CN105762055A - Mass spectrum device for research of plasma-micromolecule system reaction - Google Patents
Mass spectrum device for research of plasma-micromolecule system reaction Download PDFInfo
- Publication number
- CN105762055A CN105762055A CN201410787348.XA CN201410787348A CN105762055A CN 105762055 A CN105762055 A CN 105762055A CN 201410787348 A CN201410787348 A CN 201410787348A CN 105762055 A CN105762055 A CN 105762055A
- Authority
- CN
- China
- Prior art keywords
- plasma
- reaction
- laser
- electrode
- vacuum
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000006243 chemical reaction Methods 0.000 title claims abstract description 67
- 238000001819 mass spectrum Methods 0.000 title claims description 5
- 238000011160 research Methods 0.000 title description 2
- 238000000605 extraction Methods 0.000 claims abstract description 35
- 239000007787 solid Substances 0.000 claims abstract description 12
- 238000004544 sputter deposition Methods 0.000 claims abstract description 12
- 238000004949 mass spectrometry Methods 0.000 claims abstract description 11
- 150000003384 small molecules Chemical class 0.000 claims abstract description 7
- 239000000203 mixture Substances 0.000 claims abstract description 3
- 239000002184 metal Substances 0.000 claims description 24
- 229910052751 metal Inorganic materials 0.000 claims description 24
- 238000010884 ion-beam technique Methods 0.000 claims description 16
- 238000004458 analytical method Methods 0.000 claims description 13
- 238000000034 method Methods 0.000 claims description 12
- 230000007935 neutral effect Effects 0.000 claims description 3
- 238000007493 shaping process Methods 0.000 claims description 3
- 125000006850 spacer group Chemical group 0.000 claims description 3
- 238000005477 sputtering target Methods 0.000 claims description 2
- 239000000284 extract Substances 0.000 claims 5
- 238000009413 insulation Methods 0.000 claims 2
- 230000001105 regulatory effect Effects 0.000 claims 2
- 230000001133 acceleration Effects 0.000 claims 1
- 238000003491 array Methods 0.000 claims 1
- 238000002955 isolation Methods 0.000 claims 1
- 238000010926 purge Methods 0.000 claims 1
- 239000013077 target material Substances 0.000 claims 1
- 239000000047 product Substances 0.000 abstract description 13
- 239000007795 chemical reaction product Substances 0.000 abstract description 8
- 238000005516 engineering process Methods 0.000 abstract description 5
- 238000001269 time-of-flight mass spectrometry Methods 0.000 abstract description 5
- 238000004519 manufacturing process Methods 0.000 abstract description 2
- 230000019771 cognition Effects 0.000 abstract 1
- 150000002500 ions Chemical class 0.000 description 17
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 16
- 239000007789 gas Substances 0.000 description 14
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 13
- 239000001301 oxygen Substances 0.000 description 13
- 229910052760 oxygen Inorganic materials 0.000 description 13
- 229910052742 iron Inorganic materials 0.000 description 8
- 238000005520 cutting process Methods 0.000 description 5
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 4
- -1 Iron oxide ions Chemical class 0.000 description 2
- 238000011161 development Methods 0.000 description 2
- 238000003698 laser cutting Methods 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 239000002893 slag Substances 0.000 description 2
- 238000004611 spectroscopical analysis Methods 0.000 description 2
- 230000003321 amplification Effects 0.000 description 1
- 238000012512 characterization method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000010494 dissociation reaction Methods 0.000 description 1
- 230000005593 dissociations Effects 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- UQSXHKLRYXJYBZ-UHFFFAOYSA-N iron oxide Inorganic materials [Fe]=O UQSXHKLRYXJYBZ-UHFFFAOYSA-N 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 230000003863 physical function Effects 0.000 description 1
- 239000012495 reaction gas Substances 0.000 description 1
- 239000000523 sample Substances 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
- 238000013519 translation Methods 0.000 description 1
Landscapes
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Abstract
本发明涉及一种用于研究等离子体-小分子体系反应的质谱装置。所述用于研究等离子体-小分子体系反应的质谱装置包括等离子体-小分子反应单元(1),飞秒激光电离系统(2),离子提取系统(3),质量分析器(4),真空腔体(5)。其中,纳秒激光溅射固体靶材用于产生等离子体,气相小分子经过毛细管进入等离子体产生区域,并且与等离子体在靶材表面附近发生反应。采用飞秒激光电离技术对反应产物进行电离,最后,结合飞行时间质谱技术对反应产物进行分析并加以确认。该装置可以准确、高效、实时地表征等离子体与气相分子反应的产物构成,为生产加工过程中所存在的实际的等离子体与气体反应的准确认知提供模型支持。
The invention relates to a mass spectrometry device for studying plasma-small molecule system reaction. The mass spectrometry device for studying the plasma-small molecule system reaction comprises a plasma-small molecule reaction unit (1), a femtosecond laser ionization system (2), an ion extraction system (3), a mass analyzer (4), Vacuum chamber (5). Among them, the nanosecond laser sputtering solid target is used to generate plasma, and the gas phase small molecules enter the plasma generation area through the capillary, and react with the plasma near the surface of the target. Femtosecond laser ionization technology was used to ionize the reaction products, and finally, combined with time-of-flight mass spectrometry, the reaction products were analyzed and confirmed. The device can accurately, efficiently and real-time characterize the product composition of the reaction between plasma and gas phase molecules, and provide model support for the accurate cognition of the actual plasma and gas reaction in the production process.
