CN106021001A - Method for reliability modeling and analysis of electronic products with ring backup structures - Google Patents
Method for reliability modeling and analysis of electronic products with ring backup structures Download PDFInfo
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- CN106021001A CN106021001A CN201610361505.XA CN201610361505A CN106021001A CN 106021001 A CN106021001 A CN 106021001A CN 201610361505 A CN201610361505 A CN 201610361505A CN 106021001 A CN106021001 A CN 106021001A
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- 238000004458 analytical method Methods 0.000 title claims abstract description 19
- 238000000342 Monte Carlo simulation Methods 0.000 claims abstract description 13
- 238000004364 calculation method Methods 0.000 claims abstract description 5
- 238000005070 sampling Methods 0.000 claims abstract description 4
- 238000004088 simulation Methods 0.000 claims abstract description 3
- 238000010586 diagram Methods 0.000 claims description 6
- 238000005315 distribution function Methods 0.000 claims description 3
- 230000004888 barrier function Effects 0.000 claims 1
- 230000009286 beneficial effect Effects 0.000 abstract description 2
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- 239000000203 mixture Substances 0.000 description 2
- 238000004422 calculation algorithm Methods 0.000 description 1
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/008—Reliability or availability analysis
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Abstract
The invention discloses a method for reliability modeling and analysis of electronic products with ring backup structure. Based on a Monte-Carlo simulation method, reliability modeling and analytical calculations of ring backup structure are achieved. The Monte-Carlo simulation method is adopted for modeling and modeling comprises following steps: (1) establishing a probability simulation model related to solutions to solve probability distribution or mathematical expectations of the established model; (2) performing sampling investigations randomly of the model, namely generating random variables; (3) and solving by comparisons. The method for reliability modeling and analysis of electronic products with ring backup structure has following beneficial effects: the difficulty of reliability modeling of electronic products with ring backup structure is solved so that requirements for complicated descriptions of logical relationships and reliability analyses are satisfied; and a theoretical basis is provided for reliability analyses and design level of products.
Description
Technical field
The present invention relates to a kind of method that ring backup electronic product is carried out Reliability modeling analysis, belonging to electronic product can
By property design field.
Background technology
The present invention is to design, based on DSMC for the Reliability modeling analysis of ring backup architecture electronic product
Realize ring backup electronic product reliability modeling and analyze work.Ring backup architecture refers to many backup compositions of ring-like.By
In its complex redundancy structure, use some common Reliability Modelings (such as reliability block diagram, fault tree analysis method, dynamic
State fault tree, Markov process etc.), it is impossible to it is modeled, it is impossible to description logic relation, and then cannot be to its analysis meter
Calculate reliability index.Present invention application DSMC, carries out Reliability modeling and analysis to ring backup architecture, and proposes
Corresponding algorithmic formula, improves the fail-safe analysis level of ring backup architecture electronic product.
Summary of the invention
It is an object of the invention to Monte Carlo method application in electronic product ring backup architecture, carry out Reliability modeling
And analytical calculation；The complete logical relation describing ring backup architecture, and the Reliability modeling solving ring backup architecture divides
A difficult problem for analysis, provides theoretical basis for improving the reliability design level of product.
The present invention adopts the technical scheme that: a kind of method that ring backup electronic product is carried out Reliability modeling analysis,
It realizes ring backup architecture Reliability modeling and analytical calculation based on Monte Carlo simulation approach, uses monte carlo simulation methodology
Modeling, its modeling procedure is as follows:
(1) set up one with solve relevant probability simulation model, make to be solved to probability distribution or the number of constructed model
Term hopes；
(2) model is carried out stochastic sampling observation, i.e. produce stochastic variable；
(3) compare and solve.
