CN105651542B - Glass substrate sampling device and method - Google Patents
Glass substrate sampling device and method Download PDFInfo
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- CN105651542B CN105651542B CN201511022326.5A CN201511022326A CN105651542B CN 105651542 B CN105651542 B CN 105651542B CN 201511022326 A CN201511022326 A CN 201511022326A CN 105651542 B CN105651542 B CN 105651542B
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- glass substrate
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/02—Devices for withdrawing samples
- G01N1/04—Devices for withdrawing samples in the solid state, e.g. by cutting
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- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
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- General Health & Medical Sciences (AREA)
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- Sampling And Sample Adjustment (AREA)
Abstract
The invention discloses a glass substrate sampling device and a glass substrate sampling method, wherein the glass substrate sampling device comprises a sampling block (1) with a sampling hole (11) and a cover plate (2) which is fixed on one side of the sampling block (1) and covers the sampling hole (11), the other side of the sampling block (1) is used for being fixed on the surface of a glass substrate defect, and the glass substrate surface defect is kept in the sampling hole (11). Therefore, the glass substrate sample is not polluted, and the accuracy of the physical and chemical analysis result of the spectrometer is improved.
Description
Technical Field
The invention relates to the field of glass substrate production, in particular to a glass substrate sampling device and a glass substrate sampling method.
Background
In the glass substrate inspection step, after sampling foreign substances on the surface of the glass substrate, the components of the foreign substances need to be analyzed physically and chemically by a spectrometer. In the prior art, a glass substrate sample with foreign matters on the surface is cut from a whole glass substrate and is stored in a sampling bag and sent to a laboratory for component analysis. However, in practice, the results of the physicochemical analysis are inaccurate due to various factors, for example, particle dust generated by cutting the glass substrate may adhere to the glass substrate sample, the glass substrate sample rubs against the sampling bag to scratch off foreign matters, and other foreign matters may adhere to the glass substrate sample.
Disclosure of Invention
The invention aims to provide a glass substrate sampling device, which can prevent a glass substrate sample from being polluted and improve the accuracy of a physical and chemical analysis result of a spectrometer.
Another object of the present invention is to provide a method for sampling a glass substrate, which is simple and easy to perform and can accurately sample.
In order to achieve the above object, according to one aspect of the present invention, there is provided a glass substrate sampling device including a sampling block having a sampling hole, and a cover plate fixed to one side of the sampling block and covering the sampling hole, the other side of the sampling block being for fixing to a defective surface of a glass substrate, and the defective surface of the glass substrate being held in the sampling hole.
Preferably, the cover plate is made of glass, and the sampling block is made of PVC, stainless steel, aluminum profile or polyether ether ketone.
Preferably, a first double-sided tape is provided at one side of the sampling block to be fixed to the cap plate.
Preferably, the other side of the sampling block is provided with a second double-sided tape to be fixed on the defective surface of the glass substrate.
According to another aspect of the present invention, there is provided a glass substrate sampling method including finding a defective surface of a glass substrate using a defect inspection apparatus and determining position coordinates of the surface defect of the glass substrate by a gauge, and then fixing a glass substrate sampling device provided according to the present invention to the defective surface of the glass substrate such that the surface defect of the glass substrate is held in the sampling hole.
Preferably, after the glass substrate sampling device is fixed to the defective surface of the glass substrate, a sample is cut from the entire glass substrate along the outer contour of the glass substrate sampling device by using a glass cutter.
Preferably, a halogen lamp or a hard flashlight is used to locate the defective surface of the glass substrate.
The invention has the beneficial effects that: the glass substrate with the surface defects is sampled by the glass substrate sampling device, so that the glass substrate sample is not polluted, and the accuracy of the physical and chemical analysis result of the spectrometer is improved.
Additional features and advantages of the invention will be set forth in the detailed description which follows.
Drawings
The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description serve to explain the principles of the invention and not to limit the invention. In the drawings:
fig. 1 is a schematic plan view of a glass substrate sampling device according to a preferred embodiment of the present invention.
Fig. 2 is a cross-sectional view taken according to line a-a in fig. 1.
