CN105651487A - Testing apparatus for infrared tube - Google Patents
Testing apparatus for infrared tube Download PDFInfo
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- CN105651487A CN105651487A CN201410709971.3A CN201410709971A CN105651487A CN 105651487 A CN105651487 A CN 105651487A CN 201410709971 A CN201410709971 A CN 201410709971A CN 105651487 A CN105651487 A CN 105651487A
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Abstract
Disclosed in the invention is a testing apparatus for an infrared tube. The testing apparatus comprises an upper computer, a main control panel, slave machines, a pedestal, and two infrared tube mounting benches. The two infrared tube mounting benches are installed on two ends of the pedestal respectively; the slave machines are installed on the two infrared tube mounting benches respectively; the two slave machines are connected to the main control panel; and the main control panel and the upper computer are connected. In addition, an infrared emission tube is arranged on the infrared tube mounting bench at one end of the pedestal and is connected with the slave machine of the infrared tube mounting bench; and an infrared receiving tube is arranged on the infrared tube mounting bench arranged at the other end of the pedestal and is connected with the slave machine of the infrared tube mounting bench. Therefore, with the testing apparatus, an infrared tube of an infrared frame can be tested especially.
Description
Technical field
The present invention relates to electronic installation, refer to a kind of infrared tube test set especially.
Background technology
Infrared frame a kind of is widely used in interactive electric whiteboard and the electronic installation of interactive liquid crystal integral machine, is generally arranged on the surrounding of touch-screen. When user's contact screen, infrared receiving tube is due to the infrared signal stopped can't accept corresponding transmitting tube of hand or thing, and by this " Loss Of Signal " mechanism, system can the position of opponent or thing accurately be located, and then realizes man-machine interaction. In practice, the layout of infrared lamp is generally divided into " one to one " type (Fig. 1) and " one to many " two kinds, types (Fig. 2): the former transmitting tube and receiving tube one_to_one corresponding, the corresponding multiple transmitting tube of the latter's receiving tube. In rear a kind of structure, as shown in Figure 1, system needs the detection carrying out many transmitting tube signals for each receiving tube, and the signal sent due to this majority transmitting tube forms sector, and this kind of technology is called again covering of the fan scanning.
Relative to rectilinear scanning, infrared lamp is had higher requirement by covering of the fan scanning technique: no matter be transmitting tube or receiving tube, all must launch or receive the infrared signal (also namely possessing certain emissive porwer or receiving angle) possessing certain intensity in certain angle, otherwise error will be produced and even bring falsehood.
Due to the difference of test environment, testing standard and/or applied environment, the actual measurement parameter of commercially available infrared lamp always can have a difference with parameter of dispatching from the factory, and the product that finally causes dispatching from the factory is unsatisfactory. Therefore, it is badly in need of the instrument that a kind of special infrared tube for infrared frame carries out testing.
Summary of the invention
In view of this, it is an object of the invention to propose a kind of infrared tube test set, it is possible to the special infrared tube for infrared frame is tested.
Based on above-mentioned purpose infrared tube test set provided by the invention, comprise upper computer, master control board, from machine, pedestal and two infrared tubes, platform be installed, described two infrared tubes are installed platform and are arranged on respectively on the two ends of described pedestal, and described two infrared tubes install platform is separately installed with described in one from machine;Described two are connected respectively to described master control board from machine, and this master control board is connected with described upper computer;
In addition, the described infrared tube in described pedestal one end is installed and is arranged infrared emission pipe on platform, and this infrared emission pipe installs being connected from machine on platform with at this infrared tube; Described infrared tube at the described pedestal the other end is installed and is arranged infrared receiving tube on platform, and this infrared receiving tube installs being connected from machine on platform with at this infrared tube.
Can selection of land, the distance that described two infrared tubes are installed between platform is greater than 200mm.
Can selection of land, described infrared tube test set also comprises two light shields, is arranged on described two infrared tube respectively and installs on platform.
Can selection of land, described two infrared tubes are installed platform and are respectively stationary platen and universal stage, or are two stationary platens, or are two universal stages.
