CN105759890A - Device and method for temperature compensation of APD (avalanche photon diode) bias voltage - Google Patents
Device and method for temperature compensation of APD (avalanche photon diode) bias voltage Download PDFInfo
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F1/00—Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
- G05F1/10—Regulating voltage or current
- G05F1/46—Regulating voltage or current wherein the variable actually regulated by the final control device is dc
- G05F1/56—Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices
- G05F1/565—Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices sensing a condition of the system or its load in addition to means responsive to deviations in the output of the system, e.g. current, voltage, power factor
- G05F1/567—Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices sensing a condition of the system or its load in addition to means responsive to deviations in the output of the system, e.g. current, voltage, power factor for temperature compensation
Abstract
The invention discloses a device and a method for temperature compensation of APD (avalanche photon diode) bias voltage and relates to the field of a photoreceiver in optical fiber communication. The device comprises a voltage adjusting unit, a boosting unit and a feedback unit, wherein the feedback unit comprises a feedback resistor R1 with a fixed resistance value and a temperature compensation subunit connected with a feedback voltage end of the feedback resistor R1; two or more negative temperature coefficient thermistors and resistors with fixed resistance values are adopted to constitute circuits for the temperature compensation subunit, so that linear temperature compensation is performed on feedback voltage of the feedback resistor R1. According to the technical scheme, the workload and difficulty of development effort of optical receiving end equipment are reduced, the degree of linearity of the temperature compensation of APD bias voltage is improved, and requirements of products of different APD manufacturers can be met.
Description
Technical field
The present invention relates to photoreceiver field in fiber optic communication, more particularly relate to, the compensation schemes of a kind of avalanche photodide (APD) bias voltage.
Background technology
Long-distance optical fiber communication generally uses avalanche photodide (APD) as the nucleus equipment of receiving terminal, converts optical signals into the signal of telecommunication.Relative to general photodiode, APD has higher gain and the high sensitivity thus brought.
In order to obtain higher gain level, it is necessary to provide higher bias voltage (30～60V) to APD.This bias voltage is temperature sensitive, and it and temperature make linear change in the same direction, and proportionality coefficient therebetween is called the warm variable coefficient of APD bias voltage.Therefore optical receiver circuit is supplied to the bias voltage of APD and must have temperature compensation capability: can according to the situation of variations in temperature, suitably regulate the size of bias voltage, making bias voltage over temperature make linear change, the proportionality coefficient of change is equal to the warm variable coefficient of selected APD bias voltage.
The temperature compensation of APD bias voltage is had two kinds by current fiber optic communication receiving terminal, and one is traditional method using critesistor, and two is the method using look-up table.
The rule that traditional method using critesistor make use of the resistance of negative tempperature coefficient thermistor to vary with temperature roughly, resistance connection in series-parallel by single negative tempperature coefficient thermistor Yu fixed resistance value, form resistor network, as the feedback resistance of voltage generation circuit.When the temperature is changed, resistor network change in resistance, thus changing output voltage, reach to compensate the purpose of APD bias voltage over temperature change.This method is simple, have only to simple calculating just can design, but shortcoming is, no matter how the form of resistor network changes, the function varied with temperature due to the resistance of single negative tempperature coefficient thermistor is exponential form, therefore there is bigger nonlinearity all the time in the variation relation between equivalent resistance and the temperature of resistor network, and the method being traditional use thermistor compensation APD bias voltage shown in Fig. 1, the output voltage of generation varies with temperature the curve chart of situation.It can be seen that near 263K (-10 DEG C) and 328K (55 DEG C), output bucking voltage is maximum with the difference of desired voltage, both reach 1.33V at absolute value sum, and in commercial temperature (0～70 DEG C) scope, nonlinearity is 1.43%.So causing that APD offset voltage temperature compensation effect is poor, the receiving sensitivity of equipment has larger fluctuation.
