CN105675258B - High birefringence optical fiber beat length measuring method and measuring device based on interference order - Google Patents

High birefringence optical fiber beat length measuring method and measuring device based on interference order Download PDF

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CN105675258B
CN105675258B CN201610008795.XA CN201610008795A CN105675258B CN 105675258 B CN105675258 B CN 105675258B CN 201610008795 A CN201610008795 A CN 201610008795A CN 105675258 B CN105675258 B CN 105675258B
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optical fiber
high birefringence
measured
interference
birefringence optical
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CN105675258A (en
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朱军
俞本立
曹志刚
汪辉
甄胜来
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Anhui University
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/33Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face
    • G01M11/331Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face by using interferometer

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  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
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  • Instruments For Measurement Of Length By Optical Means (AREA)

Abstract

The invention relates to the field of high birefringence fiber parameter measurement, in particular to a high birefringence fiber beat length measurement method and a measurement device based on interference seriesCalculating beat length under different extreme wavelengths. The measuring method of the invention has the advantages of less dependent parameters, small measuring error and high measuring precision. The measuring device provided by the invention is simple in structure and easy to realize.

Description

A kind of high birefringence optical fiber beat length measuring method and measurement apparatus based on interference level
Technical field
The present invention relates to high birefringence optical fiber parameter measurement field, specially a kind of high birefringence light based on interference level Fine beat length measuring method and measurement apparatus.
Background technology
It is to characterize an Important Parameters of high birefringence optical fiber characteristic to clap length, need to accurately be measured.Traditional high birefringence light Fine beat length measuring method has Rayleigh scattering method (XShe Xianfenxi), dynamic pressurized method, Magnetooptic Modulation, White Light Interferometer and interferometric spectrometry etc..Its In, interferometric spectrometry is that wide spectrum light source is coupled into high birefringence optical fiber, and it is orthogonal to obtain high birefringence optical fiber by spectrometer Interference signal between polarization mode, according to the wavelength interval in spectrum between two neighboring extremum wavelengths, two extreme values and high birefringence Fiber lengths realize that optical fiber claps long measurement.
A kind of patent of invention " beat length of polarization maintaining optical fiber based on SAGNAC interferometers of China Patent Publication No. 101592551 Method of testing and test device " and a kind of " survey of beat length of polarization maintaining optical fiber of China Patent Publication No. 101710023A patent of invention Method for testing and device " is all typical interferometric spectrometry case.
In the patent of invention of Publication No. 101592551, clapping long computational methods is:The length of measurement tested optical fiber is designated as L, The wavelength X of adjacent extreme value (13,14) is obtained according to interference spectrumkAnd λk-1, calculate wavelength interval Δ λ=λ between extreme valuek-1k And mean wavelengthAccording to the long calculation formula of batCalculate bat length.In this patent, L, λkWith λk-1Measurement error can all have influence on measurement result, although employed in this patent error analysis method selection optimize light Fine length, but influence caused by measurement error can only be reduced to a certain extent, the error in measurement parameters can not be eliminated.
In publication number 101710023A patent of invention, clapping long computational methods is:The length of measurement tested optical fiber is designated as L, The interference modal data at least one cycle is collected, the data of collection are emulated by computer software, theoretical polishing wax Expression formula beBirefringence β is calculated according to fitting result, calculated using length is clapped FormulaBat length is calculated, then by being averaging after repeatedly measuring, obtains the long result of final bat.In this patent from See that clapping long calculation error derives from data fitting result and birefringent calculating, in fact still derives from spectrum reading on surface With the error of optical fiber length measuring, fitting and average treatment can only reduce influence caused by measurement error to a certain extent, The error in measurement parameters can not be eliminated.
In above two computational methods, clap that the measurement parameters that long result of calculation relies on are more, and each parameter is present Certain measurement error, cause error calculated larger, measuring accuracy is low.
The content of the invention
For the problems of the prior art, a kind of dependence parameter that calculates of present invention offer is few, and measuring result error is small, measurement The high high birefringence optical fiber beat length measuring method based on interference level of accuracy.
To realize above technical purpose, the technical scheme is that:
