CN105974180B - A kind of highly sensitive broadband monitoring current probe for conducted emission test - Google Patents
A kind of highly sensitive broadband monitoring current probe for conducted emission test Download PDFInfo
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- CN105974180B CN105974180B CN201610616903.1A CN201610616903A CN105974180B CN 105974180 B CN105974180 B CN 105974180B CN 201610616903 A CN201610616903 A CN 201610616903A CN 105974180 B CN105974180 B CN 105974180B
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- current probe
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0092—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring current only
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
Abstract
The invention discloses a kind of highly sensitive broadband monitoring current probes for conducted emission test, belong to electromagnetic conductive transmitting the field of test technology.Calculation method that the present invention is combined by equivalent circuit and electromagnetic field of high frequency, a kind of highly sensitive wideband current monitoring probe of development and design.Current probe of the invention uses new material as magnetic core according to equivalent circuit calculated result, and determines structure size according to electromagnetic-field simulation calculated result.Current probe of the invention has carried out test with commercialization probe and has compared, comparison result shows, current probe of the invention is in low-frequency range 20Hz-10kHz, current probe measurement sensitivity is higher than commercial probe 15dB or more, in high band 10kHz-500MHz, its transfer impedance can reach or be more than to arrive commercial probe measurement sensitivity index, and circuit probe performance of the invention meets the requirement of electromagnetic compatibility type conduction transmitting test.
Description
Technical field
The present invention relates to electromagnetic compatibility testing technical fields, specifically, being development and design one kind for conducted emission
The highly sensitive broadband monitoring current of test is popped one's head in.
Background technique
Test item conducted emission is one of core content of examination of electromagnetic compatibility test, and conduction transmitting test is generally divided into
It is sent out using the conducted emission voltage of linear impedance stabilization network test test item and using the conduction of current probe test test item
Radio stream two types.Current probe method of testing is by snapping into current probe on subject cable, and induction has signal to pass through
The electromagnetic field that cable bundle generates, the port voltage sensed using receiver receiving transducer, then test result is calculated, from
And obtain the current strength in subject cable.
Cable conducted emission current probe incude method of testing because its test method it is simple, to experimental enviroment condition require compared with
Low, increasingly by experimental test personnel attention.In recent years, there is researcher to propose and substitute linear resistance using current probe
The method of anti-stabilizing network test conducted emission voltage, this method have carried out further expansion to the application of current probe, have made
Current probe is in electromagnetic compatibility test field using more and more extensive.
The rule that current probe in electromagnetic compatibility test is used according to international wireless electricity administration committee CISPR-16-1
It is fixed, in conjunction with different majors class electromagnetic compatibility standard to the requirement of current probe, can analyze out, test conducted emission
Current probe, frequency of use are applied to 500MHz from 20Hz.
Currently, commercial current probe, in low frequency band, the factors such as the material used due to it and structure design are influenced, compared with
Its transfer impedance characteristic of low-frequency range is poor, especially broadband current probe, and compared with low-frequency range, transfer impedance is set close to test
Standby sensitivity limit, influences conduction transmitting test in the test result precision of low frequency.In response to this, it the present invention and has developed
A kind of Wideband current probe can significantly improve current probe in low frequency in low-frequency range transfer impedance with higher
The service performance and measurement sensitivity of section, also, meet measuring accuracy as defined in standard in high band characteristic, it is suitable for different frequencies
Section conducted emission testing requirement.
Summary of the invention
It is of the present invention the invention discloses a kind of highly sensitive broadband monitoring current probe for conducted emission test
Current probe in low-frequency range 20Hz-10kHz, current probe measurement sensitivity is higher than identical function commercialization and pops one's head in 15dB or more,
In high band 10kHz-500MHz, current probe measurement sensitivity can reach the index of similar commercial probe, be suitable for electromagnetism
Conduction current emission test in compatible test.
The present invention provides a kind of highly sensitive broadband monitoring current probe for conducted emission test, and specific steps are such as
Under:
Step 1: the making material of current probe is selected；
In order to improve current probe in the measurement sensitivity of low frequency 20Hz-10kHz, and take into account high frequency 10kHz-500MHz's
Measurement sensitivity characteristic selects magnetic conductivity to be much higher than magnetic core material of the iron-base ultramicro-crystal of commercial manganese-zinc ferrite as current probe
Material.
