CN105807456B - Lighting test method and device - Google Patents
Lighting test method and device Download PDFInfo
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- CN105807456B CN105807456B CN201610304688.1A CN201610304688A CN105807456B CN 105807456 B CN105807456 B CN 105807456B CN 201610304688 A CN201610304688 A CN 201610304688A CN 105807456 B CN105807456 B CN 105807456B
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- examining system
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
Abstract
The present invention provides a kind of lighting test method and device, wherein exports time configuration information and initialization information according to test request；The time configuration information includes being in specified time in different time periods；According to time configuration information, trigger signal is generated in different specified times, constantly switches the switch state of the examining system；It stores the examining system and responds the first trigger signal and the second trigger signal total degree respectively；Judge whether total degree reaches test request, if reached, terminates the lighting test of examining system；If do not reached also, continue the lighting test of examining system.Before not reaching for the first specified time, comprising: according to initialization information, export Transistor-Transistor Logic level signal；Signal needed for Transistor-Transistor Logic level signal is converted to rear class mould group to be measured.The lighting test method and device not only meets the experiment test request of complicated periodic switch machine, also meets every function lighting experiment test request of common liquid crystal module.
Description
Technical field
The present invention relates to display field more particularly to a kind of lighting test method and devices.
Background technique
Referring to FIG. 1, Fig. 1 is the structural block diagram of available liquid crystal display screen lighting reliability test system.As shown in Figure 1,
The lighting reliability test system includes microprocessor, field programmable gate array, bridge chip and mould group to be measured.Microprocessor
Initializing field programmable gate array, and testing time information is sent to field programmable gate array.Field-programmable gate array
Row initialization bridge chip, and Transistor-Transistor Logic level signal is transmitted to bridge chip, the bridge chip signal required to mould group to be measured output test is simultaneously
Complete reliability test lighting.
Although the lighting reliability test system under the conditions of failtests, can test every function of liquid crystal module
Whether meet product specification, but special failtests, such as periodic switch machine are tested, which surveys
Test system is not to be able to satisfy testing requirement.
Summary of the invention
The purpose of the present invention includes providing a kind of lighting test method and device, to solve existing lighting test method
And device is not able to satisfy the technical issues of periodic switch machine test experiments requirement.
Specifically, the present invention provides a kind of lighting test method, for carrying out lighting test to examining system comprising with
Lower step:
Time configuration information and initialization information are exported according to test request；Wherein, the time configuration information includes place
In specified time in different time periods；
According to the time configuration information, trigger signal is generated in different specified times, constantly switches the system to be measured
The switch state of system；
Store the total degree that the examining system responds the first trigger signal and the second trigger signal respectively；
Judge whether the total degree reaches test request, if reached, terminates the lighting test of examining system；If
Do not reach also, then continues the lighting test of examining system.
Further, when the time configuration information reach the first specified time when, generate the first trigger signal, switching to
Examining system is in the open state or closed state；Then, reach the second specified time when, generate the second trigger signal, switching to
Examining system is in close state or opening state.
Further, before not reaching first specified time, specifically includes the following steps:
According to initialization information, Transistor-Transistor Logic level signal is exported, and Transistor-Transistor Logic level signal is converted to needed for rear class mould group to be measured
Signal to test rear class mould group to be measured.
Further, when terminating the lighting test of examining system, specifically further include: generate prompt information to remind test
Member's test terminates.
The present invention also provides a kind of lighting test devices, for carrying out lighting test to examining system comprising:
Microprocessor, for exporting time configuration information and initialization information according to test request；Wherein, the time matches
Confidence breath includes being in specified time in different time periods；
Field programmable gate array, for being initialized according to the initialization information；
Clock chip, for generating trigger signal in different specified times, constantly cutting according to the time configuration information
Change the switch state of the examining system；
Memory module, total time for responding the first trigger signal and the second trigger signal respectively for storing the examining system
Number；
When whether the total degree reaches test request, if reached, terminate the lighting test of examining system；If also
Do not reach, then continues the lighting test of examining system.
Further, when the clock chip reached for the first specified time, the first trigger signal is generated, system to be measured is switched
It unites in the open state or closed state；Then, when reaching for the second specified time, the clock chip generates the second triggering letter
Number, switching examining system is in close state or opening state.
Further, the lighting test device further includes bridge chip and time showing module, and the bridge chip is used for
Rear class mould group to be measured is driven, the time showing module is for showing testing time and test status.
Further, when the clock chip does not reach first specified time, specifically includes the following steps:
The field programmable gate array initializes bridge chip, and exports Transistor-Transistor Logic level signal to bridge chip；
Signal needed for Transistor-Transistor Logic level signal is converted to rear class mould group to be measured by the bridge chip.
Further, the lighting test device further includes prompt equipment, and the prompt equipment is for terminating examining system
Lighting test when, generate prompt information so as to remind test man test terminate.
