CN105844082A - Method for judging main facies in sedimentary facies map and system thereof - Google Patents

Abstract

The invention discloses a method for judging a main facies in a sedimentary facies map and a system thereof. The method comprises the steps of according to the sandstone thickness of each drill point and the maximum thickness and the minimum thickness of the single-layer sandstone, calculating the sand thickness, the ratio of the sandstone thickness and the stratum thickness, the ratio of the sandstone thickness and the stratum thickness corresponding to the single-layer sandstone with the maximum thickness and the ratio of the sandstone thickness and the stratum thickness corresponding to the single-layer sandstone with the minimum thickness, screening out the drill point where the sandstone thickness is bigger than a preset thickness and the layer number of the sandstone is bigger than a preset layer number, and determining the drilling point as the main facies when the thickness of the single-layer sandstone with the maximum thickness, the thickness of the single-layer sandstone with the minimum thickness, the ratio of the sandstone thickness and the stratum thickness corresponding to the single-layer sandstone with the maximum thickness and the ratio of the sandstone thickness and the stratum thickness corresponding to the single-layer sandstone with the minimum thickness of the screened drill point reach the requirements, so the misjudgment of the main facies is prevented, and the accuracy of the sedimentary facies map is improved.

Description

A kind of determination methods depositing leading phase in phasor and system

Technical field

The present invention relates to technical field of geological exploration, deposit the judgement side of leading phase in phasor particularly to a kind of Method and system.

Background technology

Deposition phasor is basic map important in oil and gas exploration and development, sand body planar distribution map It is then the main map of establishment deposition phasor, generally comprises sand thickness figure (being called for short sand thickness figure) and sandy ground ratio Figure (or sand factor figure).On the basis of statistics work area drilling strata and sandstone thickness, establishment is corresponding equivalent Line chart can obtain sand thickness figure and sandy ground than figure.General sandstone thickness is to add up sandstone in a certain stratigraphic unit Cumulative thickness, sandy ground is divided by formation thickness by the cumulative thickness of sandstone than then.

Obtaining sandstone cumulative thickness accurately is the key working out sand thickness figure and sandy ground than figure.Sandstone cumulative thickness Being the statistically thickness of all or most of monolayer sandstone in layer unit, the defect that the method exists is that some bores Sandstone thickness in monolayer is thin, the layer of sand number of plies is many to meet point, and cumulative thickness is big, and non-dominant is mistakenly considered leading phase mutually； Otherwise, thickness in monolayer is big, the number of plies is few, cumulative thickness is little leading is mistakenly considered non-dominant phase mutually；In appearance Problem of stating then can cause the less reliable depositing phasor.

Summary of the invention

Embodiments provide a kind of determination methods depositing leading phase in phasor and system, in order to solve The problem that in prior art, leading phase misjudgment causes depositing phasor less reliable.

A kind of determination methods depositing in phasor leading phase, comprises the following steps:

Add up each each layer sandstone thickness, the sandstone number of plies and formation thickness boring and meeting point；

According to described each layer sandstone thickness screening maximum gauge of monolayer sandstone and minimum thickness, determine that monolayer is Thick sandstone and the thinnest sandstone of monolayer；

Calculate each boring according to described each layer sandstone thickness, the sandstone number of plies and formation thickness and meet the sand thickness of point, sand Sandy ground ratio that ground is more corresponding than, the thickest sandstone of monolayer and sandy ground ratio corresponding to the thinnest sandstone of monolayer；

It is more than more than preset thickness and the sandstone number of plies according to each sand thickness boring chance point and sand layers number riddled sand thickness Point met by the brill presetting the number of plies；

Respectively reach at the thickness boring the thickest sandstone of monolayer meeting point filtered out and the most flaggy thickness of monolayer Maximum empirical thickness and minimum empirical thickness, and sandy ground corresponding to the thickest sandstone of monolayer than and the thinnest sandstone of monolayer Corresponding sandy ground ratio respectively reach maximum experience sandy ground than and minimum experience sandy ground ratio, determine described in filter out Bore chance point and take phase as the leading factor.

Preferably, described sand is calculated by below equation thick:

$h={\mathrm{\Σ}}_{i=1}^n{h}_i;$

Wherein, h is that described sand is thick, and n is the described sandstone number of plies, h_iIt is the thickness of i-th layer of sandstone.

Preferably, calculate described sandy ground by below equation to compare:

$\mathrm{\ρ}=\frac{h}{H};$

Wherein, ρ is described sandy ground ratio, and H is described formation thickness.

