CN105806857B - Dual intensity ray inspection system material identification and its sorting parameter processing method and device - Google Patents

Dual intensity ray inspection system material identification and its sorting parameter processing method and device Download PDF

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CN105806857B
CN105806857B CN201410849920.0A CN201410849920A CN105806857B CN 105806857 B CN105806857 B CN 105806857B CN 201410849920 A CN201410849920 A CN 201410849920A CN 105806857 B CN105806857 B CN 105806857B
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ray
angle
predetermined
distributional difference
transmutation
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CN105806857A (en
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陈志强
赵自然
刘耀红
顾建平
郑娟
刘必成
徐光明
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Nuctech Co Ltd
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Nuctech Co Ltd
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Abstract

The present invention discloses a kind of dual intensity ray material identification and its checks genealogical classification parameter processing method and device.This method comprises: obtaining calibration material angle distributional difference coefficient corresponding with transparency under predetermined x-ray angle；Sorting parameter of the angle distributional difference coefficient of predetermined x-ray angle based on calibration material to calibration material in main beam direction is adjusted, to obtain calibration material in the sorting parameter of predetermined x-ray angle.Method and apparatus disclosed by the invention, it is effectively adjusted by sorting parameter of the angle distributional difference coefficient to different x-ray angles, to improve the dual intensity material discrimination effect of each x-ray angle, the performance for giving full play to dual intensity ray examination apparatus further increases the competitiveness and user experience of product.

Description

Dual intensity ray inspection system material identification and its sorting parameter processing method and device
Technical field
The present invention relates to radiographic imaging arts more particularly to a kind of dual intensity ray inspection system material identification and its classification ginsengs Number processing method and device.
Background technique
With increasingly severe, the container radiation with explosive, drugs, violated object automatic identification function of anti-terrorism situation The market that image-forming detecting system becomes urgent needs.The material identification technology of the large objects safety inspection such as existing container, Including dual-energy transmission technology, neutron activation technique and container CT, all increasingly it is valued by people.
The material discrimination to scanning object may be implemented using dual-energy transmission technology for dual energy X-ray inspection systems.Dual intensity is saturating The technology of penetrating is that detected material is penetrated using the different ray such as X-ray of two kinds of power spectrums, and the signal of output is handled by difference, is obtained To the material atom ordinal information of checking matter.
Existing dual energy X-ray inspection systems are there are the distribution of the angle of ray energy and dosage, thus different x-ray angles Dual intensity material discrimination effect is not also identical.
Existing dual-energy x-ray material discrimination technical solution, some use simplified way, do not consider the caloric agent of beam Angulation is distributed the influence to material discrimination, using the sorting parameter in main beam direction as the sorting parameter of all search coverages.For The lower dual energy X-ray inspection systems of separability, the classifying quality and other x-ray angles of main beam direction scanning article are likely to Inconsistent phenomenon is had, the resolving effect of material is influenced, examination personnel bring puzzlement to check of drawings.
Summary of the invention
In view of the above-mentioned problems existing in the prior art, it is necessary to propose a kind of dual intensity ray inspection system sorting parameter processing Scheme improves the material discrimination effect of each x-ray angle.
The disclosure technical problem to be solved is how to eliminate the caloric agent angulation distribution of ray to dual intensity material point The influence distinguished guarantees that the material discrimination effect of each x-ray angle is consistent as far as possible.
The disclosure provides a kind of dual intensity ray inspection system sorting parameter processing method, comprising: obtains calibration material pre- Determine angle distributional difference coefficient corresponding with transparency under x-ray angle；The angle distribution of predetermined x-ray angle based on calibration material is poor Sorting parameter of the different coefficient to calibration material in main beam direction is adjusted, to obtain calibration material in predetermined x-ray angle Sorting parameter.
Optionally, obtaining calibration material angle distributional difference coefficient corresponding with transparency under predetermined x-ray angle includes: Obtain the angle distributional difference coefficient of calibration material second ray corresponding with the first X-ray transmutation X under predetermined x-ray angle；Base It is adjusted in the angle distributional difference coefficient of the predetermined x-ray angle of calibration material to sorting parameter of the material in main beam direction is demarcated It is whole to obtain the angle that calibration material includes: the second ray based on predetermined x-ray angle in the sorting parameter of predetermined x-ray angle Sorting parameter of the distributional difference coefficient to calibration material in main beam direction is adjusted to obtain calibration material in predetermined ray Sorting parameter under angle.
Optionally, obtaining calibration material angle distributional difference coefficient corresponding with transparency under predetermined angular includes: in master Shu Fangxiang, first X-ray transmutation X in the main beam direction that the calibration material that the first ray of acquisition passes through the first mass thickness obtains, Second X-ray transmutation X in the main beam direction that the calibration material that the second ray passes through the first mass thickness obtains；In predetermined ray angle Degree determines the second mass thickness of calibration material, and the first ray is made to pass through the transparency of the calibration material of the second mass thickness First X-ray transmutation X in main beam direction；Obtain the predetermined ray that the second ray is obtained across the calibration material of the second mass thickness Second X-ray transmutation X of angle；The second X-ray transmutation X according to the second X-ray transmutation X of predetermined ray and main beam direction is true Material is determined in the angle distributional difference coefficient of the second ray corresponding with the first X-ray transmutation X of predetermined x-ray angle.
Optionally, first X-ray transmutation X in main beam direction is αL, second X-ray transmutation X in main beam direction is αH；It is predetermined Second X-ray transmutation X of x-ray angle is α 'H, demarcate material under predetermined x-ray angle with the first X-ray transmutation X αLIt is corresponding The angle distributional difference coefficient of second ray is α 'H/αH。
Optionally, the first ray is low energy ray, and the second ray is high-energy ray.
Optionally, the first ray is high-energy ray, and the second ray is low energy ray.
Optionally, this method further include: turn to multiple level of transparency for transparency is discrete；Determine calibration material predetermined Angle distributional difference coefficient corresponding with each level of transparency under x-ray angle.
Optionally, this method further include: according to transparency pair of the calibration material under multiple x-ray angles with the first ray Standard angle corresponding with the first X-ray transmutation X distribution of the angle distributional difference Coefficient Fitting calibration material for the second ray answered is poor Different curve；Standard angle distributional difference curve discretization is obtained into calibration material in each x-ray angle and the first X-ray transmutation X Corresponding angle distributional difference coefficient.
Optionally, this method further include: the positional relationship according to detector in detector array and ray main beam direction is true The x-ray angle for determining detector determines the angle distributional difference coefficient of detector based on standard angle distributional difference curve.
Optionally, this method further include: according to the main beam side of the model parameter and ray of dual intensity ray inspection system equipment Conversion acquisition is carried out to standard angle distributional difference curve to position on the detector and checks that the corresponding angle distribution of system equipment is poor Different coefficient.
Optionally, the model parameter of dual intensity ray inspection system equipment includes the mechanical design structure of system, detector The main beam elevation angle of size and/or accelerator.
Optionally, the first ray and the second ray are X-ray or gamma rays.
