CN105938202A - Crystal test apparatus - Google Patents
Crystal test apparatus Download PDFInfo
- Publication number
- CN105938202A CN105938202A CN201610450241.5A CN201610450241A CN105938202A CN 105938202 A CN105938202 A CN 105938202A CN 201610450241 A CN201610450241 A CN 201610450241A CN 105938202 A CN105938202 A CN 105938202A
- Authority
- CN
- China
- Prior art keywords
- crystal
- silicone oil
- oil groove
- tabula rasa
- fixing hole
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T7/00—Details of radiation-measuring instruments
- G01T7/005—Details of radiation-measuring instruments calibration techniques
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- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Liquid Crystal (AREA)
Abstract
The invention discloses a crystal test apparatus. The crystal test apparatus comprises a light source, an elevating device, a light insulation plate, a detection circuit board and a silicone oil groove, wherein the elevating device is arranged at one side of the silicone oil groove, the light insulation plate is disposed above the silicone oil groove, the light source is disposed above the light insulation plate, the output end of the elevating device is provided with a support rod connected with the light insulation plate, the light insulation plate is provided with a plurality of crystal fixation holes, scintillation crystal strips are respectively arranged at the lower portions of the crystal fixation holes, and the detection circuit board is provided with SiPM silicon detectors respectively disposed below the crystal fixation holes. According to the crystal test apparatus, through such a mode, the multiple scintillation crystal strips are respectively placed in the light insulation plate for simultaneous testing, the work efficiency is high, gaps between the top surfaces of the SiPM silicon detectors and the bottom surfaces of the scintillation crystal strips are filled with silicone oil, errors are reduced, the test precision is improved, and the operation is flexible.
Description
Technical field
The present invention relates to crystal production field tests, particularly relate to a kind of crystal test device.
Background technology 。
The quality of crystal can be detected by SiPM silicon detector, but operates comparatively laborious, needs to contact the detection that just can carry out ray bottom single crystal with SiPM silicon detector, mainly uses manual operation, inefficiency.
It addition, when test, SiPM silicon detector contacts requirement strictly with crystal, is also the key factor affecting measuring accuracy, and existing manual operation difficulty or ease guarantee the precision of test.
Summary of the invention
The technical problem that present invention mainly solves is to provide a kind of crystal test device, promotes measuring accuracy and work efficiency.
For solving above-mentioned technical problem, the technical scheme that the present invention uses is: provide a kind of crystal test device, including: light source, lowering or hoisting gear, every tabula rasa, testing circuit plate and silicone oil groove, it is provided with bracing frame in described silicone oil groove, described testing circuit plate is arranged on bracing frame, described lowering or hoisting gear is arranged on silicone oil groove side, the described top being positioned at silicone oil groove every tabula rasa, described light source is positioned at the top every tabula rasa, the outfan of described lowering or hoisting gear is provided with the support bar being connected with every tabula rasa, described on tabula rasa, it is provided with several crystal fixing hole, scintillation crystal bar is separately positioned on crystal fixing hole bottom, the SiPM silicon detector laid respectively at below crystal fixing hole it is provided with on described testing circuit plate.
In a preferred embodiment of the present invention, being provided with silicone oil in described silicone oil groove, described SiPM silicon detector is positioned under silicone oil liquid level.
In a preferred embodiment of the present invention, described several crystal fixing hole arrays are arranged on tabula rasa.
In a preferred embodiment of the present invention, described crystal fixing hole inwall is provided with reflectance coating.
In a preferred embodiment of the present invention, support frame as described above is provided with the pressure limit bit switch being positioned at below support bar.
The invention has the beneficial effects as follows: a kind of crystal test device that the present invention points out, multiple scintillation crystal bars are individually positioned in and test in tabula rasa simultaneously, work efficiency is high, SiPM silicon detector end face is filled with silicone oil in the gap of scintillation crystal bar bottom surface, decrease error, improve the precision of test, flexible operation, decrease cost of labor.
Accompanying drawing explanation
For the technical scheme being illustrated more clearly that in the embodiment of the present invention, in describing embodiment below, the required accompanying drawing used is briefly described, apparently, accompanying drawing in describing below is only some embodiments of the present invention, for those of ordinary skill in the art, on the premise of not paying creative work, it is also possible to obtain other accompanying drawing according to these accompanying drawings, wherein:
Fig. 1 is the structural representation of a kind of crystal of present invention test device one preferred embodiment.
Detailed description of the invention
Technical scheme in the embodiment of the present invention will be clearly and completely described below, it is clear that described embodiment is only a part of embodiment of the present invention rather than whole embodiments.Based on the embodiment in the present invention, all other embodiments that those of ordinary skill in the art are obtained under not making creative work premise, broadly fall into the scope of protection of the invention.
Referring to Fig. 1, the embodiment of the present invention includes:
A kind of crystal test device, including: light source 4, lowering or hoisting gear 2, every tabula rasa 3, testing circuit plate 5 and silicone oil groove 1, it is provided with bracing frame 11 in described silicone oil groove 1, described testing circuit plate 5 is arranged on bracing frame 11, described lowering or hoisting gear 2 is arranged on silicone oil groove 1 side, the described top being positioned at silicone oil groove 1 every tabula rasa 3, described light source 4 is positioned at the top every tabula rasa 3, light source 4 sends ray, below covering every tabula rasa 3, the outfan of described lowering or hoisting gear 2 is provided with the support bar 21 being connected with every tabula rasa 3, utilize the lowering or hoisting gear 2 driving to support bar 21, realize moving up and down every tabula rasa 3.
Light source 4 utilizes support means to be connected with support bar 21, moves up and down with the lifting of support bar 21, good to the mobile adaptability every tabula rasa 3.
