CN105738835A - Power source load test device - Google Patents

Power source load test device Download PDF

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Publication number
CN105738835A
CN105738835A CN201610012435.7A CN201610012435A CN105738835A CN 105738835 A CN105738835 A CN 105738835A CN 201610012435 A CN201610012435 A CN 201610012435A CN 105738835 A CN105738835 A CN 105738835A
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China
Prior art keywords
electrically connected
electric current
slope
voltage follower
load
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CN201610012435.7A
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Chinese (zh)
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CN105738835B (en
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不公告发明人
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Anhui shangcable Instrument Group Co., Ltd
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Nine City Network Technology (shenzhen) Co Ltd
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Priority to CN201610012435.7A priority Critical patent/CN105738835B/en
Priority claimed from CN201210206665.9A external-priority patent/CN103513191B/en
Publication of CN105738835A publication Critical patent/CN105738835A/en
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/40Testing power supplies

Abstract

A power source load test device is used for testing the dynamic load of a tested power source. The power source load test device comprises a main controller, a function generator, a tensile load circuit and a current detection circuit which are electrically connected in sequence, wherein the function generator is used for outputting a square wave signal, the tensile load circuit is used for dynamically changing the output current of the tested power source according to the square wave signal, the current detection circuit is electrically connected to the main controller and is used for cooperating with the main controller to detect the slope of the output current, and the main controller is used for comparing the detected slope of the output current with a preset slope value and accordingly making the function generator adjust the square wave signal according to the comparison result until the slope of the output current is equal to the preset slope value.

