CN105676109A - Main board testing method and device - Google Patents
Main board testing method and device Download PDFInfo
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- CN105676109A CN105676109A CN201610012934.6A CN201610012934A CN105676109A CN 105676109 A CN105676109 A CN 105676109A CN 201610012934 A CN201610012934 A CN 201610012934A CN 105676109 A CN105676109 A CN 105676109A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/04—Programme control other than numerical control, i.e. in sequence controllers or logic controllers
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- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Automation & Control Theory (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The embodiment of the invention provides a main board testing method and a device and relates to a test system, wherein the main board can be automatically detected. In this way, the detection efficiency and the accuracy are improved, so that the quality of the main board can be ensured. The main board testing device comprises an automatic switching assembly and a detection circuit connected with the automatic switching assembly. The automatic switching assembly is used for driving a to-be-tested main board to be in communication with the main board testing device or transmit data with the main board testing device when the main board testing device detects the access of the to-be-tested main board. For each channel of the to-be-tested main board, the automatic switching assembly generates a first signal and transmits the first signal via the to-be-tested main board to obtain a second signal output by the to-be-tested main board. The detection circuit is used for determining whether the main board breaks down or not according to the first signal generated by each channel of the to-be-tested main board and the acquired second signal.
Description
Technical field
The present invention relates to test system, particularly relate to a kind of motherboard test method and equipment.
Background technology
Along with the development of technology, the application of intelligent terminal gets more and more, and the function that intelligent terminal is capable of is also more and more abundanter. Therewith, the mainboard of intelligent terminal comprises new function module and the quantity of binding post also get more and more.
The mainboard of intelligent terminal had to pass through various functional test before producing. At present, the test of the mainboard of intelligent terminal is operated dependence test fixture to detect each test function of this mainboard mainly by operator by each equipment manufacturer, and determines whether the mainboard of intelligent terminal exists fault according to each test function.
Above-mentioned method of testing depends not only upon proficiency level and the technical skills of operator, but also depends on the duty that operator are current, thus causing that testing efficiency is low, and cannot ensure the quality of the mainboard of intelligent terminal. Such as, if operator are in fatigue state, lack of skill etc. and would potentially result in that testing efficiency is low, error in judgement, and then the product quality of whole intelligent terminal is affected.
Summary of the invention
Embodiments of the invention provide a kind of motherboard test method and equipment, it is possible to realize Aulomatizeted Detect mainboard, improve detection efficiency and accuracy rate, and then ensure that mainboard quality.
For reaching above-mentioned purpose, embodiments of the invention adopt the following technical scheme that
The embodiment of the present invention provides a kind of main board test apparatus, including automatic switching component and the testing circuit that is connected with described automatic switching component; Wherein,
Described automatic switching component, for when the test equipment Inspection of described mainboard accesses to mainboard to be measured, described mainboard to be measured and described main board test apparatus is driven to communicate, or carry out data transmission with described main board test apparatus, each passage for described mainboard to be measured, generate the first signal and described first signal is transmitted via described mainboard to be measured, obtaining the secondary signal of described mainboard to be measured output;
Described testing circuit, for the first signal generated at each passage of described mainboard to be measured according to described automatic switching component and the secondary signal got, it is determined that whether described mainboard to be measured exists fault.
The embodiment of the present invention includes in main board test apparatus automatic switching component and testing circuit. Automatic switching component can mainboard test equipment Inspection access to mainboard to be measured time, be automatically performed the detection of each passage to mainboard to be measured, testing circuit is capable of detecting when whether each passage exists fault. The main board test apparatus that such embodiment of the present invention provides can switch the test to mainboard voluntarily, and complete to dock the test of each mainboard becoming owner of board test apparatus voluntarily, achieve Aulomatizeted Detect mainboard, relatively the testing efficiency of operator's manual test mainboard is high, and improve test accuracy rate, and then ensure that mainboard quality.
