CN105806171A - Measuring structure achieved by means of double concentric circles, method and application of the method - Google Patents
Measuring structure achieved by means of double concentric circles, method and application of the method Download PDFInfo
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- CN105806171A CN105806171A CN201610218336.4A CN201610218336A CN105806171A CN 105806171 A CN105806171 A CN 105806171A CN 201610218336 A CN201610218336 A CN 201610218336A CN 105806171 A CN105806171 A CN 105806171A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B3/00—Measuring instruments characterised by the use of mechanical techniques
- G01B3/22—Feeler-pin gauges, e.g. dial gauges
- G01B3/24—Feeler-pin gauges, e.g. dial gauges with open yoke, i.e. calipers
Abstract
The invention relates to the field of measurement, in particular to a measuring structure method achieved by means of double concentric circles, a method and application thereof.The theoretical basis is the inference of the invention.The circle A and the circle B of the concentric circles are arranged on the measuring structure, equal cells c are arranged on the circumference of the circle A, the circumference k of the circle B is equally divided, the circle A and the circle B relatively rotate, and reading is conducted through the coincidence line and the zero graduation line of the circle A and the circle B.The measuring structure has the advantages that compared with a traditional measuring tool, new measuring reference is obtained, and the measuring precision is higher and can even exceed the micron level; structure improvement of measuring tools such as a vernier caliper with a meter and a dial indicator is promoted, measuring errors are reduced accordingly, and the manufacturing difficulty is lowered.The method for measuring the angle is provided and is applied to an encoder, a stepping motor, a switch reluctance machine and the like.Under the specific condition, scale marks on the circle A and the circle B are sequentially arranged from small to large, and therefore the method can be applied to improvement in various measuring structures or machine tools.
Description
Technical field
The present invention relates to fields of measurement, particularly relate to the double; two concentrically ringed measurement structure of a kind of utilization, method and application thereof.
Background technology
Before more than 160 year, French mathematician is about Neil Bill, in " new quadrantal structure, utilization and characteristic " literary composition, gives the manufacturing theory of slide gauge, until today just has theorem here can explain this principle.Within more than 100 year, all without innovation, this just illustrates the natural law that inference herein is disclosed to the principle of micrometer and dial gauge, and people also not exclusively understand.Present reaching certainty of measurement with table slide gauge, dial gauge by big pinion drive, this mechanism can increase measurement error, and reading is all equal to main scale reading and adds secondary chi reading.The certainty of measurement of conventional measurement structure, can not meet the requirement of some modern industries, if still improving according to existing measuring principle, its certainty of measurement is difficult to improve.
Summary of the invention
Present invention aims to the existing state of the art, it is provided that the double; two concentrically ringed measurement structure of a kind of utilization, method and application thereof, after improving according to the method, this measuring principle can carry out three readings so that it is certainty of measurement is higher, even can exceed micron order.
The concentrically ringed measurement structure of a kind of utilization pair, and B circle round including A, it is characterised in that: it is round round with B that described measurement structure is provided with concentrically ringed A, A circle has equal c lattice, the circumference k decile of B circle, A is round and B is round relatively rotates, and the coincidence line round with B by A circle and zero graduation line carry out reading.
A kind of measuring method utilizing double; two concentrically ringed measurement structure: having equal c lattice on (1) A circle but not circumference in equal parts, the circumference that B justifies carries out k decile, on A circle c lattice equal with the central angle of the n lattice on B circle, and gcd (n, c)=1;(2) A circle rotates actual measurement in a week or movable length s millimeter, and on A circle, every lattice representMillimeter, the B every lattice of circle representMillimeter；(3) on A circle, head and the tail 2 are zero graduation lines, select the reading pointer wherein as B circle, and the reading on A circle is the reading corresponding to graduation mark overlapped.