Step 2: the size and structure of current probe are provided；
After current probe magnetic core uses material, need to carry out calculating design to the overall structure of probe, using electromagnetism number of fields
Value calculating method carries out Modeling Calculation to current probe, optimizes the structure of current probe, obtain the optimized dimensions of current probe.
Current probe of the present invention is divided into five-layer structure, the outermost layer structure and innermost layer structure of current probe, such as Fig. 3
In (r2-r1And r6-r5) shown in, it is the outer shield shell and internal layer shield shell with a thickness of 1.5 millimeters -2.5 millimeters respectively；
Current probe shield shell uses high electrical conductivity materials, it is contemplated that and cost and economical and practical factor select brass or red copper preferable,
If cost allows, high-purity silver material is preferably selected；It is the magnetic core with a thickness of 8 millimeters -10 millimeters among current probe, such as
(r in Fig. 34-r3) shown in；Magnetic core uses iron-base ultramicro-crystal alloy material；Magnetic core is to being thick between current probe outer shield shell
The outer layer insulation material that degree is 4 millimeters -5 millimeters, such as (r in Fig. 35-r4) shown in；Magnetic core to current probe internal layer shield shell it
Between be primary insulation material with a thickness of 6 millimeters -8 millimeters, such as (r in Fig. 33-r2) shown in；Outer layer and primary insulation material all select
Select high resistivity material polytetrafluoroethylene (PTFE), perfluoroethylene or polypropylene material.The magnetic core width of current probe is 24 millimeter of -26 milli
Rice, such as H in Fig. 31It is shown；Outer layer insulation material width is 32 millimeters -36 millimeters, such as W in Fig. 31It is shown.Electric current of the present invention
Probe allows fabrication error within 5 percent.
Step 3: testing the current probe of production, the broadband character and sensory characteristic of verificating current probe；
According to the regulation of international standard ISO, test verifying carried out to current probe of the invention, and by electric current of the invention
Probe characteristic and the commercial current probe of same type compare, it was demonstrated that superiority of the invention.
For current probe in low-frequency range 20Hz-10kHz, current probe measurement sensitivity is higher than identical function commercialization probe 15dB
More than, in high band 10kHz-500MHz, current probe measurement sensitivity can reach the index of similar commercial probe.
The advantages of analysis and design method of a kind of novel linear impedance stable network of the present invention is: the present invention provides one
Kind is used for the highly sensitive wideband current monitoring probe of conduction transmitting test, and current probe of the present invention uses iron-base ultramicro-crystal alloy
Material calculates according to Theory of Electromagnetic Field as magnetic core and determines its structure size.Current probe of the present invention and commercial probe
Into comparing.In low-frequency range 20Hz-10kHz, current probe of the present invention respectively with the similar probe So-9207- of Solar company of the U.S.
The similar probe F-16A of 1N and FCC company compares, current probe measurement sensitivity of the invention be higher than commercial probe 15dB with
On；In high band 10kHz-500MHz, current probe of the present invention respectively with the similar probe So-9123-1N of Solar company of the U.S.
Compared with the similar probe F-55 of FCC company, the measurement sensitivity of current probe of the present invention can reach commercial indicator probe, survey
Examination sensitivity meets the requirement of electromagnetic compatibility type conduction transmitting test.
Detailed description of the invention
Fig. 1 is the equivalent circuit schematic of current probe；
Fig. 2 is realization procedure chart of the present invention；
Fig. 3 is the structure size figure of current probe of the present invention；Fig. 3 left figure is that current probe is placed in parallel sectional view, is described
The inside/outside diameter size of probe；Right figure is that current probe is disposed vertically sectional view, describes the height and width dimensions of probe；
Fig. 4 is current probe characteristic test configuration diagram；
Fig. 5 is current probe detection calibration configuration diagram；
Fig. 6 is current probe of the present invention and the commercial comparison diagram popped one's head in from 20Hz to 1MHz；
Fig. 7 is current probe of the present invention and the commercial comparison diagram popped one's head in from 10kHz to 500MHz.
Specific embodiment
The present invention is described in detail with reference to the accompanying drawing.