Concrete, described automatic switching component includes control circuit, the signal generator being connected with described control circuit, the electrical interface being all connected with described control circuit and described signal generator; Wherein,
Described control circuit, for when the test equipment Inspection of described mainboard accesses to mainboard to be measured, generate pumping signal, and send described pumping signal extremely described electrical interface, described pumping signal comprises the mark of described mainboard to be measured, and it is used for sequentially generating control signal, and control signal to described signal generator and described mainboard to be measured described in transmission, described control signal comprises the mark of passage to be measured;
Described signal generator, for receiving described control signal, the mark of passage to be measured according to described control signal, the passage of described signal generator is switched to the passage to be measured of the mark instruction of described passage to be measured, and generate the first signal in described passage to be measured, send described first signal extremely described mainboard to be measured and described testing circuit;
Described electrical interface, for receiving described pumping signal, described mainboard to be measured and described main board test apparatus is driven to communicate according to described pumping signal, or carry out data transmission with described main board test apparatus, so that described mainboard to be measured receives described control signal, and the passage of described mainboard to be measured is switched to described passage to be measured.
Further, described main board test apparatus also includes display;
Described display is screen and/or display lamp, and described display is for showing that the first testing result that described testing circuit is determined, described first testing result are used for indicating whether described mainboard to be measured exists fault.
Concrete, described testing circuit, specifically for according to described automatic switching component in the first signal of each passage of described mainboard to be measured and the secondary signal that gets, determine whether each passage of described mainboard to be measured exists fault, and the testing result according to each passage determines whether described mainboard to be measured exists fault.
Concrete, each passage for described mainboard to be measured, described testing circuit, pre-conditioned specifically for judging whether described secondary signal meets, described pre-conditioned identical with described first signal for secondary signal, or the difference of the property value of the property value of described secondary signal and described first signal is less than predetermined threshold value, and property value is amplitude or the phase place of signal; If described secondary signal meets described pre-conditioned, it is determined that described passage is absent from fault; If described secondary signal is unsatisfactory for described pre-conditioned, it is determined that described passage exists fault.
Further, if described display is described screen, then described display is additionally operable to show the first signal of each passage and secondary signal.
Another embodiment of the present invention provides a kind of motherboard test method, mainboard test equipment Inspection to mainboard to be measured access time, whether n the passage detecting mainboard to be measured exists fault, and records n testing result, wherein, n >=1;Described main board test apparatus is according to described n testing result, it is determined that whether described mainboard to be measured exists fault; Described main board test apparatus shows determines result, described determines that result is for indicating whether described mainboard to be measured exists fault.
In the embodiment of the present invention, main board test apparatus is when detecting that mainboard to be measured accesses, whether n (n >=1) the individual passage first detecting mainboard to be measured exists fault, and record n testing result, then, main board test apparatus is according to n testing result, determining whether mainboard to be measured exists fault, finally, main board test apparatus indicates the determination result whether mainboard to be measured exists fault to show by being used for. Pass through the program, main board test apparatus can switch the test to mainboard voluntarily, and complete to dock the test of each mainboard becoming owner of board test apparatus voluntarily, achieve Aulomatizeted Detect mainboard, relatively the testing efficiency of operator's manual test mainboard is high, and improve test accuracy rate, and then ensure that mainboard quality.
Wherein, for the first passage in described n passage, whether first passage described in the test equipment Inspection of described mainboard exists fault, and records the first testing result, and described first testing result is used for identifying whether described first passage exists fault.
Concrete, whether first passage described in the test equipment Inspection of described mainboard exists fault, specifically includes:
A, described main board test apparatus generate the control signal of the mark comprising described first passage, and control signal to described mainboard to be measured described in sending, so that the passage of described mainboard to be measured is switched first passage according to the mark of described first passage by described mainboard to be measured, wherein, the mark instruction first passage of described first passage;
B, described main board test apparatus send the first signal to described mainboard to be measured, so that described first signal transmits via described first passage, and export secondary signal;
C, described main board test apparatus judge whether the secondary signal that described mainboard to be measured exports meets pre-conditioned, described pre-conditioned identical with described first signal for described secondary signal or the property value of described secondary signal and the difference of the property value of described first signal are less than predetermined threshold value, and property value is amplitude or the phase place of signal;
If the described secondary signal of D meets described pre-conditioned, described main board test apparatus then determines described first passage fault-free;
If the described secondary signal of E is unsatisfactory for described pre-conditioned, then repeat B and C;
If F repeats m E, described main board test apparatus then determines that described first passage breaks down, wherein, and m >=1.