LUT Method is the related table between pre-recorded APD bias voltage and temperature, when the temperature is changed, temperature sensing device converts Current Temperatures to digital coding, table look-up accordingly and find the magnitude of voltage of correspondence, recycling to adjust digital resistor, change the means adjustment output voltages such as booster circuit dutycycle.Thus reaching when the temperature is changed, adjust the purpose of APD bias voltage.The shortcoming of this method has four.First, make the intricate operation of temperature-voltage relationship form.Under normal circumstances, it is necessary under multiple temperature spots, measure the optimum reception sensitivity data of up to a hundred equipment, very consuming time.Error Detector can not be passed through when sensitivity directly to measure, but when indirectly being measured by indexs such as packet loss, also can introduce sizable measurement error.Second, specify according to SFF-8472 agreement, the DDMI temperature error of receiving device must not exceed ± 3 DEG C.If it means that the proportionality coefficient of the linear relationship between APD bias voltage and temperature is 0.1V/ DEG C, then the error of maximum 0.6V conforms with SFF-8472 agreement regulation, but it is clear that so big error can cause relatively larger change of sensitivity scope.3rd, the Adjustment precision of output voltage is subject to digitally coded resolution and controls, and error is bigger.Finally, the price of digital resistor is higher, causes that the cost of optical receiving end equipment remains high.
Summary of the invention
The technical problem to be solved is to provide a kind of APD offset voltage temperature compensation device and method, to solve the problem that optical receiving end device temperature compensates complexity.
In order to solve above-mentioned technical problem, the invention discloses a kind of avalanche photodide APD offset voltage temperature compensation device, including voltage-adjusting unit, boosting unit and feedback unit, described voltage-adjusting unit, according to the digital coding output current signal pre-set, change the dividing ratios of feedback unit, adjust the voltage V of boosting unit outputout, wherein:
Described feedback unit is divided into the feedback resistance R1 of fixed resistance value, and the temperature-compensating subelement being connected with the feedback voltage end of described feedback resistance Rl, described temperature-compensating subelement adopts the resistance built-up circuit of plural negative tempperature coefficient thermistor and fixed resistance value, and the feedback voltage for described feedback resistance R1 carries out linear temperature compensation.
Alternatively, in said apparatus, described temperature-compensating subelement adopts the resistance built-up circuit of plural negative tempperature coefficient thermistor and fixed resistance value, carries out temperature-compensating for the feedback voltage of described feedback resistance R1 and refers to:
Described temperature compensation unit includes the resistance R3 composition parallel circuit of negative tempperature coefficient thermistor RT1 and fixed resistance value, the resistance R4 of negative tempperature coefficient thermistor RT2 and fixed resistance value forms series circuit, after described parallel circuit and series circuit are again in parallel, connecting with the resistance R2 of fixed resistance value, the other end of described resistance R2 is connected with the feedback voltage end of described feedback resistance R1.
Alternatively, in said apparatus, described temperature-compensating subelement adopts the resistance built-up circuit of plural negative tempperature coefficient thermistor and fixed resistance value, carries out temperature-compensating for the feedback voltage of described feedback resistance R1 and refers to:
Described temperature compensation unit includes the resistance R3 composition parallel circuit of negative tempperature coefficient thermistor RT1 and fixed resistance value, after this parallel circuit is connected with the resistance R4 of fixed resistance value, again in parallel with negative tempperature coefficient thermistor RT2, finally connecting with the resistance R2 of fixed resistance value, the other end of described resistance R2 is connected with the feedback voltage end of described feedback resistance R1.
Alternatively, in said apparatus, it is in parallel with the feedback resistance R1 of fixed resistance value that described feedback unit also includes the electric capacity C1 for stable loop parameter, described electric capacity C1.
Alternatively, in said apparatus, described boosting unit adopts booster circuit and the charge pump booster circuit of pulse width modulation (PWM) on and off switch composition.
Alternatively, in said apparatus, described voltage-adjusting unit at least adopts digital-analog signal conversion chip DAC, single-chip microcomputer, laser diode to drive-receive chip to form.
The invention also discloses a kind of avalanche photodide APD offset voltage temperature compensation method, including, in APD offset voltage temperature compensation device, voltage-adjusting unit is according to the digital coding output current signal pre-set, change the dividing ratios of feedback unit in APD offset voltage temperature compensation device, to adjust the output voltage V of boosting unitout, wherein, in described feedback unit, temperature-compensating subelement utilizes the resistance built-up circuit of plural negative tempperature coefficient thermistor and fixed resistance value, and the feedback voltage for the feedback resistance R1 of the fixed resistance value in described feedback unit carries out linear temperature compensation.
