CN105933075A - Terminal testing system and method - Google Patents

Terminal testing system and method Download PDF

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Publication number
CN105933075A
CN105933075A CN201610453088.1A CN201610453088A CN105933075A CN 105933075 A CN105933075 A CN 105933075A CN 201610453088 A CN201610453088 A CN 201610453088A CN 105933075 A CN105933075 A CN 105933075A
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CN
China
Prior art keywords
terminal
probe
signal
base station
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201610453088.1A
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Chinese (zh)
Inventor
陈晓晨
安旭东
刘政
张钦娟
张霄
唐伟生
冯云
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SHENZHEN INSTITUTE OF TELECOMMUNICATIONS
China Academy of Information and Communications Technology CAICT
Original Assignee
SHENZHEN INSTITUTE OF TELECOMMUNICATIONS
China Academy of Telecommunications Research CATR
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Application filed by SHENZHEN INSTITUTE OF TELECOMMUNICATIONS, China Academy of Telecommunications Research CATR filed Critical SHENZHEN INSTITUTE OF TELECOMMUNICATIONS
Priority to CN201610453088.1A priority Critical patent/CN105933075A/en
Publication of CN105933075A publication Critical patent/CN105933075A/en
Pending legal-status Critical Current

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Classifications

    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04BTRANSMISSION
    • H04B17/00Monitoring; Testing
    • H04B17/10Monitoring; Testing of transmitters
    • H04B17/101Monitoring; Testing of transmitters for measurement of specific parameters of the transmitter or components thereof
    • H04B17/102Power radiated at antenna
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04BTRANSMISSION
    • H04B17/00Monitoring; Testing
    • H04B17/0082Monitoring; Testing using service channels; using auxiliary channels
    • H04B17/0085Monitoring; Testing using service channels; using auxiliary channels using test signal generators
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04BTRANSMISSION
    • H04B17/00Monitoring; Testing
    • H04B17/20Monitoring; Testing of receivers
    • H04B17/29Performance testing
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04BTRANSMISSION
    • H04B17/00Monitoring; Testing
    • H04B17/30Monitoring; Testing of propagation channels
    • H04B17/309Measuring or estimating channel quality parameters
    • H04B17/318Received signal strength
    • H04B17/327Received signal code power [RSCP]

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Quality & Reliability (AREA)
  • Monitoring And Testing Of Transmission In General (AREA)
  • Mobile Radio Communication Systems (AREA)

Abstract

The invention provides a terminal testing system and method. The terminal testing system comprises a base station simulator, a fully anechoic chamber, a DSP (Digital Signal Processor) chip and an FPGA (Field Programmable Gate Array) chip; a plurality of probes are uniformly arranged in the fully anechoic chamber and are respectively in wireless connection with antennas of tested terminals; the base station simulator outputs base station signals to the plurality of probes in the fully anechoic chamber; the plurality of probes receive the base station signals output by the base station simulator, send out downlink signals to the tested terminals according to the base station signals, and receive uplink signals fed back by the tested terminals according to the downlink signals; the DSP chip is used for acquiring power of the uplink signals received by the plurality of probes, selecting a preset number of probes from the plurality of probes according to the power, and generating control signals on the basis of the selected probes; the FPGA chip is used for controlling on-off of the corresponding probes in the fully anechoic chamber according to the control signals; the selected probes sent out testing signals to the tested terminals in the fully anechoic chamber so as to test the tested terminals.