The present invention provides a kind of conduction transmitting test highly sensitive wideband current monitoring probe, the development and design of probe and
Composed structure follows the steps below, as shown in Figure 2.
Step 1: the making material of current probe is selected；
Current probe equivalent circuit schematic according to figure 1 carries out calculating analysis to the transmission characteristic of current probe.
In equivalent circuit, subject cable is equivalent to the primary single-turn circular coil of mutual inductance circuit, and self-induction is much smaller than circuit mutual inductance, Ke Yi
Ignore in calculating；In the circuit, LSRepresent the secondary self-induction of mutual inductance circuit；LMRepresent the circuit between subject cable and probe
Mutual inductance；IPRepresent the electric current in subject cable；ISRepresent the induced current of circuit secondary；RSRepresent the self-impedance of probe winding；R0
Represent probe load impedance；RMRepresent the Loss impedance that probe magnetic core increases with frequency and generated；C represent mutual inductance circuit secondary with
It is tested the distribution capacity that frequency increases and generates；V0Represent load terminal voltage.According to the definition of current probe transfer impedance, transmission
Impedance are as follows:
When the equivalent mutual inductance circuit work of current probe is in low frequency, core loss resistance and distribution capacity very little are being calculated
In can ignore；Circuit secondary coil self-impedance RSWith load impedance R0Compared to very little, can also ignore in calculating.It will be at the beginning of circuit
The energization single-turn circular coil that grade is equivalent to belt current source can be obtained according to Kirchhoff's theorem:
jωLMIp=j ω (LS+LM)IS+ISR0 (2)
It can be obtained according to the definition of current probe transfer impedance:
Wherein, ω is the angular frequency (rad/s) of tested electric current,I.e. by measured frequencyWhen,
The formula can obtain after arranging transformation:
From formula (4) it is found that the power frequency f in conducting wire is smaller when current probe work is in lower frequency, with
The increase of frequency, transfer impedance ZtIt is linearly increasing.
In order to improve results precision and test result accuracy, most important is exactly to increase current probe in low frequency work
Measurement sensitivity when making.The low-frequency test sensitivity for increasing current probe, needs to increase the low-frequency transmission impedance of current probe.
According to shown in formula (4), the low-frequency transmission impedance operator of current probe is only between working frequency and probe and subject cable
Mutual inductance is related.Mutual inductance calculation formula according to two-stage hot-wire coil:
In formula (5), K coefficient of coup between coil, conduction current emission is tested in equivalent circuit, in low frequency operation,
Since the magnetic conductivity of probe magnetic core is high, leakage field very little, the coefficient of coup is approximately equal to 1 between being approximately considered two-stage coil.By formula
(5) it is found that improve mutual inductance LM, only it is improved the self-induction of two-stage coil.Electromagnetic conductive current emission is tested, cable is tested
Determine, equivalent circuit primary also determine that, improve mutual inductance can only by improve circuit secondary, that is, improve probe from
Sense is to realize.According to the defined formula of self-induction of loop:
Wherein μ space permeability is worth for 4 π * 10-7；μsFor the relative permeability of magnetic core；N is the number of turns of coil；S is coil
Cross-sectional area, unit be square metre；L represents the length of coil, and unit is rice；K represents the coefficient of coil, and the value of k depends on
The ratio of coil radius and length.
From formula (6) it is found that the self-induction characteristic of probe is mainly related with core material and the probe structure of Inside coil, it is
The low frequency operation performance for improving probe needs to choose magnetic conductivity is as high as possible in working frequency range material, also, the magnetic considered
The problems such as stagnant saturation, combines high frequency using characteristic to make probe have good low frequency characteristic, according to use demand,
Have chosen magnetic core of the iron-base ultramicro-crystal alloy as current probe.
Step 2: the size and structure of current probe are provided；
In order to improve current probe low frequency operation performance, while guaranteeing it in the use characteristic of high band, since electric current is visited
In high frequency, the distribution parameter effects of current probe equivalent circuit are obvious for head work, and transfer impedance is in non-linear, utilization
Equivalent circuit formula cannot accurately calculate current probe transfer impedance.Therefore, to the design of current probe structure, lead to
Electromagnetic field numerical simulation software, influence of the simulation calculation difference dimensional structure to current probe high-frequency work performance are crossed, and is passed through
Calculated result determines the size of current probe.
