CN106094193A - A kind of automatic focusing micro imaging system of planetary surface material detection in place - Google Patents

A kind of automatic focusing micro imaging system of planetary surface material detection in place Download PDF

Info

Publication number
CN106094193A
CN106094193A CN201610607155.0A CN201610607155A CN106094193A CN 106094193 A CN106094193 A CN 106094193A CN 201610607155 A CN201610607155 A CN 201610607155A CN 106094193 A CN106094193 A CN 106094193A
Authority
CN
China
Prior art keywords
unit
focusing
micro
gear
image acquisition
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN201610607155.0A
Other languages
Chinese (zh)
Other versions
CN106094193B (en
Inventor
陶金有
葛伟
王渊博
杨建峰
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
XiAn Institute of Optics and Precision Mechanics of CAS
Original Assignee
XiAn Institute of Optics and Precision Mechanics of CAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by XiAn Institute of Optics and Precision Mechanics of CAS filed Critical XiAn Institute of Optics and Precision Mechanics of CAS
Priority to CN201610607155.0A priority Critical patent/CN106094193B/en
Publication of CN106094193A publication Critical patent/CN106094193A/en
Application granted granted Critical
Publication of CN106094193B publication Critical patent/CN106094193B/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/36Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365Control or image processing arrangements for digital or video microscopes
    • G02B21/367Control or image processing arrangements for digital or video microscopes providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/06Means for illuminating specimens
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/24Base structure
    • G02B21/241Devices for focusing
    • G02B21/244Devices for focusing using image analysis techniques

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Multimedia (AREA)
  • Automatic Focus Adjustment (AREA)
  • Microscoopes, Condenser (AREA)

Abstract

The present invention proposes the automatic focusing micro imaging system of a kind of planetary surface material detection in place, including lighting unit, micro-imaging unit, image acquisition units, focusing gear unit, host computer unit;Lighting unit and micro-imaging unit are positioned at same light path, and micro-imaging unit includes microscope objective, lens barrel;Focusing gear unit is to bite conjunction actuating device outside gear, and its setting direction is vertical with lighting unit, and this unit, by the transmission of gear, changes into the movement of microscope tube;Image acquisition units is connected with focusing gear unit in same light path, image acquisition units with microscope tube;The definition collecting image is passed judgment on by host computer unit, controls whole system and is in quasi-coke-like state.The present invention can carry out definition differentiation to the image of the testing sample collected, and by matching focusing function, is quickly found out focus position, improves speed and the precision of focusing, and this device uses blocking design, has the advantages such as volume is little, function is strong.

