CN106018978B - A method of emf probe micro-disturbance is studied by changing power of radiation source - Google Patents
A method of emf probe micro-disturbance is studied by changing power of radiation source Download PDFInfo
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Abstract
本发明一种通过改变辐射源功率研究电磁场探头微扰动性的方法,1:获取辐射源不同的辐射功率下电磁场探头测试电磁场强度矩阵Fi;2:利用仿真软件对辐射源在观察平面Pz上的电磁场分布进行有探头情况下的仿真,获取有探头情况下仿真电磁场强度矩阵3:对比矩阵Fi和确定仿真模型。4:利用仿真软件对辐射源在观察平面Pz上的电磁场分布进行无探头情况下的仿真,获取无探头情况下仿真电磁场强度矩阵5:对比矩阵和两组电磁场强度对比的差值是对测试数据进行修正的重要依据。本发明得到的数据可对工程中电磁场探头测试的数据进行修正,提高电磁场探头测试结果可信度,保证仿真过程中建模准确度,保证结果数据只受到辐射源辐射功率是否不同的影响。
The present invention is a method for studying the micro-disturbance of electromagnetic field probes by changing the power of the radiation source. 1: Obtain the electromagnetic field probe to test the electromagnetic field intensity matrix F i under different radiation powers of the radiation source; Simulation of the electromagnetic field distribution on the network with a probe, and obtain the simulated electromagnetic field intensity matrix with a probe 3: Compare matrix F i and Determine the simulation model. 4: Use the simulation software to simulate the electromagnetic field distribution of the radiation source on the observation plane P z without a probe, and obtain the simulated electromagnetic field intensity matrix without a probe 5: Contrast matrix and The difference between the two groups of electromagnetic field strength comparison is an important basis for correcting the test data. The data obtained by the invention can correct the data of the electromagnetic field probe test in engineering, improve the reliability of the electromagnetic field probe test result, ensure the modeling accuracy in the simulation process, and ensure that the result data is only affected by whether the radiation power of the radiation source is different.
Description
【技术领域】【Technical field】
本发明涉及一种对电磁场探头微扰动性研究的方法,尤其是指一种通过改变辐射源功率研究电磁场探头微扰动性的方法,具体来说是研究电磁场探头在应用过程中由于辐射源的辐射功率不同进而产生不同的微扰动性。The invention relates to a method for researching the micro-disturbance of an electromagnetic field probe, in particular to a method for studying the micro-disturbance of an electromagnetic field probe by changing the power of a radiation source. Different power produces different micro-perturbations.
【背景技术】【Background technique】
随着科学技术的飞速发展、大规模集成电路的广泛应用和电路的工作频率越来越高,电气设备中的每一个模块甚至每一段走线都可能是产生电磁干扰的源。电磁干扰不仅影响系统的正常工作,而且在严重的情况下可能造成严重的事故。在系统级电磁兼容设计过程中对指标进行验证的时常使用电磁场探头对被测设备辐射的电磁场强度进行测量。With the rapid development of science and technology, the wide application of large-scale integrated circuits and the increasing operating frequency of circuits, every module and even every section of wiring in electrical equipment may be a source of electromagnetic interference. Electromagnetic interference not only affects the normal operation of the system, but also may cause serious accidents in severe cases. In the process of system-level electromagnetic compatibility design, the electromagnetic field probe is often used to measure the electromagnetic field intensity radiated by the equipment under test to verify the indicators.
传统上往往忽略了由于探头的金属结构而对被测设备辐射的电磁场分布造成扰动,探头测得的场分布并不是实际的场分布值,这是影响探头使用效果的重要因素。在不同的辐射功率条件下,在受到电磁场探头的扰动时辐射源电磁场分布发生的变化是不同的,在使用探头测试场强数据在误差允许范围内的扰动可以忽略,其他不能忽略扰动则需要对电磁场探头测得的数据进行修正。Traditionally, the disturbance of the electromagnetic field distribution radiated by the device under test due to the metal structure of the probe is often ignored. The field distribution measured by the probe is not the actual field distribution value, which is an important factor affecting the use effect of the probe. Under different radiation power conditions, the electromagnetic field distribution of the radiation source changes differently when it is disturbed by the electromagnetic field probe. When using the probe to test the field strength data, the disturbance within the allowable error range can be ignored, and other disturbances that cannot be ignored need to be corrected. The data measured by the electromagnetic field probe are corrected.
