CN106018978B - A method of emf probe micro-disturbance is studied by changing power of radiation source - Google Patents

A method of emf probe micro-disturbance is studied by changing power of radiation source Download PDF

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CN106018978B
CN106018978B CN201610537770.9A CN201610537770A CN106018978B CN 106018978 B CN106018978 B CN 106018978B CN 201610537770 A CN201610537770 A CN 201610537770A CN 106018978 B CN106018978 B CN 106018978B
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probe
radiation source
matrix
electromagnetic field
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CN106018978A (en
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阎照文
刘伟
赵文静
谢树果
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Beihang University
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Beihang University
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/0807—Measuring electromagnetic field characteristics characterised by the application
    • G01R29/0814—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/02—Testing or calibrating of apparatus covered by the other groups of this subclass of auxiliary devices, e.g. of instrument transformers according to prescribed transformation ratio, phase angle, or wattage rating

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Measuring Magnetic Variables (AREA)

Abstract

A kind of method for studying emf probe micro-disturbance by changing power of radiation source of the present invention, 1: obtaining emf probe under the different radiant power of radiation source and test electromagnetic field intensity matrix Fi；2: using simulation software to radiation source in viewing plane PzOn magnetic distribution have the emulation in the case of probe, acquisition to have probe in the case of emulate electromagnetic field intensity matrix3: comparison matrix FiWithDetermine simulation model.4: using simulation software to radiation source in viewing plane PzOn magnetic distribution carry out without the emulation in the case of probe, obtain without emulating electromagnetic field intensity matrix in the case of probe5: comparison matrixWithThe difference of two groups of electromagnetic field intensities comparison is the important evidence being modified to test data.The data that the data that the present invention obtains can test emf probe in engineering be modified, and improve emf probe test result confidence level, guarantee to model accuracy in simulation process, guarantee that result data is only influenced by whether radiation source radiant power is different.

