CN105807082B - A kind of speed measuring device - Google Patents
A kind of speed measuring device Download PDFInfo
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- CN105807082B CN105807082B CN201610271932.9A CN201610271932A CN105807082B CN 105807082 B CN105807082 B CN 105807082B CN 201610271932 A CN201610271932 A CN 201610271932A CN 105807082 B CN105807082 B CN 105807082B
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P3/00—Measuring linear or angular speed; Measuring differences of linear or angular speeds
- G01P3/36—Devices characterised by the use of optical means, e.g. using infrared, visible, or ultraviolet light
Abstract
The present invention provides a kind of speed measuring device, including the first THz wave light source, second THz wave light source, light splitting piece, frequency mixer, oscillograph and data processing equipment, first beam section of the first THz wave light source transmitting is incident on measured target target through light splitting piece, after the first light beam reflected through measured target target is incident on light splitting piece, frequency mixer is reflexed to by light splitting piece, second light beam of the second THz wave light source transmitting is incident on the frequency mixer, frequency mixer carries out Frequency mixing processing to the first light beam and the second light beam and exports electric signal to oscillograph, data processing equipment analyzes data to obtain the motion information of measured target target.The interference signal of this bifrequency THz wave has the characteristics that AC modulation, noise is relatively high, good in anti-interference performance, and it is insensitive to the variation of direct current signal in interference signal, in addition, using frequency mixer as interference signal detector, adjusting is simple and convenient, solves the problems, such as difficult using beam adjusting is closed when conventional interference optical path.
Description
Technical field
The present invention relates to optical interference velocity measuring technique fields, in particular to a kind of speed measuring device.
Background technique
Speed, acceleration and bullet bottom pressure of the shell in thorax are the key that cannon and shell emission system design ginseng
Number, for developing interior ballistics theory, the novel cannon of research and small arms and verify etc. having great importance to weapon.
Currently, the major experimental technology of trajectory parameter has microwave interference measuring technique and laser dry when measurement bullet continuously moves in thorax
Relate to velocity measuring technique.But the uncertainty of microwave interference technology measurement is larger, laser interferometry techniques are for the cigarette in trajectory
Dirt penetrability is poor and has very high requirement to oscillograph bandwidth and sample rate.So how to design a kind of penetrability it is good,
The optical interference speed measuring device that bandwidth requirement is low and measurement accuracy is high is current urgent problem to be solved.
Summary of the invention
In view of this, the purpose of the present invention is to provide a kind of speed measuring device, to improve the above problem.
The present invention is implemented as follows:
A kind of speed measuring device, including the first THz wave light source, the second THz wave light source, light splitting piece, frequency mixer, oscillography
Device and data processing equipment,
The first THz wave light source is used to emit the first light beam with first frequency, the second Terahertz glistening light of waves
Source is used to emit the second light beam with second frequency, and wherein first frequency is different from second frequency,
First beam section is incident on target through the light splitting piece, and the first light beam through target reflection is incident
To after the light splitting piece, the frequency mixer is reflexed to by the light splitting piece, second light beam is incident on the frequency mixer,
The frequency mixer carries out Frequency mixing processing with second light beam to first light beam and exports corresponding electric signal
The extremely oscillograph,
The data processing equipment is analyzed the data of the oscillograph recording to obtain the speed of the target
Information and displacement information.
There are two clear advantages for this speed measuring device tool, one is, the interference signal of bifrequency THz wave, which has, to be handed over
The characteristics of stream modulation, the velocity information of measured target target is loaded on interference signal in a manner of frequency modulation, therefore the measuring technique
Noise it is relatively high, good in anti-interference performance is AC signal additionally, due to measuring signal, therefore to direct current signal in interference signal
Variation it is insensitive；The second is using frequency mixer as interference signal detector, two beam THz waves can directly input frequency mixer
It carries out Frequency mixing processing and exports corresponding interference signal, adjusting is simple and convenient, solves using conjunction beam tune when conventional interference optical path
Save difficult problem.
