CN106018978B - A method of emf probe micro-disturbance is studied by changing power of radiation source - Google Patents

Abstract

The present invention is a method for studying the micro-disturbance of electromagnetic field probes by changing the power of the radiation source. 1: Obtain the electromagnetic field probe to test the electromagnetic field intensity matrix F _i under different radiation _powers of the radiation source; Simulation of the electromagnetic field distribution on the network with a probe, and obtain the simulated electromagnetic field intensity matrix with a probe 3: Compare matrix F _i and Determine the simulation model. 4: Use the simulation software to simulate the electromagnetic field distribution of the radiation source on the observation plane P _z without a probe, and obtain the simulated electromagnetic field intensity matrix without a probe 5: Contrast matrix and The difference between the two groups of electromagnetic field strength comparison is an important basis for correcting the test data. The data obtained by the invention can correct the data of the electromagnetic field probe test in engineering, improve the reliability of the electromagnetic field probe test result, ensure the modeling accuracy in the simulation process, and ensure that the result data is only affected by whether the radiation power of the radiation source is different.

Description

A Method of Studying Micro-perturbation of Electromagnetic Field Probe by Changing Radiation Source Power

【Technical field】

The invention relates to a method for researching the micro-disturbance of an electromagnetic field probe, in particular to a method for studying the micro-disturbance of an electromagnetic field probe by changing the power of a radiation source. Different power produces different micro-perturbations.

【Background technique】

With the rapid development of science and technology, the wide application of large-scale integrated circuits and the increasing operating frequency of circuits, every module and even every section of wiring in electrical equipment may be a source of electromagnetic interference. Electromagnetic interference not only affects the normal operation of the system, but also may cause serious accidents in severe cases. In the process of system-level electromagnetic compatibility design, the electromagnetic field probe is often used to measure the electromagnetic field intensity radiated by the equipment under test to verify the indicators.

Traditionally, the disturbance of the electromagnetic field distribution radiated by the device under test due to the metal structure of the probe is often ignored. The field distribution measured by the probe is not the actual field distribution value, which is an important factor affecting the use effect of the probe. Under different radiation power conditions, the electromagnetic field distribution of the radiation source changes differently when it is disturbed by the electromagnetic field probe. When using the probe to test the field strength data, the disturbance within the allowable error range can be ignored, and other disturbances that cannot be ignored need to be corrected. The data measured by the electromagnetic field probe are corrected.

【Content of invention】

In order to correct the measurement deviation caused by the perturbation produced by the electromagnetic field probe on the electromagnetic field distribution of the device under test, the invention proposes a method for studying the perturbation property of the electromagnetic field probe by changing the power of the radiation source.

A kind of method of the present invention researches the micro-perturbation property of electromagnetic field probe by changing radiation source power, comprises the following steps:

The first step: obtain the electromagnetic field probe to test the electromagnetic field strength matrix F _i ;

Set different radiation powers of the radiation source, randomly select M observation points on the observation plane P _z for measurement, and the measured electromagnetic field radiation intensity is represented by matrix F _i (i=1,2,…) in sequence, where F _i represents The field intensity matrix of the radiation source measured by the probe under the i radiation power, the matrix has 1×M elements.

The second step: obtain the simulated electromagnetic field strength matrix F _i ^eh1 in the case of a probe;

Use the simulation software to simulate the electromagnetic field distribution of the radiation source on the observation plane P _z with a probe. The position and selection order of the observation points are consistent with the position and selection order of the observation points in the first step, and the radiation intensity matrix is obtained F _i ^eh1 , where the superscript eh1 represents the simulation results with a probe, and the subscript i represents different radiation powers of the radiation source. This matrix has 1×M elements.

The third step: compare the matrices F _i and F _i ^eh1 ;

By comparing F _i and F _i ^eh1 to judge the fitting degree of simulation modeling, determine the simulation model.

Step 4: Obtain the simulated electromagnetic field strength matrix F _i ^eh0 without a probe;

Use the simulation software to simulate the electromagnetic field distribution of the radiation source on the observation plane P _z without a probe. The position and selection order of the observation points are consistent with the position and selection order of the observation points in the first step, and the radiation intensity matrix is obtained F _i ^eh0 , where the superscript eh0 represents the simulation results without a probe, and the subscript i represents different radiation powers of the radiation source. This matrix has 1×M elements.

The fifth step: compare the matrices F _i ^eh1 and F _i ^eh0 ;

By comparing F _i ^eh1 and F _i ^eh0 , the electromagnetic field distribution of the radiation source under the i radiation power can be obtained due to the perturbation caused by the introduction of the electromagnetic field probe. The difference between the two groups of electromagnetic field strength comparisons is to correct the test data Important reference.