Description of the reference numerals
1 sampling block 11 sampling hole
2 cover plate
Detailed Description
The following detailed description of embodiments of the invention refers to the accompanying drawings. It should be understood that the detailed description and specific examples, while indicating the present invention, are given by way of illustration and explanation only, not limitation.
As shown in fig. 1 to 2, the present invention provides a glass substrate sampling device and a glass substrate sampling method implemented by the sampling device. First, as an idea of the present invention, in order to prevent a glass substrate sample from being contaminated, a glass substrate sampling method provided by the present invention includes finding a defective surface of a glass substrate using a defect inspection apparatus, and determining position coordinates of the surface defect of the glass substrate by a gauge, and then fixing a glass substrate sampling device provided by the present invention to the defective surface of the glass substrate so that the surface defect of the glass substrate is maintained in a sampling hole 11 of a sampling block 1.
Specifically, the sampling device provided by the invention comprises a sampling block 1 with a sampling hole 11 and a cover plate 2 which is fixed on one side of the sampling block 1 and covers the sampling hole 11, wherein the other side of the sampling block 1 is used for being fixed on the surface of a defect of a glass substrate, and the surface defect of the glass substrate is kept in the sampling hole 11. Herein, the "glass substrate sample" refers to a glass substrate having a defect on the surface.
In the glass substrate sampling device provided by the invention, the cover plate 2 is fixed on one side of the sampling block 1, the cover plate 2 covers the sampling hole 11 on the sampling block 1, and the other side of the sampling block 1 is fixed on the defect surface of the glass substrate, so that the surface defect of the glass substrate can be kept in the sampling hole 11, and thus, the cover plate 2, the defect surface of the glass substrate and the sampling hole 11 form a closed space, so that the surface defect of the glass substrate is kept in the closed space, the glass substrate sample cannot be polluted, and the accuracy of a spectrometer on the physicochemical analysis result of the surface defect of the glass substrate is further improved.
In order to facilitate the inspection of whether the surface defect of the glass substrate is placed in the sampling hole 11, the cover plate 2 is preferably made of glass. In order to prevent the sample block 1 from dust absorption, static electricity generation, volatilization and the like, and to pollute the glass substrate sample, the sample block 1 is preferably made of a cleaning material: PVC, stainless steel, aluminum profile or polyether ether ketone.
Specifically, one side of the sampling block 1 is provided with a first double-sided tape to be fixed to the cover plate 2, and the other side of the sampling block 1 is provided with a second double-sided tape to be fixed to the defective surface of the glass substrate.
After the glass substrate sampling device is fixed on the defect surface of the glass substrate, one side of the glass substrate without the fixed sampling device is placed on a marble platform, and a sample is broken off from the whole glass substrate by scribing along the outline of the glass substrate sampling device by using a glass cutter, so as to finish sampling. Therefore, the particle dust generated by cutting can not be adhered to a closed space formed by the cover plate 2, the defect surface of the glass substrate and the sampling hole 11, and the glass substrate sample is prevented from being polluted.
In addition, a halogen lamp or a hard torch may be used to find the defective surface of the glass substrate in addition to the defect inspection apparatus.
In summary, the invention is directed to the problem that the physicochemical analysis result of the glass substrate sample by the spectrometer is inaccurate due to the fact that the glass substrate sample is easily polluted, and the glass substrate sampling device is used for sampling the glass substrate with surface defects, so that the glass substrate sample is not polluted, and the accuracy of the physicochemical analysis result of the spectrometer is improved.
The preferred embodiments of the present invention have been described in detail with reference to the accompanying drawings, however, the present invention is not limited to the specific details of the above embodiments, and various simple modifications can be made to the technical solution of the present invention within the technical idea of the present invention, and these simple modifications are within the protective scope of the present invention.
It should be noted that the various technical features described in the above embodiments can be combined in any suitable manner without contradiction, and the invention is not described in any way for the possible combinations in order to avoid unnecessary repetition.
In addition, any combination of the various embodiments of the present invention is also possible, and the same should be considered as the disclosure of the present invention as long as it does not depart from the spirit of the present invention.