Alternatively, in said method, in described feedback unit, temperature-compensating subelement utilizes the resistance built-up circuit of plural negative tempperature coefficient thermistor and fixed resistance value to refer to:
Adopt the resistance R3 composition parallel circuit of negative tempperature coefficient thermistor RT1 and fixed resistance value, the resistance R4 of negative tempperature coefficient thermistor RT2 and fixed resistance value forms series circuit, after described parallel circuit and series circuit are again in parallel, connecting with the resistance R2 of fixed resistance value, the other end of described resistance R2 is connected with the feedback voltage end of described feedback resistance R1.
Alternatively, in said method, in described feedback unit, temperature-compensating subelement utilizes the resistance built-up circuit of plural negative tempperature coefficient thermistor and fixed resistance value to refer to:
Adopt the resistance R3 composition parallel circuit of negative tempperature coefficient thermistor RT1 and fixed resistance value, after this parallel circuit is connected with the resistance R4 of fixed resistance value, again in parallel with negative tempperature coefficient thermistor RT2, finally connecting with the resistance R2 of fixed resistance value, the other end of described resistance R2 is connected with the feedback voltage end of described feedback resistance R1.
Alternatively, said method also includes:
Described APD offset voltage temperature compensation device adopts electric capacity C1 in parallel with fixed resistance value resistance R1, stablizes loop parameter.
The APD offset voltage temperature compensation scheme that technical scheme provides according to the change of temperature, can suitably adjust output voltage.In operating temperature range (-40 DEG C～85 DEG C), make between output voltage (being namely APD bias voltage) and temperature linear.Thus reducing workload and the difficulty of optical receiving end equipment development work, and improve the linearity that APD offset voltage temperature compensates, it is possible to meet the demand of different APD vendor product.
Accompanying drawing explanation
Fig. 1 is that the output voltage that the method for traditional use thermistor compensation APD bias voltage produces varies with temperature the curve chart of situation；
Fig. 2 is the circuit diagram of APD offset voltage temperature compensation method disclosed by the invention；
Fig. 3 is the configuration schematic diagram including compensating circuit according to the APD offset voltage temperature of one embodiment of the present of invention；
Fig. 4 is the configuration schematic diagram including compensating circuit according to the APD offset voltage temperature of an alternative embodiment of the invention；
Fig. 5 is the curve chart that the output voltage produced according to APD offset voltage temperature compensation method disclosed by the invention varies with temperature situation.
Detailed description of the invention
For making the object, technical solutions and advantages of the present invention clearly understand, below in conjunction with accompanying drawing, technical solution of the present invention is described in further detail.It should be noted that when not conflicting, embodiments herein and the feature in embodiment can arbitrarily be mutually combined.
Embodiment 1
The present embodiment provides a kind of APD offset voltage temperature compensation device, at least includes voltage-adjusting unit, boosting unit and feedback unit, and wherein, feedback unit is divided into feedback resistance R1 and the temperature-compensating subelement of fixed resistance value.
Voltage-adjusting unit, according to the digital coding output current signal pre-set, changes the dividing ratios of feedback unit, adjusts the voltage V of boosting unit outputout；
Feedback unit, temperature-compensating subelement is connected with the feedback voltage end of the feedback resistance R1 of fixed resistance value, temperature-compensating subelement adopts the resistance built-up circuit of plural negative tempperature coefficient thermistor and fixed resistance value, and the feedback voltage for described feedback resistance R1 carries out temperature-compensating.
Wherein, temperature-compensating subelement can include the resistance R3 composition parallel circuit of negative tempperature coefficient thermistor RT1 and fixed resistance value, the resistance R4 of negative tempperature coefficient thermistor RT2 and fixed resistance value forms series circuit, after above-mentioned parallel circuit and series circuit are again in parallel, connecting with the resistance R2 of fixed resistance value, the other end of resistance R2 is connected with the feedback voltage end of feedback resistance R1.
It addition, above-mentioned feedback unit to could be included for the electric capacity C1 of stable loop parameter, this electric capacity C1 in parallel with the feedback resistance R1 of fixed resistance value.