【发明内容】【Content of invention】
为了修正由于电磁场探头对被测设备电磁场分布产生的微扰而引起的测量偏差,本发明提出一种通过改变辐射源功率研究电磁场探头微扰动性的方法。In order to correct the measurement deviation caused by the perturbation produced by the electromagnetic field probe on the electromagnetic field distribution of the device under test, the invention proposes a method for studying the perturbation property of the electromagnetic field probe by changing the power of the radiation source.
本发明的一种通过改变辐射源功率研究电磁场探头微扰动性的方法,包括有以下步骤:A kind of method of the present invention researches the micro-perturbation property of electromagnetic field probe by changing radiation source power, comprises the following steps:
第一步:获取电磁场探头测试电磁场强度矩阵Fi;The first step: obtain the electromagnetic field probe to test the electromagnetic field strength matrix F i ;
设置辐射源不同的辐射功率,在观察平面Pz上随机选取M个观察点进行测量,测量得到电磁场辐射强度按照先后顺序用矩阵Fi(i=1,2,…)表示,其中Fi表示辐射源在第i种辐射功率下被探头测得的场强度矩阵,该矩阵有1×M个元素。Set different radiation powers of the radiation source, randomly select M observation points on the observation plane P z for measurement, and the measured electromagnetic field radiation intensity is represented by matrix F i (i=1,2,…) in sequence, where F i represents The field intensity matrix of the radiation source measured by the probe under the i radiation power, the matrix has 1×M elements.
第二步:获取有探头情况下仿真电磁场强度矩阵Fi eh1;The second step: obtain the simulated electromagnetic field strength matrix F i eh1 in the case of a probe;
利用仿真软件对辐射源在观察平面Pz上的电磁场分布进行有探头情况下的仿真,观察点的位置和选择顺序和第一步中观察点的位置和选择顺序是一致的,得到辐射强度矩阵Fi eh1,其中上标eh1表示有探头情况下的仿真结果,下标i表示辐射源不同的辐射功率,该矩阵有1×M个元素。Use the simulation software to simulate the electromagnetic field distribution of the radiation source on the observation plane P z with a probe. The position and selection order of the observation points are consistent with the position and selection order of the observation points in the first step, and the radiation intensity matrix is obtained F i eh1 , where the superscript eh1 represents the simulation results with a probe, and the subscript i represents different radiation powers of the radiation source. This matrix has 1×M elements.
第三步:对比矩阵Fi和Fi eh1;The third step: compare the matrices F i and F i eh1 ;
通过对比Fi和Fi eh1进行判断仿真建模的拟合程度,确定仿真模型。By comparing F i and F i eh1 to judge the fitting degree of simulation modeling, determine the simulation model.
第四步:获取无探头情况下仿真电磁场强度矩阵Fi eh0;Step 4: Obtain the simulated electromagnetic field strength matrix F i eh0 without a probe;
利用仿真软件对辐射源在观察平面Pz上的电磁场分布进行无探头情况下的仿真,观察点的位置和选择顺序与第一步中观察点的位置和选择顺序是一致的,得到辐射强度矩阵Fi eh0,其中上标eh0表示无探头情况下的仿真结果,下标i表示辐射源不同的辐射功率,该矩阵有1×M个元素。Use the simulation software to simulate the electromagnetic field distribution of the radiation source on the observation plane P z without a probe. The position and selection order of the observation points are consistent with the position and selection order of the observation points in the first step, and the radiation intensity matrix is obtained F i eh0 , where the superscript eh0 represents the simulation results without a probe, and the subscript i represents different radiation powers of the radiation source. This matrix has 1×M elements.
第五步:对比矩阵Fi eh1和Fi eh0;The fifth step: compare the matrices F i eh1 and F i eh0 ;
通过对比对Fi eh1和Fi eh0可以得到辐射源在第i种辐射功率下的电磁场分布由于电磁场探头的引入而产生的微扰,两组电磁场强度对比的差值是对测试数据进行修正的重要依据。By comparing F i eh1 and F i eh0 , the electromagnetic field distribution of the radiation source under the i radiation power can be obtained due to the perturbation caused by the introduction of the electromagnetic field probe. The difference between the two groups of electromagnetic field strength comparisons is to correct the test data Important reference.