Optionally, the angle distributional difference coefficient of the second ray based on predetermined x-ray angle is to calibration material in main beam direction Sorting parameter be adjusted to obtain sorting parameter of the calibration material under predetermined x-ray angle to include: according to calibration material The angle distributional difference coefficient of second ray of sorting parameter curve and predetermined x-ray angle on main beam direction determines calibration material Expect the sorting parameter in predetermined x-ray angle.
According to another aspect of the present invention, a kind of substance identification is provided, comprising: obtain the first of predetermined x-ray angle X-ray transmutation X and the second X-ray transmutation X；According to the first X-ray transmutation X and the second X-ray transmutation X and predetermined x-ray angle Sorting parameter determine material information, wherein sorting parameter is the sorting parameter obtained according to above-mentioned method.
According to another aspect of the invention, a kind of dual intensity ray inspection system sorting parameter processing unit is provided, comprising: angle Distributional difference coefficient obtains module, for obtaining calibration material angle corresponding with transparency distributional difference under predetermined x-ray angle Coefficient；
Sorting parameter adjusts module, and the angle distributional difference coefficient for the predetermined x-ray angle based on calibration material is to calibration Sorting parameter of the material in main beam direction is adjusted, to obtain calibration material in the sorting parameter of predetermined x-ray angle.
Optionally, distributional difference coefficient in angle obtains module and is also used to obtain calibration material under predetermined x-ray angle with first The angle distributional difference coefficient of corresponding second ray of the transparency of ray；Sorting parameter adjustment module is also used to based on predetermined ray Sorting parameter of the angle distributional difference coefficient of second ray of angle to calibration material in main beam direction is adjusted to obtain Demarcate sorting parameter of the material under predetermined x-ray angle.
Optionally, it includes: main beam direction transparency acquiring unit that distributional difference coefficient in angle, which obtains module, for obtaining in master First X-ray transmutation X in the main beam direction that the calibration material that the first ray of Shu Fangxiang passes through the first mass thickness obtains, second penetrates Second X-ray transmutation X in the main beam direction that the calibration material that line passes through the first mass thickness obtains；X-ray angle transparency obtains Unit makes the first ray pass through the calibration material of the second mass thickness for determining the second mass thickness in predetermined x-ray angle Transparency be main beam direction the first X-ray transmutation X；The calibration material that the second ray is obtained across the second mass thickness obtains Predetermined x-ray angle the second X-ray transmutation X；Angle distributional difference factor determination unit, for according to the second of predetermined ray X-ray transmutation X and second X-ray transmutation X in main beam direction determine calibration material in the saturating with the first ray of predetermined x-ray angle The angle distributional difference coefficient of corresponding second ray of lightness.
Optionally, first X-ray transmutation X in main beam direction is αL, second X-ray transmutation X in main beam direction is αH；It is predetermined Second X-ray transmutation X of x-ray angle is α 'H；Angle distributional difference factor determination unit determines calibration material in predetermined ray angle Spend lower and the first X-ray transmutation X αLThe angle distributional difference coefficient of corresponding second ray is α 'H/αH。
Optionally, distributional difference coefficient in angle obtains module and is used to turn to multiple transparencies for the transparency of the first ray is discrete Rank；Determine the angle of calibration material second ray corresponding with each level of transparency of the first ray under predetermined x-ray angle Distributional difference coefficient.
Optionally, the device further include: standard angle distributional difference curve generation module, for being examined according to standard dual intensity ray Look into the angle distributional difference of calibration material second ray corresponding with the transparency of the first ray under multiple x-ray angles of system The standard angle distributional difference curve corresponding with the first X-ray transmutation X of Coefficient Fitting calibration material.
Optionally, the device further include: angle distributional difference coefficient conversion module, for according to detector in detector array The x-ray angle that detector is determined with the positional relationship in ray main beam direction determines detector based on standard angle distributional difference curve Angle distributional difference coefficient.
Optionally, angle distributional difference coefficient conversion module be used for according to the model parameter of dual intensity ray inspection system equipment and The position of the main beam direction of ray on the detector carries out conversion to standard angle distributional difference curve and sets to obtain inspection system Standby corresponding angle distributional difference coefficient.
Optionally, the model parameter of dual intensity ray inspection system equipment includes the mechanical design structure of system, detector The main beam elevation angle of size and/or accelerator.
Optionally, sorting parameter adjustment module includes: classification curve matching unit, is used for according to calibration material in main beam The angle distributional difference coefficient of second ray of sorting parameter curve and predetermined x-ray angle on direction determines calibration material pre- Determine the sorting parameter curve of x-ray angle；Sorting parameter determination unit, for the dividing in predetermined x-ray angle according to calibration material Class parameter curve determines calibration material in the sorting parameter of predetermined x-ray angle.
In accordance with a further aspect of the present invention, a kind of material identification device is provided, comprising: above-mentioned dual intensity ray inspection system point Class parameter processing apparatus；Transparency obtains module, for obtaining the first X-ray transmutation X and the of the predetermined x-ray angle of detector The transparency of two rays；Material classification determining module is connected with transparency acquiring unit, according to the first X-ray transmutation X and The sorting parameter of the transparency of two rays and predetermined x-ray angle determines that material information, sorting parameter are examined according to dual intensity ray Look into the sorting parameter of genealogical classification parameter processing apparatus acquisition.
The processing of dual intensity ray inspection system sorting parameter and substance identification and device that the disclosure provides, pass through angle point Cloth coefficient of variation effectively adjusts the sorting parameter of different x-ray angles, to improve the dual intensity material of each x-ray angle Resolving effect gives full play to the performance of dual intensity ray examination apparatus, further increases the competitiveness and user experience of product.
Detailed description of the invention
Fig. 1 is the schematic diagram of the dual intensity ray inspection system of one embodiment of the invention；
Fig. 2 shows the flow charts of the dual intensity ray inspection system sorting parameter processing method of one embodiment of the invention；
Fig. 3 shows the schematic diagram of the dual intensity ray inspection system of another embodiment of the present invention；
The dual intensity ray inspection system that Fig. 4 shows one embodiment of the invention generates the process of main beam direction sorting parameter Figure；
Fig. 5 shows the sorting parameter curve in the dual energy X-ray inspection systems main beam direction of another embodiment of the present invention；
The dual intensity ray inspection system that Fig. 6 shows one embodiment of the invention generates the flow chart of angle distributional difference coefficient；
Fig. 7 A shows the flow chart of the dual intensity ray inspection system sorting parameter processing method of one embodiment of the invention；
Fig. 7 B shows the schematic diagram of the standard calibration material of one embodiment of the invention；
Fig. 7 C shows the angle distributional difference coefficient curve of the same material difference detector position of one embodiment of the invention Partial schematic diagram；
It is bent that Fig. 7 D shows the different materials of one embodiment of the invention, the angle distributional difference coefficient of identical low energy level of transparency The schematic diagram of line；
Fig. 7 E shows the partial schematic diagram of the sorting parameter curve of the main beam angle of one embodiment of the invention；
Fig. 7 F shows the partial schematic diagram of the sorting parameter curve of the predetermined x-ray angle of one embodiment of the invention；
Fig. 8 shows the flow chart of the dual intensity ray inspection system substance identification of one embodiment of the invention；
Fig. 9 shows the structural block diagram of the dual intensity ray inspection system sorting parameter processing unit of one embodiment of the invention；
Figure 10 shows the structural frames of the dual intensity ray inspection system sorting parameter processing unit of another embodiment of the present invention Figure；
Figure 11 shows the structural frames of the dual intensity ray inspection system sorting parameter processing unit of another embodiment of the invention Figure；
Figure 12 shows the structural block diagram of the material identification device of one embodiment of the invention.