Further, the speed measuring device further includes polarizing film, and the polarizing film is set to the light splitting piece and the mesh
In light transmission path between target, it is adjusted for the polarization state to first light beam.
After target reflects, polarization state may change first light beam, and setting polarizing film carries out the first light beam
Polarization-maintaining, so that the polarization state of itself and the second light beam is consistent as far as possible.
Further, the speed measuring device further includes the first power being adjusted for the power to first light beam
Adjuster and the second power governor being adjusted for the power to second light beam,
First power governor is set to the optical transport between the first THz wave light source and the light splitting piece
In path,
Second power governor is set to the optical transport between the second THz wave light source and the frequency mixer
In path.
First power governor and the second power governor are respectively used to the intensity and the of the optical signal of the first light beam of decaying
The intensity of the optical signal of two light beams, its object is to adjust the power of the first light beam and second light beam that eventually enter into frequency mixer
Size avoids the light intensity of the first light beam or the second light beam from crossing ambassador's frequency mixer saturation.
Further, the speed measuring device further includes the first collimation lens and the second collimation lens, and first collimation is saturating
Mirror is set in the light transmission path between the first THz wave light source and first power governor, for described
First light beam carries out collimation and handles to reduce the angle of divergence of first light beam,
Second collimation lens is set between the second THz wave light source and second power governor
In light transmission path, for carrying out collimation processing to second light beam to reduce the angle of divergence of second light beam.
Further, the speed measuring device further includes the first optoisolator and the second optoisolator, first optical isolation
Device is set in the light transmission path between first collimation lens and first power governor, for preventing described
The reflected light or rear orientation light of one light beam enter to be emitted back towards the first THz wave light source,
Second optoisolator is set to the biography of the light between second collimation lens and second power governor
In defeated path, reflected light or rear orientation light for preventing second light beam enter to be emitted back towards the second THz wave light source.
The purpose that the first optoisolator and the second optoisolator is arranged is, prevents the reflection of the first light beam and the second light beam
Light or rear orientation light incidence light echo source, the generations such as the power of the light beam emitted to light source or frequency are interfered, and measurement essence is influenced
Degree.
Further, the speed measuring device further include the first condenser lens for being focused to first light beam and
The second condenser lens for being focused to second light beam,
First condenser lens is set in the light transmission path between the light splitting piece and the frequency mixer,
Second condenser lens is set to the light transmission path between second power governor and the frequency mixer
In.
Further, the speed measuring device further includes low-pass filter, the signal input part of the low-pass filter and institute
State the signal output end connection of frequency mixer, the signal input part company of the signal output end of the low-pass filter and the oscillograph
It connects.
Further, the light splitting piece is semi-transparent semi-reflecting.
Semi-transparent semi-reflecting light intensity transmitance and reflectivity is 0.5, and the first light beam into frequency mixer can be made to have
Maximum dump energy.
Further, the light splitting piece is high resistant silicon wafer.
Further, the first THz wave light source includes the first local oscillator light source and the first frequency multiplier, the first
The light beam of vibration light source transmitting forms first light beam, the second THz wave light source packet after the first frequency multiplier frequency multiplication
Include the second local oscillator light source and the second frequency multiplier, the light beam of the second local oscillator light source transmitting shape after the second frequency multiplier frequency multiplication
At second light beam.
First local oscillator light source is formed through the first frequency multiplier process of frequency multiplication with first frequency after emitting a branch of fundamental frequency optical signal
THz wave light beam, the second local oscillator light source, which emits to be formed through the second frequency multiplier processing after a branch of fundamental frequency optical signal, has the second frequency
The THz wave light beam of rate.