综上,对于辐射源在不同的辐射功率下探头引入的扰动是不同的,可能使得测试值比真实值偏大,可能使得测试值比真实值偏小。通过对比不同辐射功率条件下辐射源产生的电磁场分布微扰动,这是在实际工程应用中对探头测试数据进行修正的有力支撑。To sum up, the disturbance introduced by the probe is different for the radiation source under different radiation powers, which may make the test value larger than the real value, and may make the test value smaller than the real value. By comparing the micro-disturbance of the electromagnetic field distribution generated by the radiation source under different radiation power conditions, this is a strong support for correcting the probe test data in practical engineering applications.
本发明一种通过改变辐射源功率研究电磁场探头微扰动性的方法,其优点在于:The present invention is a method for studying the micro-disturbance of electromagnetic field probes by changing the radiation source power, and its advantages are:
(1)传统中利用电磁场探头进行测试往往忽视了探头对辐射源的电磁场分布产生的微扰,使得测试数据和真实数据存在偏差,而这一偏差可能造成难以估计的后果。本发明提供了一种对探头的微扰动性进行研究的方法,得到的数据可以对工程中电磁场探头测试的数据进行修正,明显提高了电磁场探头测试结果的可信度。(1) Traditionally, the use of electromagnetic field probes for testing often ignores the perturbation produced by the probes on the electromagnetic field distribution of the radiation source, resulting in deviations between test data and real data, and this deviation may cause inestimable consequences. The invention provides a method for researching the micro-disturbance of the probe, and the obtained data can be used to correct the data of the electromagnetic field probe test in engineering, which obviously improves the reliability of the test result of the electromagnetic field probe.
(2)通过利用实测和仿真两组数据进行对比,保证了仿真过程中建模的准确度。利用有探头和无探头时的仿真结果进行对比满足科学控制变量法,保证了结果数据只受到辐射源的辐射功率是否不同的影响。(2) By comparing the two sets of measured and simulated data, the accuracy of modeling in the simulation process is ensured. The comparison of the simulation results with and without the probe satisfies the scientific control variable method, which ensures that the result data is only affected by whether the radiation power of the radiation source is different.
【附图说明】【Description of drawings】
图1是电磁场探头测试辐射源电磁场分布的结构图。Figure 1 is a structural diagram of the electromagnetic field probe testing the electromagnetic field distribution of the radiation source.
图1A是仿真有探头情况下辐射源电磁场分布的结构图。FIG. 1A is a structural diagram of simulating the electromagnetic field distribution of a radiation source in the case of a probe.
图1B是仿真无探头情况下辐射源电磁场分布的结构图。FIG. 1B is a structural diagram of simulating electromagnetic field distribution of a radiation source without a probe.
图2是电场探头随辐射功率不同引入的微扰。Figure 2 shows the perturbation introduced by the electric field probe with different radiation power.
图2A是磁场探头随辐射功率不同引入的微扰。Figure 2A is the perturbation introduced by the magnetic field probe with different radiation power.
图3是本发明研究电磁场微扰动性流程图。Fig. 3 is a flow chart of researching electromagnetic field micro-perturbation in the present invention.
【具体实施方式】【Detailed ways】
下面将结合附图和实施例对本发明做进一步的详细说明。The present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments.
本发明一种通过改变辐射源功率研究电磁场探头微扰动性的方法,其应用的设备参见图1所示的电磁场分布测试平台,其中包括计算机、探头夹具、电磁场探头、辐射源和频谱分析仪。探头夹具用于夹持电磁场探头,保证电磁场探头测量辐射源场分布数据的精度和准确度。电磁场探头、频谱分析仪和计算机相连接,为的是保证系统的正常工作。The present invention is a method for studying the micro-disturbance of an electromagnetic field probe by changing the power of a radiation source. The equipment used is the electromagnetic field distribution test platform shown in Figure 1, which includes a computer, a probe fixture, an electromagnetic field probe, a radiation source and a spectrum analyzer. The probe fixture is used to clamp the electromagnetic field probe to ensure the precision and accuracy of the electromagnetic field probe to measure the field distribution data of the radiation source. The electromagnetic field probe, spectrum analyzer and computer are connected to ensure the normal operation of the system.