Lighting test method and device provided by the embodiment of the present invention, microprocessor can be according to test request configurable clock generators
Chip, clock chip trigger the rear class electricity that examining system was closed and opened to field programmable gate array according to preset specified time
Source and signal output, the number that field programmable gate array is exported according to the rear level power supply and signal for closing or opening examining system
Whether test request is reached, with the experiment test purpose of execution cycle property switching on and shutting down.The lighting test method and device can expire
The experiment test request of the complicated periodic switch machine of foot.
The above description is only an overview of the technical scheme of the present invention, in order to better understand the technical means of the present invention,
And it can be implemented in accordance with the contents of the specification, and in order to allow above and other objects, features and advantages of the invention can
It is clearer and more comprehensible, it is special below to lift preferred embodiment, and cooperate attached drawing, detailed description are as follows.
Detailed description of the invention
Fig. 1 is the structural block diagram of available liquid crystal display screen lighting reliability test system.
Fig. 2 provides a kind of lighting test method testing flow chart for the embodiment of the present invention.
Fig. 3 provides a kind of circuit module schematic diagram of lighting test device for the embodiment of the present invention.
Specific embodiment
Further to illustrate the present invention to reach the technical means and efficacy that predetermined purpose is taken, below in conjunction with attached drawing
And preferred embodiment, to a kind of specific embodiment, method, the step of lighting test method and device proposed according to the present invention
Suddenly, structure, feature and effect, detailed description is as follows.
For the present invention aforementioned and other technology contents, feature and effect refer to the preferable reality of schema in following cooperation
Applying can clearly be presented in example detailed description.By the explanation of specific embodiment, when predetermined mesh can be reached to the present invention
The technical means and efficacy taken be able to more deeply and it is specific understand, however institute's accompanying drawings are only to provide with reference to and say
It is bright to be used, it is not intended to limit the present invention.
Lighting test method provided in an embodiment of the present invention can be not only used for carrying out examining system lighting test, also
Rear class mould group to be measured can be tested before carrying out lighting test to examining system.Wherein, the lighting test method lighting test
When examining system, the switching of the rear level power supply of examining system and the on and off of signal output is controlled.Rear class herein
Mainly under the conditions of failtests, whether the every function for testing liquid crystal module meets product rule for the test of mould group to be measured
Lattice.It is the specific embodiment of lighting test method of the present invention below.
Referring to FIG. 2, Fig. 2 provides a kind of lighting test method testing flow chart for the embodiment of the present invention.The lighting is surveyed
Method for testing the following steps are included:
Step S1 exports time configuration information and initialization information according to test request.
Herein, the time configuration information includes being in specified time in different time periods, for example will be used for system to be measured
The period of the lighting test of system is divided into continuous and recyclable the first specified time and the second specified time.Wherein, each finger
Fix time is needed according to actual test come limiting time value.Initialization information herein is surveyed for test macro, lighting
It when examination, needs to empty last lighting test information, then inputs current lighting test again and need test macro quasi-
Standby relevant configuration information.
Step S2 judges whether to reach for the first specified time.
Step S3 generates the first trigger signal.If reaching for the first specified time, the first trigger signal is generated.
Herein, according to the time configuration information in step S1, trigger signal is generated in different specified times, constantly
Switch the switch state of the examining system.Switch state herein includes the rear level power supply of examining system and beating for signal output
The two states of open and close state.Periodic switch machine test experiments will complete power supply according to the performance requirement of examining system
Or the "ON" and " closing " the two movements of signal output, executed within a certain period of time according to examining system "ON" and " closing " the two
The total degree of movement is to examine whether examining system meets test purpose.For example, when reaching the first specified time, output first
Trigger signal is exported with the rear level power supply and signal of closing examining system, this is the movement of " closing ".Certainly, tester can also be certainly
Definition acts herein for "ON", i.e. when the first specified time reaches, trigger signal opens the rear level power supply and signal of examining system
Output.
Step S4 judges whether to reach for the second specified time.
Herein, if having not arrived for the second specified time, in conjunction with step S3, continue to output the first trigger signal, switching to
Rear level power supply and the signal output of examining system open or close.
Step S5 generates the second trigger signal.If reach the second specified time, generate the second trigger signal, switching to
The state of rear level power supply and the signal output of examining system.
In conjunction with step S3 and S5, so far, examining system responds first trigger signal and the second trigger signal respectively.
Such as a switch state has been completed in periodic switch machine test experiments, rear level power supply and the signal output of examining system, i.e.,
Complete two movements of " closing " and "ON".The first specified time and the second specified time of another circulation later are according to preceding
First specified time of circulation and the switching mode of the second specified time carry out.The deadline of test is according to test request
To determine.Such as need to complete examining system 1000 times switch state switching, that is, need 1000 times " closing " movement and 1000 times
The cyclic switching of "ON" movement.