Description

Power source loads test device
Technical field
The present invention relates to a kind of power source loads test device, particularly relate to a kind of power source loads for computer VRM and test device.
Background technology
In actual use, its load being with is usually dynamic load to the VRM Voltage Regulator Module (VoltageRegulatorModule, VRM) of computer, namely, the load of VRM changes at any time, and correspondingly, the output electric current of VRM also changes in dynamic with the change of load.Such as, computer is when entering some games, and the load that VRM is with can significantly increase, and correspondingly the output electric current of VRM also significantly increases.
When VRM is carried out dynamic test, the outfan being typically in VRM connects an electronic load, and described electronic load changes the output electric current of VRM and realizes the dynamic load of VRM is tested by simulating actually used situation.When VRM carries out dynamic test, it is under the effect of electronic load, the waveform of output electric current generally can be reduced to the square-wave waveform shown in Fig. 1, the output electric current of VRM is t1 from the rise time that 0 rises to I1, wherein, the slope of output electric current, namely the load slope that draws of electronic load is: the ratio of I1 and rise time t1.Difference according to load, VRM draws load slope also different, and sometimes, VRM needs bigger drawing to carry slope to drive load.
The load slope that draws of current electronic load is typically in 1A/ μ about s, and is fixing, it is impossible to meet some VRM demand to drawing more greatly load slope.
Summary of the invention
For the problems referred to above, it is necessary to provide a kind of power source loads test device providing and drawing more greatly load slope.
A kind of power source loads test device, for a tested power supply is carried out dynamic load test, including the master controller being electrically connected successively, functional generator, draws load circuit and current detection circuit, and described functional generator is used for exporting a square-wave signal;nullDescribed drawing carries circuit for dynamically changing the output electric current of described tested power supply according to described square-wave signal,Including voltage follower、First mos field effect transistor、Load resistance and the first current-limiting resistance,The in-phase input end of described voltage follower is electrically connected to the outfan of described functional generator,For receiving described square-wave signal,The outfan of described voltage follower is electrically connected to the grid of described first mos field effect transistor,The drain electrode of described first mos field effect transistor is electrically connected to the outfan of described tested power supply,The source electrode of described first mos field effect transistor passes through described load resistance ground connection,And the node between source electrode and the described load resistance of described first mos field effect transistor is electrically connected to the inverting input of described voltage follower;Described first current-limiting resistance is electrically connected between the node between the inverting input of described voltage follower and source electrode and the described load resistance of described first mos field effect transistor, and the test of described output electric current is impacted by the electric current on the inverting input preventing described voltage follower;Described current detection circuit is also electrically connected to described master controller, described current detection circuit detects the slope of described output electric current for coordinating described master controller, described master controller compares for the slope of the described output electric current detected and one are preset slope value, and the described functional generator described square-wave signal of adjustment is controlled accordingly according to comparative result, until the slope of described output electric current is equal with described default slope value.
In the present invention, the waveform of square-wave signal is adjusted by power source loads test device by main controller controls functional generator, thus can pass through to draw what load circuit regulated this power source loads test device accordingly to draw load slope, bigger draw load slope thus can obtain as required.Additionally, the different default slope value according to keyboard circuit input, described power source loads test device also can obtain different drawing load slope accordingly, therefore, has good versatility.
Accompanying drawing explanation
Fig. 1 is the existing VRM output current wave figure when carrying out dynamic test.
Fig. 2 is the functional block diagram of the power source loads test device of better embodiment of the present invention.
Fig. 3 is the circuit diagram of the test device of power source loads shown in Fig. 2.
Main element symbol description
Power source loads test device 100
VRM200
Master controller 10
Functional generator 20
Draw load circuit 30
Current detection circuit 40
Enable circuit 50
Keyboard circuit 60
Display 70
Output electric current Io
Current detecting pin P1
Control pin P2
Voltage follower U1
Operational amplifier U2
Oneth MOSFETQ1
NPN type triode Q2
PNP type triode Q3
2nd MOSFETQ4
Load resistance R0
Filter resistance R1
Current-limiting resistance R2-R8, R10
Feedback resistance R9
Filter capacitor C1
In-phase input end 1,5
Inverting input 2,6
Outfan 3,7
Control end 4,8
Grid g1, g2
Source electrode s1, s2
Drain electrode d1, d2
Base stage b1, b2
Colelctor electrode c1, c2
Emitter e 1, e2
Following detailed description of the invention will further illustrate the present invention in conjunction with above-mentioned accompanying drawing.
Detailed description of the invention
Referring to Fig. 2, the power source loads test device 100 of better embodiment of the present invention is for carrying out dynamic load test to a tested power supply.In the present embodiment, for described tested power supply, for a VRM200, the present invention will be described.