The phantom wherein using DSMC to set up is as follows:
1. system model
System is made up of 16 elementary cells, represents with s, then have s={z1,z2,…z16}；
ziRepresenting each unit, their failure distribution function is Fi(t) (i=1,2 ... 16), obey λ=10-7/ hour
Exponential；
2. emulation logic relation
Protect 12 cold standby belief systems for the most non-16, can directly use reliability block diagram as system Meng Teka
The genuine logical relation of Luo Fang；Protect the 12 such complication systems of cold standby for 16, use fault tree to represent Monte-Carlo Simulation
Logical relation；Introducing time variable, if in this system, the structure function of fault tree φ [x (t)] represents；Each unit zi's
State variable biT () represents, then be represented by formula (5-1)
X (t)=[b1(t),b2(t),…b16(t)] (5-1)
Wherein ziState variable
Represent that top event in the state variable of t, then has with φ [t]
And φ [t]=φ [x (t)] (5-4)
Top event is that system s lost efficacy, and bottom event is following four kinds of situations:
1. the ∑ b of A1, A2, B1i≥2；
2. the ∑ b of A3～A7, B2, B3i≥3；
3. the ∑ b of A8～A12, B3, B4i≥3；
4. the ∑ b of A3～A12, B2～B4i≥4。
The method calculating required reliability index according to described phantom is:
1. randomly generate a time t obeying given exponential, compare t and 131400 (15 years=131400 hours)
Magnitude relationship, if t > 131400, then do not broke down in 131400 hours, state variable is 0；If t < 131400,
Then breaking down in 131400 hours, state variable is 1；Each amplifier is produced the most in this manner random number, and
Obtain its state variable, totally 16 unit.
2. fault is divided into following four: if having more than a cell failure in tri-unit of A1, A2, B1, the most whole sets
Standby fault；If A3～A7, seven unit of B2, B3 had more than two cell failures, the most whole equipment fault；If A8～
Seven unit of A12, B3, B4 have more than two cell failures, the most whole equipment fault；If A3～A12, B2～B4 13
Unit has more than three cell failures, the most whole equipment fault；
3. procedure above iteration 104Secondary, equipment fault number of times and 104Ratio be unreliable degree.
The invention has the beneficial effects as follows: solve a difficult problem for ring backup architecture electronic product reliability modeling, can apply
To comprising many series products, the reliability design fields of system such as the electronics of ring backup architecture, electromechanics.Meet complicated ring standby
The logical relation of part structure describes and fail-safe analysis requirement.For improving the fail-safe analysis of product, design level provides reason
Opinion basis.
Accompanying drawing explanation
Fig. 1 is that 12 ring backup schematic diagrams protected by amplifier 16.
Fig. 2 is the Monte-Carlo Simulation flow chart of amplifier.
Detailed description of the invention
The present invention is described in detail with specific embodiment below in conjunction with the accompanying drawings.
Present invention is primarily based on Monte Carlo simulation approach, it is achieved ring backup architecture Reliability modeling and analytical calculation.Use
Monte carlo simulation methodology models, and its basic modeling step is as follows:
1. set up one with solve relevant probabilistic model, make to be solved to the probability distribution of constructed model or mathematics phase
Hope；
2. model is carried out stochastic sampling observation, i.e. produce stochastic variable；
3. compare and solve.
Equipment as shown in Figure 1 is certain row amplifier, and this equipment belongs to ring backup.This device structure functional relationship is 16 guarantors
12 backups: under normal circumstances, have 12 unit (A1～A12) work, constitute 12 paths, and remaining 4 (B1～B4) is standby
Part part.Wherein, any road in path 1 and 2 can be backed up by B1, and A1, A2 and B1 form 3:2 backup mode；Remaining A3
～any road in path 3～7 can be backed up by A12 and B2～B4 composition 13 guarantor 10 backup modes: B2, but can not be to path 8
～12 backup；B3 can be to any road backup in 3～12；Any road in path 8～12 can be backed up by B4, but not
Path 3～7 can be backed up.It is the exponential of λ that the crash rate of each monomer obeys parameter.Need to analyze this ring backup architecture
Unreliable degree after working 15 years.
Between 16 unit of this equipment, Relationship Comparison is complicated, uses DSMC, and phantom is as follows:
1. system model
System is made up of 16 elementary cells, represents with s, then have s={z1,z2,…z16}。
ziRepresenting each unit, their failure distribution function is Fi(t) (i=1,2 ... 16), obey λ=10-7/ hour
Exponential.