Description
技术领域technical field
本发明涉及微观化学反应动力学领域,具体地说是一种用于研究等离子体与气相小分子体系反应的质谱装置,可以完成对等离子体与气相小分子反应过程产物的准确分析。The invention relates to the field of microscopic chemical reaction kinetics, in particular to a mass spectrometry device for studying the reaction of plasma and gas-phase small molecule systems, which can accurately analyze the products of the reaction process between plasma and gas-phase small molecules.
背景技术Background technique
微观化学反应动力学旨在原子与分子水平上探究化学反应过程,并且希望能够实现对反应的调控进而使反应的进行向着更加有利的方向发生。等离子体是激光加工过程中无法回避的伴生物,比较简单的一个例子,比如在大功率激光切割金属的过程中,当激光功率达到一定的阈值便会产生等离子体。上述等离子体的产生会使激光发生散焦,并且会吸收激光的能量从而导致激光切割能力被大大的削弱。但需要注意的是,在切割过程中如果使用不同的辅助切割气体,该等离子体的产生会随之而改变。比如在用氮气做激光切割辅助气体时,等离子体会随着激光功率的增加很容易产生,相差甚大的便是如果利用氧气作为辅助气体,上述等离子体便会得到一定的抑制。结合之前的一些研究手段,比如光谱等分析手段认识到在上述切割过程中氧气的参与除了作为辅助气体用来提供物理上的一些功能之外,比如将金属熔渣从切割区域驱除之外,还与金属发生反应致使等离子体的产生受到抑制,而氮气的功能仅仅是作为辅助气体将熔渣驱除,并未有别的反应,如此与等离子体之间发生反应等。对于上述过程的清晰认识,目前仍然缺乏清晰的图像,在很大程度上由于上述模型的建立和分析手段的限制使得对上述等离子与氧气参与的反应的认识受到限制。Microscopic chemical reaction kinetics aims to explore the chemical reaction process at the atomic and molecular level, and hopes to realize the regulation of the reaction and make the reaction proceed in a more favorable direction. Plasma is an unavoidable companion in the laser processing process. A relatively simple example, such as in the process of high-power laser cutting metal, will generate plasma when the laser power reaches a certain threshold. The generation of the above-mentioned plasma will defocus the laser and absorb the energy of the laser so that the cutting ability of the laser is greatly weakened. However, it should be noted that if different auxiliary cutting gases are used during the cutting process, the generation of the plasma will change accordingly. For example, when nitrogen is used as auxiliary gas for laser cutting, plasma will be easily generated with the increase of laser power. The big difference is that if oxygen is used as auxiliary gas, the above plasma will be suppressed to a certain extent. Combined with some previous research methods, such as spectroscopy and other analysis methods, it is recognized that the participation of oxygen in the above-mentioned cutting process is not only used as an auxiliary gas to provide some physical functions, such as driving metal slag from the cutting area, but also The reaction with metal suppresses the generation of plasma, and the function of nitrogen is only as an auxiliary gas to drive away the slag, and there is no other reaction, such as the reaction with plasma. For a clear understanding of the above process, there is still a lack of clear images. To a large extent, the understanding of the above-mentioned reactions involving plasma and oxygen is limited due to the limitations of the above-mentioned model establishment and analysis methods.