Power source loads test device 100 includes master controller 10, functional generator 20, draws load circuit 30, current detection circuit 40, enables circuit 50, keyboard circuit 60 and display 70.Functional generator 20 is used for producing a square-wave signal;Draw load circuit 30 for dynamically changing the output electric current of VRM200 according to described square-wave signal;Current detection circuit 40 is for coordinating master controller 10 to detect the output electric current Io of VRM200, i.e. load current, thus obtaining the slope of output electric current Io;Described master controller 10 compares for the slope of output electric current Io and one are preset slope value, and adjusts the waveform of described square-wave signal according to comparative result corresponding control function generator 20, until the slope of output electric current Io is equal with described default slope value.
Seeing also Fig. 3, master controller 10 includes the current detecting pin P1 being electrically connected to the current detection circuit 40 and control pin P2 being electrically connected enable circuit 50.
Load circuit 30 is drawn to include voltage follower U1, the first mos field effect transistor (Metal-Oxide-SemiconductorField-EffectTransistor, MOSFET) Q1, load resistance R0, filter resistance R1, current-limiting resistance R2-R5 and filter capacitor C1.Voltage follower U1 includes in-phase input end 1, inverting input 2, outfan 3 and controls end 4.The in-phase input end 1 of voltage follower U1 is electrically connected to functional generator 20 by current-limiting resistance R2, is used for receiving described square-wave signal;Inverting input 2 passes sequentially through filter resistance R1 and filter capacitor C1 and is electrically connected to outfan 3;Outfan 3 is electrically connected to the grid g1 of a MOSFETQ1 by current-limiting resistance R3;Control end 4 and be electrically connected to enable circuit 50.The source electrode s1 of the oneth MOSFETQ1 passes through load resistance R0 ground connection, and source electrode s1 is also electrically connected to the inverting input 2 of voltage follower U1;The drain electrode d1 of the oneth MOSFETQ1 is electrically connected to the outfan of VRM200.In the present embodiment, source electrode s1 is electrically connected the inverting input 2 of voltage follower U1 by current-limiting resistance R5.The test of the output electric current Io of VRM is impacted by current-limiting resistance R5 for preventing the electric current on the inverting input 2 of voltage follower U1.
Voltage on the outfan 3 of voltage follower U1 and the arc in phase on its in-phase input end 1, and the amplification of voltage follower U1 is approximately 1, therefore, the signal of outfan 3 output of voltage follower U1 is described square-wave signal, described square-wave signal drives a MOSFETQ1 to sequentially turn on and cut-off, thus VRM200 produces a dynamic electric current on load resistance R0, i.e. the output electric current Io of VRM200.
Resolution according to operational amplifier, the electric current of the inverting input 2 of voltage follower U1 is approximately zero, therefore, the pressure drop on current-limiting resistance R5 is only small, and the current potential on the source electrode s1 of a MOSFETQ1 is approximately equal to the current potential of the inverting input 2 of voltage follower U1.The short characteristic of void according to operational amplifier, the current potential of the in-phase input end 1 of voltage follower U1 is equal with the current potential of inverting input 2, and therefore, the amplitude of the current potential on the source electrode s1 of a MOSFETQ1 is equal to the amplitude of described square-wave signal.And the electric current on load resistance R0, namely the value business equal to the current potential on source electrode s1 with the resistance of load resistance R0 of electric current Io is exported, so, by changing the amplitude of described square-wave signal, the size of output electric current Io can be changed, thus, when the identical rise time, electric current Io is more big in output, then its slope is more big.In addition, when changing due to the amplitude of described square-wave signal, the amplitude of output electric current Io also changes therewith, therefore, output electric current Io has rise time identical with described square-wave signal, fall time, frequency and dutycycle, by changing rise time and the fall time of described square-wave signal, also rise time and the fall time of output electric current Io can be changed accordingly, when exporting electric current Io amplitude and being constant, rise time and fall time are more big, then its slope is more little.
In the present embodiment, load circuit 30 is drawn also to include NPN type triode Q2 and PNP type triode Q3.NPN type triode Q2 and PNP type triode Q3 is for strengthening the described square-wave signal driving force to a MOSFETQ1, it is to avoid described square-wave signal distortion cannot driven the oneth MOSFETQ1.Specifically, the outfan 3 of voltage follower U1 is electrically connected to the base stage b1 of NPN type triode Q2 and PNP type triode Q3, b2 by current-limiting resistance R5.The colelctor electrode c1 of NPN type triode Q2 is electrically connected to+5V power supply;Emitter e 1 is electrically connected to the emitter e 2 of PNP type triode Q3, and the node between emitter e 1, e2 is electrically connected to the grid g1 of a MOSFETQ1 by current-limiting resistance R3.The colelctor electrode c2 of PNP type triode Q3 is electrically connected to-5V power supply.Additionally, when a MOSFETQ1 cut-off, PNP type triode Q3 is additionally operable to make the rapid ground connection electric discharge of the charging capacitor (not shown) in a MOSFETQ1, so that a MOSFETQ1 quickly ends, thus improving the response speed of a MOSFETQ1.