A kind of measuring method utilizing double; two concentrically ringed measurement structure: the circumference of (1) A circle carries out c decile, the circumference of B circle carries out k decile, gcd (k, c)=d；(2) A circle rotates actual measurement in a week or movable length s millimeter, and the A every lattice of circle representMillimeter, the B every lattice of circle representMillimeter；(3) having, on A circle, the scale that d group is identical, often group hasIndividual different reading, A circle at least retains one group of graduation mark, and A circle can only select a zero graduation line, and as the reading pointer of B circle, the reading on A circle is the reading corresponding to coincidence scale.
A kind of measuring method utilizing double; two concentrically ringed measurement structure: the circumference of (1) A circle carries out c decile, the circumference of B circle carries out k decile, and every lattice of described A circle representDegree, the B every lattice of circle representDegree, gcd (k, c)=d；(2) having, on the A circle described in, the scale that d group is identical, often group hasIndividual different reading, A circle at least retains one group of scale；(3) when measuring angle, the summit at angle overlaps with the center of circle, and aliging with B circle zero degree line in a limit, aliging with A circle zero graduation line in another limit, the reading on A circle is the reading corresponding to graduation mark overlapped.
Such scheme, with table slide gauge by the rack drives pinion rotation on main scale, A circle on dial plate is along with pinion rotation, dial plate is mainly made up of A circle and B circle, and A circle has equal c lattice, and the circumference of B circle carries out k decile, c lattice on A circle are equal with the central angle of c+1 lattice on B circle or c-1 lattice, A circle rotates one week dial plate at main scale top offset s millimeter, and on main scale, every lattice are s millimeters, and on A circle, every lattice representMillimeter, the B every lattice of circle representMillimeter, does not want open-bull gear drive here, and the value of s is at least more than several millimeters, and when lattice every on main scale change one millimeter into, the integer part of reading can read on main scale, and therefore the integer part of the reading on B circle all changes zero into；Measuring length is zero, then dial plate is positioned at main scale zero graduation, and B circle overlaps with the zero graduation line of A circle, and this zero graduation line on A circle is the reading pointer of B circle.Can also justifying along with pinion rotation by B, A circle is fixing.If A circumference c decile；Gcd(k, c)=| on k-c|=d, A circle, every lattice representMillimeter, other conditions are constant, also can manufacture band table slide gauge.
Such scheme, the microdrum of micrometer is as B circle, the circumference k decile of microdrum, fixing sleeve, as A circle, fixing sleeve has equal c lattice, c lattice on A circle are equal with the central angle of c+1 lattice on B circle or c-1 lattice, the head and the tail 2 of A circle are zero graduation lines, select a zero graduation line as datum line, and microdrum often rotates one week micrometric screw and moves s millimeter, the every lattice of main scale are s millimeters, and the every lattice of microdrum representMillimeter, the fixing every lattice of sleeve representMillimeter.When measurement length is zero, microdrum is on the zero graduation line of main scale, and the zero graduation line on microdrum overlaps with datum line.
Such scheme, the handle of Machine-Tool Control processing dimension rotates one week, distance between cutter and machined object changes s millimeter, the B circle driven by handle carries out k decile, the A circle concentric with B circle is provided with equal c lattice, c lattice on A circle are equal with the central angle of c+1 lattice on B circle or c-1 lattice, and the A every lattice of circle representMillimeter, the B every lattice of circle representMillimeter, arbitrarily takes a zero graduation line from A circle, and as the reading pointer of B circle, the graduated disc of A circle and B circle has at least one can adjust as required.Can also justifying along with handle rotates by A, B circle be fixing.
Such scheme, the measuring staff of dial gauge passes through rack drives pinion rotation, and the A circle on dial plate is along with pinion rotation, the circumference c decile of A circle, the circumference k decile of B circle, gcd (k, c)=| k-c |=d, A circle rotates one week then measuring staff displacement s millimeter, and the A every lattice of circle representMillimeter, the B every lattice of circle representMillimeter；When measuring staff is not in contact with object, B circle overlaps with the zero graduation line of A circle, and this zero graduation line on A circle is the reading pointer of B circle.Can also justifying along with pinion rotation by B, A circle is fixing.If A circumference simply has equal c lattice, the c lattice on A circle are equal with the central angle of the c+1 lattice on B circle or c-1 lattice, and the every lattice on A circle representMillimeter, other condition is constant, also can produce dial gauge.
