce cost of labor, and improves work efficiency The method of testing of IR remote controller, and relate to the system that have employed the method for testing of this IR remote controller.
To this, the present invention provides the method for testing of a kind of IR remote controller, comprises the following steps:
Step S1, the test program of burning IR remote controller on MCU;
Step S2, after waiting until that MCU powers on, is directly entered test pattern according to test program, and described MCU exports test patterns Value;
Step S3, is received by Decoder and judges to test code value, until after test code value is sent, just being entered by MCU Norm block.
Further improvement of the present invention is, in described step S2, after entering test pattern, the I/O port of described MCU passes through Infrared transmitting tube output infrared test signal.
Further improvement of the present invention is, in described step S2, IR remote controller is connected with ammeter, described While MCU exports test code value automatically, detected the current value of described IR remote controller by ammeter.
Further improvement of the present invention is, described IR remote controller is arranged on testing current tool, and described electric current is surveyed Examination tool is connected with described ammeter, when described IR remote controller is placed on described testing current tool, is automatically obtained The detection of described current value.
Further improvement of the present invention is, in described step S3, after test code value is sent, described MCU controls IR remote controller exits test pattern, and automatically into normal mode.
Further improvement of the present invention is, in described step S2, described MCU powers on and powers on first for this MCU.
Further improvement of the present invention is, in described step S3, described Decoder is provided with alarm device, when determining When test code value occurs abnormal, send alarm.
The present invention also provides for the test system of a kind of IR remote controller, have employed the test of IR remote controller as above Method, and include direct current supply module, described direct current supply module is connected with described MCU.
Further improvement of the present invention is, also includes that testing current tool, described direct current supply module are arranged at described On testing current tool, when described IR remote controller is positioned on described testing current tool, connect direct current supply module real Existing MCU powers on, and is automatically obtained the detection of current value.
Compared with prior art, the beneficial effects of the present invention is: after IR remote controller is electrified, MCU can the most automatically Enter the test program of burning in advance, and then will automatically launch test code value at once, until after being completed, described MCU is controlled IR remote controller processed enters normal mode;Therefore, test workman has only to power on, and observes test data the most in test mode , without the mode of operation of switching IR remote controller after being completed, so can be greatly improved production test efficiency, fall Low to test labor claim, reduce the frequency of manual operation, therefore cost is effectively reduced.
Accompanying drawing explanation
Fig. 1 is the workflow schematic diagram of an embodiment of the present invention;
Fig. 2 is the system structure schematic diagram of an embodiment of the present invention;
Fig. 3 is the circuit theory schematic diagram of an embodiment of the present invention.
Detailed description of the invention
Below in conjunction with the accompanying drawings, the preferably embodiment of the present invention is described in further detail.
Embodiment 1:
As depicted in figs. 1 and 2, this example provides the method for testing of a kind of IR remote controller, comprises the following steps:
Step S1, the test program of burning IR remote controller on MCU;
Step S2, after waiting until that MCU powers on, is directly entered test pattern according to test program, and described MCU exports test patterns Value;
Step S3, is received by Decoder and judges to test code value, until after test code value is sent, just being entered by MCU Norm block.
Step S1 described in this example is used for by default test program and then makes MCU can automatically send test code value, institute Stating test code value is each key code value in the circuit diagram shown in Fig. 3, and then can be used in detecting described IR remote controller Hardware is the most normal;In described step S2, after entering test pattern, the I/O port of described MCU exports infrared by infrared transmitting tube Test signal, such as is controlled exporting infrared test signal to infrared transmitting tube by 15 pins of described MCU.In Fig. 2, AD009-03 is a kind of learning-oriented remote-controlled chip.
Preferably, in step S2 described in this example, IR remote controller is connected with ammeter, automatically exports survey at described MCU While examination code value, detected the current value of described IR remote controller by ammeter;Being more highly preferred to, described IR remote controller sets Being placed on testing current tool, described testing current tool is connected with described ammeter, when described IR remote controller is placed on Time on described testing current tool, it is automatically obtained the detection of described current value.Described testing current tool is that current value detects institute The frock used, can be automatically obtained the inspection of current value when described IR remote controller is positioned on described testing current tool Survey.
In step S3 described in this example, after test code value is sent, described MCU controls IR remote controller and exits test mould Formula, and automatically into normal mode, so it can be avoided that workman is after being completed, in addition it is also necessary to Non-follow control mode of operation switches Problem, further achieve the raising of work efficiency;Described mode of operation includes test pattern and normal mode, described just Norm formula refers to user can directly control the normal mode of operation of infrared equipment by IR remote controller.
In step S2 described in this example, described MCU powers on and powers on first for this MCU, say, that when plant produced, red Outer remote controller powers on first so that MCU powers on, and then is directly entered test pattern, after test terminates, automatically switches to normal Pattern.Such setting, can either facilitate production test, it is possible to reduce technical threshold and the number of operations of workman's test as far as possible, Change battery simultaneously during also being able to prevent user from using and also can enter the drawback of test pattern, be very suitable for infrared remote control The test of device and use.
In step S3 described in this example, described Decoder is provided with alarm device, when determining test code value and occurring abnormal, Send alarm;If unusual circumstance in test process, send alarm, test workman so can be given fine Suggesting effect so that test workman can operate the test of several IR remote controller simultaneously, improves work efficiency.
This example is after IR remote controller is electrified, and MCU meeting is first automatically into the test program of burning in advance, and then horse back is the most just Can automatically launch test code value, until after being completed, described MCU controls IR remote controller and enters normal mode;Therefore, test Workman has only to power on, and observes test data the most in test mode, without switching infrared remote control after being completed The mode of operation of device, so can be greatly improved production test efficiency, reduces test labor claim, reduces manual operation Frequency, therefore cost is effectively reduced.
Embodiment 2:
This example also provides for the test system of a kind of IR remote controller, have employed the test of IR remote controller as described in Example 1 Method, and include direct current supply module, described direct current supply module is connected with described MCU.
This example further preferably includes that testing current tool, described direct current supply module are arranged on described testing current tool, When described IR remote controller is positioned on described testing current tool, connection direct current supply module realizes MCU and powers on, and automatically Realize the detection of current value.Therefore, this example has only to be positioned over by described IR remote controller on described testing current tool, with regard to energy The enough hardware automatically detecting described IR remote controller and operating current are the most normal.
Above content is to combine concrete preferred implementation further description made for the present invention, it is impossible to assert Being embodied as of the present invention is confined to these explanations.For general technical staff of the technical field of the invention, On the premise of present inventive concept, it is also possible to make some simple deduction or replace, all should be considered as belonging to the present invention's Protection domain.