Further, described stationary platen comprises and supports seat, fluorescent tube mount pad, power supply board and from machine retaining plate, and described support seat is fixed on described pedestal, and described fluorescent tube mount pad and described power supply board are arranged on this support seat; Being provided with a groove on this support seat, described power supply board is arranged in this groove, and the one end of described fluorescent tube mount pad is fixedly connected with described power supply board, and the other end of described fluorescent tube mount pad is for installing infrared emission pipe or infrared receiving tube; In addition, should being vertically fixed on described support seat from machine retaining plate, and described can install from machine retaining plate described from machine, described is connected from machine with the infrared emission pipe being arranged on described fluorescent tube mount pad or infrared receiving tube.
Further, being provided with guide rail on the upper surface of described pedestal, the support seat of described stationary platen, described universal stage can be fixed by screws in described guide rail; Unclamping this screw, described stationary platen, described universal stage can slide along this guide rail.
Further, described stationary platen being provided with multiple test bit, the multiple test bits on described stationary platen linearly arrange on the direction being perpendicular to described pedestal length medullary ray; Namely multiple groove is set on the support seat of described stationary platen, this groove is installed described power supply board and described fluorescent tube mount pad.
Further, described universal stage comprises rotating disk, supports seat, fluorescent tube mount pad, power supply board and from machine retaining plate, described support seat is arranged on described pedestal by described rotating disk, this support seat is provided with a groove, described power supply board is arranged in this groove, and the one end of described fluorescent tube mount pad is fixedly connected with described power supply board, and this fluorescent tube mount pad is installed infrared emission pipe or infrared receiving tube; In addition, described being vertically fixed on described support seat from machine retaining plate, and described can install from machine retaining plate described from machine, described is connected from machine with the infrared emission pipe being arranged on described fluorescent tube mount pad or infrared receiving tube.
Further, being provided with axes normal in the motor of described pedestal upper surface in the cavity of described pedestal, motor is fixedly connected with described rotating disk by motor output shaft.
Further, described universal stage being provided with multiple test bit, on described universal stage, multiple test bit is looped around around described support seat, and when described motor rotates, multiple test bit is tested successively; Namely multiple groove is set on the support seat of described universal stage, this groove is installed described power supply board and described fluorescent tube mount pad.
Further, described infrared tube test set also comprises controller, and this controller one end is connected with described master control board, and the other end is connected with described motor;Described upper computer to the turning to of described motor, rotating speed by described master control board and is turned and stops controlling.
Further, described pedestal can also arrange positioned sensor, for determining that two infrared tubes install the infrared emission pipe on platform and whether infrared receiving tube aligns.
As can be seen from above, a kind of infrared tube test set provided by the invention, installs platform be arranged on respectively on the two ends of described pedestal by comprising described two infrared tubes, and described two infrared tubes install platform is separately installed with described in one from machine; Described two are connected respectively to described master control board from machine, and this master control board is connected with described upper computer; Described infrared tube in described pedestal one end is installed and is arranged infrared emission pipe on platform, and this infrared emission pipe installs being connected from machine on platform with at this infrared tube; Described infrared tube at the described pedestal the other end is installed and is arranged infrared receiving tube on platform, and this infrared receiving tube installs being connected from machine on platform with at this infrared tube. Thus, the infrared tube of infrared frame can be tested by infrared tube test set of the present invention, and can significantly reduce signal circuit decay and/or aerial interference in test process.
Accompanying drawing explanation
Fig. 1 is the schematic diagram of type infrared tube frame " one to one " in prior art;
Fig. 2 is the schematic diagram of " one to many " type infrared tube frames in prior art;
Fig. 3 is the structural representation of embodiment of the present invention infrared tube test set;
Fig. 4 is the structural representation of embodiment of the present invention stationary platen;
Fig. 5 is the structural representation of embodiment of the present invention universal stage;
Fig. 6 is the structural representation of embodiment of the present invention pedestal upper rail.
Embodiment
For making the object, technical solutions and advantages of the present invention clearly understand, below in conjunction with specific embodiment, and with reference to accompanying drawing, the present invention is described in more detail.