Description

A method of emf probe micro-disturbance is studied by changing power of radiation source
[technical field]
The present invention relates to the methods of a kind of pair of emf probe micro-disturbance Journal of Sex Research, refer in particular to a kind of by changing radiation The method of source power research emf probe micro-disturbance specifically studies emf probe in application process due to spoke It penetrates the radiant power difference in source and then generates different micro-disturbances.
[background technique]
With the rapid development of science and technology, the working frequency of the extensive use of large scale integrated circuit and circuit is increasingly Height, each of electrical equipment module even each section of cabling all may be the source for generating electromagnetic interference.Electromagnetic interference is not only The normal work of influence system, and may cause serious accident in severe cases.In system-level EMC Design In the process to index verified when be often used the electromagnetic field intensity that emf probe radiates equipment under test and measure.
It traditionally often has ignored the metal structure due to probe and the magnetic distribution of equipment under test radiation is caused to disturb Dynamic, the field distribution measured of popping one's head in not is actual field distribution value, this is an important factor for influencing probe using effect.In difference Radiant power under the conditions of, in the disturbance by emf probe radiation source magnetic distribution occur variation be different, It can ignore using disturbance of the probe test field strength data in allowable range of error, other cannot ignore disturbance and then need pair The data that emf probe measures are modified.
[summary of the invention]
In order to correct measured deviation caused by the perturbation generated due to emf probe to equipment under test magnetic distribution, The present invention proposes a kind of method for studying emf probe micro-disturbance by changing power of radiation source.
A kind of method for studying emf probe micro-disturbance by changing power of radiation source of the invention, includes following Step:
Step 1: obtaining emf probe tests electromagnetic field intensity matrix Fi；
The different radiant power of radiation source is set, in viewing plane PzOn randomly select M point of observation and measure, measure Electromagnetic field radiation intensity is obtained according to sequencing matrix Fi(i=1,2 ...) is indicated, wherein FiIndicate radiation source at i-th kind The field intensity matrix measured under radiant power by probe, the matrix have 1 × M element.
Step 2: acquisition emulates electromagnetic field intensity matrix F in the case of having probei eh1；
Using simulation software to radiation source in viewing plane PzOn magnetic distribution have the emulation in the case of probe, The position of point of observation and selecting sequence are consistent in the position of point of observation and selecting sequence and the first step, obtain radiation intensity square Battle array Fi eh1, wherein subscript eh1 indicates that the simulation result in the case of probe, subscript i indicate the different radiant power of radiation source, should Matrix has 1 × M element.
Step 3: comparison matrix FiAnd Fi eh1；
By comparing FiAnd Fi eh1The fitting degree for judge simulation modeling, determines simulation model.
Step 4: obtaining without emulation electromagnetic field intensity matrix F in the case of probei eh0；
Using simulation software to radiation source in viewing plane PzOn magnetic distribution carry out without the emulation in the case of probe, The position of point of observation and selecting sequence are consistent with the position of point of observation in the first step and selecting sequence, obtain radiation intensity square Battle array Fi eh0, wherein subscript eh0 indicates that the simulation result in the case of no probe, subscript i indicate the different radiant power of radiation source, should Matrix has 1 × M element.
Step 5: comparison matrix Fi eh1And Fi eh0；
By to comparison Fi eh1And Fi eh0Magnetic distribution of the available radiation source under i-th kind of radiant power is due to electricity The introducing of magnet field probe and the perturbation generated, the difference of two groups of electromagnetic field intensities comparison be test data is modified it is important Foundation.
To sum up, the disturbance of introducing of popping one's head under different radiant powers for radiation source is different, and may to test Value is bigger than normal than true value, and test value may be made less than normal than true value.It is produced by radiation source under the conditions of comparing different radiant powers Raw magnetic distribution micro-disturbance, this is the powerful support being modified in practical engineering applications to probe test data.
A kind of method for studying emf probe micro-disturbance by changing power of radiation source of the present invention, the advantage is that:
(1) the magnetic distribution generation for often ignoring probe to radiation source is tested in tradition using emf probe Perturbation so that there are deviations for test data and truthful data, and this deviation may cause the consequence for being difficult to estimate.The present invention A kind of method that the micro-disturbance to probe is studied is provided, obtained data can test emf probe in engineering Data be modified, hence it is evident that improve the confidence level of emf probe test result.
(2) by comparing using two groups of data of actual measurement and emulation, it ensure that the accuracy modeled in simulation process.Benefit With having probe and comparing the scientific control variate method of satisfaction without simulation result when popping one's head in, it ensure that result data only by spoke Penetrate the whether different influence of the radiant power in source.
[Detailed description of the invention]
Fig. 1 is the structure chart of emf probe testing radiation source magnetic distribution.
Figure 1A is the structure chart that emulation has radiation source magnetic distribution in the case of probe.
Figure 1B is the structure chart of radiation source magnetic distribution in the case of emulating no probe.
Fig. 2 is the perturbation that electric field probe is introduced with radiant power difference.
Fig. 2A is the perturbation that magnet field probe is introduced with radiant power difference.
Fig. 3 is present invention research electromagnetic field micro-disturbance flow chart.
[specific embodiment]
Below in conjunction with drawings and examples, the present invention is described in further detail.
A kind of method for studying emf probe micro-disturbance by changing power of radiation source of the present invention, the equipment of application Magnetic distribution test platform shown in Figure 1, including computer, probe gripper, emf probe, radiation source and frequency Spectrum analysis instrument.Probe gripper guarantees the precision of emf probe measurement radiation source field distribution data for clamping emf probe And accuracy.Emf probe, spectrum analyzer are connected with computer, in order that guaranteeing the normal work of system.
1. the electromagnetic field intensity distributed intelligence that emf probe is used to obtain radiation source.
2. spectrum analyzer is used to that the electromagnetic field intensity information that probe obtains to be shown and be stored.
3. computer is used for the electromagnetic field intensity information handled and operation spectrum analyzer is stored.
A kind of method for studying emf probe micro-disturbance by changing power of radiation source of the present invention, specific steps are such as Under:
Step 1: obtaining emf probe tests electromagnetic field intensity matrix Fi；
In viewing plane PzOn randomly select M point of observation and measure, wherein viewing plane PzIt is above radiation source distance For the plane of z.Point of observation position coordinates use (x, y, z)mIt indicates, subscript m (m=1,2 ..., M) indicates the tested elder generation of point of observation Sequence afterwards.By controlling probe gripper probe is measured positioned at different points of observation, it is strong that measurement obtains electromagnetic field radiation Degree is according to sequencing matrix Fi(i=1,2 ...) is indicated, wherein FiIndicate radiation source quilt under the conditions of i-th kind of radiant power The field intensity matrix that probe measures, the matrix have 1 × M element.Be arranged different radiant powers radiation source correspond to it is different under I is marked, the first radiant power corresponds to subscript i=1.
Step 2: acquisition emulates electromagnetic field intensity matrix F in the case of having probei eh1；
There are probe simulation architecture, including a radiation source and an emf probe referring to shown in figure 1A.By electromagnetic field Probe is according to the selecting sequence and point of observation (x, y, z) in the first stepmIt is configured, obtaining has the strong of probe situation given viewpoint Field information, obtains matrix Fi eh1, for the radiation source of different radiant powers, corresponding different matrix Fi eh1。
Step 3: comparison matrix FiAnd Fi eh1；
Field intensity matrix obtained in the first step and second step is grouped according to subscript i, same index is one group It compares, passes through the field strength F of paired observation pointiAnd Fi eh1Fitting degree is obtained, with (1- | Fi(n,1)-Fi eh1(n,1)|/|Fi (n, 1) |) × 100% expression degree of fitting, if meeting inequality | Fi(n,1)-Fi eh1(n,1)|/|Fi(n, 1) |≤0.05 indicates Modeling is correct, credible result.It is on the contrary then will modeling and simulating again, repeat second step until meeting the inequality.Wherein Fi(n,1) Representing matrix FiIn nth elements, Fi eh1(n, 1) representing matrix Fi eh1In nth elements, meet n=1,2 ..., M.Entirely In text | | it indicates to taking absolute value.
Step 4: obtaining without emulation electromagnetic field intensity matrix F in the case of probei eh0；
Referring to having probe simulation architecture, including a radiation source and an emf probe shown in Figure 1B, wherein modeling Model is consistent with the model in second step.Emulation is without given viewpoint in the case of probe (x, y, z)mHigh field information, obtain Matrix Fi eh0, for the radiation source under different radiant powers, corresponding different matrix Fi eh1。
Step 5: comparison matrix Fi eh1And Fi eh0；
Field intensity matrix obtained in second step and the 4th step is grouped according to subscript i, same index is one group It compares.Matrix Di=Fi eh1-Fi eh0Each of element be all introducing as probe and caused by field distribution disturb It is dynamic, by DiRecord storage is modified emf probe when testing i-th kind of radiant power to test data.
Embodiment
Setting radiation source is 50 Ω microstrip lines, working frequency 1.0GHz, in the observation at radiant source plane 1mm Plane randomly selects 3 points of observation, and coordinate is respectively (- 1,0,1)1、(0,0,1)2(1,0,1)3, the spoke of radiation source is set Penetrating power is respectively 0.1mW, 1mW, 1W.Electric field strength and magnetic field strength are measured one by one using electric field probe and magnet field probe, benefit With simulation software to different operating frequency and have probe in the case of emulate, compare fitting degree.Using simulation software to not It is radiation source under the conditions of different radiant powers with Fig. 2A referring to fig. 2 with working frequency and without being emulated in the case of probe Due to electric field probe and magnet field probe introducing and the micro-disturbance that generates, numerical result are as shown in table 1.
Characteristic of the 1 micro-strip line source of table under different radiant powers with electric and magnetic fields probe disturbance
According to numerical result it can be seen that micro-strip line source is due to electric and magnetic fields probe introducing in the case of different radiant powers Perturbation level be different, will be for difference in practical application and as the variation of radiant power meets certain rule The amendment that is responded of probe.