Claims (9)

1. the method for testing of an IR remote controller, it is characterised in that comprise the following steps:
Step S1, the test program of burning IR remote controller on MCU;
Step S2, after waiting until that MCU powers on, is directly entered test pattern according to test program, and described MCU exports test patterns Value;
Step S3, is received by Decoder and judges to test code value, until after test code value is sent, just being entered by MCU Norm block.
The method of testing of IR remote controller the most according to claim 1, it is characterised in that in described step S2, enters and surveys After die trial formula, the I/O port of described MCU exports infrared test signal by infrared transmitting tube.
The method of testing of IR remote controller the most according to claim 1, it is characterised in that in described step S2, infrared distant Control device is connected with ammeter, while described MCU exports test code value automatically, detects described infrared remote control by ammeter The current value of device.
The method of testing of IR remote controller the most according to claim 3, it is characterised in that described IR remote controller is arranged at On testing current tool, described testing current tool is connected with described ammeter, when described IR remote controller is placed on described Time on testing current tool, it is automatically obtained the detection of described current value.
5. according to the method for testing of the IR remote controller described in Claims 1-4 any one, it is characterised in that described step In S3, after test code value is sent, described MCU controls IR remote controller and exits test pattern, and automatically into normal mode Formula.
6. according to the method for testing of the IR remote controller described in Claims 1-4 any one, it is characterised in that described step In S2, described MCU powers on and powers on first for this MCU.
7. according to the method for testing of the IR remote controller described in Claims 1-4 any one, it is characterised in that described step In S3, described Decoder is provided with alarm device, when determining test code value and occurring abnormal, sends alarm.
8. the test system of an IR remote controller, it is characterised in that have employed as described in claim 1 to 7 any one The method of testing of IR remote controller, and include direct current supply module, described direct current supply module is connected with described MCU.
The test system of IR remote controller the most according to claim 8, it is characterised in that also include testing current tool, Described direct current supply module is arranged on described testing current tool, controls when described IR remote controller is positioned over described testing current Time on tool, connection direct current supply module realizes MCU and powers on, and is automatically obtained the detection of current value.
CN201610592238.7A 2016-07-22 2016-07-22 The method of testing of a kind of IR remote controller and system Pending CN106097700A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201610592238.7A CN106097700A (en) 2016-07-22 2016-07-22 The method of testing of a kind of IR remote controller and system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201610592238.7A CN106097700A (en) 2016-07-22 2016-07-22 The method of testing of a kind of IR remote controller and system

Publications (1)

Publication Number Publication Date
CN106097700A true CN106097700A (en) 2016-11-09

Family

ID=57448806

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201610592238.7A Pending CN106097700A (en) 2016-07-22 2016-07-22 The method of testing of a kind of IR remote controller and system

Country Status (1)