Further, before described main board test apparatus sends the first signal extremely described mainboard to be measured, described motherboard test method also includes:
The passage of self is switched to described first passage by described main board test apparatus, and generates described first signal at described first passage.
Concrete, described main board test apparatus is according to described n testing result, it is determined that whether described mainboard to be measured exists fault, including:
If described first testing result indicates described first passage to there is fault, described main board test apparatus then determines that described mainboard to be measured exists fault.
Accompanying drawing explanation
In order to be illustrated more clearly that the embodiment of the present invention or technical scheme of the prior art, the accompanying drawing used required in embodiment or description of the prior art will be briefly described below, apparently, accompanying drawing in the following describes is only some embodiments of the present invention, for those of ordinary skill in the art, under the premise not paying creative work, it is also possible to obtain other accompanying drawing according to these accompanying drawings.
The structural representation one of the main board test apparatus that Fig. 1 provides for the embodiment of the present invention;
The structural representation two of the main board test apparatus that Fig. 2 provides for the embodiment of the present invention;
The schematic flow sheet of the motherboard test method that Fig. 3 provides for the embodiment of the present invention;
The schematic flow sheet of the test first passage that Fig. 4 provides for the embodiment of the present invention.
Detailed description of the invention
Below in conjunction with the accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is clearly and completely described, it is clear that described embodiment is only a part of embodiment of the present invention, rather than whole embodiments. Based on the embodiment in the present invention, the every other embodiment that those of ordinary skill in the art obtain under not making creative work premise, broadly fall into the scope of protection of the invention.
It addition, the terms "and/or", being only a kind of incidence relation describing affiliated partner, can there are three kinds of relations in expression, for instance, A and/or B, it is possible to represent: individualism A, there is A and B, individualism B these three situation simultaneously. It addition, character "/" herein, typically represent forward-backward correlation to as if the relation of a kind of "or".
When the embodiment of the present invention mentions the ordinal number such as " first ", " second ", unless the meaning of based on context its certain order of representation, it is appreciated that be only the use of differentiation.
Embodiment one
The embodiment of the present invention provides a kind of main board test apparatus, as it is shown in figure 1, this main board test apparatus can include automatic switching component 10, testing circuit 11 and system bus 12.
Wherein, it is connected by system bus 12 and completes mutual communication between automatic switching component 10 with testing circuit 11.
Concrete, automatic switching component 10 is for when mainboard test equipment Inspection accesses to mainboard to be measured, mainboard to be measured and main board test apparatus is driven to communicate, or carry out data transmission with main board test apparatus, each passage for mainboard to be measured, generate the first signal and the first signal is transmitted via mainboard to be measured, obtaining the secondary signal of mainboard to be measured output.
It is understood that when mainboard to be measured accesses main board test apparatus, main board test apparatus drives mainboard to be measured and main board test apparatus communicate or carry out data transmission automatically. Therefore, if multiple mainboard to be measured accesses main board test apparatus, main board test apparatus can drive each mainboard to be measured and main board test apparatus communicate or carry out data transmission according to the electrifying timing sequence of each mainboard to be measured successively.
In practical application, each mainboard to be measured includes at least one passage, and for each passage, main board test apparatus all generates the first signal, and sends the first signal to mainboard to be measured, in order to the first signal transmits via mainboard to be measured, and exports secondary signal.
Passage in the embodiment of the present invention is sound channel, VGA (VideoGraphicsArray, Video Graphics Array) passage, YPbPr passage, HDMI (HighDefinitionMultimediaInterface, HDMI) passage, AV (AudioVideo, audio frequency and video) passage or TV (Television, TV) passage.
It should be noted that the passage in the embodiment of the present invention is not limited to above-mentioned several.
Concrete, as it is shown in figure 1, automatic switching component 10 includes control circuit 101, signal generator 102 and electrical interface 103.
Wherein, signal generator 102 and electrical interface 103 are all connected with control circuit 101, and signal generator 102 and electrical interface 103 are all connected with testing circuit 11.