Current detection circuit 40 includes operational amplifier U2, current-limiting resistance R6-R8 and feedback resistance R9.Operational amplifier U2 includes in-phase input end 5, inverting input 6, outfan 7 and controls end 8.The in-phase input end 5 of operational amplifier U2 is electrically connected to the node between load resistance R0 and source electrode s1 by current-limiting resistance R6;And the node between in-phase input end 5 and current-limiting resistance R6 is also by current-limiting resistance R8 ground connection.Inverting input 6 is electrically connected to the node between load resistance R0 and ground by current-limiting resistance R7;And the node between inverting input 6 and current-limiting resistance R7 is electrically connected to outfan 7 also by feedback resistance R9.Outfan 7 is electrically connected to master controller 10.Operational amplifier U2 converts the voltage signal output current detecting pin P1 to master controller 10 to after being amplified by the described output electric current Io flow through on load resistance R0, master controller 10 calculates output electric current Io accordingly according to this voltage signal, thus judge the slope of output electric current Io according to the change exporting electric current Io on load resistance R0.
Enabling circuit 50 and be electrically connected to master controller 10, master controller 10 controls to draw the duty of load circuit 30 and current detection circuit 40 by enabling circuit 50.Specifically, enable circuit 50 and include the 2nd MOSFETQ4 and current-limiting resistance R10.The grid g2 of the 2nd MOSFETQ4 is electrically connected to the control pin P2 of master controller 10, source electrode s2 ground connection, and grid d2 is electrically connected to the control end 4,8 of voltage follower U1 and operational amplifier U2.The node controlled between end 4,8 and drain electrode d2 of voltage follower U1 and operational amplifier U2 is electrically connected to a power supply also by current-limiting resistance R10 ,+5V the power supply in present embodiment.Master controller 10 is by controlling conducting and the cut-off of the 2nd MOSFETQ4, and corresponding change controls the level state of end 4 and 8, starts working thus controlling voltage follower U1 and operational amplifier U2 or quits work.In the present embodiment, controlling end 4 and 8, to be high level effective.So, when master controller 10 sends a low level signal (logical zero) to two MOSFETQ4 by controlling pin P2,2nd MOSFETQ4 cut-off, controlling end 4 and 8 to be connected to+5V power supply by current-limiting resistance R10 and be high level, voltage follower U1 and operational amplifier U2 starts working;And when master controller 10 sends a high level signal (logic 1) to two MOSFETQ4 by controlling pin P2,2nd MOSFETQ4 conducting, controlling end 4 and 8 by the 2nd MOSFETQ4 ground connection in low level, voltage follower U1 and operational amplifier U2 quits work.
It is appreciated that described enable circuit 50 also can be only connected to one of them of voltage follower U1 or operational amplifier U2, thus the duty of one of them of voltage follower U1 or operational amplifier U2 is only controlled by master controller 10.
In the present embodiment, described default slope value is inputted by the keyboard circuit 60 being electrically connected to master controller 10.Different default slope value is inputted, it is possible to make to draw load circuit 30 to obtain and different draw load slope by keyboard circuit 60.In addition, the parameters such as the amplitude of described square-wave signal of functional generator 20 output, rise time, fall time, frequency and dutycycle input also by described keyboard circuit 60, master controller 10 receives each parameter of described square-wave signal by keyboard circuit 60, and exports corresponding described square-wave signal according to each state modulator functional generator 20.
Display 70 is electrically connected to described master controller 10, for showing each parameter of described default slope value that keyboard circuit 60 inputs and described square-wave signal under the control of master controller 10.
The work process of power source loads test device 100 described in brief description:
First the drain electrode d1 of the described MOSFETQ1 drawing load circuit 30 is electrically connected to a tested power supply, the VRM200 to be measured in the present embodiment.Then first keyboard circuit 60 inputs the parameters such as described default slope value and the amplitude of described square-wave signal, rise time, fall time, frequency and dutycycle.Master controller 10 controls the above-mentioned information that display 70 shows that keyboard circuit 60 inputs, functional generator 20 according to each state modulator of the square-wave signal of keyboard circuit 60 input exports corresponding described square-wave signal simultaneously, master controller 10 controls to draw load circuit 30 and current detection circuit 40 to start working by enabling circuit 50 subsequently, load circuit 30 is drawn then to drive VRM200 output corresponding output electric current Io according to described square-wave signal, current detection circuit 40 coordinates master controller 10 to detect the change of the described output electric current Io slope to judge described output electric current Io accordingly subsequently.The slope of the output electric current Io detected is compared by master controller 10 again with described default slope value, and finely tune according to the comparative result control function generator 20 amplitude to described square-wave signal and/or rise time and fall time, until the slope of output electric current Io is equal with described default slope value.
Now, power source loads test device 100 can be equivalent to a dynamic electronic load, tests under the effect of device 100 at power source loads so that the output electric current Io of VRM200 is in dynamically change, it is achieved the dynamic test to VRM200.
The waveform of square-wave signal is adjusted by described power source loads test device 100 by master controller 10 control function generator 20, thus can pass through to draw the load slope that draws that load circuit 30 regulates this power source loads test device 100 accordingly to reach described default slope value, can obtain bigger draw load slope thus described default slope value can be arranged as required to.Additionally, the different default slope value according to keyboard circuit 60 input, described power source loads test device 100 also can obtain different drawing load slope accordingly, therefore, has good versatility.