近年来,伴随着分析手段的高速发展,质谱技术、光谱技术以及能谱技术等均可以在分子水平上去研究反应过程的进行。其中,质谱技术在作为一种普适的分析技术近年来得到了越来越多的关注和应用。同时,飞行时间质谱也因其具有高分辨率、高灵敏度、结构简单、性价比高等特点而逐渐成为现今质谱分析领域最具有发展前景的分析手段之一。另外,随着超短脉冲激光器技术的成熟,使得高功率密度激光的应用变得越发普及。飞秒激光技术因其超短的激光脉冲(脉冲宽度在10-15秒量级)而逐渐成为飞行时间质谱电离手段的新的发展方向。利用飞秒激光聚焦之后可以非常容易获取太瓦级的功率密度,可以大大提高分析产物的电离效率。高效的电离手段和高分辨的分析技术的结合使得认识等离子反应过程的进行成为可能。In recent years, with the rapid development of analytical methods, mass spectrometry, spectroscopy, and energy spectroscopy can all study the reaction process at the molecular level. Among them, mass spectrometry, as a universal analytical technique, has received more and more attention and application in recent years. At the same time, time-of-flight mass spectrometry has gradually become one of the most promising analytical methods in the field of mass spectrometry because of its high resolution, high sensitivity, simple structure, and high cost performance. In addition, with the maturity of ultrashort pulse laser technology, the application of high power density laser has become more and more popular. Femtosecond laser technology has gradually become a new development direction of time-of-flight mass spectrometry ionization means because of its ultrashort laser pulse (pulse width is on the order of 10 -15 seconds). After the femtosecond laser is focused, it is very easy to obtain a power density of terawatt level, which can greatly improve the ionization efficiency of the analyzed product. The combination of efficient ionization means and high-resolution analysis technology makes it possible to understand the progress of plasma reaction process.
发明内容Contents of the invention
本发明是鉴于以上的事实而做出的,其目的在于提供一种用于研究等离子体-小分子体系反应的质谱装置;The present invention is made in view of the above facts, and its purpose is to provide a mass spectrometer for researching plasma-small molecule system reactions;
为实现上述目的,本发明采用的技术方案如图1所示:In order to achieve the above object, the technical solution adopted in the present invention is as shown in Figure 1:
一种用于研究等离子体-小分子体系反应的质谱装置,包括等离子体-小分子反应单元(1)、离子提取系统(3)和质量分析器(4)置于一密闭容器内;等离子体-小分子反应单元(1)包括中空密闭的反应腔,反应腔上设有与真空泵相连的抽真空口;反应腔内设置有金属靶材,纳秒激光器发出的纳秒激光照射于金属靶材的右侧表面,一气体管路的一端与气源相连,另一侧处于气体管路金属靶材的右侧,由气体管路注入的气体吹扫到纳秒激光照射的、金属靶材的右侧表面,于金属靶材的右侧形成一反应区,飞秒激光器发出的飞秒激光照射到反应区中;反应腔右侧开口,密闭容器左侧开口,反应腔右侧开口,密闭容器通过开口处密闭连接;离子提取系统(3)从左至右依次包括两片提取电极、离子束聚焦透镜组和两对偏转电极;提取电极为平行设置的二块平板,于平板的左侧分别设有圆锥台形突起,于圆锥台形突起上沿轴线方向设有贯穿平板的通孔,二块平板上的通孔同轴;离子束聚焦透镜组包括三片从左至右同轴间隔设置的、中空的筒状金属电极,偏转电极由两组金属平行板组成,第一组电极的极板与第二组的极板相垂直放置;两片提取电极与离子束聚焦透镜组同轴,且它们的轴线位于第一组电极的二个极板及第二组的二个极板之间;提取电极的通孔面向纳秒激光照射的、金属靶材的右侧表面;质量分析器位于提取电极的右侧,于靠近质量分析器一侧的密闭容器上设有与真空泵相连的抽真空口;等离子体-小分子反应单元产生的离子经离子提取系统后进入质量分析器中进行质量分析。A mass spectrometry device for studying plasma-small molecule system reactions, comprising a plasma-small molecule reaction unit (1), an ion extraction system (3) and a mass analyzer (4) placed in a closed container; the plasma - The small molecule reaction unit (1) includes a hollow and airtight reaction chamber, which is provided with a vacuum port connected to a vacuum pump; a metal target is arranged in the reaction chamber, and the nanosecond laser emitted by the nanosecond laser is irradiated on the metal target On the right side of the surface, one end of a gas pipeline is connected to the gas source, and the other side is on the right side of the metal target in the gas pipeline. On the right side surface, a reaction area is formed on the right side of the metal target, and the femtosecond laser emitted by the femtosecond laser is irradiated into the reaction area; the opening on the right side of the reaction chamber, the opening on the left side of the airtight container, the opening on the right side of the reaction chamber, airtight container Through the airtight connection of the opening; the ion extraction system (3) includes two extraction electrodes, ion beam focusing lens group and two pairs of deflection electrodes in sequence from left to right; the extraction electrodes are two flat plates arranged in parallel, respectively There is a truncated conical protrusion, and a through hole through the flat plate is arranged on the truncated conical protrusion along the axial direction. The through holes on the two flat plates are coaxial; the ion beam focusing lens group includes three coaxial and spaced from left to right, The hollow cylindrical metal electrode, the deflection electrode is composed of two sets of metal parallel plates, the plates of the first set of electrodes are placed perpendicular to the plates of the second set; the two extraction electrodes are coaxial with the ion beam focusing lens group, and they The axis of the electrode is located between the two plates of the first group of electrodes and the two plates of the second group; the through hole of the extraction electrode faces the right surface of the metal target irradiated by the nanosecond laser; the mass analyzer is located in the extraction electrode On the right side, a vacuum port connected to a vacuum pump is provided on the airtight container near the mass analyzer; the ions generated by the plasma-small molecule reaction unit enter the mass analyzer for mass analysis after passing through the ion extraction system.