Consulting shown in Fig. 3, be the structural representation of embodiment of the present invention infrared tube test set, described infrared tube test set comprises upper computer 1, master control board 2, installs platform 4 from machine 3, pedestal 5 and two infrared tubes. Two infrared tubes are installed platforms 4 and are arranged on respectively on the two ends of pedestal 5, and two infrared tubes install platforms 4 are separately installed with described in one from machine 3. Described two are connected respectively to master control board 2 from machine 3, and this master control board 2 is connected with upper computer 1. In addition, the infrared tube in described pedestal 5 one end is installed and is arranged infrared emission pipe on platform 4, and this infrared emission pipe installs being connected from machine 3 on platform 4 with at this infrared tube. Infrared tube at described pedestal 5 the other end is installed and is arranged infrared receiving tube on platform 4, and this infrared receiving tube installs being connected from machine 3 on platform 4 with at this infrared tube.
When this infrared tube test set carries out work, upper computer 1 configures transmitted power, upper computer sends corresponding work order by USB line to master control board 2, master control board 2 controls the conducting that the infrared tube in pedestal 5 one end installs the infrared emission pipe on platform 4, during infrared emission pipe conducting produce voltage signal send to be attached thereto from machine 3, again by after carrying out A/D digital-to-analog conversion from machine 3, being sent to master control board 2 and send in upper computer 1. Meanwhile, a voltage signal is produced when the infrared receiving tube that the infrared tube of pedestal 5 the other end is installed on platform 4 receives the infrared rays of infrared emission pipe transmitting, this voltage signal send to be attached thereto from machine 3, after carrying out A/D digital-to-analog conversion from machine 3, it is sent to master control board 2 and sends in upper computer 1.Thus, upper computer 1 can demonstrate signal whether characteristic such as distortion after infrared tube transmits. In addition, it is possible to accomplish the setting to transmitted power. And in machine, it is integrated with A/D digital-to-analog conversion so that it is numerary signal from the signal transmitted between machine and master control board and the signal between master control board and upper computer, reduces signal attenuation and signal disturbing.
Goodly, two infrared tubes are installed and are had certain distance between platform. In an embodiment, its distance between the two should be greater than 200mm, it is preferable that is 1000mm. , it is also possible to according to the size flexible customization of infrared electronic white board, certainly such as white board size is 1800mm, then distance is adjusted to 1800mm.
In addition, in an embodiment of the present invention, this infrared tube test set also comprises two light shields, is arranged on two infrared tubes respectively and installs on platform, for shielding the impact of environment light.
As one embodiment of the present of invention, wherein two infrared tubes are installed platform and are respectively stationary platen and universal stage, or are two stationary platens, or are two universal stages. Preferably, two infrared tube installation platforms are highly consistent on the direction being perpendicular to pedestal 4 upper surface, can be able to overlap with the geometric center lines of infrared receiving tube to ensure the geometric center lines of infrared emission pipe.
Consulting shown in Fig. 4, be the structural representation of embodiment of the present invention stationary platen, described stationary platen comprises and supports seat 401, fluorescent tube mount pad 402, power supply board 403 and from machine retaining plate 404. Wherein, support seat 401 and it is fixed on pedestal 5, and fluorescent tube mount pad 402 and power supply board 403 are arranged on this support seat 401. Being provided with a groove on this support seat 401, power supply board 403 is arranged in this groove, and the one end of fluorescent tube mount pad 402 is fixedly connected with power supply board 403, and the other end of fluorescent tube mount pad 402 is for installing infrared emission pipe or infrared receiving tube. In addition, should being vertically fixed on from machine retaining plate 404 and support seat 401, and it can install from machine 3 from machine retaining plate 404, described is connected from machine 3 with the infrared emission pipe being arranged on fluorescent tube mount pad 402 or infrared receiving tube.