Description

Terminal test system and method
Technical field
The present invention relates to radio frequency arts, particularly relate to a kind of terminal test system and method.
Background technology
At present, when terminal is carried out the performance test such as testing protocol consistency and handling capacity, typically use conduction pattern Testing, test system is by several parts such as WiMAX comprehensive tester, multi-antenna multiplexed unit, channel simulators Composition, by the way of conduction line, test terminal performance under simulated environment.Test terminal under conduction pattern Uniformity test, it is impossible to reflection terminal situation in actual applications, and for using the end of integration array antenna End, conduction test method cannot realize.
Summary of the invention
For solving above-mentioned technical problem, the invention provides a kind of terminal test system, described terminal test system includes: Base station simulator, fully anechoic chamber, dsp chip and fpga chip;Described fully anechoic chamber is evenly arranged with Multiple probes, are connected with the antenna wireless of measured terminal respectively;
Described base station simulator is used for outputting base station signal to the plurality of probe in fully anechoic chamber;
The plurality of probe is for receiving the base station signal of described base station simulator output, respectively according to described base station signal Send downstream signal to described measured terminal, and receive the upward signal that measured terminal feeds back according to described downstream signal;
Described dsp chip is for obtaining the power of the upward signal that the plurality of probe receives, according to described power Size from the plurality of probe, select the probe of predetermined number, and generate control signal based on selected probe;
Described fpga chip is for controlling the switch of corresponding probe in described fully anechoic chamber according to described control signal;
Selected probe sends test signal to described measured terminal, with to described tested in described fully anechoic chamber Terminal is tested.
In one embodiment, described terminal test system also includes: PA chip, for sending down described probe The power of row signal or the power of test signal are amplified.
In one embodiment, described measured terminal includes: single antenna terminal, multi-antenna terminal and aerial array integration Terminal.
In one embodiment, described dsp chip specifically for: by the plurality of probe according to received upward signal The descending mode of power, select the probe of predetermined number, and generate control signal based on selected probe.
In one embodiment, the test carried out described measured terminal includes: survey the antenna of described measured terminal Try, and the protocol conformance and performance to described measured terminal is tested.
Present invention also offers a kind of terminal test method, be applied to described terminal test system, described terminal test Method includes:
Described base station simulator outputting base station signal is to the plurality of probe in fully anechoic chamber;
The plurality of probe sends downstream signal according to described base station signal to described measured terminal respectively, and receives tested The upward signal that terminal is fed back according to described downstream signal;
Described dsp chip obtains the power of upward signal that the plurality of probe receives, big according to described power The little probe selecting predetermined number from the plurality of probe, and generate control signal based on selected probe;
Described fpga chip controls the switch of corresponding probe in described fully anechoic chamber according to described control signal;
Selected probe sends test signal to described measured terminal, with to described tested in described fully anechoic chamber Terminal is tested.
In one embodiment, described terminal test method also includes: to the power of the downstream signal that described probe sends and The power of test signal is amplified.
In one embodiment, described measured terminal includes: single antenna terminal, multi-antenna terminal and aerial array integration Terminal.
In one embodiment, from the plurality of probe, select the probe of predetermined number according to the size of described power, bag Include: by the plurality of probe according to the descending mode of the power of received upward signal, select the spy of predetermined number Head.
In one embodiment, described measured terminal is carried out test and includes: the antenna of described measured terminal is tested, And the protocol conformance and performance to described measured terminal test.
Utilize the present invention, be possible not only to single antenna terminal and multi-antenna terminal are carried out antenna measurement, it is also possible to antenna Array integrated terminal carries out antenna measurement.Further, utilize the present invention can also be to the terminal of above-mentioned multiple antenna type The performance such as protocol conformance and handling capacity carries out space test, can be with the authentic testing terminal performance when reality is applied.
Accompanying drawing explanation
In order to be illustrated more clearly that the embodiment of the present invention or technical scheme of the prior art, below will be to embodiment or existing In having technology to describe, the required accompanying drawing used is briefly described, it should be apparent that, the accompanying drawing in describing below is only It is some embodiments of the present invention, for those of ordinary skill in the art, in the premise not paying creative work Under, it is also possible to other accompanying drawing is obtained according to these accompanying drawings.
Fig. 1 is the structural representation of embodiment of the present invention terminal test system;