Preferably, calculate sandy ground ratio corresponding to the thickest sandstone of described monolayer by below equation and monolayer is the thinnest The sandy ground ratio that sandstone is corresponding:

${\mathrm{\ρ}}_{\max }=\frac{h_{\max }}{H};$

${\mathrm{\ρ}}_{min}=\frac{h_{\min }}{H};$

Wherein, ρ_maxFor the sandy ground ratio that the thickest sandstone of described monolayer is corresponding, h_maxFor the thickest sandstone of described monolayer Thickness, ρ_minFor the sandy ground ratio that the thinnest sandstone of described monolayer is corresponding, h_minFor the most flaggy thickness of described monolayer.

A kind of judgement system depositing in phasor leading phase, including:

Statistical module, for adding up each each layer sandstone thickness, the sandstone number of plies and formation thickness boring chance point；

First screening module, for the maximum gauge according to described each layer sandstone thickness screening monolayer sandstone and Little thickness, determines the thickest sandstone of monolayer and the thinnest sandstone of monolayer；

Computing module, for calculating each brill according to described each layer sandstone thickness, the sandstone number of plies and formation thickness Meet the sand that the sand thickness of point, sandy ground ratio corresponding to sandy ground ratio, the thickest sandstone of monolayer and the thinnest sandstone of monolayer are corresponding Ground ratio；

Second screening module, for the sand according to each brill chance point is thick and sand layers number riddled sand thickness is more than default Thickness and the sandstone number of plies meet point more than the brill presetting the number of plies；

Judge module, at the thickness boring the thickest sandstone of monolayer meeting point filtered out and the thinnest sandstone of monolayer Thickness respectively reach maximum empirical thickness and minimum empirical thickness, and the sandy ground ratio that the thickest sandstone of monolayer is corresponding The sandy ground ratio that sandstone the thinnest with monolayer is corresponding respectively reaches maximum experience sandy ground ratio and minimum experience sandy ground ratio, really The brill filtered out described in Ding is met point and is taken phase as the leading factor.

Preferably, to calculate described sand by below equation thick for described computing module:

$h={\mathrm{\Σ}}_{i=1}^n{h}_i;$

Wherein, h is that described sand is thick, and n is the described sandstone number of plies, h_iIt is the thickness of i-th layer of sandstone.

Preferably, described computing module by below equation calculate described sandy ground compare:

$\mathrm{\ρ}=\frac{h}{H};$

Wherein, ρ is described sandy ground ratio, and H is described formation thickness.

Preferably, described computing module calculates, by below equation, the sandy ground ratio that the thickest sandstone of described monolayer is corresponding And the sandy ground ratio that the thinnest sandstone of monolayer is corresponding:

${\mathrm{\ρ}}_{\max }=\frac{h_{\max }}{H};$

${\mathrm{\ρ}}_{\min }=\frac{h_{\min }}{H};$

Wherein, ρ_maxFor the sandy ground ratio that the thickest sandstone of described monolayer is corresponding, h_maxFor the thickest sandstone of described monolayer Thickness, ρ_minFor the sandy ground ratio that the thinnest sandstone of described monolayer is corresponding, h_minFor the most flaggy thickness of described monolayer.

In the embodiment of the present invention, a kind of determination methods depositing leading phase in phasor and system, bore according to each and meet Sandstone thickness, the maximum gauge of monolayer sandstone and the minimum thickness of point, calculates sand thickness, sandy ground ratio, monolayer Sandy ground ratio that thick sandstone is corresponding and sandy ground ratio corresponding to the thinnest sandstone of monolayer, screening is shaked out thick more than presetting thickness Degree and the sandstone number of plies meet point more than the brill presetting the number of plies, in the thickness boring the thickest sandstone of monolayer meeting point filtered out Degree, the sandy ground ratio sandstone the thinnest with monolayer that the most flaggy thickness of monolayer, the thickest sandstone of monolayer are corresponding are corresponding Than respectively reaching, sandy ground determines when requiring that the brill filtered out is met point and taken phase as the leading factor, it is to avoid the erroneous judgement of leading phase, carries The accuracy of high deposition phasor.

Accompanying drawing explanation

In order to be illustrated more clearly that inventive embodiments of the present invention or technical scheme of the prior art, below The accompanying drawing used required in embodiment or description of the prior art will be briefly described, it is clear that Ground, the accompanying drawing in describing below is only some embodiments of present invention invention, common for this area From the point of view of technical staff, on the premise of not paying creative work, it is also possible to obtain according to these accompanying drawings Other accompanying drawing.