Speed measuring device provided by the invention use with certain frequency difference two beam THz waves respectively as signal light with
Reference light measures the motion information (velocity information and displacement information) of measured target target, surveys with traditional optical interference
Amount technology is compared, and the interference signal of this bifrequency THz wave has the characteristics that AC modulation, the speed letter of measured target target
Breath is loaded on mixed frequency signal in a manner of frequency modulation, and the noise of obtained mixed frequency signal is relatively high, good in anti-interference performance, and
It is insensitive to the variation of direct current signal in interference signal since measuring signal is AC signal, in addition, being made using frequency mixer
For interference signal detector, two beam THz waves can directly input frequency mixer and carry out Frequency mixing processing and export corresponding interference letter
Number, adjusting is simple and convenient, solves the problems, such as difficult using beam adjusting is closed when conventional interference optical path.
Detailed description of the invention
In order to illustrate the technical solution of the embodiments of the present invention more clearly, below will be to needed in the embodiment attached
Figure is briefly described, it should be understood that the following drawings illustrates only certain embodiments of the present invention, therefore is not construed as pair
The restriction of range for those of ordinary skill in the art without creative efforts, can also be according to this
A little attached drawings obtain other relevant attached drawings.
Fig. 1 is a kind of schematic diagram for speed measuring device that the embodiment of the present invention 1 provides；
Fig. 2 is the schematic diagram for another speed measuring device that the embodiment of the present invention 1 provides；
Fig. 3 is a kind of schematic diagram for speed measuring device that the embodiment of the present invention 2 provides；
Fig. 4 is the schematic diagram for another speed measuring device that the embodiment of the present invention 2 provides；
Fig. 5 is a kind of schematic diagram for speed measuring device that the embodiment of the present invention 3 provides；
Fig. 6 is the schematic diagram for another speed measuring device that the embodiment of the present invention 3 provides；
Fig. 7 is speed measuring device provided in an embodiment of the present invention under prescribed conditions to measured target target progress motion information
The analog simulation result figure of measurement；
Fig. 8 is the movement velocity curve graph of simulation measured target target provided in an embodiment of the present invention；
Fig. 9 is the velocity of displacement curve graph of simulation measured target target provided in an embodiment of the present invention.
Appended drawing reference:
First THz wave light source 100；Second THz wave light source 200；Light splitting piece 300；Frequency mixer 400；Oscillograph
500；Data processing equipment 600；First input end 40；Second input terminal 402；Measured target target 10；First local oscillator light source 101；
First frequency multiplier 102；Second local oscillator light source 201；Second frequency multiplier 202；Polarizing film 700；First power governor 800；Second
Power governor 900；First collimation lens 110；Second collimation lens 210；First optoisolator 310；Second optoisolator
410；First condenser lens 510；Second condenser lens 610；Low-pass filter 710.
Specific embodiment
In order to make the object, technical scheme and advantages of the embodiment of the invention clearer, below in conjunction with the embodiment of the present invention
In attached drawing, technical scheme in the embodiment of the invention is clearly and completely described, it is clear that described embodiment is
A part of the embodiment of the present invention, instead of all the embodiments.The present invention being usually described and illustrated herein in the accompanying drawings is implemented
The component of example can be arranged and be designed with a variety of different configurations.
It should also be noted that similar label and letter indicate similar terms in following attached drawing, therefore, once a certain Xiang Yi
It is defined in a attached drawing, does not then need that it is further defined and explained in subsequent attached drawing.
In the description of the present invention, it should be noted that unless otherwise clearly defined and limited, term " setting ", " phase
Even ", " connection " shall be understood in a broad sense, for example, it may be being fixedly connected, may be a detachable connection, or be integrally connected；It can
To be mechanical connection, it is also possible to be electrically connected；It can be directly connected, can also can be indirectly connected through an intermediary
Connection inside two elements.For the ordinary skill in the art, above-mentioned term can be understood at this with concrete condition
Concrete meaning in invention.
Therefore, the detailed description of the embodiment of the present invention provided in the accompanying drawings is not intended to limit below claimed
The scope of the present invention, but be merely representative of selected embodiment of the invention.Based on the embodiments of the present invention, this field is common
Technical staff's every other embodiment obtained without making creative work belongs to the model that the present invention protects
It encloses.
