CN105814541A - 计算机设备及计算机设备内存启动的方法 - Google Patents

计算机设备及计算机设备内存启动的方法 Download PDF

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CN105814541A
CN105814541A CN201480065607.6A CN201480065607A CN105814541A CN 105814541 A CN105814541 A CN 105814541A CN 201480065607 A CN201480065607 A CN 201480065607A CN 105814541 A CN105814541 A CN 105814541A
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memory
operating system
computer
memories
size
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CN105814541B (zh
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何剑
李显才
倪小珂
姚益民
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Huawei Technologies Co Ltd
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Huawei Technologies Co Ltd
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    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F9/00—Arrangements for program control, e.g. control units
    • G06F9/06—Arrangements for program control, e.g. control units using stored programs, i.e. using an internal store of processing equipment to receive or retain programs
    • G06F9/44—Arrangements for executing specific programs
    • G06F9/4401—Bootstrapping
    • G06F9/4406—Loading of operating system
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/221—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test buses, lines or interfaces, e.g. stuck-at or open line faults
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2247—Verification or detection of system hardware configuration
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/27—Built-in tests
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F9/00—Arrangements for program control, e.g. control units
    • G06F9/06—Arrangements for program control, e.g. control units using stored programs, i.e. using an internal store of processing equipment to receive or retain programs
    • G06F9/44—Arrangements for executing specific programs
    • G06F9/4401—Bootstrapping
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/14—Implementation of control logic, e.g. test mode decoders
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F9/00—Arrangements for program control, e.g. control units
    • G06F9/06—Arrangements for program control, e.g. control units using stored programs, i.e. using an internal store of processing equipment to receive or retain programs
    • G06F9/44—Arrangements for executing specific programs
    • G06F9/4401—Bootstrapping
    • G06F9/4411—Configuring for operating with peripheral devices; Loading of device drivers
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C2029/0407—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals on power on
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C2207/00—Indexing scheme relating to arrangements for writing information into, or reading information out from, a digital store
    • G11C2207/22—Control and timing of internal memory operations
    • G11C2207/2254—Calibration
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/20—Memory cell initialisation circuits, e.g. when powering up or down, memory clear, latent image memory

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Software Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Security & Cryptography (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Stored Programmes (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)

Abstract

一种计算机设备和计算机的内存启动的方法，以解决现有技术中内存初始化时间过长影响用户体验的问题。本发明通过提供的计算机设备和计算机的内存启动方法，在计算机上电启动后，基本输入输出系统在内存初始化阶段只初始化第一部分内存，使得操作系统能够启动，并在操作系统启动后，由基本输入输出系统继续初始化计算机中未初始化的内存，使得计算机在启动阶段，不需要等到所有的内存初始化后再启动操作系统，缩短了计算机从启动到进入操作系统的时间，使得用户能够快速进入操作系统进行操作，提高了用户的体验。

Description

PCT国内申请，说明书已公开。

Claims (16)

  1. PCT国内申请，权利要求书已公开。
CN201480065607.6A 2014-11-10 2014-11-10 计算机设备及计算机设备内存启动的方法 Active CN105814541B (zh)

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CN110377550A (zh) * 2019-07-15 2019-10-25 合肥联宝信息技术有限公司 一种实现显示器热插拔功能的方法和计算机设备
CN110716697A (zh) * 2019-09-29 2020-01-21 联想(北京)有限公司 一种信息处理方法和设备
CN111142955A (zh) * 2019-12-31 2020-05-12 联想(北京)有限公司 一种信息处理方法及装置

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CN111381892B (zh) * 2018-12-29 2023-04-28 斑马智行网络(香港)有限公司 一种数据处理方法、装置、设备和机器可读介质
US11550664B2 (en) * 2019-04-08 2023-01-10 Dell Products L.P. Early boot event logging system
CN110737481A (zh) * 2019-09-25 2020-01-31 浙江万胜智能科技股份有限公司 基于多重备份引导程序的嵌入式linux操作系统的启动方法
CN110928582B (zh) * 2019-10-08 2023-09-29 联想企业解决方案(新加坡)有限公司 信息处理设备和配置信息处理设备的目标装置的方法
CN115004155A (zh) * 2020-02-24 2022-09-02 英特尔公司 在运行时实现外部存储器训练
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CN109032623A (zh) * 2018-07-27 2018-12-18 郑州云海信息技术有限公司 一种bios镜像的初始化方法及bios镜像
CN110377550A (zh) * 2019-07-15 2019-10-25 合肥联宝信息技术有限公司 一种实现显示器热插拔功能的方法和计算机设备
CN110716697A (zh) * 2019-09-29 2020-01-21 联想(北京)有限公司 一种信息处理方法和设备
CN111142955A (zh) * 2019-12-31 2020-05-12 联想(北京)有限公司 一种信息处理方法及装置
CN111142955B (zh) * 2019-12-31 2021-07-16 联想(北京)有限公司 一种信息处理方法及装置

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US20170168849A1 (en) 2017-06-15
WO2016074127A1 (zh) 2016-05-19
EP3163441A4 (en) 2017-08-23
EP3163441A1 (en) 2017-05-03
US10481916B2 (en) 2019-11-19
EP3163441B1 (en) 2018-09-19
CN105814541B (zh) 2019-08-02

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