CN105785210A - Harness conduction test device and test method - Google Patents

Harness conduction test device and test method Download PDF

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Publication number
CN105785210A
CN105785210A CN201610121906.8A CN201610121906A CN105785210A CN 105785210 A CN105785210 A CN 105785210A CN 201610121906 A CN201610121906 A CN 201610121906A CN 105785210 A CN105785210 A CN 105785210A
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China
Prior art keywords
wire harness
computer
chip microcomputer
test device
heart yearn
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CN201610121906.8A
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Chinese (zh)
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CN105785210B (en
Inventor
叶志伟
田刚
徐政豪
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NINGBO TUOPU ELECTRICAL APPLIANCE CO Ltd
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NINGBO TUOPU ELECTRICAL APPLIANCE CO Ltd
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Priority to CN201610121906.8A priority Critical patent/CN105785210B/en
Publication of CN105785210A publication Critical patent/CN105785210A/en
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/58Testing of lines, cables or conductors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections

Abstract

The present invention discloses a harness conduction test device and a test method. The device comprises n MCUs, n groups of comparators which are corresponding to the n MCUs, a vibration machine, and temperature and humidity test boxes arranged on the vibration machine, and n harnesses arranged in the temperature and humidity test boxes, wherein n is larger than or equal to 1. Each MCU and each group of comparator are in a monitoring box which is provided with an alarm lamp. Each MCU is electrically connected to the alarm lamp. Each group of comparators comprises eight comparators, each comparator comprises two comparison circuits, and the input ends of m comparison circuits of each group of comparators are electrically connected to one end of m core wires of one harness. The harness conduction test device and the test method have the advantages of good applicability, fast response speed, high testing precision, good testing consistency, and high testing efficiency.