Claims (3)

1. a power source loads test device, for a tested power supply is carried out dynamic load test, it is characterized in that: master controller, functional generator that described power source loads test device includes being electrically connected successively, draw load circuit and current detection circuit, described functional generator is used for exporting a square-wave signal;nullDescribed drawing carries circuit for dynamically changing the output electric current of described tested power supply according to described square-wave signal,Including voltage follower、First mos field effect transistor、Load resistance and the first current-limiting resistance,The in-phase input end of described voltage follower is electrically connected to the outfan of described functional generator,For receiving described square-wave signal,The outfan of described voltage follower is electrically connected to the grid of described first mos field effect transistor,The drain electrode of described first mos field effect transistor is electrically connected to the outfan of described tested power supply,The source electrode of described first mos field effect transistor passes through described load resistance ground connection,And the node between source electrode and the described load resistance of described first mos field effect transistor is electrically connected to the inverting input of described voltage follower;Described first current-limiting resistance is electrically connected between the node between the inverting input of described voltage follower and source electrode and the described load resistance of described first mos field effect transistor, and the test of described output electric current is impacted by the electric current on the inverting input preventing described voltage follower;Described current detection circuit is also electrically connected to described master controller, described current detection circuit detects the slope of described output electric current for coordinating described master controller, described master controller compares for the slope of the described output electric current detected and one are preset slope value, and the described functional generator described square-wave signal of adjustment is controlled accordingly according to comparative result, until the slope of described output electric current is equal with described default slope value.
2. power source loads test device as claimed in claim 1, it is characterised in that: described controller changes the amplitude of described square-wave signal and/or rise time by controlling described functional generator and regulates the slope of described output electric current fall time.
3. power source loads test device as claimed in claim 2, it is characterized in that: described in draw load circuit also to include filter resistance and filter capacitor, the inverting input of described voltage follower passes sequentially through described filter resistance and filter capacitor is electrically connected to the outfan of described voltage follower.
CN201610012435.7A 2012-06-21 2012-06-21 Power source loads test device Active CN105738835B (en)

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Application Number Priority Date Filing Date Title
CN201610012435.7A CN105738835B (en) 2012-06-21 2012-06-21 Power source loads test device

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CN201610012435.7A CN105738835B (en) 2012-06-21 2012-06-21 Power source loads test device
CN201210206665.9A CN103513191B (en) 2012-06-21 2012-06-21 Power source loads proving installation

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CN105738835B CN105738835B (en) 2018-11-16

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Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1410855A (en) * 1995-01-11 2003-04-16 微行星有限公司 Electric power controlling method and apparatus thereof
CN1788412A (en) * 2002-12-16 2006-06-14 皇家飞利浦电子股份有限公司 Self adaptable bias circuit for enabling dynamic control of quiescent current in a linear power amplifier
US20060132518A1 (en) * 2004-05-27 2006-06-22 Silverbrook Research Pty Ltd Printhead module having interleaved shift registers
CN101789921A (en) * 2009-01-23 2010-07-28 中芯国际集成电路制造(上海)有限公司 Amplitude shift keying demodulator and method

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1410855A (en) * 1995-01-11 2003-04-16 微行星有限公司 Electric power controlling method and apparatus thereof
CN1788412A (en) * 2002-12-16 2006-06-14 皇家飞利浦电子股份有限公司 Self adaptable bias circuit for enabling dynamic control of quiescent current in a linear power amplifier
US20060132518A1 (en) * 2004-05-27 2006-06-22 Silverbrook Research Pty Ltd Printhead module having interleaved shift registers
CN101789921A (en) * 2009-01-23 2010-07-28 中芯国际集成电路制造(上海)有限公司 Amplitude shift keying demodulator and method

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Effective date of registration: 20180925

Address after: 312500 Dong Chen 109, East West Village, Chengtan Town, Xinchang, Shaoxing, Zhejiang

Applicant after: Zhejiang Haicheng De Chang Machinery Co., Ltd.

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Effective date of registration: 20191204

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Address before: 312500 Dongchen 109, Dongchen Village, Dongcheng Town, Chengtan Town, Xinchang County, Shaoxing City, Zhejiang Province

Patentee before: Zhejiang Haicheng De Chang Machinery Co., Ltd.