2. emulation logic relation
For simple belief system, reliability block diagram can be directly used to close as the logic of system Monte-Carlo Simulation
System；Protect the 12 such complication systems of cold standby for 16, typically represent the logical relation of Monte-Carlo Simulation with fault tree.Introduce
Time variable, if in this system, the structure function of fault tree φ [x (t)] represents；Each unit ziState variable bi(t)
Represent, be then represented by formula (5-1)
X (t)=[b1(t),b2(t),…b16(t)] (5-1)
Wherein ziState variable
Represent that top event in the state variable of t, then has with φ [t]
And φ [t]=φ [x (t)] (5-4)
Top event is that system s lost efficacy, and bottom event is following four kinds of situations:
1. the ∑ b of A1, A2, B1i≥2；
2. the ∑ b of A3～A7, B2, B3i≥3；
3. the ∑ b of A8～A12, B3, B4i≥3；
4. the ∑ b of A3～A12, B2～B4i≥4。
Above phantom just can clearly give expression to the logical relation of these 16 guarantor, 12 equipment, such that it is able to root further
Reliability index needed for calculating according to this phantom.
Emulating this amplifier (Fig. 1) application software (example Matlab), program flow diagram is as shown in Figure 2.
The implication that in flow chart, each variable represents: E represents whole equipment fault number of times；K represents cycle-index；I represents and puts
The title of big device；tiRepresent the life time of random 16 travelling-wave tube amplifiers taken out；NiRepresent the state of i-th travelling-wave tube
Variable, Ni=1 is fault, Ni=0 is normal；F represents the unreliable degree of whole equipment.
Algorithm routine principle is as follows:
1. randomly generate a time t obeying given exponential, compare t and 131400 (15 years=131400 hours)
Magnitude relationship, if t > 131400, then do not broke down in 131400 hours, state variable is 0.If t < 131400,
Then breaking down in 131400 hours, state variable is 1.Each amplifier is produced the most in this manner random number, and
Obtain its state variable, totally 16 unit.
2. fault is divided into following four: if having more than a cell failure in tri-unit of A1, A2, B1, the most whole sets
Standby fault.If A3～A7, seven unit of B2, B3 had more than two cell failures, the most whole equipment fault；If A8～
Seven unit of A12, B3, B4 have more than two cell failures, the most whole equipment fault；If A3～A12, B2～B4 13
Unit has more than three cell failures, the most whole equipment fault；
3. procedure above iteration 104Secondary, equipment fault number of times and 104Ratio be unreliable degree.
Analyze the unreliable degree drawing product, because the indexs such as the unreliable degree of product, reliability, crash rate, MTTF can
With mutually conversion, the numerical value of other characteristic quantities of ring backup architecture therefore can be drawn.
The ultimate principle of the present invention, principal character and advantage have more than been shown and described.Those of ordinary skill in the art
It should be appreciated that above-described embodiment limits the scope of the invention the most in any form, the mode such as all employing equivalents is obtained
The technical scheme obtained, all falls within protection scope of the present invention.
Part that the present invention does not relate to is the most same as the prior art maybe can use prior art to be realized.
Claims (3)
1. the method that ring backup electronic product is carried out Reliability modeling analysis, it is characterised in that: based on Monte Carlo mould
Plan method realizes ring backup architecture Reliability modeling and analytical calculation, uses monte carlo simulation methodology to model, its modeling procedure
As follows:
(1) set up one with solve relevant probability simulation model, make to be solved to the probability distribution of constructed model or mathematics phase
Hope；
(2) model is carried out stochastic sampling observation, i.e. produce stochastic variable；
(3) compare and solve.