Description

A kind of wire harness conducting test device and method of testing
Technical field
The present invention relates to technical field, especially relate to a kind of measuring accuracy height, the test wire harness conducting test device that concordance is good, testing efficiency is high and method of testing.
Background technology
In order to make the wire harness used in vehicle disclosure satisfy that the long playing prescription of vehicle, all need when wire harness dispatches from the factory wire harness is carried out continuity test, just the wire harness only meeting test request can dispatch from the factory.
Traditional wire break-make monitoring realizes by monitoring its conducting resistance, need to utilize modulus (A/D) modular converter, if wire harness comprises 16 heart yearns, then need 16 modulus (A/D) modular converters, owing to the time of A/D transformation process is longer, intermittent open circuit for us level, it is easy to the situation that monitor signal is lost occur, causes that measuring accuracy is low.
nullChinese patent mandate publication number: CN202770947U,Authorize publication date on March 6th, 2013,Disclose a kind of electromotor workpiece technique wire harness conduction detecting device,Including detecting device body,Described monitoring device body is connected with Control System of Microcomputer,Technique wire harness can be directly displayed by computer monitor whether to turn on and fault location,Described detecting device body one end is used for placing and fixing workpiece to be detected,The technique wiring harness connector of described workpiece to be detected is provided with for docking the female socket with the docking of male probe with wire harness,The described detecting device other end is provided with cylinder and the wire harness docking male probe being arranged on cylinder,The wire harness docking female socket with the docking of male probe is docked with wire harness,Described wire harness docking male probe is under cylinder-pushed,Dock with described wire harness and dock with female socket.The weak point of this utility model is, it is easy to cause test error.
Summary of the invention
The goal of the invention of the present invention is to overcome wire harness conduction detecting device of the prior art to be easily caused the deficiency of test error, it is provided that a kind of measuring accuracy is high, test concordance is good, testing efficiency is high wire harness conducting test device and method of testing.
To achieve these goals, the present invention is by the following technical solutions:
A kind of wire harness conducting test device, including n block single-chip microcomputer, n group comparator corresponding with every piece of single-chip microcomputer respectively, jarring machine, is located at the humiture test box on jarring machine and the n bar wire harness being located in humiture test box, n >=1;Each piece of single-chip microcomputer and each group of comparator are respectively positioned in monitoring box, and monitoring box is provided with alarm lamp, and each piece of single-chip microcomputer all electrically connects with alarm lamp;Often group comparator is 8, and each comparator all includes 2 comparison circuits, and the input of m the comparison circuit often organizing comparator electrically connects with one end of the m bar heart yearn of 1 wire harness respectively;The outfan electrical connection of each comparator that every piece of single-chip microcomputer is all corresponding, each piece of single-chip microcomputer is all connected with computer data, and computer electrically connects with humiture test box and jarring machine respectively.
The present invention utilizes comparator that make-and-break signal is tested, and single-chip microcomputer will pass to computer by signal, the fast response time of make-and-break signal test, can a plurality of wire harness be tested simultaneously, and measuring accuracy is high, concordance is good, testing efficiency is high in test.
As preferably, each comparison circuit all includes potentiometer, amplifier, several operating resistances and sampling resistor;One fixed contact end of potentiometer is connected with VCC, another fixed contact end ground connection of potentiometer, the movable contact end of potentiometer electrically connects with the inverting input of amplifier, the in-phase input end of amplifier electrically connects with battery core and sampling resistor one end respectively, the sampling resistor other end is connected with VCC, battery core other end ground connection, the outfan of amplifier electrically connects with each operating resistance and corresponding single-chip microcomputer respectively.
As preferably, described amplifier is LM393 amplifier, and operating resistance is 2,2 operating resistance respectively resistance R461 and resistance R437, resistance R461 two ends electrically connect with the 1st pin of LM393 amplifier and the 8th pin respectively, and the 1st pin of resistance R437 and LM393 amplifier electrically connects.
As preferably, each single-chip microcomputer is electrically connected with computer by CAN.
As preferably, each bar wire harness is positioned on the fixed mount of humiture test box.
The method of testing of a kind of wire harness conducting test device, comprises the steps:
(6-1) computer is provided with by with vibration frequency be abscissa, vibrations power spectral value be vertical coordinate shock curve, with the testing time be abscissa, temperature be vertical coordinate temperature adjustment curve, with the testing time be abscissa, humidity be vertical coordinate humidity regulation curve and testing time length T;
Computer sends enabled instruction to each single-chip microcomputer, humiture test box and jarring machine, in testing time length T, humiture test box carries out the adjustment of temperature and humidity according to temperature adjustment curve and humidity regulation curve, controls jarring machine and shakes according to shock curve;
The moment definition receiving enabled instruction was all 0 moment by each single-chip microcomputer, then starts timing accumulator, often increases 1ms by accumulator count once;
(6-2) in the process that jarring machine and humiture test box work, the per interval T of each single-chip microcomputer1Inquiring about the feedback states value of the m bar heart yearn of n wire harness successively, state value when giving tacit consent to the conducting of all heart yearns is " 0 ";
When continuous 5 " 1 " occurs in any heart yearn, or when continuous 5 " 1 " enter " 0 " state afterwards, described Single-chip Controlling alarm lamp flicker T3This state value is also passed to computer, and the accumulation interval of accumulator is sent to computer by the second, and between when reached during T, computer controls humiture test box and bobbing machine quits work, and computer draws the state change curve of every heart yearn;
(6-3) computer is provided with fault threshold T2, the time span that " 1 " in the state change curve of every heart yearn is occurred by computer is more than T2Place is defined as trouble point, and the heart yearn of number >=1, trouble point is all defined as fault heart yearn;
For every wire harness, if any of which bar heart yearn is fault heart yearn, then show that described wire harness is defective in a computer;Otherwise show that described wire harness is qualified in a computer.
As preferably, the span of described vibration frequency is 100Hz to 1650Hz, and the vibrations power spectral value of described shock curve is from 88 (m/s2)2/ Hz first rises to 180 (m/s in cosine shape along with the increase of vibration frequency2)2Then/Hz drops to 82 (m/s along oblique line2)2/ Hz is stable at 82 (m/s thereafter2)2/Hz。
As preferably, the span of temperature is-40 DEG C to 120 DEG C, and along with the increase of testing time, temperature first drops to-40 DEG C in cosine shape from 18 DEG C, then rises to 120 DEG C along oblique line, then drops to 20 DEG C along sinusoidal from 120 DEG C.
As preferably, the span of humidity is 20% to 95%, and along with the increase of testing time, humidity first rises to 44% in oblique line shape from 20%, then drops to 28% along oblique line, and its tailing edge oblique line rises to 95%, then drops to 20% from 95% along oblique line.
As preferably, T1For 1us, T2For 10s.
Therefore, there is advantages that the suitability is good, fast response time, measuring accuracy is high, concordance is good, testing efficiency is high in test.
Accompanying drawing explanation
Fig. 1 is a kind of theory diagram of the present invention;
Fig. 2 is the circuit diagram of a kind of comparison circuit of the present invention;
Fig. 3 is a kind of state change curve of the present invention;
Fig. 4 is a kind of flow chart of embodiments of the invention.
In figure: single-chip microcomputer 1, jarring machine 2, humiture test box 3, wire harness 4, comparison circuit 5, heart yearn 6, computer 7, CAN 8, alarm lamp 9, sampling resistor RL.
Detailed description of the invention
Below in conjunction with the drawings and specific embodiments, the present invention will be further described.
Embodiment as shown in Figure 1 is a kind of wire harness conducting test device, including 4 pieces of single-chip microcomputers 1, n group comparator corresponding with every piece of single-chip microcomputer respectively, jarring machine 2, is located at the humiture test box 3 on jarring machine and 4 wire harness 4 being located in humiture test box;Each piece of single-chip microcomputer and each group of comparator are respectively positioned in monitoring box, and monitoring box is provided with alarm lamp 9, and each piece of single-chip microcomputer all electrically connects with alarm lamp;Often group comparator is 2, and each comparator all includes 2 comparison circuits 5, and the input of 4 comparison circuits often organizing comparator electrically connects with one end of 4 heart yearns 6 of 1 wire harness respectively, and the other end of 4 heart yearns all meets VCC;The outfan electrical connection of each comparator that every piece of single-chip microcomputer is all corresponding, each piece of single-chip microcomputer all with computer 7 data cube computation, computer electrically connects with humiture test box and jarring machine respectively.Each bar wire harness is positioned on the fixed mount of humiture test box.