Embodiment 1 please refers to Fig. 1 to Fig. 2
As shown in Figure 1, speed measuring device provided in this embodiment, including the first THz wave light source 100, the second THz wave
Light source 200, light splitting piece 300, frequency mixer 400, oscillograph 500 and data processing equipment 600.Wherein, the first Terahertz glistening light of waves
Source 100 is used to emit the first light beam with first frequency, and the second THz wave light source 200 is used to emit with second frequency
Second light beam.Wherein, first frequency is different from second frequency, i.e. the first light beam has certain frequency poor with the second light beam.Mixing
Device 400 is used as a kind of photodetector, for carrying out interference Frequency mixing processing to the first light beam and the second light beam.Specifically, it is mixed
There are two input terminals, respectively first input end 401 and the second input terminal 402 for the tool of device 400, and the first light beam is by first input end
401 enter to inject frequency mixer 400, and the second light beam enters to inject frequency mixer 400 by the second input terminal 402.Data processing equipment 600 can be with
Be computer or it is any other can be to the calculating equipment that data are analyzed and processed.
The concrete operating principle of the speed measuring device is that the first light beam that the first THz wave light source 100 is launched is used as letter
After number light is incident on light splitting piece 300, a part is reflected, and another part is incident on measured target target 10 through light splitting piece 300.Enter
The first light beam of measured target target 10 is mapped to after the reflection of measured target target 10 and is back to light splitting piece 300, and again through light splitting piece
300 carry out light-splitting processing, and a part penetrates light splitting piece 300, and another part is after the reflection of light splitting piece 300 by first input end 401
Enter to inject in frequency mixer 400.The second light beam that second THz wave light source 200 is launched is as reference light directly from the second input
End 402 enters to inject frequency mixer 400.The first light beam for entering to inject frequency mixer 400 respectively generates in frequency mixer 400 with the second light beam
Interference, the interference signal of the detection generation of frequency mixer 400 are simultaneously converted into corresponding voltage signal.Frequency mixer 400 believes voltage
Number output to oscillograph 500 so that oscillograph 500 records the voltage signal.Finally, by data processing equipment 600 to oscillography
The electric signal that device 500 records is analyzed and is handled, and the velocity information of measured target target 10 is obtained, yet further by the speed
Degree information obtains the displacement information of measured target target 10.
Specifically, the measuring principle of data processing equipment 600 is, it is assumed that the frequency of the first light beam is f1, the second light beam
Frequency is f2, when measured target target 10 is stationary, due to f1≠f2, so the frequency of mixed frequency signal is two beam THz waves
Intrinsic frequency difference f1-f2, it may be assumed that
Wherein, V represents the output voltage of frequency mixer 400, VrIt represents and there was only the second light beam (reference light) incident frequency mixer 400
When frequency mixer 400 output voltage, VsFrequency mixer 400 is defeated when representing only the first light beam (signal light) incident frequency mixer 400
Voltage out,Represent the initial phase factor.
If measured target target 10 is with speed u (t) movement, the first light beam is incident on 10 back reflection of measured target target and returns too
The frequency of Hertz wave is by primary frequency f1Become f1', frequency variation is known as Doppler frequency shift, the size direct ratio of Doppler frequency shift
In the movement velocity u (t) of measured target target 10, it is shown below:
At this point, the frequency of mixed frequency signal increases by a Doppler frequency shift on the basis of intrinsic frequency of two beam THz waves is poor
Amount, it may be assumed that
Wherein, c represents the spread speed of electromagnetic wave in a vacuum.
As shown from the above formula, when measured target target 10 is with speed u (t) movement, mixed frequency signal that oscillograph 500 is recorded
It is related with the movement velocity of measured target target 10.In formula, the frequency of mixed frequency signal is the intrinsic frequency difference f of two beam THz waves1-
f2With Doppler frequency shift amountThe sum of, therefore it is f that mixed frequency signal can be regarded as to a fundamental frequency1-f2, frequency modulation be
AC frequency modulation signal.Time-frequency convert is carried out to the electric signal that oscillograph 500 records using Short Time Fourier Transform, can be obtained
The movement velocity u (t) of measured target target 10, and then obtain the displacement information L (t) of measured target target 10.