Also have some preferred versions, as in figure 2 it is shown, boosting unit 100 is a DC/DC booster circuit, it is possible to produce the VD of 15V～70V from 3.3V DC voltage, this output voltage is connected to the bias voltage pin of APD400.Voltage-adjusting unit 200 is a programmable constant-current source, by absorbing or discharging current at Voltage Feedback point, it is possible to the DC voltage component of superposition designated magnitude on above-mentioned output voltage, meets different bias voltage needs individual for APD.Also include feedback unit 300.Feedback unit 300 is composed in series by temperature-compensating subelement 310 and a fixed resistance value resistance R1.Electric capacity C1 and R1 is in parallel, for stablizing loop parameter.Temperature-compensation circuit 310 is made up of with the collocation of other fixed resistance value resistance two negative tempperature coefficient thermistors: negative tempperature coefficient thermistor RT1 and fixed resistance value resistance R3 forms parallel circuit, negative tempperature coefficient thermistor RT2 and fixed resistance value resistance R4 forms series circuit, after above-mentioned parallel circuit and series circuit are again in parallel, connecting with fixed resistance value resistance R2, namely formation temperature compensates circuit 310 again.In operating temperature range (-40 DEG C～85 DEG C), along with variations in temperature, there is linear change therewith in the resistance of described temperature-compensation circuit 310, so that output voltage does linear change with temperature.
Below in conjunction with accompanying drawing, the enforcement of technical scheme is described in further detail: for simplifying and the purpose that illustrates, for avoiding the purport being likely to make the present invention unclear, therefore omit to including known function and the detailed description of circuit.
Fig. 3 gives a preferred version according to APD offset voltage temperature compensation device disclosed in the present application.As it is shown on figure 3, boosting unit 100 can include being positioned at, by general headquarters, " MP3217 " chip that the core origin system company limited of the U.S. (MPS) of 79GreatOaksBlvd, SanJose, CA, USA produces, use PWM on and off switch technology composition booster circuit.This PWM booster circuit utilizes 3.3V input voltage, has the output voltage V producing the highest 36VpAbility.Voltage generation section 100 also includes being positioned at, by general headquarters, " MMBD4148TW " chip that the DIODES company of the U.S. of 4949HedgcoxeRoad, Plano, Texas, USA produces, and forms charge pump booster circuit.This charge pump booster circuit utilizes VpAs input voltage, there is the output voltage V producing the highest 70VoutAbility.The bias voltage input pin of APD400 and VoutIt is connected.
Voltage-adjusting unit 200 is a programmable constant-current source, and " M02098 " laser diode comprising MINDSPEED company of the U.S. production being positioned at 4000MacArthurBlvd., EastTowerNewportBeach, CA92660 by general headquarters drives-receive chip.This chip receives the digital coding pre-set, and converts current signal I to by DAC in sheet1, export from AUXDAC pin, flow through resistance R5 from right to left.Due to this current signal I1Existence, VoutOn with regard to superposition one DC component, its size is equal to I1×R1.When producing optical receiving end equipment in batches, owing to each APD bias voltage at normal temperatures is different from, by adjusting the digital coding of this chip, each APD bias voltage at normal temperatures namely can be adjusted.
Feedback unit 300 is to be composed in series by temperature-compensating subelement 310 and a fixed resistance value resistance R1, and electric capacity C1 and R1 is in parallel, for stablizing loop parameter.Negative tempperature coefficient thermistor RT1 and fixed resistance value resistance R3 forms parallel circuit, negative tempperature coefficient thermistor RT2 and fixed resistance value resistance R4 forms series circuit, after above-mentioned parallel circuit and series circuit are again in parallel, then connecting with fixed resistance value resistance R2, namely formation temperature compensates subelement 310.
Calculation Methods of Circuit Parameters is as follows:
Output voltage VoutEqual to the APD bias voltage V neededapd:
Vout=Vapd①
In the present embodiment, APD bias voltage VapdWarm variable coefficient be 0.08V/ DEG C, therefore VapdAs follows with the relation of temperature T:
Vapd=0.08 × T+b is 2.
Wherein, intercept b is called side-play amount, and the side-play amount of each APD is different from.
