CN106094193A - A kind of automatic focusing micro imaging system of planetary surface material detection in place - Google Patents
A kind of automatic focusing micro imaging system of planetary surface material detection in place Download PDFInfo
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- CN106094193A CN106094193A CN201610607155.0A CN201610607155A CN106094193A CN 106094193 A CN106094193 A CN 106094193A CN 201610607155 A CN201610607155 A CN 201610607155A CN 106094193 A CN106094193 A CN 106094193A
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- image acquisition
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
- G02B21/365—Control or image processing arrangements for digital or video microscopes
- G02B21/367—Control or image processing arrangements for digital or video microscopes providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/06—Means for illuminating specimens
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/24—Base structure
- G02B21/241—Devices for focusing
- G02B21/244—Devices for focusing using image analysis techniques
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- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Multimedia (AREA)
- Automatic Focus Adjustment (AREA)
- Microscoopes, Condenser (AREA)
Abstract
The present invention proposes the automatic focusing micro imaging system of a kind of planetary surface material detection in place, including lighting unit, micro-imaging unit, image acquisition units, focusing gear unit, host computer unit;Lighting unit and micro-imaging unit are positioned at same light path, and micro-imaging unit includes microscope objective, lens barrel;Focusing gear unit is to bite conjunction actuating device outside gear, and its setting direction is vertical with lighting unit, and this unit, by the transmission of gear, changes into the movement of microscope tube;Image acquisition units is connected with focusing gear unit in same light path, image acquisition units with microscope tube;The definition collecting image is passed judgment on by host computer unit, controls whole system and is in quasi-coke-like state.The present invention can carry out definition differentiation to the image of the testing sample collected, and by matching focusing function, is quickly found out focus position, improves speed and the precision of focusing, and this device uses blocking design, has the advantages such as volume is little, function is strong.
Description
Technical field
The invention belongs to optical engineering field, particularly relate to the microscopic imaging device of a kind of automatic focusing, utilize image clear
Clear degree evaluation function quickly realizes focus process, obtains testing sample micro-image clearly.
Background technology
Deep-space detection field, micro imaging system is as the optics load of detection in place, by planetary geological topsoil
Earth, rock sample imaging, according to features such as picture size, texture, colors, can carry out cognitive topography and geomorphology from microcosmic angle, enter
And judge soil element composition, mineralogical composition analysis etc..Such as the microscopic imaging apparatus (MI) carried on " Opportunity Rover " of the U.S., " phoenix
Phoenix number " optical microscope (OM) that carries of Mars landing device, " curious number " carry MAHLI camera, European Space Agency " ExoMars " number
The MicroOmega EO-1 hyperion microscope etc. carried can carry out imaging, analysis from the microcosmic angle pedotheque to collecting
Deng.
When micro-imaging load obtains picture rich in detail, traditional method is usually and becomes testing sample respectively under different object distances
Picture, then chooses picture rich in detail in a series of images collected, and the image that this method collects is more, the longest,
Inefficiency.
Summary of the invention
In order to solve the technical problem in the presence of background technology, the present invention proposes the micro-imaging of a kind of automatic focusing
System and device, this device can carry out definition differentiation to the image of the testing sample collected, by matching focusing function, soon
Speed finds focus position, improves speed and the precision of focusing, and this device uses blocking design, has that volume is little, function
The advantage such as strong, meets the light littleization design principle of space flight load.
The technical solution of the present invention is: the automatic focusing micro-imaging system of a kind of planetary surface material detection in place
System, it is characterised in that: described system include lighting unit, micro-imaging unit, image acquisition units, focusing gear unit, on
Position machine unit;
Described lighting unit and micro-imaging unit are positioned at same light path, and micro-imaging unit includes microscope objective, mirror
Cylinder.Focusing gear unit is to bite conjunction actuating device outside gear, and its setting direction is vertical with lighting unit, and this unit is by the biography of gear
Dynamic, change into the movement of microscope tube.