A kind of method that ring backup electronic product is carried out Reliability modeling analysis the most according to claim 1, its feature
It is: the phantom using DSMC to set up is as follows:
1. system model
System is made up of 16 elementary cells, represents with s, then have s={z1,z2,…z16}；
ziRepresenting each unit, their failure distribution function is Fi(t) (i=1,2 ... 16), obey λ=10-7/ hour finger
Number distribution；
2. emulation logic relation
Protect 12 cold standby belief systems for the most non-16, can directly use reliability block diagram to imitate as system Monte Carlo
Genuine logical relation；Protect the 12 such complication systems of cold standby for 16, use fault tree to represent the logic of Monte-Carlo Simulation
Relation；Introducing time variable, if in this system, the structure function of fault tree φ [x (t)] represents；Each unit ziState
Variable biT () represents, then be represented by formula (5-1)
X (t)=[b1(t),b2(t),…b16(t)] (5-1)
Wherein ziState variable
Represent that top event in the state variable of t, then has with φ [t]
And φ [t]=φ [x (t)] (5-4)
Top event is that system s lost efficacy, and bottom event is following four kinds of situations:
1. the ∑ b of A1, A2, B1i≥2；
2. the ∑ b of A3～A7, B2, B3i≥3；
3. the ∑ b of A8～A12, B3, B4i≥3；
4. the ∑ b of A3～A12, B2～B4i≥4。
A kind of method that ring backup electronic product is carried out Reliability modeling analysis the most according to claim 2, its feature
It is that the method calculating required reliability index according to described phantom is:
1. randomly generate a time t obeying given exponential, compare the big of t and 131400 (15 years=131400 hours)
Little relation, if t > 131400, did not then break down in 131400 hours, and state variable is 0；If t < 131400, then exist
Breaking down in 131400 hours, state variable is 1；Each amplifier is produced random number the most in this manner, and obtains
Its state variable, totally 16 unit.
2. fault is divided into following four: if had in tri-unit of A1, A2, B1 more than a cell failure, the event of the most whole equipment
Barrier；If A3～A7, seven unit of B2, B3 had more than two cell failures, the most whole equipment fault；If A8～A12,
Seven unit of B3, B4 have more than two cell failures, the most whole equipment fault；If A3～A12,13 unit of B2～B4
In have more than three cell failures, the most whole equipment fault；
3. procedure above iteration 104Secondary, equipment fault number of times and 104Ratio be unreliable degree.
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108170892A (en) * | 2017-11-30 | 2018-06-15 | 中国航空综合技术研究所 | A kind of fault modes and effect analysis method that emulation is deduced based on accident dynamic |
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| CN101655882A (en) * | 2009-07-24 | 2010-02-24 | 上海宏力半导体制造有限公司 | Modelling method based on worst condition of statistic model |
| CN101706831A (en) * | 2009-06-12 | 2010-05-12 | 上海宏力半导体制造有限公司 | Circuit tolerance measure method in field of semiconductor design simulation |
| US20130173233A1 (en) * | 2011-11-18 | 2013-07-04 | Searete Llc | Enhanced Neutronics Systems |
| CN104239687A (en) * | 2014-08-13 | 2014-12-24 | 中国航天标准化研究所 | Reliability modeling and evaluation method based on aerospace product signal transmission path |
| CN104750932A (en) * | 2015-04-01 | 2015-07-01 | 电子科技大学 | Structural reliability analysis method based on agent model under condition of hybrid uncertainty |
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Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101706831A (en) * | 2009-06-12 | 2010-05-12 | 上海宏力半导体制造有限公司 | Circuit tolerance measure method in field of semiconductor design simulation |
| CN101655882A (en) * | 2009-07-24 | 2010-02-24 | 上海宏力半导体制造有限公司 | Modelling method based on worst condition of statistic model |
| US20130173233A1 (en) * | 2011-11-18 | 2013-07-04 | Searete Llc | Enhanced Neutronics Systems |
| CN104239687A (en) * | 2014-08-13 | 2014-12-24 | 中国航天标准化研究所 | Reliability modeling and evaluation method based on aerospace product signal transmission path |
| CN104750932A (en) * | 2015-04-01 | 2015-07-01 | 电子科技大学 | Structural reliability analysis method based on agent model under condition of hybrid uncertainty |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108170892A (en) * | 2017-11-30 | 2018-06-15 | 中国航空综合技术研究所 | A kind of fault modes and effect analysis method that emulation is deduced based on accident dynamic |
| CN108170892B (en) * | 2017-11-30 | 2021-07-16 | 中国航空综合技术研究所 | Fault mode and influence analysis method based on accident dynamic deduction simulation |
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