Such scheme, the microdrum of micrometer is as B circle, the circumference k decile of microdrum, and fixing sleeve is as A circle, the circumference c decile of fixing sleeve, (k, c)=| k-c |=d, fixing sleeve takes a bisector as datum line to gcd, also it is zero graduation line, microdrum rotates one week micrometric screw and moves s millimeter, and the every lattice of main scale are s millimeters, and the every lattice of microdrum representMillimeter, the fixing every lattice of sleeve representMillimeter；Measuring length is zero, and microdrum is on the zero graduation line of main scale, and the zero graduation line on microdrum overlaps with datum line.
Such scheme, the handle of Machine-Tool Control processing dimension rotates one week, and the distance between cutter and machined object changes s millimeter, the B circle driven by handle carries out k decile, and the A circle concentric with B circle is carried out c decile, gcd (k, c)=| k-c |=d, A every lattice of circle representMillimeter, the B every lattice of circle representMillimeter, arbitrarily takes a zero graduation line from A circle, and as the reading pointer of B circle, the graduated disc of A circle and B circle has at least one can adjust as required.Can also justifying along with handle rotates by A, B circle be fixing.
The invention have the benefit that
The present invention carries out reading by A circle and both cooperations of B circle, the measurement structure such as micrometer, dial gauge and band table slide gauge are allowed to have had new principle, its certainty of measurement is higher, even can surmount micron level, survey tool internal structure can also be simplified, thus reducing measurement error, reduce manufacture difficulty；Improvement to machine tool, can allow the machining accuracy of lathe surmount existing top level；The invention provides a kind of method measuring angle, in encoder, motor, switched reluctance machines etc., all can have purposes；And the present invention is under given conditions, the scale on A circle and B circle is arranged in order from small to large so that it is method is applicable in the improvement of various measurement structure or lathe.
Accompanying drawing illustrates:
Accompanying drawing 1 is the structural representation of the embodiment of the present invention 1；
Accompanying drawing 2 is the structural representation of the embodiment of the present invention 4；
Mark illustrates: A circle 1；B circle 2.
Detailed description of the invention:
In order to make juror can the purpose of the present invention, feature and function be further understood that, hereby lift preferred embodiment and coordinate graphic detailed description as follows:
Adjacent theorem: a and b is arithmetic number, and a > b, draws the point of the integral multiple of a above number axis by redness, and the lower section black at number axis draws the point of the integral multiple of b, if, and m and n is coprime positive integer, then have: the distance between adjacent coincidence point is all na or mb.
1. the point on number axis is symmetrical with the perpendicular bisector of adjacent coincidence point, symmetrical with coincidence point.
2. the distance of adjacent 2 is respectivelyOr, between adjacent coincidence point, every kind of distance only has two, and symmetrical with perpendicular bisector.
3. here adjacent 2 refer to that red point is adjacent with stain, their distance can be calculated with ax-by, x and y is integer, and b is the ultimate range of adjacent 2, as a-b >Time, between adjacent coincidence point, b has multiple, but can meet only two required.
Prove: 1. tna=tmb(tZ), the point being apparent from satisfying condition tna on number axis is all coincidence point, it is assumed that also have coincidence line tna+xa(x between tna and (t+1) × naZ+), then there is tna+xa < (t+1) naX < n., m and n does not have same factors, has at least a factor to be absent from x, therefore in x < n, nNot being integer, namely tna+xa is not coincidence point, and tna and (t+1) × na is adjacent coincidence point, between distance be (t+1) × na-tna=na.
2. demonstrate,prove slightly.