Specific embodiment
Following will be combined with the drawings in the embodiments of the present invention, and technical solution in the embodiment of the present invention carries out clear, complete Site preparation description, it is clear that described embodiments are only a part of the embodiments of the present invention, instead of all the embodiments.Below Description only actually at least one exemplary embodiment be it is illustrative, never as to the present invention and its application or make Any restrictions.Based on the embodiments of the present invention, those of ordinary skill in the art are not making creative work premise Under every other embodiment obtained, shall fall within the protection scope of the present invention.
Unless specifically stated otherwise, positioned opposite, the digital table of the component and step that otherwise illustrate in these embodiments It is not limited the scope of the invention up to formula and numerical value.
Simultaneously, it should be appreciated that for ease of description, the size of various pieces shown in attached drawing is not according to reality Proportionate relationship draw.
Technology, method and apparatus known to person of ordinary skill in the relevant may be not discussed in detail, but suitable In the case of, technology, method and apparatus should be considered as authorizing part of specification.
It is shown here and discuss all examples in, any occurrence should be construed as merely illustratively, without It is as limitation.Therefore, the other examples of exemplary embodiment can have different values.
It should also be noted that similar label and letter indicate similar terms in following attached drawing, therefore, once a certain Xiang Yi It is defined in a attached drawing, then in subsequent attached drawing does not need that it is further discussed.
Inventors have observed that typical dual energy X-ray inspection systems use fan-shaped x-ray beam, detector covers one Determine the x-ray angle of range.Usually there is the distribution of dosage angle in such fan-shaped x-ray beam, that is, the dosage of main beam angle is maximum, more Angle position dosage far from main beam is smaller.According to the generation mechanism of X-ray, the more preshoot of the higher photon of energy, dosage angle point Cloth is more sharp, and energy it is low photon doses angle distribution it is then gentler.In this way, since the angle of the photon of different-energy is distributed not Together, cause the equivalent energy of the continuum X-ray of Difference angles also different: main beam direction equivalent energy highest, it is more past Both sides, equivalent energy are lower.
The material discrimination of dual-energy x-ray and the equivalent energy of X-ray are closely related, the change of the equivalent energy of different angle Change, affects the dual intensity sorting parameter of corresponding different detector positions.Existing dual-energy x-ray resolution techniques scheme, is not examined Worry is adjusted the sorting parameter of each different angle.In view of the above problems in the prior art, the present inventor provides a kind of new Technical solution, consider that angle is distributed influence to dual intensity sorting parameter.
Fig. 1 is the schematic diagram of the dual intensity ray inspection system of one embodiment of the invention.As shown in Figure 1, the dual intensity ray Inspection system includes ray generating device 11, mechanical driving device (not shown), data acquisition device 16, scan control computer With data processing computer (not shown).The inspected object 15 of such as container etc passes through ray generating device 11 and data Between acquisition device 16, its transmission image is obtained.
Ray generating device 11 includes radioactive source 111, collimator 112, which can also include dual intensity Accelerator and other ancillary equipments, can be alternately produced the beam of two kinds of energy, i.e. the first ray with very high frequency Beam and the second beam.First ray and the second ray can be X-ray or gamma rays.In one embodiment, the first ray For low energy ray, the second ray is high-energy ray.In another embodiment, the first ray is high-energy ray, and the second ray is low It can ray.
Mechanical driving device can make ray generating device 11 and data acquisition device 16 together relative to container to be checked 15 generate the relative motion of horizontal direction.Alternatively, can be ray generating device 11 and data acquisition device 16 is motionless, and it is mechanical Transmission device moves container 15 to be checked.
Radiographic source 111 is used to generate the first X-ray beam of the first energy and the second X-ray beam of the second energy, by adding After fast device accelerates, launch fan-ray beam by collimating slit 112, beam transmits container 15, and the X-ray after transmission is mapped to On data acquisition device 16.Data acquisition device is made of multiple detectors, detector can with detected ray energy, intensity, Dosage etc., detector can be solid probe, gas detector, semiconductor detector.In one embodiment, which can To be Cerenkov detector.
Detector 16 is oppositely arranged with radiographic source 111, and the first X-ray beam and the 2nd X for receiving transmission inspected object are penetrated Harness can produce the first probe value and the second probe value；It is connected with data processing equipment (not shown) with detector, is connect The first probe value and the second probe value are received, the material classification or effective atomic number of inspected object are exported.
Herein, transparency T=I/I is defined0=exp (- μmtm) it is the transmitted intensity and initial ray for penetrating checking matter Intensity ratio, wherein μmIndicate mass attentuation coefficient, tmRepresentation quality thickness.Dual-energy x-ray equipment is usually by different quality Such as α curve that the training process that the standard material block of thickness carries out generates is realized as sorting parameter curve to scanning object Material discrimination.Detector can detect the dosage of high and low power X ray, according to ray without the first of any object to be detected The ratio of beginning transmitted intensity and the transmitted intensity for penetrating object to be detected, determines the transparency of substance.
In data processing, the negative logarithm for defining high and low power X ray transparency is the α value of high and low power X ray, so as to numerical value Simulation process.The transparency of high and low power X ray is indicated with the α value of high and low power X ray herein, defining alpha taxonomy curve is height The difference of low energy ray α value and the relation curve of high-energy ray α value, can be referred to as sorting parameter curve.It should be noted that sharp Use the α value of high-energy ray as the abscissa of dual intensity sorting parameter curve, the α difference of high and low energy ray is only one as ordinate Kind of example, those skilled in the art can design the transverse and longitudinal coordinate of the sorting parameter curve of dual-energy x-ray and double according to the actual situation The conversion regime of energy transmitted intensity.
For having for the dual intensity system of monochromatic power spectrum, sorting parameter curve (α curve) is that one group of slope fixation is straight Line, every line correspondences are in a kind of atomic number information.When different angles distribution dual intensity state change, sorting parameter curve It is still one group of straight line, only the slope of every straight line is all changed, the amplitude of variation of variation coefficient and dual intensity energy state It is related.Therefore only it needs to be determined that on sorting parameter curve certain point variation coefficient, that is, may know that the variation tendency of whole curve.
The X-ray beam that ray generating device used in real system generates is continuum, it is flat in communication process Equal energy can be got higher, and in other words, beam is gradually hardened, and can generate ray " hardening " phenomenon.Therefore, (α is bent for sorting parameter curve Line) it is no longer the fixed straight line of slope, but the curve that one group of slope is smaller and smaller.Such case compared with monochromatic power spectrum for, Sorting parameter plots changes are complicated very much, and the sorting parameter curvilinear motion coefficient under different attenuations is different, no With the angle distributional difference coefficient of material, there is also differences, it is therefore desirable to individually be designed according to the actual situation.
Fig. 2 shows the flow charts of the dual intensity ray inspection system sorting parameter processing method of one embodiment of the invention.