A kind of high birefringence optical fiber beat length measuring method based on interference level, step are as follows:
A. the length L of high birefringence optical fiber to be measured is measured;
B. the interferometer that optical interference circuit phase difference is formed with high birefringence optical fiber fast axle to be measured and slow axis is built;
C. interference spectrum is obtained, gathers the wavelength of two neighboring maximum or two minimums, calculates two poles It is worth the interference level corresponding to wavelength, according to the interference level calculated, you can obtain the interference corresponding to all extremum wavelengths Series, all extremum wavelengths include all maximum wavelength and all minimum wavelength;
D. the phase relation formula and clap long calculation formula that extremum wavelengths meet under interference spectrum are incorporated in, can be derived any Extremum wavelengths λNUnder the long formula of bat beWherein N is extremum wavelengths λNCorresponding interference level, according to The interference level corresponding to all extremum wavelengths measured, you can calculate the bat length under all extremum wavelengths.
From the above, it can be seen that the present invention possesses advantages below:
1. interference level calculates high birefringence optical fiber and claps length, the measurement of dependence according to corresponding to extremum wavelengths in interference spectrum Parameter only has interference level N and high birefringence optical fiber length L to be measured, and dependence parameter is few, and accuracy of measurement influence factor is few.
2. being this fundamental characteristics of π integral multiple using phase corresponding to extremum wavelengths, eliminate in interference level calculating Interfere influences caused by extremum wavelengths measurement error so that the error for clapping long result of calculation is derived only from high birefringence light to be measured Fine length-measuring error, improve the precision of beat length measurement.
To realize above measuring method, the present invention provides a kind of high birefringence optical fiber beat length measurement device, including light source, with High birefringence optical fiber fast axle to be measured and slow axis form the interferometer of optical interference circuit phase difference, spectrometer and for measuring Gao Shuan to be measured The measurement apparatus of fiber lengths is reflected, the input of the interferometer is connected with light source, and output end is connected with spectrometer.
From the above, it can be seen that the present invention possesses advantages below:Utilize high birefringence optical fiber fast axle to be measured and slow axis Optical interference circuit phase difference is formed, interference structure is simple, it is easy to accomplish.
Preferably, the interferometer is Sagnac ring structures, the Sagnac ring structures include high birefringence light to be measured Fibre, coupler, the first single-mode fiber and the second single-mode fiber, the port A of the coupler are connected with light source, port B and spectrum Instrument is connected, and the both ends of the high birefringence optical fiber to be measured pass through the first single-mode fiber and the second single-mode fiber and coupler respectively Port C is connected with port D;Interference structure simple structure, required component are few, it is easy to make, and cost is low.
Preferably, it is 5mW that the light source, which is power output, spectrum is 1500nm-1600nm SLD.
Preferably, the high birefringence optical fiber to be measured is panda type optical fiber.
Preferably, the coupler is three-dB coupler.
Preferably, the interferometer is polarization interference structure, the polarization interference structure includes high birefringence light to be measured Fibre, the polarizer, the first polarization maintaining optical fibre, the second polarization maintaining optical fibre and analyzer, the input of the polarizer is connected with light source, described The output end of analyzer is connected with spectrometer, and the both ends of the high birefringence optical fiber to be measured pass through the first polarization maintaining optical fibre and respectively Two polarization maintaining optical fibres are connected with the output end of the polarizer and the input of analyzer, the high birefringence optical fiber to be measured and the first polarization-maintaining The connected mode of optical fiber and the second polarization maintaining optical fibre is to intersect 45 ° of weldings with optical axis;Interference structure light path stable performance, polarization are dry It is not good by ectocine, interference pattern to relate to characteristic.
Preferably, it is 5mW that the light source, which is power output, spectrum is 1500nm-1600nm SLD.
Preferably, the high birefringence optical fiber to be measured is panda type optical fiber.
Brief description of the drawings
Fig. 1 is the structural representation of the embodiment of the present invention 1;
Fig. 2 is the structural representation of the embodiment of the present invention 2;
Fig. 3 is the transmitted light spectrogram of simulation;
Fig. 4 is that embodiment 1 actually measures obtained transmitted light spectrogram;
Fig. 5 is the long graph of a relation between wavelength of bat that embodiment 1 obtains;
Reference:1. light source, 2. interferometers, 3. spectrometers, 4. high birefringence optical fibers to be measured, 5. couplers, 6. first Single-mode fiber, 7. second single-mode fibers, 8. polarizers, 9. first polarization maintaining optical fibres, 10. second polarization maintaining optical fibres, 11. analyzers.
Embodiment