1.电磁场探头用于获取辐射源的电磁场强度分布信息。1. The electromagnetic field probe is used to obtain the electromagnetic field intensity distribution information of the radiation source.
2.频谱分析仪用于将探头获取的电磁场强度信息进行显示和存储。2. The spectrum analyzer is used to display and store the electromagnetic field strength information obtained by the probe.
3.计算机用于处理和运算频谱分析仪所存储的电磁场强度信息。3. The computer is used to process and calculate the electromagnetic field strength information stored by the spectrum analyzer.
本发明一种通过改变辐射源功率研究电磁场探头微扰动性的方法,具体步骤如下:The present invention is a method for studying the micro-disturbance of an electromagnetic field probe by changing the radiation source power, and the specific steps are as follows:
第一步:获取电磁场探头测试电磁场强度矩阵Fi;The first step: obtain the electromagnetic field probe to test the electromagnetic field strength matrix F i ;
在观察平面Pz上随机选取M个观察点进行测量,其中观察平面Pz是高于辐射源距离为z的平面。观察点位置坐标用(x,y,z)m表示,下标m(m=1,2,…,M)表示观察点被测试的先后顺序。通过控制探头夹具使得探头位于不同的观察点进行测量,测量得到电磁场辐射强度按照先后顺序用矩阵Fi(i=1,2,…)表示,其中Fi表示辐射源在第i种辐射功率条件下被探头测得的场强度矩阵,该矩阵有1×M个元素。设置不同辐射功率的辐射源对应不同的下标i,第一种辐射功率对应下标i=1。Randomly select M observation points on the observation plane P z for measurement, where the observation plane P z is a plane that is a distance z above the radiation source. The position coordinates of the observation points are represented by (x, y, z) m , and the subscript m (m=1, 2,..., M) indicates the order in which the observation points are tested. By controlling the probe fixture so that the probe is located at different observation points for measurement, the measured electromagnetic field radiation intensity is represented by a matrix F i (i=1,2,...) in order, where F i represents the radiation source under the i radiation power condition Below is the field strength matrix measured by the probe, which has 1×M elements. Radiation sources with different radiation powers correspond to different subscripts i, and the first type of radiation power corresponds to subscript i=1.
第二步:获取有探头情况下仿真电磁场强度矩阵Fi eh1;The second step: obtain the simulated electromagnetic field strength matrix F i eh1 in the case of a probe;
参见图1A所示的有探头仿真结构,包括一个辐射源和一个电磁场探头。将电磁场探头按照第一步中的选择顺序和观察点(x,y,z)m进行设置,获取有探头情况观察点处的强场信息,得到矩阵Fi eh1,对于不同辐射功率的辐射源,对应不同的矩阵Fi eh1。See Figure 1A for a simulation structure with a probe, including a radiation source and an electromagnetic field probe. Set the electromagnetic field probe according to the selection order in the first step and the observation point (x, y, z) m , obtain the strong field information at the observation point with the probe, and obtain the matrix F i eh1 , for radiation sources with different radiation power , corresponding to different matrices F i eh1 .
第三步:对比矩阵Fi和Fi eh1;The third step: compare the matrices F i and F i eh1 ;
将第一步和第二步中得到的场强度矩阵按照下标i进行分组,相同下标的为一组进行对比,通过对比观察点的场强Fi和Fi eh1得到拟合程度,用(1-|Fi(n,1)-Fi eh1(n,1)|/|Fi(n,1)|)×100%表示拟合度,如果满足不等式|Fi(n,1)-Fi eh1(n,1)|/|Fi(n,1)|≤0.05表示建模正确,结果可信。反之则要重新建模仿真,重复第二步直至满足该不等式。其中Fi(n,1)表示矩阵Fi中的第n个元素,Fi eh1(n,1)表示矩阵Fi eh1中的第n个元素,满足n=1,2,…,M。全文中|·|表示对·取绝对值。Group the field strength matrices obtained in the first step and the second step according to the subscript i, and compare the same subscript as a group, and obtain the fitting degree by comparing the field strength F i and F i eh1 of the observation point, use ( 1-|F i (n,1)-F i eh1 (n,1)|/|F i (n,1)|)×100% indicates the degree of fit, if the inequality |F i (n,1) is satisfied -F i eh1 (n,1)|/|F i (n,1)|≤0.05 means that the modeling is correct and the result is credible. Otherwise, it is necessary to re-model the simulation and repeat the second step until the inequality is satisfied. Wherein F i (n, 1) represents the nth element in the matrix F i , F i eh1 (n, 1) represents the nth element in the matrix F i eh1 , satisfying n=1, 2, . . . , M. In the full text |·| means to take the absolute value of ·.