进一步地,提取电极的二块平板之间由中部带孔的绝缘垫片隔离;真空泵为气体抽真空用的机械泵和分子泵。Further, the two plates of the extraction electrode are separated by an insulating gasket with a hole in the middle; the vacuum pump is a mechanical pump and a molecular pump for gas vacuuming.
进一步地,于左侧提取电极和金属靶材上施加电势,右侧提取电极接地;于离子束聚焦透镜组和两对偏转电极施加直流电压。Further, a potential is applied to the left extraction electrode and the metal target, and the right extraction electrode is grounded; DC voltage is applied to the ion beam focusing lens group and the two pairs of deflection electrodes.
进一步地,各部分功能如下:Further, the functions of each part are as follows:
(a)等离子体-小分子反应单元(1)可以产生等离子体并且与小分子体系发生反应;(a) The plasma-small molecule reaction unit (1) can generate plasma and react with the small molecule system;
(b)飞秒激光电离系统(2)将上述反应产物进行电离;(b) Femtosecond laser ionization system (2) ionizes the above reaction product;
(c)离子提取系统(3)将反应产物中被电离的离子进行提取加速整形,并且使该离子束进入飞行时间质谱;(c) ion extraction system (3) extracting and accelerating shaping the ionized ions in the reaction product, and making the ion beam enter the time-of-flight mass spectrometer;
(d)质量分析器(4)使进入该区域的离子根据动能的差异在时间上分开,并且由质谱探测器转换成可以分析的电压信号;(d) The mass analyzer (4) separates the ions entering the region in time according to the difference in kinetic energy, and is converted into an analyzable voltage signal by the mass spectrometer detector;
(f)真空腔室(5)为等离子-小分子反应以及质量分析器提供高真空环境。(f) Vacuum chamber (5) provides high vacuum environment for plasma-small molecule reaction and mass analyzer.
进一步地,等离子体-小分子反应单元(1)中采用激光溅射的方法产生等离子体。该溅射激光为脉冲激光,脉冲宽度为纳秒量级(1-1000纳秒),波长可以为300纳米-1200纳米。该纳秒激光经过聚焦透镜聚焦在固体靶材上,在聚焦位置处的功率大于等于105W/cm2。Further, laser sputtering is used to generate plasma in the plasma-small molecule reaction unit (1). The sputtering laser is a pulsed laser, the pulse width is on the order of nanoseconds (1-1000 nanoseconds), and the wavelength can be 300 nanometers to 1200 nanometers. The nanosecond laser is focused on a solid target through a focusing lens, and the power at the focusing position is greater than or equal to 10 5 W/cm 2 .
进一步地,等离子体-小分子反应单元(1)中的固体靶材被固定在一个四维调节架上,该四维调节架可以实现三维平动调节和一维转动调节。上述反应气体通过一个毛细管以射流的方式进入等离子体发生区域并与等离子发生反应。上述毛细管内径0.01毫米至1毫米。通过调节气体进入毛细管前的压强调节气体分子的反应浓度。Furthermore, the solid target in the plasma-small molecule reaction unit (1) is fixed on a four-dimensional adjustment frame, and the four-dimensional adjustment frame can realize three-dimensional translation adjustment and one-dimensional rotation adjustment. The above-mentioned reaction gas enters the plasma generation region in a jet flow through a capillary tube and reacts with the plasma. The inner diameter of the above-mentioned capillary is 0.01 mm to 1 mm. The reaction concentration of gas molecules is adjusted by adjusting the pressure before the gas enters the capillary.
进一步地,飞秒激光电离系统(2)被用于电离等离子体-小分子反应过程中的中性产物。该飞秒激光可以是产生的激光脉冲宽度在10-1000飞秒,频率1-1000赫兹,聚焦后的功率密度在1012W/cm2以上。飞秒激光电离区域位于纳秒激光溅射靶材表面位置距离5-15厘米。Further, a femtosecond laser ionization system (2) is used to ionize neutral products in the plasma-small molecule reaction process. The femtosecond laser can generate laser pulses with a width of 10-1000 femtoseconds, a frequency of 1-1000 Hz, and a focused power density of more than 10 12 W/cm 2 . The femtosecond laser ionization area is located at a distance of 5-15 cm from the surface of the nanosecond laser sputtering target.