A kind of steps flow chart depositing the determination methods dominating phase in phasor that Fig. 1 provides for the embodiment of the present invention Figure；

A kind of functional module depositing the judgement system dominating phase in phasor that Fig. 2 provides for the embodiment of the present invention Figure.

Detailed description of the invention

Below in conjunction with the accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is carried out clearly Chu, be fully described by, it is clear that described embodiment be only a part of embodiment of the present invention rather than Whole embodiments.Based on the embodiment in the present invention, those of ordinary skill in the art are not making creation The every other embodiment obtained under property work premise, broadly falls into the scope of protection of the invention.

With reference to Fig. 1, embodiments provide a kind of determination methods depositing and dominating phase in phasor, the party Method includes:

Step 100, adds up each each layer sandstone thickness, the sandstone number of plies and formation thickness boring and meeting point；

Step 101, according to maximum gauge and the minimum thickness of described each layer sandstone thickness screening monolayer sandstone, Determine the thickest sandstone of monolayer and the thinnest sandstone of monolayer；

Specifically, the monolayer sandstone with maximum gauge is the thickest sandstone of described monolayer, has minimum thickness Monolayer sandstone is the thinnest sandstone of described monolayer；

Step 102, calculates each boring according to described each layer sandstone thickness, the sandstone number of plies and formation thickness and meets point Sandy ground ratio corresponding to sand thickness, sandy ground ratio corresponding to sandy ground ratio, the thickest sandstone of monolayer and the thinnest sandstone of monolayer；

Specifically, described sand is calculated by below equation (1) thick:

$h={\mathrm{\Σ}}_{i=1}^n{h}_i---\left(1\right);$

In formula (1), h is that described sand is thick, and n is the described sandstone number of plies, h_iIt is the thickness of i-th layer of sandstone；

Calculate described sandy ground by below equation (2) to compare:

$\mathrm{\ρ}=\frac{h}{H}---\left(2\right);$

In formula (2), ρ is described sandy ground ratio, and H is described formation thickness；

By below equation (3) calculate respectively with (4) sandy ground ratio corresponding to the thickest sandstone of described monolayer and The sandy ground ratio that the thinnest sandstone of monolayer is corresponding:

${\mathrm{\ρ}}_{max}=\frac{h_{max}}{H}---\left(3\right);$

${\mathrm{\ρ}}_{min}=\frac{h_{min}}{H}---\left(4\right);$

Wherein, ρ_maxFor the sandy ground ratio that the thickest sandstone of described monolayer is corresponding, h_maxFor the thickest sandstone of described monolayer Thickness, ρ_minFor the sandy ground ratio that the thinnest sandstone of described monolayer is corresponding, h_minFor the most flaggy thickness of described monolayer；

Step 103, bores the sand thickness meeting point with sand layers number riddled sand thickness more than preset thickness and sand according to each Rock stratum number meets point more than the brill presetting the number of plies；

Step 104, in the thickness boring the thickest sandstone of monolayer meeting point filtered out and the most flaggy thickness of monolayer Degree respectively reaches maximum empirical thickness and minimum empirical thickness, and sandy ground ratio corresponding to the thickest sandstone of monolayer and list The sandy ground ratio that the thinnest sandstone of layer is corresponding respectively reaches maximum experience sandy ground ratio and minimum experience sandy ground ratio, determines institute State the brill chance point filtered out and take phase as the leading factor；

Specifically, the brill filtered out described in meets point for step 103 medium sand thickness more than preset thickness and the sandstone number of plies Point is met more than the brill presetting the number of plies.

Based on same inventive concept, embodiments provide a kind of judgement system depositing and dominating phase in phasor System, as in figure 2 it is shown, owing to principle and a kind of deposition of this system solution technical problem dominate phase in phasor Determination methods is similar, and therefore the enforcement of this system can refer to the enforcement of method, repeats no more in place of repetition.