3. assume that the stain on number axis can move integrally left and right, arbitrarily take a red point and a stain, become coincidence point, and this coincidence point is decided to be zero point, 2. 1. same provable conclusion be set up with conclusion, and therefore left and right moves integrally stain, as long as occurring that coincidence point is exactly numerous, the state of occurred coincidence point, the point between adjacent coincidence point, distribution situation is forever identical.The minimum range making at adjacent 2 is y, from conclusion 2., stain moves y to the left or to the right all can there is coincidence point, can knowing by inference further, stain arbitrarily moves how many y, coincidence point all can occurs, stain moves integrally when being b the ultimate range of adjacent 2 (b be) also there will be coincidence point, therefore b is the integral multiple of y, below stain be just discussed only move y every time, moving the total distance of how many times to same direction is b.
Arbitrarily take two adjacent coincidence points, and mark at two red some places, be not wherein that the red point of coincidence point has n-1.Stain moves y every time, only there will be a coincidence point, if there is plural coincidence point between markd two red points, the distance of adjacent coincidence point just has less than na, if occurring without coincidence point, the distance of adjacent coincidence point just has more than na, and 1. this contradict with conclusion.It it not any one red point of coincidence point, it is all b with the distance sum of both sides stain, therefore the total distance of stain displacement is in the process of b, each red point only once becomes coincidence point, if there being a red point not become coincidence point, necessarily occurring that the minimum range of adjacent 2 was not the situation of y, the point between this with adjacent coincidence point, distribution situation is forever identical to be contradicted.Stain only moves y every time as known from the above, and moving n time red the counting of coincidence point (be not add one) total distance to same direction is b, i.e. ny=by=, therefore the distance of adjacent 2 is respectively, between adjacent coincidence point, the distance sum of adjacent 2 is 2(n-1) and+2=2n, conclusion 2. known every kind of distance only have two, and symmetrical.
1: two equal concentric circular of inference, lights a circumference C decile, another circumference K decile from one, is arbitrarily rotated by a circle, if gcd(k, c)=d, then often rotateDegree, just has d coincidence point decile two circle (starting point is considered as coincidence point).
Prove: taking long line segment one circle of composition for nad on number axis, on circumference, red point has nd, and stain hasD, coincidence point has d, makes k=md, c=nd, then has gcd(k, c)=d, and therefore this circle can be considered and meets two concentric circulars that inference requires, by the proof procedure of adjacent theorem it can be seen that a circle is arbitrarily rotated, often rotatesIndividual arc length, arises that d coincidence point divides equally circumference,Central angle corresponding to individual arc length is。
On the number axis of theorem, retaining m+1 stain between two adjacent coincidence points, as the secondary chi (vernier) of slide gauge, all red points make main scale, when coincidence point both sides exist a-b= During m-n=1, the distance of adjacent 2 is order arrangement from small to large, the now reading on vernier, from small to large order arrangement；As a-b >Time, the reading on vernier is chaotic.Arbitrarily take the long slide gauge for ka > na and become two concentric circulars,Central angle corresponding to arc length is×=, therefore there is following inference 2, as n=m-1 or m+1, adjacent 2 central angles of inference 2, from small to large order arrangement, now with the present invention for according to the survey tool manufactured, its reading is order arrangement from small to large.M--n=1 is substituted into k-c=md-nd and can obtain k-c=d, therefore k-c=gcd(k, time c), the central angle of adjacent 2 in inference 1, from small to large order arrangement, now recognize the survey tool that the present invention manufactures, its reading is order arrangement from small to large.Inference 1 and inference 2 are the theoretical foundations of the present invention.
Inference 2:A, two equal concentric circulars of B, light from same, draws equal m lattice on A circumference, but not circumference in equal parts, B circumference k decile, the m lattice on A circle are equal with the n lattice central angle on B circle, rotated to same direction by a circle, if gcd (m, n)=1, then often rotateDegree, arises that one or two coincidence points, and often rotating just has two coincidence points for m time, and is the head and the tail two point (starting point is considered as coincidence point) of A circle
The concentrically ringed measurement structure of a kind of utilization pair, and B circle round including A, it is round round with B that described measurement structure is provided with concentrically ringed A, A circle has equal c lattice, the circumference k decile of B circle, A is round and B is round relatively rotates, and the coincidence line round with B by A circle and zero graduation line carry out reading.