As shown in Fig. 2, step S200, it is poor to obtain the angle distribution corresponding with transparency under predetermined x-ray angle of calibration material Different coefficient.In one embodiment, calibration material is obtained corresponding with the transparency of the first ray the under predetermined x-ray angle The angle distributional difference coefficient of two rays.
Step S202, the angle distributional difference coefficient of the predetermined x-ray angle based on calibration material is to calibration material in main beam side To sorting parameter be adjusted, thus obtain calibration material predetermined x-ray angle sorting parameter.In one embodiment, Sorting parameter of the angle distributional difference coefficient of the second ray based on predetermined x-ray angle to calibration material in main beam direction carries out Adjustment is to obtain the sorting parameter of the calibration material under predetermined x-ray angle.It can be according to calibration material on main beam direction Sorting parameter curve and predetermined x-ray angle the second ray angle distributional difference coefficient determine calibration material in predetermined ray The sorting parameter curve of angle；Determine calibration material predetermined in the sorting parameter curve of predetermined x-ray angle according to calibration material The sorting parameter of x-ray angle.
In above-mentioned implementation, by calibration material different x-ray angles angle distributional difference coefficient to different x-ray angles Sorting parameter is effectively adjusted, to improve the dual intensity material discrimination effect of each x-ray angle, gives full play to dual intensity ray The performance for checking equipment, further increases the competitiveness and user experience of product.
The dual intensity ray inspection system that Fig. 3 shows one embodiment of the invention generates the flow chart of angle distributional difference coefficient.
As shown in figure 3, step S300, in main beam direction, obtain the calibration material that the first ray passes through the first mass thickness First X-ray transmutation X, second ray in obtained main beam direction pass through the main beam side that the calibration material of the first mass thickness obtains To the second X-ray transmutation X.
Step S302, it in predetermined x-ray angle, determines the second mass thickness of calibration material, the first ray is made to pass through second The transparency of the calibration material of mass thickness is first X-ray transmutation X in main beam direction；Then the second ray is obtained across second Second X-ray transmutation X of the predetermined x-ray angle that the calibration material of mass thickness obtains.
Step S304, mark is determined according to the second X-ray transmutation X of predetermined ray and second X-ray transmutation X in main beam direction Material is determined in the angle distributional difference coefficient of the second ray corresponding with the first X-ray transmutation X of predetermined x-ray angle.
In above-described embodiment, each x-ray angle is determined by transparency of the high and low energy ray between different x-ray angles Angle distributional difference coefficient, strong operability is easy to implement.
In one embodiment, in main beam direction, the first ray, which passes through, obtains the after the calibration material of the first mass thickness One X-ray transmutation X αL, the second ray pass through the first mass thickness calibration material after obtain the second X-ray transmutation X αH.Predetermined X-ray angle determines so that the first X-ray transmutation X is α after the first ray passes through calibration materialLWhen the second mass thickness, Two rays obtain the second ray actual transparency degree α ' after the calibration material of the second mass thicknessH, determine the first ray transparent Degree is αLWhen, calibration material the second ray of predetermined x-ray angle angle distributional difference coefficient be α 'H/αH.Wherein, it first penetrates Line can be low energy ray, and corresponding transparency is low energy transparency；Second ray is high-energy ray, and corresponding transparency is height It can transparency；Or it is opposite.
It can be usually reference with the main beam direction of ray, other ray positions are compared with main beam direction, obtain pair Answer the angle distributional difference coefficient under low energy transparency.In main beam direction, low energy X ray passes through certain material of certain mass thickness The α data obtained afterwards are αL, it is α that high-energy ray, which passes through the α data obtained after the material,H；For other angles position, dual intensity etc. Efficiency amount has certain variation, but still can find such mass thickness, so that low energy X ray passes through the mass thickness The material after obtained α value be still αL, and the α value that sigmatron obtains after the material of the mass thickness is α 'H.Then The variation coefficient of dual intensity alpha taxonomy parameter curve slope is α 'H/αH.It is reference, other angles position and main beam side with main beam direction To comparing, then having obtained low energy α value is αLWhen, high energy α value αHAngle distributional difference coefficient.
In real system, X-ray is continuum, and there are hardening phenomenons for ray, it is therefore desirable to be divided under different transparencies It Ji Suan not angle distributional difference coefficient.In actual design, a variety of implementations can be used.A kind of feasible mode is by first The transparency of ray is discrete to turn to multiple level of transparency；Determine that calibration material is each with the first ray under predetermined x-ray angle The angle distributional difference coefficient of corresponding second ray of a level of transparency.Several ranks are turned to by low energy transparency is discrete, are passed through Corresponding low energy level of transparency and detector number, to save and search angle distributional difference coefficient.Other possible modes are also Including angle distributional difference coefficient is saved and searched according to the angle of detector position and main beam.
Every classification curve data volume it is bigger, save hundreds of detector positions classification curve storage and read at This is relatively high.It such as include 3~4 of main beam direction for only saving the classification curve in the angle that several are picked out, Although can make up certain angle distribution influences, precision is inadequate.Above-mentioned technical proposal uses the classification for saving main beam direction The discretization angle distributional difference coefficient of parameter and various standard calibration materials, since discretization angle distributional difference coefficient is to use To low energy transparency sliding-model control, data volume is little, while can satisfy the required precision of angle distribution adjustment again.
In one embodiment, Data correction, data statistics, classification curve matching, generation discretization classification ginseng can be passed through Number generates angle distributional difference coefficient using fitting parameter, and saves angle distributional difference coefficient.
Wherein, Data correction refers to that the original image obtained to detector is corrected, and eliminates detector background, detector Inconsistency and roentgen dose X fluctuation etc. influence, and obtain transparency image.
Data statistics is a variety of materials, the high energy transparency of each ladder and low energy transparency mean value in order to obtain, for song Line fitting is prepared.Since data should be fully utilized in short transverse for generating angle distributional difference coefficient Certain stride information is arranged in information, such as in the height direction every several pixels, such as 5~25 pixels, preferably 10, 15 pixels statistics primary informations.The range of statistics, which can according to need, to be set, and scope of statistics is bigger, and noise reduction effect is got over Greatly, the curve that the later period obtains is more smooth, but if range is excessive, also just loses the meaning for calculating angle distributional difference coefficient, Therefore suitable scope of statistics should be selected according to the actual situation.
Curve matching can use least square polynomial fit, after data statistics and curve matching, for convenience It searches and avoids angle distributional difference coefficient files excessive, need to carry out sliding-model control to low energy transparency.By fitting data It resets, under available each low energy level of transparency, according to the high energy α Value Data α of detector index value arrangementH, so as to It obtains angle distributional difference coefficient files, in automatic flow, is automatically generated in training process and save angle distributional difference coefficient text Part.
In this way, can be designed that angle distributional difference Coefficient Look-up Table, and lead to according to the material discrimination principle of dual-energy x-ray It crosses the angle distributional difference Coefficient Look-up Table effectively to adjust the sorting parameter of different angle, guarantees the material of each x-ray angle Expect that resolving effect is consistent as far as possible.
The sorting parameter that various ways generate dual intensity ray inspection system main beam direction is had existed, following is a brief introduction of one Kind specific implementation.
The dual intensity ray inspection system that Fig. 4 shows one embodiment of the invention generates the flow chart of main beam direction sorting parameter.