Image acquisition units is connected with focusing gear unit in same light path, image acquisition units with microscope tube;
The definition collecting image is passed judgment on by host computer unit, matching focusing curve, and sends focusing instruction, controls whole
Individual system is in quasi-coke-like state.
Above-mentioned focusing gear unit includes drivewheel, driven pulley, magnetic bead, motor and Hall element;Motor drives main
Driving wheel drives driven pulley transmission;Magnetic bead is arranged on the driven wheel, rising when magnetic bead and Hall element are used for demarcating gear drive
Point position;Driven pulley connects microscope tube and image acquisition units.
Above-mentioned image acquisition units is CCD camera.
Present invention have the advantage that
1) present invention uses the image-generating unit of illumination imaging light path altogether so that whole system integrated level is higher.
2) wavelength of lighting source is optional, selects the light source of different wave length for different samples, with more comprehensively flexibly
Analyze sample characteristic.
3) the demarcation effect by Hall element of this device, has effectively eliminated gear drive backhaul difference to location
The impact of precision.
Accompanying drawing explanation
Fig. 1 is the structural representation of the present invention;
Fig. 2 is automatic focusing micro imaging system workflow diagram of the present invention;
Detailed description of the invention
Seeing Fig. 1, the present invention is the automatic focusing micro imaging system device of a kind of planetary surface material detection in place, whole
Individual system includes: lighting unit, microoptic image-generating unit, image acquisition units (CCD camera 9), focusing gear unit are (actively
Wheel, driven pulley, magnetic bead, motor, Hall element), host computer unit.When this device carries out micro-imaging to sample, on
Position machine, by the differentiation to image definition, calculates focus position, and sends command adapted thereto, controls imaging system and arrives appointment
Position, quickly obtains testee micro-image clearly.
The illumination part of this automatic focusing device and microoptic imaging moiety light path altogether.The light that LED illumination light source 1 sends
Line is irradiated on light splitting piece through illuminating spotlight mirror, is pointed into being observed object sample surfaces, and the light that sample reflects passes through
Imaging lens group is imaged in image planes.Focus adjusting mechanism is to bite conjunction actuating device outside gear, drives drivewheel 3 to carry by motor 2
Dynamic driven pulley 4 transmission, lens barrel 5 progressively closer or far from target, namely changes the mode of object distance, finds focus position.Driven
Installing magnetic bead 6 on wheel 4, magnetic bead 6 and Hall element 7 are used for demarcating start position during gear drive, to eliminate gear drive
The impact on positioning precision of the backhaul difference of mechanism.Motor 2 drives camera lens unique step to advance, and often makes a move, and gathers a frame figure
Picture, host computer 8 calculates this location drawing image sharpness, if present image definition is more than previous frame image, then it is assumed that system is progressively
Near focus position, when the image definition of continuous four positions declines, then take definition maximum position and each side
Take two adjacent positions and corresponding image definition, it is achieved the matching of focusing curve, find out peak, send and refer to accordingly
Order, controls imaging system and arrives at peak, it is achieved focussing process.
Specific implementation process is as follows:
Host computer 8 sends focusing instruction, and motor 2 rotates forward, and by gear drive, lens barrel 5 is the most close
Testing sample, when Hall element 7 senses magnetic bead 6 magnetic field first, sensor sends a signal to host computer 8, by this position
It is masked as start of a run of focusing.
At start position, the big step-length of motor drives drivewheel 3 to rotate, and gathers image every unique step, and host computer 8 differentiates figure
Image sharpness.When continuous 4 definitions decline, i.e. think and now have passed past focus position point, now motor stalling.Upper
Machine 8 then takes definition maximum position and each side takes two adjacent positions and corresponding image definition, it is achieved focusing song
The matching of line, the peak of focusing curve is considered focus position.
Motor reversal, when Hall element 7 senses field signal again, illustrates to arrive start position.Motor rotates forward,
Until driving focus adjusting mechanism to operate to the focus position of matching, gather image.