Description

A kind of automatic focusing micro imaging system of planetary surface material detection in place
Technical field
The invention belongs to optical engineering field, particularly relate to the microscopic imaging device of a kind of automatic focusing, utilize image clear Clear degree evaluation function quickly realizes focus process, obtains testing sample micro-image clearly.
Background technology
Deep-space detection field, micro imaging system is as the optics load of detection in place, by planetary geological topsoil Earth, rock sample imaging, according to features such as picture size, texture, colors, can carry out cognitive topography and geomorphology from microcosmic angle, enter And judge soil element composition, mineralogical composition analysis etc..Such as the microscopic imaging apparatus (MI) carried on " Opportunity Rover " of the U.S., " phoenix Phoenix number " optical microscope (OM) that carries of Mars landing device, " curious number " carry MAHLI camera, European Space Agency " ExoMars " number The MicroOmega EO-1 hyperion microscope etc. carried can carry out imaging, analysis from the microcosmic angle pedotheque to collecting Deng.
When micro-imaging load obtains picture rich in detail, traditional method is usually and becomes testing sample respectively under different object distances Picture, then chooses picture rich in detail in a series of images collected, and the image that this method collects is more, the longest, Inefficiency.
Summary of the invention
In order to solve the technical problem in the presence of background technology, the present invention proposes the micro-imaging of a kind of automatic focusing System and device, this device can carry out definition differentiation to the image of the testing sample collected, by matching focusing function, soon Speed finds focus position, improves speed and the precision of focusing, and this device uses blocking design, has that volume is little, function The advantage such as strong, meets the light littleization design principle of space flight load.
The technical solution of the present invention is: the automatic focusing micro-imaging system of a kind of planetary surface material detection in place System, it is characterised in that: described system include lighting unit, micro-imaging unit, image acquisition units, focusing gear unit, on Position machine unit;
Described lighting unit and micro-imaging unit are positioned at same light path, and micro-imaging unit includes microscope objective, mirror Cylinder.Focusing gear unit is to bite conjunction actuating device outside gear, and its setting direction is vertical with lighting unit, and this unit is by the biography of gear Dynamic, change into the movement of microscope tube.
Image acquisition units is connected with focusing gear unit in same light path, image acquisition units with microscope tube;
The definition collecting image is passed judgment on by host computer unit, matching focusing curve, and sends focusing instruction, controls whole Individual system is in quasi-coke-like state.
Above-mentioned focusing gear unit includes drivewheel, driven pulley, magnetic bead, motor and Hall element;Motor drives main Driving wheel drives driven pulley transmission;Magnetic bead is arranged on the driven wheel, rising when magnetic bead and Hall element are used for demarcating gear drive Point position;Driven pulley connects microscope tube and image acquisition units.
Above-mentioned image acquisition units is CCD camera.
Present invention have the advantage that
1) present invention uses the image-generating unit of illumination imaging light path altogether so that whole system integrated level is higher.
2) wavelength of lighting source is optional, selects the light source of different wave length for different samples, with more comprehensively flexibly Analyze sample characteristic.
3) the demarcation effect by Hall element of this device, has effectively eliminated gear drive backhaul difference to location The impact of precision.
Accompanying drawing explanation
Fig. 1 is the structural representation of the present invention;
Fig. 2 is automatic focusing micro imaging system workflow diagram of the present invention;
Detailed description of the invention
Seeing Fig. 1, the present invention is the automatic focusing micro imaging system device of a kind of planetary surface material detection in place, whole Individual system includes: lighting unit, microoptic image-generating unit, image acquisition units (CCD camera 9), focusing gear unit are (actively Wheel, driven pulley, magnetic bead, motor, Hall element), host computer unit.When this device carries out micro-imaging to sample, on Position machine, by the differentiation to image definition, calculates focus position, and sends command adapted thereto, controls imaging system and arrives appointment Position, quickly obtains testee micro-image clearly.
The illumination part of this automatic focusing device and microoptic imaging moiety light path altogether.The light that LED illumination light source 1 sends Line is irradiated on light splitting piece through illuminating spotlight mirror, is pointed into being observed object sample surfaces, and the light that sample reflects passes through Imaging lens group is imaged in image planes.Focus adjusting mechanism is to bite conjunction actuating device outside gear, drives drivewheel 3 to carry by motor 2 Dynamic driven pulley 4 transmission, lens barrel 5 progressively closer or far from target, namely changes the mode of object distance, finds focus position.Driven Installing magnetic bead 6 on wheel 4, magnetic bead 6 and Hall element 7 are used for demarcating start position during gear drive, to eliminate gear drive The impact on positioning precision of the backhaul difference of mechanism.Motor 2 drives camera lens unique step to advance, and often makes a move, and gathers a frame figure Picture, host computer 8 calculates this location drawing image sharpness, if present image definition is more than previous frame image, then it is assumed that system is progressively Near focus position, when the image definition of continuous four positions declines, then take definition maximum position and each side Take two adjacent positions and corresponding image definition, it is achieved the matching of focusing curve, find out peak, send and refer to accordingly Order, controls imaging system and arrives at peak, it is achieved focussing process.
Specific implementation process is as follows:
Host computer 8 sends focusing instruction, and motor 2 rotates forward, and by gear drive, lens barrel 5 is the most close Testing sample, when Hall element 7 senses magnetic bead 6 magnetic field first, sensor sends a signal to host computer 8, by this position It is masked as start of a run of focusing.
At start position, the big step-length of motor drives drivewheel 3 to rotate, and gathers image every unique step, and host computer 8 differentiates figure Image sharpness.When continuous 4 definitions decline, i.e. think and now have passed past focus position point, now motor stalling.Upper Machine 8 then takes definition maximum position and each side takes two adjacent positions and corresponding image definition, it is achieved focusing song The matching of line, the peak of focusing curve is considered focus position.
Motor reversal, when Hall element 7 senses field signal again, illustrates to arrive start position.Motor rotates forward, Until driving focus adjusting mechanism to operate to the focus position of matching, gather image.

Claims (3)

1. the automatic focusing micro imaging system of a planetary surface material detection in place, it is characterised in that: described system includes Lighting unit, micro-imaging unit, image acquisition units, focusing gear unit, host computer unit;
Described lighting unit and micro-imaging unit are positioned at same light path, and micro-imaging unit includes microscope objective, lens barrel;Adjust Burnt gear unit is to bite conjunction actuating device outside gear, and its setting direction is vertical with lighting unit, and this unit, by the transmission of gear, turns The movement of chemical conversion microscope tube;
Image acquisition units is connected with focusing gear unit in same light path, image acquisition units with microscope tube;
The definition collecting image is passed judgment on by host computer unit, matching focusing curve, and sends focusing instruction, controls whole system System is in quasi-coke-like state.
The automatic focusing micro imaging system of planetary surface material detection in place the most according to claim 1, its feature exists In: described focusing gear unit includes drivewheel, driven pulley, magnetic bead, motor and Hall element;Motor drives actively wheel belt Dynamic driven pulley transmission;Magnetic bead is arranged on the driven wheel, and magnetic bead and Hall element are used for demarcating start position during gear drive; Driven pulley connects microscope tube and image acquisition units.
The automatic focusing micro imaging system of planetary surface material detection in place the most according to claim 2, its feature exists In: described image acquisition units is CCD camera.
CN201610607155.0A 2016-07-28 2016-07-28 The automatic focusing micro imaging system that a kind of planetary surface substance detects in place Expired - Fee Related CN106094193B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201610607155.0A CN106094193B (en) 2016-07-28 2016-07-28 The automatic focusing micro imaging system that a kind of planetary surface substance detects in place