As shown in Fig. 2, optionally, the first THz wave light source 100 includes the first local oscillator light source 101 and the first frequency multiplier
102, the second THz wave light source 200 includes the second local oscillator light source 201 and the second frequency multiplier 202.The transmitting of first local oscillator light source 101
A basic frequency beam out forms THz wave light beam, i.e. first with first frequency after 102 process of frequency multiplication of the first frequency multiplier
Light beam.Similarly, the second local oscillator light source 201 launches a basic frequency beam, after 202 process of frequency multiplication of the second frequency multiplier, is formed too
Hertz wave light beam, i.e., with the second light beam of second frequency.
What needs to be explained here is that after frequency multiplier carries out frequency multiplication to signal, the power of signal can drop by practical application
It is low, it needs to carry out power amplification again, can be only achieved the requirement of subsequent probe.So when it is implemented, the first frequency multiplier 102 and
Varactor doubler 202 can be substituted by AMC (Amplifier Multiplier Chain, power amplification frequency multiplication link), to fundamental frequency light
Signal carries out frequency multiplication and power amplification processing, to form THz wave light beam.
For light splitting piece 300, it is contemplated that it is finally incident on the energy of the first light beam of frequency mixer 400, it is theoretically, best
THz wave transmissivity and reflectivity should be 0.5, i.e., and semi-transparent semi-reflecting.When it is implemented, the THz wave of high resistant silicon wafer transmits
Rate and reflectivity can be used as preferred light-splitting device close to 0.5.
Embodiment 2 please refers to Fig. 3 to Fig. 4
The technical effect of measuring device provided by the embodiment of the present invention, realization principle and generation is same as Example 1,
To briefly describe, embodiment 2 does not refer to place, please refers to 1 corresponding contents of embodiment.
As shown in figure 3, for the interference effect for having generated the first light beam and the second light beam in frequency mixer 400, first
The polarization state that light beam and the second light beam should be consistent, but the first light beam, after the reflection of measured target target 10, polarization state can
It can change, it is contemplated that this point, in the present embodiment, light of the measuring device between light splitting piece 300 and measured target target 10
Polarizing film 700 is additionally provided in transmission path.The polarization state of the first light beam (signal light) is adjusted in polarizing film 700, so that its
It is consistent as far as possible with the polarization state of the second light beam (reference light).
Furthermore it is full to avoid the light intensity into the first light beam and the second light beam that inject frequency mixer 400 from crossing substantially frequency mixer 400
With in the present embodiment, measuring device is additionally provided with the first power governor 800 and the second power governor 900.Wherein, the first function
Rate adjuster 800 is set in the light transmission path between the first THz wave light source 100 and light splitting piece 300, the second power tune
Section device 900 is set in the light transmission path between the second THz wave light source 200 and frequency mixer 400.
First power governor 800 and the second power governor 900 decay respectively the first light beam optical signal intensity and
The intensity of the optical signal of second light beam, its object is to adjust the first light beam and second light beam that eventually enter into frequency mixer 400
The size of power avoids the light intensity of the first light beam or the second light beam is excessive frequency mixer 400 is caused to be saturated.
Further, as shown in figure 4, in order to reduce the angle of divergence of the first light beam and the second light beam, improve the side of its transmission
Tropism, in the present embodiment, measuring device further includes having the first collimation lens 110 and the second collimation lens 210.Wherein, first is quasi-
Straight lens 110 are set in the light transmission path between the first THz wave light source 100 and the first power governor 800, are used for
Collimation processing is carried out to reduce the angle of divergence of the first light beam to the first light beam；Second collimation lens 210 is set to the second Terahertz
In light transmission path between wave source 200 and the second power governor 900, for carrying out collimation processing to the second light beam to subtract
The angle of divergence of small second light beam.