Claims (7)
1. The glass substrate sampling device is characterized by comprising a sampling block (1) with a sampling hole (11) and a cover plate (2) which is fixed on one side of the sampling block (1) and covers the sampling hole (11), wherein the other side of the sampling block (1) is used for being fixed on the surface of a defect of a glass substrate, the surface defect of the glass substrate is kept in the sampling hole (11), and the cover plate (2) is made of glass.
2. Glass substrate sampling device according to claim 1, characterized in that the sampling block (1) is made of PVC, stainless steel, aluminum profile or polyetheretherketone.
3. Glass substrate sampling device according to claim 1, characterized in that one side of the sampling block (1) is provided with a first double-sided tape to be fixed to the cover plate (2).
4. The glass substrate sampling device according to claim 1 or 3, wherein the other side of the sampling block (1) is provided with a second double-sided tape to be fixed to the defective surface of the glass substrate.
5. A glass substrate sampling method, characterized in that the sampling method comprises finding a defective surface of a glass substrate using a defect inspection apparatus and determining position coordinates of the surface defect of the glass substrate by a gauge, and then fixing the glass substrate sampling device according to any one of claims 1 to 4 to the defective surface of the glass substrate so that the surface defect of the glass substrate is held in the sampling hole (11).
6. The glass substrate sampling method of claim 5, wherein after the glass substrate sampling device is fixed to the defective surface of the glass substrate, the sample is cut from the entire glass substrate along an outer contour of the glass substrate sampling device by using a glass cutter.
7. The glass substrate sampling method of claim 5, wherein the defective surface of the glass substrate is located using a halogen lamp or a hard torch.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201511022326.5A CN105651542B (en) | 2015-12-29 | 2015-12-29 | Glass substrate sampling device and method |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201511022326.5A CN105651542B (en) | 2015-12-29 | 2015-12-29 | Glass substrate sampling device and method |
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| Publication Number | Publication Date |
|---|---|
| CN105651542A CN105651542A (en) | 2016-06-08 |
| CN105651542B true CN105651542B (en) | 2020-04-17 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201511022326.5A Active CN105651542B (en) | 2015-12-29 | 2015-12-29 | Glass substrate sampling device and method |
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Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1566919A (en) * | 2003-06-24 | 2005-01-19 | 友达光电股份有限公司 | Contamination detecting method for LCD cell panel and sampling tool therefor |
| CN203148712U (en) * | 2013-03-06 | 2013-08-21 | 首钢京唐钢铁联合有限责任公司 | Hot rolled coil sampling mould |
| CN103698907A (en) * | 2013-09-18 | 2014-04-02 | 北京京东方光电科技有限公司 | Method for extracting foreign materials from liquid crystal panel |
| CN204752694U (en) * | 2015-07-01 | 2015-11-11 | 何志昂 | Burnt piece of cultivateing of copolymerization |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3886488T2 (en) * | 1987-09-18 | 1994-06-09 | Nagoya Oilchemical | Mask. |
| JP2000321180A (en) * | 1999-05-12 | 2000-11-24 | Nec Kyushu Ltd | Surface contamination measuring instrument of equipment |
-
2015
- 2015-12-29 CN CN201511022326.5A patent/CN105651542B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1566919A (en) * | 2003-06-24 | 2005-01-19 | 友达光电股份有限公司 | Contamination detecting method for LCD cell panel and sampling tool therefor |
| CN203148712U (en) * | 2013-03-06 | 2013-08-21 | 首钢京唐钢铁联合有限责任公司 | Hot rolled coil sampling mould |
| CN103698907A (en) * | 2013-09-18 | 2014-04-02 | 北京京东方光电科技有限公司 | Method for extracting foreign materials from liquid crystal panel |
| CN204752694U (en) * | 2015-07-01 | 2015-11-11 | 何志昂 | Burnt piece of cultivateing of copolymerization |
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| Publication number | Publication date |
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| CN105651542A (en) | 2016-06-08 |
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Application publication date: 20160608 Assignee: Hunan Xinghuai New Material Technology Co.,Ltd. Assignor: DONGXU OPTOELECTRONIC TECHNOLOGY Co.,Ltd. Contract record no.: X2022110000065 Denomination of invention: Glass substrate sampling device and method Granted publication date: 20200417 License type: Common License Record date: 20221101 |