第四步:获取无探头情况下仿真电磁场强度矩阵Fi eh0;Step 4: Obtain the simulated electromagnetic field strength matrix F i eh0 without a probe;
参见图1B所示的有探头仿真结构,包括一个辐射源和一个电磁场探头,其中建模模型与第二步中的模型是一致的。仿真无探头情况下观察点处(x,y,z)m的强场信息,得到矩阵Fi eh0,对于不同辐射功率下的辐射源,对应不同的矩阵Fi eh1。Refer to the simulation structure with a probe shown in Figure 1B, including a radiation source and an electromagnetic field probe, where the modeling model is consistent with the model in the second step. The strong field information at the observation point (x, y, z) m is simulated without a probe, and the matrix F i eh0 is obtained. For radiation sources with different radiation powers, different matrices F i eh1 are corresponding.
第五步:对比矩阵Fi eh1和Fi eh0;The fifth step: compare the matrices F i eh1 and F i eh0 ;
将第二步和第四步中得到的场强度矩阵按照下标i进行分组,相同下标的为一组进行对比。矩阵Di=Fi eh1-Fi eh0中的每一个元素都是由于探头的引入而造成的场分布的扰动,将Di记录存储,对电磁场探头在测试第i种辐射功率时对测试数据进行修正。Group the field strength matrices obtained in the second step and the fourth step according to the subscript i, and compare them with the same subscript as a group. Each element in the matrix D i =F i eh1 -F i eh0 is the disturbance of the field distribution caused by the introduction of the probe, and the D i is recorded and stored, and the test data of the electromagnetic field probe is tested when the i-th radiation power is tested Make corrections.
实施例Example
设置辐射源为50Ω微带线,其工作频率为1.0GHz,在距离辐射源平面1mm处的观察平面随机选取3个观察点,其坐标分别为(-1,0,1)1、(0,0,1)2和(1,0,1)3,设置辐射源的辐射功率分别为0.1mW,1mW,1W。利用电场探头和磁场探头逐一测量电场强度和磁场强度,利用仿真软件对不同工作频率和有探头情况下进行仿真,对比拟合程度。利用仿真软件对不同工作频率和没有探头情况下进行仿真,参见图2和图2A是在不同辐射功率条件下辐射源由于电场探头和磁场探头的引入而产生的微扰动,其数值结果如表1所示。Set the radiation source as a 50Ω microstrip line with an operating frequency of 1.0GHz, randomly select 3 observation points on the observation plane 1mm away from the radiation source plane, and their coordinates are (-1,0,1) 1 , (0, 0,1) 2 and (1,0,1) 3 , the radiation power of the radiation source is set to 0.1mW, 1mW, 1W respectively. Use electric field probes and magnetic field probes to measure the electric field strength and magnetic field strength one by one, use simulation software to simulate different operating frequencies and probes, and compare the degree of fitting. Use simulation software to simulate different operating frequencies and without probes. See Figure 2 and Figure 2A for the micro-disturbance of the radiation source due to the introduction of electric field probes and magnetic field probes under different radiation power conditions. The numerical results are shown in Table 1. shown.
表1微带线源在不同辐射功率下与电场和磁场探头扰动的特性Table 1 Characteristics of microstrip line source perturbed by electric field and magnetic field probes under different radiation powers
根据数值结果可以看出不同辐射功率情况下微带线源由于电场和磁场探头引入的微扰程度是不同的,并且随着辐射功率的变化满足一定的规律,实际应用中要针对不同的探头进行响应的修正。According to the numerical results, it can be seen that the degree of perturbation introduced by the microstrip line source due to the electric field and magnetic field probes is different under different radiation power conditions, and the change of the radiation power satisfies certain rules. In practical applications, different probes should be used. Response fixes.
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