With reference to Fig. 1, the specific embodiment of the present invention is described in detail, but any limit is not done to the claim of the present invention It is fixed.
As shown in figure 1, a kind of high birefringence optical fiber beat length measurement device, including it is light source 1, fast with high birefringence optical fiber to be measured Axle and slow axis form the interferometer 2 of optical interference circuit phase difference, spectrometer 3 and for measuring the length of high birefringence optical fiber 4 to be measured Measurement apparatus, the input of interferometer 2 are connected with light source 1, and output end is connected with spectrometer 3.
Wherein interferometer 2 uses Sagnac ring structures, and Sagnac ring structures include high birefringence optical fiber 4 to be measured, coupler 5th, the first single-mode fiber 6 and the second single-mode fiber 7, the port A of coupler 5 are connected with light source 1, and port B is connected with spectrometer 3, The both ends of high birefringence optical fiber 4 to be measured pass through the first single-mode fiber 6 and the port C of the second single-mode fiber 7 and coupler 5 respectively It is connected with port D.
During work, light is divided into clockwise direction and inverse time by port A of the light source 1 through optical-fiber switch-in coupler 5, coupler 5 The two-beam in pin direction, meet and interfere in coupler 5 after high birefringence optical fiber 4 to be measured respectively, interference spectrum signal Port B through coupler is exported and is transferred to spectrometer 3.
With reference to Fig. 2, the specific embodiment of the present invention is described in detail, but any limit is not done to the claim of the present invention It is fixed.
As shown in Fig. 2 a kind of high birefringence optical fiber beat length measurement device, including it is light source 1, fast with high birefringence optical fiber to be measured Axle and slow axis form the interferometer 2 of optical interference circuit phase difference, spectrometer 3 and for measuring the length of high birefringence optical fiber 4 to be measured Measurement apparatus, the input of interferometer 2 are connected with light source 1, and output end is connected with spectrometer 3.
Wherein, interferometer 2 is polarization interference structure, and the polarization interference structure includes high birefringence optical fiber 4 to be measured, risen Inclined device 8, the first polarization maintaining optical fibre 9, the second polarization maintaining optical fibre 10 and analyzer 11, the input of the polarizer 8 are connected with light source 1, The output end of the analyzer 11 is connected with spectrometer 3, and the both ends of the high birefringence optical fiber 4 to be measured pass through the first polarization-maintaining respectively The polarization maintaining optical fibre 10 of optical fiber 9 and second is connected with the output end of the polarizer 8 and the input of analyzer 11, the high birefringence to be measured Optical fiber 4 is to intersect 45 ° of weldings with optical axis with the connected mode of the first polarization maintaining optical fibre 9 and the second polarization maintaining optical fibre 10.
During work, through the intelligent acess polarizer 8, the light through the polarizer 8 forms linearly polarized light and transmitted to first and protects light source 1 In polarisation fibre 9, linearly polarized light enters high birefringence optical fiber 4 to be measured after fusion point, and again passes by fusion point and protected into second Polarisation fibre 10, meet and interfere in analyzer 11 by the two-beam of fast axle and slow axis in high birefringence optical fiber 4 to be measured respectively, Interference spectrum signal is output to spectrometer from the output end of analyzer 11.
In above two embodiment, being output to the spectral signal of spectrometer can directly be read out, and can also be transferred to Computer, analyzed by computer disposal.
In above two embodiment, the normalization light spectrum expression formula of output is:
B represents the birefringence of high birefringence optical fiber in formula (1), and L represents the length of high birefringence optical fiber to be measured, λ represent into The wavelength being mapped in interferometer.
It is as shown in Figure 3 according to the simulated transmission spectrogram that formula (1) obtains.
According to formula (1) and Fig. 3, the integral multiple that the phase corresponding to extremum wavelengths (maximum value or minimum value) is π.
For two neighboring maximum wavelength XkWith λk-1, its corresponding phase should be π even-multiple, meets following formula:
In formula (2), λk、λk-1Two adjacent maximum wavelength are represented, k is integer, and k, k-1 represent maximum ripple respectively Long λk、λk-1Corresponding interference level.
Accordingly for any maximum wavelength XkTwo adjacent minimum wavelengthCorresponding to it Phase should be π odd-multiple, meet following formula:
In formula (3),Two adjacent minimum wavelength are represented,Represent minimum ripple It is longCorresponding interference level.
It can be calculated according to formula (2), k and λk、λk-1Between relational expression be:
According to formula (3) can calculate k withBetween relational expression be:
To formula (4) and formula (5) round, formula (6) and formula (7) can be rewritten as respectively:
[] represents round in formula (6) and formula (7), and rounding operation can eliminate the shadow of extremum wavelengths error in reading Ring.