Country Link
CN (1) CN106097700A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107886705A (en) * 2017-12-28 2018-04-06 上海传英信息技术有限公司 A kind of infrared remote control method of testing and system
CN109769389A (en) * 2019-01-23 2019-05-17 浙江灵杰智控科技有限公司 One kind being based on the surface-pasted controller production technology of tin cream
CN110308321A (en) * 2019-07-05 2019-10-08 珠海格力智能装备有限公司 Dynamic current detection method and device
CN112986799A (en) * 2021-02-10 2021-06-18 深圳市云鼠科技开发有限公司 FCT test fixture and method
US20220201514A1 (en) * 2020-12-23 2022-06-23 Dish Network L.L.C. Automated remote control tester

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58115998A (en) * 1981-12-28 1983-07-09 Sony Corp Remote control system
CN201590157U (en) * 2010-01-22 2010-09-22 深圳创维数字技术股份有限公司 Automatic testing arrangement for remote control device
CN102645433A (en) * 2011-02-21 2012-08-22 珠海格力电器股份有限公司 Method and system for detecting remote controller
CN203838877U (en) * 2014-03-26 2014-09-17 深圳市创荣发电子有限公司 Infrared remote controller test device and system
CN104464259A (en) * 2014-12-03 2015-03-25 深圳市星火原光电科技有限公司 Automatic test instrument with air conditioner remote controller and test method

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58115998A (en) * 1981-12-28 1983-07-09 Sony Corp Remote control system
CN201590157U (en) * 2010-01-22 2010-09-22 深圳创维数字技术股份有限公司 Automatic testing arrangement for remote control device
CN102645433A (en) * 2011-02-21 2012-08-22 珠海格力电器股份有限公司 Method and system for detecting remote controller
CN203838877U (en) * 2014-03-26 2014-09-17 深圳市创荣发电子有限公司 Infrared remote controller test device and system
CN104464259A (en) * 2014-12-03 2015-03-25 深圳市星火原光电科技有限公司 Automatic test instrument with air conditioner remote controller and test method

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
王芳 徐振: "《集成电路芯片测试》", 31 March 2014, 杭州:浙江大学出版社 *

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107886705A (en) * 2017-12-28 2018-04-06 上海传英信息技术有限公司 A kind of infrared remote control method of testing and system
CN109769389A (en) * 2019-01-23 2019-05-17 浙江灵杰智控科技有限公司 One kind being based on the surface-pasted controller production technology of tin cream
CN110308321A (en) * 2019-07-05 2019-10-08 珠海格力智能装备有限公司 Dynamic current detection method and device
US20220201514A1 (en) * 2020-12-23 2022-06-23 Dish Network L.L.C. Automated remote control tester
US12035158B2 (en) * 2020-12-23 2024-07-09 Dish Network L.L.C. Automated remote control tester
CN112986799A (en) * 2021-02-10 2021-06-18 深圳市云鼠科技开发有限公司 FCT test fixture and method

Similar Documents

Publication Publication Date Title
CN106097700A (en) The method of testing of a kind of IR remote controller and system
CN105203929B (en) A kind of fixed switching cabinet online detector for partial discharge and method
CN108107332B (en) Withstand voltage ageing control system and withstand voltage ageing test system
CN203909156U (en) Test system for testing insulating properties of electrical equipment
CN104166072B (en) The intelligent device for detecting polarity of four star-like voltage transformers and detection method
CN108919002A (en) A kind of test macro of direct-current charging post
CN104459566A (en) Secondary electric power supply testing system and method
CN105354564B (en) A kind of fingerprint and face information collection head and its method for carrying out authentication
CN102944759A (en) Non-contact early warning system for high-voltage power equipment
CN204790407U (en) A controlling means for electric energy meter batch meter
CN109031069A (en) The diagnostic system of high-tension switch cabinet Partial discharge signal
CN106405375A (en) Multipath resistance and voltage testing method, device and system
CN208384025U (en) A kind of test macro of direct-current charging post
CN110288842A (en) A kind of method and apparatus that parking stall management is carried out based on earth magnetism
CN106405348A (en) Electric cable insulation detection apparatus collection system
CN104731037A (en) Energy-saving monitoring and controlling system
CN208705430U (en) Partial discharge detecting system for the test of high-tension switch cabinet ac voltage withstanding
CN205986326U (en) Transformer substation's hyperbaric chamber intelligent recognition device
CN206095423U (en) A monitoring and forewarning system for building execute industrial area circle noise
CN103645977A (en) Automatic debugging system and method for electronic products
CN106556770A (en) A kind of self-priming leakage monitoring device and monitoring method
CN108646158A (en) Partial discharge detecting system for the experiment of high-tension switch cabinet ac voltage withstanding
CN205864072U (en) A kind of Internet of Things gate inhibition's power supply
CN107065635A (en) A kind of intelligent automation control system
CN109729539A (en) A kind of air conditioner quickly produces survey method with wireless communication module

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
RJ01 Rejection of invention patent application after publication
RJ01 Rejection of invention patent application after publication

Application publication date: 20161109