As shown in figure 4, the scanning of step S402, the first and second rays according to corresponding to acquisition calibration material block ladder Data obtain classification data, and scan data includes transmitted intensity, dosage, and the classification data is contingency table fixed number in an embodiment According to according to demarcating, material is trained to obtain the classification nominal data.
Step S404, statistical disposition is carried out to classification data, fitting obtains the sorting parameter curve in main beam direction.
In one embodiment, the first ray represents low energy ray, and the second ray represents high-energy ray, dual intensity radiological survey X When system creation sorting parameter curve, α is definedL=(- log (TL))；Wherein TLFor the first X-ray transmutation X, i.e. low energy transparency, αH=(- log (TH))；Wherein THFor the second X-ray transmutation X, i.e. high energy transparency, α is takenHFor the cross of dual intensity alpha taxonomy parameter curve Coordinate, αH=(- log (TH)), take αLWith αHOrdinate α of the difference as dual intensity alpha taxonomy parameter curveL-αH=(- log (TL)+ log(TH))。
Fig. 5 shows the sorting parameter curve in the dual energy X-ray inspection systems main beam direction of one embodiment of the invention.Dual intensity X Ray inspection system is bent by the dual intensity alpha taxonomy parameter that the calibration process that the standard material block to different quality thickness carries out generates Line, can be for every kind of calibration material in various calibration material；With the first ray and the various thickness subscripts of the second radiation exposure Determine material and does not obtain corresponding low energy transparency and high energy transparency；It, will using the first function of the second transparency as abscissa The second function of both first X-ray transmutation X and the second X-ray transmutation X forms calibration material as ordinate in different thickness Data point under degree；In this way, such as using least square curve fitting method quasi- to data point march line using curve-fitting method It closes, dual intensity alpha taxonomy parameter curve can be fitted.
Fig. 6 shows the schematic diagram of the dual intensity ray inspection system of one embodiment of the invention.Referring to Fig. 6, radioactive source 600 with Sector format emits dual-energy x-ray beam, and the side opposite with radioactive source is data acquisition device such as detector array, the detector Array is made of multiple detectors, and the corresponding detector of ray 602 in dual energy X ray detector main beam direction is detector 609, The beam in other directions is corresponding with other detectors such as detector 604, detector 605, detector 606, detector 607, visits Survey device 608, detector 610, detector 611, detector 612 ... ...
X-ray angle can be determined according to the positional relationship of detector in detector array and ray main beam direction.For example, 600 position of position, that is, radioactive source of detector 611, the detector 609 in main beam direction and main beam, that is, can determine x-ray angle 601, beam 603 includes two beam line of the first ray and the second ray, by searching for angle distributional difference Coefficient Look-up Table, is obtained The angle distributional difference coefficient of the second ray corresponding with the transparency of the first ray of predetermined x-ray angle 601.
In this way, the transparency pair with the first ray of predetermined angular can be found according to angle distributional difference Coefficient Look-up Table The angle distributional difference coefficient for the second ray answered.The classification data obtained by detector on main beam direction, can obtain main beam Sorting parameter on direction directly adjusts the available predetermined angular of sorting parameter on main beam point by angle distributional difference coefficient Class parameter can draw out the sorting parameter curve of predetermined x-ray angle according to the sorting parameter, pass through the predetermined x-ray angle Sorting parameter, in identification material information, can more accurate identification material information, improve the dual intensity material of each x-ray angle Expect resolving effect, gives full play to the performance of dual intensity ray examination apparatus, further increase the competitiveness and user experience of product.
Fig. 7 A shows the flow chart of the dual intensity ray inspection system sorting parameter processing method of one embodiment of the invention.Such as figure Shown in 7A, this method is specifically included that
Step S700, several level of transparency are turned to by transparency is discrete, it in one embodiment, can be by the first ray Transparency discrete turn to several level of transparency.
Step S702, the angle distributional difference coefficient of the second ray under each level of transparency of predetermined x-ray angle is determined, In one embodiment, the angle for determining the second ray under each level of transparency of predetermined the first ray of x-ray angle can be distributed Coefficient of variation.
Specifically, distributional difference Coefficient Look-up Table in angle is generated by training process, Fig. 7 B shows one embodiment of the invention The schematic diagram of standard calibration material, as shown in Figure 7 B, standard material training device can be by having several step-thickness not It is formed with material, the calibration material in the present embodiment is tetra- kinds of materials of C, Al, Fe, Pb, can also use other in hands-on The material block of the compositions such as example organic inorganic matter metal of material is demarcated, the size of material block can cover all or part of detection Device.In training process, the scan data as corresponding to system positioning acquisition and statistical disposition each standard material block ladder.
In one embodiment, angle distributional difference coefficient files can by the standard material block under different quality thickness into Capable training process generates, and can also be generated by other modes such as Monte Carlo simulations.
Referring to Fig. 7 C, Fig. 7 C shows the angle distributional difference system of the same material difference detector position of one embodiment of the invention The partial schematic diagram of number curve.Wherein, abscissa is detector position index value, can be determined according to detector position index value X-ray angle, ordinate are angle distributional difference coefficient, and different curves correspond to different transparencies.
Referring to Fig. 7 D, Fig. 7 D shows the angle distribution of the different materials of one embodiment of the invention, identical low energy level of transparency The schematic diagram of coefficient of variation curve, the partial schematic diagram of sorting parameter curve.Wherein, abscissa is detector position index value, It can determine that x-ray angle, ordinate are the difference of first the second X-ray transmutation X of ray according to detector position index value, no With the corresponding three kinds of different standard materials of curve.
It should be noted that it will be understood by those skilled in the art that there are many representations of angle distributional difference coefficient curve, and It is not limited to representation shown in the embodiment of the present invention and attached drawing, it, can basis in a kind of possible embodiment The transparency and x-ray angle of second ray prepare the angle distributional difference coefficient curve of the first X-ray transmutation X, as long as can be realized Distinguish the angle distributional difference of predetermined angular and main beam angle.
Referring to Fig. 7 E, Fig. 7 E shows the partial schematic diagram of the sorting parameter curve of the main beam angle of one embodiment of the invention. Wherein, abscissa is the second X-ray transmutation X, and ordinate is the difference of first the second X-ray transmutation X of ray, and different curves are corresponding Different standard materials.
It should be noted that it will be understood by those skilled in the art that making the mode of the sorting parameter curve in the main beam direction has It is a variety of, however it is not limited to which that representation shown in the embodiment of the present invention and attached drawing can in a kind of possible embodiment With according to the classification data in main beam direction, to produce abscissa be the first X-ray transmutation X ordinate is the second X-ray transmutation X Sorting parameter curve, as long as determining sorting parameter curve can be played to carry out the effect of material identification classification.
Referring to Fig. 7 F, Fig. 7 F shows the partially schematic of the sorting parameter curve of the predetermined x-ray angle of one embodiment of the invention Figure.Wherein, abscissa is the second X-ray transmutation X, and ordinate is the difference of first the second X-ray transmutation X of ray, different curves Corresponding different standard material.