The primary structure of electric current inductive probe by pop one's head in external shielding body, inner core, wrap up magnetic core insulating materials and
The coiling being wrapped on magnetic core is constituted.The dimensional structure of each material all has an impact to current probe transmission characteristic, comprehensive imitative
Very and consider to optimize different dimensional structures to the affecting laws of current probe frequency transfer characteristic, it is opposite to obtain frequency transfer characteristic
Ideal current probe structure size is as shown in figure 3, current probe of the present invention is divided into five-layer structure.Outermost layer and most interior
The shield shell that layer is 2 millimeters of thickness, case material use brass；It is 10 millimeters of thickness of magnetic core, magnetic core among current probe
Use iron-base ultramicro-crystal alloy；Magnetic core is to being exhausted with a thickness of the internal layer and outer layer of respectively 5 millimeters and 8 millimeters between shield shell
Edge material, insulating materials are polytetrafluoroethylene (PTFE).The magnetic core width of current probe is 26 millimeters, and magnetic core outer layer insulation material width is
34 millimeters.
Step 3: testing the current probe of production, verifies its broadband character and sensory characteristic.
The test that current monitoring is popped one's head in is provided according to International Standards Organization ISO11452-4, test verificating current probe
Transfer impedance.Current probe transfer impedance is tested by vector network analyzer, calibration clamp and the load of 50 ohm coaxials.
Test configurations are as shown in figure 4, be connected to current probe with RF cable respectively for the port 1 of vector network analyzer and port 2
The input terminal of calibration clamp and the input terminal of current probe, the output of calibration clamp terminate 50 ohm of matched load.Debugging arrow
Network Analyzer is measured, checks the transmission coefficient of current probe, i.e., the S shown on vector network analyzer21Value, by calculating
To the transfer impedance of current probe.
According to the regulation of ISO11452-4 standard, before the test of current probe transfer impedance, it is necessary first to calibration cartridge
It sets and is calibrated, according to shown in Fig. 5, calibration clamp and load are calibrated with vector network analysis, according to the echo of calibration
S is lost11As a result, calculate calibration clamp and load standing-wave ratio, when standing-wave ratio is less than 1.2, it is believed that the test device self-correcting
Standard passes through, and meets the ability tested current probe transmission characteristic, can carry out the test of current probe transfer impedance.
Current probe actual test is gone out according to the definition of current probe transfer impedance by the test to current probe
Transfer curve calculated, calculation formula is as shown in Equation 7.
ZT(dB Ω)=34 (dB Ω)+S21(dB) (7)
Current probe working frequency of the invention is 20Hz-500MHz.In order to which verificating current probe is special in the transmission of low frequency
Property, it is public in the current probe and Solar that the low-frequency range present invention provides by current probe compared with mainstream commercialization monitoring current probe
The low-frequency current of department and FCC company probe is compared.
The current probe So-9207-1N of Solar company of the U.S., working frequency range 20Hz-150MHz, FCC company of the U.S.
Current probe F-16A, working frequency range 10Hz-100MHz, the present invention provides current probe and both current probes
Transfer impedance carries out test comparison, and correlation curve is as shown in Figure 6.
In order to verify current probe of the present invention in the transmission characteristic of high frequency, compared with mainstream commercialization monitoring current probe, originally
The current probe of invention is compared in radio frequency band transfer impedance and the wideband high-frequency current probe of Solar company and FCC company
Compared with.
The So-9123-1N of U.S.'s Solar formula, working frequency range 10kHz-500MHz, the F-55 of FCC company of the U.S.,
Its working frequency range is 10kHz-500MHz, and the transfer impedance that the present invention provides current probe and both current probes is tested
Comparison, correlation curve are as shown in Figure 7.
It can be seen from figures 6 and 7 that the current probe that the present invention provides is in low frequency, especially from 20Hz to
10kHz, transfer impedance is much larger than commercial probe, in 20Hz frequency point, the F- of current probe of the invention than FCC company of the U.S.