As in figure 2 it is shown, each comparison circuit all includes potentiometer, amplifier, several operating resistances and sampling resistor RL;One fixed contact end of potentiometer is connected with VCC, another fixed contact end ground connection of potentiometer, the movable contact end of potentiometer electrically connects with the inverting input of amplifier, the in-phase input end of amplifier electrically connects with battery core and sampling resistor one end respectively, the sampling resistor other end is connected with VCC, battery core other end ground connection, the outfan of amplifier electrically connects with each operating resistance and corresponding single-chip microcomputer respectively.
Amplifier is LM393 amplifier, operating resistance is 2,2 operating resistance respectively resistance R461 and resistance R437, resistance R461 two ends electrically connect with the 1st pin of LM393 amplifier and the 8th pin respectively, and the 1st pin of resistance R437 and LM393 amplifier electrically connects.
According to U=I*R, every wire harness one end ground connection, another terminates 100 Ω resistance RL, another termination 5V power supply (VCC) of 100 Ω resistance RL.Sampled point is between resistance RL and wire harness.During wire harness normally, the electric current ≈ 50Ma (wire harness conducting resistance is disregarded) of resistance RL, the voltage on resistance RL is 5V (U=I*R=0.05A*100 Ω), and the voltage of sampled point is 0V.If when moment open circuit (resistance value is more than 7 Ω), according to resistant series dividing potential drop, sampled voltage is higher than 0.37V ( U = 8 100 + 8 × 5 = 0.37 V ) .
Sampled point is connected to the positive input CH13A of LM393 amplifier, and reverse input end carries out dividing potential drop by potentiometer, and its reference voltage is adjusted to 0.37V.Therefore, when normally, the outfan of LM393 amplifier is output as low level " 0 ", exports high level " 1 " when open circuit.
As shown in Figure 4, the method for testing of a kind of wire harness conducting test device, comprise the steps:
Step 100, detection
Computer is provided with and is abscissa by with vibration frequency, shakes the shock curve that power spectral value is vertical coordinate, with the testing time be abscissa, temperature be vertical coordinate temperature adjustment curve, with the testing time be abscissa, humidity be vertical coordinate humidity regulation curve and testing time length T;
Computer sends enabled instruction to each single-chip microcomputer, humiture test box and jarring machine, in testing time length T, humiture test box carries out the adjustment of temperature and humidity according to temperature adjustment curve and humidity regulation curve, controls jarring machine and shakes according to shock curve;
The moment definition receiving enabled instruction was all 0 moment by each single-chip microcomputer, then starts timing accumulator, often increases 1ms by accumulator count once;
Step 200, draws the state change curve of every heart yearn
In the process that jarring machine and humiture test box work, the per interval T of each single-chip microcomputer1Inquiring about the feedback states value of the m bar heart yearn of n wire harness successively, state value when giving tacit consent to the conducting of all heart yearns is " 0 ";
When continuous 5 " 1 " occurs in any heart yearn, or when continuous 5 " 1 " enter " 0 " state afterwards, Single-chip Controlling alarm lamp glimmers 3 seconds and this state value is passed to computer, and the accumulation interval of accumulator is sent to computer, between when reached during T, computer controls humiture test box and bobbing machine quits work, and computer draws the state change curve of every heart yearn;
Step 300, makes the judgement whether wire harness is qualified
Computer is provided with fault threshold T2, as it is shown on figure 3, the time span that " 1 " in the state change curve of every heart yearn is occurred by computer is more than T2Place is defined as trouble point, and the heart yearn of number >=1, trouble point is all defined as fault heart yearn;
For every wire harness, if any of which bar heart yearn is fault heart yearn, then show that described wire harness is defective in a computer;Otherwise show that described wire harness is qualified in a computer.
Wherein, the span of vibration frequency is 100Hz to 1650Hz, and the vibrations power spectral value of described shock curve is from 88 (m/s2)2/ Hz first rises to 180 (m/s in cosine shape along with the increase of vibration frequency2)2Then/Hz drops to 82 (m/s along oblique line2)2/ Hz is stable at 82 (m/s thereafter2)2/Hz。
The span of temperature is-40 DEG C to 120 DEG C, and along with the increase of testing time, temperature first drops to-40 DEG C in cosine shape from 18 DEG C, then rises to 120 DEG C along oblique line, then drops to 20 DEG C along sinusoidal from 120 DEG C.
The span of humidity is 20% to 95%, and along with the increase of testing time, humidity first rises to 44% in oblique line shape from 20%, then drops to 28% along oblique line, and its tailing edge oblique line rises to 95%, then drops to 20% from 95% along oblique line.T1For 1us, T2For 10s.
Should be understood that the present embodiment is merely to illustrate the present invention rather than restriction the scope of the present invention.In addition, it is to be understood that after having read the content that the present invention lectures, the present invention can be made various changes or modifications by those skilled in the art, and these equivalent form of values fall within the application appended claims limited range equally.