X-ray angle in the present embodiment is, for example, 15 degree, and sorting parameter curve can be understood as αHAnd αLRelation curve. According to sorting parameter coefficient of variation curve, corresponding with the transparency of the first ray second that predetermined x-ray angle is 15 degree is obtained The angle distributional difference coefficient of ray；The angle distributional difference coefficient, angle distribution can be found according to angle distributional difference coefficient curve Coefficient of variation is multiplied with the second ray transparent, available 15 degree of the second X-ray transmutation X, saturating according to 15 degree of the first ray The transparency of lightness and the second ray can obtain sorting parameter curve when predetermined x-ray angle is 15 degree.
It should be noted that specifically classification curve (such as α curve) can be according to αHAnd αLThe two variables carry out some numbers Student movement is calculated, therefore has different expression ways, but be all mathematically it is of equal value, classification results are not also influenced.Angle distribution What difference curve saved is each detector index position, corresponding each αLDiscrete levels (such as can be 256 ranks), αH The variation coefficient in opposite main beam direction, it can obtain α 'H.Thus main beam side can very easily be passed through according to the coefficient To classification curve calculate the classification curve of Current detector position.
Since angle distributional difference curve is used to low energy transparency sliding-model control, data volume is little, can satisfy The required precision of angle distribution adjustment, reduces the workload of measurement and statistics, the number for the sorting parameter curve that system needs to save Relatively small according to measuring, the classification data by saving main beam direction can be by point of angle distributional difference coefficient adjustment all angles Class parameter curve, can solve measurement and store multiple positions sorting parameter curve data amount of storage is big, precision is inadequate lacks Point, compared with the existing technology precision it is high, using more convenient.
In one embodiment, in main beam direction, the second ray obtains first after the calibration material of the first mass thickness X-ray transmutation X αH, the first ray pass through the first mass thickness calibration material after obtain the first X-ray transmutation X αL；It is penetrated predetermined Line angle degree determines so that the second X-ray transmutation X is α after the second ray passes through calibration materialHWhen third mass thickness, first Ray obtains the first ray actual transparency degree α ' after the calibration material of third mass thicknessL, determine the second X-ray transmutation X For αHWhen, calibration material predetermined x-ray angle the first ray angle distributional difference coefficient be α 'L/αL。
In this way, the angle distributional difference coefficient of the first ray of the different angle based on the second X-ray transmutation X can be generated, According to the material discrimination principle of dual-energy x-ray, angle distributional difference Coefficient Look-up Table can be designed that, and pass through the angle distributional difference Coefficient Look-up Table effectively adjusts the sorting parameter of different angle, guarantees that the classifying quality of all angles is consistent, gives check of drawings Personnel bring better user experience, give full play to the performance of dual intensity ray examination apparatus, further increase the competitiveness of product And user experience.
In one embodiment, according to calibration material corresponding with the transparency of the first ray the under multiple x-ray angles The standard angle distributional difference curve corresponding with the first X-ray transmutation X of the angle distributional difference Coefficient Fitting calibration material of two rays； Standard angle distributional difference curve discretization is obtained into calibration material in the corresponding with the first X-ray transmutation X of each x-ray angle Angle distributional difference coefficient.
In one embodiment, it is determined and is detected according to the positional relationship in detector in detector array and ray main beam direction The x-ray angle of device determines the angle distributional difference coefficient of the detector based on the standard angle distributional difference curve of generation.It is real one Shi Zhong can determine that other dual intensities are penetrated according to the main beam direction half-convergency distributional difference coefficient of device model parameter and ray is checked The angle distributional difference coefficient of ray examination system, device model parameter include the mechanical design structure of system, detector size and/ Or the main beam elevation angle of accelerator.
The dual energy X-ray inspection systems of same model should have similar angle distributional difference coefficient distribution, preferably may be used To pass through the angle distributional difference curve of design standard, on the detector according to the main beam direction of inspection device model parameter and ray Position standard angle distributional difference curve is converted, determine the angle distributional difference coefficient of other dual intensity ray inspection systems, And adjustment appropriate is carried out according to the state status of accelerator, the actual conditions of current device are adapted to, so that hardware be effectively reduced Cost.
The dual energy X-ray inspection systems of different model, due to the mechanical design structure of system, detector size and add The difference at the main beam elevation angle of fast device, angle distributional difference coefficient be not also identical.But in the similar situation of accelerator data state, According to the design parameter relationship between distinct device system, obtained by being converted to standard angle distributional difference curve corresponding Angle distributional difference coefficient files.
The case where many detector positions can not be covered for calibration material, above-described embodiment proposes conversion method.This Sample is distributed conversion regime by the standard angle distributional difference Coefficient Look-up Table of design and angle, it is possible to reduce the investment of hardware aspect Cost, and adapt to be influenced do not have the case where complete training device by objective factor.Reduction procedure is used in the prior art, Improve resolving effect.
Fig. 8 shows the flow chart of the dual intensity ray inspection system substance identification of one embodiment of the invention.Such as Fig. 8 institute Show, this method specifically includes that
Step S800, the first ray of predetermined x-ray angle and the transparency of the second ray are obtained.
Step S802, it is determined according to the sorting parameter of the transparency and predetermined x-ray angle of the first ray and the second ray Material information, sorting parameter are the sorting parameters obtained according to dual intensity ray inspection system sorting parameter processing method.
Specifically, when identifying substance, by detector measurement through data processing obtain the first ray second judge it is transparent When spending, material classification is judged according to minimal distance principle.
The substance of the present embodiment sets method, by different x-ray angles according to different sorting parameter Curves Recognition materials Expect information, it in this way can more accurate identification material information.
Fig. 9 shows the structural block diagram of the dual intensity ray inspection system sorting parameter generating means of one embodiment of the invention.Such as Shown in Fig. 9, the device mainly includes: angle distributional difference coefficient obtains module 91, for obtaining calibration material in predetermined ray angle Lower angle distributional difference coefficient corresponding with transparency is spent, in one embodiment, for obtaining calibration material in predetermined x-ray angle The angle distributional difference coefficient of lower the second ray corresponding with the transparency of the first ray；Sorting parameter adjusts module 92, with angle point Cloth coefficient of variation obtains module 91 and is connected, and the angle distributional difference coefficient for the predetermined x-ray angle based on calibration material is to mark Determine material to be adjusted in the sorting parameter in main beam direction, thus obtain calibration material predetermined x-ray angle sorting parameter, In one embodiment, for the angle distributional difference coefficient of the second ray based on predetermined x-ray angle to calibration material in main beam side To sorting parameter be adjusted to obtain sorting parameter of the calibration material under predetermined x-ray angle.
In one embodiment, distributional difference coefficient in angle obtains module 91 and is used to turn to the transparency of the first ray is discrete Multiple level of transparency；Determine calibration material corresponding with each level of transparency of the first ray the under predetermined x-ray angle The angle distributional difference coefficient of two rays.
The dual intensity ray inspection system sorting parameter generating means of the present embodiment, penetrate difference by angle distributional difference coefficient The sorting parameter of line angle degree is effectively adjusted, to improve the dual intensity material discrimination effect of each x-ray angle, is given full play to The performance of dual intensity ray examination apparatus further increases the competitiveness and user experience of product.
Figure 10 shows the structural block diagram of the dual intensity ray inspection system sorting parameter generating means of one embodiment of the invention.Such as Shown in Figure 10, which includes that angle distributional difference coefficient obtains module 101 and sorting parameter adjustment module 102.
