CN106053949A - Metal element contact resistance testing device and testing method - Google Patents
Metal element contact resistance testing device and testing method Download PDFInfo
- Publication number
- CN106053949A CN106053949A CN201610571335.8A CN201610571335A CN106053949A CN 106053949 A CN106053949 A CN 106053949A CN 201610571335 A CN201610571335 A CN 201610571335A CN 106053949 A CN106053949 A CN 106053949A
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- plug
- hardware
- contact resistance
- measured
- probe
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/20—Measuring earth resistance; Measuring contact resistance, e.g. of earth connections, e.g. plates
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Abstract
The invention discloses a metal element contact resistance testing device and a testing method. The testing device comprises a plug-pull male head, a plug-pull female seat and a driving mechanism, wherein the plug-pull male head is provided with more than one probe, the probes are arranged at intervals side by side, and the probes are electrically connected with a current source or a voltage measurement device via a first conductive wire; the plug-pull female seat is used for arranging more than one to-be-tested metal element arranged at intervals side by side, the to-be-tested metal elements and the probes are arranged correspondingly, and the to-be-tested metal elements are electrically connected with the voltage measurement device or the current source via a second conductive wire; the driving mechanism is used for driving plug-pull operation to be realized between the plug-pull male head and the plug-pull female seat. When the plug-pull male head is plugged in the plug-pull female seat, the probes and the to-be-tested metal elements are contacted. During a process during which the driving mechanism drives the plug-pull male head to be plugged in the plug-pull female seat in a back-forth reciprocating mode, the to-be-tested metal elements are aged gradually along with the plug-pull times of the probes, and the voltage measurement device can test, record and analyze the change condition of the contact resistance during the gradual to-be-tested metal element aging process.
Description
Technical field
The present invention relates to the degradation testing technique field of component, especially relate to a kind of hardware contact resistance
Test device and method of testing.
Background technology
Hardware, such as metal pad, golden finger etc., when contacting with other component, hardware will produce
Raw contact resistance.It addition, hardware is in use, due to other component phase mutual friction, metal component surfaces
Can gradually present catabiosis.Hardware when contacting with other component produced contact resistance will be with metal
Element aging and gradually change, the change of hardware contact resistance will influence whether the stable operation of electronic equipment.
Summary of the invention
Based on this, the invention reside in the defect overcoming prior art, it is provided that the test dress of a kind of hardware contact resistance
Putting and method of testing, it can contact produced contact resistance in ageing process to hardware with other component and carry out
Test analysis.
Its technical scheme is as follows: the test device of a kind of hardware contact resistance, including: plug male, described plug
Male is provided with more than one probe, and more than one described probe is spaced setting side by side, and described probe is electrically connected by the first conductor wire
It is connected to current source or voltage measuring apparatus；Plug female seat, described plug female seat is used for being equiped with more than one hardware to be measured,
More than one described hardware to be measured is spaced setting side by side, more than one described hardware to be measured and more than one described spy
Pin relative set one by one, described hardware to be measured is electrically connected to voltage measuring apparatus or current source by the second conductor wire；And
Drive mechanism, described drive mechanism is used for driving between described plug male and described plug female seat realization plug operation, described
When plug male inserts described plug female seat, described probe contacts with described hardware to be measured.
The method of testing of a kind of hardware contact resistance, comprises the steps:
Step one, drive mechanism drive plug male to be inserted in plug female seat；
Step 2, tested voltage when described probe contacts with described hardware to be measured by voltage measuring apparatus
Value, and described magnitude of voltage is carried out record；
Step 3, described drive mechanism drive plug male to be extracted out from described plug female seat by described probe again；
Repeating said steps one is to described step 3 n time.
Wherein in an embodiment, described current source and described voltage measuring apparatus are one, described in more than one
Probe is electrically connected to described current source, also include more than one control switch, more than one described control switch with one with
Upper described probe is corresponding one by one, and described first conductor wire is provided with control switch, and more than one described hardware to be measured electrically connects
It is connected to described voltage measuring apparatus.
Wherein in an embodiment, the test device of hardware contact resistance also includes controller, described controller
Being electrically connected with described drive mechanism, described control switch, described controller is used for controlling described drive mechanism and drives institute back and forth
State plug male and switch off for controlling described control or close.