Claims (3)
1. the automatic focusing micro imaging system of a planetary surface material detection in place, it is characterised in that: described system includes
Lighting unit, micro-imaging unit, image acquisition units, focusing gear unit, host computer unit;
Described lighting unit and micro-imaging unit are positioned at same light path, and micro-imaging unit includes microscope objective, lens barrel;Adjust
Burnt gear unit is to bite conjunction actuating device outside gear, and its setting direction is vertical with lighting unit, and this unit, by the transmission of gear, turns
The movement of chemical conversion microscope tube;
Image acquisition units is connected with focusing gear unit in same light path, image acquisition units with microscope tube;
The definition collecting image is passed judgment on by host computer unit, matching focusing curve, and sends focusing instruction, controls whole system
System is in quasi-coke-like state.
The automatic focusing micro imaging system of planetary surface material detection in place the most according to claim 1, its feature exists
In: described focusing gear unit includes drivewheel, driven pulley, magnetic bead, motor and Hall element;Motor drives actively wheel belt
Dynamic driven pulley transmission;Magnetic bead is arranged on the driven wheel, and magnetic bead and Hall element are used for demarcating start position during gear drive;
Driven pulley connects microscope tube and image acquisition units.
The automatic focusing micro imaging system of planetary surface material detection in place the most according to claim 2, its feature exists
In: described image acquisition units is CCD camera.
Priority Applications (1)
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CN201610607155.0A CN106094193B (en) | 2016-07-28 | 2016-07-28 | The automatic focusing micro imaging system that a kind of planetary surface substance detects in place |
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CN201610607155.0A CN106094193B (en) | 2016-07-28 | 2016-07-28 | The automatic focusing micro imaging system that a kind of planetary surface substance detects in place |
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Publication Number | Publication Date |
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CN106094193A true CN106094193A (en) | 2016-11-09 |
CN106094193B CN106094193B (en) | 2018-07-03 |
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CN201610607155.0A Expired - Fee Related CN106094193B (en) | 2016-07-28 | 2016-07-28 | The automatic focusing micro imaging system that a kind of planetary surface substance detects in place |
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113766139A (en) * | 2021-09-29 | 2021-12-07 | 广东朝歌智慧互联科技有限公司 | Focusing device and method |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20020067409A1 (en) * | 2000-12-06 | 2002-06-06 | Bio-View Ltd. | Data acquisition and display system and method |
US20020105641A1 (en) * | 2001-02-05 | 2002-08-08 | Anderson Mark S. | Locally enhanced raman spectroscopy with an atomic force microscope |
CN103743719A (en) * | 2013-12-11 | 2014-04-23 | 中国科学院西安光学精密机械研究所 | Remote in-situ integrated test system for planet surface substances and atmosphere |
CN205942080U (en) * | 2016-07-28 | 2017-02-08 | 中国科学院西安光学精密机械研究所 | Micro - imaging system of automatic focusing that planet surface material is taken one's place and is surveyed |
-
2016
- 2016-07-28 CN CN201610607155.0A patent/CN106094193B/en not_active Expired - Fee Related
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20020067409A1 (en) * | 2000-12-06 | 2002-06-06 | Bio-View Ltd. | Data acquisition and display system and method |
US20020105641A1 (en) * | 2001-02-05 | 2002-08-08 | Anderson Mark S. | Locally enhanced raman spectroscopy with an atomic force microscope |
CN103743719A (en) * | 2013-12-11 | 2014-04-23 | 中国科学院西安光学精密机械研究所 | Remote in-situ integrated test system for planet surface substances and atmosphere |
CN205942080U (en) * | 2016-07-28 | 2017-02-08 | 中国科学院西安光学精密机械研究所 | Micro - imaging system of automatic focusing that planet surface material is taken one's place and is surveyed |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113766139A (en) * | 2021-09-29 | 2021-12-07 | 广东朝歌智慧互联科技有限公司 | Focusing device and method |
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