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201610607155.0A CN106094193B (en) 2016-07-28 2016-07-28 The automatic focusing micro imaging system that a kind of planetary surface substance detects in place

Publications (2)

Publication Number Publication Date
CN106094193A true CN106094193A (en) 2016-11-09
CN106094193B CN106094193B (en) 2018-07-03

Family

ID=57479066

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201610607155.0A Expired - Fee Related CN106094193B (en) 2016-07-28 2016-07-28 The automatic focusing micro imaging system that a kind of planetary surface substance detects in place

Country Status (1)

Country Link
CN (1) CN106094193B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113766139A (en) * 2021-09-29 2021-12-07 广东朝歌智慧互联科技有限公司 Focusing device and method

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20020067409A1 (en) * 2000-12-06 2002-06-06 Bio-View Ltd. Data acquisition and display system and method
US20020105641A1 (en) * 2001-02-05 2002-08-08 Anderson Mark S. Locally enhanced raman spectroscopy with an atomic force microscope
CN103743719A (en) * 2013-12-11 2014-04-23 中国科学院西安光学精密机械研究所 Remote in-situ integrated test system for planet surface substances and atmosphere
CN205942080U (en) * 2016-07-28 2017-02-08 中国科学院西安光学精密机械研究所 Micro - imaging system of automatic focusing that planet surface material is taken one's place and is surveyed

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20020067409A1 (en) * 2000-12-06 2002-06-06 Bio-View Ltd. Data acquisition and display system and method
US20020105641A1 (en) * 2001-02-05 2002-08-08 Anderson Mark S. Locally enhanced raman spectroscopy with an atomic force microscope
CN103743719A (en) * 2013-12-11 2014-04-23 中国科学院西安光学精密机械研究所 Remote in-situ integrated test system for planet surface substances and atmosphere
CN205942080U (en) * 2016-07-28 2017-02-08 中国科学院西安光学精密机械研究所 Micro - imaging system of automatic focusing that planet surface material is taken one's place and is surveyed

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113766139A (en) * 2021-09-29 2021-12-07 广东朝歌智慧互联科技有限公司 Focusing device and method

Also Published As

Publication number Publication date
CN106094193B (en) 2018-07-03

Similar Documents

Publication Publication Date Title
CN101050949A (en) Measuring system and its measuring method for large field object micro surface three dimension topography
EP2813803B1 (en) Machine vision inspection system and method for performing high-speed focus height measurement operations
CN102692347A (en) Camera automatic regulating image acquisition device and method for fatigue crack propagation test
CN103765277B (en) Use the focusing of error signal and imaging system and technology
CN101498831B (en) Auxiliary automatic focusing system and method for optical imaging system
CN103353285A (en) Apparatus and method for detecting multiple optical axis consistency of platform photoelectric instrument
CN101718912B (en) Digitalized detail visualizer of industrial X-ray negative with variable zooming ratio
WO2004010380A3 (en) Measuring 3d deformations of an object by comparing focusing conditions for sharp capturing of said object before and after deformation
CN1727983A (en) Strobe illumination
CN101553749A (en) Dynamic scanning automatic microscope and method
EP3064981B1 (en) Image acquisition device and image acquisition method for image acquisition device
CN104111485A (en) Stereo imaging based observation method for raindrop size distribution and other rainfall micro physical characteristics
CN105785561B (en) A kind of digital microscope and its focus method
CN106525869A (en) Glass edge defect detection method, as well as device and system thereof
CN104181685A (en) Automatic digital slide focusing device and method based on microscope
WO2016101092A1 (en) Digital microscope and focusing method thereof
US20110157344A1 (en) Method and apparatus for fast focus imaging biologic specimens
CN201681056U (en) Industrial high-resolution observation device for X-ray negative films
CN107741425A (en) A kind of surface defect real-time detection apparatus for increasing material manufacturing
CN205942080U (en) Micro - imaging system of automatic focusing that planet surface material is taken one's place and is surveyed
CN112345553A (en) Hard disk part detection device and detection method
CN106645045B (en) TDI-CCD-based bidirectional scanning imaging method in fluorescence optical microscopy imaging
CN104380170A (en) Microscope and shutter mechanism
CN106094193A (en) A kind of automatic focusing micro imaging system of planetary surface material detection in place
CN106225765A (en) A kind of many line scan image sensors obtain device and the formation method of hyperfocal distance scanning imagery

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20180703

Termination date: 20190728

CF01 Termination of patent right due to non-payment of annual fee