1, a kind of method of measurement length utilizing double; two concentrically ringed measurement structure: have equal c lattice on (1) A circle, but not circumference in equal parts, the circumference of B circle carries out k decile, c lattice on A circle are equal with the central angle of n lattice on B circle, and gcd(n, c)=1(2) A circle rotates actual measurement in a week or movable length s millimeter, and on A circle, every lattice represent×=Millimeter, the B every lattice of circle representMillimeter；(3) reading on A circle is the reading corresponding to graduation mark overlapped, and on A circle, head and the tail 2 are zero graduations, selects the reading pointer wherein as B circle.
2, a kind of method of measurement length utilizing double; two concentrically ringed measurement structure: the circumference of (1) A circle carries out c decile, and the circumference of B circle carries out k decile, gcd (k, c)=d；(2) A circle rotates actual measurement in a week or movable length s millimeter, and the A every lattice of circle represent×=Millimeter, the B every lattice of circle representMillimeter；(3) having, on A circle, the scale that d group is identical, often group hasIndividual different reading, A circle at least retains one group of scale, and A circle can only select a zero graduation line, and as the reading pointer of B circle, the reading on A circle is the reading corresponding to graduation mark overlapped.
3, a kind of method of measurement angle utilizing double; two concentrically ringed measurement structure: the circumference of (1) A circle carries out c decile, the circumference of B circle carries out k decile, and every lattice of described A circle representDegree, the B every lattice of circle representDegree, gcd (k, c)=d；(2) having, on the A circle described in, the scale that d group is identical, often group hasIndividual different reading, A circle at least retains one group of scale；(3) when measuring angle, the summit at angle overlaps with the center of circle, and aliging with B circle zero degree line in a limit, aliging with A circle zero graduation line in another limit, the reading on A circle is the reading corresponding to graduation mark overlapped.
Embodiment 1
Band table slide gauge, with table slide gauge by the rack drives pinion rotation on main scale, A circle on dial plate is along with pinion rotation, dial plate is mainly made up of A circle and B circle, having equal c=50 lattice on A circle, the circumference of B circle carries out k=100 decile, and the c=50 lattice on A circle are equal with the central angle of B upper 49 lattice of circle, within one week, then dial plate is at main scale top offset s=10 millimeter in A circle rotation, and on A circle, every lattice represent=0.002 millimeter, the B every lattice of circle represent=0.1 millimeter, the every lattice of main scale are one millimeter, and the integer part of the reading on B circle all changes zero into；Measuring length is zero, then dial plate is positioned at main scale zero graduation, and B circle overlaps with the zero graduation line of A circle, and this zero graduation line on A circle is the reading pointer of B circle.
Embodiment 2
Micrometer microdrum is as B circle, the circumference k=50 decile of microdrum, fixing sleeve is as A circle, fixing sleeve there are equal c=20 lattice, 20 lattice on A circle are equal with the central angle of B upper 21 lattice of circle, and the head and the tail 2 of A circle are zero graduation lines, select a zero graduation line as datum line, microdrum often rotates one week micrometric screw and moves s=1 millimeter, and the every lattice of microdrum represent=0.02 millimeter, the fixing every lattice of sleeve represent=0.001 millimeter, on main scale, every lattice are one millimeter, and when measurement length is zero, microdrum is on the zero graduation line of main scale, and the zero graduation line of microdrum overlaps with datum line.
Embodiment 3
The handle of Machine-Tool Control processing dimension rotates one week, distance between cutter and machined object changes s=5 millimeter, and the B circle driven by handle carries out k=100 decile, and the A circle concentric with B circle is provided with equal c=50 lattice, 50 lattice on A circle are equal with the central angle of B upper 51 lattice of circle, and the A every lattice of circle represent=0.001 millimeter, the B every lattice of circle represent=0.05 millimeter, arbitrarily taking a zero graduation line from A circle, as the reading pointer of B circle, the graduated disc of A circle and B circle has at least one can adjust as required.