Consulting shown in Fig. 5, be the structural representation of embodiment of the present invention universal stage, described universal stage comprises rotating disk 501, supports seat 502, fluorescent tube mount pad 503, power supply board 504 and from machine retaining plate 506. Wherein, supporting seat 302 is arranged on pedestal 5 by rotating disk 301, this support seat 302 is provided with a groove, power supply board 304 is arranged in this groove, and the one end of fluorescent tube mount pad 303 is fixedly connected with power supply board 304, and this fluorescent tube mount pad 303 can be installed infrared emission pipe or infrared receiving tube. In addition, should being vertically fixed on from machine retaining plate 506 and support seat 501, and it can install from machine 3 from machine retaining plate 506, described is connected from machine 3 with the infrared emission pipe being arranged on fluorescent tube mount pad 503 or infrared receiving tube. Therefore, if two infrared tubes install platform be all universal stage or one for universal stage time, what the receiving angle of the infrared receiving tube that universal stage is installed or the emission angle of infrared emission pipe can be manual is changed by adjustment rotating disk 501. Thus, upper computer 1 can the result different emission angle or different receiving angle tested of show needle.
Preferably, as shown in Figure 6, being provided with guide rail 6 on the upper surface of pedestal 5, the support seat of stationary platen, universal stage can be fixed by screws in 6 li, guide rail;Unclamping this screw, stationary platen, universal stage can slide along guide rail 6. Thus, it is possible to the distance between adjustment stationary platen and universal stage, or the distance between stationary platen and stationary platen, or the distance between universal stage and universal stage.
Preferably, pedestal 5 can also arrange positioned sensor, such as photo-sensor or vernier switch, it is possible to for determining that two infrared tubes install the infrared emission pipe on platform and whether infrared receiving tube aligns.
As an alternative embodiment of the invention, being provided with axes normal in the motor of pedestal 5 upper surface in the cavity of pedestal 5, motor can be fixedly connected with rotating disk 501 by motor output shaft 505 (as shown in Figure 5). Owing to infrared receiving tube or infrared emission pipe are installed on a spinstand, by often rotating a universal stage, the receiving angle of infrared receiving tube or the emission angle of infrared emission pipe can be changed, thus can record infrared receiving tube or infrared emission pipe is received in different angles or launches the situation of signal. Thus, described infrared tube test set can be changed by the receiving angle of emission angle or infrared receiving tube that automatically controlled mode changes infrared emission pipe.
It should be noted that, in an embodiment of the present invention, it can be all stationary platen that two infrared tubes install platform, is namely that transmitting or the receiving angle of infrared emission pipe or infrared receiving tube all can not change in this kind of situation. In addition, two infrared tubes install platform can be all universal stage or one be universal stage, namely in this kind of situation, the emission angle of infrared emission pipe and/or the receiving angle of infrared receiving tube can be changed by automatically controlled mode.
In another embodiment of the present invention, infrared tube test set also comprises controller, and this controller one end is connected with master control board 2, and the other end is connected with motor. Upper computer to the turning to of motor, rotating speed by master control board and can be turned and stops controlling, such that it is able to the change installing infrared emission pipe emission angle on a spinstand is controlled, or the change installing infrared receiving tube receiving angle on a spinstand can be controlled.
If infrared emission pipe is arranged on described universal stage, during test, upper computer 1 configures turning to of transmitted power and motor, rotate step-length (step-length is such as a unit time rotate 0.2 degree), the number of times rotated, upper computer sends corresponding work order by USB line to master control board 2, master control board 2 controls the conducting that the infrared tube in pedestal 5 one end installs the infrared emission pipe on platform 4, during infrared emission pipe conducting produce voltage signal send to be attached thereto from machine 3, again by after carrying out A/D digital-to-analog conversion from machine 3, it is sent to master control board 2 and sends to and upper computer 1 completes a data gathering. meanwhile, a voltage signal is produced when the infrared receiving tube that the infrared tube of pedestal 5 the other end is installed on platform 4 receives the infrared rays of infrared emission pipe transmitting, this voltage signal send to be attached thereto from machine 3, after carrying out A/D digital-to-analog conversion from machine 3, it is sent to master control board 2 and sends to and upper computer 1 completes a data gathering. then upper computer 1 sends corresponding work order by USB line to controller, and this controller control motor driven rotary platform once rotates, and completes second time data gathering afterwards in the manner described above. the collection of data is carried out, until completing the revolution number of times of configuration in upper computer 1 with this.
If infrared receiving tube is arranged on described universal stage, identical with described principle above during test.
