CN105675711A - 一种批量获取磁性材料m-t、δs-t曲线的方法 - Google Patents
一种批量获取磁性材料m-t、δs-t曲线的方法 Download PDFInfo
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- CN105675711A CN105675711A CN201610008914.1A CN201610008914A CN105675711A CN 105675711 A CN105675711 A CN 105675711A CN 201610008914 A CN201610008914 A CN 201610008914A CN 105675711 A CN105675711 A CN 105675711A
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- 238000000034 method Methods 0.000 title claims abstract description 65
- 239000000696 magnetic material Substances 0.000 title claims abstract description 50
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/12—Measuring magnetic properties of articles or specimens of solids or fluids
- G01R33/14—Measuring or plotting hysteresis curves
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CN201610008914.1A CN105675711B (zh) | 2016-01-05 | 2016-01-05 | 一种批量获取磁性材料m-t、δs-t曲线的方法 |
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CN201610008914.1A CN105675711B (zh) | 2016-01-05 | 2016-01-05 | 一种批量获取磁性材料m-t、δs-t曲线的方法 |
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CN105675711A true CN105675711A (zh) | 2016-06-15 |
CN105675711B CN105675711B (zh) | 2018-09-18 |
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Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2004079340A2 (en) * | 2003-02-28 | 2004-09-16 | University Of South Florida | Measurement of point contact andreev-reflection characteristics of half-metallic thin films |
WO2008069423A1 (en) * | 2006-12-07 | 2008-06-12 | Seoul National University Industry Foundation | Magnetoelectric susceptibility measurement method and the system thereof |
CN103018685A (zh) * | 2012-12-09 | 2013-04-03 | 河北科技大学 | 一种恒温下钢中诱发马氏体相变磁场强度的测量方法 |
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- 2016-01-05 CN CN201610008914.1A patent/CN105675711B/zh active Active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2004079340A2 (en) * | 2003-02-28 | 2004-09-16 | University Of South Florida | Measurement of point contact andreev-reflection characteristics of half-metallic thin films |
WO2008069423A1 (en) * | 2006-12-07 | 2008-06-12 | Seoul National University Industry Foundation | Magnetoelectric susceptibility measurement method and the system thereof |
CN103018685A (zh) * | 2012-12-09 | 2013-04-03 | 河北科技大学 | 一种恒温下钢中诱发马氏体相变磁场强度的测量方法 |
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