When any maximum wavelength XkWhen corresponding interference level k is for known to, adjacent maximum wavelength X can be drawnk-1It is corresponding Interference level be k-1, adjacent maximum wavelength Xk-2Corresponding interference level is k-2, adjacent minimum wavelengthIt is corresponding Interference level isAdjacent minimum wavelengthCorresponding interference level isBy that analogy, interference can be written Interference level corresponding to any one maximum wavelength of spectrum.
Bat according to corresponding to the long calculation formula of bat can derive any extreme point is a length of:
In formula (8), λNAny extremum wavelengths are represented, B represents the birefringence of high birefringence optical fiber, and L represents high birefringence light Fine length, N represent any extremum wavelengths λNCorresponding interference level.
Formula (6) is substituted into formula (8) can draw any maximum wavelength XkCorresponding bat is a length of:
Formula (7) is substituted into formula (8) can draw any minimum wavelengthCorresponding bat is a length of:
In above calculating process, in order to ensure that round operation result and actual value are consistent, k uncertainties It should be less than 0.5.
For formula (6), analyzed according to error theory, maximum wavelength XkCorresponding interference level k uncertainty should expire Foot:
σ in formula (11)k、σλThe uncertainty of k and extremum wavelengths reading is represented respectively.
It is assumed that interference spectrum is in 1550nm wave bands, λk, λk-1≈ 1550nm, the principal element for influenceing formula (11) result are interference Wavelength interval and wavelength uncertainty in spectrum.Assuming that wavelength uncertainty is 0.02nm, wavelength interval minimum can be calculated About 9.5nm.For conventional high birefringence optical fiber, it can calculate and meet that the fiber lengths maximum of formula (11) is about 50cm, In practical application, this scope is feasible, within zone of reasonableness.
The consistency analysis of round operation result and actual value in formula (7), with formula (6) analysis similarly, In practical application, rounding operation is feasible.
As can be seen that passing through rounding operation from formula (9) and formula (10), error is not present in obtained interference level, claps length The error source of result of calculation only has the length-measuring error of high birefringence optical fiber to be measured, is no longer missed by interference extremum wavelengths reading The influence of difference.
As shown in figure 4, actually measure obtained transmitted light spectrogram for embodiment 1, selected light source is SLD during implementation, Power output is 5mW, spectrum 1500nm-1600nm, selected coupler formula three-dB coupler, selected Gao Shuan to be measured Refraction optical fiber is panda type optical fiber, and length is 172.23 ± 0.05mm, and selected spectrometer is the model of YOKOGAWA companies For AQ6370C spectrometer, its scanning resolution is 0.02nm.
It is measurable to obtain each minimum wavelength and carry it into formula (10) that corresponding interference order is calculated according to Fig. 4 Number and bat length, concrete outcome are as shown in the table:
Extremum wavelengths/nm 1507.8 1528.66 1550.14 1572.16 1594.78
Corresponding interference level 73.5 72.5 71.5 70.5 69.5
To the long L that answers the bidB/nm 2.343 2.376 2.409 2.443 2.478
Table 1
As shown in figure 5, it is the long graph of a relation between extremum wavelengths of bat obtained according to the data in table 1.From Fig. 5 Fitting result can be seen that degree of fitting as 1, experimental result ideally demonstrate the feasibility of the method for the invention with it is superior Property.
According to long computational theory is clapped, clapping long uncertainty of measurement can be written as:
In formula (12),Represent to clap long uncertainty of measurement, σLRepresent the uncertain of high birefringence optical fiber linear measure longimetry Degree, N represent the interference level corresponding to extremum wavelengths.
According to the experimental result of embodiment 1, when the uncertainty of linear measure longimetry is ± 0.05nm, it is not true to clap long measurement Fixed degree is better than:0.001mm, measurement accuracy are very high.
In summary, the present invention has advantages below:
1. interference level calculates high birefringence optical fiber and claps length, the measurement of dependence according to corresponding to extremum wavelengths in interference spectrum Parameter only has interference level N and high birefringence optical fiber length L to be measured, and dependence parameter is few, and accuracy of measurement influence factor is few.
2. being this fundamental characteristics of π integral multiple using phase corresponding to extremum wavelengths, eliminate in interference level calculating Interfere influences caused by extremum wavelengths measurement error so that the error for clapping long result of calculation is derived only from high birefringence light to be measured Fine length-measuring error, improve the precision of beat length measurement.
It is understood that above with respect to the specific descriptions of the present invention, it is merely to illustrate the present invention and is not limited to this Technical scheme described by inventive embodiments.It will be understood by those within the art that still the present invention can be carried out Modification or equivalent substitution are (anti-by obtaining such as by measuring the measurement transmitted spectrum in the reflectance spectrum replacement embodiment of the present invention Penetrate the wavelength in spectrum corresponding to extreme value and calculate corresponding interference level) to reach identical technique effect;It is as long as full Foot is using needs, all within protection scope of the present invention.