Embodiment 4
The measuring staff of dial gauge passes through rack drives pinion rotation, A circle on dial plate is along with pinion rotation, dial plate is mainly made up of A circle and B circle, the circumference c=101 decile of A circle, the circumference k=100 decile of B circle, gcd (k, c)=| k-c |=d=1, A circle rotates one week then measuring staff displacement s=10 millimeter, and the A every lattice of circle represent=Millimeter, the B every lattice of circle represent=0.1 millimeter；When measuring staff is not in contact with object, B circle overlaps with the zero graduation line of A circle, and the zero graduation line on A circle is the reading pointer of B circle.
Embodiment 5
The microdrum of micrometer is as B circle, the circumference k=50 decile of microdrum, fixing sleeve is as A circle, the circumference c=48 decile of fixing sleeve, gcd (k, c)=| k-c |=d=2, taking a bisector as datum line on fixing sleeve, be also zero graduation line, microdrum often rotates one week micrometric screw and moves s=0.5 millimeter, the every lattice of main scale are 0.5 millimeter, and the every lattice of microdrum represent=0.01 millimeter, the fixing every lattice of sleeve represent=Millimeter, when measurement length is zero, microdrum is on main scale zero graduation line, and the zero graduation line on microdrum overlaps with datum line, fixing sleeve has two groups of identical readings, it is possible to only retain one group.
Embodiment 6
The handle of Machine-Tool Control processing dimension rotates one week, and the distance between cutter and machined object changes s=2 millimeter, and the B circle driven by handle carries out k=100 decile, the A circle concentric with B circle is carried out c=96 decile, (k, c)=| k-c |=d=4, A every lattice of circle represent gcd=Millimeter, the B every lattice of circle represent=0.02 millimeter, arbitrarily taking a zero graduation line from A circle, as the reading pointer of B circle, the graduated disc of A circle and B circle has at least one can adjust as required, A circle has 4 groups of identical readings, it is possible to only retain one group.
Certainly; illustrated above it is only better embodiment of the present invention; not limit the use scope of the present invention with this; such as: micrometer, dial gauge, parts etc. with the observing and controlling length of table slide gauge and lathe, angle; therefore, every make in the principle of the invention equivalence change should be included in protection scope of the present invention.
Claims (10)
1. utilize a double; two concentrically ringed measurement structure, including A circle and B circle, it is characterised in that: described measurement structure is provided with concentrically ringed A circle and B circle, A circle has equal c lattice, the circumference k decile of B circle, A is round and B is round relatively rotates, and the coincidence line round with B by A circle and zero graduation line carry out reading.
2. the measuring method of the double; two concentrically ringed measurement structure of a utilization as claimed in claim 1, it is characterised in that: (1) A circle has equal c lattice, and not circumference in equal parts, the circumference of B circle carries out k decile, c lattice on A circle are equal with the central angle of the n lattice on B circle, and gcd (n, c)=1;(2) A circle rotates actual measurement in a week or movable length s millimeter, and on A circle, every lattice representMillimeter, the B every lattice of circle representMillimeter；(3) on A circle, head and the tail 2 are zero graduation lines, select the reading pointer wherein as B circle, and the reading on A circle is the reading corresponding to graduation mark overlapped.
3. the measuring method of the double; two concentrically ringed measurement structure of utilization as claimed in claim 1, it is characterised in that: the circumference of (1) A circle carries out c decile, and the circumference of B circle carries out k decile, gcd (k, c)=d；(2) A circle rotates actual measurement in a week or movable length s millimeter, and the A every lattice of circle representMillimeter, the B every lattice of circle representMillimeter；(3) having, on A circle, the scale that d group is identical, often group hasIndividual different reading, A circle at least retains one group of scale, and A circle can only select a zero graduation line, and as the reading pointer of B circle, the reading on A circle is the reading corresponding to graduation mark overlapped.