Control circuit 101, for when mainboard test equipment Inspection accesses to mainboard to be measured, generate pumping signal, and send pumping signal to electrical interface 103, pumping signal comprises the mark of mainboard to be measured, and it is used for sequentially generating control signal, and send a control signal to signal generator 102 and mainboard to be measured, control signal comprises the mark of passage to be measured.
Optionally, the mark of the passage to be measured in the embodiment of the present invention can be the code value of passage to be measured.
Concrete, control circuit 101, for, in the preset time period generating pumping signal, generating the control signal of the code value carrying passage to be measured, this control signal switches respective passage for pointing signal generator 102 and mainboard to be measured according to code value.
Optionally, control circuit 101 in the embodiment of the present invention could be included for the single-chip microcomputer of coding, control circuit 101 is in the preset time period generating pumping signal, generate infrared encoded signal, this infrared encoded signal is carried out NEC coding and generates NEC code value by single-chip microcomputer, or carries out RC5 coding generation RC5 code value.
Signal generator 102, for receiving control signal, the mark according to passage to be measured in control signal, the passage of signal generator 102 is switched to the passage to be measured of the mark instruction of passage to be measured, and in passage to be measured, generate the first signal, send the first signal extremely mainboard to be measured and testing circuit 11.
It is easily understood that, in the embodiment of the present invention, according to detecting the secondary signal of output after the first signal and the first signal transmit via mainboard to be measured, main board test apparatus determines whether mainboard to be measured exists fault, and mainboard to be measured includes at least one passage, accordingly, it would be desirable to the passage of mainboard to be measured and the passage of signal generator are switched to identical passage.
Electrical interface 103, for receiving pumping signal, drive mainboard to be measured and main board test apparatus to communicate according to pumping signal, or carry out data transmission with main board test apparatus, so that mainboard to be measured receives control signal, and the passage of mainboard to be measured is switched to passage to be measured.
Wherein, the electrical interface 102 in the embodiment of the present invention is used for carrying or connect mainboard to be measured, and the electrical interface in the embodiment of the present invention can carry or connect at least one mainboard to be measured.
Concrete, if at least two mainboard to be measured accesses main board test apparatus, then the interface 102 of providing loans in the embodiment of the present invention can comprise relay, and electrical interface 102 chooses mainboard to be measured according to the mark of the mainboard to be measured that control signal comprises by relay.
Described testing circuit, for the first signal generated at each passage of described mainboard to be measured according to described automatic switching component 10 and the secondary signal got, it is determined that whether described mainboard to be measured exists fault.
Further, as in figure 2 it is shown, main board test apparatus also includes the display 12 being connected with testing circuit 11.
Concrete, described display 12 is screen and/or display lamp, and described display 12 is for showing that the first testing result that described testing circuit 11 is determined, described first testing result are used for indicating whether described mainboard to be measured exists fault.
Described testing circuit 11, specifically for according to described automatic switching component 10 in the first signal of each passage of described mainboard to be measured and the secondary signal that gets, determine whether each passage of described mainboard to be measured exists fault, and the testing result according to each passage determines whether described mainboard to be measured exists fault.
Concrete, each passage for described mainboard to be measured, described testing circuit 11, pre-conditioned specifically for judging whether described secondary signal meets, described pre-conditioned identical with described first signal for secondary signal, or the difference of the property value of the property value of described secondary signal and described first signal is less than predetermined threshold value, and property value is amplitude or the phase place of signal;If described secondary signal meets described pre-conditioned, it is determined that described passage is absent from fault; If described secondary signal is unsatisfactory for described pre-conditioned, it is determined that described passage exists fault.
Wherein, the first signal in the embodiment of the present invention can be audio signal, it is also possible to for picture signal, this is not especially limited by the embodiment of the present invention. Accordingly, if the first signal is audio signal, secondary signal is also audio signal. If the first signal is picture signal, secondary signal is also picture signal.
Optionally, for audio signal, testing circuit can detect the property value of signal. For picture signal, testing circuit can detect the color of signal.
Concrete, testing circuit 11 detects whether each passage of mainboard to be measured exists fault successively, then determines whether this mainboard to be measured exists fault according to each testing result.