Claims (10)

1. a wire harness conducting test device, it is characterized in that, including n block single-chip microcomputer (1), n group comparator corresponding with every piece of single-chip microcomputer respectively, jarring machine (2), it is located at the humiture test box on jarring machine (3) and n bar wire harness (4) being located in humiture test box, n >=1;Each piece of single-chip microcomputer and each group of comparator are respectively positioned in monitoring box, and monitoring box is provided with alarm lamp (9), and each piece of single-chip microcomputer all electrically connects with alarm lamp;Often group comparator is 8, and each comparator all includes 2 comparison circuits (5), and the input of m the comparison circuit often organizing comparator electrically connects with one end of m bar heart yearn (6) of 1 wire harness respectively;The outfan electrical connection of each comparator that every piece of single-chip microcomputer is all corresponding, each piece of single-chip microcomputer all with computer (7) data cube computation, computer electrically connects with humiture test box and jarring machine respectively.
2. wire harness conducting test device according to claim 1, is characterized in that, each comparison circuit all includes potentiometer, amplifier, several operating resistances and sampling resistor (RL);One fixed contact end of potentiometer is connected with VCC, another fixed contact end ground connection of potentiometer, the movable contact end of potentiometer electrically connects with the inverting input of amplifier, the in-phase input end of amplifier electrically connects with battery core and sampling resistor one end respectively, the sampling resistor other end is connected with VCC, battery core other end ground connection, the outfan of amplifier electrically connects with each operating resistance and corresponding single-chip microcomputer respectively.
3. wire harness conducting test device according to claim 2, it is characterized in that, described amplifier is LM393 amplifier, operating resistance is 2,2 operating resistance respectively resistance R461 and resistance R437, resistance R461 two ends electrically connect with the 1st pin of LM393 amplifier and the 8th pin respectively, and the 1st pin of resistance R437 and LM393 amplifier electrically connects.
4. wire harness conducting test device according to claim 1, is characterized in that, each single-chip microcomputer is electrically connected with computer by CAN (8).
5. the wire harness conducting test device according to claim 1 or 2 or 3 or 4, is characterized in that, each bar wire harness is positioned on the fixed mount of humiture test box.
6. based on a method of testing for the wire harness conducting test device described in claim 1, it is characterized in that, comprise the steps:
(6-1) computer is provided with by with vibration frequency be abscissa, vibrations power spectral value be vertical coordinate shock curve, with the testing time be abscissa, temperature be vertical coordinate temperature adjustment curve, with the testing time be abscissa, humidity be vertical coordinate humidity regulation curve and testing time length T;
Computer sends enabled instruction to each single-chip microcomputer, humiture test box and jarring machine, in testing time length T, humiture test box carries out the adjustment of temperature and humidity according to temperature adjustment curve and humidity regulation curve, controls jarring machine and shakes according to shock curve;
The moment definition receiving enabled instruction was all 0 moment by each single-chip microcomputer, then starts timing accumulator, often increases 1ms by accumulator count once;
(6-2) in the process that jarring machine and humiture test box work, the per interval T of each single-chip microcomputer1Inquiring about the feedback states value of the m bar heart yearn of n wire harness successively, state value when giving tacit consent to the conducting of all heart yearns is " 0 ";
When continuous 5 " 1 " occurs in any heart yearn, or when continuous 5 " 1 " enter " 0 " state afterwards, described Single-chip Controlling alarm lamp flicker T3This state value is also passed to computer, and the accumulation interval of accumulator is sent to computer by the second, and between when reached during T, computer controls humiture test box and bobbing machine quits work, and computer draws the state change curve of every heart yearn;
(6-3) computer is provided with fault threshold T2, the time span that " 1 " in the state change curve of every heart yearn is occurred by computer is more than T2Place is defined as trouble point, and the heart yearn of number >=1, trouble point is all defined as fault heart yearn;
For every wire harness, if any of which bar heart yearn is fault heart yearn, then show that described wire harness is defective in a computer;Otherwise show that described wire harness is qualified in a computer.
7. the method for testing of wire harness conducting test device according to claim 6, is characterized in that, the span of described vibration frequency is 100Hz to 1650Hz, and the vibrations power spectral value of described shock curve is from 88 (m/s2)2/ Hz first rises to 180 (m/s in cosine shape along with the increase of vibration frequency2)2Then/Hz drops to 82 (m/s along oblique line2)2/ Hz is stable at 82 (m/s thereafter2)2/Hz。
8. the method for testing of wire harness conducting test device according to claim 6, it is characterized in that, the span of temperature is-40 DEG C to 120 DEG C, increase along with the testing time, temperature first drops to-40 DEG C in cosine shape from 18 DEG C, then rise to 120 DEG C along oblique line, then drop to 20 DEG C along sinusoidal from 120 DEG C.
9. the method for testing of wire harness conducting test device according to claim 6, it is characterized in that, the span of humidity is 20% to 95%, increase along with the testing time, humidity first rises to 44% in oblique line shape from 20%, then dropping to 28% along oblique line, its tailing edge oblique line rises to 95%, then drops to 20% from 95% along oblique line.
10. the method for testing of the wire harness conducting test device according to claim 6 or 7 or 8 or 9, is characterized in that, T1For 1us, T2For 10s.
CN201610121906.8A 2016-03-03 2016-03-03 A kind of wire harness conducting test device and test method Active CN105785210B (en)