4. the measuring method of the double; two concentrically ringed measurement structure of utilization as claimed in claim 1, it is characterised in that: the circumference of (1) A circle carries out c decile, and the circumference of B circle carries out k decile, and every lattice of described A circle representDegree, the B every lattice of circle representDegree, gcd (k, c)=d；(2) having, on the A circle described in, the scale that d group is identical, often group hasIndividual different reading, A circle at least retains one group of scale；(3) when measuring angle, the summit at angle overlaps with the center of circle, and aliging with B circle zero degree line in a limit, aliging with A circle zero graduation line in another limit, the reading on A circle is the reading corresponding to graduation mark overlapped.
5. the double; two concentrically ringed measuring method of a kind of utilization according to claim 2, it is applied to band table slide gauge, it is characterized in that: with table slide gauge by the rack drives pinion rotation on main scale, A circle on dial plate is along with pinion rotation, dial plate is mainly made up of A circle and B circle, A circle has equal c lattice, the circumference of B circle carries out k decile, c lattice on A circle are equal with the central angle of c+1 lattice on B circle or c-1 lattice, A circle rotate one week then dial plate at main scale top offset s millimeter, on main scale, every lattice are S millimeters, and on A circle, every lattice representMillimeter, the B every lattice of circle representMillimeter, when the every lattice of main scale change one millimeter into, the integer part of the reading on B circle all changes zero into；Measuring length is zero, then dial plate is positioned at main scale zero graduation, and B circle overlaps with the zero graduation line of A circle, and this zero graduation line on A circle is the reading pointer of B circle.
6. the double; two concentrically ringed length measurement method of a kind of utilization according to claim 2, it is applied to micrometer, it is characterized in that: microdrum is as B circle, the circumference k decile of microdrum, and fixing sleeve is as A circle, fixing sleeve there are equal c lattice, c lattice on A circle are equal with the central angle of c+1 lattice on B circle or c-1 lattice, and the head and the tail 2 of A circle are zero graduation lines, select a zero graduation line as datum line, microdrum often rotates one week micrometric screw and moves s millimeter, and the every lattice of microdrum representMillimeter, the fixing every lattice of sleeve representMillimeter, the every lattice of main scale are S millimeters；When measurement length is zero, microdrum is on the zero graduation of main scale, and the zero graduation line on microdrum overlaps with datum line.
7. the double; two concentrically ringed length measurement method of a kind of utilization according to claim 2, it is applied to machine tool, it is characterized in that: the handle of Machine-Tool Control processing dimension rotates one week, distance between cutter and machined object changes s millimeter, the B circle driven by handle carries out k decile, the A circle concentric with B circle is provided with equal c lattice, and the c lattice on A circle are equal with the central angle of c+1 lattice on B circle or c-1 lattice, and the A every lattice of circle representMillimeter, the B every lattice of circle representMillimeter, arbitrarily takes a zero graduation line from A circle, and as the reading pointer of B circle, the graduated disc of A circle and B circle has at least one can adjust as required.
8. the double; two concentrically ringed length measurement method of a kind of utilization according to claim 3, it is applied to dial gauge, it is characterized in that: the measuring staff of dial gauge passes through rack drives pinion rotation, the A circle on dial plate is along with pinion rotation, and dial plate is mainly made up of A circle and B circle, the circumference c decile of A circle, the circumference k decile of B circle, gcd (k, c)=| k-c |=d, A circle rotates one week then measuring staff displacement s millimeter, and the A every lattice of circle representMillimeter, the B every lattice of circle representMillimeter；When measuring staff is not in contact with object, B circle overlaps with the zero graduation line of A circle, and this zero graduation line on A circle is the reading pointer of B circle.