Wherein in an embodiment, the test device of hardware contact resistance also includes supporting seat, described support seat
Being provided with slide rail, described plug female seat is fixedly installed on described support seat, and described plug male is provided with and matches with described slide rail
Sliding part, described plug male is installed on described slide rail by described sliding part, described drive mechanism with described plug public affairs
Head transmission is connected, and described drive mechanism is used for driving described plug male to move back and forth along described slide rail.
Wherein in an embodiment, described probe includes syringe, the syringe needle being installed in described syringe and is set in
Spring outside described syringe needle, described syringe medial wall is provided with the first flange and the second flange, and it is convex that described syringe needle sidewall is provided with the 3rd
Edge, described third lip is between described first flange and described second flange, and described both ends of the spring conflicts described respectively
Two flanges and described third lip.
Wherein in an embodiment, described hardware to be measured is golden finger or metal pad.
Wherein in an embodiment, in described step 2: controller controls more than one control switch and closes successively,
By described voltage measuring apparatus by more than one measured described magnitude of voltage record successively.
Below in conjunction with technique scheme, principle, the effect of the present invention are further illustrated:
The test device of 1, above-mentioned hardware contact resistance, the probe of plug male and the gold to be measured in plug female seat
When genus element contacts, hardware to be measured will produce contact resistance.Current source is electrically connected to metal to be measured by probe
Element, voltage measuring apparatus is just able to detect that magnitude of voltage produced by hardware to be measured, just may be used according to magnitude of voltage, current source
To derive hardware to be measured produced contact resistance when contacting with probe.So, drive mechanism drives plug public affairs
During head is the most back and forth inserted into plug female seat, hardware to be measured is the most aging along with probe plug increased frequency, voltage
Measurement apparatus can test the situation of change of the contact resistance in record analysis hardware to be measured gradually ageing process.
2, current source and voltage measuring apparatus are one.More than one probe is electrically connected to current source.More than one
Control switch the most corresponding to more than one probe.First conductor wire is provided with control switch, more than one hardware to be measured electricity
Property is connected to voltage measuring apparatus.Controller is electrically connected with drive mechanism, control switch, and controller is used for controlling drive mechanism
Drive back and forth to plug male and be used for control and switch off or close.Plug male and plug swapping process of female seat
In, controlling more than one control switch by controller and close successively, when control switch closes successively, current source is by accordingly
First conductor wire is electrically connected to probe successively, just can be produced by hardware to be tested by described voltage measuring apparatus
Magnitude of voltage tests out successively, and more than one the described magnitude of voltage record successively that will be tested out.
3, supporting seat and be provided with slide rail, plug female seat is fixedly installed on support seat.Plug male is provided with and matches with slide rail
Sliding part, plug male be installed on slide rail by sliding part.Drive mechanism is connected with plug male transmission, and drive mechanism is used
Move back and forth along slide rail in driving plug male.When drive mechanism drives plug male Plug Action, the slip of plug male
Part moves back and forth on the slide rail supporting seat back and forth, and plug male passes through the slide rail guiding supporting seat so that plug male is with slotting
Pull out the Plug Action between female seat the most smooth.
4, syringe medial wall is provided with the first flange and the second flange, and syringe needle sidewall is provided with third lip.Third lip is positioned at
Between first flange and the second flange.Both ends of the spring is conflicted the second flange and third lip respectively.Probe is touching gold to be measured
When belonging to element, syringe needle pressuring spring, and shrinking back in syringe, such syringe needle during touching hardware to be measured, spring
Cushioning effect can be played, it is to avoid damage hardware to be measured.
Accompanying drawing explanation
Fig. 1 be hardware contact resistance described in the embodiment of the present invention test device in hardware to be measured for gold hands
Working state figure one during finger；
Fig. 2 be hardware contact resistance described in the embodiment of the present invention test device hardware to be measured be golden finger
Time working state figure two；
Fig. 3 be hardware contact resistance described in the embodiment of the present invention test device hardware to be measured be metal welding
Working state figure one during dish；
Fig. 4 be hardware contact resistance described in the embodiment of the present invention test device hardware to be measured be metal welding
Working state figure two during dish；
Fig. 5 is the circuit during test device to test contact resistance of hardware contact resistance described in the embodiment of the present invention
Figure；
Fig. 6 is the structural representation of probe described in the embodiment of the present invention.