Fig. 2 is the schematic flow sheet of embodiment of the present invention terminal test method.
Detailed description of the invention
Below in conjunction with the accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is carried out clear, complete Describe, it is clear that described embodiment is only a part of embodiment of the present invention rather than whole embodiments wholely. Based on the embodiment in the present invention, those of ordinary skill in the art are obtained under not making creative work premise Every other embodiment, broadly falls into the scope of protection of the invention.
Fig. 1 is the structural representation of embodiment of the present invention terminal test system.As it is shown in figure 1, this terminal test system Including: base station simulator 1, fully anechoic chamber 2, dsp chip 3 and fpga chip 4.In fully anechoic chamber 2 Be evenly arranged with multiple probe 5, when terminal is tested, these probes 5 can respectively with the sky of measured terminal Line wirelessly connects.
Base station simulator 1 is used for outputting base station signal to the multiple probes 5 in fully anechoic chamber 2.
Multiple probes 5 in fully anechoic chamber 2 are for receiving the base station signal of base station simulator 1 output, basis respectively This base station signal sends downstream signal to measured terminal, and receives the up letter that measured terminal feeds back according to this downstream signal Number.
Dsp chip 3 is for obtaining the power of the upward signal that multiple probe 5 receives, received by each probe The size of upward signal power from above-mentioned multiple probes 5, select the probe of predetermined number, and based on selected Probe generates control signal.
Fpga chip 4 controls corresponding in fully anechoic chamber 2 spy for the control signal generated according to dsp chip 3 The switch of head.
Selected probe sends test signal to the measured terminal being arranged in fully anechoic chamber 2, with to measured terminal Test.Test signal herein falls within the one of downstream signal.
Utilize the present invention, be possible not only to single antenna terminal and multi-antenna terminal are carried out antenna measurement, it is also possible to antenna Array integrated terminal carries out antenna measurement.Further, utilize the present invention can also be to the terminal of above-mentioned multiple antenna type The performance such as protocol conformance and handling capacity carries out space test, can be with the authentic testing terminal performance when reality is applied.
Under normal circumstances, in order to increase the power that in fully anechoic chamber 2, probe is sent, above-mentioned terminal test system Also include a PA (Power Amplifier, power amplifier) chip, the merit to the downstream signal that probe 5 sends The power of rate or test signal is amplified.
When using above-mentioned terminal test system that terminal is tested, measured terminal need to be placed on fully anechoic chamber 2 In, measured terminal can be single antenna terminal, multi-antenna terminal, it is also possible to is aerial array integrated terminal.
In one embodiment, the probe 5 in fully anechoic chamber 2 after measured terminal sends downstream signal, tested end End sets antenna due to interior, and now antenna can be accordingly based upon downstream signal feeding back uplink signal.Probe receives measured terminal After the upward signal of feedback, dsp chip 3 is descending according to the power of received upward signal by above-mentioned multiple probes Mode, select the probe that the power of predetermined number is bigger, and generate control signal based on selected probe and be sent to Fpga chip 4.Such as, the upward signal power receiving probe, by sorting from big to small, chooses front 25% Probe is used as the probe sending test used by signal, and wherein 25% this numerical value is for illustrating, and is not intended to this Bright restriction.
After fpga chip 4 receives the control signal that dsp chip 3 generates, control complete according to this control signal In anechoic chamber, 2, the switch of corresponding probe, i.e. opens selected probe and cuts out not selected probe.These institute The probe selected sends test signal to measured terminal in fully anechoic chamber 2, tests measured terminal.
In embodiments of the present invention, the probe in fully anechoic chamber 2 and measured terminal therein use wireless mode even Connecing, therefore, above-mentioned test is possible not only to the radio-frequency performance of the antenna to measured terminal and tests, it is also possible to quilt Protocol conformance and the performance of surveying terminal are tested.
This terminal test system is utilized to replace existing call wire connected mode to the protocol conformance of terminal and handling capacity When testing etc. performance, more can reflect the terminal performance when reality is applied.
Based on the inventive concept identical with terminal test system shown in Fig. 1, the embodiment of the present invention also provides for a kind of terminal and surveys Method for testing, is applied to terminal test system shown in Fig. 1.The main flow of this method of testing is as in figure 2 it is shown, it is main Comprise the following steps:
Step S1, base station simulator 1 outputting base station signal are to the multiple probes in fully anechoic chamber 2.
Step S2, the above-mentioned multiple probes receiving base station signal are dark to being placed in full electric wave according to this base station signal respectively Measured terminal in room 2 sends downstream signal, and receives the upward signal that measured terminal feeds back according to downstream signal.
Step S3, dsp chip 3 obtain the power of the upward signal that above-mentioned multiple probe receives, according to power Size selects the probe of predetermined number from above-mentioned multiple probes, and generates control signal based on selected probe.