Claims (1)

1. a kind of method for studying emf probe micro-disturbance by changing power of radiation source, be characterized in that: this method includes Following steps:
Step 1: obtaining emf probe tests electromagnetic field intensity matrix Fi:
The different radiant power of radiation source is set, in viewing plane PzOn randomly select M point of observation and measure, measurement obtains Electromagnetic field radiation intensity is according to sequencing matrix Fi(i=1,2 ...) is indicated, wherein FiIndicate that radiation source is radiated at i-th kind The field intensity matrix measured under power by probe, the matrix have 1 × M element；
Step 2: acquisition emulates electromagnetic field intensity matrix F in the case of having probei eh1:
Using simulation software to radiation source in viewing plane PzOn magnetic distribution have the emulation in the case of probe, observation The position of point of observation and selecting sequence are consistent in the position of point and selecting sequence and the first step, obtain radiation intensity matrix Fi eh1, wherein subscript eh1 indicates that the simulation result in the case of probe, subscript i indicate the different radiant power of radiation source, the square Battle array has 1 × M element；
Step 3: comparison matrix FiAnd Fi eh1:
By comparing FiAnd Fi eh1The fitting degree for judge simulation modeling, determines simulation model；
Step 4: obtaining without emulation electromagnetic field intensity matrix F in the case of probei eh0:
Using simulation software to radiation source in viewing plane PzOn magnetic distribution carry out the observation without the emulation in the case of probe The position and selecting sequence of point are consistent with the position of point of observation in the first step and selecting sequence, obtain radiation intensity matrix Fi eh0, wherein subscript eh0 indicates that the simulation result in the case of no probe, subscript i indicate the different radiant power of radiation source, the square Battle array has 1 × M element；
Step 5: comparison matrix Fi eh1And Fi eh0:
By comparing Fi eh1And Fi eh0Magnetic distribution of the available radiation source under i-th kind of radiant power is visited due to electromagnetic field The introducing of head and the perturbation that generates, the difference of two groups of electromagnetic field intensities comparison is the important evidence being modified to test data.
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Citations (5)

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CN104569622A (en) * 2014-12-24 2015-04-29 复旦大学 Efficient microwave polarization detection device based on photonic spin Hall effect
CN105527598A (en) * 2015-12-17 2016-04-27 北京无线电计量测试研究所 Field sensor calibration system and method
JP5939887B2 (en) * 2012-05-25 2016-06-22 三菱電機株式会社 Electromagnetic noise detector

Patent Citations (5)

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Publication number Priority date Publication date Assignee Title
JP2001194435A (en) * 2000-01-07 2001-07-19 Canon Inc Magnetic field sensor and method, and apparatus for measurement of distribution of magnetic field and method, and apparatus for search of electromagnetic wave source and storage medium
JP5939887B2 (en) * 2012-05-25 2016-06-22 三菱電機株式会社 Electromagnetic noise detector
CN103135086A (en) * 2013-02-20 2013-06-05 华北电力大学 Calibration device and calibration and verification method for direct current electric field measuring apparatus
CN104569622A (en) * 2014-12-24 2015-04-29 复旦大学 Efficient microwave polarization detection device based on photonic spin Hall effect
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