进一步地,离子提取系统(3)可以对上述被电离的产物进行加速和整形。该离子提取系统(3)包括两片提取锥、离子束聚焦透镜组和两对偏转电极。提取锥锥形立体角为20至50度,锥体开孔0.5至5毫米,锥形底部直径7至50毫米,锥体长度5至50毫米。离子提取锥之间由绝缘垫片隔离,间距3至20毫米。离子束聚焦透镜组包括三片柱状金属电极,该组电极外径7至50毫米,内径5至45毫米,长度3至50毫米,电极间距2至25毫米。偏转电极由两组金属平行板组成,该两组电极垂直放置。每组电极片间距5至35毫米。电极片为矩形,边长尺寸为10至50毫米。上述提取锥和离子束聚焦透镜组同轴堆砌放置,且提第一片提取锥的锥顶距离纳秒激光溅射固体靶材的区域长度6至25毫米。Further, the ion extraction system (3) can accelerate and shape the above-mentioned ionized products. The ion extraction system (3) includes two extraction cones, an ion beam focusing lens group and two pairs of deflection electrodes. The extraction cone has a cone solid angle of 20 to 50 degrees, a cone opening of 0.5 to 5 mm, a cone bottom diameter of 7 to 50 mm, and a cone length of 5 to 50 mm. The ion extraction cones are separated by insulating spacers with a spacing of 3 to 20 mm. The ion beam focusing lens group includes three cylindrical metal electrodes, the outer diameter of the group of electrodes is 7 to 50 mm, the inner diameter is 5 to 45 mm, the length is 3 to 50 mm, and the electrode distance is 2 to 25 mm. The deflection electrodes consist of two sets of metal parallel plates placed vertically. The distance between each group of electrode sheets is 5 to 35 mm. The electrode sheet is rectangular with a side length dimension of 10 to 50 mm. The extraction cone and the ion beam focusing lens group are stacked coaxially, and the distance between the top of the first extraction cone and the region of the nanosecond laser sputtering solid target is 6 to 25 mm.
进一步地,质量分析器(4)可以采用直线式或者反射式的飞行时间质谱,并且该质谱的探测器为基于微通道板放大方式的离子探测器。Further, the mass analyzer (4) can adopt a linear or reflective time-of-flight mass spectrometer, and the detector of the mass spectrometer is an ion detector based on a microchannel plate amplification method.
进一步地,系统控制和数据采集单元(6)可以控制纳秒激光、飞秒激光以及离子提取锥施加的高压脉冲的开启时间。系统控制和数据采集单元(5)控制飞秒激光电离系统(2)在纳秒激光开启之后0.5-20微秒的时间内开启,离子提取系统(3)的高压开启时间与飞秒激光电离系统(2)同步或者在其后5微秒之内开启。Further, the system control and data acquisition unit (6) can control the turn-on time of the nanosecond laser, the femtosecond laser and the high-voltage pulse applied by the ion extraction cone. The system control and data acquisition unit (5) controls the femtosecond laser ionization system (2) to turn on within 0.5-20 microseconds after the nanosecond laser is turned on, and the high voltage turn-on time of the ion extraction system (3) is the same as that of the femtosecond laser ionization system (2) Synchronized or turned on within 5 microseconds thereafter.
进一步地,真空腔室(5)有两级真空腔体组成,且每级真空腔体具有一组机械泵加分子泵的真空泵组合构成。在装置运行的前期首先由机械泵对真空腔室进行粗抽,之后再有分子泵对真空腔室进行精抽,从而达到高真空或者超高真空状态。在等离子-小分子反应发生过程中反应腔(5a)的真空度优于10-3Pa,无场飞行腔的真空度优于10-5Pa。Further, the vacuum chamber (5) is composed of two stages of vacuum chambers, and each stage of vacuum chambers is composed of a combination of a mechanical pump and a molecular pump. In the early stage of device operation, the vacuum chamber is firstly pumped by the mechanical pump, and then the molecular pump is used to fine-pump the vacuum chamber, so as to achieve a high vacuum or ultra-high vacuum state. During the plasma-small molecule reaction process, the vacuum degree of the reaction chamber (5a) is better than 10 -3 Pa, and the vacuum degree of the fieldless flight chamber is better than 10 -5 Pa.