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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106019064A (en) * 2016-08-04 2016-10-12 歌尔股份有限公司 Electronic element on-off measuring method and equipment applied to same
CN109060355A (en) * 2018-07-18 2018-12-21 浙江创格科技有限公司 A kind of durable test device of engine wiring harness
CN113625194A (en) * 2021-07-20 2021-11-09 迪力普电子(常州)有限公司 Distributed wire harness testing system and method based on SCTP
US11235715B2 (en) * 2017-11-13 2022-02-01 Robert Bosch Gmbh Test device for a plug-in connection, control unit, control system

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CN201812020U (en) * 2010-10-20 2011-04-27 天津豪风机电设备有限公司 Automotive wiring harness conduction detecting system
CN103207347A (en) * 2013-03-19 2013-07-17 太原市华洋吉禄电子控制技术有限公司 Multi-core multi-model cable automatic detecting device and detecting method
CN203825107U (en) * 2014-02-28 2014-09-10 成都蓉盛达系统工程技术有限公司 Wiring harness tester
CN204479699U (en) * 2014-12-23 2015-07-15 北京新能源汽车股份有限公司 To the device that the insulating property of the high-voltage wiring harness of electric automobile are measured

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Publication number Priority date Publication date Assignee Title
CN201293816Y (en) * 2008-10-15 2009-08-19 熊猫电子集团有限公司 Rapid cable detector
CN201812020U (en) * 2010-10-20 2011-04-27 天津豪风机电设备有限公司 Automotive wiring harness conduction detecting system
CN103207347A (en) * 2013-03-19 2013-07-17 太原市华洋吉禄电子控制技术有限公司 Multi-core multi-model cable automatic detecting device and detecting method
CN203825107U (en) * 2014-02-28 2014-09-10 成都蓉盛达系统工程技术有限公司 Wiring harness tester
CN204479699U (en) * 2014-12-23 2015-07-15 北京新能源汽车股份有限公司 To the device that the insulating property of the high-voltage wiring harness of electric automobile are measured

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106019064A (en) * 2016-08-04 2016-10-12 歌尔股份有限公司 Electronic element on-off measuring method and equipment applied to same
US11235715B2 (en) * 2017-11-13 2022-02-01 Robert Bosch Gmbh Test device for a plug-in connection, control unit, control system
CN109060355A (en) * 2018-07-18 2018-12-21 浙江创格科技有限公司 A kind of durable test device of engine wiring harness
CN113625194A (en) * 2021-07-20 2021-11-09 迪力普电子(常州)有限公司 Distributed wire harness testing system and method based on SCTP

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