If infrared emission pipe and infrared receiving tube are all arranged on described universal stage, during test identical with described principle above, just need when upper computer 1 is configured respectively to being provided with the turning to of the motor corresponding to the universal stage of infrared emission pipe, infrared receiving tube, rotate step-length, number of revolutions arranges. In addition, in addition it is also necessary to setting is that infrared emission pipe or infrared receiving tube first occur direction to rotate. When performing, then it is rendered as " staggered form rotation " to complete, namely first time infrared emission pipe, infrared receiving tube direction is all constant, second time infrared emission pipe or infrared receiving tube occur once to rotate then to complete data gathering, and infrared receiving tube or infrared emission pipe occur once to rotate then to complete data gathering for the third time. Analogize with this, until completing the number of revolutions arranging infrared emission pipe and infrared receiving tube. It should be noted that, if the number of revolutions of infrared emission pipe and infrared receiving tube is inconsistent, when the number of revolutions of completes, infrared emission pipe or the infrared receiving tube that another does not complete then directly is rotated in data gathering next time.
Also it should be noted that, stationary platen described in the present invention and universal stage can be respectively arranged with multiple test bit. The respective support seat of described stationary platen and described universal stage arranges multiple groove, this groove is installed described power supply board and described fluorescent tube mount pad. Wherein, on universal stage, multiple test bit is looped around and supports seat 402 around, and when motor rotates, multiple test bit is tested successively. Multiple test bits on stationary platen linearly arrange on the direction being perpendicular to pedestal 5 length medullary ray. No matter it is on stationary platen, arrange multiple test bit infrared emission pipe or infrared receiving tube are installed, or multiple test bit is set on a spinstand infrared emission pipe or infrared receiving tube are installed, " one to one " type at infrared frame scene and the environment for use of " one to many " types can be simulated.
In sum, infrared tube test set provided by the invention, creatively proposes transmission of digital signals, reduces circuit decay and/or aerial interference; The emissive porwer of infrared emission pipe can be arranged by the present invention; Further, transmitting tube or receiving tube are tested by the present invention with different emission angles or receiving angle; And, transmitting and the receiving angle of infrared emission pipe and infrared receiving tube is adjusted by program control mode; Achieve and can continuously, with different emission angles or receiving angle transmitting tube or receiving tube be tested; Meanwhile, device of the present invention had both facilitated use, it is to increase precision, in turn simplify test procedure, it is also possible to adapt to the company standard of different manufacturers flexibly; Further, test data can be carried out in time, accurately process by the present invention; Finally, whole described infrared tube test set is easy, compact, is easy to realize.
Those of ordinary skill in the field are it is understood that the foregoing is only specific embodiments of the invention; it is not limited to the present invention; within the spirit and principles in the present invention all, any amendment of making, equivalent replacement, improvement etc., all should be included within protection scope of the present invention.
Claims (12)
1. an infrared tube test set, it is characterized in that, comprise upper computer, master control board, from machine, pedestal and two infrared tubes, platform be installed, described two infrared tubes are installed platform and are arranged on respectively on the two ends of described pedestal, and described two infrared tubes install platform is separately installed with described in one from machine; Described two are connected respectively to described master control board from machine, and this master control board is connected with described upper computer;
In addition, the described infrared tube in described pedestal one end is installed and is arranged infrared emission pipe on platform, and this infrared emission pipe installs being connected from machine on platform with at this infrared tube;Described infrared tube at the described pedestal the other end is installed and is arranged infrared receiving tube on platform, and this infrared receiving tube installs being connected from machine on platform with at this infrared tube.
2. device according to claim 1, it is characterised in that, the distance that described two infrared tubes are installed between platform is greater than 200mm.
3. device according to claim 1, it is characterised in that, described infrared tube test set also comprises two light shields, is arranged on described two infrared tube respectively and installs on platform.
4. device according to claim 1, it is characterised in that, described two infrared tubes are installed platform and are respectively stationary platen and universal stage, or are two stationary platens, or are two universal stages.