According to the feature of PWM on and off switch technology, MP3217, critesistor data book, output voltage VoutFormula as follows:
Wherein, Vfb is the reference voltage of MP3217, and Rn is the resistance of divider resistance under feedback network.
In operating temperature range (-40 DEG C～85 DEG C), take temperature T equal to 233K, 263K, 298K, 328K, 358K, it is possible to obtain 5 equations.Equation group does not have analytic solutions, it is possible to use numerical computations instrument such as MATLAB etc., calculates numerical solution.The present embodiment obtains following result:
R2=6.34K Ω
R3=8.45K Ω
R4=6.65K Ω
RT1 room temperature nominal resistance=15K Ω, B=4000K
RT2 room temperature nominal resistance=1.5K Ω, B=4000K
According to above-mentioned selected circuit parameter, it is possible to obtain in whole operating temperature range, output voltage VoutThe linearity reach 0.4%.When the APD bias voltage needed is higher, the output voltage of the present embodiment linearly spends index also can be better.
Fig. 4 show another preferred version according to APD offset voltage temperature compensation device disclosed in the present application.This scheme is differing principally in that with the scheme shown in Fig. 3, in temperature-compensating subelement, negative tempperature coefficient thermistor RT1 forms parallel circuit with the resistance R3 of fixed resistance value, after this parallel circuit is connected with the resistance R4 of fixed resistance value, again in parallel with negative tempperature coefficient thermistor RT2, finally connecting with the resistance R2 of fixed resistance value, the other end of described resistance R2 is connected with the feedback voltage end of described feedback resistance R1.
From fig. 5, it can be seen that said apparatus is in full temperature scope, output bucking voltage is all close to desired voltage, and the absolute value sum of both maximum differences is 0.38V.In commercial temperature (0～70 DEG C) scope, nonlinearity is 0.25%.
Embodiment 2
The present embodiment provides a kind of APD offset voltage temperature compensation method, specifically includes that
In APD offset voltage temperature compensation device, voltage-adjusting unit is according to the digital coding output current signal pre-set, and changes the dividing ratios of feedback unit in APD offset voltage temperature compensation device, to adjust boosting unit output voltage Vout；
Wherein, in described feedback unit, temperature-compensating subelement utilizes the resistance built-up circuit of plural negative tempperature coefficient thermistor and fixed resistance value, and the feedback voltage for the feedback resistance R1 of the fixed resistance value in described feedback unit carries out linear temperature compensation.
Specifically, APD offset voltage temperature compensation device utilizes the resistance built-up circuit of plural negative tempperature coefficient thermistor and fixed resistance value to refer to:
Adopt the resistance R3 composition parallel circuit of negative tempperature coefficient thermistor RT1 and fixed resistance value, the resistance R4 of negative tempperature coefficient thermistor RT2 and fixed resistance value forms series circuit, after described parallel circuit and series circuit are again in parallel, connecting with the resistance R2 of fixed resistance value, the other end of described resistance R2 is connected with the feedback voltage end of described feedback resistance R1.
Or, adopt the resistance R3 composition parallel circuit of negative tempperature coefficient thermistor RT1 and fixed resistance value, after this parallel circuit is connected with the resistance R4 of fixed resistance value, again in parallel with negative tempperature coefficient thermistor RT2, finally connecting with the resistance R2 of fixed resistance value, the other end of described resistance R2 is connected with the feedback voltage end of described feedback resistance R1.
Preferably, above-mentioned APD offset voltage temperature compensation device can also adopt electric capacity C1 in parallel with fixed resistance value resistance R1, stablizes loop parameter.
APD offset voltage temperature compensation device boost output voltage VoutTime, it is possible to after the booster circuit of employing pulse width modulation (PWM) on and off switch composition and charge pump booster circuit boost, output voltage Vout。
When in APD offset voltage temperature compensation device, voltage-adjusting unit is according to the digital coding output current signal pre-set, can adopting programmable constant-current source, digital-analog signal conversion chip DAC, single-chip microcomputer, laser diode drive-receive chip to realize the conversion of current signal.
Due to the APD offset voltage temperature compensation device implemented in responsible above-described embodiment 1 of said method, therefore the detailed description of the present embodiment referring to the corresponding contents of above-described embodiment 1, can not repeat them here.