If described display is described screen, then screen is displayed for the first signal and the secondary signal of each passage, and namely more directly testing result shows, and determines where the fault of this mainboard to be measured occurs in for manager.
If display is display lamp, then determines whether mainboard to be measured is deposited after the failure at testing circuit 11, testing result is shown.
Optionally, indicator light colors is red, represents mainboard to be measured and there is fault. Indicator light colors is green, represents mainboard to be measured and is absent from fault.
It is understandable that, the main board test apparatus that the embodiment of the present invention provides can also include memorizer (attached not shown), this memorizer can mainly include storage program area and storage data field, wherein, the application program (such as sending message function) etc. needed for program area can store operating system, at least one function is stored; Storage data field can store the testing result etc. of each passage.
The embodiment of the present invention includes in main board test apparatus automatic switching component and testing circuit. Automatic switching component can mainboard test equipment Inspection access to mainboard to be measured time, be automatically performed the detection of each passage to mainboard to be measured, testing circuit is capable of detecting when whether each passage exists fault. The main board test apparatus that such embodiment of the present invention provides can switch the test to mainboard voluntarily, and complete to dock the test of each mainboard becoming owner of board test apparatus voluntarily, achieve Aulomatizeted Detect mainboard, relatively the testing efficiency of operator's manual test mainboard is high, and improve test accuracy rate, and then ensure that mainboard quality.
Embodiment two
The present invention provides a kind of motherboard test method, executive agent is main board test apparatus, this main board test apparatus once can test at least one mainboard to be measured, wherein, the method that main board test apparatus tests each mainboard to be measured is identical, therefore, the embodiment of the present invention is only tested one of them mainboard to be measured for main board test apparatus and is described in detail.
The embodiment of the present invention provides a kind of motherboard test method, as it is shown on figure 3, the method includes:
S101, mainboard test equipment Inspection to mainboard to be measured access time, whether n the passage detecting mainboard to be measured exists fault, and records n testing result, wherein, n >=1.
Wherein, the passage in the embodiment of the present invention can be sound channel, VGA passage, YPbPr passage, HDMI passage, AV passage or TV passage, and this is not especially limited by the embodiment of the present invention.
In practical application, mainboard to be measured comprises at least one passage. For each mainboard to be measured, main board test apparatus is when test, it is necessary to testing each passage of this mainboard to be measured, to determine whether each passage exists fault, and then the test result according to all passages determines whether mainboard to be measured exists fault.
Concrete, mainboard test equipment Inspection to mainboard to be measured access time, main board test apparatus drives mainboard to be measured and main board test apparatus communicate or carry out data transmission automatically.Therefore, if multiple mainboard to be measured accesses main board test apparatus, main board test apparatus can drive each mainboard to be measured and main board test apparatus communicate or carry out data transmission according to the electrifying timing sequence of each mainboard to be measured successively.
For each mainboard to be measured, whether n (n >=1) the individual passage of mainboard test this mainboard to be measured of equipment Inspection exists fault, and records n testing result.
For the first passage in n passage, whether mainboard test equipment Inspection first passage exists fault, and records whether first passage exists the first testing result of fault, and wherein, first passage is any one in n passage.
The method whether mainboard test equipment Inspection first passage exists fault is explained below, repeats no more herein.
S102, main board test apparatus are according to n testing result, it is determined that whether mainboard to be measured exists fault.
Main board test apparatus is after detecting n passage of mainboard to be measured, and main board test apparatus is according to n testing result, it is determined that whether mainboard to be measured exists fault.
It is understood that simply by the presence of a testing result for indicating the passage of its correspondence to there is fault in n testing result, just illustrate that mainboard to be measured then exists fault. If n testing result all indicates is absent from fault, then mainboard fault-free to be measured.
Concrete, if the first testing result is used for indicating first passage to there is fault, main board test apparatus then determines that mainboard to be measured exists fault.
S103, main board test apparatus show determines result, wherein it is determined that result is used for indicating whether mainboard to be measured exists fault.
Main board test apparatus is whether mainboard to be measured is deposited after the failure, it is to be determined to result shows.