Embodiment 3 please refers to Fig. 5 to Fig. 6
The technical effect of measuring device provided by the embodiment of the present invention, realization principle and generation is with embodiment 1 and in fact
It is identical to apply example 2, to briefly describe, embodiment 3 does not refer to place, please refers to the corresponding contents of embodiment 1 and embodiment 2.
As shown in figure 5, measuring device provided in this embodiment, further includes having the first optoisolator 310 and the second optical isolation
Device 410.First optoisolator 310 is set to the light transmission path between the first collimation lens 110 and the first power governor 800
In, reflected light or rear orientation light for preventing the first light beam enter to be emitted back towards the first THz wave light source 100, to the first Terahertz
The frequency or power of wave source 100 generate interference, influence measurement result.Similarly, the second optoisolator 410 is set to the second standard
In light transmission path between straight lens 210 and the second power governor 900, for preventing the reflected light of the second light beam or backward
Scattering light enters to be emitted back towards the second THz wave light source 200, and the frequency or power to the second THz wave light source 200 generate interference, shadow
Ring measurement result.
Optionally, as shown in fig. 6, being also provided with the first condenser lens 510 and the second condenser lens in measuring device
610.First condenser lens 510 is set in the light transmission path between light splitting piece 300 and frequency mixer 400, anti-through light splitting piece 300
The first light beam after penetrating is directly incident on frequency mixer 400 through the first condenser lens 510.Second condenser lens 610 is set to
In light transmission path between two power governors 900 and frequency mixer 400, the second light beam is direct through the second condenser lens 610
It is incident in frequency mixer 400.
Furthermore in order to filter out the high frequency section in mixed frequency signal, retain low frequency part, so that subsequent measurement is accurate
Du Genggao, measuring device provided in this embodiment are additionally provided with low-pass filter 710.The signal input part of low-pass filter 710 with
The signal output end of frequency mixer 400 connects, and the signal output end of low-pass filter 710 and the signal input part of oscillograph 500 connect
It connects.
What needs to be explained here is that for the first collimation lens 110 referred in above-described embodiment and the second collimation lens
210, the first optoisolator 310 and the second optoisolator 410, the first condenser lens 510 and the second condenser lens 610, the first function
Rate adjuster 800 and the second power governor 900, these devices can respectively be separately provided, not necessarily necessary pairs of difference
It is arranged in signal optical path and reference path.It can be with for example, the first collimation lens 110 is arranged in signal optical path, in reference path
It is not provided with the second collimation lens 210.In addition, the device of different function, relative position can be adjusted according to the actual situation, no
It is limitation with relative position given by above-described embodiment.For example, the first optoisolator 310 can also be set to the second Terahertz
In light transmission path between wave source 200 and the second collimation lens 210.
Finally, as shown in fig. 7, be in first frequency being 0.5THz, second frequency 0.5THz+5MHz, noise intensity is
In the case where 5 times of signal strength, use measuring device provided in an embodiment of the present invention to rate curve as shown in Figure 8 with
And the measured target target 10 of displacement curve as shown in Figure 9 carries out obtained experiment curv after simulation interferometry.By in figure
It is tied as can be seen that carrying out the obtained simulation of analogue measurement to measured target target 10 using double frequency Terahertz wave interferometry
Fruit signal-to-noise ratio with higher, experiment curv approach the true velocity curve of measured target target 10.
In conclusion speed measuring device provided in this embodiment uses the two beam THz waves with certain frequency difference to make respectively
For signal light and reference light, the motion information (velocity information and displacement information) of measured target target 10 is measured, with tradition
Optical interference measuring technique compare, the interference signal of this bifrequency THz wave has the characteristics that AC modulation, be tested mesh
The velocity information of target 10 is loaded on mixed frequency signal in a manner of frequency modulation, and the noise of obtained mixed frequency signal is relatively high, is resisted
Jamming performance is good, and since measuring signal is AC signal, insensitive to the variation of direct current signal in interference signal, separately
Outside, interference signal detector is used as using frequency mixer 400, two beam THz waves can directly input frequency mixer 400 and carry out at mixing
Corresponding interference signal is managed and exports, adjusting is simple and convenient, solves and adjusts difficult ask using conjunction beam when conventional interference optical path
Topic.