Description of reference numerals:
10, plug male, 11, probe, 111, syringe, the 1111, first flange, the 1112, second flange, 112, syringe needle,
1121, third lip, 113, spring, the 12, first conductor wire, 13, current source, 14, control switch, 15, sliding part, 20, plug
Female seat, 21, hardware to be measured, the 22, second conductor wire, 23, voltage measuring apparatus, 30, drive mechanism, 40, support seat, 41,
Slide rail, 50, contact resistance.
Detailed description of the invention
Below embodiments of the invention are described in detail:
As Figure 1-4, the test device of the hardware contact resistance described in the embodiment of the present invention, including: plug public affairs
10, plug female seat 20 and drive mechanism 30.Described plug male 10 is provided with more than one probe 11.More than one described probe
11 are spaced setting side by side, and described probe 11 is electrically connected to current source 13 or voltage measuring apparatus 23 by the first conductor wire 12.Institute
State plug female seat 20 for being equiped with more than one hardware 21 to be measured.In embodiments of the present invention, described metal to be measured unit
Part 21 is golden finger or metal pad.More than one described hardware 21 to be measured is spaced setting side by side, treats described in more than one
Survey hardware 21 and more than one described probe 11 relative set one by one.Described hardware to be measured 21 is by the second conductor wire
22 are electrically connected to voltage measuring apparatus 23 or current source 13.Described drive mechanism 30 is used for driving described plug male 10 with described
Plug operation is realized between plug female seat 20.When described plug male 10 inserts described plug female seat 20, described probe 11 and institute
State hardware 21 to be measured to contact.
The test device of above-mentioned hardware contact resistance, the probe 11 of plug male 10 and treating in plug female seat 20
When survey hardware 21 contacts, hardware 21 to be measured will produce contact resistance 50 (as shown in Figure 5).Current source 13 leads to
Crossing probe 11 and be electrically connected to hardware 21 to be measured, voltage measuring apparatus 23 is just able to detect that hardware 21 to be measured is produced
Magnitude of voltage, just can derive hardware 21 to be measured according to magnitude of voltage, current source 13 and be produced when contacting with probe 11
Raw contact resistance 50.So, during drive mechanism 30 drives plug male 10 to be the most back and forth inserted into plug female seat 20, treat
Surveying hardware 21 the most aging along with probe 11 plugs increased frequency, it is to be measured that voltage measuring apparatus 23 can test record analysis
The situation of change of the contact resistance 50 in hardware 21 gradually ageing process.
Described current source 13 is one with described voltage measuring apparatus 23.More than one described probe 11 is electrically connected to
Described current source 13.The test device of described hardware contact resistance also includes that more than one controls switch 14.One with
Upper described control switch 14 is the most corresponding to probe more than one described 11.Described first conductor wire 12 is provided with described control and switchs
14, more than one described hardware 21 to be measured is electrically connected to described voltage measuring apparatus 23.Hardware contact resistance
Test device also includes controller.Described controller is electrically connected with described drive mechanism 30, the described switch 14 that controls, described control
Device processed is used for controlling described drive mechanism 30 and drives described plug male 10 back and forth and disconnect for controlling the described switch 14 that controls
Or Guan Bi.Plug male 10 is with plug 20 swapping process of female seat, and controller controls more than one and controls switch 14 successively
Guan Bi, when control switch 14 closes successively, current source 13 is electrically connected to probe 11 successively by corresponding first conductor wire 12,
Just the magnitude of voltage that hardware to be tested produces can be tested out successively by described voltage measuring apparatus 23, and will be tested
More than one gone out described magnitude of voltage record successively.
The test device of hardware contact resistance also includes supporting seat 40.Described support seat 40 is provided with slide rail 41, described
Plug female seat 20 is fixedly installed on described support seat 40.Described plug male 10 is provided with the slip matched with described slide rail 41
Part 15, described plug male 10 is installed on described slide rail 41 by described sliding part 15.Described drive mechanism 30 is inserted with described
Pulling out male 10 transmission to be connected, described drive mechanism 30 is used for driving described plug male 10 to move back and forth along described slide rail 41.
When drive mechanism 30 drives plug male 10 Plug Action, the sliding part 15 of plug male 10 comes on the slide rail 41 supporting seat 40
Returning and move back and forth, plug male 10 guides through the slide rail 41 supporting seat 40 so that between plug male 10 and plug female seat 20
Plug Action the most smooth.