Described on tabula rasa 3, it is provided with several crystal fixing hole 31, scintillation crystal bar 7 is separately positioned on crystal fixing hole 31 bottom, the SiPM silicon detector 6 laid respectively at below crystal fixing hole 31 it is provided with on described testing circuit plate 5, move down every tabula rasa 3, the upper surface of SiPM silicon detector 6 is contacted with the lower surface of scintillation crystal bar 7, tests.
Being provided with silicone oil in described silicone oil groove 1, described SiPM silicon detector 6 is positioned under silicone oil liquid level, and silicone oil is filled in the gap between SiPM silicon detector 6 and scintillation crystal bar 7, decreases the clearance issues impact on accuracy of detection.
Described several crystal fixing hole 31 array is arranged on tabula rasa 3, it is provided with reflectance coating on described crystal fixing hole 31 inwall, reflecting effect is good, multiple scintillation crystal bars 7 can be tested simultaneously, crystal fixing hole 31 and SiPM silicon detector 6 is carried out the numbering of correspondence, it is simple to determine abnormal scintillation crystal bar 7.
The pressure limit bit switch 12 being positioned at below support bar 21 it is provided with on support frame as described above 11, pressure limit bit switch 12 drops at support bar 21 and triggers the most afterwards, suspend the work of lowering or hoisting gear 2, it is to avoid the shock of SiPM silicon detector 6 and scintillation crystal bar 7 damages problem.
In sum, a kind of crystal test device that the present invention points out, the test of multiple scintillation crystal bar 7 can be completed simultaneously, measuring accuracy is high, and operation is convenient, reduces cost of labor, improves production efficiency.
The foregoing is only embodiments of the invention; not thereby the scope of the claims of the present invention is limited; every equivalent structure utilizing description of the invention content to be made or equivalence flow process conversion; or directly or indirectly it is used in other relevant technical field, the most in like manner it is included in the scope of patent protection of the present invention.
Claims (5)
1. a crystal test device, detection for scintillation crystal bar, it is characterized in that, including: light source, lowering or hoisting gear, every tabula rasa, testing circuit plate and silicone oil groove, it is provided with bracing frame in described silicone oil groove, described testing circuit plate is arranged on bracing frame, described lowering or hoisting gear is arranged on silicone oil groove side, the described top being positioned at silicone oil groove every tabula rasa, described light source is positioned at the top every tabula rasa, the outfan of described lowering or hoisting gear is provided with the support bar being connected with every tabula rasa, described on tabula rasa, it is provided with several crystal fixing hole, scintillation crystal bar is separately positioned on crystal fixing hole bottom, the SiPM silicon detector laid respectively at below crystal fixing hole it is provided with on described testing circuit plate.
Crystal the most according to claim 1 test device, it is characterised in that being provided with silicone oil in described silicone oil groove, described SiPM silicon detector is positioned under silicone oil liquid level.
Crystal the most according to claim 1 test device, it is characterised in that described several crystal fixing hole arrays are arranged on tabula rasa.
Crystal the most according to claim 1 test device, it is characterised in that be provided with reflectance coating on described crystal fixing hole inwall.
Crystal the most according to claim 1 test device, it is characterised in that be provided with the pressure limit bit switch being positioned at below support bar on support frame as described above.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610450241.5A CN105938202A (en) | 2016-06-21 | 2016-06-21 | Crystal test apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610450241.5A CN105938202A (en) | 2016-06-21 | 2016-06-21 | Crystal test apparatus |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN105938202A true CN105938202A (en) | 2016-09-14 |
Family
ID=56872384
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610450241.5A Pending CN105938202A (en) | 2016-06-21 | 2016-06-21 | Crystal test apparatus |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN105938202A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106597569A (en) * | 2016-10-29 | 2017-04-26 | 无锡通透光电科技有限公司 | Multifunctional scintillation crystal testing platform |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN201440067U (en) * | 2009-06-17 | 2010-04-21 | 创宇科技工业股份有限公司 | Appearance inspection device |
| CN102113892A (en) * | 2011-03-14 | 2011-07-06 | 北京锐视康科技发展有限公司 | Detector in nuclear medicine diagnosis device and using method thereof |
| CN205103184U (en) * | 2015-10-23 | 2016-03-23 | 苏州晶特晶体科技有限公司 | High energy X -ray detector of visual regulation |
| CN205880235U (en) * | 2016-06-21 | 2017-01-11 | 苏州晶特晶体科技有限公司 | Crystal testing arrangement |
-
2016
- 2016-06-21 CN CN201610450241.5A patent/CN105938202A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN201440067U (en) * | 2009-06-17 | 2010-04-21 | 创宇科技工业股份有限公司 | Appearance inspection device |
| CN102113892A (en) * | 2011-03-14 | 2011-07-06 | 北京锐视康科技发展有限公司 | Detector in nuclear medicine diagnosis device and using method thereof |
| CN205103184U (en) * | 2015-10-23 | 2016-03-23 | 苏州晶特晶体科技有限公司 | High energy X -ray detector of visual regulation |
| CN205880235U (en) * | 2016-06-21 | 2017-01-11 | 苏州晶特晶体科技有限公司 | Crystal testing arrangement |
Non-Patent Citations (1)
| Title |
|---|
| 李寿榼: "《原子能研究所年报》", 31 August 1980, 原子能出版社 * |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106597569A (en) * | 2016-10-29 | 2017-04-26 | 无锡通透光电科技有限公司 | Multifunctional scintillation crystal testing platform |
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| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
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| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20160914 |
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| RJ01 | Rejection of invention patent application after publication |