5. device according to claim 4, it is characterized in that, described stationary platen comprises and supports seat, fluorescent tube mount pad, power supply board and from machine retaining plate, and described support seat is fixed on described pedestal, and described fluorescent tube mount pad and described power supply board are arranged on this support seat; Being provided with a groove on this support seat, described power supply board is arranged in this groove, and the one end of described fluorescent tube mount pad is fixedly connected with described power supply board, and the other end of described fluorescent tube mount pad is for installing infrared emission pipe or infrared receiving tube; In addition, should being vertically fixed on described support seat from machine retaining plate, and described can install from machine retaining plate described from machine, described is connected from machine with the infrared emission pipe being arranged on described fluorescent tube mount pad or infrared receiving tube.
6. device according to claim 5, it is characterised in that, the upper surface of described pedestal is provided with guide rail, the support seat of described stationary platen, described universal stage can be fixed by screws in described guide rail; Unclamping this screw, described stationary platen, described universal stage can slide along this guide rail.
7. device according to claim 5, it is characterised in that, described stationary platen is provided with multiple test bit, the multiple test bits on described stationary platen linearly arrange on the direction being perpendicular to described pedestal length medullary ray; Namely multiple groove is set on the support seat of described stationary platen, this groove is installed described power supply board and described fluorescent tube mount pad.
8. device according to claim 4, it is characterized in that, described universal stage comprises rotating disk, supports seat, fluorescent tube mount pad, power supply board and from machine retaining plate, described support seat is arranged on described pedestal by described rotating disk, this support seat is provided with a groove, described power supply board is arranged in this groove, and the one end of described fluorescent tube mount pad is fixedly connected with described power supply board, and installs infrared emission pipe or infrared receiving tube on this fluorescent tube mount pad; In addition, described being vertically fixed on described support seat from machine retaining plate, and described can install from machine retaining plate described from machine, described is connected from machine with the infrared emission pipe being arranged on described fluorescent tube mount pad or infrared receiving tube.
9. device according to claim 8, it is characterised in that, axes normal is installed in the cavity of described pedestal in the motor of described pedestal upper surface, motor is fixedly connected with described rotating disk by motor output shaft.
10. device according to claim 8, it is characterised in that, described universal stage is provided with multiple test bit, on described universal stage, multiple test bit is looped around around described support seat, and when described motor rotates, multiple test bit is tested successively;Namely multiple groove is set on the support seat of described universal stage, this groove is installed described power supply board and described fluorescent tube mount pad.
11. devices according to claim 8, it is characterised in that, described infrared tube test set also comprises controller, and this controller one end is connected with described master control board, and the other end is connected with described motor; Described upper computer to the turning to of described motor, rotating speed by described master control board and is turned and stops controlling.
12. devices according to claim 1 to 11 any one, it is characterised in that, described pedestal can also arrange positioned sensor, for determining that two infrared tubes install the infrared emission pipe on platform and whether infrared receiving tube aligns.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410709971.3A CN105651487A (en) | 2014-11-28 | 2014-11-28 | Testing apparatus for infrared tube |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410709971.3A CN105651487A (en) | 2014-11-28 | 2014-11-28 | Testing apparatus for infrared tube |
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| CN105651487A true CN105651487A (en) | 2016-06-08 |
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|---|---|---|---|
| CN201410709971.3A Pending CN105651487A (en) | 2014-11-28 | 2014-11-28 | Testing apparatus for infrared tube |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN110247709A (en) * | 2019-06-28 | 2019-09-17 | 中航光电科技股份有限公司 | A kind of duplex wireless optical communication module and its debugging apparatus |
| CN110672952A (en) * | 2019-10-11 | 2020-01-10 | 深圳创维－Rgb电子有限公司 | Testing device |
| CN114111853A (en) * | 2021-11-25 | 2022-03-01 | 上海索迪龙自动化有限公司 | Installation structure of correlation type sensor and correlation type sensor |
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Address after: C1104 room 100085 Beijing city Haidian District Third Street No. 9 C Applicant after: Hitevision Polytron Technologies Inc Address before: C1104 room 100085 Beijing city Haidian District Third Street No. 9 C Applicant before: HONGHE TECHNOLOGY CO., LTD. |
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Application publication date: 20160608 |
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