本发明利用纳秒激光溅射固体靶材产生的等离子体可以在功率密度上建模实际过程中的等离子体发生过程,利用飞秒激光作为电离手段,可以实现对产物的高效离子化。结合飞行时间质谱分析手段可以实时准确的分析等离子体-小分子体系反应过程中的产物,进而达到对上述反应过程的清晰认知,为实际生产加工过程中出现的相应问题进行理论分析提供模型依据。The invention utilizes the plasma generated by the nanosecond laser sputtering solid target to model the plasma generation process in the actual process in terms of power density, and uses the femtosecond laser as an ionization means to realize efficient ionization of products. Combined with the time-of-flight mass spectrometry analysis method, the products in the plasma-small molecule system reaction process can be analyzed accurately in real time, so as to achieve a clear understanding of the above reaction process, and provide a model basis for theoretical analysis of corresponding problems in the actual production and processing process .
附图说明Description of drawings
图1本发明实施例的原理示意图;Fig. 1 schematic diagram of the principle of an embodiment of the present invention;
图2本发明实施例得到的铁等离子体与氧气反应的产物质谱。Fig. 2 is the mass spectrum of the reaction product of iron plasma and oxygen obtained in the embodiment of the present invention.
其中1-等离子体-分子反应单元;1a-靶材架;1b-纳秒激光;1c-气体;2-飞秒激光电离系统;3-离子提取系统;4-质量分析器;5-真空腔体;5a-反应腔;5b-无场飞行腔。1-plasma-molecular reaction unit; 1a-target rack; 1b-nanosecond laser; 1c-gas; 2-femtosecond laser ionization system; 3-ion extraction system; 4-mass analyzer; 5-vacuum cavity body; 5a-reaction cavity; 5b-field-free flight cavity.
附图中的侧视图为示意性的且未按照比例绘制。不过不同的附图中相同或相似的部件均在附图中给出相同的标记。The side views in the figures are schematic and not drawn to scale. However, the same or similar components in different figures are given the same symbols in the figures.
具体实施方式detailed description
下面将通过具体的实施例来说明本发明所具有的一些特性和优点。本发明是按如下方式设计的一种用于研究等离子体-小分子体系反应的质谱装置,如图1所示,该装置包括等离子体-小分子反应单元(1),飞秒激光电离系统(2),离子提取系统(3),质量分析器(4),真空腔体(5)。其中,纳秒激光溅射固体靶材用于产生等离子体,气相小分子经过毛细管进入等离子体产生区域,并且与等离子体在靶材表面附近发生反应。采用飞秒激光电离技术对反应产物进行电离,最后,结合飞行时间质谱技术对反应产物进行分析并加以确认。该装置可以准确、高效、实时地表征等离子体与气相分子反应的产物构成。Some characteristics and advantages of the present invention will be illustrated below through specific embodiments. The present invention is a kind of mass spectrometry device for researching plasma-small molecule system reaction designed in the following way, as shown in Figure 1, this device comprises plasma-small molecule reaction unit (1), femtosecond laser ionization system ( 2), an ion extraction system (3), a mass analyzer (4), and a vacuum chamber (5). Among them, the nanosecond laser sputtering solid target is used to generate plasma, and the gas phase small molecules enter the plasma generation area through the capillary, and react with the plasma near the surface of the target. Femtosecond laser ionization technology was used to ionize the reaction products, and finally, combined with time-of-flight mass spectrometry, the reaction products were analyzed and confirmed. The device can accurately, efficiently and real-time characterize the product composition of the reaction between plasma and gas phase molecules.