To sum up, the disturbance introduced by the probe is different for the radiation source under different radiation powers, which may make the test value larger than the real value, and may make the test value smaller than the real value. By comparing the micro-disturbance of the electromagnetic field distribution generated by the radiation source under different radiation power conditions, this is a strong support for correcting the probe test data in practical engineering applications.

The present invention is a method for studying the micro-disturbance of electromagnetic field probes by changing the radiation source power, and its advantages are:

(1) Traditionally, the use of electromagnetic field probes for testing often ignores the perturbation produced by the probes on the electromagnetic field distribution of the radiation source, resulting in deviations between test data and real data, and this deviation may cause inestimable consequences. The invention provides a method for researching the micro-disturbance of the probe, and the obtained data can be used to correct the data of the electromagnetic field probe test in engineering, which obviously improves the reliability of the test result of the electromagnetic field probe.

(2) By comparing the two sets of measured and simulated data, the accuracy of modeling in the simulation process is ensured. The comparison of the simulation results with and without the probe satisfies the scientific control variable method, which ensures that the result data is only affected by whether the radiation power of the radiation source is different.

【Description of drawings】

Figure 1 is a structural diagram of the electromagnetic field probe testing the electromagnetic field distribution of the radiation source.

FIG. 1A is a structural diagram of simulating the electromagnetic field distribution of a radiation source in the case of a probe.

FIG. 1B is a structural diagram of simulating electromagnetic field distribution of a radiation source without a probe.

Figure 2 shows the perturbation introduced by the electric field probe with different radiation power.

Figure 2A is the perturbation introduced by the magnetic field probe with different radiation power.

Fig. 3 is a flow chart of researching electromagnetic field micro-perturbation in the present invention.

【Detailed ways】

The present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments.

The present invention is a method for studying the micro-disturbance of an electromagnetic field probe by changing the power of a radiation source. The equipment used is the electromagnetic field distribution test platform shown in Figure 1, which includes a computer, a probe fixture, an electromagnetic field probe, a radiation source and a spectrum analyzer. The probe fixture is used to clamp the electromagnetic field probe to ensure the precision and accuracy of the electromagnetic field probe to measure the field distribution data of the radiation source. The electromagnetic field probe, spectrum analyzer and computer are connected to ensure the normal operation of the system.

1. The electromagnetic field probe is used to obtain the electromagnetic field intensity distribution information of the radiation source.

2. The spectrum analyzer is used to display and store the electromagnetic field strength information obtained by the probe.

3. The computer is used to process and calculate the electromagnetic field strength information stored by the spectrum analyzer.

The present invention is a method for studying the micro-disturbance of an electromagnetic field probe by changing the radiation source power, and the specific steps are as follows:

The first step: obtain the electromagnetic field probe to test the electromagnetic field strength matrix F _i ;

Randomly select M observation points on the observation plane P _z for measurement, where the observation plane P _z is a plane that is a distance z above the radiation source. The position coordinates of the observation points are represented by (x, y, z) _m , and the subscript m (m=1, 2,..., M) indicates the order in which the observation points are tested. By controlling the probe fixture so that the probe is located at different observation points for measurement, the measured electromagnetic field radiation intensity is represented by a matrix F _i (i=1,2,...) in order, where F _i represents the radiation source under the i radiation power condition Below is the field strength matrix measured by the probe, which has 1×M elements. Radiation sources with different radiation powers correspond to different subscripts i, and the first type of radiation power corresponds to subscript i=1.

The second step: obtain the simulated electromagnetic field strength matrix F _i ^eh1 in the case of a probe;

See Figure 1A for a simulation structure with a probe, including a radiation source and an electromagnetic field probe. Set the electromagnetic field probe according to the selection order in the first step and the observation point (x, y, z) _m , obtain the strong field information at the observation point with the probe, and obtain the matrix F _i ^eh1 , for radiation sources with different radiation power , corresponding to different matrices F _i ^eh1 .

The third step: compare the matrices F _i and F _i ^eh1 ;

Group the field strength matrices obtained in the first step and the second step according to the subscript i, and compare the same subscript as a group, and obtain the fitting degree by comparing the field strength F _i and F _i ^eh1 of the observation point, use ( 1-|F _i (n,1)-F _i ^eh1 (n,1)|/|F _i (n,1)|)×100% indicates the degree of fit, if the inequality |F _i (n,1) is satisfied -F _i ^eh1 (n,1)|/|F _i (n,1)|≤0.05 means that the modeling is correct and the result is credible. Otherwise, it is necessary to re-model the simulation and repeat the second step until the inequality is satisfied. Wherein F _i (n, 1) represents the nth element in the matrix F _i , F _i ^eh1 (n, 1) represents the nth element in the matrix F _i ^eh1 , satisfying n=1, 2, . . . , M. In the full text |·| means to take the absolute value of ·.