It is right that step S4, fpga chip 4 control in fully anechoic chamber 2 according to the control signal that dsp chip 3 sends The switch that should pop one's head in, i.e. opens selected probe and cuts out not selected probe.
Step S5, selected probe send test signal to measured terminal in fully anechoic chamber 2, with to tested Terminal is tested.
Utilize the present invention, be possible not only to single antenna terminal and multi-antenna terminal are carried out antenna measurement, it is also possible to antenna Array integrated terminal carries out antenna measurement.Further, utilize the present invention can also be to the terminal of above-mentioned multiple antenna type The performance such as protocol conformance and handling capacity carries out space test, can be with the authentic testing terminal performance when reality is applied. Further, when reality is tested and all probes of being provided without in fully anechoic chamber 2 send test signal, but select Measured terminal is tested by part probe, and this is greatly saved the energy.
When being embodied as, the terminal needing test need to be previously positioned in fully anechoic chamber 2, and this terminal is permissible Wireless connections are passed through with the probe in fully anechoic chamber 2.
Above-mentioned measured terminal includes single antenna terminal, multi-antenna terminal and aerial array integrated terminal.Due to terminal Inside is provided with antenna, when pop one's head in 5 send downstream signal according to base station signal time, the antenna in terminal can be accordingly based upon Downstream signal generates upward signal.
When selecting probe in step s3, generally according to the side that the power of the received upward signal of each probe is descending Formula, selects the probe that the power of predetermined number is bigger.
After selecting the probe of predetermined number, fpga chip 4 controls in fully anechoic chamber 2 according to above-mentioned control signal The switch of corresponding probe.Now, base station simulator 1 sends base station signal again, owing to the most selected probe is Open, not selected probe be close, therefore by selected probe according to this base station signal to measured terminal Send test signal, measured terminal is tested, the radio-frequency enabled of measured terminal antenna can be tested, also The performances such as the protocol conformance of measured terminal and handling capacity can be tested.
It is said that in general, in order to increase the power that the probe in fully anechoic chamber 2 is sent, generally probe 5 is sent The power of downstream signal or the power of test signal are amplified.
Utilize the present invention can replace traditional call wire connected mode, terminal is carried out space test, truly reflects The terminal performance when reality is applied.
Those skilled in the art are it should be appreciated that embodiments of the invention can be provided as method, system or computer journey Sequence product.Therefore, the present invention can use complete hardware embodiment, complete software implementation or combine software and hardware The form of the embodiment of aspect.And, the present invention can use and wherein include computer available programs one or more The computer-usable storage medium (including but not limited to disk memory, CD-ROM, optical memory etc.) of code The form of the computer program of upper enforcement.
The present invention is with reference to method, equipment (system) and the stream of computer program according to embodiments of the present invention Journey figure and/or block diagram describe.It should be understood that can be by computer program instructions flowchart and/or block diagram Flow process in each flow process and/or square frame and flow chart and/or block diagram and/or the combination of square frame.These can be provided Computer program instructions processes to general purpose computer, special-purpose computer, Embedded Processor or other programmable datas and sets Standby processor is to produce a machine so that held by the processor of computer or other programmable data processing device The instruction of row produces for realizing one flow process of flow chart or multiple flow process and/or one square frame of block diagram or multiple side The device of the function specified in frame.
These computer program instructions may be alternatively stored in and computer or other programmable data processing device can be guided with spy Determine in the computer-readable memory that mode works so that the instruction being stored in this computer-readable memory produces bag Including the manufacture of command device, this command device realizes at one flow process of flow chart or multiple flow process and/or block diagram one The function specified in individual square frame or multiple square frame.
These computer program instructions also can be loaded in computer or other programmable data processing device so that at meter On calculation machine or other programmable devices, execution sequence of operations step is to produce computer implemented process, thus is calculating The instruction performed on machine or other programmable devices provide for realizing in one flow process of flow chart or multiple flow process and/or The step of the function specified in one square frame of block diagram or multiple square frame.
The present invention applies specific embodiment principle and the embodiment of the present invention are set forth, above example Explanation be only intended to help to understand method and the core concept thereof of the present invention;General technology simultaneously for this area Personnel, according to the thought of the present invention, the most all will change, in sum, This specification content should not be construed as limitation of the present invention.