实施例1Example 1
铁等离子体与氧气反应的产物分析Product Analysis of Iron Plasma Reacted with Oxygen
本实施例旨在说明该装置用来研究铁等离子体与氧气反应之后,对产物进行分析表征的性能。本实施例中铁等离子的产生是采用纳秒激光溅射的方法产生。纳秒激光的参数如下,激光波长532纳米,重复频率20赫兹,能量30毫瓦,脉冲宽度20纳秒,经过一个焦距为30厘米的透镜聚焦在铁的表面,在纳秒激光与铁作用的区域激光的功率密度大概为2.75×107W/cm2。高纯氧气(99.99%)经过一个内径为0.5毫米的金属毛细管以射流的方式进入等离子体发生区域。提取电极施加的电压为1600伏特。飞秒激光采用脉冲宽度30-40飞秒,能量3.3毫焦耳,波长800纳米附近,经过一个焦距为40厘米的透镜聚焦在距离铁与溅射激光反应区域的8毫米处对反应产物进行电离。如图2所示,最上面图2a的图代表着只有纳秒激光溅射的时候,此时只能观察到Fe+的信号,虽然铁等离子体与氧气已经反应,但是呈现中性,无法进行分析探测。图2b所示的是只有飞秒激光的时候,此时纳秒激光没有进入,在电离分析区域只有氧气存在,因此只有飞秒激光存在的时候只观察到了氧气的离子信号。在图2c中所示的是当纳秒激光诱导产生等离子体并且与氧气发生反应之后,再经过飞秒激光电离分析得到的质谱信号,从质谱图中可以清晰的看到氧化铁离子,经过纳秒激光溅射产生的铁离子,还有等离子体诱导氧气解离而生成的氧原子离子等产物以及相应的二价离子产物。上述结果充分的向我们展示了该发明在实时表征等离子体-小分子反应过程及其产物时所具有的优良性能。This example is intended to illustrate the performance of the device for analyzing and characterizing the product after the iron plasma reacts with oxygen. In this embodiment, iron plasma is generated by nanosecond laser sputtering. The parameters of the nanosecond laser are as follows. The laser wavelength is 532 nanometers, the repetition rate is 20 Hz, the energy is 30 milliwatts, and the pulse width is 20 nanoseconds. It is focused on the surface of iron through a lens with a focal length of 30 cm. The power density of the area laser is about 2.75×10 7 W/cm 2 . High-purity oxygen (99.99%) enters the plasma generation area through a metal capillary with an inner diameter of 0.5 mm in the form of a jet. The voltage applied to the extraction electrodes was 1600 volts. The femtosecond laser uses a pulse width of 30-40 femtoseconds, an energy of 3.3 millijoules, and a wavelength of around 800 nanometers. It is focused by a lens with a focal length of 40 centimeters at a distance of 8 millimeters from the iron and sputtering laser reaction area to ionize the reaction product. As shown in Figure 2, the picture in Figure 2a on the top represents only the nanosecond laser sputtering, at this time only the signal of Fe + can be observed, although the iron plasma has reacted with oxygen, but it is neutral and cannot be carried out. Analyze probes. Figure 2b shows that only the femtosecond laser exists, and the nanosecond laser does not enter at this time, and only oxygen exists in the ionization analysis area, so only the ion signal of oxygen is observed when only the femtosecond laser exists. Shown in Figure 2c is the mass spectrometry signal obtained by femtosecond laser ionization analysis after the nanosecond laser induces plasma and reacts with oxygen. Iron oxide ions can be clearly seen from the mass spectrum. Second laser sputtering produces iron ions, as well as products such as oxygen atomic ions and corresponding divalent ion products generated by plasma-induced oxygen dissociation. The above results fully demonstrate to us the excellent performance of the invention in real-time characterization of the plasma-small molecule reaction process and its products.
本领域技术人员将理解上面的实施例纯粹是以示例的方式给出的,并且一些改变是可能的。Those skilled in the art will understand that the above embodiments are given purely by way of example, and that some changes are possible.
Claims (11)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201410787348.XA CN105762055B (en) | 2014-12-17 | 2014-12-17 | A kind of mass spectrometric apparatus for being used to study plasma-small molecule systems reaction |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201410787348.XA CN105762055B (en) | 2014-12-17 | 2014-12-17 | A kind of mass spectrometric apparatus for being used to study plasma-small molecule systems reaction |
Publications (2)
Publication Number | Publication Date |
---|---|
CN105762055A true CN105762055A (en) | 2016-07-13 |
CN105762055B CN105762055B (en) | 2018-06-26 |
Family
ID=56340125
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201410787348.XA Expired - Fee Related CN105762055B (en) | 2014-12-17 | 2014-12-17 | A kind of mass spectrometric apparatus for being used to study plasma-small molecule systems reaction |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN105762055B (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107910241A (en) * | 2017-11-14 | 2018-04-13 | 大连民族大学 | A kind of mass spectrometer of laser welding plasma plumage brightness particulate subconstiuent |
CN112114026A (en) * | 2020-09-14 | 2020-12-22 | 中国科学院化学研究所 | Method for activating and dissociating nitrogen by using plasma-assisted metal cluster catalysis |
CN115629058A (en) * | 2022-09-16 | 2023-01-20 | 大连理工大学 | Standard reaction device for measuring photoreaction quantum yield and measuring method thereof |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4468468A (en) * | 1981-06-27 | 1984-08-28 | Bayer Aktiengesellschaft | Process for the selective analysis of individual trace-like components in gases and liquid |