The 16A similar high 16dB of probe, probe high 40dB more similar than the So-9207-1N of Solar company of the U.S..Current probe i.e. of the present invention
Measurement sensitivity in 20Hz at least 15dB higher than commercial current probe.In 20Hz to 10kHz frequency range, current probe of the invention
Measurement sensitivity is higher than commercial current probe comprehensively, and in 10kHz to 500MHz, current probe measurement sensitivity energy of the invention
Enough reach the level of commercial current probe, therefore current probe of the invention has property more superior than commercial current probe
Energy.
Above embodiments are provided just for the sake of the description purpose of the present invention, and are not intended to limit the scope of the invention.This
The range of invention is defined by the following claims.It does not depart from spirit and principles of the present invention and the various equivalent replacements made and repairs
Change, should all cover within the scope of the present invention.
Claims (1)
1. a kind of monitoring current probe for conducted emission test, it is characterised in that design method is as follows:
Step 1: the making material of current probe is selected；
In order to improve current probe in the measurement sensitivity of low frequency 20Hz-10kHz, and take into account the test of high frequency 10kHz-500MHz
Sensory characteristic selects magnetic conductivity to be much higher than core material of the iron-base ultramicro-crystal of commercial manganese-zinc ferrite as current probe；
Step 2: the size and structure of current probe are provided；
After current probe magnetic core uses material, need to carry out calculating design to the overall structure of probe, using electromagnetism Flow Field Numerical meter
Calculation method carries out Modeling Calculation to current probe, optimizes the structure of current probe；The current probe is divided into five-layer structure, most
The shield shell that outer layer and innermost layer are 1.5 millimeters -2.5 millimeters of thickness, current probe shield shell use high electrical conductivity materials
Brass or red copper or high-purity silver material；It is 8 millimeters -10 millimeters of thickness of magnetic core among current probe, magnetic core uses iron-based
Ultramicro-crystal alloy；Magnetic core is to being outer layer insulation material with a thickness of 4 millimeters -5 millimeters between current probe outer shield shell；Magnetic
For core to being primary insulation material with a thickness of 6 millimeters -8 millimeters between current probe internal layer shield shell, insulating materials selection is high
Resistivity materials polytetrafluoroethylene (PTFE), perfluoroethylene or polypropylene material；The magnetic core width of current probe is 24 millimeters -26 millimeters,
Magnetic core outer layer insulation material width is 32 millimeters -36 millimeters.
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Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7094273B2 (en) * | 2002-03-29 | 2006-08-22 | General Electric Company | Fabrication of a high-strength steel article with inclusion control during melting |
| CN101430369A (en) * | 2008-10-24 | 2009-05-13 | 江苏大学 | Self-generation wide-band laminated magnetic induced piezoelectric effect AC magnetic field sensor and production method thereof |
| CN103529366A (en) * | 2013-09-22 | 2014-01-22 | 华北电力大学 | UHF (Ultra High Frequency) broadband current sensor based on Rogowski coil principle and joint monitoring system |
| CN203672961U (en) * | 2013-12-02 | 2014-06-25 | 武汉重型机床集团有限公司 | Broadband 0-200Hz current detection circuit |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20110062330A1 (en) * | 2009-09-14 | 2011-03-17 | David Ben-Bassat | Electromagnetic based thermal sensing and imaging incorporating differential pixel topology |
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- 2016-07-29 CN CN201610616903.1A patent/CN105974180B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7094273B2 (en) * | 2002-03-29 | 2006-08-22 | General Electric Company | Fabrication of a high-strength steel article with inclusion control during melting |
| CN101430369A (en) * | 2008-10-24 | 2009-05-13 | 江苏大学 | Self-generation wide-band laminated magnetic induced piezoelectric effect AC magnetic field sensor and production method thereof |
| CN103529366A (en) * | 2013-09-22 | 2014-01-22 | 华北电力大学 | UHF (Ultra High Frequency) broadband current sensor based on Rogowski coil principle and joint monitoring system |
| CN203672961U (en) * | 2013-12-02 | 2014-06-25 | 武汉重型机床集团有限公司 | Broadband 0-200Hz current detection circuit |
Non-Patent Citations (1)
| Title |
|---|
| 不同磁芯材料对电流探头传输阻抗Zt的影响;刘荣;《南京师范大学学报》;20040630;第4卷(第2期);第53-55页 |
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