Statistical module 200, for adding up each each layer sandstone thickness, the sandstone number of plies and stratum boring chance point Thickness；

First screening module 201, for the maximum gauge according to described each layer sandstone thickness screening monolayer sandstone And minimum thickness, determine the thickest sandstone of monolayer and the thinnest sandstone of monolayer；

Computing module 202, every for calculating according to described each layer sandstone thickness, the sandstone number of plies and formation thickness Individual boring meets sand thickness of point, sandy ground ratio corresponding to sandy ground ratio, the thickest sandstone of monolayer and monolayer the thinnest sandstone correspondence Sandy ground ratio；

Second screening module 203, for meeting according to each brill, the sand of point is thick and sand layers number riddled sand thickness is more than Preset thickness and the sandstone number of plies meet point more than the brill presetting the number of plies；

Judge module 204, for the thinnest at the thickness boring the thickest sandstone of monolayer meeting point filtered out and monolayer The thickness of sandstone respectively reaches maximum empirical thickness and minimum empirical thickness, and the sand that the thickest sandstone of monolayer is corresponding The ground sandy ground ratio more corresponding than sandstone the thinnest with monolayer respectively reaches maximum experience sandy ground ratio and minimum experience sandy ground ratio, The brill filtered out described in determining is met point and is taken phase as the leading factor.

Should be appreciated that should according to module that in one of the above deposition phasor, the judgement system of leading phase includes is only The logical partitioning that the function that system realizes is carried out, in actual application, can carry out the superposition of above-mentioned module or tear open Point.And the function that a kind of judgement system depositing in phasor leading phase that this embodiment provides is realized is with upper The a kind of of embodiment offer is provided and deposits the determination methods one_to_one corresponding of leading phase in phasor, real for this system institute Existing more detailed handling process, is described in detail in said method embodiment one, the most detailed Thin description.

Those skilled in the art are it should be appreciated that embodiments of the invention can be provided as method, system or meter Calculation machine program product.Therefore, the present invention can use complete hardware embodiment, complete software implementation or knot The form of the embodiment in terms of conjunction software and hardware.And, the present invention can use and wherein wrap one or more Computer-usable storage medium containing computer usable program code (include but not limited to disk memory, CD-ROM, optical memory etc.) form of the upper computer program implemented.

The present invention is with reference to method, equipment (system) and computer program according to embodiments of the present invention Flow chart and/or block diagram describe.It should be understood that can by computer program instructions flowchart and/ Or flow process in each flow process in block diagram and/or square frame and flow chart and/or block diagram and/or The combination of square frame.These computer program instructions can be provided to general purpose computer, special-purpose computer, embedded The processor of datatron or other programmable data processing device is to produce a machine so that pass through computer Or the instruction that the processor of other programmable data processing device performs produces for realizing at flow chart one stream The device of the function specified in journey or multiple flow process and/or one square frame of block diagram or multiple square frame.

These computer program instructions may be alternatively stored in and can guide computer or other programmable data processing device In the computer-readable memory worked in a specific way so that be stored in this computer-readable memory Instruction produces the manufacture including command device, and this command device realizes at one flow process of flow chart or multiple stream The function specified in journey and/or one square frame of block diagram or multiple square frame.

These computer program instructions also can be loaded in computer or other programmable data processing device, makes Sequence of operations step must be performed to produce computer implemented process on computer or other programmable devices, Thus the instruction performed on computer or other programmable devices provides for realizing in one flow process of flow chart Or the step of the function specified in multiple flow process and/or one square frame of block diagram or multiple square frame.

Although preferred embodiments of the present invention have been described, but those skilled in the art once know base This creativeness concept, then can make other change and amendment to these embodiments.So, appended right is wanted Ask and be intended to be construed to include preferred embodiment and fall into all changes and the amendment of the scope of the invention.

Obviously, those skilled in the art can carry out various change and modification without deviating from this to the present invention Bright spirit and scope.So, if the present invention these amendment and modification belong to the claims in the present invention and Within the scope of its equivalent technologies, then the present invention is also intended to comprise these change and modification.

Claims (8)

1. one kind deposits the determination methods of leading phase in phasor, it is characterised in that comprise the following steps:

Add up each each layer sandstone thickness, the sandstone number of plies and formation thickness boring and meeting point；

According to described each layer sandstone thickness screening maximum gauge of monolayer sandstone and minimum thickness, determine that monolayer is Thick sandstone and the thinnest sandstone of monolayer；

Calculate each boring according to described each layer sandstone thickness, the sandstone number of plies and formation thickness and meet the sand thickness of point, sand Sandy ground ratio that ground is more corresponding than, the thickest sandstone of monolayer and sandy ground ratio corresponding to the thinnest sandstone of monolayer；

It is more than more than preset thickness and the sandstone number of plies according to each sand thickness boring chance point and sand layers number riddled sand thickness Point met by the brill presetting the number of plies；

Respectively reach at the thickness boring the thickest sandstone of monolayer meeting point filtered out and the most flaggy thickness of monolayer Maximum empirical thickness and minimum empirical thickness, and sandy ground corresponding to the thickest sandstone of monolayer than and the thinnest sandstone of monolayer Corresponding sandy ground ratio respectively reach maximum experience sandy ground than and minimum experience sandy ground ratio, determine described in filter out Bore chance point and take phase as the leading factor.