In one embodiment, it includes: main beam direction transparency acquiring unit that distributional difference coefficient in angle, which obtains module 101, 1011, for obtaining first in the main beam direction that the calibration material that the first ray of main beam direction passes through the first mass thickness obtains X-ray transmutation X, second X-ray transmutation X in the main beam direction that the calibration material that the second ray passes through the first mass thickness obtains； X-ray angle transparency acquiring unit 1012 passes through the first ray for determining the second mass thickness in predetermined x-ray angle The transparency of the calibration material of second mass thickness is first X-ray transmutation X in main beam direction；The second ray is obtained across second Second X-ray transmutation X of the predetermined x-ray angle that the calibration material of mass thickness obtains；Angle distributional difference factor determination unit 1013, for determining that calibration material exists according to the second X-ray transmutation X of predetermined ray and second X-ray transmutation X in main beam direction The angle distributional difference coefficient of the second ray corresponding with the first X-ray transmutation X of predetermined x-ray angle.
In one embodiment, main beam direction transparency acquiring unit 1011 obtains the first ray in main beam direction and passes through the The first X-ray transmutation X α is obtained after the calibration material of one mass thicknessL, calibration material of second ray across the first mass thickness After obtain the second X-ray transmutation X αH；X-ray angle transparency acquiring unit 1012 is in predetermined x-ray angle determination so that first penetrates The first X-ray transmutation X is α after line passes through calibration materialLWhen the second mass thickness, the second ray passes through second mass thickness The second ray actual transparency degree α ' is obtained after calibration materialH；Angle distributional difference factor determination unit 1013 determines that the first ray is saturating Lightness is αLWhen, calibration material the second ray of predetermined x-ray angle angle distributional difference coefficient be α 'H/αH。
In one embodiment, sorting parameter adjustment module 102 is used for the classification according to calibration material on main beam direction The angle distributional difference coefficient of second ray of parameter curve and predetermined x-ray angle determines calibration material in predetermined x-ray angle Sorting parameter curve.
Figure 11 shows the structural frames of the dual intensity ray inspection system sorting parameter processing unit of another embodiment of the invention Figure.As shown in figure 11, which includes that angle distributional difference coefficient obtains module 91, standard angle distributional difference curve generation module 113, angle distributional difference coefficient conversion module 114 and sorting parameter adjust module 92.Wherein, distributional difference coefficient in angle obtains module 91 and sorting parameter adjustment module 92 function and act on it is similar to the respective modules in foregoing embodiments, for brevity, This is not described in detail.Wherein, standard angle distributional difference curve generation module 113, for according to standard dual intensity radiological survey X system The angle distributional difference coefficient of calibration material second ray corresponding with the transparency of the first ray under multiple x-ray angles of system The standard angle distributional difference curve corresponding with the first X-ray transmutation X of fitting calibrating material.In one embodiment, angle is distributed Coefficient of variation conversion module 114 is visited for being determined according to the positional relationship in detector in detector array and ray main beam direction The x-ray angle for surveying device, the angle distributional difference coefficient of detector is determined based on standard angle distributional difference curve.In one embodiment In, angle distributional difference coefficient conversion module 114 is used for according to the model parameter of dual intensity ray inspection system equipment and the master of ray The position of Shu Fangxiang on the detector carries out conversion to standard angle distributional difference curve and obtains the corresponding angle point of inspection system equipment Cloth coefficient of variation.Wherein, the model parameter of dual intensity ray inspection system equipment includes the mechanical design structure of system, detector The main beam elevation angle of size and/or accelerator.
In one embodiment, the first ray is low energy ray, and the second ray is high-energy ray.In another embodiment, First ray is high-energy ray, and the second ray is low energy ray.Wherein, the first ray and the second ray can be X-ray or gal Ma ray.
Figure 12 shows the structural block diagram of the material identification device of one embodiment of the invention.As shown in figure 12, the device is main It include: that transparency obtains module 1201, material classification determining module 1202 and dual intensity ray inspection system sorting parameter processing dress Set 1203.Transparency obtains the first X-ray transmutation X and the second ray that module 1201 is used to obtain the predetermined x-ray angle of detector Transparency；Material classification determining module 1202 obtains module 1201 with transparency and is connected, according to the first X-ray transmutation X and The sorting parameter of the transparency of second ray and predetermined x-ray angle determines material information, which penetrated according to dual intensity The sorting parameter that ray examination genealogical classification parameter processing apparatus 1203 obtains.Dual intensity ray inspection system sorting parameter processing unit 1203 may refer to the corresponding intrument in hereinbefore each embodiment.
The substance of the present embodiment sets device, by different x-ray angles according to different sorting parameter Curves Recognition materials Expect information, in this way can more accurate identification material information, give full play to the performance of dual intensity ray examination apparatus, further increase The competitiveness and user experience of product.
For the device in the embodiment of Fig. 9~12, the function of modules or unit can be with reference to above method The corresponding description of embodiment.
Description of the invention is given for the purpose of illustration and description, and is not exhaustively or will be of the invention It is limited to disclosed form.Many modifications and variations are obvious for the ordinary skill in the art.It selects and retouches It states embodiment and is to more preferably illustrate the principle of the present invention and practical application, and those skilled in the art is enable to manage The solution present invention is to design various embodiments suitable for specific applications with various modifications.

Claims (24)

1. a kind of dual intensity ray inspection system sorting parameter processing method characterized by comprising
Obtain the angle distributional difference system of calibration material second ray corresponding with the first X-ray transmutation X under predetermined x-ray angle Number；
The angle distributional difference coefficient of the predetermined x-ray angle based on the calibration material is to the calibration material in main beam side To sorting parameter be adjusted, thus obtain it is described calibration material the predetermined x-ray angle sorting parameter.
2. the method according to claim 1, wherein the predetermined ray angle based on the calibration material Sorting parameter of the angle distributional difference coefficient of degree to the calibration material in main beam direction is adjusted to obtain the calibration Material includes: in the sorting parameter of the predetermined x-ray angle
The angle distributional difference coefficient of the second ray based on the predetermined x-ray angle is to the calibration material in main beam direction Sorting parameter is adjusted to obtain sorting parameter of the calibration material under the predetermined x-ray angle.
3. the method according to claim 1, wherein acquisition angle distributional difference coefficient includes:
In the main beam direction, the first ray is obtained across the main beam direction that the calibration material of the first mass thickness obtains The second of the main beam direction that the calibration material that first X-ray transmutation X, the second ray pass through first mass thickness obtains X-ray transmutation X；
In the predetermined x-ray angle, determines the second mass thickness of the calibration material, pass through first ray described The transparency of the calibration material of second mass thickness is first X-ray transmutation X in the main beam direction；Obtain described second Second X-ray transmutation X of the predetermined x-ray angle that the calibration material that ray passes through second mass thickness obtains；
The mark is determined according to the second X-ray transmutation X of the second X-ray transmutation X of the predetermined ray and the main beam direction Material is determined in the angle distributional difference coefficient of the second ray corresponding with first X-ray transmutation X of the predetermined x-ray angle.