US20050021243A1 (en) * | 2001-01-30 | 2005-01-27 | Marcos Dantus | Laser and environmental monitoring system |
US20060108520A1 (en) * | 2003-04-04 | 2006-05-25 | Park Melvin A | Ion guide for mass spectrometers |
CN101216459A (en) * | 2007-12-28 | 2008-07-09 | 中国科学技术大学 | New Infrared Laser Desorption/Vacuum Ultraviolet Single Photon Ionization Mass Spectrometry Device |
CN103219220A (en) * | 2013-03-26 | 2013-07-24 | 复旦大学 | Mass spectrum device and method used for generating plasma and ion reaction |
-
2014
- 2014-12-17 CN CN201410787348.XA patent/CN105762055B/en not_active Expired - Fee Related
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4468468A (en) * | 1981-06-27 | 1984-08-28 | Bayer Aktiengesellschaft | Process for the selective analysis of individual trace-like components in gases and liquid |
US20050021243A1 (en) * | 2001-01-30 | 2005-01-27 | Marcos Dantus | Laser and environmental monitoring system |
US20060108520A1 (en) * | 2003-04-04 | 2006-05-25 | Park Melvin A | Ion guide for mass spectrometers |
CN101216459A (en) * | 2007-12-28 | 2008-07-09 | 中国科学技术大学 | New Infrared Laser Desorption/Vacuum Ultraviolet Single Photon Ionization Mass Spectrometry Device |
CN103219220A (en) * | 2013-03-26 | 2013-07-24 | 复旦大学 | Mass spectrum device and method used for generating plasma and ion reaction |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107910241A (en) * | 2017-11-14 | 2018-04-13 | 大连民族大学 | A kind of mass spectrometer of laser welding plasma plumage brightness particulate subconstiuent |
CN108010829A (en) * | 2017-11-14 | 2018-05-08 | 大连民族大学 | The mass spectrometer of plumage brightness particulate in a kind of laser welding |
CN108010829B (en) * | 2017-11-14 | 2019-12-03 | 大连民族大学 | The mass spectrometer of plumage brightness particulate in a kind of laser welding |
CN107910241B (en) * | 2017-11-14 | 2019-12-13 | 大连民族大学 | Mass spectrum analysis device for plasma plume microparticle components in laser welding |
CN112114026A (en) * | 2020-09-14 | 2020-12-22 | 中国科学院化学研究所 | Method for activating and dissociating nitrogen by using plasma-assisted metal cluster catalysis |
CN115629058A (en) * | 2022-09-16 | 2023-01-20 | 大连理工大学 | Standard reaction device for measuring photoreaction quantum yield and measuring method thereof |
Also Published As
Publication number | Publication date |
---|---|
CN105762055B (en) | 2018-06-26 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP6909264B2 (en) | Synchronization of ion generation with the period of the discontinuous atmospheric interface | |
US8642948B2 (en) | Ion trap for cooling ions | |
US6888134B2 (en) | Mass spectrometer and mass spectrometric method | |
JP2014521189A (en) | Ion guide connected to MALDI ion source | |
CN106896089A (en) | A kind of photoelectronic imaging device based on electric spray ion source | |
WO2005088294A1 (en) | Laser ionization mass spectroscope | |
DE112012005173T5 (en) | Mass spectrometer vacuum interface method and apparatus | |
CN104392887A (en) | Femtosecond laser post-ionization mass spectrum apparatus | |
WO2009013481A2 (en) | Method and apparatus for the analysis of samples | |
US20150187558A1 (en) | Pulse-burst assisted electrospray ionization mass spectrometer | |
CN105762055B (en) | A kind of mass spectrometric apparatus for being used to study plasma-small molecule systems reaction | |
US20130285552A1 (en) | Ion generation in mass spectrometers by cluster bombardment | |
US8362421B2 (en) | Use ion guides with electrodes of small dimensions to concentrate small charged species in a gas at relatively high pressure | |
WO2015085651A1 (en) | Quadrupole rod mass analysis device for bidirectional introduction and transmission of ions | |
CN104597477A (en) | Photoelectronic imaging device for researching anion system | |
GB2603224A (en) | Desorption ion source with dopant-gas assisted ionization | |
CN110931342B (en) | Photoelectron and Ion Imaging Spectroscopy Device Based on Liquid Beam Sampling | |
CN110931343B (en) | Femtosecond laser ionization time-of-flight mass spectrometry device based on liquid beam injection | |
CN107946167A (en) | A kind of metal complex mass spectrometer | |
de Ruette et al. | DESIREE electrospray ion source test bench and setup for collision induced dissociation experiments | |
US20110042567A1 (en) | Ionization Method and Ionization Apparatus | |
US20140332679A1 (en) | Apparatus and Method Relating to an Improved Mass Spectrometer | |
US20240079226A1 (en) | Compact laser ion source apparatus and method | |
CN119208123A (en) | Femtosecond laser-assisted chemical ionization method |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
GR01 | Patent grant | ||
GR01 | Patent grant | ||
CF01 | Termination of patent right due to non-payment of annual fee | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20180626 Termination date: 20201217 |