2. the method for claim 1, it is characterised in that calculate described sand by below equation thick:

$h={\mathrm{\Σ}}_{i=1}^n{h}_i;$

Wherein, h is that described sand is thick, and n is the described sandstone number of plies, h_iIt is the thickness of i-th layer of sandstone.

3. method as claimed in claim 2, calculates described sandy ground by below equation and compares:

$\mathrm{\ρ}=\frac{h}{H};$

Wherein, ρ is described sandy ground ratio, and H is described formation thickness.

4. method as claimed in claim 3, it is characterised in that calculate described monolayer by below equation Sandy ground ratio that thick sandstone is corresponding and sandy ground ratio corresponding to the thinnest sandstone of monolayer:

${\mathrm{\ρ}}_{\max }=\frac{h_{max}}{H};$

${\mathrm{\ρ}}_{min}=\frac{h_{\min }}{H};$

Wherein, ρ_maxFor the sandy ground ratio that the thickest sandstone of described monolayer is corresponding, h_maxFor the thickest sandstone of described monolayer Thickness, ρ_minFor the sandy ground ratio that the thinnest sandstone of described monolayer is corresponding, h_minFor the most flaggy thickness of described monolayer.

5. one kind deposits the judgement system of leading phase in phasor, it is characterised in that including:

Statistical module, for adding up each each layer sandstone thickness, the sandstone number of plies and formation thickness boring chance point；

First screening module, for the maximum gauge according to described each layer sandstone thickness screening monolayer sandstone and Little thickness, determines the thickest sandstone of monolayer and the thinnest sandstone of monolayer；

Computing module, for calculating each brill according to described each layer sandstone thickness, the sandstone number of plies and formation thickness Meet the sand that the sand thickness of point, sandy ground ratio corresponding to sandy ground ratio, the thickest sandstone of monolayer and the thinnest sandstone of monolayer are corresponding Ground ratio；

Second screening module, for the sand according to each brill chance point is thick and sand layers number riddled sand thickness is more than default Thickness and the sandstone number of plies meet point more than the brill presetting the number of plies；

Judge module, at the thickness boring the thickest sandstone of monolayer meeting point filtered out and the thinnest sandstone of monolayer Thickness respectively reach maximum empirical thickness and minimum empirical thickness, and the sandy ground ratio that the thickest sandstone of monolayer is corresponding The sandy ground ratio that sandstone the thinnest with monolayer is corresponding respectively reaches maximum experience sandy ground ratio and minimum experience sandy ground ratio, really The brill filtered out described in Ding is met point and is taken phase as the leading factor.

6. system as claimed in claim 5, it is characterised in that described computing module passes through below equation meter Calculate described sand thick:

$h={\mathrm{\Σ}}_{i=1}^n{h}_i;$

Wherein, h is that described sand is thick, and n is the described sandstone number of plies, h_iIt is the thickness of i-th layer of sandstone.

7. system as claimed in claim 6, it is characterised in that described computing module passes through below equation meter Calculate described sandy ground to compare:

$\mathrm{\ρ}=\frac{h}{H};$

Wherein, ρ is described sandy ground ratio, and H is described formation thickness.

8. system as claimed in claim 7, it is characterised in that described computing module passes through below equation meter Calculate sandy ground ratio corresponding to the thickest sandstone of described monolayer and the thinnest sandstone of monolayer corresponding sandy ground ratio:

${\mathrm{\ρ}}_{max}=\frac{h_{max}}{H};$

${\mathrm{\ρ}}_{\min }=\frac{h_{\min }}{H};$

Wherein, ρ_maxFor the sandy ground ratio that the thickest sandstone of described monolayer is corresponding, h_maxFor the thickest sandstone of described monolayer Thickness, ρ_minFor the sandy ground ratio that the thinnest sandstone of described monolayer is corresponding, h_minFor the most flaggy thickness of described monolayer.