Claims (10)
1. a kind of speed measuring device, which is characterized in that including the first THz wave light source, the second THz wave light source, light splitting piece, mix
Frequency device, oscillograph and data processing equipment,
The first THz wave light source is used to emit the first light beam with first frequency, and the second THz wave light source is used
There is the second light beam of second frequency in transmitting, wherein first frequency is different from second frequency,
First beam section is incident on measured target target through the light splitting piece, the first light beam reflected through measured target target
After being incident on the light splitting piece, the frequency mixer is reflexed to by the light splitting piece,
Second light beam is incident on the frequency mixer,
The frequency mixer carries out Frequency mixing processing with second light beam to first light beam and exports corresponding electric signal to institute
Oscillograph is stated,
The data processing equipment is analyzed the data of the oscillograph recording to obtain the speed of the measured target target
Information and displacement information.
2. speed measuring device according to claim 1, which is characterized in that the speed measuring device further includes polarizing film,
The polarizing film is set in the light transmission path between the light splitting piece and the measured target target, for described the
The polarization state of one light beam is adjusted.
3. speed measuring device according to claim 1, which is characterized in that the speed measuring device further includes for described first
The first power governor that the power of light beam is adjusted and the second function being adjusted for the power to second light beam
Rate adjuster,
First power governor is set to the light transmission path between the first THz wave light source and the light splitting piece
In,
Second power governor is set to the light transmission path between the second THz wave light source and the frequency mixer
In.
4. speed measuring device according to claim 3, which is characterized in that the speed measuring device further include the first collimation lens and
Second collimation lens,
First collimation lens is set to the biography of the light between the first THz wave light source and first power governor
In defeated path, handle for carrying out collimation to first light beam to reduce the angle of divergence of first light beam,
Second collimation lens is set to the biography of the light between the second THz wave light source and second power governor
In defeated path, for carrying out collimation processing to second light beam to reduce the angle of divergence of second light beam.
5. speed measuring device according to claim 4, which is characterized in that the speed measuring device further include the first optoisolator and
Second optoisolator,
First optoisolator is set to the optical transport road between first collimation lens and first power governor
In diameter, reflected light or rear orientation light for preventing first light beam enter to be emitted back towards the first THz wave light source,
Second optoisolator is set to the optical transport road between second collimation lens and second power governor
In diameter, reflected light or rear orientation light for preventing second light beam enter to be emitted back towards the second THz wave light source.
6. speed measuring device according to claim 3, which is characterized in that the speed measuring device further includes for described first
The first condenser lens that light beam is focused and the second condenser lens for being focused to second light beam,
First condenser lens is set in the light transmission path between the light splitting piece and the frequency mixer,
Second condenser lens is set in the light transmission path between second power governor and the frequency mixer.
7. speed measuring device according to claim 1, which is characterized in that the speed measuring device further includes low-pass filter,
The signal input part of the low-pass filter is connect with the signal output end of the frequency mixer, the letter of the low-pass filter
Number output end is connect with the signal input part of the oscillograph.
8. speed measuring device according to claim 1, which is characterized in that the light splitting piece is semi-transparent semi-reflecting.
9. speed measuring device according to claim 1, which is characterized in that the light splitting piece is high resistant silicon wafer.
10. speed measuring device according to claim 1, which is characterized in that the first THz wave light source includes first
Shake light source and the first frequency multiplier,
The light beam of the first local oscillator light source transmitting forms first light beam after the first frequency multiplier frequency multiplication,
The second THz wave light source includes the second local oscillator light source and the second frequency multiplier,
The light beam of the second local oscillator light source transmitting forms second light beam after the second frequency multiplier frequency multiplication.
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| CN108709506B (en) * | 2018-08-01 | 2023-11-10 | 天津博科光电科技有限公司 | Optical fiber displacement sensing probe and optical fiber displacement sensing system |
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