4. according to the method described in claim 3, it is characterized in that, first X-ray transmutation X in the main beam direction is αL, described Second X-ray transmutation X in main beam direction is αH；Second X-ray transmutation X of the predetermined x-ray angle is α 'H, the calibration material Material under the predetermined x-ray angle with the first X-ray transmutation X αLThe angle distributional difference coefficient of corresponding second ray is α’H/αH。
5. the method according to claim 3 or 4, which is characterized in that first ray is low energy ray, and described second penetrates Line is high-energy ray；
Or
First ray is high-energy ray, and second ray is low energy ray.
6. the method according to claim 1, wherein further include:
Multiple level of transparency are turned to by the transparency is discrete；
Determine calibration material angle distributional difference corresponding with each level of transparency under the predetermined x-ray angle Coefficient.
7. according to the method described in claim 2, it is characterized by further comprising:
According to the angle of calibration material second ray corresponding with the transparency of first ray under multiple x-ray angles The standard angle distributional difference curve corresponding with first X-ray transmutation X of material is demarcated described in distributional difference Coefficient Fitting；
The standard angle distributional difference curve discretization is obtained into the calibration material in each x-ray angle and described first The corresponding angle distributional difference coefficient of X-ray transmutation X.
8. the method according to the description of claim 7 is characterized in that further include:
The x-ray angle of the detector, base are determined according to the positional relationship of detector in detector array and ray main beam direction The angle distributional difference coefficient of the detector is determined in the standard angle distributional difference curve.
9. the method according to the description of claim 7 is characterized in that further include:
According to the position of the main beam direction of the model parameter of dual intensity ray inspection system and ray on the detector to the standard Angle distributional difference curve carries out conversion and obtains the corresponding angle distributional difference coefficient of the dual intensity ray inspection system.
10. according to the method described in claim 9, it is characterized in that, the model parameter of the dual intensity ray inspection system includes The main beam elevation angle of the mechanical design structure of system, the size of detector and/or accelerator.
11. according to the method described in claim 2, it is characterized in that, first ray and the second ray are X-ray or gamma Ray.
12. according to the method described in claim 2, it is characterized in that, second ray based on the predetermined x-ray angle Angle distributional difference coefficient the sorting parameter of the calibration material in main beam direction is adjusted to obtain the calibration material Expect that the sorting parameter under the predetermined x-ray angle includes:
It is penetrated according to the second of sorting parameter curve and the predetermined x-ray angle of the calibration material on the main beam direction The angle distributional difference coefficient of line determines the calibration material in the sorting parameter of the predetermined x-ray angle.
13. a kind of substance identification characterized by comprising
Obtain the first X-ray transmutation X and the second X-ray transmutation X of predetermined x-ray angle；
It is determined according to the sorting parameter of first X-ray transmutation X and the second X-ray transmutation X and the predetermined x-ray angle Material information, wherein the sorting parameter is the classification obtained according to the method for any of claims 1-12 Parameter.
14. a kind of dual intensity ray inspection system sorting parameter processing unit characterized by comprising
Angle distributional difference coefficient obtains module, for obtaining transparency of the calibration material under predetermined x-ray angle with the first ray The angle distributional difference coefficient of corresponding second ray；
Sorting parameter adjusts module, the angle distributional difference coefficient pair for the predetermined x-ray angle based on the calibration material Sorting parameter of the calibration material in main beam direction is adjusted, to obtain the calibration material in the predetermined ray angle The sorting parameter of degree.
15. device according to claim 14, which is characterized in that
The sorting parameter adjustment module is used for the angle distributional difference coefficient pair of the second ray based on the predetermined x-ray angle Sorting parameter of the calibration material in main beam direction is adjusted to obtain the calibration material in the predetermined ray angle Sorting parameter under degree.
16. device according to claim 14, which is characterized in that the angle distributional difference coefficient obtains module and includes:
Main beam direction transparency acquiring unit passes through the institute of the first mass thickness in first ray of main beam direction for obtaining First X-ray transmutation X in the main beam direction that calibration material obtains is stated, the second ray passes through the mark of first mass thickness Determine second X-ray transmutation X in the main beam direction that material obtains；
X-ray angle transparency acquiring unit makes described first for determining the second mass thickness in the predetermined x-ray angle The transparency that ray passes through the calibration material of second mass thickness is first X-ray transmutation X in the main beam direction； Obtain second ray across second mass thickness the obtained predetermined x-ray angle of the calibration material the Two X-ray transmutation Xs；
Angle distributional difference factor determination unit, for according to the predetermined ray the second X-ray transmutation X and the main beam direction The second X-ray transmutation X determine the calibration material in the corresponding with first X-ray transmutation X of the predetermined x-ray angle The second ray angle distributional difference coefficient.
17. device according to claim 16, which is characterized in that first X-ray transmutation X in the main beam direction is αL, institute The second X-ray transmutation X for stating main beam direction is αH；Second X-ray transmutation X of the predetermined x-ray angle is α 'H；
The angle distributional difference factor determination unit determines the calibration material under the predetermined x-ray angle with described first X-ray transmutation X αLThe angle distributional difference coefficient of corresponding second ray is α 'H/αH。
18. device according to claim 14, which is characterized in that the angle distributional difference coefficient obtains module and is used for institute State that transparency is discrete to turn to multiple level of transparency；Determine the calibration material under the predetermined x-ray angle with it is each described The angle distributional difference coefficient of corresponding second ray of level of transparency.
19. device according to claim 15, which is characterized in that further include:
Standard angle distributional difference curve generation module, for according to the calibration material under multiple x-ray angles with the first ray Corresponding second ray of transparency angle distributional difference Coefficient Fitting described in calibration material with first X-ray transmutation X Corresponding standard angle distributional difference curve.
20. device according to claim 19, which is characterized in that further include:
Angle distributional difference coefficient conversion module, for the positional relationship according to detector in detector array and ray main beam direction The x-ray angle for determining the detector determines the angle distributional difference of the detector based on the standard angle distributional difference curve Coefficient.
21. device according to claim 20, which is characterized in that the angle distributional difference coefficient conversion module is used for basis It is poor that the position of the main beam direction of the model parameter of dual intensity ray inspection system and ray on the detector is distributed the standard angle Different curve carries out conversion and obtains the corresponding angle distributional difference coefficient of the dual intensity ray inspection system.
22. device according to claim 21, which is characterized in that the model parameter of the dual intensity ray inspection system includes The main beam elevation angle of the mechanical design structure of system, the size of detector and/or accelerator.
23. device according to claim 14, which is characterized in that the sorting parameter adjustment module is also used to according to The angle distribution for demarcating the second ray of sorting parameter curve and the predetermined x-ray angle of the material on the main beam direction is poor Different coefficient determines the calibration material in the sorting parameter of the predetermined x-ray angle.
24. a kind of material identification device characterized by comprising
The dual intensity ray inspection system sorting parameter processing unit as described in any one of described claim 14-23；
Transparency obtain module, for obtain the predetermined x-ray angle of detector the first X-ray transmutation X and the second ray it is transparent Degree；
Material classification determining module is connected with the transparency acquiring unit, according to first X-ray transmutation X and second The sorting parameter of the transparency of ray and the predetermined x-ray angle determines material information, and the sorting parameter is according to The sorting parameter that dual intensity ray inspection system sorting parameter processing unit obtains.
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