Concrete, main board test apparatus can be shown by display lamp determines result. Such as, if main board test apparatus determines that mainboard to be measured exists fault, then the display lamp display redness of main board test apparatus.
Further, main board test apparatus can also be shown by screen and determines result.
Concrete, the signal of the signal and mainboard to be measured output that input mainboard to be measured is all shown by screen, so that by watching screen, the manager of main board test apparatus can directly know which passage of mainboard to be measured occurs in that fault.
Concrete, as shown in Figure 4, for the first passage in n passage, whether mainboard test equipment Inspection exists fault, and the method recording the first testing result is:
S201, main board test apparatus generate the control signal of the mark comprising first passage, and send a control signal to mainboard to be measured, so that the passage of mainboard to be measured is switched first passage according to control signal by mainboard to be measured.
Wherein, the mark instruction first passage of first passage.
S202, main board test apparatus send the first signal to mainboard to be measured, so that the first signal transmits via first passage, and export secondary signal.
S203, main board test apparatus judge whether the secondary signal that mainboard to be measured exports meets pre-conditioned.
Wherein, the difference of the property value of pre-conditioned identical with the first signal for secondary signal or secondary signal and the property value of the first signal is less than predetermined threshold value, and property value is amplitude or the phase place of signal.
If S204 secondary signal meets pre-conditioned, main board test apparatus then determines first passage fault-free.
If S205 secondary signal is unsatisfactory for pre-conditioned, then repeating S202 and S203, if after repeating m S202 and S203, secondary signal is still unsatisfactory for pre-conditioned, and main board test apparatus then determines that first passage breaks down, wherein, and m >=1.
Owing to mainboard to be measured includes n passage, therefore, main board test apparatus is when whether the first passage detecting mainboard to be measured exists fault, it is necessary to first its passage is switched to first passage by mainboard to be measured.
Concrete, main board test apparatus sends a control signal to mainboard to be measured, so that its passage is switched to first passage according to this control signal by mainboard to be measured.
Optionally, the control signal in the embodiment of the present invention is digital signal.
After its passage is switched to first passage by mainboard to be measured, main board test apparatus sends the first signal to mainboard to be measured, so that the first signal transmits via the first passage of mainboard to be measured.
Wherein, the first signal is that the passage of self is switched to the signal generated after first passage by main board test apparatus according to control signal.
It is easily understood that when mainboard tests the first passage of equipment Inspection mainboard to be measured, it is necessary to ensure that the passage of self is identical with first passage. So, when the first signal transmits via first passage, the first signal will not have greatly changed.
Concrete, main board test apparatus also includes at least one passage, and at least one passage of main board test apparatus is identical with n passage of mainboard to be measured. So, main board test apparatus can complete the detection of n the passage to mainboard to be measured.
Further, main board test apparatus is after sending the first signal extremely mainboard to be measured, and the first signal can transmit via the first passage of mainboard to be measured, and mainboard to be measured is to output secondary signal after the first signal response, now, mainboard test equipment utilization secondary signal determines whether first passage exists fault.
Concrete, it is pre-conditioned that main board test apparatus judges whether this secondary signal meets, wherein, pre-conditioned identical with the first signal for secondary signal, or, the difference of the property value of secondary signal and the property value of the first signal is less than predetermined threshold value, and the property value of signal is amplitude or the phase place of signal.
Signal in the embodiment of the present invention can be audio signal, it is also possible to for picture signal, this is not especially limited by the embodiment of the present invention.
Exemplary, if the first signal is the first picture signal, secondary signal is the second picture signal, then main board test apparatus may determine that in the color of image of predeterminated position in the second picture signal and the first picture signal, whether the color of image of predeterminated position is identical. If the first signal is the first audio signal, secondary signal is second sound signal, then main board test apparatus may determine that the amplitude of the second sound signal difference with the amplitude of the first audio signal is less than predetermined threshold value.
Concrete, if secondary signal meets pre-conditioned, main board test apparatus then determines first passage fault-free. If secondary signal is unsatisfactory for pre-conditioned, then repeating S202 and S203, if after repeating m S202 and S203, secondary signal is still unsatisfactory for pre-conditioned, and main board test apparatus then determines that first passage breaks down, wherein, and m >=1.