It can be seen that technical scheme has, the compensation effect linearity is high, calculate easy, cheap feature from the above, adapts to the product of each APD producer.
One of ordinary skill in the art will appreciate that all or part of step in said method can be carried out instruction related hardware by program and complete, described program can be stored in computer-readable recording medium, such as read only memory, disk or CD etc..Alternatively, all or part of step of above-described embodiment can also use one or more integrated circuit to realize.Correspondingly, each module/unit in above-described embodiment can adopt the form of hardware to realize, it would however also be possible to employ the form of software function module realizes.The application is not restricted to the combination of the hardware and software of any particular form.
The above, be only the preferred embodiments of the present invention, be not intended to limit protection scope of the present invention.All within the spirit and principles in the present invention, any amendment of making, equivalent replacement, improvement etc., should be included within protection scope of the present invention.
Claims (10)
1. an avalanche photodide APD offset voltage temperature compensation device, including voltage-adjusting unit, boosting unit and feedback unit, described voltage-adjusting unit, according to the digital coding output current signal pre-set, change the dividing ratios of feedback unit, adjust the voltage V of boosting unit outputout, it is characterised in that
Described feedback unit is divided into the feedback resistance R1 of fixed resistance value, and the temperature-compensating subelement being connected with the feedback voltage end of described feedback resistance Rl, described temperature-compensating subelement adopts the resistance built-up circuit of plural negative tempperature coefficient thermistor and fixed resistance value, and the feedback voltage for described feedback resistance R1 carries out linear temperature compensation.
2. device as claimed in claim 1, it is characterised in that described temperature-compensating subelement adopts the resistance built-up circuit of plural negative tempperature coefficient thermistor and fixed resistance value, carries out temperature-compensating for the feedback voltage of described feedback resistance R1 and refers to:
Described temperature compensation unit includes the resistance R3 composition parallel circuit of negative tempperature coefficient thermistor RT1 and fixed resistance value, the resistance R4 of negative tempperature coefficient thermistor RT2 and fixed resistance value forms series circuit, after described parallel circuit and series circuit are again in parallel, connecting with the resistance R2 of fixed resistance value, the other end of described resistance R2 is connected with the feedback voltage end of described feedback resistance R1.
3. device as claimed in claim 1, it is characterised in that described temperature-compensating subelement adopts the resistance built-up circuit of plural negative tempperature coefficient thermistor and fixed resistance value, carries out temperature-compensating for the feedback voltage of described feedback resistance R1 and refers to:
Described temperature compensation unit includes the resistance R3 composition parallel circuit of negative tempperature coefficient thermistor RT1 and fixed resistance value, after this parallel circuit is connected with the resistance R4 of fixed resistance value, again in parallel with negative tempperature coefficient thermistor RT2, finally connecting with the resistance R2 of fixed resistance value, the other end of described resistance R2 is connected with the feedback voltage end of described feedback resistance R1.
4. the device as described in any one of claims 1 to 3, it is characterised in that it is in parallel with the feedback resistance R1 of fixed resistance value that described feedback unit also includes the electric capacity C1 for stable loop parameter, described electric capacity C1.
5. device as claimed in claim 4, it is characterised in that
Described boosting unit adopts booster circuit and the charge pump booster circuit of pulse width modulation (PWM) on and off switch composition.
6. device as claimed in claim 4, it is characterised in that
Described voltage-adjusting unit at least adopts digital-analog signal conversion chip DAC, single-chip microcomputer, laser diode to drive-receive chip to form.
7. an avalanche photodide APD offset voltage temperature compensation method, including, in APD offset voltage temperature compensation device, voltage-adjusting unit is according to the digital coding output current signal pre-set, change the dividing ratios of feedback unit in APD offset voltage temperature compensation device, to adjust the output voltage V of boosting unitout, it is characterised in that
In described feedback unit, temperature-compensating subelement utilizes the resistance built-up circuit of plural negative tempperature coefficient thermistor and fixed resistance value, and the feedback voltage for the feedback resistance R1 of the fixed resistance value in described feedback unit carries out linear temperature compensation.