9. the double; two concentrically ringed length measurement method of a kind of utilization according to claim 3, it is applied to micrometer, and microdrum is as B circle, the circumference k decile of microdrum, fixing sleeve is as A circle, the circumference c decile of fixing sleeve, gcd (k, c)=| k-c |=d, fixing sleeve takes a bisector as datum line, also being zero graduation line, microdrum often rotates one week micrometric screw and moves s millimeter, and the every lattice of microdrum representMillimeter, the fixing every lattice of sleeve representMillimeter, the every lattice of main scale are s millimeters；When measurement length is zero, microdrum is on the zero graduation line of main scale, and the zero graduation line on microdrum overlaps with datum line.
10. the double; two concentrically ringed length measurement method of a kind of utilization according to claim 3, it is applied to machine tool, it is characterized in that: the handle of Machine-Tool Control processing dimension rotates one week, distance between cutter and machined object changes s millimeter, the B circle driven by handle carries out k decile, and the A circle concentric with B circle is carried out c decile, gcd (k, c)=| k-c |=d, A every lattice of circle representMillimeter, the B every lattice of circle representMillimeter, arbitrarily takes a zero graduation line from A circle, and as the reading pointer of B circle, the graduated disc of A circle and B circle has at least one can adjust as required.
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| CN201610218336.4A Pending CN105806171A (en) | 2016-04-11 | 2016-04-11 | Measuring structure achieved by means of double concentric circles, method and application of the method |
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| CN2189733Y (en) * | 1993-12-19 | 1995-02-15 | 汉中精密仪器厂 | Numeral-point type antishock caliper centigrade meter |
| CN2288802Y (en) * | 1996-11-15 | 1998-08-26 | 蔡继绪 | High precision vernier adjusting boring cutter |
| CN2293793Y (en) * | 1997-01-11 | 1998-10-07 | 成谢锋 | Vernier protractor |
| CN202002600U (en) * | 2011-02-23 | 2011-10-05 | 葛洲坝集团试验检测有限公司 | Inspection protractor |
| CN103575173A (en) * | 2013-11-25 | 2014-02-12 | 郭永然 | 180-degree vernier protractor |
| CN103697781A (en) * | 2014-01-02 | 2014-04-02 | 祁砚明 | Ten-thousandth micrometer |
| CN203837608U (en) * | 2014-04-22 | 2014-09-17 | 朱嘉慧 | Gradian vernier disc protractor |
| CN104713438A (en) * | 2015-03-13 | 2015-06-17 | 张念文 | Inner-outer diameter micrometer |
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| CN2031908U (en) * | 1988-05-20 | 1989-02-01 | 吴春苗 | Specialized vernier callipers for milling machine |
| CN2030312U (en) * | 1988-06-09 | 1989-01-04 | 严松山 | Turning angle admeasuring apparatus |
| GB2264364A (en) * | 1992-02-20 | 1993-08-25 | Yin Hong Wong | Protractor |
| CN2189733Y (en) * | 1993-12-19 | 1995-02-15 | 汉中精密仪器厂 | Numeral-point type antishock caliper centigrade meter |
| CN2288802Y (en) * | 1996-11-15 | 1998-08-26 | 蔡继绪 | High precision vernier adjusting boring cutter |
| CN2293793Y (en) * | 1997-01-11 | 1998-10-07 | 成谢锋 | Vernier protractor |
| CN202002600U (en) * | 2011-02-23 | 2011-10-05 | 葛洲坝集团试验检测有限公司 | Inspection protractor |
| CN103575173A (en) * | 2013-11-25 | 2014-02-12 | 郭永然 | 180-degree vernier protractor |
| CN103697781A (en) * | 2014-01-02 | 2014-04-02 | 祁砚明 | Ten-thousandth micrometer |
| CN203837608U (en) * | 2014-04-22 | 2014-09-17 | 朱嘉慧 | Gradian vernier disc protractor |
| CN104713438A (en) * | 2015-03-13 | 2015-06-17 | 张念文 | Inner-outer diameter micrometer |
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