It is understood that in order to prevent erroneous judgement, main board test apparatus, when determining that secondary signal is unsatisfactory for pre-conditioned, repeats the first passage of mainboard to be measured is tested. As long as it is pre-conditioned to determine that secondary signal meets in main board test apparatus once test process, namely can determine that first passage fault-free.
Main board test apparatus adopts said method to detect n passage of mainboard to be measured successively, and records whether each passage exists fault.
In the embodiment of the present invention, main board test apparatus is when detecting that mainboard to be measured accesses, whether n (n >=1) the individual passage first detecting mainboard to be measured exists fault, and record n testing result, then, main board test apparatus is according to n testing result, determining whether mainboard to be measured exists fault, finally, main board test apparatus indicates the determination result whether mainboard to be measured exists fault to show by being used for.Pass through the program, main board test apparatus can switch the test to mainboard voluntarily, and complete to dock the test of each mainboard becoming owner of board test apparatus voluntarily, achieve Aulomatizeted Detect mainboard, relatively the testing efficiency of operator's manual test mainboard is high, and improve test accuracy rate, and then ensure that mainboard quality.
Those skilled in the art is it can be understood that arrive, for convenience and simplicity of description, only it is illustrated with the division of above-mentioned each functional module, in practical application, as desired above-mentioned functions distribution can be completed by different functional modules, it is divided into different functional modules, to complete all or part of function described above by the internal structure of device. The specific works process of the system of foregoing description, device and unit, it is possible to reference to the corresponding process in preceding method embodiment, do not repeat them here.
In several embodiments provided herein, it should be understood that disclosed system, apparatus and method, it is possible to realize by another way. Such as, device embodiment described above is merely schematic, such as, the division of described module or unit, being only a kind of logic function to divide, actual can have other dividing mode when realizing, for instance multiple unit or assembly can in conjunction with or be desirably integrated into another system, or some features can ignore, or do not perform. Another point, shown or discussed coupling each other or direct-coupling or communication connection can be through INDIRECT COUPLING or the communication connection of some interfaces, device or unit, it is possible to be electrical, machinery or other form.
The above; being only the specific embodiment of the present invention, but protection scope of the present invention is not limited thereto, any those familiar with the art is in the technical scope that the invention discloses; change can be readily occurred in or replace, all should be encompassed within protection scope of the present invention. Therefore, protection scope of the present invention should be as the criterion with described scope of the claims.
Claims (10)
1. a main board test apparatus, it is characterised in that include automatic switching component and the testing circuit being connected with described automatic switching component; Wherein,
Described automatic switching component, for when the test equipment Inspection of described mainboard accesses to mainboard to be measured, described mainboard to be measured and described main board test apparatus is driven to communicate, or carry out data transmission with described main board test apparatus, each passage for described mainboard to be measured, generate the first signal and described first signal is transmitted via described mainboard to be measured, obtaining the secondary signal of described mainboard to be measured output;
Described testing circuit, for the first signal generated at each passage of described mainboard to be measured according to described automatic switching component and the secondary signal got, it is determined that whether described mainboard to be measured exists fault.
2. main board test apparatus according to claim 1, it is characterized in that, described automatic switching component includes control circuit, the signal generator being connected with described control circuit, all it is connected with described testing circuit with the electrical interface that described control circuit and described signal generator are all connected with, described signal generator and described electrical interface; Wherein,
Described control circuit, for when the test equipment Inspection of described mainboard accesses to mainboard to be measured, generate pumping signal, and send described pumping signal extremely described electrical interface, described pumping signal comprises the mark of described mainboard to be measured, and it is used for sequentially generating control signal, and control signal to described signal generator and described mainboard to be measured described in transmission, described control signal comprises the mark of passage to be measured;
Described signal generator, for receiving described control signal, the mark of passage to be measured according to described control signal, the passage of described signal generator is switched to the passage to be measured of the mark instruction of described passage to be measured, and generate the first signal in described passage to be measured, send described first signal extremely described mainboard to be measured and described testing circuit;
Described electrical interface, for receiving described pumping signal, described mainboard to be measured and described main board test apparatus is driven to communicate according to described pumping signal, or carry out data transmission with described main board test apparatus, so that described mainboard to be measured receives described control signal, and the passage of described mainboard to be measured is switched to described passage to be measured.