Referring to Fig. 6, described probe 11 includes syringe 111, the syringe needle 112 being installed in described syringe 111 and sheathed
Spring 113 outside described syringe needle 112.Described syringe 111 medial wall is provided with the first flange 1111 and the second flange 1112, described
Syringe needle 112 sidewall is provided with third lip 1121.It is second convex with described that described third lip 1121 is positioned at described first flange 1111
Between edge 1112.Conflict described second flange 1112 and described third lip 1121 respectively in described spring 113 two ends.Probe 11 exists
When touching hardware 21 to be measured, syringe needle 112 pressuring spring 113, and shrink back in syringe 111, such syringe needle 112 is in contact
During hardware 21 to be measured, spring 113 can play cushioning effect, it is to avoid damages hardware 21 to be measured.
The method of testing of hardware contact resistance of the present invention, comprises the steps:
Step one, drive mechanism 30 drive plug male 10 to be inserted in plug female seat 20；
Step 2, tested by voltage measuring apparatus 23 when described probe 11 contacts with described hardware 21 to be measured
Magnitude of voltage, and described magnitude of voltage is carried out record；
Step 3, described drive mechanism 30 drive plug male 10 to be taken out from described plug female seat 20 by described probe 11 again
Go out；
Repeating said steps one is to described step 3 n time.The number of times of n is correlated with according to the burn-in test of hardware 21 to be measured
Standard is set, it is also possible to be artificially set.
The method of testing of above-mentioned hardware contact resistance, the probe 11 of plug male 10 is to be measured with plug female seat 20
When hardware 21 contacts, hardware 21 to be measured will produce contact resistance 50 (as shown in Figure 5).Drive mechanism 30 is driven
During dynamic plug male 10 is the most back and forth inserted into plug female seat 20, hardware 21 to be measured increases along with probe 11 plugs number of times
Much the most aging, voltage measuring apparatus 23 can test the contact electricity in record analysis hardware to be measured 21 gradually ageing process
The situation of change of resistance 50.
Wherein, in described step 2: controller controls more than one control switch 14 and closes successively, by described voltage
Measurement apparatus 23 is by more than one measured described magnitude of voltage record successively.Plug male 10 once plugs with plug female seat 20
During, controller controls more than one control switch 14 and closes successively, and when control switch 14 closes successively, current source 13 passes through
Corresponding first conductor wire 12 is electrically connected to probe 11 successively, just can be by ensaying to be measured by described voltage measuring apparatus 23
The magnitude of voltage belonging to element generation tests out successively, and more than one the described magnitude of voltage record successively that will be tested out.
Each technical characteristic of embodiment described above can combine arbitrarily, for making description succinct, not to above-mentioned reality
The all possible combination of each technical characteristic executed in example is all described, but, as long as the combination of these technical characteristics is not deposited
In contradiction, all it is considered to be the scope that this specification is recorded.
Embodiment described above only have expressed the several embodiments of the present invention, and it describes more concrete and detailed, but also
Can not therefore be construed as limiting the scope of the patent.It should be pointed out that, come for those of ordinary skill in the art
Saying, without departing from the inventive concept of the premise, it is also possible to make some deformation and improvement, these broadly fall into the protection of the present invention
Scope.Therefore, the protection domain of patent of the present invention should be as the criterion with claims.
Claims (8)
1. the test device of a hardware contact resistance, it is characterised in that including:
Plug male, described plug male is provided with more than one probe, and more than one described probe is spaced setting, described spy side by side
Pin is electrically connected to current source or voltage measuring apparatus by the first conductor wire；
Plug female seat, described plug female seat is used for being equiped with more than one hardware to be measured, more than one described metal to be measured
Element is spaced setting side by side, more than one described hardware to be measured and more than one described probe relative set one by one, described
Hardware to be measured is electrically connected to voltage measuring apparatus or current source by the second conductor wire；And
Drive mechanism, described drive mechanism is used for driving between described plug male and described plug female seat realization plug operation,
When described plug male inserts described plug female seat, described probe contacts with described hardware to be measured.