Step S6 stores the total degree that the examining system responds the first trigger signal and the second trigger signal respectively.
Step S7, judges whether total degree reaches test request.
Herein, if total degree reaches test request, terminate the lighting test of examining system；If do not reached also,
Continue the lighting test of examining system.
Step S8 generates prompt information.
Herein, while terminating the lighting test of examining system, lighting test method of the embodiment of the present invention further includes producing
The step of raw prompt information is to remind test man to test end.Wherein, which can be buzzer or loudspeaker
Sound is also possible to the light of LED light.
During lighting test, according to the time configuration information, it is specified that test macro does not reach described first also
Before time, and also specifically includes the following steps:
S91, output Transistor-Transistor Logic level signal.
In step S91, test macro exports Transistor-Transistor Logic level signal according to the initialization information in step S1.
S92, Transistor-Transistor Logic level signal is converted to rear class mould group to be measured needed for signal.
In step S92, the test of the mould group to be measured of rear class herein mainly under the conditions of failtests, tests liquid crystal
Whether every function of mould group meets product specification.
In conjunction with step S91 and S92, in addition to Transistor-Transistor Logic level signal, test macro can also export other and meet data transmission association
The level signal for standard of assessing a bid for tender, and can also be converted to needed for rear class mould group to be measured according to the level signal according to built-in algorithm
Signal.
Therefore, lighting test method provided in an embodiment of the present invention not only can satisfy common failtests demand,
And it is able to satisfy failtests demand more special in time.
On this basis, the present embodiment also provides a kind of lighting test device, referring to FIG. 3, Fig. 3 is the embodiment of the present invention
A kind of circuit module schematic diagram of lighting test device is provided.As shown in figure 3, microprocessor 10 respectively with field-programmable gate array
Column 20 and clock chip 30 communicate, and are believed according to test request field programmable gate array 20 and 30 input initialization of clock chip
Breath, and further to clock chip 30 input time configuration information.Initializing field programmable gate array 20, on the one hand, clear
Except previous test remains in the configuration information of the memory of field programmable gate array 20, on the other hand, to field-programmable gate array
The configuration of column 20 related parameter with test.
Clock chip 30 is in subsequent testing procedure, according to time configuration information, generates triggering letter according to specified time
Number.Herein, the time configuration information includes being in specified time in different time periods, for example will be used for point to examining system
The period of lamp test is divided into continuous and recyclable the first specified time and the second specified time.Wherein, each specified time
It is to be needed according to actual test come limiting time value.
Field programmable gate array 20 generates trigger signal in different specified times, constantly switches the examining system
Switch state.Switch state herein includes two kinds of the rear level power supply of examining system and the on and off of signal output
State.Periodic switch machine test experiments according to the performance requirement of examining system, to complete power supply or signal output "ON" and
" closing " the two movements execute the total degree of "ON" and " closing " the two movements within a certain period of time according to examining system to examine
Whether examining system meets test purpose.For example, the first trigger signal of output is to be measured to close when reaching the first specified time
The rear level power supply and signal of system export, this is the movement of " closing ".Certainly, tester can be with customized dynamic for "ON" herein
Make, i.e. when the first specified time reaches, trigger signal opens rear level power supply and the signal output of examining system.And then, it reaches
When the second specified time, the second trigger signal is generated, to open rear level power supply and the signal output of examining system, this is "ON"
Movement.So far, a switch state has been completed in rear level power supply and the signal output of examining system, i.e. completion " closing " and "ON"
Two movements.Later another circulation first specified time and the second specified time according to preceding circulation first it is specified when
Between and the switching mode of the second specified time carry out.The deadline of test is determined according to test request.For example it needs
The switch state switching for completing examining system 1000 times needs 1000 times " closing " movements and the circulation of 1000 "ON" movement to cut
It changes.
Memory module 40 stores the total degree that the examining system responds the first trigger signal and the second trigger signal respectively.
If whether total degree reaches test request, terminate the lighting test of examining system；If do not reached also, continue system to be measured
The lighting test of system.Memory module 40 can be using the memory built in field programmable gate array 20 herein, or can also be with
Using the memory of peripheral hardware.
So far, the experiment test of complicated periodic switch machine is completed in lighting test device provided in an embodiment of the present invention
It is required that.
While terminating the lighting test of examining system, equipment 50 is prompted to generate prompt information to remind test man to survey
Examination terminates.Wherein, which can be buzzer or loudspeaker or LED light.
If clock chip 30 had not arrived for the first specified time, field programmable gate array 20 initializes bridge chip
60, and Transistor-Transistor Logic level signal is exported to bridge chip 60, Transistor-Transistor Logic level signal is converted to needed for rear class mould group 70 to be measured by bridge chip 60
Signal, for driving rear class mould group 70 to be measured.Therefore, which also meets every machine of common liquid crystal module
It can lighting test requirement.