Step 4: Obtain the simulated electromagnetic field strength matrix F _i ^eh0 without a probe;

Refer to the simulation structure with a probe shown in Figure 1B, including a radiation source and an electromagnetic field probe, where the modeling model is consistent with the model in the second step. The strong field information at the observation point (x, y, z) _m is simulated without a probe, and the matrix F _i ^eh0 is obtained. For radiation sources with different radiation powers, different matrices F _i ^eh1 are corresponding.

The fifth step: compare the matrices F _i ^eh1 and F _i ^eh0 ;

Group the field strength matrices obtained in the second step and the fourth step according to the subscript i, and compare them with the same subscript as a group. Each element in the matrix D _i =F _i ^eh1 -F _i ^eh0 is the disturbance of the field distribution caused by the introduction of the probe, and the D _i is recorded and stored, and the test data of the electromagnetic field probe is tested when the i-th radiation power is tested Make corrections.

Example

Set the radiation source as a 50Ω microstrip line with an operating frequency of 1.0GHz, randomly select 3 observation points on the observation plane 1mm away from the radiation source plane, and their coordinates are (-1,0,1) ₁ , (0, 0,1) ₂ and (1,0,1) ₃ , the radiation power of the radiation source is set to 0.1mW, 1mW, 1W respectively. Use electric field probes and magnetic field probes to measure the electric field strength and magnetic field strength one by one, use simulation software to simulate different operating frequencies and probes, and compare the degree of fitting. Use simulation software to simulate different operating frequencies and without probes. See Figure 2 and Figure 2A for the micro-disturbance of the radiation source due to the introduction of electric field probes and magnetic field probes under different radiation power conditions. The numerical results are shown in Table 1. shown.

Table 1 Characteristics of microstrip line source perturbed by electric field and magnetic field probes under different radiation powers

According to the numerical results, it can be seen that the degree of perturbation introduced by the microstrip line source due to the electric field and magnetic field probes is different under different radiation power conditions, and the change of the radiation power satisfies certain rules. In practical applications, different probes should be used. Response fixes.

Claims (1)

1. a kind of method for studying emf probe micro-disturbance by changing power of radiation source, be characterized in that: this method includes Following steps:

Step 1: obtaining emf probe tests electromagnetic field intensity matrix F_i:

The different radiant power of radiation source is set, in viewing plane P_zOn randomly select M point of observation and measure, measurement obtains Electromagnetic field radiation intensity is according to sequencing matrix F_i(i=1,2 ...) is indicated, wherein F_iIndicate that radiation source is radiated at i-th kind The field intensity matrix measured under power by probe, the matrix have 1 × M element；

Step 2: acquisition emulates electromagnetic field intensity matrix F in the case of having probe_i ^eh1:

Using simulation software to radiation source in viewing plane P_zOn magnetic distribution have the emulation in the case of probe, observation The position of point of observation and selecting sequence are consistent in the position of point and selecting sequence and the first step, obtain radiation intensity matrix F_i ^eh1, wherein subscript eh1 indicates that the simulation result in the case of probe, subscript i indicate the different radiant power of radiation source, the square Battle array has 1 × M element；

Step 3: comparison matrix F_iAnd F_i ^eh1:

By comparing F_iAnd F_i ^eh1The fitting degree for judge simulation modeling, determines simulation model；

Step 4: obtaining without emulation electromagnetic field intensity matrix F in the case of probe_i ^eh0:

Using simulation software to radiation source in viewing plane P_zOn magnetic distribution carry out the observation without the emulation in the case of probe The position and selecting sequence of point are consistent with the position of point of observation in the first step and selecting sequence, obtain radiation intensity matrix F_i ^eh0, wherein subscript eh0 indicates that the simulation result in the case of no probe, subscript i indicate the different radiant power of radiation source, the square Battle array has 1 × M element；

Step 5: comparison matrix F_i ^eh1And F_i ^eh0:

By comparing F_i ^eh1And F_i ^eh0Magnetic distribution of the available radiation source under i-th kind of radiant power is visited due to electromagnetic field The introducing of head and the perturbation that generates, the difference of two groups of electromagnetic field intensities comparison is the important evidence being modified to test data.