Claims (9)

1. a kind of high birefringence optical fiber beat length measuring method based on interference level, step are as follows:
A. the length L of high birefringence optical fiber to be measured is measured;
B. the interferometer that optical interference circuit phase difference is formed with high birefringence optical fiber fast axle to be measured and slow axis is built;
C. interference spectrum is obtained, gathers the wavelength of two neighboring maximum or two minimums, calculates two extreme value ripples Long corresponding interference level, according to the interference level calculated, you can the interference level corresponding to all extremum wavelengths is obtained, All extremum wavelengths include all maximum wavelength and all minimum wavelength;
D. the phase relation formula and clap long calculation formula that extremum wavelengths meet under interference spectrum are incorporated in, any extreme value can be derived Wavelength XNUnder the long formula of bat beWherein N is extremum wavelengths λNCorresponding interference level, according to having measured All extremum wavelengths corresponding to interference level, you can calculate under all extremum wavelengths bat length.
A kind of 2. high birefringence optical fiber beat length measurement device based on method as claimed in claim 1, it is characterised in that:Including light Source (1), interferometer (2), the spectrometer (3) for being formed with high birefringence optical fiber to be measured (4) fast axle and slow axis optical interference circuit phase difference With for measuring high birefringence optical fiber to be measured (4) measurement of length device, input and light source (1) phase of the interferometer (2) Even, output end is connected with spectrometer (3).
3. high birefringence optical fiber beat length measurement device as claimed in claim 2, it is characterised in that:The interferometer (2) is Sagnac ring structures, the Sagnac ring structures include high birefringence optical fiber to be measured (4), coupler (5), the first single-mode fiber (6) it is connected with the second single-mode fiber (7), the port A of the coupler (5) with light source (1), port B is connected with spectrometer (3), The both ends of the high birefringence optical fiber to be measured (4) pass through the first single-mode fiber (6) and the second single-mode fiber (7) and coupler respectively (5) port C is connected with port D.
4. high birefringence optical fiber beat length measurement device as claimed in claim 3, it is characterised in that:The light source (1) is output Power is 5mW, and spectrum is 1500nm-1600nm SLD.
5. high birefringence optical fiber beat length measurement device as claimed in claim 3, it is characterised in that:The high birefringence light to be measured Fine (4) are panda type optical fiber.
6. high birefringence optical fiber beat length measurement device as claimed in claim 3, it is characterised in that:The coupler (5) is 3dB Coupler.
7. high birefringence optical fiber beat length measurement device as claimed in claim 2, it is characterised in that:The interferometer (2) is inclined Shake interference structure, the polarization interference structure include high birefringence optical fiber to be measured (4), the polarizer (8), the first polarization maintaining optical fibre (9), Second polarization maintaining optical fibre (10) and analyzer (11), the input of the polarizer (8) are connected with light source (1), the analyzer (11) output end is connected with spectrometer (3), and the both ends of the high birefringence optical fiber (4) to be measured pass through the first polarization maintaining optical fibre respectively (9) it is connected with the second polarization maintaining optical fibre (10) with the output end of the polarizer (8) and the input of analyzer (11), the Gao Shuan to be measured Refraction optical fiber (4) is to intersect 45 ° with optical axis to melt with the connected mode of the first polarization maintaining optical fibre (9) and the second polarization maintaining optical fibre (10) Connect.
8. high birefringence optical fiber beat length measurement device as claimed in claim 7, it is characterised in that:The light source (1) is output Power is 5mW, and spectrum is 1500nm-1600nm SLD.
9. high birefringence optical fiber beat length measurement device as claimed in claim 7, it is characterised in that:The high birefringence light to be measured Fine (4) are panda type optical fiber.
CN201610008795.XA 2016-01-04 2016-01-04 High birefringence optical fiber beat length measuring method and measuring device based on interference order Expired - Fee Related CN105675258B (en)

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