80 recording and displaying testing time of time showing module and test status, so that test man knows the testing time.
The experiment that lighting test device provided in an embodiment of the present invention can not only meet complicated periodic switch machine is surveyed
Examination requires, but also meets every function lighting test requirement of common liquid crystal module.Therefore, the present invention also protects the point
Application of the test device in liquid crystal display panel lighting test.
The above, only be invention preferred embodiment, be not intended to limit the present invention in any form, although
The present invention has been disclosed as a preferred embodiment, and however, it is not intended to limit the invention, any person skilled in the art,
Without departing from the scope of the present invention, when the technology contents using the disclosure above make a little change or are modified to
With the equivalent embodiment of variation, but without departing from the technical solutions of the present invention, according to the technical essence of the invention to above
Any simple modification, equivalent change and modification made by embodiment, all of which are still within the scope of the technical scheme of the invention.
Claims (9)
1. a kind of lighting test method, for carrying out lighting test to examining system, which comprises the following steps:
Time configuration information and initialization information are exported according to test request；Wherein, the time configuration information includes in not
With the specified time of period；
According to the time configuration information, trigger signal is generated in different specified times, constantly switches the examining system
Switch state；
Store the total degree that the examining system responds the first trigger signal and the second trigger signal respectively；
Judge whether the total degree reaches test request, if reached, terminates the lighting test of examining system；If do not had also
Reach, then continues the lighting test of examining system.
2. lighting test method according to claim 1, which is characterized in that refer to when the time configuration information reaches first
When fixing time, the first trigger signal is generated, examining system is in the open state or closed state for switching；Then, second is reached to refer to
When fixing time, the second trigger signal is generated, switching examining system is in close state or opening state.
3. lighting test method according to claim 2, which is characterized in that before not reaching first specified time, tool
Body the following steps are included:
According to initialization information, Transistor-Transistor Logic level signal is exported；
Signal needed for the Transistor-Transistor Logic level signal is converted to rear class mould group to be measured is to test rear class mould group to be measured.
4. lighting test method according to claim 1, which is characterized in that when terminating the lighting test of examining system, tool
Body further include: generate prompt information to remind test man that test terminates.
5. a kind of lighting test device, for carrying out lighting test to examining system characterized by comprising
Microprocessor, for exporting time configuration information and initialization information according to test request；Wherein, the time matches confidence
Breath includes being in specified time in different time periods；
Field programmable gate array, for being initialized according to the initialization information；
Clock chip, for generating trigger signal in different specified times, constantly switching institute according to the time configuration information
State the switch state of examining system；
Memory module responds the total degree of the first trigger signal and the second trigger signal for storing the examining system respectively；
When whether the total degree reaches test request, if reached, terminate the lighting test of examining system；If do not reached also
It arrives, then continues the lighting test of examining system.
6. lighting test device according to claim 5, which is characterized in that when clock chip arrival first is specified
Between when, generate the first trigger signal, examining system is in the open state or closed state for switching；Then, when arrival second is specified
Between when, the clock chip generates the second trigger signal, and switching examining system is in close state or opening state.
7. lighting test device according to claim 5, which is characterized in that the lighting test device further includes bridge chip
And time showing module, the bridge chip is for driving rear class mould group to be measured, and the time showing module is for showing test
Time and test status.
8. lighting test device according to claim 7, which is characterized in that the clock chip do not reach first it is specified when
Between when, specifically includes the following steps:
The field programmable gate array initializes bridge chip, and exports Transistor-Transistor Logic level signal to bridge chip；
Signal needed for Transistor-Transistor Logic level signal is converted to rear class mould group to be measured by the bridge chip.
9. lighting test device according to claim 5, which is characterized in that the lighting test device further includes that prompt is set
It is standby, when the prompt equipment is used to terminate the lighting test of examining system, prompt information is generated to remind test man to test knot
Beam.
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| CN201610304688.1A CN105807456B (en) | 2016-05-10 | 2016-05-10 | Lighting test method and device |
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| CN201610304688.1A CN105807456B (en) | 2016-05-10 | 2016-05-10 | Lighting test method and device |
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| CN105807456B true CN105807456B (en) | 2019-02-22 |
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Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN107402460B (en) | 2017-08-07 | 2020-03-24 | 京东方科技集团股份有限公司 | Lighting control system board, detection method and lighting detection device |
| CN113053273A (en) * | 2020-12-15 | 2021-06-29 | 四川长虹电器股份有限公司 | Method for judging and controlling lighting of DLP micro-throw product optical machine through IIC communication |
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| US6014035A (en) * | 1997-07-11 | 2000-01-11 | International Business Machines Corporation | Test system and test method for liquid crystal display device |
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