The test device of hardware contact resistance the most according to claim 1, it is characterised in that described current source and institute
Stating voltage measuring apparatus and be one, more than one described probe is electrically connected to described current source, also includes that more than one is controlled
System switch, more than one described control switch is the most corresponding to probe more than one described, and described first conductor wire is provided with control
Switch, more than one described hardware to be measured is electrically connected to described voltage measuring apparatus.
The test device of hardware contact resistance the most according to claim 2, it is characterised in that also include controller,
Described controller is electrically connected with described drive mechanism, described control switch, and described controller is used for controlling described drive mechanism
Drive described plug male back and forth and switch off for controlling described control or close.
The test device of hardware contact resistance the most according to claim 1, it is characterised in that also include supporting seat,
Described support seat is provided with slide rail, and described plug female seat is fixedly installed on described support seat, and described plug male is provided with described
The sliding part that slide rail matches, described plug male is installed on described slide rail by described sliding part, described drive mechanism with
Described plug male transmission is connected, and described drive mechanism is used for driving described plug male to move back and forth along described slide rail.
The test device of hardware contact resistance the most according to claim 1, it is characterised in that described probe includes pin
Cylinder, the syringe needle that is installed in described syringe and be set in the spring outside described syringe needle, it is convex that described syringe medial wall is provided with first
Edge and the second flange, described syringe needle sidewall is provided with third lip, and described third lip is positioned at described first flange and described second
Between flange, described both ends of the spring is conflicted described second flange and described third lip respectively.
6. according to the test device of the hardware contact resistance described in any one of Claims 1 to 5, it is characterised in that described
Hardware to be measured is golden finger or metal pad.
7. a method of testing for hardware contact resistance, have employed the hardware as described in any one of claim 1-6
The test device of contact resistance, it is characterised in that comprise the steps:
Step one, drive mechanism drive plug male to be inserted in plug female seat；
Step 2, tested magnitude of voltage when described probe contacts with described hardware to be measured by voltage measuring apparatus, and
Described magnitude of voltage is carried out record；
Step 3, described drive mechanism drive plug male to be extracted out from described plug female seat by described probe again；
Repeating said steps one is to described step 3 n time.
The method of testing of hardware contact resistance the most according to claim 7, it is characterised in that in described step 2
In: controller controls more than one and controls switch and close successively, by described voltage measuring apparatus by measured more than one
Described magnitude of voltage record successively.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610571335.8A CN106053949B (en) | 2016-07-18 | 2016-07-18 | A kind of test device and test method of hardware contact resistance |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610571335.8A CN106053949B (en) | 2016-07-18 | 2016-07-18 | A kind of test device and test method of hardware contact resistance |
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| Publication Number | Publication Date |
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| CN106053949A true CN106053949A (en) | 2016-10-26 |
| CN106053949B CN106053949B (en) | 2019-05-17 |
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| CN201610571335.8A Active CN106053949B (en) | 2016-07-18 | 2016-07-18 | A kind of test device and test method of hardware contact resistance |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN107525989A (en) * | 2017-08-29 | 2017-12-29 | 常州普莱德新能源电池科技有限公司 | Battery management unit plug and pull out detector |
| CN110190468A (en) * | 2018-11-30 | 2019-08-30 | 中航光电科技股份有限公司 | A kind of connector of contact resistance on-line checking |
| CN111007319A (en) * | 2019-12-05 | 2020-04-14 | 上海华力集成电路制造有限公司 | Detection circuit and method for socket probe yield |
| CN112424620A (en) * | 2018-07-24 | 2021-02-26 | Amad 曼奈柯斯控股有限责任两合公司 | Monitoring of contact areas in a plug arrangement |
| CN117389816A (en) * | 2023-12-08 | 2024-01-12 | 国网江西省电力有限公司电力科学研究院 | Interface detection device and method based on UEFI firmware detection |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN107525989A (en) * | 2017-08-29 | 2017-12-29 | 常州普莱德新能源电池科技有限公司 | Battery management unit plug and pull out detector |
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| CN117389816A (en) * | 2023-12-08 | 2024-01-12 | 国网江西省电力有限公司电力科学研究院 | Interface detection device and method based on UEFI firmware detection |
| CN117389816B (en) * | 2023-12-08 | 2024-04-02 | 国网江西省电力有限公司电力科学研究院 | Interface detection device and method based on UEFI firmware detection |
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|---|---|
| CN106053949B (en) | 2019-05-17 |
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