CN105759191A - 测试方法、通讯基站、新能源发电站、直流电力系统、人工智能机器人、智能家居、智能电动车 - Google Patents
测试方法、通讯基站、新能源发电站、直流电力系统、人工智能机器人、智能家居、智能电动车 Download PDFInfo
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- CN105759191A CN105759191A CN201610100752.4A CN201610100752A CN105759191A CN 105759191 A CN105759191 A CN 105759191A CN 201610100752 A CN201610100752 A CN 201610100752A CN 105759191 A CN105759191 A CN 105759191A
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- 238000012360 testing method Methods 0.000 title claims abstract description 67
- 238000013473 artificial intelligence Methods 0.000 title claims abstract description 7
- 238000004891 communication Methods 0.000 title claims abstract description 6
- 238000005070 sampling Methods 0.000 claims abstract description 20
- 238000000034 method Methods 0.000 claims abstract description 9
- 230000000694 effects Effects 0.000 claims description 14
- 230000000087 stabilizing effect Effects 0.000 claims description 6
- 230000005611 electricity Effects 0.000 claims description 4
- 230000007423 decrease Effects 0.000 claims description 3
- 239000004065 semiconductor Substances 0.000 claims description 2
- 238000005516 engineering process Methods 0.000 description 19
- 239000011324 bead Substances 0.000 description 2
- 239000000446 fuel Substances 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 230000002265 prevention Effects 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
- 238000012956 testing procedure Methods 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2632—Circuits therefor for testing diodes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Relating To Insulation (AREA)
Abstract
Description
Claims (10)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN201610100752.4A CN105759191B (zh) | 2016-02-24 | 2016-02-24 | 测试方法、通讯基站、新能源发电站、直流电力系统、人工智能机器人、智能家居、智能电动车 |
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CN201610100752.4A CN105759191B (zh) | 2016-02-24 | 2016-02-24 | 测试方法、通讯基站、新能源发电站、直流电力系统、人工智能机器人、智能家居、智能电动车 |
Publications (2)
Publication Number | Publication Date |
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CN105759191A true CN105759191A (zh) | 2016-07-13 |
CN105759191B CN105759191B (zh) | 2019-01-04 |
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CN201610100752.4A Expired - Fee Related CN105759191B (zh) | 2016-02-24 | 2016-02-24 | 测试方法、通讯基站、新能源发电站、直流电力系统、人工智能机器人、智能家居、智能电动车 |
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CN (1) | CN105759191B (zh) |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5572878A (en) * | 1978-11-28 | 1980-06-02 | Tdk Corp | Measuring method for variation rate of amplification factor of emitter earth direct current to direct-current collector current of transistor |
CN101378226A (zh) * | 2007-08-27 | 2009-03-04 | 通嘉科技股份有限公司 | 具二极管开路保护机制的电源转换器及其脉宽调制控制器 |
CN101778502A (zh) * | 2009-12-25 | 2010-07-14 | 安徽问天量子科技股份有限公司 | 一种发光二极管开路保护专用集成电路 |
CN101865964A (zh) * | 2009-04-14 | 2010-10-20 | 尼克森微电子股份有限公司 | 系统开路测试的方法 |
CN103364675A (zh) * | 2012-03-30 | 2013-10-23 | 海洋王(东莞)照明科技有限公司 | 电线断路检测电路及电线断路检测装置 |
CN203444073U (zh) * | 2013-09-23 | 2014-02-19 | 江苏新通达电子科技股份有限公司 | 一种采用单路ad口检测多路led开路和短路的系统 |
CN104507243A (zh) * | 2014-12-04 | 2015-04-08 | 中国船舶重工集团公司第七一七研究所 | 一种发光二极管和激光二极管开路故障检测电路 |
-
2016
- 2016-02-24 CN CN201610100752.4A patent/CN105759191B/zh not_active Expired - Fee Related
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5572878A (en) * | 1978-11-28 | 1980-06-02 | Tdk Corp | Measuring method for variation rate of amplification factor of emitter earth direct current to direct-current collector current of transistor |
CN101378226A (zh) * | 2007-08-27 | 2009-03-04 | 通嘉科技股份有限公司 | 具二极管开路保护机制的电源转换器及其脉宽调制控制器 |
CN101865964A (zh) * | 2009-04-14 | 2010-10-20 | 尼克森微电子股份有限公司 | 系统开路测试的方法 |
CN101778502A (zh) * | 2009-12-25 | 2010-07-14 | 安徽问天量子科技股份有限公司 | 一种发光二极管开路保护专用集成电路 |
CN103364675A (zh) * | 2012-03-30 | 2013-10-23 | 海洋王(东莞)照明科技有限公司 | 电线断路检测电路及电线断路检测装置 |
CN203444073U (zh) * | 2013-09-23 | 2014-02-19 | 江苏新通达电子科技股份有限公司 | 一种采用单路ad口检测多路led开路和短路的系统 |
CN104507243A (zh) * | 2014-12-04 | 2015-04-08 | 中国船舶重工集团公司第七一七研究所 | 一种发光二极管和激光二极管开路故障检测电路 |
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CN105759191B (zh) | 2019-01-04 |
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Effective date of registration: 20181114 Address after: 325615 No. 204, Xiao Heng Pu Cun, Da Jing Town, Yueqing City, Wenzhou, Zhejiang Applicant after: Chen Shihao Address before: 410200 4/F 4100, B1 District, Wantian International Logistics Park, Dingziwan Street, Wangcheng District, Changsha City, Hunan Province Applicant before: HUNAN QINGCHUANG TECHNOLOGY CO.,LTD. |
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Effective date of registration: 20190924 Address after: Room 401, No. 1699 Zuchong South Road, Kunshan City, Suzhou City, Jiangsu Province Patentee after: Kunshan Quantum Kunci Quantum Technology Co.,Ltd. Address before: 325615 Zhejiang city of Wenzhou province Yueqing city Jing Zhen Xiao Heng Pu Village No. 204 Patentee before: Chen Shihao |
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Effective date of registration: 20200103 Address after: 215300 room 1602-1605, 1699 South Road, Zu Chong Chong, Kunshan, Suzhou, Jiangsu. Patentee after: YIWO ARTIFICIAL INTELLIGENCE TECHNOLOGY (JIANGSU) CO.,LTD. Address before: Room 401, No. 1699 Zuchong South Road, Kunshan City, Suzhou City, Jiangsu Province Patentee before: Kunshan Quantum Kunci Quantum Technology Co.,Ltd. |
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Granted publication date: 20190104 |