8. method as claimed in claim 7, it is characterised in that in described feedback unit, temperature-compensating subelement utilizes the resistance built-up circuit of plural negative tempperature coefficient thermistor and fixed resistance value to refer to:
Adopt the resistance R3 composition parallel circuit of negative tempperature coefficient thermistor RT1 and fixed resistance value, the resistance R4 of negative tempperature coefficient thermistor RT2 and fixed resistance value forms series circuit, after described parallel circuit and series circuit are again in parallel, connecting with the resistance R2 of fixed resistance value, the other end of described resistance R2 is connected with the feedback voltage end of described feedback resistance R1.
9. method as claimed in claim 7, it is characterised in that in described feedback unit, temperature-compensating subelement utilizes the resistance built-up circuit of plural negative tempperature coefficient thermistor and fixed resistance value to refer to:
Adopt the resistance R3 composition parallel circuit of negative tempperature coefficient thermistor RT1 and fixed resistance value, after this parallel circuit is connected with the resistance R4 of fixed resistance value, again in parallel with negative tempperature coefficient thermistor RT2, finally connecting with the resistance R2 of fixed resistance value, the other end of described resistance R2 is connected with the feedback voltage end of described feedback resistance R1.
10. the method as described in any one of claim 7 to 9, it is characterised in that the method also includes:
Described APD offset voltage temperature compensation device adopts electric capacity C1 in parallel with fixed resistance value resistance R1, stablizes loop parameter.
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| CN201410785442.1A CN105759890A (en) | 2014-12-16 | 2014-12-16 | Device and method for temperature compensation of APD (avalanche photon diode) bias voltage |
| PCT/CN2015/076557 WO2016095378A1 (en) | 2014-12-16 | 2015-04-14 | Temperature compensation apparatus and method for bias voltage of avalanche photodiode |
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| CN201410785442.1A CN105759890A (en) | 2014-12-16 | 2014-12-16 | Device and method for temperature compensation of APD (avalanche photon diode) bias voltage |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106767938A (en) * | 2016-12-08 | 2017-05-31 | 西安电子科技大学 | A kind of APD offset voltage temperatures compensation circuit |
| CN106767938B (en) * | 2016-12-08 | 2019-07-09 | 西安电子科技大学 | A kind of APD offset voltage temperature compensation circuit |
| CN106525232A (en) * | 2016-12-09 | 2017-03-22 | 中国科学院自动化研究所 | Multichannel light detection apparatus |
| CN107222266A (en) * | 2017-06-12 | 2017-09-29 | 青岛海信宽带多媒体技术有限公司 | A kind of optical module |
| CN107504983A (en) * | 2017-09-06 | 2017-12-22 | 湖南航天机电设备与特种材料研究所 | Miniature fiber gyro Y waveguide drive circuit and half-wave voltage drift compensation method |
| CN108075761B (en) * | 2017-12-26 | 2021-01-26 | 积成电子股份有限公司 | Temperature self-compensation switching value signal processing method |
| CN108075761A (en) * | 2017-12-26 | 2018-05-25 | 积成电子股份有限公司 | A kind of on-off model processing method of temperature self-compensation |
| CN108933517A (en) * | 2018-09-06 | 2018-12-04 | 广州金升阳科技有限公司 | The output voltage feed circuit and temperature-compensation circuit of switch converters |
| CN109814085A (en) * | 2018-12-18 | 2019-05-28 | 歌尔股份有限公司 | A kind of laser radar temperature-compensation method, device, system and equipment |
| CN110196430A (en) * | 2019-05-15 | 2019-09-03 | 深圳市速腾聚创科技有限公司 | A kind of temperature-compensation circuit and method applied to single photon sensor array |
| CN112311209A (en) * | 2019-07-29 | 2021-02-02 | 希望森兰科技股份有限公司 | Voltage-stabilized power supply device for outputting adjustable voltage |
| CN112165075A (en) * | 2020-09-22 | 2021-01-01 | 郑州嘉晨电器有限公司 | Overcurrent protection circuit |
| CN112165075B (en) * | 2020-09-22 | 2021-08-24 | 郑州嘉晨电器有限公司 | Overcurrent protection circuit |
| CN114510108A (en) * | 2021-12-27 | 2022-05-17 | 中国原子能科学研究院 | Miniature temperature compensation circuit for silicon photomultiplier |
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| WO2016095378A1 (en) | 2016-06-23 |
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