Claims (10)

1. a terminal test system, it is characterised in that described terminal test system includes: base station simulator, complete Anechoic chamber, dsp chip and fpga chip;Described fully anechoic chamber is evenly arranged with multiple probe, respectively It is connected with the antenna wireless of measured terminal;
Described base station simulator is used for outputting base station signal to the plurality of probe in fully anechoic chamber;
The plurality of probe is for receiving the base station signal of described base station simulator output, respectively according to described base station signal Send downstream signal to described measured terminal, and receive the upward signal that measured terminal feeds back according to described downstream signal;
Described dsp chip is for obtaining the power of the upward signal that the plurality of probe receives, according to described power Size from the plurality of probe, select the probe of predetermined number, and generate control signal based on selected probe;
Described fpga chip is for controlling the switch of corresponding probe in described fully anechoic chamber according to described control signal;
Selected probe sends test signal to described measured terminal, with to described tested in described fully anechoic chamber Terminal is tested.
Terminal test system the most according to claim 1, it is characterised in that described terminal test system is also wrapped Include: PA chip, for the power of the power of the downstream signal that described probe sends or test signal is amplified.
Terminal test system the most according to claim 1, it is characterised in that described measured terminal includes: single Antenna terminal, multi-antenna terminal and aerial array integrated terminal.
Terminal test system the most according to claim 1, it is characterised in that described dsp chip specifically for: By the plurality of probe according to the descending mode of the power of received upward signal, select the probe of predetermined number, And generate control signal based on selected probe.
Terminal test system the most according to claim 1, it is characterised in that described measured terminal is carried out Test includes: test the antenna of described measured terminal, and to the protocol conformance of described measured terminal and property Can test.
6. a terminal test method, is applied to the terminal test system described in claim 1, it is characterised in that Described terminal test method includes:
Described base station simulator outputting base station signal is to the plurality of probe in fully anechoic chamber;
The plurality of probe sends downstream signal according to described base station signal to described measured terminal respectively, and receives tested The upward signal that terminal is fed back according to described downstream signal;
Described dsp chip obtains the power of upward signal that the plurality of probe receives, big according to described power The little probe selecting predetermined number from the plurality of probe, and generate control signal based on selected probe;
Described fpga chip controls the switch of corresponding probe in described fully anechoic chamber according to described control signal;
Selected probe sends test signal to described measured terminal, with to described tested in described fully anechoic chamber Terminal is tested.
Terminal test method the most according to claim 6, it is characterised in that described terminal test method is also wrapped Include: the power of the downstream signal that described probe sends and the power of test signal are amplified.
Terminal test method the most according to claim 6, it is characterised in that described measured terminal includes: single Antenna terminal, multi-antenna terminal and aerial array integrated terminal.
Terminal test method the most according to claim 6, it is characterised in that according to the size of described power from The plurality of probe is selected the probe of predetermined number, including:
By the plurality of probe according to the descending mode of the power of received upward signal, select the spy of predetermined number Head.
Terminal test method the most according to claim 6, it is characterised in that described measured terminal is surveyed Examination includes: test the antenna of described measured terminal, and to the protocol conformance of described measured terminal and performance Test.
CN201610453088.1A 2016-06-21 2016-06-21 Terminal testing system and method Pending CN105933075A (en)

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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110166143A (en) * 2018-02-12 2019-08-23 中国信息通信研究院 A kind of test method of base station performance, equipment and system
CN111132207A (en) * 2018-10-30 2020-05-08 中国移动通信有限公司研究院 Integrated base station equipment testing device and method, storage medium and related equipment
CN113219262A (en) * 2021-04-26 2021-08-06 深圳市广和通无线股份有限公司 Equipment test method, device, equipment and storage medium
CN114726411A (en) * 2020-12-22 2022-07-08 中国移动通信集团终端有限公司 3D MIMO OTA darkroom probe system

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CN104283623A (en) * 2014-10-01 2015-01-14 工业和信息化部电信研究院 MIMO-OTA testing method supporting multi-cell interference
CN104754633A (en) * 2013-12-30 2015-07-01 中国移动通信集团公司 Mutual interference testing method and device
CN205693679U (en) * 2016-06-21 2016-11-16 工业和信息化部电信研究院 Terminal test system

Patent Citations (4)

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Publication number Priority date Publication date Assignee Title
CN103188022A (en) * 2011-12-30 2013-07-03 中国移动通信集团公司 Antenna correlation testing method and system
CN104754633A (en) * 2013-12-30 2015-07-01 中国移动通信集团公司 Mutual interference testing method and device
CN104283623A (en) * 2014-10-01 2015-01-14 工业和信息化部电信研究院 MIMO-OTA testing method supporting multi-cell interference
CN205693679U (en) * 2016-06-21 2016-11-16 工业和信息化部电信研究院 Terminal test system

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110166143A (en) * 2018-02-12 2019-08-23 中国信息通信研究院 A kind of test method of base station performance, equipment and system
CN110166143B (en) * 2018-02-12 2021-08-13 中国信息通信研究院 Method, equipment and system for testing performance of base station
CN111132207A (en) * 2018-10-30 2020-05-08 中国移动通信有限公司研究院 Integrated base station equipment testing device and method, storage medium and related equipment
CN111132207B (en) * 2018-10-30 2022-12-13 中国移动通信有限公司研究院 Integrated base station equipment testing device and method, storage medium and related equipment
CN114726411A (en) * 2020-12-22 2022-07-08 中国移动通信集团终端有限公司 3D MIMO OTA darkroom probe system
CN114726411B (en) * 2020-12-22 2023-12-26 中国移动通信集团终端有限公司 3D MIMO OTA darkroom probe system
CN113219262A (en) * 2021-04-26 2021-08-06 深圳市广和通无线股份有限公司 Equipment test method, device, equipment and storage medium
CN113219262B (en) * 2021-04-26 2023-09-08 深圳市广和通无线股份有限公司 Equipment testing method, device, equipment and storage medium

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