3. main board test apparatus according to claim 1 and 2, it is characterised in that described main board test apparatus also includes the display being connected with described testing circuit;
Described display is screen and/or display lamp, and described display is for showing that the first testing result that described testing circuit is determined, described first testing result are used for indicating whether described mainboard to be measured exists fault.
4. main board test apparatus according to claim 3, it is characterised in that
Described testing circuit, specifically for according to described automatic switching component in the first signal of each passage of described mainboard to be measured and the secondary signal that gets, determine whether each passage of described mainboard to be measured exists fault, and the testing result according to each passage determines whether described mainboard to be measured exists fault.
5. main board test apparatus according to claim 4, it is characterised in that
Each passage for described mainboard to be measured, described testing circuit, pre-conditioned specifically for judging whether described secondary signal meets, described pre-conditioned identical with described first signal for secondary signal, or the difference of the property value of the property value of described secondary signal and described first signal is less than predetermined threshold value, and property value is amplitude or the phase place of signal; If described secondary signal meets described pre-conditioned, it is determined that described passage is absent from fault; If described secondary signal is unsatisfactory for described pre-conditioned, it is determined that described passage exists fault.
6. main board test apparatus according to claim 5, it is characterised in that
If described display is described screen, then described display is additionally operable to show the first signal of each passage and secondary signal.
7. a motherboard test method, it is characterised in that including:
Mainboard test equipment Inspection to mainboard to be measured access time, whether n the passage detecting described mainboard to be measured exists fault, and records n testing result, wherein, n >=1;
Described main board test apparatus is according to described n testing result, it is determined that whether described mainboard to be measured exists fault;
Described main board test apparatus shows determines result, described determines that result is for indicating whether described mainboard to be measured exists fault.
8. motherboard test method according to claim 7, it is characterized in that, for the first passage in described n passage, whether first passage described in the test equipment Inspection of described mainboard exists fault, and recording the first testing result, described first testing result is used for identifying whether described first passage exists fault;
Whether first passage described in the test equipment Inspection of described mainboard exists fault, specifically includes:
A, described main board test apparatus generate the control signal of the mark comprising described first passage, and control signal to described mainboard to be measured described in sending, so that the passage of described mainboard to be measured is switched first passage according to the mark of described first passage by described mainboard to be measured, wherein, the mark instruction first passage of described first passage;
B, described main board test apparatus send the first signal to described mainboard to be measured, so that described first signal transmits via described first passage, and export secondary signal;
C, described main board test apparatus judge whether the secondary signal that described mainboard to be measured exports meets pre-conditioned, described pre-conditioned identical with described first signal for described secondary signal or the property value of described secondary signal and the difference of the property value of described first signal are less than predetermined threshold value, and property value is amplitude or the phase place of signal;
If the described secondary signal of D meets described pre-conditioned, described main board test apparatus then determines described first passage fault-free;
If the described secondary signal of E is unsatisfactory for described pre-conditioned, then repeat B and C;
If F repeats m E, described main board test apparatus then determines that described first passage breaks down, wherein, and m >=1.
9. motherboard test method according to claim 8, it is characterised in that before described main board test apparatus sends the first signal extremely described mainboard to be measured, described motherboard test method also includes:
The passage of self is switched to described first passage by described main board test apparatus;
Described main board test apparatus generates described first signal at described first passage.
10. motherboard test method according to claim 8 or claim 9, it is characterised in that described main board test apparatus is according to described n testing result, it is determined that whether described mainboard to be measured exists fault, including:
If described first testing result indicates described first passage to there is fault, described main board test apparatus then determines that described mainboard to be measured exists fault.
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Address after: 266555 Qingdao economic and Technological Development Zone, Shandong, Hong Kong Road, No. 218 Patentee after: Hisense Video Technology Co.,Ltd. Address before: 266555 Qingdao economic and Technological Development Zone, Shandong, Hong Kong Road, No. 218 Patentee before: HISENSE ELECTRIC Co.,Ltd. |